Technical Program Committee - IEEE Computer Society · Tel: 1-408-345-8800 Email: ... University of...
4
4 INTERNATIONAL TEST CONFERENCE 2001 ® Technical Program Committee Program Chair Donald Wheater IBM Microelectronics M/S 963G River Road Essex Junction, VT 05452, USA Tel: 1-802-769-7261 Email: [email protected] Program Vice Chair Robert Aitken Agilent Technologies 51LGO 5301 Stevens Creek Blvd Santa Clara, CA 95051-8059, USA Tel: 1-408-345-8800 Email: [email protected] Past Program Chair Wayne Needham 901 E. Juanita Ave Gilbert, AZ 85234, USA Tel: 1-602-545-8127 Email: [email protected] Area Topic Coordinators - Analog/ Mixed-Signal Gordon Roberts McGill University 3480 University Street Montreal, PQ H3A 2A7, Canada Tel: 1-514-398-6029 Email: [email protected] Area Topic Coordinators - ATE Justin Woyke IBM 963G 1000 River Street Essex Junction, VT 5452, USA Tel: 1-802-769-1445 Email: [email protected] Area Topic Coordinators - Board, Online, Production, and System Anthony Ambler University of Texas at Austin MS C0803 Austin, TX 78712, USA Tel: 1-512-475-6153 Email: [email protected] Area Topic Coordinators - Defects, Diags, IDDQ, MEMS, Safety-Critical Applications Jerry Soden Sandia National Laboratories PO Box 5800, MS-1081 Albuquerque, NM 87185-1081, USA Tel: 1-505-845-8575 Email: [email protected] Area Topic Coordinators - DFT, Case Studies, Economics, Stds Kenneth Butler Texas Instruments 12500 TI Boulevard MS 8645 Dallas, TX 75243, USA Tel: 1-214-480-1431 Email: [email protected] Area Topic Coordinators - Logic- ATPG, Flt Mdl, BIST, Synth, FPGA Scott Davidson Sun Microsystems UMPK 14-108 901 San Antonio Road Palo Alto, CA 94303-4900, USA Tel: 1-650-786-7256 Email: [email protected] Area Topic Coordinators - Memory Test Rochit Rajsuman Advantest America R&D Center 3201 Scott Blvd Santa Clara, CA 95054, USA Tel: 1-408-727-2222, ext 386 Email: [email protected] Area Topic Coordinators - SOC(uP, Cores, MCM, Des/Val, HSD, KGD) Mary Kusko IBM MS P310 Bldg. 705 2455 South Road Poughkeepsie, NY 12601, USA Tel: 1-845-435-6849 Email: [email protected] Topic Coordinators ATE Hardware Ben Brown Teradyne 7670 SW Mohawk Street Tualatin, OR 97062, USA Tel: 1-503-612-6505 Email: [email protected] Hideo Okawara Agilent Technologies Japan, Ltd. B7-2-3 9-1 Takakuracho Hachioji, Tokyo 192-8510, Japan Tel: 81-426-60-2308 Email: [email protected] ATE Software Art Downey 4225 Sea Pines Court Capitola, CA 95010, USA Tel: 1-408-930-0050 Email: [email protected] ATPG and Fault Modeling Elizabeth Rudnick University of Illinois Coordinated Science Laboratory 1308 West Main Street Urbana, IL 61801, USA Tel: 1-217-244-4659 Email: [email protected] BIST Kazumi Hatayama Hitachi, Ltd. 1-280 Higashi-koigakubo, Kokubunji Tokyo 185-8601, Japan Tel: 81-42-327-7877 Email: [email protected] Benoit Nadeau-Dostie LogicVision (Canada) Inc 1525 Carling Avenue Suite 404 Ottawa, Ontario K1Z 8R9, Canada Tel: 1-613-722-2051 #228 Email: [email protected] Janusz Rajski Mentor Graphics Corporation 8005 SW Boeckman Rd Wilsonville, OR 97070, USA Tel: 1-503-685-4797 Email: [email protected] Board Test Bernard Sutton GenRad Europe 7, Parkfield Drive Nantwich, C CW5 7DB, United Kingdom Tel: +44 1270 624 740 Email: [email protected] Defects Anne Gattiker IBM MS904-6E005 11400 Burnet Rd. Austin, TX 78727, USA Tel: +1-802-838-0884 Email: [email protected] Design Validation Sujit Dey UC San Diego 407 La Jolla, CA 92093, USA Tel: +1-858-534-0750 Email: [email protected] Prab Varma Veritable Inc. 800 W. El Camino Real, Suite 180 Mountain View, CA 94040, USA Tel: +1-650-943-2398 Email: [email protected] Design-for-Test Anjali Kinra Texas Instruments MS 706 12203 Southwest Fwy, Bldg 2 Stafford, TX 77477, USA Tel: +1-281-274-3561 Email: [email protected] Christian Landrault LIRMM/University 161 rue ADA MONTPELLIER 34392, France Tel: +33- 467-418524 Email: [email protected]
Transcript of Technical Program Committee - IEEE Computer Society · Tel: 1-408-345-8800 Email: ... University of...
