TU Wien · 2011. 1. 31. · ide, degradation of the device, leakage effects on drain currents due...

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Transcript of TU Wien · 2011. 1. 31. · ide, degradation of the device, leakage effects on drain currents due...

Page 1: TU Wien · 2011. 1. 31. · ide, degradation of the device, leakage effects on drain currents due to crystal defects, tunneling, impact ionization, interface charge formation and
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