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Technical ProgramCommitteeProgram Chair

Donald WheaterIBM MicroelectronicsM/S 963GRiver RoadEssex Junction, VT 05452, USATel: 1-802-769-7261Email: dwheater@us.ibm.com

Program Vice Chair

Robert AitkenAgilent Technologies51LGO5301 Stevens Creek BlvdSanta Clara, CA 95051-8059, USATel: 1-408-345-8800Email: rob_aitken@agilent.com

Past Program Chair

Wayne Needham901 E. Juanita AveGilbert, AZ 85234, USATel: 1-602-545-8127Email: wmn@computer.org

Area Topic Coordinators - Analog/Mixed-Signal

Gordon RobertsMcGill University3480 University StreetMontreal, PQ H3A 2A7, CanadaTel: 1-514-398-6029Email: roberts@macs.ece.mcgill.ca

Area Topic Coordinators - ATE

Justin WoykeIBM963G1000 River StreetEssex Junction, VT 5452, USATel: 1-802-769-1445Email: jwoyke@us.ibm.com

Area Topic Coordinators - Board,Online, Production, and System

Anthony AmblerUniversity of Texas at AustinMS C0803Austin, TX 78712, USATel: 1-512-475-6153Email: ambler@ece.utexas.edu

Area Topic Coordinators - Defects,Diags, IDDQ, MEMS, Safety-CriticalApplications

Jerry SodenSandia National LaboratoriesPO Box 5800, MS-1081Albuquerque, NM 87185-1081, USATel: 1-505-845-8575Email: sodenjm@sandia.gov

Area Topic Coordinators - DFT, CaseStudies, Economics, Stds

Kenneth ButlerTexas Instruments12500 TI Boulevard MS 8645Dallas, TX 75243, USATel: 1-214-480-1431Email: kenb@ti.com

Area Topic Coordinators - Logic-ATPG, Flt Mdl, BIST, Synth, FPGA

Scott DavidsonSun MicrosystemsUMPK 14-108901 San Antonio RoadPalo Alto, CA 94303-4900, USATel: 1-650-786-7256Email: scott.davidson@sun.com

Area Topic Coordinators - MemoryTest

Rochit RajsumanAdvantest America R&D Center3201 Scott BlvdSanta Clara, CA 95054, USATel: 1-408-727-2222, ext 386Email: r.rajsuman@advantest-ard.com

Area Topic Coordinators - SOC(uP,Cores, MCM, Des/Val, HSD, KGD)

Mary KuskoIBMMS P310 Bldg. 7052455 South RoadPoughkeepsie, NY 12601, USATel: 1-845-435-6849Email: eleve@us.ibm.com

Topic Coordinators

ATE Hardware

Ben BrownTeradyne7670 SW Mohawk StreetTualatin, OR 97062, USATel: 1-503-612-6505Email: ben.brown@teradyne.com

Hideo OkawaraAgilent Technologies Japan, Ltd.B7-2-39-1 TakakurachoHachioji, Tokyo 192-8510, JapanTel: 81-426-60-2308Email: hideo_okawara@agilent.com

ATE Software

Art Downey4225 Sea Pines CourtCapitola, CA 95010, USATel: 1-408-930-0050Email: artdowney@cruzio.com

ATPG and Fault Modeling

Elizabeth RudnickUniversity of IllinoisCoordinated Science Laboratory1308 West Main StreetUrbana, IL 61801, USATel: 1-217-244-4659Email: liz@uiuc.edu

BIST

Kazumi HatayamaHitachi, Ltd.1-280 Higashi-koigakubo, KokubunjiTokyo 185-8601, JapanTel: 81-42-327-7877Email: k-hataya@crl.hitachi.co.jp

Benoit Nadeau-DostieLogicVision (Canada) Inc1525 Carling AvenueSuite 404Ottawa, Ontario K1Z 8R9, CanadaTel: 1-613-722-2051 #228Email: benoit@logicvision.com

Janusz RajskiMentor Graphics Corporation8005 SW Boeckman RdWilsonville, OR 97070, USATel: 1-503-685-4797Email: janusz_rajski@mentor.com

