Final Program - IEEE Holm Program.pdf · Final Program 63rd IEEE HOLM CONFERENCE ON ELECTRICAL...

Final Program

63rd IEEE HOLM

CONFERENCEON

ELECTRICAL CONTACTS

10-13 SEPTEMBER 2017

Brown Palace Hotel

D e nv e r

CO, USA

Sponsored By:The Electronics Packaging Society

(formerly CPMT) of The Institute of Electrical and Electronics Engineers,

Inc.

Final Program

63rd IEEE HOLM

CONFERENCEON

ELECTRICAL CONTACTS

10-13 SEPTEMBER 2017

Brown Palace Hotel

D e nv e r

CO, USA

Sponsored By:The Electronics Packaging Society

(formerly CPMT) of The Institute of Electrical and Electronics Engineers,

Inc.

CONFERENCE CHAIRRod Martens, TE CONNECTIVITY

CONFERENCE VICE CHAIRXin Zhou, EATON CORPORATION

FINANCE CHAIRHenry Czajkowski, ROCKWELL AUTOMATION

TECHNICAL PROGRAM CHAIRDaniel Gagnon, HYDRO QUEBEC IREQ

TECHNICAL PROGRAM VICE CHAIRRonald Coutu, MARQUETTE UNIVERSITY

CPMT TECHINCAL COMMITTEE 1 ELECTRICAL CONTACTS CHAIR

Gerald Witter, ELECTRICAL CONTACTS PLUS, LLC

CPMT TECHINCAL COMMITTEE 1 ELECTRICAL CONTACTS VICE CHAIR

Robert Malucci, R.D. MALUCCI CONSULTING

PUBLICITY CHAIRJohn J. Shea, SCHNEIDER ELECTRIC

INTENSIVE COURSE DIRECTOR, and US REPRESENTATIVE for the INTERNATIONAL CONFERENCE

Paul Slade, CONSULTANT

TECHNICAL PROGRAM CHAIRDaniel Gagnon, HYDRO QUEBEC IREQ

TECHNICAL PROGRAM VICE CHAIRRonald Coutu, MARQUETTE UNIVERSITY

Z.K. Chen, ELECTRICAL CONTACTS PLUS, LLCBella Chudnovsky, BHC CONSULTING

Henry Czajkowski, ROCKWELL AUTOMATIONGeorge Drew, DELPHI PACKARD ELECTRIC SYSTEMS

George Flowers, AUBURN UNIVERSITY Hélène Gauthier, HYDRO QUEBEC IREQ

Peter Hale, DERINGER NEY, INC.Guenther Horn, ELCONMAT CONSULTING ASSOCIATES

Robert Jackson, AUBURN UNIVERSITYChi Leung, CONSULTANT

Rod Martens, TE CONNECTIVITY Richard Moore, C&K COMPONENTS

Deepak Patil, MOLEX INC.Timo Muetzel, UMICORE AG & CO. KG

Marjorie Myers, TE CONNECTIVITY Karumbu Meyyappan, INTEL

Brett Rickett, MOLEX INC.John J. Shea, SCHNEIDER ELECTRIC

Ed Smith III, DERINGER NEY, INC. David Williams, NEXTEER

Gerald Witter, ELECTRICAL CONTACTS PLUS, LLC Guang Yang, MOLEX

Xin Zhou, EATON CORPORATION

2017 HOLM Conference Officers

2017 HOProgram

LM TechnicalCommittee

1

Rod Martens, Chairman Xin Zhou, Vice Chairman

Daniel Gagnon, Program Chairman Ronald Coutu, Program Vice Chairman Henry Czajkowski, Finance Chairman

John Shea, Publicity ChairmanJohn Shea, Webmaster

Gerald Witter, TC-1 Chair Paul Slade, Course Director

Z. K. Chen, Immediate Past Conference Chairman

John McBride John Shea

Roland Timsit

Robert Jackson David Williams

Hélène Gauthier

2017 Operating Committee

2017 Awards Committee

2017 PrAward C

ize Paperommittee

2

To provide a forum for the presentation and discussionof the latest developments in the field of electricalcontacts, as well as the application of recent advances inmaterials and processes in electrical, electronic andtelecommunications equipment.

Practicing designers, engineers, physicists, andresearch scientists those new to the field and thoseexperienced. The 2017 IEEE Holm Conference willinclude excellent papers authored by outstandingtechnical people in this field. The internationalcontributors come from A u s t r i a , B e l g i u m , China, France, Germany, India, Japan, Kazakhstan, Malays ia, M e x i c o , S w i t z e r l a n d , the United Kingdom, and the USA. These papers will provide the attendees with up-to-date information on a wide range of subjects that makes this conference so attractive to the practicing engineer.

Additionally, the 2017 IEEE Holm Conference will makeit possible for any attendee to discuss personally, withany author, additional details concerning the workpresented by the author at the conference or any subjectrelated to the authorʼs field of expertise.

The Holm Conference began in 1953 as a forum for thediscussion of electrical contact phenomena and relatedfields. In 1968, the conference was named the HolmSeminar in honor of Dr. Ragnar Holm, whosecontributions to the field of electrical contacts spanned50 years and forms the foundation of the electricalcontacts field, was the inspiration and guide of theConference from its inception until his death in 1970.

In addition to the Annual Conference, the ConferenceOrganization regularly conducts an intensive course oncontacts and participates in the biannual InternationalConference on Electrical Contacts.

ose

For Whom

Background

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All participants are encouraged to pre-register to avoidlines at conference and to obtain the discounted fee.

CONFERENCE REGISTRATIONOn/Before July 10 After July 10

IEEE Member US$800 US$875

Non Member US$875 US$950

Student/Life Member US$350 US$400

CONFERENCE REGISTRATION HOURSSunday 9 September 4:00PM – 6:00PM

Monday 10 September 7:00AM – 5:00PM

Tuesday 11 September 8:00AM – 4:30PM

Wednesday 12 September 8:00AM – 4:00PM

Registration can be completed online:

http://www.cvent.com/events/2017-holm-conference/event-summary-5f5bf3759a4647f3bb495dd5f01b6ed6.aspx

Registration payments:

Checks are to be made out to the IEEE HOLM in US$. Visa, MasterCard, Discover, and American Express are accepted

For additional information please contact Holm Registrar, at:

US and Canada: +1 800 810 4333Elsewhere: +1 732 465 7810

Email: [email protected]

WELCOME RECEPTION

All conference attendees are invited to register early and to attend our welcome reception on Sunday, 10 September from 4:00 PM – 6:00 PM at the Ellyngtonʼs room of the Brown Palace Hotel.

ration

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63rd IEEE Holm Conference on Electrical ContactsThe 2017 conference meets in Denver, Colorado at the Brown Palace Hotel, where meeting facilities are well suited to the conference sessions and other activities. The hotel is offering special rates of US$229* single/double occupancy to conference attendees. Rates are subject to state and local tax. To make a reservation please use the Holm Conference link http://www.cvent.com/events/2017-holm-conference/event-summary-5f5bf3759a4647f3bb495dd5f01b6ed6.aspx

or call the Brown Palace Hotel Reservations 1- 303-297-3111, and please refer to the group name as “IEEE” in order to receive the group rate. The rate is valid until August 17th 2017 at 5:00PM MST. Reservations received after this date will be subject to space and availability. Attendees will be charged 1 nightʼs deposit at time of booking, which is refundable in case of a cancellation as long as you cancel your room before 6pm, 3 days prior to arrival.

