SCHEME OF INSTRUCTION AND EXAMINATION BE …mjcollege.ac.in/ece/pdf/syllabus/slbs22.pdf · Design...

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WITH EFFECT FROM THE ACADEMIC YEAR 2015-2016 1 SCHEME OF INSTRUCTION AND EXAMINATION BE II YEAR (ELECTRONCIS AND COMMUNICATION ENGINEERING) SEMESTER I S.No. Code No. Subject Scheme of Instruction Scheme of Examination THEORY L/T D/P Duration in Hours Max. Marks Univ. Exams Sessionals 1 MAT 202 Applied Mathematics 4 - 3 75 25 2 EC 201 Basic Circuit Analysis 4 - 3 75 25 3 EC 202 Electromagnetic Theory 4 - 3 75 25 4 EC 203 Electronic Devices 4 - 3 75 25 5 ME 221 Elements of Mechanical Engineering 4 - 3 75 25 6 EE 222 Electrical Technology 4 - 3 75 25 PRACTICALS 1 EC 231 Electronic Devices Lab - 3 3 50 25 2 EC 232 Electronic Workshop and Simulation Lab - 3 3 50 25 TOTAL 24 6 550 200

Transcript of SCHEME OF INSTRUCTION AND EXAMINATION BE …mjcollege.ac.in/ece/pdf/syllabus/slbs22.pdf · Design...

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SCHEME OF INSTRUCTION AND EXAMINATION

BE II YEAR

(ELECTRONCIS AND COMMUNICATION ENGINEERING)

SEMESTER – I

S.No. Code No. Subject Scheme of

Instruction Scheme of Examination

THEORY L/T D/P

Duration

in Hours

Max. Marks

Univ.

Exams

Sessionals

1 MAT 202 Applied

Mathematics 4 - 3 75 25

2 EC 201 Basic Circuit

Analysis 4 - 3 75 25

3 EC 202 Electromagnetic

Theory 4 - 3 75 25

4 EC 203 Electronic Devices 4 - 3 75 25

5 ME 221

Elements of

Mechanical

Engineering

4 - 3 75 25

6 EE 222 Electrical

Technology 4 - 3 75 25

PRACTICALS

1 EC 231 Electronic Devices

Lab - 3 3 50 25

2 EC 232

Electronic

Workshop and

Simulation Lab

- 3 3 50 25

TOTAL 24 6 550 200

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SCHEME OF INSTRUCTION AND EXAMINATION

BE II YEAR

(SERVICE COURSES OFFERED TO OTHER DEPARTMENTS)

SEMESTER – I

S.No. Code No. Subject Scheme of

Instruction Scheme of Examination

THEORY L/T D/P

Duration

in Hours

Max. Marks

Univ.

Exams

Sessionals

1 EC 221

Electronics

Engineering – I

(for EEE and EIE)

4 - 3 75 25

2 EC 222 Basic Electronics

(for CSE) 4 - 3 75 25

PRACTICALS

1 EC 241

Electronics

Engineering - I

Lab

(for EEE and EIE)

- 3 3 50 25

2 EC 242

Basic Electronics

Lab

(for CSE)

- 3 3 50 25

TOTAL 8 6 250 100

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MAT 202

APPLIED MATHEMATICS

(ECE)

Instructions 4 Periods per week

Duration of University Examination 3 Hours

University Examination 75 Marks

Sessionals 25 Marks

Objectives:

1. Derive first order partial differential equations

2. Analyze the concepts of functions of complex variables, analytic functions, complex

integration and residue theory

3. Apply numerical methods to solve certain types of problems

4. Evaluate curve fitting, correlation and regression

UNIT- I

Partial differential equations: Formation of Partial differential equations, Linear first order partial

differential equations, Lagrange’s equation, Non linear first order partial differential equations,

Charpit’s method, Standard forms.

UNIT-II

Functions of Complex variables: Limits and Continuity of function, Analytic functions, Cauchy-

Riemann equations, Cartesian and Polar forms, Harmonic functions, Complex integration, Cauchy’s

theorem, Cauchy’s integral formula and its applications.

UNIT-III

Residue theory and Transformations: Taylor’s and Laurent’s series expansions, Zeros and

Singularities, Residues, Residue theorem, Evaluation of real integrals using Residue theorem,

Conformal mapping, Bilinear transformation.

UNIT-IV

Numerical Methods: Solutions of Algebraic and Transcendental equations, Bisection method and

Newton-Raphson’s method, Interpolation, Newton’s Forward and Backward difference

interpolations, Lagrange’s interpolation, Newton’s divided difference interpolation, Numerical

differentiation, Solution of differential equations by Euler’s method and Runge-Kutta method of

order four.

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UNIT-V

Curve fitting: Correlation and Regression, lines of regression fitting of curves by the method of

least squares (Straight line, parabola, exponential curves)

Suggested Reading:

1. R.K. Jain and S.R.K. lyengar, Advanced Engineering Mathematics, 4th

ed., Narosa

Publications, 2014.

2. Dr. B.S. Grewal, Higher Engineering Mathematics, 43rd

ed., Khanna Publications, 2014.

3. James Brown and Ruel Churchill, Complex Variables and Applications, 9th

ed., McGraw Hill

Education (India) Private Limited, 2013.

4. Erwin Kreyszig, Advanced Engineering Mathematics, 9th

ed., John Wiley & Sons, 2012.

5. S.C. Gupta, V.K. Kapoor, Fundamentals of Mathematical Statistics (A Modern Approach),

10th

ed., Sultan Chand & Sons, 2002.

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EC 201

BASIC CIRCUIT ANALYSIS

Instructions 4 Periods per week

Duration of University Examination 3 Hours

University Examination 75 Marks

Sessionals 25 Marks

Objectives:

1. Define basic concepts of DC and AC circuit behavior.

2. Develop and solve mathematical representations for simple RLC circuits.

3. Formulate the circuit analysis theorems and methods.

4. Derive Laplace transforms of signals, their properties and applications.

5. Analyze the principle of two-port networks their parameters.

UNIT I

Lumped Circuit elements, dependent and independent current and voltage sources, Ohms law,

energy, power, Kirchoff’ laws, D.C. circuit analysis. Nodal and mesh analysis. Source

transformations, Terminal characteristics of RLC elements. Thevenin’s and Norton’s theorems.

Superposition theorem, Maximum power transfer theorem. Topological description of networks.

Network graphs, tree, chord, cutest, incidence matrix, tieset matrix, cutest matrix. Formulation of

node and loop equations. Tellegen’s theorem, duality, dual networks.

UNIT II

Linear time invariant first order and second order circuits, Formulation of integro differential

equations, RL, RC and RLC circuits, transient and steady state responses. Zero Input Response

(ZIR), Zero State Response (ZSR) - complete response.

UNIT III

Steady state response of RLC networks to exponential signals, Sinusoidal function, response to

sinusoidal excitation, phasors, impedance and admittance. Calculation of power in a.c. circuits,

average power, apparent power, complex power, vector representation. Network theorems with

impedance. Analysis of magnetically coupled circuits

UNIT IV

Two port networks, Z, Y, h, g, ABCD parameters. Equivalence of two port networks. T, Pi

transformation, Inter connection of two ports, Reciprocity theorem. Analysis of reciprocal networks:

Practical and ideal transformers.

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UNIT V

Concept of complex frequency, impedance and admittance functions, Pole-Zero cancellation,

calculation of natural response from pole zero plot. Series and parallel resonance, Q-factor,

selectivity, bandwidth. Calculation of Q factor for different resonant forms.

