Surface Plasmons devices and leakage radiation microscopy
description
Transcript of Surface Plasmons devices and leakage radiation microscopy
1Surface Plasmons devices and leakage Surface Plasmons devices and leakage radiation microscopy radiation microscopy
A.Drezet
(ISIS- Univ. Louis Pasteur, Strasbourg, France)
A. Hohenau, D. Koller, F. R. Aussenegg, J.R Krenn
Nano - Optics Group ● Institute of Physics ● Univ. Graz, Austria
nanooptics.uni-graz.at
Marseille , 1.10. 2007
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Surface Plasmon polaritons (SPPs) at a single interface
Dielectric(Air,SiO2)
Metal (Au,Ag)
E,B
z
Raether, Surface Plasmons (Springer, Berlin, 1988).Genet and Ebbesen, Nature 445, 39 (2007).Drezet et al., Micron 38, 427 (2007).
SPP
100nm
10nm
Hy
md
mdSPP ck
3
SPP dispersion relation on a 70 nm thick gold film
Au/glass
Au/air
1Re mkx
12 m
Johnson and Christy, PRB 6, 4370 (1972).
Total Internalreflection
KSPP
4
Au/glass
Au/air
12 m
mLSPP
SPP dispersion relation on a 70 nm thick gold film
"21
xSPP kL
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Leakage Radiation (LR) SPP modes
air
metalglass
SPP
LRLR
z
Air side
Glass side
LR
Hecht et al., PRL 77 ,1889 (1986).A. Bouhelier et al., PRB 63, 155404 (2001).
m
mLR
1
Resinn glass
6
"sin2
xLRglass kn
LR cone
H. J Simon, J. K. Guha, Opt. Comm. 18, 391 (1976).
SPP
LR2
LR cone
22//
// )''()'(
1)(
kkkkI
Leakage Radiation cone
Rough Ag surface
7
IO
Au
LR
SPP
CCD
LRO2
SPP
Lens
NSOM (near field scanning optical microscope)
Polar.
15 µm
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Quantum dots (CdTe/ZnTe)
=514 nm
SPP
NSOM
Brun et al., Europhys. Lett. 64 , 634 (2003)
Rdistance hole-tip (nm)
Addressing a nanoobject with SPP
R
eI
SPPLR /
4.2 K
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Leakage Radiation Microscopy (LRM)
Stepanov et al., Optics Letters 30, 1524 (2005).Hohenau et al., Optics Letters 30 ,893 (2005).
LRM on 50 nm Au film
=800 nm
IO
Au
LR
SPP
CCD
laser
O1
LRO2
SPP
Lensµm 20SPPL
10
2SPPP
Bragg condition:
SPP 2D Bragg reflectors
Drezet et al., Europhys.Lett. 74, 693 (2006)
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SPP interferometer
V=1, R= 0.95
2D dipole model
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LRM: Imaging the direct and the Fourier space
Drezet et al., APL 89, 091117 (2006).
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A) SPP dispersion in the direct space
(A)
L R20 µm
T
Bragg mirror (out of resonance)
)cos(2 in
SPPP
Bragg condition:
nmP
nm
nm
inSPP
555
45 ,785
800
65 800 innm
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10 20 30 40
1
00
(B)In
tens
ity (
arbi
trar
y un
its)
x (µm)
0.5
10 µm
µmk
LSPP
SPP 202
1"
SPP decay in the direct space
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LRM (Fourier)
k (1/µm)
Inte
nsity
(ar
bitr
ary
units
)
0
1
8.0 8.27.8
(A)
0.5
L
Drezet et al., Appl.Phys.Lett. 89, 091117 (2006).
2"2'//
1
SPPSPP kkkI
µmk
LSPP
SPP 202
1"
B) SPP dispersion in the Fourier space
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(a)
(A)
L R20 µm
T
T
(C) T (D)
RLL
C) SPP Fourier optics
(B)
R
T
L
C
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Reflectance 90%
Appl.Phys.Lett. 86, 074104 (2005) Interferences
SPP in plane elliptical cavity
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Phase difference
Inte
nsi
ty (
a. u
.)
D1
D2
Braggmirror
ridge
Ditlbacher et al.,APL. 81, 1762 (2002).Drezet et al., Plasmonics (2006).
SEM
SPP in plane interferometry
15 µm
LRM
Phase difference
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SPP in plane demultiplexer-plasmonic crystal
b
3
a
e1e2
550 nm
=750 nm
=800 nm
Drezet et al., Nanolett. (pub. on line15 mai 2007).
30 µm
21,
1SPPd
2
2,2
SPPd
LRM
SPPAu
Plasmonic crystal
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SPP in plane Tritter = beam splitter 3 inputs-3outputs
15 µm
e1
e2
500nm
32 SPPa 3
SPPd
21 finalorinc kfk
LRM (direct) (Fourier)
d
(Ewald sphere)
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SPP in plane reflection microscope (M=3)
10 µm
10 µm
F1F2
10 µm
2 µm
SPP
Drezet et al. Submitted to Optics letters (2007).
400 nm
theory
LRM
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10 µm
Inte
nsity
(ar
b.un
its)
X (µm)
2 µm
1 µm
500 nm
1.4 µm
3 µm
6 µm
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• LRM is a straightforward and reliable technique
for probing SPP fields in direct and Fourier space.
•LRM allows precise quantitative analysis of SPP
propagations.
•Fast method: alternative to PSTM, NSOM, NFO
Summary
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