Check in time: 3:00PM EST Check out time: 12:00PM EST

Brown Palace Hotel 321 17th St Denver CO 80202 USA+1 (303) 297-3111

Airport and Driving Directions:

FROM DENVER INTERNATIONAL AIRPORT – 25 to 40 MINUTES/22 MILES

Exit the airport on Pena Boulevard, drive 10 miles to I-70 west, continue on I-70 west 7 miles to Colorado Boulevard (exit 276B). Turn left on Colorado Boulevard, drive south on Colorado Boulevard 2.3 miles to 17th Avenue and turn right. Drive west on 17th Avenue 2.5 miles. (Note: As York street is crossed, 17th Avenue becomes 18th Avenue). Continue heading west on 18th Avenue to Tremont Street. Veer left on Tremont Street. The front entrance of The Brown Palace Hotel will be on the left.

Convenient Shuttle Service To The Airport:

Super Shuttle provides transportation from the airport for $25 per person one way and $46 round trip. To make arrangements with Super Shuttle, call 1-800-BLUE-VAN.

The Brown Palace doorman can assist you in hailing a cab. A one-way taxi ride to the airport is approximately $57.

Hotel Acco mmodations

Transportation

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Transportation

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Transportation

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DRIVING:If you are arriving by your own transportation, parking fees at the Brown Palace Hotel are $45 per night:

For specific driving directions consult Map Quest at www.mapquest.com or call the hotel directly at +1 (303) 297-3111.

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Conference Banquet

Kevin Taylor’s at the Opera House

Monday, 11 September 2017 6:30PM

Located in the Chambers Grant Salon in the Ellie Caulkins Opera House at the Denver Performing Arts Complex, Kevin Taylorʼs at the Opera House serves pre-theater cocktails and dinner on evenings with performances in the Ellie Caulkins Opera House, Buell Theater and/or Boettcher Concert Hall.

The Holm Social event will be held in the Chambers-Grant Salon, an extraordinary 11,600 sq. ft. space featuring twinkling fiber optic ceilings, exposed stone walls, full stage and luxurious finishes.

Each conference attendee will receive a ticket to attend the social event on the Kevin Taylor at the Opera, Additional tickets may be purchased for the rate of $80 USD.

Social Event

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History: The Ragnar Holm Scientific Achievement Award was created by the 1971 Holm Conference Steering Committee in honor of the memory of Dr. Ragnar Holm, the founder of the modern science of electrical contacts. This award is to be granted to the living scientist or engineer who has made significant contributions to the theory or practice of electrical contacts, or for work in related technologies which is directly applicable to contacts. In considering a personʼs work and selecting a recipient preference will be given for: a.) Nominees that have made contributions to the technology over many years, b.) the originality and scientific importance of contributions, and c.) achievements that have found a high degree of practice. Provided worthy candidates are found, the Award will be granted annually.

Eligibility: Any person may be nominated for this award regardless of IEEE membership. Members of IEEE Holm Awards Committee are not eligible to be considered for the award while serving on this committee. Nominations are not accepted for persons deceased. Candidates must have made contributions to the electrical contact field for a period spanning at least ten years.

Nominator Eligibility: Any person may nominate a candidate for this award, with the following exception: members of the award committee.

Nomination Support MaterialsEndorsers: At least two letters of endorsement are required. One is from the nominator and the others are from the endorsers selected by the nominator. Endorsers should be in a position to substantiate the candidateʼs contributions by providing explicit detail from personal knowledge. The nominator is responsible for submission of the letters of endorsement.

Candidate Personal Data/Education/Work: “Name”, provide complete name of candidate, not initials. “Personal”, provide date of birth, and citizenship. “Education”, list year and exact degree of institute. “Society Membership”, list various professional society affiliations. Under society activities list officers and major committee work. “Professional History”, list present occupation followed by previous career experiences. Indicate positions held, years, and briefly explain each responsibility.

Technical Accomplishments: “Technical Publications”, such as books, papers, reports, and standards are to be listed in chronological order giving authorʼs names, title, book, journal, or proceedings. “Patents”, should be listed by date, number,

Holm Co Ragnar Hol

AchievemNomination

nferencem Scientific ent Award Guidelines

8

title, and country of origin. Documentation authentication “Development of Products or processes”, may be listed for items not covered by patents. “Technical Presentations”, such as keynote addresses or courses developed by the candidate should also be listed.

Significant Contributions: Describe the candidateʼs outstanding contributions in terms of specific items. Provide a short paragraph to each one including a general description of the item, the degree of originality and creativity, and importance of the work to the electrical contact field and the time period over which the contribution was made. Also, state cases of examples of practices which were developed or modified through contributions of the candidate.

Forward Nominations To: IEEE Holm Nominations Committee, c/o IEEE Holm Conference Planner, 445 Hoes Lane, Piscataway, NJ 08854 USA

2018 Nominations Deadline: 13 January 2018

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The Ragnar Holm Scientific Achievement Award derives its significance and prestige from the scientist whose name it carries. The contributions of Dr. Ragnar Holm to electrical contact theory and application are renowned the world over. The award, created in 1971 by the Steering Committee of the holm conference, honors the memory of the founder of modern electrical contact science by recognizing outstanding scientists and engineers in the field of electrical contacts or related technologies.

An award committee appointed by the steering committee of the conference meets annually and considers nominations for the award that have been received and determines whether they have a worthy candidate. The award is not limited to candidates from the United States, or to works that have been presented to the IEEE-Holm Conference.

SIEGFRIED FOUVRY

Siegfried Fouvry is currently Director of Research CNRS at LTDS laboratory of Ecole Centrale de Lyon. He received his engineering undergraduate degree from the Ecole Centrale de Lyon in 1992 and his Ph.D Thesis under the direction of Prof. L. Vincent in 1997. Since 2015 he had the responsibility of the tribology research group of the LTDS laboratory. His main research work focuses on the experimental

investigation and modelling of fretting damages including the quantification of the fretting sliding conditions, the analysis of local friction coefficient, the quantification of surface wear through a friction energy wear approach and the prediction of fretting cracking risk using non local fatigue modelling. A major interest of his research concerns the fretting wear damages in DC and more recently RF electrical contacts. Author of more than 130 papers and 3 patents he received the HIRN prize in 1998 and the Jean Mandel prize in 2000 (X-Ecole Polytechnique).

The 2017 RagnarAchieveme

Holm Scientificnt Award

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The 28th International Conference on Electric Contacts

Held in Conjunction With

The 64th IEEE Holm Conference on Electrical Contacts

The 29th International Conference on Electric Contacts will be held in conjunction with the 64th IEEE Holm Conference on Electrical Contacts on October 14-18, 2018, in Albuquerque, New Mexico, USA.

Prior to these, the 4 d a ys Intensive Course on Electrical Contacts will be held o n October 10-13, 2018 in the same location. The course covers all aspects of the Electrical Contacts: • Contact fundamentals and materials • Friction, wear, fretting and lubrication • Electric arc fundamentals and dynamics • Power and electronic connector technologies • Guidelines for electrical and electronic connector design

Prospective authors should submit a brief abstract (200 words maximum) online before February 9, 2018. Authors will be notified concerning acceptance of abstracts by February 17, 2018.

Please include complete contact information for all correspondence to be sent.