4
INTERNATIONALTEST CONFERENCE2001
®
Technical ProgramCommitteeProgram Chair
Donald WheaterIBM MicroelectronicsM/S 963GRiver RoadEssex Junction, VT 05452, USATel: 1-802-769-7261Email: [email protected]
Program Vice Chair
Robert AitkenAgilent Technologies51LGO5301 Stevens Creek BlvdSanta Clara, CA 95051-8059, USATel: 1-408-345-8800Email: [email protected]
Past Program Chair
Wayne Needham901 E. Juanita AveGilbert, AZ 85234, USATel: 1-602-545-8127Email: [email protected]
Area Topic Coordinators - Analog/Mixed-Signal
Gordon RobertsMcGill University3480 University StreetMontreal, PQ H3A 2A7, CanadaTel: 1-514-398-6029Email: [email protected]
Area Topic Coordinators - ATE
Justin WoykeIBM963G1000 River StreetEssex Junction, VT 5452, USATel: 1-802-769-1445Email: [email protected]
Area Topic Coordinators - Board,Online, Production, and System
Anthony AmblerUniversity of Texas at AustinMS C0803Austin, TX 78712, USATel: 1-512-475-6153Email: [email protected]
Area Topic Coordinators - Defects,Diags, IDDQ, MEMS, Safety-CriticalApplications
Jerry SodenSandia National LaboratoriesPO Box 5800, MS-1081Albuquerque, NM 87185-1081, USATel: 1-505-845-8575Email: [email protected]
Area Topic Coordinators - DFT, CaseStudies, Economics, Stds
Kenneth ButlerTexas Instruments12500 TI Boulevard MS 8645Dallas, TX 75243, USATel: 1-214-480-1431Email: [email protected]
Area Topic Coordinators - Logic-ATPG, Flt Mdl, BIST, Synth, FPGA
Scott DavidsonSun MicrosystemsUMPK 14-108901 San Antonio RoadPalo Alto, CA 94303-4900, USATel: 1-650-786-7256Email: [email protected]
Area Topic Coordinators - MemoryTest
Rochit RajsumanAdvantest America R&D Center3201 Scott BlvdSanta Clara, CA 95054, USATel: 1-408-727-2222, ext 386Email: [email protected]
Area Topic Coordinators - SOC(uP,Cores, MCM, Des/Val, HSD, KGD)
Mary KuskoIBMMS P310 Bldg. 7052455 South RoadPoughkeepsie, NY 12601, USATel: 1-845-435-6849Email: [email protected]
Topic Coordinators
ATE Hardware
Ben BrownTeradyne7670 SW Mohawk StreetTualatin, OR 97062, USATel: 1-503-612-6505Email: [email protected]
Hideo OkawaraAgilent Technologies Japan, Ltd.B7-2-39-1 TakakurachoHachioji, Tokyo 192-8510, JapanTel: 81-426-60-2308Email: [email protected]
ATE Software
Art Downey4225 Sea Pines CourtCapitola, CA 95010, USATel: 1-408-930-0050Email: [email protected]
ATPG and Fault Modeling
Elizabeth RudnickUniversity of IllinoisCoordinated Science Laboratory1308 West Main StreetUrbana, IL 61801, USATel: 1-217-244-4659Email: [email protected]
BIST
Kazumi HatayamaHitachi, Ltd.1-280 Higashi-koigakubo, KokubunjiTokyo 185-8601, JapanTel: 81-42-327-7877Email: [email protected]
Benoit Nadeau-DostieLogicVision (Canada) Inc1525 Carling AvenueSuite 404Ottawa, Ontario K1Z 8R9, CanadaTel: 1-613-722-2051 #228Email: [email protected]
Janusz RajskiMentor Graphics Corporation8005 SW Boeckman RdWilsonville, OR 97070, USATel: 1-503-685-4797Email: [email protected]
