HP-AN369-12_Measurement of Impedance of Magnetic Heads
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Transcript of HP-AN369-12_Measurement of Impedance of Magnetic Heads
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Preface
The market for magnetic heads isexpected to experience furtherexpansion due to a wide variety of industrial applications as well asconsumer electronic applications.In consumer electronics, the VTR
(video tape recorder) marketforms a large market for magneticheads. The digital VCR (videocassette recorder) and VTRmarkets are expected to expand,
benefiting the magnetic headmarket. In the industrial field,along with the market expansionof computer-related devices, themarket for both hard and floppydisks has continued to grow. In
addition, there is a high demandfor tape drives used for computer
back up.
In these areas, magnetic headswill be required to operate athigher frequencies to providehigher quality. The movement
towards higher picture quality,demonstrated in S-VHS's and evenhigher picture quality in highergrade VTR's, demands magneticheads to record and read signalsat higher frequencies. Hard andfloppy disk drives process amassive amount of data, thusrequiring high speed and highdensity recording and reading of the data.
In order to accurately check thequality of magnetic heads tosatisfy these requirements, it isnecessary to conductmeasurement under theconditions close to actualoperation in terms of operatingfrequency and applied current. Forthis purpose, it is important toconduct measurement at constantcurrent and to accurately measurethe impedance value even at highfrequencies. An LCR meter used
for measurement of magneticheads is required to measure atconstant current and at a widerange of frequencies. As well as
being highly accurate, it must beeasy and cost effective to use.Development of a measuringdevice satisfying all theserequirements at frequencies over1 MHz had been long awaited.
(Table 1 shows "Applications of Magnetic Heads, Typical
Operating Frequency andMeasurement Range for each Application")
This application note will presentsolutions which make use of theHP 4285A, when such magneticheads operating at relatively highfrequencies are inspected on the
production line, and assessed fortheir device characteristics.
Measurement of Impedance of Magnetic Headsin Conducting an Inspection on the Production Line
and Assessing Device Characteristics
Application Note 369-12The HP 4285APrecision LCR Meter
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How to Use an LCR Meter forMeasuring Magnetic Heads
When magnetic heads areassessed using an LCR meter, thefollowing items are normallymeasured. The objectives formeasurement and assessment arealso listed in the following.
The Items to be Measured andConditions for ConductingMeasurement of MagneticHeads on the Production Line
A. The Items Measured
1) L (Inductance)Compared with the prescribed
value obtained from data onmagnetic heads of good quality,check for any abnormality.
Measurement objectivesa) Checking for defects or flaws of the magnetic head materials
b) Checking for the number of coilturnsc) Checking for abnormalconfiguration including the widthof head gap
2) Q (Purity of reactance)
Measurement objective Assessment of losses such aseddy-current loss
3) | Z | - (Impedance)Compared with the prescribed
value obtained from data onmagnetic heads of good quality,check for any abnormality in thematerials and/or configuration of
magnetic heads.
Measurement objectiveChecking for the resonantfrequency
B. Measurement Conditionsand Method
Conducting measurement atconstant current (The constantcurrent should be applied inconducting measurement becausethe magnetic head characteristics
change depending on the currentlevel.)Covering the range of frequencyrequired for measuring magneticheads and providing high accuracyGo/No-Go measurement(Measurement to see if a magnetichead operates or not.)Interface available for measuringscanners which are capable of multidevice measurement
The Items Measured andConditions for Assessing theMagnetic Head Characteristics
In addition to the items andconditions for measurement onthe production line mentionedabove, assessment of devicecharacteristics requires thefollowing:
Sweep measurement at multiple
frequenciesSelection of multiplemeasurement parametersFlexible setting of measurementconditions such as frequencies to
be measured at and the input levelof voltage, current and electric
power
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Application ofMagnetic Heads
Typical OperatingFrequency
Measurement Range foreach Application
Measurement atConstant Current
Audio Head 12.5 KHz 1 KHz 100 uAp-p
VHS Head ~5 MHz 5 MHz 100 uAp-p
High8 VCR head ~7.7 MHz 5 MHz 1 mAp-p
High Definition VTR Head 20M~76 MHz Various Various
Professional Digital VCR Head 30~40 MHz Various Various
6mm Digital VCR Head ~22 MHz 10 MHz 40 mAp-p
Thin Film Head ~40 MHz 1 MHz 30~40 mAp-p
MR Head ~100 MHz 1 MHz 10~14 mAp-p(MR)30~40 mAp-p(Ind)
Floppy Disk Head ~100 KHz 1 KHz 4~7 mAp-p
DDS-DAT Head ~5 MHz 5 MHz 24 mAp-p
Table 1. Application of Magnetic Heads, Typical Operating Frequency and Measurement Range
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Problems of ConventionalDevices used for MeasuringMagnetic Heads, and Solutionsbrought by the HP 4285A and
its Features
The HP 4285A's special featureswill provide a powerful solution toeach problem conventionalmagnetic head measuring devicesface.