Suggested Reading:

1. Hayt Jr. W.H. Kemmerly J.E. and Steven M. Durbin, Engineering Circuit Analysis, 8th

ed.,

McGraw Hill Education (India) Private Limited, 2013.

2. Aatre, V.K., Network Theory and Filter Design, 2nd

ed., New Age International Pvt. Ltd.,

1986.

3. Jagan NC and Laxminarayana C, Network Analysis, 3rd

ed., BSP Publications, 2014.

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EC 202

ELECTROMAGNETIC THEORY

Instruction 4 Periods per week

Duration of University Examination 3 Hours

University Examination 75 Marks

Sessional 25 Marks

Objectives:

1. Analyze fundamental concepts of vector analysis, electrostatics and magneto-statics laws and

their applications.

2. Describe the relationship between Electromagnetic Theory and Circuit Theory.

3. Formulate the basic laws of static electricity and magnetism and extend them to time varying

fields.

4. Derive the Maxwell’s equations leading to the wave equations in various media

5. Define wave propagation characteristics.

UNIT I

Vector Analysis, Coulomb’s law and applications, Electric field intensity, Electric flux, flux density,

Gauss’s law and applications: determination of electric field due to line of charge, sheet of charge,

volume charge distributions, divergence theorem.

UNIT II

Potential and energy, potential field of system of charges, potential gradient, energy, energy density,

Conductors – Current density , Continuity equation, Dielectrics – Nature of dielectric materials,

boundary conditions in static electric field, Capacitance of two wire line, Poisson’s and Laplace’s

equations, Solution of Laplace’s Equation, Uniqueness theorem.

UNIT III

Steady magnetic field, Biot-Savart’s law and applications, Ampere’s law and application:

determination of magnetic field due to line, sheet and volume currents, Stoke’s theorem, Magnetic

scalar and vector potential, magnetic boundary conditions.

UNIT IV

Displacement currents, Maxwell’s equations in integral and differential forms, E.M wave Equations

in free space and good conductors, uniform plane wave, wave propagation in free space, perfect

dielectric, lossy dielectric and good conductors. EM Wave polarization.

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UNIT V

Poynting Vector: Instantaneous, average and complex Poynting vector, power and energy

calculations. Reflection of plane waves by a perfect conductor, normal and oblique incidence.

Reflection of plane waves at different media - normal and oblique incidence, Reflection coefficient,

Transmission coefficient.

Suggested Reading:

1. Sadiku N.O., Principles of Electromagnetics, 4th

ed., Oxford University Press, 2009.

2. W H Hayt, J A Buck and Jaleel M. Akhtar, Engineering Electromagnetics, 8th

ed., McGraw Hill

Education (India) Private Limited, 2014.

3. Jordan E.C., Balmain K.G., Electromagnetic Waves and Radiating Systems, 2nd

ed., Prentice Hall

of India, 2001.

4. Nannapaneni Narayana Rao, Elements of Engineering Electromagnetics, 1st

ed., Pearson

Education, 2008.

5. B.N.Basu, Engineering Electromagnetics Essentials, 1st ed., Universities Press (India) Private

Limited, 2015.

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EC 203

ELECTRONIC DEVICES

Instructions 4 Periods per week

Duration of University Examination 3 Hours

University Examination 75 Marks

Sessionals 25 Marks

Objectives:

1. Analyze the behavior of Semiconductor diodes in Forward and Reverse bias

2. Develop Half wave and Full wave rectifiers with L,C,LC & CLC Filters

3. Explain V-I characteristics of Bipolar Junction Transistor in CB,CE & CC configurations

4. Design Biasing techniques for BJT in Amplifier Applications

5. Explore V-I characteristics of FETs and MOSFETs

UNIT I

Junction Diode : Different types of PN Junction formation techniques, PN Junction Characteristics,

biasing- band diagrams and current flow, Diode current equations under forward bias and reverse

bias conditions, Junction breakdown in diodes and breakdown voltages, effect of temperature on

diode characteristics, Diode as a circuit element, small signal diode models, Junction capacitance

under forward bias and reverse bias, Diode switching characteristics, Zener Diodes, Zener voltage

regulator and its limitation.

UNIT II

PN Diode Applications: Half wave, Full wave and Bridge rectifiers - their operation, performance

characteristics, and analysis; Filters (L, C, LC and CLC filters) used in power supplies and their

ripple factor calculations, design of Rectifiers with and without Filters.

UNIT III

Bipolar Junction Transistor : Transistor Junction formation (collector-base, base-emitter

Junctions) Transistor biasing-band diagram for NPN and PNP transistors, current components and

current flow in BJT, Modes of transistor operation, Early effect, BJT input and output characteristics

in CB, CE CC configuration, BJT as an amplifier, BJT biasing techniques, Thermal runway, heat

sinks and thermal stabilization, operating point stabilization against temperature and device

variations, stability factors, Bias stabilization and compensation techniques, Biasing circuit design.

UNIT IV

Small Signal Transistors equivalent circuits : Small signal low frequency h-parameter model of

BJT, Determination of h parameters, analysis of BJT amplifiers using h-parameter, comparison of

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CB, CE and CC amplifier configurations, Analysis of BJT amplifier with approximate model.

Introduction to low frequency Π and T models

Special Devices: working of UJT, SCR, DIAC, TRIAC and CCD.

UNIT V

Junction Field Effect Transistors (JFET): JFET formation, operation & current flow, pinch-off

voltage, V-I characteristics of JFET. JFET biasing-zero current drift biasing, biasing against device

variations. Low frequency small signal model of FETs. Analysis of CS, CD and CG amplifiers and

their comparison. FET as an amplifier and as a switch. MOSFETs: MOSFETs, Enhancement &

Depletion mode MOSFETs, V-I characteristics. MOSFET as resistance, Biasing of MOSFETs,

MOSFET as a switch

Suggested Reading:

1. Jacob Millman, Christos C. Halkias, and Satyabrata Jit, Electronic Devices and Circuits, 3rd

ed.,McGraw Hill Education, 2010.

2. David A. Bell, Electronic Devices and Circuits, 5th

ed., Oxford University Press, 2009.

3. Robert Boylestad and Louis Nashelsky, Electronic Devices and Circuit Theory, 11th

ed.,Pearson

India Publications, 2015.

4. S Salivahanan, N Kumar, and A Vallavaraj, Electronic Devices and Circuits, 2nd

ed., McGraw

Hill Education, 2007.

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ME 221

ELEMENTS OF MECHANICAL ENGINEERING

(ECE)

Instructions 4 Periods per week

Duration of University Examination 3 Hours

University Examination 75 Marks

Sessionals 25 Marks

Course Objectives:

1. To understand the basic concepts of thermodynamics

2. To understand the working principles of Heat exchangers, I.C engines and compressors.

3. To understand the various manufacturing processes

4. To understand the various Refrigeration systems and refrigerants. 5. To familiarize the design and working principles of drives and transmission systems

UNIT-I

Thermodynamics: Concept of system, process and properties, laws of thermodynamics, concept of

entropy and Clausius inequality, steady flow energy equation for an open system.

IC Engines: Working of four stroke and two stroke petrol and diesel engine with p-V diagrams,

valve timing diagram, calculation of indicated power, brake power, specific fuel consumption,

mechanical and thermal efficiencies.

Reciprocating Air compressors: work done, efficiency of multistage compressors, effect of

clearance volume.

