Class 02 Transistors I

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    Jose h A. Elias PhD 1

    Class 02: Transistors I

    Topics:

    What is a transistor? History of transistorsViews of an n-type transistor

    schematic and cross section

    channel length, channel width

    Where are we headed? Final cross section for CMOSCMOS vs. NMOS

    Layout layers for a transistor

    Layout and Cross section for an NMOS transistor

    CMOS Formation

    Substrate and Doping

    Why Isolate?

    Isolation, NwellVt Adjust

    Poly

    P+ Diffusion

    N+ DiffusionFinal Cross Section for CMOS

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    Jose h A. Elias PhD 2

    Class 02: Transistors I

    Transistor - trans(fer) (res)istor

    NFET (PFET) - n-type (p-type) field effect transistor

    NMOS (PMOS) - n-type (p-type) metal oxide semiconductor (misnomer)

    MESFET - metal semiconductor FET

    MISFET - metal insulator FET

    IGFET - insulated gate FETJFET - junction FET (BJT - Bipolar Junction Transistor)

    History:

    1875 - Selenium shown to have rectifying and optoelectronic properties

    1906 - Silicon used for diode to detect radio waves1935 - Selenium rectifiers and photodetectors commercially availabe

    WWII - Radar spurs growth of Silicon and Germanium research

    1948 - Point contact transistor by Bardeen and Brattain (Bell Labs)

    1949 - Junction diodes and junction transistors by Shockley (Bell Labs)

    1949 - Single crystal (as opposed to polycrystalline) silicon developed1952 - Grown junction germanium transistors by Shockley (Bell Labs)

    1954 - Grown junction silicon transistors by Texas Instruments

    1959 - Integrated circuit by Kilby (Texas Instruments)

    1961 - Silicon planar transistor by Hoerni (Fairchild)

    (References: Runyan and Bean, Yang, Sze)

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    Class 02: Transistors INMOS Cross Section (Martin p.91)

    Why is this important?

    W, L, S, D, G are fundamental to every aspect of IC design

    (circuit level, gate level, layout, simulation)Each transistor is the basically the same, so know one, you know them all

    gate

    source drain

    Substrate, bulk, well, or back gate

    A transistor

    has four terminals

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    Class 02: Transistors IFinal Cross Section for CMOS (Martin p. 47)

    Why is this important?

    Design Engineers: understanding of how transistors are formed leads to better designs

    Process Engineers: each step in the formation is related to the next

    Product Engineers: debugging of product-level issues involves cross sectionCAD/Layout Engineers: integrating rules and determining violations to layout

    Partial

    Layout

    Cross

    Section

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    Class 02: Transistors I

    CMOS - Complementary Metal Oxide Semiconductor

    NMOS - N-type Metal Oxide Semiconductor

    Assumptions for CMOS:Substrate is p-type

    Gate material is made of polysilicon

    The process is single-well (nwell)

    CMOS vs. NMOS:

    NMOS process uses n-type transistors only

    CMOS (complementary MOS) uses n- and p-type

    NMOS process has a substrate (p-type) no wells

    CMOS process has a substrate (p-type) and

    (usually) one well (nwell)

    CMOS vs. NMOS

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    Class 02: Transistors ILayout Layers for Transistor

    Drawn and MASK layers used to create a transistor:

    1) Well (aka substrate, tub, moat)

    nmos are in pwell, pmos are in nwell

    2) Diffusion , ACTIVE, NSELECT, PSELECT (aka diff)

    type of diffusion for Source/Drain set by well

    defines active vs. isolation (or field) regions

    3) Poly (aka gate)gate material over diff defines W and L of transistor

    4) Contact, CT-TO-ACTIVE, CT-TO-POLY (aka ct)

    defines how the source, drain, gate, and tap are contacted to higher levels

    5) Tap, ACTIVE, NSELECT, PSELECT

    defines contact to substrate or well

    heavily doped, same type as sub/well (i.e., n-type in nwell, p-type in p-substrate)

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    Class 02: Transistors ILayout and Cross Section - NMOS (Martin p.50)

    Isolation

    Region

    Isolation

    Region

    Isolation

    Region

    Isolation

    Region

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    Class 02: Transistors ICMOS Formation - Substrate, Doping

    Presently, most starting material (substrate) is p-type silicon

    Silicon is a group IV element (4 outer electrons)

    p-type dopants are ones with less electrons, or more holes (B)

    n-type dopants are ones with more electrons, or less holes (P, As)

    Research Areas:

    II-VI

    III-V

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    Class 02: Transistors ICMOS Formation - Why isolate? (Wolf p.18)

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    Class 02: Transistors ICMOS Formation - Isolation, Nwell (Martin p.42)

    nwell

    Diff-tap

    Deposit SiO2, Si3N4, photoresist (PR)

    Use DiffTap (aka moat, active) mask to define isolation regions. This is where

    transistors will NOT be located, which is the inverse of diffusion and tap regions

    Grow isolation (LOCOS), or etch silicon and deposit oxide (STI), strip Si3N4

    Deposit photoresist, expose NWELL mask, develop, implant N-type well (Phos)

    Optional : Implant field regions for channel stop (CS), punchthrough (PT)

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    Class 02: Transistors ICMOS Formation - Vt Adjust (Martin p.43)

    The order of events can vary, but in general:

    With NWELL pattern still on silicon, implant gate threshold adjust

    Strip thin oxide, regrow oxide to 30-100A (depending on process node)

    Done since oxide has been damaged due to implant

    Allows for gate oxide to be as clean as possible

    Purpose of Vt adjust will become apparent further in the semester

    Implant will show up here

    as well, but be counter-dope

    later in the process

    nwell

    Diff-tap

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    Class 02: Transistors ICMOS Formation - Poly (Martin p. 44)

    Deposit polysilcon everywhere on wafer, deposit PR

    Use POLY mask to define regions where poly is to remain

    Expose, develop PR; etch polysilicon; implant poly with P or As

    nwell

    Diff-tap

    poly

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    Class 02: Transistors ICMOS Formation - P+ diffusion (Martin p.45)

    Use Diff-Tap layout to generate, or manually draw p-diff mask

    Size up the diff-tap region to account for misalignment

    Implant is self-aligned to gate, as gate acts as a mask

    nwell

    Diff-tap

    poly

    Pdiff

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    Class 02: Transistors ICMOS Formation - N+ diffusion (Martin p. 45)

    Use Diff-Tap layout to generate, or manually draw n-diff mask

    Size up the diff-tap region to account for misalignment

    Implant is self-aligned to gate, as gate acts as a mask

    Taps should NOT cross well boundaries!

    nwell

    poly

    Pdiff Ndiff

    Incorrect

    tap to well

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    Class 02: Transistors IFinal Cross Section for CMOS (Martin p. 47)

    Further processing:

    CT (contact) mask to open up regions in thin oxide to contact diff

    CT (contact) mask to open up regions over poly to contact gates

    Deposition of ILD (inter-level dielectric) , shown as CVD SiO2

    MET1 (metal 1) mask to identify routing

    Deposition of ILD, VIA mask to contact MET1, MET2 mask to route

    Deposition of PO (protective oxide), shown as Overglass