Abstracts are to be submitted through the IEEE Conference eXpress website:

http://www.ieee.org/conferencepublishingEnter conference ID – holm18

(please use lower case)

Important Dates

Correspondence AddressIEEE Meeting & Conference Management IEEE Holm Conference (2016)445 Hoes LanePiscataway, NJ 08854US and Canada: +1 800 810 4333Elsewhere: +1 732 465 7810Fax: +1 732 465 6447Email: [email protected]

Holm Website: www.ieee-holm.org

Holm 2018

February 9, 2018 Abstract DeadlineFebruary 23, 2018 Notification of AcceptanceApril 20, 2018 Completed Paper DeadlineOctober 14, 2018 Conference Begins

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The Morton Antler Lecture is an annual technical presentation given at the IEEE Holm Conference on a topic of special interest to the electrical contact community. The lecture series was established in honor of Dr. Morton Antler, a longtime member of the Holm Steering Committee and participant in the Holm Conference. Dr. Antler was a distinguished scientist and lecturer in the fields of electrical contacts, tribology, corrosion, and electrodeposition.

Electric Vehicles and Autonomous Driving

Randy Sumner Director, Global Hybrid Vehicle

Business & Technology Development Delphi Packard Electric E/EA

Abstract:

Hybrid and All Electric Vehicles: Some of the questions that will be discussed: What are the main driving forces for the development of electric vehicles?

What are the main challenges for the expansion of this market? What are the biggest changes required for the electrical system and the components of the electrical system?

What are the advantages and disadvantages between the hybrid and purely-electrical vehicles? What are the current status and plans for expansion of charging stations for pure electric? What advances have been made in battery design?

Autonomous Vehicles: What is the driving force for autonomy? What is the timing on autonomy developments? What are the plans for partial and total autonomy and will total autonomy be accepted? How are vehicle electrification and autonomy converging? What are the biggest technical challenges facing development of autonomous vehicles?

Morton Antler Lecture

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The Holm Conference Prize Paper Award was established in 1970. At that time, the Conference Steering Committee recognized that at each Conference there was at least one paper that stood out from the others in its technical content and quality of presentation. Therefore, the Prize Paper Award Committee was established. The Committeeʼs purpose is to review each paper, listen to each presentation and then judge which paper should receive the Prize Paper Award. The award is presented to the authors of the Prize Paper at the following yearʼs Holm Conference.

Impact of the Gas Environment on the Electric Arc

Daniel Grogg and Clemens Schrank, TE Connectivity USA

The Paul and Dee Dee Slade Young Investigator Award was established in 2011 with the objective to recognize outstanding achievement of young investigators in the field of Electrical Contacts and to encourage young scientists and engineers to enter this field. To be eligible for the Award, the candidate must be under the age of 35 as of the closing date of the conference, and present a paper at the conference in which s/he is either the sole author or the first author of a multi-author paper. The award is presented at the conference awards luncheon and will be prominently mentioned in the proceedings of the following conference.

Stress-dependent Frequency Response of Conductive Granular Materials

Chongpu Zhai, Dorian Hanaor, Gwénaëlle Proust and Yixiang Gan, The University of Sydney

Erle Shobert Prize Paper

Erle 2016 IEEEPrize

Erle Shobert Paper

Paul and D Young In

ee Dee Slade vestigator

Erle 2016 Paul and D Young Investig

ee Dee Slade ator Award

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Platinum Level Checon Corporation

Heraeus Materials Technology GmbH & Co.

Shanghai Hiwave Precision Instrument Co.,Ltd

Gold LevelDoduco

Electrical Contacts Plus, LLC NAECO

Tanaka Precious Metals TE Connectivity

Umicore Technical Materials

Silver Level Metalor Technologies USA

NN, Inc. Precision Engineering Product Group

Bronze Level Deringer-Ney, Inc. Eaton Corporation

Molex

The 63rd

ConferElectrical

rters of IEEE Holm ence on Contacts

Hindustan Platinum Pvt. Ltd.

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WITH COOPERATION FROMABB, Switzerland Auburn University Austrian Institute of Technology Beihang University Beijing University of Posts and Telecommunications CentraleSupélec-Université Paris-Saclay Chitose Institute of Science & Technology Chixi Technology Co., Ltd. College of Safety Science and Engineering Delphie, USA Doduco Contacts and Refining Eaton Corporation Esterline Power Systems Florida State University Friedrich-Alexander-University Fuda Alloy Materials Co., Ltd. Fuji Electric FA Components & Systems G&A Electronics Co., Ltd. Harbin Institute of Technology Hydro Québec IREQ Hyundai Technologies Centre , Hungary Intel Corporation Jiangsu University of Science and Technology Karlsruhe Institute of Technology Kazakh-British Technical University Kazakstan Institute of Mathematics and Mathematical Modeling Keio University Laboratoire GeePs, France Liaoning Technical University Lucy Electric (India) Lucy Electric (UK) Max-Planck-Institut für Eisenforschung Mitsubishi Materials Corporation Moog Components Group National Institute of Advanced Industrial Science and Technology Nippon Institute of Technology Ostwestfalen-Lippe University of Applied Sciences Panasonic Corporation Japan Paul G. Slade, Consultant Plansee Powertech AG RD Malucci Consulting Schneider Electric, China Schneider Electric, USA Shandong Alfa Dachi Electric Co, Ltd. Shanghai Hiwave Composite Materials Company Shanghai Jiao Tong University Siemens, Germany Siemens, Mexico Siemens, USA State Grid Liaoning Electric Power Supply Co., Ltd. TE Connectivity, Belgium TE Connectivity, Germany TE Connectivity, USA Technische Universität Darmstadt Technische Universität Dresden Tokyo Institute of Technology Umicore Technical Materials AG & Co. University de Lorraine University of Southampton, Malaysia University of Southampton, UK Weibin Ye, Keysight Technologies Co., Ltd. Yazaki Parts Co., Ltd.

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MONDAY, 11 September 2017

8:00AMINTRODUCTION AND OPENING REMARKSRod Martens, 2017 IEEE Holm Conference Chair

8:10AM – 9:10AMHOLM AWARDEECHAIR: SOPHIE NOËL

9:10AM – 9:25AMBREAK

9:25AM – 11:05AMYOUNG INVESTIGATOR SESSIONCHAIR: ROBERT JACKSONCO-CHAIR: DAVID WILLIAMS

1.1 Study of the Electric Arc in DC Contactors: Modelling, Simulation and Experimental ValidationMarc. Buffo, University of Lorraine; Jean-Philippe Martin, University of Lorraine; Shahrokh Saadate, University of Lorraine; Jonathan Andrea, Esterline Power Systems; Nicolas Dumoulin, Esterline Power Systems; Éric Guillard, Esterline Power Systems

1.2 Effect of fretting wear of connectors regarding phase noise of RF signal: influence of sliding amplitude and gold coating thicknessRichard Enquebecq, Ecole Centrale de Lyon, France; Olivier Graton, Ecole Centrale de Lyon; France; Siegfried Fouvry, Ecole Centrale de Lyon; France; Enrico Rubiola, Femto-ST; France; Manuel Collet, Femto-ST, France; Laurent Petit, Femto-ST, France; Julien Legrand, Femto-ST, France

1.3 Multi-physics Modeling and Au-Ni/Rh Coating Assessment for ITER Ion Cyclotron Resonance Heating Radio-Frequency Sliding Contacts Zhaoxi Chen, IRFM, France; Julien Hillairet, IRFM, France; Viviane Turq, CIRIMAT, France; Yuntao SONG, Institute of Plasma Physics, China; Raphaël lALOO, CIRIMAT, France; Karl Vulliez, DEN/DTEC/SDTC, France, Jean-Michel Bernard, IRFM, France; Qingxi Yang, Institute of Plasma Physics , China; Gilles Lombard, IRFM, France; Caroline Hernandez, IRFM, France, Leonel Ferreira, CERN Switzerland; Florent Fesquet, CERN Switzerland; Patrick Mollard, IRFM, France; Robert Volpe IRFM, France; and Fabien Ferlay IRFM, France