UNIT-II

Heat transfer: Basic modes of heat transfer, Fourier’s law of conduction, Newton’s law of cooling,

Stefan-Boltzmann law of radiation and one dimensional steady state conduction heat transfer

through plane walls without heat generation.

Heat exchangers: Classification and application of heat exchangers in industry, derivation of

LMTD in parallel and counter-flow heat exchangers and problems.

UNIT-III

Refrigeration: Types of refrigeration systems- Air refrigeration system, vapor compression system,

ammonia-water absorption refrigeration system, thermoelectric refrigeration system, COP and

representation of cycle on T-S and H-S diagrams, Types and properties of refrigerants, eco-friendly

refrigerants. Introduction to psychrometry and psychrometry processes.

UNIT-IV

Basic Manufacturing Processes: Welding, brazing, soldering, brief description of process and

parameters, associated principles of gas welding, arc welding.

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Casting: Sand casting, die casting, and principles and application.

Forming: Basic concepts of forming processes: Extrusion, rod/wire drawing, Forging and

Rolling.

Principles and Applications of basic Machining Processes: Turning, milling and grinding.

UNIT-V

Definition of kinematic link and pair, mechanism and machine, Gears: Classifications of gears,

nomenclature Gear Trains: Simple, compound, inverted and epi-cyclc gear trains.

Belt and Rope drives: Open and cross belt drives, length of belt, ratio of tensions of flat belt,

condition for maximum power transmission for flat belt.

Suggested Reading:

1. P.N. Rao, Manufacturing Technology, Vol. 1 & 2, Tata McGraw Hill publishing co, 2010.

2. Thomas Bevan Theory of Machines, CBS Publishers, 1995.

3. R.K. Rajput, Thermal Engineering, Laxmi Publications, 2005.

4. C. Sachdeva. Fundamentals of Engineering Heat and Mass transfer, Wiley Eastern Ltd,

2004.

5. Serope Kalpakjain and Steven R. Schmid, Manufacturing Engineering and Technology, 4th

ed., Pearson Education, 2013.

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EE 222

ELECTRICAL TECHNOLOGY

Instructions 4 Periods per week

Duration of University Examination 3 Hours

University Examination 75 Marks

Sessionals 25 Marks

Objectives:

1. Familiarize with working of electrical circuits.

2. Explain basic principle operation of electrical machines.

UNIT I

DC Generators: Constructional details, Simple lap and wave windings, Methods of excitation,

Induced emf, Basic ideas of armature reaction and commutation, Characteristics of shunt, series and

compound generators and applications.

DC Motors: Torque developed in motors, Motor starter, Characteristics of shunt, series and

compound motors, Speed control of DC motors.

UNIT II

Balanced Three-Phase System: Star-delta connection, Relationship between line and phase

quantities, Measurement of power by Two-Wattmeter method, Operations of fluorescent lamp.

UNIT III

AC Generators: Construction, emf equation, Armature reaction, Synchronous impedance,

Regulation.

UNIT IV

Transformers: Single-phase transformer: Construction, Theory of operation, Phasor diagram under

no-load and loaded conditions, OC and SC tests on transformer, Efficiency and regulation, Auto

transformer, Theory of operation.

UNIT V

Induction Motors: Construction, Production of rotating magnetic field, Slip-torque characteristics,

Starters for cage and wound rotor induction motors, Single-phase induction motors, Construction,

Theory of operation, Characteristics of shaded pole, Split phase and Capacitor motors, Applications.

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Suggested Reading

1. Mehtha V.K., Principles of Electrical Engineering and Electronics, S.Chand & Co., 2010.

2. John Bird, Electrical Circuit theory and Technology, 4th

ed., Routledge Taylor & Francis Group,

2012.

3. Naidu MS. and Kamakshiah S., Introduction to Electrical Engineering,McGraw Hill Inida

Private Limited, 2010.

4. A. Chakrabarti, Sudipta Nath, Chandan Kumar Chanda, Basic Electrical Engineering, McGraw

Hill India Private Limited, 2009.

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EC 231

ELECTRONIC DEVICES LAB

Instruction 3 Periods per week

Duration of University Examination 3 Hours

University Examination 50 Marks

Sessional 25 Marks

Objectives:

1. Demonstrate the characteristics of Semiconductor diodes

2. Realize the filters and rectifiers with and without capacitors.

3. Demonstrate the characteristics of different transistor Configurations

4. Design of Biasing Circuits for BJT and FET Amplifiers

5. Simulate the Electronic circuits using PSPICE (Filters and Amplifiers)

List of Experiments:

1. V-I Characteristics of Silicon and Germanium diodes and measurement of static and dynamic

resistances

2. Zener diode characteristics and its application as voltage regulator

3. Design, realization and performance evaluation of half wave rectifiers without filters and

with LC & p section filters

4. Design, realization and performance evaluation of full wave rectifiers without filters and with

LC & Π section filters

5. Plotting the characteristics of BJT in Common Base configuration and measurement of h-

parameters

6. Plotting the characteristics of BJT in Common Emitter configuration and measurement of h-

parameters

7. Plotting the characteristics of JFET in CS configurations and measurement of Trans-

conductance and Drain resistance

8. BJT biasing circuits

9. FET biasing circuits

10. Common Emitter BJT Amplifier and measurement of Gain, bandwidth, input and output

impedances

11. Common Source FET Amplifier and measurement of Gain, bandwidth, input and output

impedances

12. Emitter Follower / Source Follower circuits and measurement of Gain, bandwidth, input and

output impedance

13. Characteristics of special devices-UJT and SCR

14. Characteristics of Tunnel diode and photo diode

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Suggested Reading:

1. Paul B. Zbar, Albert P. Malvino, Michael A. Miller, Basic Electronics, A Text - Lab Manual,

7th

ed., McGraw Hill Education, 2001.

2. David Bell, Fundamentals of electronic devices and circuits Lab Manual, 5th

ed., Oxford

university press, 2009.

3. R.C. Jaeger & T. N. Blalock, Micro Electronic circuit design, 4th

ed.,Mc Graw Hill Higher

Education, 2011.

4. Paul Tobin, PSPICE for Circuit Theory and Electronic Devices, Morgan & Claypool publishers, 1st

ed., 2007.

Note:

Analysis and design of circuits should be carried out using SPICE tools wherever possible a

minimum of 10 Experiments are to be performed

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EC 232

ELECTRONIC WORKSHOP AND SIMULATION LAB

Instruction 3 Periods per week

Duration of University Examination 3 Hours

University Examination 50 Marks

Sessional 25 Marks

Objectives:

1. Familiarize with the basic electronic components.

2. Use of different meters

3. Demonstrate the working & usage of CRO

4. Design of Printed Circuit Board (PCB)

5. Familiarize with simulation of circuits using available simulation tools.

PART – A

1. Study of all types of discrete Active & passive devices, display devices, integrated

components, electro mechanical components (switches, sockets, connectors etc.,)

electromagnetic components (relays).

2. Study and use of different meters (volt/ammeter, AVO/Multi meter) for the measurement of

electrical parameters. Measurement of RLC components using LCR Meter.

3. Study of CRO & its block diagram.

4. Measurement of voltage, frequency and Phase Angle using CRO

5. Study of DSO and Measurement of signals using DSO

6. Study of PDC Board and implementation of Digital Logic using Basic Gates.

7. Half Adder and Full Adder using Universal Gates

8. Verification of Truth Tables for all Flip- Flops

9. 3-bit Asynchronous counter using FFs and Decade counter using IC 7490.

