Our Operating Funding Partners www.lightsource.ca Advances in
Time Resolved X-ray Excited Optical Luminescence Instrumentation at
the Canadian Light Source T.Z. Regier*, J.M. Vogt*, E. Matias*, L.
Dallin*, J.C. Bergstrom*, S. Hu*, S. Brunet , R. Sammynaiken , T.K.
Sham *Canadian Light Source, Inc., 101 Perimeter Road, Saskatoon,
Saskatchewan, Canada, Sasakatchewan Structural Science Centre, 110
Science Place, Saskatoon, Saskatchewan, Canada, Department of
Chemistry, The University of Western Ontario, 1151 Richmond Street,
London, Ontario, Canada X-ray Excited Optical Luminescence (XEOL)
XEOL is an x-ray photon in, optical photon out phenomenon useful
for the study of energy transfer within highly excited systems.
Photo of XEOL from a high pressure polymorph of SiO 2 excited with
540 eV x-rays. Nanomaterial Applications XEOL from nanostructured
materials is particularly useful because the spatial confinement of
the intinerant electrons created in the core hole decay. TRXEOL
Instrumentation Development A TRXEOL apparatus was developed at the
CLS to provide the capability to the user community and to foster
the growth of a time resolved community. The development consisted
of the addition of a bunch cleaning system, a streak camera and a
low jitter triggering system. Bunch Purity: Modifications were made
to the CLS transverse feedback system to allow it to be used for
bunch cleaning. Streak Camera: A streak camera coupled to a
spectrograph allows for the collection of the spectral and temporal
characteristics of the XEOL. Low Jitter Trigger: any jitter in the
trigger will reduce temporal resolution Fill pattern prior to bunch
cleaning Time Resolved XEOL studies the temporal evolution of the
luminescence by using the pulse structure of a synchrotron light
source. Resulting luminescence decay After bunch cleaning, bunch
purities of 10 6 are measured. This provides a clean, 35 ps r.m.s.
excitation pulse for TRXEOL Multidimensional Approach Excitation
Energy element and chemical specificity Emission Wavelength
electronic state information Emission Lifetimes excited state decay
pathways Two TRXEOL configurations Streak camera image of the CLS
zero order light Streak camera on the SGM beamline Triggering
electronics used to resynchronize 500 MHz RF to orbit clock for low
jitter triggering Results Measurement of the CLS pulse length (zero
order light) gives a pulse duration of 39 ps r.m.s. This
demonstrates the maximum trigger jitter is ~35 ps r.m.s. The
temporal resolution of the TRXEOL system is estimated to be ~20 ps.
91 ps FWHM SiO 2 High Pressure Polymorph - Stishovite Stishovite
shows two emissions, both related to defects. Streak images can be
processed offline by applying line and area profiles. Resolution
Instrumentation Development ZnO Nanostructures The streak image
shows a fast bandgap emission with 220 ps and 2 ns components. A
slow defect emission has a long lifetime. Acknowledgements: This
work was made possible by the excellent technical support staff at
the Canadian Light Source.