Spring 08, Mar 13 ELEC 7770: Advanced VLSI Design (Agrawal) 1 ELEC 7770 Advanced VLSI Design Spring 2008 VLSI Test Principles Vishwani D. Agrawal James.
Testing 1. 2 Problems of Ideal Tests n Ideal tests detect all defects produced in the manufacturing process. n Ideal tests pass all functionally good.