1) Measurement at ConstantCurrentFor accurate assessment of magnetic heads, impedance must
be measured at constant current because the inductance value of amagnetic head changes dependingon the current level. Mostconventional measuring devicesdo not allow measurement atconstant current when thefrequency is over 1 MHz. Evenwhen this is possible, you mightfind them unsatisfactory, becauseyou cannot select the value of constant current.
The HP 4285A is equipped with Automatic Level Control (ALC).This ALC function allows you toset the current level
(100 A-20 mA) as you wish. Onceyou set the level, the HP 4285Aautomatically controls the current,thus making it easy to performmeasurement of magnetic headsat constant current.
2) A Wide Measuring Range of Frequency and High AccuracyWith conventional LCR meters, itis technically difficult to measurewith high accuracy at highfrequencies up to tens of MHz.
The HP 4285A performsmeasurement at a wide range of frequency ranging from 75 kHz to30 MHz, and ensures highaccuracy within 0.1%. It isequipped with a powerful errorcorrection function called"Open/Short/Load" to eliminate theerror residual of the testingdevice.
3) Easy-to-use Functions on theProduction Line, includingGo/No-Go MeasurementIn order to save time and labor for
switching devices beforemanufacturing a new lot on the
production line, it is essential thata device allow as simple set-upsas possible, including a set-up of measurement conditions. Thedevice is also required torecognize if a magnetic head isoperating as desired or not.
The HP 4285A is capable of storing ten sets of set-upinformation such as measurement
conditions in its internal memory,and ten more sets on a memorycard. This feature permits easyset-up for measurement on the
production line. In addition, theHP 4285A is equipped with a
variety of functions useful for production such as a simple,flexible set-up of Go/No-Gomeasurement and BIN's. Aninterface is available toaccommodate scanners andhandlers.
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Graph 1. Inductance Characteristics of the Magnetic HeadFrequency (HZ) (Measured using the HP 4194A)
Graph 2. Impedance Characteristics of the Magnetic HeadFrequency (HZ) (Measured using the HP 4194A)
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4) Sweep Measurement atMultiple Frequencies
A measuring device used forassessment of magnetic head
characteristics needs to have afunction which specifically selectsmultiple frequencies for sweepmeasurement.
The HP 4285A allows sweepmeasurement by entering up toten frequencies of your choice. Italso presets the limit to themeasured value for everyfrequency selected, thus allowingeasy Go/No-Go measurement.
5) Setting up FlexibleMeasurement Conditions Assessment of magnetic headcharacteristics requires setting upflexible measurement conditions.The HP 4285A has twentycombinations of presetmeasurement parameters. Thus,you only need to choose one. Youcan enjoy flexibility of setting upmeasurement conditions such asthe frequency to be measured, theinput voltage/current level and the
direct current bias.
An Example
The measurement functions of theHP 4285A will be presented using
measurement of hard diskmagnetic heads as an example.
1) The Hard Disk Magnetic HeadsMeasured and theirCharacteristicsa) Device measured: hard diskmagnetic heads
b) Device characteristics
The impedance characteristics of the hard disk magnetic headsmeasured (Ls - Q, | Z | - ) areshown in graphs 1 and 2.(Measured using the HP 4194A.)
In measuring magnetic heads onthe production line, theircharacteristics are not measuredat all levels of frequency. Instead,the actual method used isdesigned to achieve highmeasurement efficiency. Asmentioned above, the methoddetermines Go or No-Go bymeasuring the value of parametersat specifically selectedfrequencies and setting up limit
values.
2) Set-up for MeasurementThe set-up for measurement isshown in diagram 3.
HP 4285A
HP 16047CTest Fixture
MagneticHead
Diagram 3. Set-up for Measurement
3) ResultsThe hard disk magnetic headsused in assessment of inductanceand impedance characteristicsdemonstrated in graphs 1 and 2were measured using theHP 4285A, equipped with specialfeatures such as a sweepmeasurement function at flexiblefrequencies, a Go/No-Gomeasurement function and a BINfunction. The results aredescribed in the following.