Technical Program

16

1.4 Study on Molten Bridge Behaviors with Arc-less Current Commutation in a Hybrid DC Circuit BreakerMo. Chen, Tokyo Institute of Technology, Japan ; Yuta Yamada, Tokyo Institute of Technology, Japan; Shungo. Zen, Tokyo Institute of Technology, Japan; Koichi Yasuoka, Tokyo Institute of Technology, Japan

1.5 The Impact of Short Circuits on Contact Elements in High Power Applications Toni Israel, Technische Universität Dresden, Germany; Michael Gatzsche, Technische Universität Dresden, Germany; Stephan Schlegel, Technische Universität Dresden, Germany; Steffen Großmann, Technische Universität Dresden, Germany; Tom Kufner, Stäubli Electrical Connectors AG, Switzerland and George Freudiger, Stäubli Electrical Connectors AG, Switzerland


11:20AM – 12:20PMModelling I CHAIR: ROBERT JACKSON CO-CHAIR: KARUMBU MEYYAPPAN

2.1 Comparison of spherical and axisymmetric models of electrical contact heating and the conditions of their application Stanislav Kharin, Kazakh- British Technical University, Almaty, Kazakhstan

2.2 Research on the distribution thermal FEM model for an enclosed isolated phase bus-bar in short-circuit condition Huimin Liang, Harbin institute of Technology, China; Ruichao Wang, Harbin institute of Technology, China; Jiaxin You, Harbin institute of Technology, China; Longxing Bao, Shandong Alfa Dachi Electric Co., China and Hongjian Wang, Shandong Alfa Dachi Electric Co., China

2.3 The Impact on Current Density and Constriction resistance from Bridge Structures in Real contacts Robert Malucci, RD Malucci Consulting, USA

12:20PM – 13:40PMLunch (on your own)

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13:40PM – 15:00PMArcing Contacts I CHAIR: PAUL SLADE CO-CHAIR: VOLKER BEHRENS

3.1 Preliminary Study on Switching Characteristics of Silver Tin Oxide Type Contacts for Capacitive Load Wanbin Ren, Harbin Institute of Technology, China; Jianmin Wei, Harbin Institute of Technology, China; Xu Zhang, Harbin Institute of Technology, China; Fubiao Luo, G&A Electronics Ltd. Co, China; Zhefeng Zhou, G&A Electronics Ltd. Co, China;and Yinghua Fu, Chixi Technology Co., China

3.2 Applications of Laser Arc Image System on Imaging the Arcing Behavior of Electrical Contacts Hai Chen, Siemens Industry, Inc., Atlanta, USA

3.3 Study of the Influence of Permanent Magnets in the Interruption Process of the Electrical Arc in MCCB Eugenio Galvan, Siemens, S. A. de C.V., Mexico and Juan Jose Rodriguez Siemens, S. A. de C.V., Mexico

3.4 Measuring Arc Temperature Distribution and Its Time-evolution Based on Relative Intensity Method Xue Zhou, Harbin Institute of Technology, China; Harbin Yong Zhang, Harbin Institute of Technology, China and Guofu Zhai, Harbin Institute of Technology, China

15:00PM – 15:15PMBREAK

15:15PM – 16:55PMFRETTINGCHAIR: BRETT RECKITTCO-CHAIR: GEORGE DREW

4.1 High Frequency Signal Transmission across Contact Interface Subjected to Vibration Induced Fretting Corrosion Haoyue Yang, Auburn University, USA; Thomas Stegeman, Florida State University, USA; Rui Ji, Beijing University of Posts and Telecommunications, China; Michael Hamilton, Auburn University, USA; Jinchun Gao, Beijing University of Posts and Telecommunications, China and George Flowers, Auburn University, USA

4.2 Fretting in sliding electrical contacts Glenn Dorsey, Moog Components Group, USA

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13:40PM – 15:00PMArcing Contacts I CHAIR: PAUL SLADE CO-CHAIR: VOLKER BEHRENS

3.1 Preliminary Study on Switching Characteristics of Silver Tin Oxide Type Contacts for Capacitive Load Wanbin Ren, Harbin Institute of Technology, China; Jianmin Wei, Harbin Institute of Technology, China; Xu Zhang, Harbin Institute of Technology, China; Fubiao Luo, G&A Electronics Ltd. Co, China; Zhefeng Zhou, G&A Electronics Ltd. Co, China;and Yinghua Fu, Chixi Technology Co., China

3.2 Applications of Laser Arc Image System on Imaging the Arcing Behavior of Electrical Contacts Hai Chen, Siemens Industry, Inc., Atlanta, USA

3.3 Study of the Influence of Permanent Magnets in the Interruption Process of the Electrical Arc in MCCB Eugenio Galvan, Siemens, S. A. de C.V., Mexico and Juan Jose Rodriguez Siemens, S. A. de C.V., Mexico

3.4 Measuring Arc Temperature Distribution and Its Time-evolution Based on Relative Intensity Method Xue Zhou, Harbin Institute of Technology, China; Harbin Yong Zhang, Harbin Institute of Technology, China and Guofu Zhai, Harbin Institute of Technology, China


15:15PM – 16:55PMFRETTINGCHAIR: BRETT RECKITTCO-CHAIR: GEORGE DREW

4.1 High Frequency Signal Transmission across Contact Interface Subjected to Vibration Induced Fretting Corrosion Haoyue Yang, Auburn University, USA; Thomas Stegeman, Florida State University, USA; Rui Ji, Beijing University of Posts and Telecommunications, China; Michael Hamilton, Auburn University, USA; Jinchun Gao, Beijing University of Posts and Telecommunications, China and George Flowers, Auburn University, USA

4.2 Fretting in sliding electrical contacts Glenn Dorsey, Moog Components Group, USA

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4.3 Reliability Test Induced failures vs Field Performance: Contact Fretting perspective Karumbu Meyyappan, Intel Corporation, USA; QiFeng Wu, Intel Corporation, USA; Milena Vujosevic, Intel Corporation, USA; Charles Hill, Intel Corporation, USA and Ryan Parrott, Intel Corporation, USA

4.4 Fretting behaviour of connectors under grease lubrication Sophie Noël, CentraleSupélec, LGEP, France; Aurore Brezard-Oudot, CentraleSupélec, LGEP, France; Pascal Chretien, CentraleSupélec, LGEP, France; and David Alamarguy, CentraleSupélec, LGEP, France

4.5 Third bodies in electrical contacts – Friction, wear and electrical performance Jian Song, Ostwestfalen-Lippe University of Applied Sciences, Germany; Haomiao Yuan, Ostwestfalen-Lippe University of Applied Sciences, Germany and Vitali Schinow, Ostwestfalen-Lippe University of Applied Sciences, Germany

6:00PM SOCIAL EVENT

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4.3 Reliability Test Induced failures vs Field Performance: Contact Fretting perspective Karumbu Meyyappan, Intel Corporation, USA; QiFeng Wu, Intel Corporation, USA; Milena Vujosevic, Intel Corporation, USA; Charles Hill, Intel Corporation, USA and Ryan Parrott, Intel Corporation, USA

4.4 Fretting behaviour of connectors under grease lubrication Sophie Noël, CentraleSupélec, LGEP, France; Aurore Brezard-Oudot, CentraleSupélec, LGEP, France; Pascal Chretien, CentraleSupélec, LGEP, France; and David Alamarguy, CentraleSupélec, LGEP, France

4.5 Third bodies in electrical contacts – Friction, wear and electrical performance Jian Song, Ostwestfalen-Lippe University of Applied Sciences, Germany; Haomiao Yuan, Ostwestfalen-Lippe University of Applied Sciences, Germany and Vitali Schinow, Ostwestfalen-Lippe University of Applied Sciences, Germany

