MMD70R600P

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    MMD70R600P Datasheet

    Jun. 2014 Revision 1.0 MagnaChip Semiconductor Ltd .1

    Parameter Value Unit

    VDS @ T j,max 750 V

    RDS(on),max 0.6 Ω

    VTH,typ 3 V

    ID 7.3 A

    Q g,typ 23 nC

    Order Code Marking Temp. Range Package Packing RoHS Status

    MMD70R600PRH 70R600P -55 ~ 150 ℃ TO-252 Reel Halogen Free

    MMD70R600P700V 0.6 N-channel MOSFET

    Description

    MMD70R600P is power MOSFET using magnachip ’ s advanced super junction technology that canrealize very low on-resistance and gate charge. It will provide much high efficiency by usingoptimized charge coupling technology. These user friendly devices give an advantage of Low EMI todesigners as well as low switching loss.

    Features

    Low Power Loss by High Speed Switching and Low On-Resistance 100% Avalanche Tested

    Green Package – Pb Free Plating, Halogen Free

    Key Parameters

    Ordering Information

    Applications

    PFC Power Supply Stages

    Switching Applications

    Adapter

    Motor Control

    DC – DC Converters

    D GS

    G

    D

    S

    Package & Internal Circuit

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    MMD70R600P Datasheet

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    Parameter Symbol Rating Unit Note

    Drain – Source voltage V DSS 700 V

    Gate – Source voltage V GSS ± 30 V

    Continuous drain current I D 7.3 A T C=25℃

    4.6 A T C=100 ℃

    Pulsed drain current (1) IDM 21.9 A

    Power dissipation P D 71 W

    Single - pulse avalanche energy E AS 142 mJ

    MOSFET dv/dt ruggedness dv/dt 50 V/ns

    Diode dv/dt ruggedness dv/dt 15 V/ns

    Storage temperature T stg -55 ~150 ℃

    Maximum operating junctiontemperature T j 150

    1) Pulse width t P limited by T j,max

    2) I SD ≤ ID, VDS peak ≤ V(BR)DSS

    Parameter Symbol Value Unit

    Thermal resistance, junction-case max R thjc 1.75 ℃ /W

    Thermal resistance, junction-ambient max R thja 62.5 ℃ /W

    Thermal Characteristics

    Absolute Maximum Rating (T c=25 unless otherwise specified)

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    MMD70R600P Datasheet

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    Parameter Symbol Min. Typ. Max. Unit Test Condition

    Drain – SourceBreakdown voltage V(BR)DSS 700 - - V V GS = 0V, I D=0.25mA

    Gate Threshold Voltage V GS(th) 2 3 4 V V DS = V GS, ID=0.25mA

    Zero Gate VoltageDrain Current IDSS - - 1 μ A V DS = 700V, V GS = 0V

    Gate Leakage Current I GSS - - 100 nA V GS = ±30V, V DS =0V

    Drain-Source OnState Resistance RDS(ON) - 0.54 0.6 Ω VGS = 10V, I D = 2.1A

    Parameter Symbol Min. Typ. Max. Unit Test Condition

    Input Capacitance C iss - 681 -

    pF

    VDS = 25V, V GS = 0V,f = 1.0MHzOutput Capacitance C oss - 34.9 -

    Reverse Transfer Capacitance C rss - 470 -

    Effective Output CapacitanceEnergy Related (3) Co(er) - 22 - VDS = 0V to 560V,VGS = 0V,f = 1.0MHz

    Turn On Delay Time t d(on) - 14.4 -

    ns VGS = 10V, R G = 25Ω, VDS = 350V, I D = 7.3A

    Rise Time t r - 27.6 -

    Turn Off Delay Time t d(off) - 68 -

    Fall Time t f - 26 -

    Total Gate Charge Q g - 23 -

    nC VGS = 10V, V DS =560VID = 7.3AGate – Source Charge Q gs - 4.3 -

    Gate – Drain Charge Q gd - 13 -

    Gate Resistance R G - 3.2 - Ω VGS = 0V, f = 1.0MHz

    3) C o(er) is a capacitance that gives the same stored energy as C OSS while V DS is rising from 0V to 80% V (BR)DSS

    Static Characteristics (T c =25 unless otherwise specified)

    Dynamic Characteristics (T c=25 unless otherwise specified)

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    MMD70R600P Datasheet

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    Parameter Symbol Min. Typ. Max. Unit Test Condition

    Continuous Diode ForwardCurrent ISD - - 7.3 A

    Diode Forward Voltage V SD - - 1.4 V I SD = 7.3 A, VGS = 0 V

    Reverse Recovery Time t rr - 344 - nsISD = 7.3 Adi/dt = 100 A/μs VDD = 100 V

    Reverse Recovery Charge Q rr - 4.3 - μC

    Reverse Recovery Current I rrm - 13.4 - A

    Reverse Diode Characteristics (T c=25 unless otherwise specified)

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    MMD70R600P Datasheet

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    Characteristic Graph

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    MMD70R600P Datasheet

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    MMD70R600P Datasheet

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    Test Circuit

    VDS

    10V

    1mA DUT

    100K Ω

    10V

    Same type as DUT

    +

    -

    VDD

    DUT

    +

    -

    Same type as DUT

    VDS+-

    IS

    R g10K Ω

    Vgs ± 15V

    L

    IF

    VDD

    DUT

    +

    -

    ID

    VDS

    Vgstp

    RL

    VDD

    DUT

    +

    -

    I AS

    VDS

    R g

    Vgstp

    L

    10V

    VGS

    Charge

    Qg

    Q gs Qgd

    VDS

    VGS

    90%

    10%

    Td(on) tr

    ton

    Td(off) tf

    toff

    VDD

    tp t AV

    VDS(t)

    BVDSS

    I AS

    Rds(on) * I AS

    trr

    ta tbIFM

    IRM

    d i/d t

    0.25 I RM

    0.75 I RM

    0.5 I RM

    VR

    VRM(REC)

    Fig15-1. Gate charge measurement circuit Fig15-2. Gate charge waveform

    Fig16-1. Diode reverse recovery test circuit Fig16-1. Diode reverse recovery test waveform

    Fig17-1. Switching time test circuit for resistive load Fig17-2. Switching time waveform

    Fig18-1. Unclamped inductive load test circuit Fig18-2. Unclamped inductive waveform

    R g25 Ω

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    MMD70R600P Datasheet

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    Physical Dimensions

    TO-252 (D-PAK) , 3L

    Dimensions are in millimeters, unless otherwise specified

    Worldwide Sales Support Locations

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    MMD70R600P Datasheet

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    DISCLAIMER:

    The Products are not designed for use in hostile environments, including, without limitation, aircraft, nuclear powergeneration, medical appliances, and devices or systems in which malfunction of any Product can reasonably beexpected to result in a personal injury. Seller’s customers using or selling Seller’s products for use in suchapplications do so at their own risk and agree to fully defend and indemnify Seller.

    MagnaChip reserves the right to change the specifications and circuitry without notice at any time. MagnaChip does not consider responsibilityfor use of any circuitry other than circuitry entirely included in a MagnaChip product. is a registered trademark of MagnaChipSemiconductor Ltd.