Board Test
Bernard SuttonGenRad Europe7, Parkfield DriveNantwich, C CW5 7DB, United KingdomTel: +44 1270 624 740Email: [email protected]
Defects
Anne GattikerIBMMS904-6E00511400 Burnet Rd.Austin, TX 78727, USATel: +1-802-838-0884Email: [email protected]
Design Validation
Sujit DeyUC San Diego407La Jolla, CA 92093, USATel: +1-858-534-0750Email: [email protected]
Prab VarmaVeritable Inc.800 W. El Camino Real, Suite 180Mountain View, CA 94040, USATel: +1-650-943-2398Email: [email protected]
Design-for-Test
Anjali KinraTexas InstrumentsMS 70612203 Southwest Fwy, Bldg 2Stafford, TX 77477, USATel: +1-281-274-3561Email: [email protected]
Christian LandraultLIRMM/University161 rue ADAMONTPELLIER 34392, FranceTel: +33- 467-418524Email: [email protected]
5
InternationalTest Conference
2001Technical Program
Committee
Design-for-Test (cont'd)
Anne MeixnerIntel CorpRA1-3315200 NE Elam Young ParkwayHillsboro, OR 97124-1976, USATel: +1-503-613-8755Email: [email protected]
Raj RainaMotorola Inc. - Somerset PowerPC DesignCenterOE707700 West Parmer Lane, MD: PL30Austin, TX 78729, USATel: +1-512 996 4670Email: [email protected]
Embedded Core Test
Alex OrailogluUC San DiegoMC-01149500 Gilman DriveLa Jolla, CA 92093, USATel: +1-858-534-0914Email: [email protected]
Nur ToubaUniversity of Texas at AustinEngineering Science BuildingAustin, TX 78712-1084, USATel: +1-512-232-1456Email: [email protected]
Yervant ZorianLogicVision101 Metro DriveSan Jose, CA 95110, USATel: +1-408-452-2427Email: [email protected]
Fault Models
Cecilia MetraUniversity of BolognaViale Risorgimento 2I-40136 Bologna, ItalyTel: +39-051-2093785Email: [email protected]
Karen PanettaTufts University161 College AvenueMedford, MA 02155, USATel: +1-617-627-5976Email: [email protected]
FPGA Test
Paolo PrinettoPolitecnico di TorinoCorso Duca degli Abruzzi, 29I-10129 Torino, TO, ItalyTel: +39-011-564-7007Email: [email protected]
High-Speed Digital Test
David KeezerGeorgia Institute of Technology777 Atlantic DriveAtlanta, GA 30332, USATel: +1-404-894-4741Email: [email protected]
IDDQ
Anne GattikerIBMMS904-6E00511400 Burnet Rd.Austin, TX 78727, USATel: +1-802-838-0884Email: [email protected]
Cecilia MetraUniversity of BolognaViale Risorgimento 2I-40136 Bologna, ItalyTel: +39-051-2093785Email: [email protected]
Lecture Series
Jerry SodenSandia National LaboratoriesPO Box 5800, MS-1081Albuquerque, NM 87185-1081, USATel: +1-505-845-8575Email: [email protected]
Craig SoldatAgilent TechnologiesMS53LFI5301 Stevens Creek BoulevardPO Box 58059, MS53LFISanta Clara, CA 95052, USATel: +1-408-553-6805Email: [email protected]
MCM and KGD Test
David KeezerGeorgia Institute of Technology250777 Atlantic DriveAtlanta, GA 30332, USATel: +1-404-894-4741Email: [email protected]
Memory Test
Nobuaki OtsukaTOSHIBA CorporationAdvanced Memory Design Group4F, 2-5-1, Kasama, Sakae-kuYokohama 247-8585, JapanTel: +81-45-890-2424Email: [email protected]