6:00PM SOCIAL EVENT

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TUESDAY, 12 SEPTEMBER 2017

08:00AM – 09:20AMMATERIALS ICHAIR: GEORGE DREWCO-CHAIR: SOPHIE NOËL

5.1 Exploratory Study of Silver Nanoparticle Laden Lubricants for Electrical Contacts Robert Jackson, Auburn University, USA; Alex Coker, Auburn University, USA; Zoe Tucker, Auburn University, USA; Mohammad Hossain, Auburn University, USA and German Mills, Auburn University, USA

5.2 New LITESURF Plating for the Mitigation of Whisker Risks in Press-Fit Applications Erika R. Crandall, TE Connectivity, Germany; Frank Schabert, TE Connectivity, Germany; Helge Schmidt, TE Connectivity, Germany; Martin Bleicher, TE Connectivity, Germany; Thomas Fili, TE Connectivity, Germany; Walter E. Mueller - von Fischer, TE Connectivity, Germany; Claus Borhauer, TE Connectivity, Germany; Stefan Thoss, TE Connectivity, Germany; Jorge Villarreal, TE Connectivity, Germany and Bart Kerckhof, TE Connectivity, Belgium

5.3 The effect of the nickel underplate on the heat resisting properties of silver plated copper alloy contacts Kenji Kubota, Mitsubishi Materials Corporation, Japan; Kiyotaka Nakaya, Mitsubishi Materials Corporation, Japan; Takashi Tamagawa, Mitsubishi Materials Corporation, Japan; Hiroyuki Mori, Mitsubishi Materials Corporation, Japan; Toru Nishimura, Mitsubishi Materials Corporation, Japan; Yoshitaka Ito, Yazaki Parts Co., Japan; Tomohiro Shimada, Yazaki Parts Co., Japan; and Takaya Kondo, Yazaki Parts Co., Japan;

5.4 Thermomechanical Stresses within Ag/SnO2 Contact Materials after Arcing Events Timo Muetzel, Umicore Technical Materials AG & Co., Germany; Duancheng Ma, Austrian Institute of Technology, Austria; Franz Roters, Max-Planck-Institut für Eisenforschung Germany and Dierk Raabe, Max-Planck-Institut für Eisenforschung, Germany


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TUESDAY, 12 SEPTEMBER 2017

08:00AM – 09:20AMMATERIALS ICHAIR: GEORGE DREWCO-CHAIR: SOPHIE NOËL

5.1 Exploratory Study of Silver Nanoparticle Laden Lubricants for Electrical Contacts Robert Jackson, Auburn University, USA; Alex Coker, Auburn University, USA; Zoe Tucker, Auburn University, USA; Mohammad Hossain, Auburn University, USA and German Mills, Auburn University, USA

5.2 New LITESURF Plating for the Mitigation of Whisker Risks in Press-Fit Applications Erika R. Crandall, TE Connectivity, Germany; Frank Schabert, TE Connectivity, Germany; Helge Schmidt, TE Connectivity, Germany; Martin Bleicher, TE Connectivity, Germany; Thomas Fili, TE Connectivity, Germany; Walter E. Mueller - von Fischer, TE Connectivity, Germany; Claus Borhauer, TE Connectivity, Germany; Stefan Thoss, TE Connectivity, Germany; Jorge Villarreal, TE Connectivity, Germany and Bart Kerckhof, TE Connectivity, Belgium

5.3 The effect of the nickel underplate on the heat resisting properties of silver plated copper alloy contacts Kenji Kubota, Mitsubishi Materials Corporation, Japan; Kiyotaka Nakaya, Mitsubishi Materials Corporation, Japan; Takashi Tamagawa, Mitsubishi Materials Corporation, Japan; Hiroyuki Mori, Mitsubishi Materials Corporation, Japan; Toru Nishimura, Mitsubishi Materials Corporation, Japan; Yoshitaka Ito, Yazaki Parts Co., Japan; Tomohiro Shimada, Yazaki Parts Co., Japan; and Takaya Kondo, Yazaki Parts Co., Japan;

5.4 Thermomechanical Stresses within Ag/SnO2 Contact Materials after Arcing Events Timo Muetzel, Umicore Technical Materials AG & Co., Germany; Duancheng Ma, Austrian Institute of Technology, Austria; Franz Roters, Max-Planck-Institut für Eisenforschung Germany and Dierk Raabe, Max-Planck-Institut für Eisenforschung, Germany


20

9:35AM – 10:35AMMORTON ANTLER LECTURE

Electrical Vehicles and Autonomous Driving Randy Sumner, Delphie, USA


10:50AM – 12:10AMTESTINGCHAIR: HENRY CZAJKOWSKICO-CHAIR: RONALD COUTU

6.1 Investigation on Electrical Connector Degradation in High Frequency Using Time Domain Reflectometry Qingya Li, Beijing University of Posts and Telecommunications, China; Rui Ji, Beijing University of Posts and Telecommunications, China; Jinchun Gao, Beijing University of Posts and Telecommunications, China; George Flowers, Auburn University, USA; Gang Xie, Beijing University of Posts and Telecommunications, China and Weibin Ye, Keysight Technologies Co., Ltd., China

6.2 Research on the resolving power of Ultrasonic Nondestructive Testing Technique on the minor Welding Defects on Low - voltage Electrical Apparatus Ye Lianhui, Shanghai Hiwave Precision Instrument Co., Ltd, China; Wang Yuanzhong, Schneider Shanghai Apparatus Parts Manufacturing Co., Ltd, China; Li Benlu, Schneider Shanghai Apparatus Parts Manufacturing Co., Ltd, China; Liu Nan, Schneider Shanghai Apparatus Parts Manufacturing Co., Ltd, China;and Qiu Kui, Shanghai Hiwave Precision Instrument Co., Ltd, China

6.3 The Failure Mechanism of Aerospace Electromagnetic Relay in Accelerated Storage Degradation Testing Zhaobin Wang, Jiangsu University of Science and Technology, China; Zhoulin Huang, Jiangsu University of Science and Technology, China; Jiawei Wang, Jiangsu University of Science and Technology, China; Shang Shang, Jiangsu University of Science and Technology, China and Guofu Zhai, Harbin Institute of Technology, China

20

9:35AM – 10:35AMMORTON ANTLER LECTURE

Electrical Vehicles and Autonomous Driving Randy Sumner, Delphie, USA


10:50AM – 12:10AMTESTINGCHAIR: HENRY CZAJKOWSKICO-CHAIR: RONALD COUTU

6.1 Investigation on Electrical Connector Degradation in High Frequency Using Time Domain Reflectometry Qingya Li, Beijing University of Posts and Telecommunications, China; Rui Ji, Beijing University of Posts and Telecommunications, China; Jinchun Gao, Beijing University of Posts and Telecommunications, China; George Flowers, Auburn University, USA; Gang Xie, Beijing University of Posts and Telecommunications, China and Weibin Ye, Keysight Technologies Co., Ltd., China

6.2 Research on the resolving power of Ultrasonic Nondestructive Testing Technique on the minor Welding Defects on Low - voltage Electrical Apparatus Ye Lianhui, Shanghai Hiwave Precision Instrument Co., Ltd, China; Wang Yuanzhong, Schneider Shanghai Apparatus Parts Manufacturing Co., Ltd, China; Li Benlu, Schneider Shanghai Apparatus Parts Manufacturing Co., Ltd, China; Liu Nan, Schneider Shanghai Apparatus Parts Manufacturing Co., Ltd, China;and Qiu Kui, Shanghai Hiwave Precision Instrument Co., Ltd, China