Chart 4 shows the results of sweep measurement in which theinductance characteristics Ls - Qare measured at ten selectedfrequencies. Chart 5 shows how toset up frequencies to be measuredat, and the high and low limit
values. On the display as shown inChart 5, the selected frequenciesto be measured at are set up in theFREQ [Hz] column, the high andlow limit values needed forGo/No-Go measurement areentered for each frequency level inthe HIGH and LOW columns, andthe selected measurement
parameter in the LMT column.
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asshown in the chart 4 displays themeasurement results at eachfrequency level and the results of
Go/No-Go measurement in theCMP column. Chart 6 displays theresults of binning in which thedevices are measured for theirimpedance value | Z | at a specificfrequency, and then classified intothe nine preset bins (BIN's1 through 9) or OUT OF BINS. Thedesired impedance value is set inthe NOM column, and the lowerand upper limit values from thedesired value are set for the BIN's1 through 9 in the LOW and HIGHcolumns, respectively.
The COUNT column shows thenumber of devices classified intothat bin. The lower and upperlimit values can be entered by theabsolute value as well as by
percentage, which allows flexiblesetups. The limit value of usedas the second parameter can also
be set in the row labeled "2nd."
Conclusion
A magnetic head measuringdevice must have a function which
maintains constant current. TheHP 4285A allows you to set up anyspecific value of constant currentwithin the range of 100 A-20 mA,and to automatically control it.Furthermore, the HP 4285A isequipped with a function tomeasure magnetic heads with highaccuracy even at high frequency(75 kHz -30 MHz) which cannot becovered by the conventional LCRmeters. In addition to this feature,it is also equipped with aGo/No-Go function, a memorycard, and several functions whichmake it easy to use the device onthe production line. Therefore, theHP 4285A is the most suitabledevice for performingmeasurements on magnetic headsoperating at relatively highfrequencies. This LCR meter alsoserves various other purposes,including measurement andassessment of magnetic storagecomponents such as rotarytransformers used in VTR's.
The HP 4285A offers powerfulsolutions to problems thatconventional LCR meters cannotovercome in measuring magneticheads. The HP 4285A is furnishedwith functions ranging from
production line inspection toassessment of devicecharacteristics.
If a device must be measured athigher frequencies due to itshigher operating speed, theHP 4219A RF impedance/material
analyzer or the HP 4286A RF LCRmeter may best suit your needs.
Chart 4. Sweep Measurement Results of Ls - Q, and Go/No-Go MeasurementResults
Chart 5. Setting up Ls - Q SweepMeasurement Frequencies andGo/No-Go Limit Values
Chart 6. Results of BINNING based onthe Impedance Value | Z |
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For more information on Hewlett-PackardTest and Measurement products,applications, or services please call yourlocal Hewlett-Packard sales office. Acurrent listing is available via the Web
through AccessHP at http://www.hp.com. If you do not have access to the internet, please contact one of the HP centers listed below and they will direct you to yournearest HP representative.
United States:Hewlett-Packard CompanyTest and Measurement Organization5301 Stevens Creek Blvd.Bldg. 51L-SCSanta Clara, CA 95052-80591 800 452 4844
Canada:Hewlett-Packard Canada Ltd.5150 Spectrum Way
Mississauga, OntarioL4W 5G1(905) 206 4725
Europe:Hewlett-PackardEuropean Marketing CentreP.O. Box 9991180 AZ AmstelveenThe Netherlands
Japan:Hewlett-Packard Japan Ltd.Measurement Assistance Center9-1, Takakura-Cho, Hachioji-Shi,Tokyo 192, JapanTel: (81 426) 56 7832
Fax: (81 426) 56 7840
Latin America:Hewlett-PackardLatin American Region Headquarters5200 Blue Lagoon Drive9th FloorMiami, Florida 33126U.S.A.(305) 267 4245/4220
Australia/New Zealand:Hewlett-Packard Australia Ltd.31-41 Joseph StreetBlackburn, Victoria 3130
Australia1 800 629 485
Asia Pacific:Hewlett-Packard Asia Pacific Ltd17-21/F Shell Tower, Times Square,1 Matheson Street, Causeway Bay,Hong KongFax: (852) 2506 9285
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Data subject to changeCopyright 1997Hewlett-Packard CompanyPrinted in U.S.A. 1/975965-6663E