Ipfa2012 photo contest winners
PROTON BEAM APPLICATIONS FOR SILICON BULK MICROMACHINING P. Nenzi 1, F. Ambrosini 1, M. Balucani 3, G. Bazzano 1, A. Klyshko 3, F. Marracino 1, L. Picardi.
Characterization of vacancy-like defects in H 2 cycled Mg and of ordered-nanochannels in Si by combined PAS techniques Roberto S. Brusa Department of Physics,
4th ILIAS-GW Annual Meeting J.P. Zendri Tuebingen 8-9 October 2007 Materials for Dual: Losses at low Temperature on Si and SiC.