10. PCB design of a small circuit with its layout

11. Soldering & De-soldering Exercises using discrete components & ICs for a specific circuit

requirement

PART – B

12. Introduction to simulation in schematics : To create / open schematic file, placing the

components in to the work space, Editing the components, wiring , using measuring

instruments like Ammeter, Volt meter, Ohm meter, CRO, LCR meter. Etc.

13. V-I Characteristics of diodes (si and zener), and Characteristics of CE transistor

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14. Analysis and Frequency Response of BJT and FET Amplifier. Procedure to configure

waveform generators and Displays in the work space.

Note: not less than 12 experiments need to be executed in the semester. Students may use any

commercial / open source SPICE programs available like MULTISIM, PSPICE, TINA, LAB VIEW

etc.

Suggested Reading:

1. Zbar, P.B. Basic Electronics. A Text-Lab Manual, 7th

ed., McGraw Hill Education, 1995.

2. James M. Kirkpatric, Electronic Drafting and Printed Circuits Board design, Galgotia

Publisher, 1988.

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EC 221

ELECTRONIC ENGINEERING – I

(For EEE and EIE)

Instruction 4 Periods per Week

Duration of University Examination 3Hours

University Examination 75Marks

Sessional 25Marks

Objectives:

1. Obtain the characteristics of diode in forward and reverse bias and perform mathematical

modeling of diode as a resistor and capacitor.

2. Perform analysis and design of a complete AC to DC converter consisting of Rectifiers,

Filters and regulators.

3. Describe the construction and working of a Bipolar Junction Transistor in various modes

(CE, CB, CC) and design circuits for stabilization and compensation of a BJT.

4. Convert the BJT into its equivalent h parameter model and perform exact and approximate

analysis of BJT Amplifiers in mid frequency region for different modes of operation.

5. Describe the construction and working of JFET and MOSFET and design FET based

amplifiers.

UNIT I

Junction Diode : Different types of PN Junction formation techniques, PN Junction Characteristics,

biasing- band diagrams and current flow, Diode current equations under forward bias and reverse

bias conditions, Junction breakdown in diodes and breakdown voltages, effect of temperature on

diode characteristics, Zener Diodes, Zener voltage regulator and its limitation.

UNIT II

PN Diode Applications: Half wave, Full wave and Bridge rectifiers - their operation, performance

characteristics, and analysis; Filters (L, C, LC and CLC filters) used in power supplies and their

ripple factor calculations, design of Rectifiers with and without Filters.

Specials Diodes: Elementary treatment on the functioning of Tunnel diode, Varactor, Photo, Light

Emitting diodes. Liquid Crystal Display. CRO: study of block diagram of CRO

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UNIT III

Bipolar Junction Transistor : Transistor Junction formation (collector-base, base-emitter

Junctions) Transistor biasing-band diagram for NPN and PNP transistors, current components and

current flow in BJT, Modes of transistor operation, Early effect, BJT input and output characteristics

in CB, CE CC configuration, BJT as an amplifier, BJT biasing techniques, Thermal runway, heat

sinks and thermal stabilization, operating point stabilization against temperature and device

variations, stability factors, Bias stabilization and compensation techniques, Biasing circuit design.

UNIT IV

Small Signal Transistors equivalent circuits : Small signal low frequency h-parameter model of

BJT, Determination of h parameters, analysis of BJT amplifiers using h-parameter, comparison of

CB, CE and CC amplifier configurations, Analysis of BJT amplifier with approximate model.

Introduction to low frequency pi and T models.

Special Devices: working of UJT, SCR, DIAC, TRIAC and CCD.

UNIT V

Junction Field Effect Transistors (JFET): JFET formation, operation & current flow, pinch-off voltage, V-I characteristics of JFET. JFET biasing. Low frequency small signal model of FETs.

Analysis of CS, CD and CG amplifiers and their comparison. FET as an amplifier and as a switch. MOSFETs: MOSFETs, Enhancement & Depletion mode MOSFETs, V-I characteristics.

Suggested Reading:

1. Jacob Millman, Christos Halkias, Satyabrata jit, Electronics Devices and Circuits, 3rd

ed.,

McGraw Hill Education (India) Private Limited, 2010.

2. S Salivahanan, N Kumar, and A Vallavaraj, Electronic Devices and Circuits, 2nd

ed.,

McGraw Hill Education (India) Private Limited, 2007.

3. Millman J., Halkias C.C. and Parikh C, Integrated Electronics, 2nd

ed., McGraw Hill

Education (India) Private Limited, 2009.

4. Donald L Schilling and Charles Belove, Electronics Circuits, Discrete & Integrated, 3rd

ed.,

McGraw Hill Education (India) Private Limited, 1989.

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EC 222

BASIC ELECTRONICS

(For CSE, Mechanical and Production)

Instruction 4 Periods per Week

Duration of University Examination 3Hours

University Examination 75Marks

Sessional 25Marks

Objectives:

1. Analyze the behavior of Semiconductor diodes in Forward and Reverse bias

2. Design of Half wave and Full wave rectifiers with L,C,LC & CLC Filters

3. Explore V-I characteristics of Bipolar Junction Transistor in CB,CE & CC configurations

4. Explain feedback concept and different oscillators.

5. Analyze Digital logic basics and Photo Electric devices.

UNIT I

Semi Conductor Theory: Energy levels, Intrinsic and Extrinsic Semiconductor, Mobility, Diffusion

and Drift current. Hall Effect, Characteristics of P-N Junction diode, Parameters and Applications.

Rectifiers: Half wave and Full wave Rectifiers (Bridge, center tapped ) with and without filters,

ripple, regulation and efficiency. Zener diode regulator

UNIT II

Bipolar Junction Transistor: BJT, Current components, CE, CB, CC configurations, characteristics,

Transistor as amplifier. Analysis of CE, CB, CC Amplifiers (qualitative treatment only).

JFET: Construction and working, parameters, CS, CG, CD Characteristics, CS amplifier.

UNIT III

Feedback concepts: Properties of negative feedback amplifiers, Classification, Parameters.

Oscillators: Barkhausen Criterion, LC Type and RC type oscillators and crystal oscillator.

(Qualitative treatment only)

UNIT IV

Operational Amplifiers – Introduction to OP Amp, characteristics and applications - Inverting and

Non-inverting Amplifiers, Summer, Integrator, Differentiator, Instrumentation Amplifier.

Digital System: Basic Logic Gates, Half, Full Adder and Subtractors.

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UNIT V

Data Acquisition systems: Study of transducer (LVDT, Strain gauge, Temperature, Force).

Photo Electric Devices and Industrial Devices: Photo diode, Photo Transistor, LED, LCD,

SCR, UJT Construction and Characteristics only.

Display Systems: Constructional details of C.R.O and Applications.

Suggested Reading:

1. Jacob Millman, Christos Halkias, Satyabrata jit, Electronics Devices and Circuits ,3rd

ed.,

McGraw Hill Education (India) Private Limited, 2010

2. Ramakanth A. Gayakwad, Op-AMPS and Linear Integrated Circuits, 4th

ed., Prentice Hall of

India, 2000.

3. M. Morris Mano, Digital Design, 3rd

edition, Prentice Hall of India, 2002.

4. William D Cooper, and A. D. Helfrick, Electronic Instrumentations and Measurement

Techniques, 2nd

ed., Prentice Hall of India, 2008.