6.3 The Failure Mechanism of Aerospace Electromagnetic Relay in Accelerated Storage Degradation Testing Zhaobin Wang, Jiangsu University of Science and Technology, China; Zhoulin Huang, Jiangsu University of Science and Technology, China; Jiawei Wang, Jiangsu University of Science and Technology, China; Shang Shang, Jiangsu University of Science and Technology, China and Guofu Zhai, Harbin Institute of Technology, China

21

6.4 Failure depending progression of contact resistance in thermal-shock testing of spring-clip contacts Matthias Friedlein, Friedrich-Alexander-University, Germany; Michael Spahr, Friedrich-Alexander-University, Germany; Robert Sueß-Wolf, Friedrich-Alexander-University, Germany and Joerg Franke, Friedrich-Alexander-University, Germany

12:10PM – 13:30PMAWARDS LUNCHEON

13:30PM – 14:50PMSLIDING CONTACTS CHAIR: ED SMITHCO-CHAIR: DANIEL GAGNON

7.1 Commutation Characteristics and Brush Wear of DC Motor at High Rotation Speeds Koichiro Sawa, Nippon Institute of Technology, Japan; Masayuki Isato, Nippon Institute of Technology, Japan; Takahiro Ueno, Nippon Institute of Technology, Japan; Keisuke Nakano, Panasonic Corporation, Japan and Kenji Kondo, Panasonic Corporation, Japan

7.2 Effects of lubricant oil on sliding contact phenomena in carbon brush-slip ring system Yuki Amada, Nippon Institute of Technology, Japan; Koichiro Sawa, Nippon Institute of Technology, Japan and Takahiro Ueno, Nippon Institute of Technology, Japan

7.3 Temperature Characteristics of Sliding Friction Pair under High-speed and Strong-current Conditions Zhiyong Wang, Liaoning Technical University, China; Fengyi Guo, Liaoning Technical University, China; Shuai Liu, Liaoning Technical University, China; Bilguun Baatar, Liaoning Technical University, China; Yuting Wang, Liaoning Technical University, China; and Haihong Liang, State Grid Liaoning Electric Power Supply Co. Ltd., China

7.4 Current detection of off line arc and back stepping control of pantograph catenary system Zhiling Ren, Liaoning Technical University, China; Dong Lin, Liaoning Technical University, Chian; Ziqi Nie, Beihang University, China and Guangquan Zhang, Liaoning Technical University, China


21

6.4 Failure depending progression of contact resistance in thermal-shock testing of spring-clip contacts Matthias Friedlein, Friedrich-Alexander-University, Germany; Michael Spahr, Friedrich-Alexander-University, Germany; Robert Sueß-Wolf, Friedrich-Alexander-University, Germany and Joerg Franke, Friedrich-Alexander-University, Germany

12:10PM – 13:30PMAWARDS LUNCHEON

13:30PM – 14:50PMSLIDING CONTACTS CHAIR: ED SMITHCO-CHAIR: DANIEL GAGNON

7.1 Commutation Characteristics and Brush Wear of DC Motor at High Rotation Speeds Koichiro Sawa, Nippon Institute of Technology, Japan; Masayuki Isato, Nippon Institute of Technology, Japan; Takahiro Ueno, Nippon Institute of Technology, Japan; Keisuke Nakano, Panasonic Corporation, Japan and Kenji Kondo, Panasonic Corporation, Japan

7.2 Effects of lubricant oil on sliding contact phenomena in carbon brush-slip ring system Yuki Amada, Nippon Institute of Technology, Japan; Koichiro Sawa, Nippon Institute of Technology, Japan and Takahiro Ueno, Nippon Institute of Technology, Japan

7.3 Temperature Characteristics of Sliding Friction Pair under High-speed and Strong-current Conditions Zhiyong Wang, Liaoning Technical University, China; Fengyi Guo, Liaoning Technical University, China; Shuai Liu, Liaoning Technical University, China; Bilguun Baatar, Liaoning Technical University, China; Yuting Wang, Liaoning Technical University, China; and Haihong Liang, State Grid Liaoning Electric Power Supply Co. Ltd., China

7.4 Current detection of off line arc and back stepping control of pantograph catenary system Zhiling Ren, Liaoning Technical University, China; Dong Lin, Liaoning Technical University, Chian; Ziqi Nie, Beihang University, China and Guangquan Zhang, Liaoning Technical University, China


22

15:05PM – 16:25PMARCING IICHAIR: JERRY WITTERCO-CHAIR: Z.K. CHEN

8.1 Influences of external magnetic field application and increased contact opening speeds on break arc duration characteristics of AgSnO2 contacts in DC load conditions Makoto Hasegawa, Chitose Institute of Science & Technology, Japan and Seika Tokumitsu, Chitose Institute of Science & Technology, Japan

8.2 Power Flux brought by an electric arc on AG SnO2 electrode Philippe Testé, CentraleSupelec-UPMC-UPSud, France; Romaric Landfried CentraleSupelec-UPMC-UPSud, France and Frédéric Houzé, CentraleSupelec-UPMC-UPSud, France

8.3 Influence of Contact Materials and Opening Velocity on Various Characteristics of DC High Voltage Arc Kiyoshi Yoshida, Nippon Institute of Technology, Japan; Koichiro Sawa, Nippon Institute of Technology and Keio University, Japan; Kenji Suzuki, Fuji Electric FA Components & Systems Co., Ltd, Japan and Koetsu Takaya, Fuji Electric FA Components & Systems Co., Ltd, Japan

8.4 Application of a New Ag/SnO2 Contact Material in AC-Contactors Havva Cinaroglu, R&D Contacts, DODUCO Contacts and Refining, Germany; Volker Behrens, R&D Contacts, DODUCO Contacts and Refining, Germany and Thomas Honig, R&D Contacts, DODUCO Contacts and Refining, Germany

16:30PMTC1 MEETINGCHAIR: GERRY WITTER

22

15:05PM – 16:25PMARCING IICHAIR: JERRY WITTERCO-CHAIR: Z.K. CHEN

8.1 Influences of external magnetic field application and increased contact opening speeds on break arc duration characteristics of AgSnO2 contacts in DC load conditions Makoto Hasegawa, Chitose Institute of Science & Technology, Japan and Seika Tokumitsu, Chitose Institute of Science & Technology, Japan

8.2 Power Flux brought by an electric arc on AG SnO2 electrode Philippe Testé, CentraleSupelec-UPMC-UPSud, France; Romaric Landfried CentraleSupelec-UPMC-UPSud, France and Frédéric Houzé, CentraleSupelec-UPMC-UPSud, France

8.3 Influence of Contact Materials and Opening Velocity on Various Characteristics of DC High Voltage Arc Kiyoshi Yoshida, Nippon Institute of Technology, Japan; Koichiro Sawa, Nippon Institute of Technology and Keio University, Japan; Kenji Suzuki, Fuji Electric FA Components & Systems Co., Ltd, Japan and Koetsu Takaya, Fuji Electric FA Components & Systems Co., Ltd, Japan

8.4 Application of a New Ag/SnO2 Contact Material in AC-Contactors Havva Cinaroglu, R&D Contacts, DODUCO Contacts and Refining, Germany; Volker Behrens, R&D Contacts, DODUCO Contacts and Refining, Germany and Thomas Honig, R&D Contacts, DODUCO Contacts and Refining, Germany

