HP-PN5965-6203E_Evaluating ATM Switch Performance Using the HP E5200A
HP-PN11896-2_Polarization Dependent Loss Measurements
HP-PN89400-7_Dynamic Range Benefits of Large-ScaleDithered Analog-To-Digital Conversion
HP-SN4291-8_Materials Characterization With a New Dielectric Spectrometer
HP-AN200-1_Fundamentals of Microwave Frequency Counters
HP-AN200-4_Understanding Frequency Counter Specifications
HP AN346 3_Effective Impedance Measurement Using OPEN SHORT Load Correction
HP-AN369-12_Measurement of Impedance of Magnetic Heads
HP-AN1202!3!3 Steps to Better Baseband, If, And RF Design With the HP 8751A
HP-AN1211-1_Standard and CRC-4 Frame Testing
HP-AN1237-1_Maximizing Revenue With in-Service Testing - An Introduction
HP-AN1244-1_Minimizing Intrusion Effects When Probing With a Logic Analyzer
HP-AN1255-2_Evaluating Chip Inductors Using the HP 4291A
HP-AN1255-3_Permittivity Measurements of PC Board and Substrate Materials
HP-AN1255-5_Electronic Characterization of IC Packages
HP-AN1264-2_Fundamentals of Synchronization Planning
HP-AN1264-3_Fundamentals of Synchronization Planning
HP-AN1287-3_Applying Error Correction to Network Analyzer Measurements
HP-AN1288-2_Configuring the HP 4396B for O-E Testing
HP-AN1288-3_Using the HP 4396B for Digital VTR Testing