5. S. Shalivahan, N. Suresh Kumar, A. Vallava Raj, Electronic Devices and Circuits, 2nd

Edition,

McGraw Hill Education (India) Private Limited, 2007.

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EC 241

ELECTRONICS ENGINEERING – I LAB

(For EEE and EIE)

Instruction 3 Periods per Week

Duration of University Examination 3Hours

University Examination 50Marks

Sessional 25Marks

Objectives:

1. Obtain V-I Characteristics of PN, Zener diodes, Tunnel and photo diodes, UJT, SCR, BJT

and JFET.

2. Design rectifier circuits with and without capacitor filters.

3. Explain the working principle of CRO.

List of Experiments:

1. V-I Characteristics of Silicon and Germanium diodes and measurement of static and dynamic

resistances.

2. Zener diode characteristics and its application as voltage regulator

3. Design, realization and performance evaluation of half wave rectifiers without filters and with

LC & π-section filters.

4. Design, realization and performance evaluation of full wave rectifiers without filters and with

LC & π- section filters.

5. Plotting the characteristics of BJT in Common Emitter configuration and measurement of h-

parameters

6. Plotting the characteristics of JFET in CS configurations and measurement of Trans-

conductance and Drain resistance

7. Study on CRO and its Application

8. BJT biasing circuits and calculation of DC conditions

9. Common Emitter BJT Amplifier and measurement of Gain, bandwidth, input and output

impedances

10. Common Source FET Amplifier and measurement of Gain, bandwidth, input and output

impedances

11. Characteristics of special devices-UJT or SCR

12. Characteristics of Tunnel diode and photo diode

Suggested Reading:

1. Paul B. Zbar, Albert P. Malvino, Michael A. Miller, Basic Electronics, A Text - Lab Manual, 7th

ed., McGraw Hill Education, 2001.

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General Note:

1. The experiments should be performed on bread board using discrete components.

2. There should not be more than 2 students per batch while performing any of the lab

experiment.

3. A minimum of 10 experiments should be performed.

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EC 242

BASIC ELECTRONICS LAB (For CSE, Mechanical and Production)

Instruction 3 Periods per Week

Duration of University Examination 3Hours

University Examination 50Marks

Sessional 25Marks

Objectives:

1. Demonstrate the characteristics of Semiconductor diodes

2. Realize the filters and rectifiers.

3. Verify the characteristics of different transistor Configurations

4. Design of Biasing Circuits for BJT and FET Amplifiers

5. Design different circuits using Operational Amplifiers. List of Experiments:

1. CRO-Applications, Measurements of R, L and C using LCR meter, Color code method and

soldering practice.

2. Characteristics of Semiconductors diode (Ge, Si and Zener)

3. Static Characteristics of BJT-Common Emitter

4. Static Characteristics of BJT-Common Base

5. Static Characteristics of FET

6. RC-Phase Shift Oscillator

7. Hartley and Colpitt’s Oscillators

8. Common Emitter Amplifier

9. Astable Multivibrator

10. Full-wave rectifier with and without filters using BJT

11. Operational Amplifier Applications

12. Strain Gauge Measurement

13. Analog-to-Digital and Digital to Analog Converters

Suggested Reading:

1. David Bell A., Operational Amplifiers and Linear ICS, Prentice Hall of India, 2005.

2. David Bell A., Laboratory Manual for Electronic Devices and Circuits, Prentice Hall of India,

2007.

3. Boylestad R.L and Nashelsky, Electronics Devices and Circuit Theory, Prentice Hall of India,

2006.

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SCHEME OF INSTRUCTION AND EXAMINATION

BE II YEAR

(ELECTRONCIS AND COMMUNICATION ENGINEERING)

SEMESTER – II

S.No. Code No. Subject Scheme of

Instruction Scheme of Examination

THEORY L/T D/P

Duration

in Hours

Max. Marks

Univ.

Exams

Sessionals

1 EC 251 Analog Electronic

Circuits 4 - 3 75 25

2 EC 252 Networks and

Transmission Lines 4 - 3 75 25

3 EC 253

Probability Theory

and Stochastic

Processes

4 - 3 75 25

4 EC 254

Signal Analysis and

Transform

Techniques

4 - 3 75 25

5 EC 255 Switching Theory

and Logic Design 4 - 3 75 25

6 CE 222 Environmental

Studies 4 - 3 75 25

PRACTICALS

1 EC 281 Analog Electronic

Circuits Lab - 3 3 50 25

2 EE 292 Electrical

Technology Lab - 3 3 50 25

TOTAL 24 6 550 200

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SCHEME OF INSTRUCTION AND EXAMINATION

BE II YEAR

(SERVICE COURSES OFFERED TO OTHER DEPARTMENTS)

SEMESTER – II

S.No. Code No. Subject Scheme of

Instruction Scheme of Examination

THEORY L/T D/P

Duration

in Hours

Max. Marks

Univ.

Exams

Sessionals

1 EC 271

Electronics

Engineering – II

(for EEE and

EIE)

4 - 3 75 25

2 EC 272

Basic Electronics

(for Mech., and

Prod.,)*

4 - 3 75 25

PRACTICALS

1 EC 291

Electronics

Engineering - II

Lab

(for EEE and

EIE)

- 3 3 50 25

2 EC 292

Basic Electronics

Lab

(for Mech.,

Prod.,)**

- 3 3 50 25

TOTAL 8 6 250 100

*Syllabus same as EC 222

**Syllabus same as EC 242

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EC 251

ANALOG ELECTRONIC CIRCUITS

Instructions 4 Periods per week

Duration of University Examination 3 Hours

University Examination 75 Marks

Sessionals 25 Marks

Objectives:

1. Analyze frequency response of Amplifiers.

2. Familiarize with concept and effect of Negative Feedback

3. Design oscillators and Regulators.

4. Design Power Amplifiers.

5. Familiarize with concept of tuned Amplifiers.

UNIT I

Small signal amplifiers: Classification of amplifiers. Mid-frequency, Low-frequency and high

frequency analysis of single and Multistage RC coupled amplifier with BJT & FET. Analysis of

Transformer coupled amplifier at mid-frequency, low-frequency and high frequency.

UNIT II

Feed Back Amplifiers: The feedback concept, General characteristics of negative feedback

amplifier, Effect of negative feedback on input and output impedances, voltage and current, series

and shunt feedbacks, Stability considerations, Local Versus global feedback.

UNIT III

Oscillators: Positive feedback and conditions for sinusoidal oscillations, RC oscillators, LC

oscillators, Crystal oscillator, Amplitude and frequency stability of oscillator.

Regulators: Transistorized series and shunt regulators.

UNIT IV

Large Signal Amplifiers: BJT as large signal audio amplifiers, Classes of operation, Harmonic

distortion, power dissipation, efficiency calculations. Design considerations of transformer coupled

and transform less push- pull audio power amplifiers under Class-A, Class-B, Class-D and Class-AB

operations.

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UNIT V

R.F. Voltage Amplifiers: General considerations, Analysis and design of single tuned and double

tuned amplifiers with BJT, selectivity, gain and bandwidth. Comparison of multistage, single tuned

amplifiers and double tuned amplifiers. The problem of stability in RF amplifiers, neutralization and

uni-laterisation, introduction to staggered tuned amplifier.

Suggested Reading:

1. Jacob Millman, Christos Halkias, Chetan Parikh, Integrated Electronics, 2nd

ed., McGraw Hill

Education (India) Private Limited, 2011.