Tetsuo TadaMitsubishi Electric Corporation4-1, Mizuhara ItamiHyogo 664-8641, JapanTel: +81-727-84-7422Email: [email protected]
MEMs Testing
Shawn BlantonECE DepartmentCarnegie Mellon University5000 Forbes AvenuePittsburgh, PA 15213-3890, USATel: +1-412-268-5241Email: [email protected]
Microprocessor Test
Magdy AbadirMotorolaPL307700 W. Parmer LaneAustin, TX 78729, USATel: +1-512-996-4906Email: [email protected]
Scott FetherstonSymbiosys3327 Sorrel Downs CourtPleasanton, CA 94588, USATel: +1-925- 462-2309Email: [email protected]
Wayne Needham901 E. Juanita AveGilbert, AZ 85234, USATel: +1-602-545-8127Email: [email protected]
Carol PyronMotorola, Inc.7700 West Parmer Lane, PL30Austin, TX 78729, USATel: +1-512-996-6096Email: [email protected]
Mixed-Signal and Analog Test
Bozena KaminskaFluence Technology8700 S.W. Creekside PlaceBeaverton, OR 97008, USATel: +1-503-672-8739Email: [email protected]
Sandeep KumarAgere Systems555 Union Blvd. Rm. 23R131Allentown, PA 18109, USATel: +1-610-712-6186Email: [email protected]
Stephen SunterLogicVision1525 Carling Ave., Suite 404Ottawa, ON K1Z 8R9, CanadaTel: +1-613-722-2051 ext 226Email: [email protected]
On-line Test
Cecilia MetraUniversity of BolognaViale Risorgimento 2I-40136 Bologna, ItalyTel: +39-051-2093797Email: [email protected]
6
INTERNATIONALTEST CONFERENCE2001
®
Technical ProgramCommitteeOn-line Test (cont'd)
Michael NicolaidisIRoC TechnologiesWorld Trade CenterPO Box 151038025 Grenoble, FranceTel: +33 4 38 120 763Email: [email protected]
Panels
Dilip BhavsarIntel334 South StreetShrewsbury, MA 01545, USATel: +1-508-841-2108Email: [email protected]
Fidel MuradaliAgilent Technologies51L-G05301 Stevens Creek Blvd.Santa Clara, CA 95051, USATel: +1-408-345-8943Email: [email protected]
Carol StolicnyIntel334 South StreetShrewsbury, MA 01545, USATel: +1-508-841-3195Email: [email protected]
Presentations Coordinator
Art Downey4225 Sea Pines CourtCapitola, CA 95010, USATel: 1-408-930-0050Email: [email protected]
Production Test Automation
Bernard SuttonGenRad Europe7, Parkfield DriveNantwich, C CW5 7DB, United KingdomTel: +44-1270 624 740Email: [email protected]
RF Testing
Jeff KastenCredence Systems5975 NW Pinefarm PlaceHillsboro, OR 97124, USATel: +1-503-466-7643Email: [email protected]
Safety-Critical Systems
Anthony AmblerUniversity of Texas at AustinMS C0803Austin, TX 78712, USATel: +1-512-475 6153Email: [email protected]
Jerry SodenSandia National LaboratoriesPO Box 5800, MS-1081Albuquerque, NM 87185-1081, USATel: +1-505-845-8575Email: [email protected]
State-of-Practice Case Studies
Kenneth ButlerTexas Instruments12500 TI Boulevard MS 8645Dallas, TX 75243, USATel: +1-214-480-1431Email: [email protected]
Test Synthesis
Kwang-Ting (Tim) ChengUniv. of CaliforniaDepartment of Electrical and ComputerEngineeringUniversity of CaliforniaSanta Barbara, CA 93106, USATel: +1-805-893-7294Email: [email protected]
