Fabrication of CMOS Integrated Circuits
FLOATING GATE DEVICES Kyle Craig. Flash Memory Cells – An overview Paolo Pavan, Roberto Bez, Piero Olivo and Enrico Zanoni.
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© 2012 Su-Jin Kim GNU Surface & Metrology Manufacturing Processes 4. Surface & Metrology.
Impact of Nanotopography on STI CMP in Future Technologies D. Boning and B. Lee, MIT N. Poduje, ADE Corp. J. Valley, ADE Phase-Shift W. Baylies, Baytech.
Lecture 18
1 Numerical Simulation of Electronic Noise in Si MOSFETs C. Jungemann Institute for Electronics Bundeswehr University Munich, Germany Acknowledgments:
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Outline
Direct Experimental Evidence Linking Silicon Dangling Bond Defects to Oxide Leakage Currents
