Intrinsic Parameter Fluctuations in Conventional MOSFETs at the scaling Limit: A Statistical Study

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Intrinsic Parameter Fluctuations in Conventional MOSFETs at the scaling Limit: A Statistical Study. * F. Adamu-Lema, G. Roy, A. R. Brown, A. Asenov and S. Roy Device Modelling Group, University of Glasgow, Department of EEE, Rankine Building, G12 8LT, Scotland, UK * [email protected]. - PowerPoint PPT Presentation

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