Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering,...

32
esign and Implementation of VLSI System (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 sources: Sedra/Prentice Hall, Saint/McGrawHill, Weste/Addison Wesle
  • date post

    21-Dec-2015
  • Category

    Documents

  • view

    226
  • download

    0

Transcript of Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering,...

Page 1: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice.

Design and Implementation of VLSI Systems(EN1600)lecture04

Sherief RedaDivision of Engineering, Brown University

Spring 2008

[sources: Sedra/Prentice Hall, Saint/McGrawHill, Weste/Addison Wesley]

Page 2: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice.

Lecture 03: CMOS fabrication

http://www.appliedmaterials.com/HTMAC/animated.html

Page 3: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice.

Fabricating one transistor

Oxidation(Field oxide)

Silicon substrate

Silicon dioxideSilicon dioxide

oxygen

PhotoresistDevelop

oxideoxide

PhotoresistCoating

photoresistphotoresist

Mask-WaferAlignment and Exposure

Mask

UV light

Exposed Photoresist

exposedphotoresistexposed

photoresist

GGS D

Active Regions

top nitridetop nitride

S DGG

silicon nitridesilicon nitride

NitrideDeposition

Contact holes

S DGG

ContactEtch

Ion Implantation

resis

t

resis

t

resis

t

resis

t

oxox D

G

Scanning ion beam

S

Metal Deposition and

Etch

drainS DGG

Metal contacts

PolysiliconDeposition

polysiliconpolysilicon

Silane gas

Dopant gas

Oxidation(Gate oxide)

gate oxidegate oxide

oxygen

PhotoresistRemove

oxideoxide

RF P

ower

RF P

ower

Ionized oxygen gas

OxideEtch

photoresistphotoresistoxideoxide

RF P

ower

RF P

ower

Ionized CF4 gas

PolysiliconMask and Etch

RF P

ower

RF P

ower

oxideoxideoxideoxide

Ionized CCl4 gas

poly

gat

e

poly

gat

e

RF P

ower

RF P

ower

Page 4: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice.

Top view

n+

p

GateSource Drain

bulk Si

SiO2

Polysilicon

n+

SiO2

n

GateSource Drain

bulk Si

Polysilicon

p+ p+

Page 5: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice.

Wafer preparation

Page 6: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice.

Start with P substrate

Page 7: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice.

1. Spin Resist Coating

Page 8: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice.

2. Expose N Well Mask

Page 9: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice.

3. Develop resist

Page 10: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice.

4. Implant N Well

Page 11: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice.

5. Remove Resist

Page 12: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice.

Anneal wafer to diffuses N well (heal lattice) and grow new oxide layer

Page 13: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice.

Remove oxide from anneal

Page 14: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice.

1. Spin Resist

Page 15: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice.

2. Expose resist with active diffusion mask

Page 16: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice.

3. Develop resist

Page 17: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice.

4. Grow oxide on exposed surface

Page 18: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice.

5. Strip resist

Page 19: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice.

Grown thin oxide over silicon surfaces

Page 20: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice.

1. Deposit poly using Chemical Vapor Deposition (CVD)

Page 21: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice.

2. Spin resist 3. expose resist using the GATE mask 4. develop resist 5. etch poly

Page 22: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice.

Remove thin oxide layer where exposed

Page 23: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice.

1. Spin resist 2. expose with P implant mask 3. develop resist 4. implant P 5. strip resist

Page 24: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice.

1. Spin resist 2. expose with N implant mask 3. develop resist 4. implant N 5. strip resist

Page 25: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice.

Remove resist – anneal wafer – oxide etch

Page 26: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice.

Grow oxide 1. spin resist 2. expose Contact mask 3. develop resist 4. etch contacts 5. strip resist

Page 27: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice.

1. Deposit metal L1 2. spin resist 3. expose metal L1 mask 4. develop resist 5. etch metal 6. strip resist

Page 28: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice.

Rest of metal layers follow similarly

Page 29: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice.

Printing masks

Page 30: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice.

The printerIlluminator optics

Beam line

Excimer laser (193 nm ArF )

Operator console

4:1 Reduction lens NA = 0.45 to 0.6

Wafer transport system

Reticle stage

Auto-alignment system

Wafer stage

Reticle library (SMIF pod interface)

Page 31: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice.

Photolithography is used to print desired patterns on the wafer

UV light

Reticle field size20 mm 15mm,4 die per field

5:1 reduction lens

Wafer

Image exposure on wafer 1/5 of reticle field4 mm 3 mm,4 die per exposure

Serpentine stepping

pattern

The feature size directly depends on the wavelength of your lithographic system

masks

Page 32: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice.

Cross section of a 7-metal layer IC

Next time:How to print different gates?