Lattice Deformation and Strain Analysis · Geometrical Phase Analysis n PA /...
1
Geometrical Phase Analysis DigitalMicrograph Plug-in GPA www.hremresearch.com / [email protected] / +81(493)35 3919 HREM Research Inc. HREM Research Inc. GPA generates fully quantitative deformation and strain maps from HR(S)TEM images. Key Features ◆ Determines geometric phase images using choice of masks and real-space averaging [1] ◆ Generates 2D deformation tensor from HR(S)TEM images (see left for local rotation map from HRTEM image [2]) ◆ Allows calculation of color maps and contours of strains (see above right for stresses around an edge dislocation [3]) ◆ Corrects for optical distortions due to the projector lens system of the electron microscope [4] ◆ Generates strain tensors from multi-spots analysis (see bottom for lattice expansion map obtained from seven spots) [1] M.J. Hÿtch, E. Snoeck and R. Kilaas, Ultramicroscopy 74 (1998) 131–146. Quantitative measurement of displacement and strain fields from HREM micrographs [2] C. L. Johnson, M. J. Hÿtch, P. R. Buseck, PNAS 101 (2004) 17936-17939. Nanoscale waviness of low-angle grain boundaries [3] M. J. Hÿtch, J-L. Putaux, J-M. Pénisson, Nature 423 (2003) 270-273. Measurement of the displacement field around dislocations to 0.03Å by electron microscopy [4] F. Hüe et al. J. Electron Microscopy 54 (2005) 181-190. Calibration of projector lens distortions References: GPA is based on geometric phase algorithms originally developed by Martin Hÿtch [1]. Lattice Deformation and Strain Analysis 0° 0.3° 0.6° 30 nm +0.75° +0.75° 1 2 3 6 4 5 7 high resolution image rotation map lattice expansion map from multi-spots
Transcript of Lattice Deformation and Strain Analysis · Geometrical Phase Analysis n PA /...
Geometrical Phase AnalysisD
igit
alM
icro
grap
h P
lug-
in
GPA
www.hremresearch.com / [email protected] / +81(493)35 3919 HREM Research Inc.HREM Research Inc.
GPA generates fully quantitative deformationand strain maps from HR(S)TEM images.
Key Features◆ Determines geometric phase imagesusing choice of masks and real-space averaging [1]◆ Generates 2D deformation tensor from HR(S)TEM images(see left for local rotation map from HRTEM image [2])◆ Allows calculation of color maps and contours of strains(see above right for stresses around an edge dislocation [3])◆ Corrects for optical distortions due to the projector lenssystem of the electron microscope [4]◆ Generates strain tensors from multi-spots analysis (seebottom for lattice expansion map obtained from seven spots)
[1] M.J. Hÿtch, E. Snoeck and R. Kilaas, Ultramicroscopy 74 (1998) 131–146.Quantitative measurement of displacement and strain fields from HREM micrographs[2] C. L. Johnson, M. J. Hÿtch, P. R. Buseck, PNAS 101 (2004) 17936-17939. Nanoscalewaviness of low-angle grain boundaries[3] M. J. Hÿtch, J-L. Putaux, J-M. Pénisson, Nature 423 (2003) 270-273. Measurement of thedisplacement field around dislocations to 0.03Å by electron microscopy[4] F. Hüe et al. J. Electron Microscopy 54 (2005) 181-190. Calibration of projector lensdistortions
References:
GPA is based on geometric phasealgorithms originally developed byMartin Hÿtch [1].
Lattice Deformation and Strain Analysis
0°0.3°
0.6°30 nm
+0.75°
+0.75°
1
23
6
4
57
SiGe
Si
high resolution image
rotation map
lattice expansion map from multi-spots