2. S Salivahanan, N Kumar,and A Vallavaraj, Electronic Devices and Circuits, McGraw Hill,3rd

edition, 2010.

3. Donald Schilling, Charles Belove, Tuvia Apelewicz, Raymond Saccardi, Electronic Circuits:

Discrete And Integrated, TMH, 3rd

edition, 2002.

4. Donald A.Neamen, Electronic Circuits: Analysis and Design, 3rd

edition, McGraw Hill, 2006.

5. Allen Mottershead, Electronic Devices and Circuits: An introduction, 2009.

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EC 252

NETWORKS AND TRANSMISSION LINES

Instruction 4 periods per week

Duration of University Examination 3 Hours

University Examination 75 Marks

Sessionals 25 Marks

Objectives:

1. Analyze concepts of Symmetrical and Asymmetrical Networks

2. Design different types of filters

3. Explain attenuators and their design

4. Explore the concepts of transmission lines

5. Explain characteristics and parameters of transmission lines.

UNIT-I

Asymmetrical networks, Image and Iterative impedances. Image transfer constant and iterative

transfer constant. Symmetrical networks, characteristic impedance and propagation constant.

Properties of L, T and Pi section types.

UNIT-II

Constant K-filters – low pass, high pass, band pass, band elimination filter design, m-derived — low

pass, high pass, band pass, band elimination filter design and composite filter design. Notch filter.

UNIT-III

Network synthesis: Hurwitz polynomials, positive real functions, L-C Immitance functions, RC

impedance functions and RL admittance functions. RL impedance functions and RC admittance

functions. Cauer And Foster’s forms of RL impedance and RC admittance

Attenuators and their design. Equalizers and their design. Impedance matching networks. Inverse

network elements.

UNIT-IV

Properties of transmission lines. Transmission line equations from source and load end. The finite

and infinite lines. Velocity of propagation, input impedance. Open and short circuited lines,

telephone cables, distortion less transmission, loading of cables, Campbell’s formula.

UNIT-V

Properties of Transmission lines at UHF, Reflection co-efficient, Standing waves and SWR,

Distribution of voltages and currents on loss less line. Characteristics of half wave, Quarter-wave

and one eighth wave lines. Construction and applications of Smith chart. Transmission line

matching. Single and double stub matching.

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Suggested Reading:

1. John D. Ryder, Networks, Lines and Fields, PHI, 2nd edition, 2009.

2. M.E. Van Valkenburg, Network Analysis, PHI, 3rd edition, 2009.

3. S.P. Ghosh and A.K. Chakraborty, Network Analysis and Synthesis, McGraw Hill,

1st edition, 2009.

4. Roy, Choudhury D., Networks and Systems, New Age International Publishers,

2nd edition, 2010.

5. Ghosh, Smarjit, Network Theory : Analysis and Synthesis, 1st ed.,PHI, 2009.

EC 253

PROBABILITY THEORY AND STOCHASTIC PROCESSES

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Instruction 4 periods per week

Duration of University Examination 3 Hours

University Examination 75 Marks

Sessionals 25 Marks

Objectives:

1. Define different types of random variables and their density and distribution functions

2. Analyze one random variable and characteristic functions of different variables using their

density or distribution functions.

3. Define the functions of two random variables and probability density and distribution of the

functions

4. Explain the concepts of sequences of random variables, Properties of Random vectors.

5. Explore elementary concepts of the Random Processes

UNIT I

Concepts of Probability and Random Variable: Definitions, Probability and Induction, Causality

versus Randomness, Review of Set Theory, Probability Space, Conditional Probability. Repeated

Trials Combined Experiments, Bernoulli Trials, Bernoulli’s Theorem and Games of Chance.

Random Variable: Definition, Distribution and Density Functions, Specific Random Variables and

their probability density and distribution functions: Normal, Exponential, Gamma, Chi-Square,

Raleigh, Nakagami-m, Uniform, Beta, Cauchy, Laplace and Maxwell, Bernoulli, Binomial, Poisson,

Geometric, Negative Binomial Conditional Distributions, Asymptotic Approximations for Binomial

Random Variable

UNIT II

Functions of One Random Variable Function of a random Variable g(x), The Distribution of g(x),

Mean and Variance, Moments, Characteristic Functions

UNIT III

Two Random Variables Bi-variate Distributions, One Function of Two Random Variables, Two

Functions of Two Random Variables, Joint Moments, Joint Characteristic Functions, Conditional

Distributions, Conditional Expected Values

UNIT IV

Sequences of Random Variables General Concepts, Conditional Densities, Characteristic

Functions, and Normality, Mean Square Estimation, Stochastic Convergence and Limit, Theorems.

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Random Numbers: Meaning, Generation of random sequence and pseudo random binary sequence.

Applications of random numbers

UNIT V

Stochastic Processes General and elementary concepts and definitions of stationary, ergodic,

random processes and independence, spectral density, white and color noise, response to linear

systems and stochastic inputs, Markov Processes.

Suggested Reading:

1. A Papoulis, S.U. Pillai, “Probability, Random Variables and Stochastic Processes”, 4th

edition,

Mc-Graw Hill. 2008.

2. Peyton Z Peebles, “Probability, Random Variables & Random Signal Properties”, 4th

ed.,

McGraw Hill Education (India) Private Limited, 2002.

3. Henry Stark and John W.Woods “Probability and Random Processes with Application to Signal

Processing” 4th ed., Pearson Publications, 2011.

EC 254

SIGNAL ANALYSIS AND TRANSFORM TECHNIQUES

Instructions 4 Periods per week

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Duration of University Examination 3 Hours

University Examination 75 Marks

Sessionals 25 Marks

Objectives:

1. Analyze basic concepts related to signals and systems.

2. Familiarize with basic operations on signals and mathematical representation of periodic and

aperiodic signals.

3. Define convolution, correlation operations on continuous signals.

4. Define the characterization of system using constant coefficient difference equations.

5. Analyze the response of systems upon application of step and ramp inputs using Fourier and

Z transforms.

UNIT I

Definitions and classifications: Classification of continuous time signals. Basic operations on

continuous-time signals and classification of continuous-time systems.

Discrete-time signals and systems: Sampling, Classification of discrete-time signals, Basic

operations on discrete time signals, Classification of discrete time systems, properties of systems.

UNIT II

Representation of Continuous-time signals: Analogy between vectors and signals, signal

representation by a discrete- set of orthogonal functions, orthogonality and completeness.

Fourier series – Trigonometric and Exponential Fourier series, computational formulae, symmetry

conditions, the complex Fourier spectrum. Solution of wave equation and Laplace equation

Fourier Transform (FT): The direct and inverse FT, existence of FT, Properties of FT, The

Frequency Spectrum.

UNIT III

Laplace Transform (LT): The direct LT, Region of convergence, existence of LT, properties of

LT. The inverse LT, Solution of differential equations, system transfer function.

Linear Convolution of continuous time signals: Graphical interpretation, properties of convolution,

Correlation between continuous-time signals: Auto and Cross correlation, graphical interpretation,

properties of correlation.

UNIT IV

Z-Transform: The direct Z transform, Region of convergence, Z-plane and S-plane correspondence.

Inverse Z transform, Properties of Z-transforms, Solution to linear difference equations, Linear

constant coefficient systems, System transfer function

UNIT V

Discrete Fourier series, Frequency domain Representation of discrete-time systems and signals.

Sampling the z-transform.

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Linear Convolution of discrete time signals: Graphical interpretation, properties of discrete

convolution.