Board Test

Bernard SuttonGenRad Europe7, Parkfield DriveNantwich, C CW5 7DB, United KingdomTel: +44 1270 624 740Email: suttonb@genrad.com

Defects

Anne GattikerIBMMS904-6E00511400 Burnet Rd.Austin, TX 78727, USATel: +1-802-838-0884Email: gattiker@us.ibm.com

Design Validation

Sujit DeyUC San Diego407La Jolla, CA 92093, USATel: +1-858-534-0750Email: dey@ece.ucsd.edu

Prab VarmaVeritable Inc.800 W. El Camino Real, Suite 180Mountain View, CA 94040, USATel: +1-650-943-2398Email: prab@veritable.com

Design-for-Test

Anjali KinraTexas InstrumentsMS 70612203 Southwest Fwy, Bldg 2Stafford, TX 77477, USATel: +1-281-274-3561Email: anjali@ti.com

Christian LandraultLIRMM/University161 rue ADAMONTPELLIER 34392, FranceTel: +33- 467-418524Email: landraul@lirmm.fr

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InternationalTest Conference

2001Technical Program

Committee

Design-for-Test (cont'd)

Anne MeixnerIntel CorpRA1-3315200 NE Elam Young ParkwayHillsboro, OR 97124-1976, USATel: +1-503-613-8755Email: anne.meixner@intel.com

Raj RainaMotorola Inc. - Somerset PowerPC DesignCenterOE707700 West Parmer Lane, MD: PL30Austin, TX 78729, USATel: +1-512 996 4670Email: rajesh.raina@motorola.com

Embedded Core Test

Alex OrailogluUC San DiegoMC-01149500 Gilman DriveLa Jolla, CA 92093, USATel: +1-858-534-0914Email: alex@cs.ucsd.edu

Nur ToubaUniversity of Texas at AustinEngineering Science BuildingAustin, TX 78712-1084, USATel: +1-512-232-1456Email: touba@ece.utexas.edu

Yervant ZorianLogicVision101 Metro DriveSan Jose, CA 95110, USATel: +1-408-452-2427Email: zorian@lvision.com

Fault Models

Cecilia MetraUniversity of BolognaViale Risorgimento 2I-40136 Bologna, ItalyTel: +39-051-2093785Email: cmetra@deis.unibo.it

Karen PanettaTufts University161 College AvenueMedford, MA 02155, USATel: +1-617-627-5976Email: karen@eecs.tufts.edu

FPGA Test

Paolo PrinettoPolitecnico di TorinoCorso Duca degli Abruzzi, 29I-10129 Torino, TO, ItalyTel: +39-011-564-7007Email: Paolo.Prinetto@polito.it

High-Speed Digital Test

David KeezerGeorgia Institute of Technology777 Atlantic DriveAtlanta, GA 30332, USATel: +1-404-894-4741Email: dkeezer@ece.gatech.edu

IDDQ

Anne GattikerIBMMS904-6E00511400 Burnet Rd.Austin, TX 78727, USATel: +1-802-838-0884Email: gattiker@us.ibm.com

Cecilia MetraUniversity of BolognaViale Risorgimento 2I-40136 Bologna, ItalyTel: +39-051-2093785Email: cmetra@deis.unibo.it

Lecture Series

Jerry SodenSandia National LaboratoriesPO Box 5800, MS-1081Albuquerque, NM 87185-1081, USATel: +1-505-845-8575Email: sodenjm@sandia.gov

Craig SoldatAgilent TechnologiesMS53LFI5301 Stevens Creek BoulevardPO Box 58059, MS53LFISanta Clara, CA 95052, USATel: +1-408-553-6805Email: craig_soldat@agilent.com

MCM and KGD Test

David KeezerGeorgia Institute of Technology250777 Atlantic DriveAtlanta, GA 30332, USATel: +1-404-894-4741Email: dkeezer@ece.gatech.edu