16:30PMTC1 MEETINGCHAIR: GERRY WITTER

23

WEDNESDAY, 13 SEPTEMBER 2017 8:00AM – 9:00AMMATERIALS II CHAIR: ROLAND TIMSITCO-CHAIR: HÉLÈNE GAUTHIER

9.1 Investigation On The Electrical Properties Of AgNi Contact Material With Various Ni Content Heng Wang, Fuda Alloy Materials Co., Ltd, China and Huan Yuan, Fuda Alloy Materials Co., Ltd, China

9.2 In-situ Synthesized Silver-Graphene Nanocomposite with Enhanced Electrical and Mechanical Properties for High-Performance Contact Materials Pengpeng Wang, Shanghai Hiwave Composite Materials Company, China; Zhijun Wei, Shanghai Hiwave Composite Materials Company, China; Minhua Shen, Shanghai Hiwave Composite Materials Company, China; Hui Pan, Shanghai Jiao Tong University, China; Jun Fu, Schneider Electric Co., Ltd., Shanghai, China and Lesheng Chen, Shanghai Hiwave Composite Materials Company, China

9.3 The influence of multi-scale roughness on the contact mechanics of a Au coated CNT composite for low current switching Hong Liu, University of Southampton Malaysia Campus, Malaysia and John McBride, University of Southampton, UK


9:15AM – 10:55AMSWITCHING / VACUUMINTERRUPTERS CHAIR: TIMO MUETZELCO-CHAIR: XIN ZHOU

10.1 Influence of Sealed Gas and Pressure on Arc Discharge of Electromagnetic Contactor Kiyoshi Yoshida, Nippon Institute of Technology, Japan; Koichiro Sawa, Nippon Institute of Technology and Keio University, Japan; Kenji Suzuki, Fuji Electric FA Components & Systems Co., Ltd, Japan and Koetsu Takaya, Fuji Electric FA Components & Systems Co., Ltd, Japan

23

WEDNESDAY, 13 SEPTEMBER 2017 8:00AM – 9:00AMMATERIALS II CHAIR: ROLAND TIMSITCO-CHAIR: HÉLÈNE GAUTHIER

9.1 Investigation On The Electrical Properties Of AgNi Contact Material With Various Ni Content Heng Wang, Fuda Alloy Materials Co., Ltd, China and Huan Yuan, Fuda Alloy Materials Co., Ltd, China

9.2 In-situ Synthesized Silver-Graphene Nanocomposite with Enhanced Electrical and Mechanical Properties for High-Performance Contact Materials Pengpeng Wang, Shanghai Hiwave Composite Materials Company, China; Zhijun Wei, Shanghai Hiwave Composite Materials Company, China; Minhua Shen, Shanghai Hiwave Composite Materials Company, China; Hui Pan, Shanghai Jiao Tong University, China; Jun Fu, Schneider Electric Co., Ltd., Shanghai, China and Lesheng Chen, Shanghai Hiwave Composite Materials Company, China

9.3 The influence of multi-scale roughness on the contact mechanics of a Au coated CNT composite for low current switching Hong Liu, University of Southampton Malaysia Campus, Malaysia and John McBride, University of Southampton, UK


9:15AM – 10:55AMSWITCHING / VACUUMINTERRUPTERS CHAIR: TIMO MUETZELCO-CHAIR: XIN ZHOU

10.1 Influence of Sealed Gas and Pressure on Arc Discharge of Electromagnetic Contactor Kiyoshi Yoshida, Nippon Institute of Technology, Japan; Koichiro Sawa, Nippon Institute of Technology and Keio University, Japan; Kenji Suzuki, Fuji Electric FA Components & Systems Co., Ltd, Japan and Koetsu Takaya, Fuji Electric FA Components & Systems Co., Ltd, Japan

24

10.2 Investigation of Arc Splitters in an SF6 Insulated Medium Voltage SwitchgearBalazs Novak, Lucy Electric, New Product Development, UK; Rahul Sonar, Lucy Electric India Excellence Centre, India and Ramesh Sivaraj, Lucy Electric India Excellence Centre, India

10.3 Development of an Arcless DC Circuit Break using a Mechanical Contact and a Semiconductor Device Shungo Zen, Tokyo Institute of Technology, Japan; Tatsuya Hayakawa, Tokyo Institute of Technology, Japan; Kyotaro Nakayama, Tokyo Institute of Technology, Japan and Koichi Yasuoka, Tokyo Institute of Technology, Japan

10.4 Effect of the axial magnetic field structure on the threshold welding current for closed, axial magnetic field, vacuum interrupter contacts Paul G. Slade, Consultant USA; Erik D. Taylor, Siemens, Germany and Andreas Lawall, Siemens Germany

10.5 Interdependency of Test Environment and Current Breaking Capacity of a Model Vacuum Switch Alexander Feilbach, Technische Universität Darmstadt, Germany; Henrik Menne, Technische Universität Darmstadt, Germany; Volker Hinrichsen, Technische Universität Darmstadt, Germany; Ulla Hauf, Karlsruhe Institute of Technology, Germany; Martin Heilmaier, Karlsruhe Institute of Technology, Germany; Mike Böning, Plansee Powertech AG, Switzerland and Frank Müller, Plansee Powertech AG, Switzerland


11:10AM – 12:10PMCONNECTORS CHAIR: MARJORIE MYERSCO-CHAIR: DAVID WILLIAMS

11.1 Glowing Connections in DC Circuits John Shea, Schneider-Electric, USA

11.2 Press- and shrink-fit connections with cylindrical aluminum conductors for high-current applications – contact and long-term behavior depending on mechanical parameters Alexander Ramonat, Technische Universität Dresden, Germany; Stephan Schlegel, Technische Universität Dresden, Germany; Steffen Großmann, Technische Universität Dresdenn, Germany and Matthias Kudoke, High Voltage Products ABB, Switzerland

24









24









25

11.3 Temperature Rise of Canted Spring Contacts During Fault Current Balazs Novak, Department of New Product Development, Lucy Electric, UK and Laszlo Szabo, Hyundai Technologies Centre, Hungary

12:10PM – 13:20PML u n ch (o n yo u r ow n)

13:20PM – 14:20PMMODELLING CHAIR: Bob MALUCCICO-CHAIR: DANIEL GAGNON

12.1 Experimental verification/comparison between standard sphere against flat and a new wave structured contact surface topography developed using a numerical contact model; Michael Leidner, TE Connectivity, Germany; Helge Schmidt, TE Connectivity, Germany; Marjorie Myers, TE Connectivity, USA; Stefan Thoss, TE Connectivity, Germany; Svenja Stotz, TE Connectivity, Germany and Matthias Brunner, TE Connectivity, Germany

12.2 The role of the arc heat flux and Joule heating in the erosion of electrical contacts Stanislav Kharin, Kazakh-British Technical University, Kazakhstan and Merey Sarsengeldin, Institute of Mathematics and Mathematical Modeling, Kazakhstan

12.3 The effect of the distribution of A-spots in the peripheral part of an apparent contact point on constriction resistance Yasuhiro Fukuyama, National Institute of Advanced Industrial Science and Technology (AIST), Japan; Norihiko Sakamoto, National Institute of Advanced Industrial Science and Technology (AIST), Japan; Nobu-Hisa Kaneko, National Institute of Advanced Industrial Science and Technology (AIST), Japan; Takaya Kondo, Yazaki Parts CO., LTD, Japan; Jun Toyoizumi, Japan and Takahiro Yudate, Yazaki Parts CO., LTD, Japan