Asian Subcommittee Chair
Hideo OkawaraAgilent Technologies Japan, Ltd.B7-2-39-1 TakakurachoHachioji, Tokyo 192-8510, JapanTel: +81-426-60-2308Email: [email protected]
Asian Subcommittee Vice Chair
Kazumi HatayamaHitachi, Ltd.1-280 Higashi-koigakubo, KokubunjiTokyo 185-8601, JapanTel: +81-42-327-7877Email: [email protected]
Asian Subcommittee US Liason
Shigeru SugamoriAdvantest America R&D Center, Inc.3201 Scott BoulevardSanta Clara, CA 95054, USATel: +1-408-727-2222Email: [email protected]
Asian Subcommittee
Tetsuo TadaMitsubishi Electric Corporation4-1, Mizuhara ItamiHyogo 664-8641, JapanTel: +81-727-84-7422Email: [email protected]
European Subcommittee Chair
Christian LandraultLIRMM/University161 rue ADAMontpellier 34392, FranceTel: +33 467 41 85 24Email: [email protected]
ITC Office Coordinator
Carla BattleCourtesy Associates2000 L Street, N.W., Suite 710Washington, DC 20036, USATel: +1-202-973-8665Email: [email protected]
Latin American Liaison
Fabian VargasElectrical Engineering DepartmentCatholic UniversityAv. Ipiranga, 6681Porto Alegre, RS 90619-900, BrazilTel: +55-51-99918612Email: [email protected]
Program Chair Emeritus Advisor
Gordon RobinsonThird Millennium Test Solutions2150 Bering DriveSan Jose, CA 95131, USATel: +1-408-435-1788Email: [email protected]
TTTC Liason
Paolo PrinettoPolitecnico di TorinoCorso Duca degli Abruzzi, 29I-10129 Torino, TO, ItalyTel: +39-011-564-7007Email: [email protected]
VLSI Test Symposium Liaison
Yervant ZorianLogicVision101 Metro DriveSan Jose, CA 95110, USATel: +1-408-452-2427Email: [email protected]
Web Site Coordinator
Burnell WestSchlumberger Semiconductor Solutions150 Baytech DriveSan Jose, CA 95134-2302, USATel: +1-408-586-6824Email: [email protected]
7
INTERNATIONALTEST CONFERENCE2001
®
International Test Conference 2001Technical Program Committee
1. Gordon Roberts2. Hideo Okawara3. Rochit Rajsuman4. Fidel Muradali5. Robert Aitken6. Anthony Ambler7. Donald Wheater8. Bozena Kaminska9. Anjali Kinra10. Mary Kusko11. Gordon Robinson12. Yervant Zorian13. Katzumi Hatayama14. Anne Gattiker15. Carol Stolicny16. Ben Brown17. David Keezer18. Prab Varma19. Dilip Bhavsar20. Christian Landrault21. Cecilia Metra22. Craig Soldat23. Bernard Sutton24. Alex Orailoglu25. Jeff Kasten26. Paolo Prinetto27. Elizabeth Rudnick28. Nobuaki Otsuka29. Shigeru Sugamori30. Jerry Soden31. Art Downey32. Tetsuo Tada33. Justin Woyke34. Sandeep Kumar35. Nur Touba36. Kenneth Butler
Not Shown: Magdy Abadir, ShawnBlanton, Kwang-Ting (Tim) Cheng,Scott Davidson, Sujit Dey, ScottFetherston, Anne Meixner, BenoitNadeau-Dostie, Wayne Needham,Michael Nicolaidis, Karen Panetta,Carol Pyron, Raj Raina, JanuszRajski, Stephen Sunter, FabianVargas, Burnell West
![[Bs 8800]-british standard-8800-1996[1]](https://static.fdocuments.net/doc/165x107/5587f770d8b42a03178b46e0/bs-8800-british-standard-8800-19961.jpg)