Memory Test

Nobuaki OtsukaTOSHIBA CorporationAdvanced Memory Design Group4F, 2-5-1, Kasama, Sakae-kuYokohama 247-8585, JapanTel: +81-45-890-2424Email: nobuaki1.ootsuka@toshiba.co.jp

Tetsuo TadaMitsubishi Electric Corporation4-1, Mizuhara ItamiHyogo 664-8641, JapanTel: +81-727-84-7422Email: tada@lsi.melco.co.jp

MEMs Testing

Shawn BlantonECE DepartmentCarnegie Mellon University5000 Forbes AvenuePittsburgh, PA 15213-3890, USATel: +1-412-268-5241Email: blanton@ece.cmu.edu

Microprocessor Test

Magdy AbadirMotorolaPL307700 W. Parmer LaneAustin, TX 78729, USATel: +1-512-996-4906Email: abadir@ibmoto.com

Scott FetherstonSymbiosys3327 Sorrel Downs CourtPleasanton, CA 94588, USATel: +1-925- 462-2309Email: scott_fetherston@yahoo.com

Wayne Needham901 E. Juanita AveGilbert, AZ 85234, USATel: +1-602-545-8127Email: wmn@computer.org

Carol PyronMotorola, Inc.7700 West Parmer Lane, PL30Austin, TX 78729, USATel: +1-512-996-6096Email: carol.pyron@motorola.com

Mixed-Signal and Analog Test

Bozena KaminskaFluence Technology8700 S.W. Creekside PlaceBeaverton, OR 97008, USATel: +1-503-672-8739Email: bozena@fluence.com

Sandeep KumarAgere Systems555 Union Blvd. Rm. 23R131Allentown, PA 18109, USATel: +1-610-712-6186Email: skumar@agere.com

Stephen SunterLogicVision1525 Carling Ave., Suite 404Ottawa, ON K1Z 8R9, CanadaTel: +1-613-722-2051 ext 226Email: sunter@logicvision.com

On-line Test

Cecilia MetraUniversity of BolognaViale Risorgimento 2I-40136 Bologna, ItalyTel: +39-051-2093797Email: cmetra@deis.unibo.it

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INTERNATIONALTEST CONFERENCE2001

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Technical ProgramCommitteeOn-line Test (cont'd)

Michael NicolaidisIRoC TechnologiesWorld Trade CenterPO Box 151038025 Grenoble, FranceTel: +33 4 38 120 763Email: michael.nicolaidis@iroctech.com

Panels

Dilip BhavsarIntel334 South StreetShrewsbury, MA 01545, USATel: +1-508-841-2108Email: dilip.bhavsar@intel.com

Fidel MuradaliAgilent Technologies51L-G05301 Stevens Creek Blvd.Santa Clara, CA 95051, USATel: +1-408-345-8943Email: fidel_muradali@agilent.com

Carol StolicnyIntel334 South StreetShrewsbury, MA 01545, USATel: +1-508-841-3195Email: carol.stolicny@intel.com

Presentations Coordinator

Art Downey4225 Sea Pines CourtCapitola, CA 95010, USATel: 1-408-930-0050Email: artdowney@cruzio.com

Production Test Automation

Bernard SuttonGenRad Europe7, Parkfield DriveNantwich, C CW5 7DB, United KingdomTel: +44-1270 624 740Email: suttonb@genrad.com

RF Testing

Jeff KastenCredence Systems5975 NW Pinefarm PlaceHillsboro, OR 97124, USATel: +1-503-466-7643Email: jeff_kasten@credence.com

Safety-Critical Systems

Anthony AmblerUniversity of Texas at AustinMS C0803Austin, TX 78712, USATel: +1-512-475 6153Email: ambler@ece.utexas.edu

Jerry SodenSandia National LaboratoriesPO Box 5800, MS-1081Albuquerque, NM 87185-1081, USATel: +1-505-845-8575Email: sodenjm@sandia.gov

State-of-Practice Case Studies

Kenneth ButlerTexas Instruments12500 TI Boulevard MS 8645Dallas, TX 75243, USATel: +1-214-480-1431Email: kenb@ti.com