26

14:35PM – 15:55PMSAFETY AFCICHAIR: XIN ZHOUCO-CHAIR: GUANG YANG

13.1 Feature Analysis in Time-domain and Fault Diagnosis of Series Arc Fault Yanli Liu, Liaoning Technical University and College of Safety Science and Engineering, China; Fengyi Guo, Liaoning Technical University, China; Zhiling Ren, Liaoning Technical University, China; Peilong Wang, Liaoning Technical University, China; Tuan Nghia Nguyen, Liaoning Technical University, China;; Jia Zheng, Liaoning Technical University, China and Xirui Zhang, Liaoning Technical University, China

13.2 A serial Arc Fault Location algorithm based on impedance method for a domestic AC system Edwin Calderon, University de Lorraine, Institut Jean Lamour, France; Patrick Schweitzer, University de Lorraine, Institut Jean Lamour, France and Serge Weber, University de Lorraine, Institut Jean Lamour, France

13.3 Arcing Fault in Aircraft Distribution Network Jonathan Andrea, Esterline Power Systems, R&D, France; Marc Buffo, Esterline Power Systems, R&D, France; Eric Guillard, Esterline Power Systems, R&D, France; Romaric Landfried, Laboratoire GeePs, Univ. Paris-Saclay, France; Redouane Boukadoum, Laboratoire GeePs, Univ. Paris-Saclay, France and Philippe Testé, Laboratoire GeePs, Univ. Paris-Saclay, France

13.4 Research on Feature of Series Arc Fault Based on Improved SVD Hongxin Gao, Liaoning Technical University, China; Xili Wang, Liaoning Technical University, China; Tuan Nghia Nguyen, Liaoning Technical University, China; Fengyi Guo, Liaoning Technical University, China; Zhiyong Wang, Liaoning Technical University, China; Jianglong You, Liaoning Technical University, China and Yong Deng, Liaoning Technical University, China

15:55PM CLOSING REMARKSROD MARTENS

27

Alamarguy, David 18

Amada, Yuki 21

Andrea, Jonathan 15,26

Baatar, Bilguun 21

Bao, Longxing 16

Behrens, Volker 22

Benlu, Li 20

Bernard, Jean-Michel 15

Bleicher, Martin 19

Böning, Mike 24

Borhauer, Claus 19

Boukadoum,

Redouane 26

Brezard-Oudot, Aurore 18

Brunner, Matthias 25

Buffo, Marc 15,26

Calderon, Edwin 26

Chen, Hai 17

Chen, Lesheng 23

Chen, Mo 16

Chen, Zhaoxi 15

Chretien, Pascal 18

Cinaroglu, Havva 22

Coker, Alex 19

Collet, Manuel 15

Crandall, Erika R. 19

Deng, Yong 26

Dong, Lin 21

Dorsey, Glenn 17

Dumoulin, Nicolas 15

Enquebecq, Richard 15

Feilbach, Alexander 24

Ferlay, Fabien 15

Ferreira, Leonel 15

Fesquet, Florent 15

Flowers, George 17,20

Fouvry, Siegfried 9,15

Franke, Joerg 21

Author IndexFreudiger, George 16

Friedlein, Matthias 21

Fu, Yinghua 17

Fukuyama,

Yasuhiro 25

Galvan, Eugenio 17

Gao, Hongxin 26

Gao, Jinchun 17,20

Gatzsche, Michael 16

Graton, Olivier 15

Großmann, effen16,24 Steffen 16,24

Guangquan, Zhang 21

Guillard, Éric 16,27

Guo, Fengyi 12,26 (2)

Hamilton, Michael 17

Hasegawa, Makoto 22

Hauf, Ulla 24

Hayakawa, Tatsuya 24

Heilmaier, Martin 24

Hernandez, Caroline 15

Hill, Charles 18

Hillairet, Julien 15Hinrichsen, Volker 24

Honig, Thomas 22

Hossain, effen

Mohammad 19

Houzé, Frédéric 22

Huang, Zhoulin 20

Isato, Masayuki 21

Israel, Toni 16

Ito, Yoshitaka 19

Jackson, Robert 19

Ji, Rui 17,20

Kaneko, Nobu-Hisa 25

Kerckhof, Bart 19

Kharin, Stanislav 16,25

Kondo, Kenji 21

16,24

28

Kondo, Takaya 0,2620, 26 Parrott, Ryan 18

Kubota, Kenji 19 Petit, Laurent 15

Kudoke, Matthias 24

Kufner, Tom 16 Raabe, Dierk 19

Kui, Qui 20 Ramonat, Alexander 24

Ren, Wanbin 17

laloo, Raphaël 15 Ren, Zhiling

Landfried, Romaric 22,26 Rodriguez, Juan Jose 17

Legrand, Julien 15 Roters, Franz 19

Leidner, Michael 25 Rubiola, Enrico 15

Li, Qinya 20

Liang, Haihong 21 Saadate, Shahrokh 15

Liang, Huimin 16 Sakamoto, Norihiko 25

Lianhui, Ye 20 Sarsengeldin, Merey 25

Liu, Hong 23 Sawa, Koichiro 23,24

Liu, Shuai 21 Schabert, Frank 19

Liu, Yanli 27 Schinow, Vitali 18

Lombard, Gilles 15 Schlegel, Stephan 16,24

Luo, Fubiao 17 Schmidt, Helge 19,25

Schweitzer, Patrick 26

Ma, Duancheng 19 Shang, Shang 20

Malucci, Robert 16 Shea, John 24

Martin, Jean-Philippe 15 Shimada, Tomohiro 19

McBride, John 23 Sivaraj, Ramesh 24

Menne, Henrik 24 Slade, Paul 24

Meyyappan, Sonar, Rahul 24

Karumbu 18 Song, Jian 18

Mills, German 19 Song, Yuntao 15

Mollard, Patrick 15 Spahr, Michael 21

Mori, Hiroyuki 19 Stegeman, Thomas 17

Mueller – von Fischer, Stotz, Svenja 25

Walter, 19 Sueß-Wolf, Robert 21

Muetzel, Timo 19 Suzuki, Kenji 3Müller, Frank 19 Szabo, Laszlo 25

Myers, Marjorie 25

Takaya, Koetsu 22,23

Nakano, Keisuke 21 Tamagawa, Takashi 19

Nakaya, Kiyotaka 19 Testé, Philippe 22,26

Nakayama, Kyotaro 24 Thoss, Stefan 19,25

Nan, Liu 20 Tokumitsu, Seika 22

Nguyen, Tuan Nghia 26 (2) Toyoizumi, Jun 25

Nishimura, Toru 19 Tucker, Zoe 19

Noël, Sophie 18 Turq, Viviane 15

Novak, Balazs 24,25

Ueno, Takahiro 21(2)

21,26

22,2

22(2),

29

Villarreal, Jorge 19

Volpe, Robert 15

Vulliez, Karl 15

Wang, Heng 23

Wang, Hongjian 16

Wang, Jiawei 20 Wang, Peilong 26 Wang, Ruichao 16 Wang, Xili 26 Wang, Yuting 21 Wang, Zhaobin 20 Wang, Zhiyong 21,26Weber, Serge 26 Wei, Jianmin 17 Wu, QiFeng 18

Xie, Gang 20

Yamada, Yuta 16 Yang, Haoyue 17Yang, Qingxi 15 Yasuoka, Koichi 16,24 Ye, Weibin 20 Yoshida, Kiyoshi 22,23 You, Jianglong 26

You, Jiaxin 16

Yuan, Haomiao 18

Yuan, Huan 23

Yuanzhong, Wang 20

Yudate, Takahiro 25

Zen, Shungo 16,24

Zhai, Guofu 17,20

Zhang, Xirui 26

Zhang, Xu 17

Zhang, Yong 17

Zheng, Jia 26

Zhou, Xue 17

Zhou, Zhefeng 17 Ziqi, Nie 21

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