Correlation between discrete time signals: Auto and Cross-correlation, graphical interpretation,

properties of correlation.

Suggested Reading:

1. B.P. Lathi, Signals, Systems and Communication, 1st ed., BS Publications, 2011.

2. Alan V. Oppenheim, Alan S. Wilsky and S. Hamid Nawab, Signals and Systems, 2nd

ed., PHI,

2009.

3. Luis F. Chaparro, Signals and Systems using MATLAB, Academic press, 2011.

4. Alan V Oppenheim and Ronald W. Schafer, Digital Signal Processing, 1st ed., PHI, 2008.

5. P. Ramakrishna Rao, Signals and Systems, 2nd

ed., McGraw Hill Education (India) Private

Limited, 2013.

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EC 255

SWITCHING THEORY AND LOGIC DESIGN

Instructions 4 Periods per week

Duration of University Examination 3 Hours

University Examination 75 Marks

Sessionals 25 Marks

Objectives:

1. Familiarize with concepts of number systems and Boolean Algebra

2. Analyze minimization techniques of Boolean functions

3. Design combinational circuits

4. Design sequential circuits

5. Design and analyze Synchronous counters

UNIT I

Number system and Codes: Binary, Octal, Hexa Decimal numbers, Number base conversion,

Signed binary numbers: 1’s Complement, 2’s complement, Types of codes: Weighted , Un Weighted

code, BCD, Excess -3 code, Development of Gray code, Parity code

Boolean Algebra: Properties of Boolean algebra, Basic Laws and Theorems, DeMorgan’s theorem,

Switching Functions, definitions, simplifications, Canonical and Standard Forms, Logic Gates,

Functional Properties.

UNIT II

Minimization of Switching Functions: The Map Method (K-Map), 5-variable map, Minimal

Functions and their properties. Prime implicants, Essential Prime Implicants, Quine-McCluskey

Tabular Method, Don’t – care combinations

Logic Design realization: Design with basic logic gates, Single Output and Multiple Output

Combinational Logic Circuit Design, AND-OR, OR-AND and NAND/NOR Realizations,

Exclusive-OR and Equivalence Functions.

UNIT III

Combinational Logic Design: Comparators, multiplexer and its applications, decoders,

demultiplexers, priority encoders, Code Conversion, Parity generator and checker, BCD to seven

segment decoder; ROM as a combination of decoder with encoder;

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Full Adder and Subtractor, Serial adder, Ripple carry adder and Carry-look ahead adder. Twos

complement ADD/ Subtractor, Decimal adder;

Implementing Boolean functions with IC 74151, IC 74153,IC 74138.

Contact Networks, Hazards: Static Hazards, Design of Hazard-Free Switching Circuits.

UNIT IV

Sequential Logic Design: Memory element, S-R, J-K and D Latch operation, Race around

condition, Master Salve J-K Flip Flop, Flip-Flop types: S-R, J-K, D, T, State table, State diagram,

Characteristic equation and excitation table, Set up and hold time, Flip flop conversions.

UNIT V

Sequential Logic Design: Classification, state diagram, state table, Asynchronous and Synchronous

counters, Skipping state counter, Counter Lock – out, Shift registers and applications. Implementing

counters with IC 7476, IC 7474, IC 7490, IC 7492, IC 7493.

Suggested Reading:

1. Mano M., Digital Design, Prentice Hall, New Delhi, 2008.

2. Zvi Kohavi, Switching and Finite Automata Theory, 3rd

ed., Cambridge University Press-New

Delhi, 2011.

3. Ronald j Tocci, Neal s Widmer, Gregory L Moss, Digital Systems: Principles and applications,

Prentice Hall India, 2009.

4. R. P Jain, Modern Digital Electronics,4th

ed., McGraw Hill Education (India) Private Limited,

2003

5. John F Wakerly, Digital Design Principles and practices, 4th

ed., Pearson India, 2008.

6. Fletcher, William, An Engineering approach to digital design, 1st ed., Prentice Hall India, 2009..

7. Herbert Taub, Donald L.Schilling, Digital Integrated electronics, 1sted., McGraw Hill Education

(India) Private Limited, 2010.

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CE 222

ENVIRONMENTAL STUDIES

Instructions 4 Periods per week

Duration of University Examination 3 Hours

University Examination 75 Marks

Sessionals 25 Marks

Objectives:

1.To study the sources of water, floods and its impact on environment.

2. To know about the ecosystem and energy resource system.

3.To understand the biodiversity concepts and its advantages.

4.To study different types of pollution and its impact on environment.

5.To know the social and environment related issues and their preventive measures.

UNII-I

Environmental studies: Definition, scope and importance, need for public awareness. Natural

resources: Water resources; use and over utilization of surface and ground water, floods, drought,

conflicts over water, dam’s benefits and problems. Effects of modern agriculture, fertilizer-pesticide

problems, water logging salinity. Energy resources, growing energy needs, renewable and non-

renewable energy sources. Land Resources, land as a resource, land degradation, soil erosion and

desertification.

UNIT-II

Ecosystems: Concepts of an ecosystem, structure and functions of an ecosystem, producers,

consumers and decomposers, energy flow in ecosystem, food chains, ecological pyramids, aquatic

ecosystem (ponds, streams, lakes, rivers, oceans, estuaries).

UNIT-III

Biodiversity: Genetic species and ecosystem diversity, bio-geographical classification of India.

Value of biodiversity, threats to biodiversity, endangered and endemic species of India,

conservation of biodiversity.

UNIT-IV

Environmental Pollution: Causes, effects and control measures of air pollution, water pollution,

soil pollution, noise pollution, thermal pollution and solid waste management, Environment

Protection Act; Air, water, forest and wild life acts, issues involved in enforcement of

environmental legislation.

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UNIT-V

Social Aspects and the Environment: Water conservation, watershed management, and

environmental ethics. Climate change, global warming, acid rain, ozone layer depletion.

Environmental protection act, population explosion.

Disaster Management: Types of disasters, impact of disasters on environment, infrastructure and

development. Basic principles of disaster mitigation, disaster management, and methodology,

disaster management cycle, and disaster management in India.

Suggested Reading :

1. A. K. De, Environmental Chemistry, New Age Publications, 2002.

2. E. P. Odum, Fundamentals of Ecology, W.B. Sunders Co., USA.

3. GL. Karia and R.A. Christian, Waste Water Treatment, Concepts and Design Approach,

Prentice Hall of India, 2005

4. Benny Joseph, Environmental studies, TataMcGraw-Hill, 2005

5. V. K. Sharma, Disaster Management, National Centre for Disaster Management, IIPE, Delhi,

1999.

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EC 281

ANALOG ELECTRONIC CIRCUITS LAB

Instructions 3 Periods per week

Duration of University Examination 3 Hours

University Examination 50 Marks

Sessionals 25 Marks

Objectives:

1. Verify frequency response of BJT and FET amplifiers

2. Design different negative feedback amplifiers circuits

3. Design AF and RF oscillator circuits.

4. Design power amplifiers

5. Demonstrate various circuits using PSPICE and verifying functionality.

6. Design Network Theorems and passive filters.

Lab Experiments:

PART – A

1. Design & frequency response of single stage and multistage RC Coupled amplifier using BJT.

2. Design & frequency response of single stage and multistage RC Coupled amplifier using FET.

3. Voltage series feedback amplifier.

4. Current shunt feedback amplifier.

5. Voltage shunt feedback amplifier.

6. Current series feedback amplifier.

7. RC phase shift, Wein bridge oscillator.

8. Hartley oscillator & Colpitts Oscillator.

9. Design of Class-A power amplifier.

10. Design of Class-B power amplifier.

11. Frequency response of Tuned Amplifiers (Single and Double).

12. Transistor regulator.

13. & 14.Simulation experiments using PSPICE

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PART – B

1. Thevenin’s and Norton’s Theorems

2. Maximum Power Transfer, Superposition and Millman’s Theorems

3. Two-Port Parameters

4. Series and Parallel Resonance

5. Constant K low pass and high pass filter

6. m-derived low pass and high pass filter

Suggested Reading:

1. Paul B. Zbar, Albert P.Malvino, Michael Miller, Basic Electronics, A Text- Lab Manual,7th

ed.,

McGraw Hill Education (India) Private Limited,2001.