Test Synthesis

Kwang-Ting (Tim) ChengUniv. of CaliforniaDepartment of Electrical and ComputerEngineeringUniversity of CaliforniaSanta Barbara, CA 93106, USATel: +1-805-893-7294Email: timcheng@ece.ucsb.edu

Asian Subcommittee Chair

Hideo OkawaraAgilent Technologies Japan, Ltd.B7-2-39-1 TakakurachoHachioji, Tokyo 192-8510, JapanTel: +81-426-60-2308Email: hideo_okawara@agilent.com

Asian Subcommittee Vice Chair

Kazumi HatayamaHitachi, Ltd.1-280 Higashi-koigakubo, KokubunjiTokyo 185-8601, JapanTel: +81-42-327-7877Email: k-hataya@crl.hitachi.co.jp

Asian Subcommittee US Liason

Shigeru SugamoriAdvantest America R&D Center, Inc.3201 Scott BoulevardSanta Clara, CA 95054, USATel: +1-408-727-2222Email: s.sugamori@advantest-ard.com

Asian Subcommittee

Tetsuo TadaMitsubishi Electric Corporation4-1, Mizuhara ItamiHyogo 664-8641, JapanTel: +81-727-84-7422Email: tada@lsi.melco.co.jp

European Subcommittee Chair

Christian LandraultLIRMM/University161 rue ADAMontpellier 34392, FranceTel: +33 467 41 85 24Email: landraul@lirmm.fr

ITC Office Coordinator

Carla BattleCourtesy Associates2000 L Street, N.W., Suite 710Washington, DC 20036, USATel: +1-202-973-8665Email: cbattle@courtesyassoc.com

Latin American Liaison

Fabian VargasElectrical Engineering DepartmentCatholic UniversityAv. Ipiranga, 6681Porto Alegre, RS 90619-900, BrazilTel: +55-51-99918612Email: vargas@computer.org

Program Chair Emeritus Advisor

Gordon RobinsonThird Millennium Test Solutions2150 Bering DriveSan Jose, CA 95131, USATel: +1-408-435-1788Email: gordon_robinson@3mts.com

TTTC Liason

Paolo PrinettoPolitecnico di TorinoCorso Duca degli Abruzzi, 29I-10129 Torino, TO, ItalyTel: +39-011-564-7007Email: Paolo.Prinetto@polito.it

VLSI Test Symposium Liaison

Yervant ZorianLogicVision101 Metro DriveSan Jose, CA 95110, USATel: +1-408-452-2427Email: zorian@lvision.com

Web Site Coordinator

Burnell WestSchlumberger Semiconductor Solutions150 Baytech DriveSan Jose, CA 95134-2302, USATel: +1-408-586-6824Email: west@ieee.org

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INTERNATIONALTEST CONFERENCE2001

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International Test Conference 2001Technical Program Committee

1. Gordon Roberts2. Hideo Okawara3. Rochit Rajsuman4. Fidel Muradali5. Robert Aitken6. Anthony Ambler7. Donald Wheater8. Bozena Kaminska9. Anjali Kinra10. Mary Kusko11. Gordon Robinson12. Yervant Zorian13. Katzumi Hatayama14. Anne Gattiker15. Carol Stolicny16. Ben Brown17. David Keezer18. Prab Varma19. Dilip Bhavsar20. Christian Landrault21. Cecilia Metra22. Craig Soldat23. Bernard Sutton24. Alex Orailoglu25. Jeff Kasten26. Paolo Prinetto27. Elizabeth Rudnick28. Nobuaki Otsuka29. Shigeru Sugamori30. Jerry Soden31. Art Downey32. Tetsuo Tada33. Justin Woyke34. Sandeep Kumar35. Nur Touba36. Kenneth Butler

Not Shown: Magdy Abadir, ShawnBlanton, Kwang-Ting (Tim) Cheng,Scott Davidson, Sujit Dey, ScottFetherston, Anne Meixner, BenoitNadeau-Dostie, Wayne Needham,Michael Nicolaidis, Karen Panetta,Carol Pyron, Raj Raina, JanuszRajski, Stephen Sunter, FabianVargas, Burnell West