2. David Bell A, Laboratory Manual for Electrical Circuits, PHI-New Delhi, 2009.

3. Hayt W H Kemmerly J.E and Durbin SM, Engineering Circuit Analysis, 8th

ed., McGraw Hill

Education (India) Private Limited, 2013.

Note:

1. A total of not less than 12 experiments must be carried out during the semester. (Where ever

possible, more than 1 lab experiment should be carried out in one lab session of 3 periods per

week.)

2. The experiments should be performed on bread board using discrete components.

3. There should not be more than 2 students per batch while performing any of the lab

experiment.

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EE 292

ELECTRICAL TECHNOLOGY LAB

Instructions 3 Periods per week

Duration of University Examination 3 Hours

University Examination 50 Marks

Sessionals 25 Marks

Objectives:

1. Demonstrate characteristics of generators and motors.

2. Design speed control methods of induction meter

3. Measure three-phase power.

List of Experiments:

1. Magnetization curve of a separately excited DC generator.

2. Load characteristics of a shunt generator.

3. Load characteristics of a series generator.

4. Performance characteristics of a DC shunt motor.

5. Load characteristics of a DC series motor.

6. Performance characteristics of a compound motor.

7. Speed control of DC motor.

8. O.C. and S.C. tests on single phase transformer.

9. Load test on single phase transformer.

10. Performance characteristics of a three phase induction motor.

11. Speed control methods of induction motors.

12. Regulation of alternator by O.C. and S.C. tests.

13. Measurement of three-phase power by Two Wattmeter method.

Note: At least 10 Experiments should be conducted in the semester

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EC 271

ELECTROINCS ENIGNEERING – II

(For EEE and EIE)

Instruction 4 Periods per Week

Duration of University Examination 3Hours

University Examination 75Marks

Sessionals 25Marks

Objectives:

1. Identify the components that effect the frequency response and analyze the single and multi

stage amplifiers

2. Recognize the type of feedback and analyze its effect on amplifier’s characteristics

3. Calculate the frequency of oscillation for different types of oscillator circuits suited for

various applications using Barkhausen’s criterion

4. Identify the importance of power amplifiers and calculate the efficiencies of class –A, B, AB

and examine the effect on distortion

5. Identify the linear and non-linear wave shaping circuits for various waveforms & analyze

their response.

UNIT-I

Multistage amplifiers: Classification of amplifiers, Low, mid and high Frequency response of

single stage RC coupled amplifiers, step response of amplifier, Cascading of amplifier, Interacting

and non interacting amplifiers, effect of cascading on gain and Bandwidth.

UNIT-II

Feed Back Amplifiers: The feedback concept, General characteristics of negative feedback

amplifier, Effect of negative feedback on input and output impedances, Voltage and current, series

and shunt feedbacks. Stability considerations, Local Versus global feedback.

UNIT-III

Oscillators: Bark-hausen Criterion, RC oscillator, Weinbridge, Phase shift, LC Hartley and

colpitts oscillator, Crystal controlled oscillator, (Analysis oscillators using BJTs only) frequency

stability of oscillator.

UNIT-IV

Large Signal Amplifiers: BJT as large signal audio amplifiers, Classes of operation, Harmonic

distortion, power dissipation, efficiency calculations. Design considerations of transformer coupled

and transform less push-pull audio power amplifiers under Class-A. Class-B, Class D and Class-AB

operations

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UNIT-V

Wave-Shaping Circuits: RC Low Pass and High Pass circuit, response to Step, Pulse, Ramp and

square wave inputs, Differentiating and Integrating circuits using diode, Clipping Circuits for Single

level and two levels, Clamping Circuits.

Suggested Reading:

1. Jacob Millman, Christos Halkias, satyabrata jit, Electronics Devices and circuits ,3rd

ed.,McGraw Hill Education (India) Private Limited, 2010.

2. Jacob Millman, Christos Halkias, Chetan Parikh, Integrated Electronics, 2nd

ed., McGraw

Hill Education (India) Private Limited, 2011.

3. Donald L Schilling & Charles Belove, Electronics Circuits, Discrete & Integrated, 3rd

ed.,

McGraw Hill Education (India) Private Limited, 2002.

4. Jacob Millman and Herbert Taub, Pulse, Digital and Switching waveforms, 3rd

ed., McGraw

Hill Education (India) Private Limited, 2011.

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EC 272

BASIC ELECTRONICS

(For Mechanical, Production and CSE)

Instruction 4 Periods per Week

Duration of University Examination 3Hours

University Examination 75Marks

Sessional 25Marks

Objectives:

1. Analyze the behavior of Semiconductor diodes in Forward and Reverse bias

2. Design of Half wave and Full wave rectifiers with L,C,LC & CLC Filters

3. Explore V-I characteristics of Bipolar Junction Transistor in CB,CE & CC configurations

4. Explain feedback concept and different oscillators.

5. Analyze Digital logic basics and Photo Electric devices.

UNIT I

Semi Conductor Theory: Energy levels, Intrinsic and Extrinsic Semiconductor, Mobility, Diffusion

and Drift current. Hall Effect, Characteristics of P-N Junction diode, Parameters and Applications.

Rectifiers: Half wave and Full wave Rectifiers (Bridge, center tapped ) with and without filters,

ripple, regulation and efficiency. Zener diode regulator

UNIT II

Bipolar Junction Transistor: BJT, Current components, CE, CB, CC configurations, characteristics,

Transistor as amplifier. Analysis of CE, CB, CC Amplifiers (qualitative treatment only).

JFET: Construction and working, parameters, CS, CG, CD Characteristics, CS amplifier.

UNIT III

Feedback concepts: Properties of negative feedback amplifiers, Classification, Parameters.

Oscillators: Barkhausen Criterion, LC Type and RC type oscillators and crystal oscillator.

(Qualitative treatment only)

UNIT IV

Operational Amplifiers – Introduction to OP Amp, characteristics and applications - Inverting and

Non-inverting Amplifiers, Summer, Integrator, Differentiator, Instrumentation Amplifier.

Digital System: Basic Logic Gates, Half, Full Adder and Subtractors.

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UNIT V

Data Acquisition systems: Study of transducer (LVDT, Strain gauge, Temperature, Force).

Photo Electric Devices and Industrial Devices: Photo diode, Photo Transistor, LED, LCD,

SCR, UJT Construction and Characteristics only.

Display Systems: Constructional details of C.R.O and Applications.

Suggested Reading:

1. Jacob Millman, Christos Halkias, Satyabrata jit, Electronics Devices and circuits ,3rd

ed.,

McGraw Hill Education India Private limited,2010.

2. Ramakanth A. Gayakwad, Op-AMPS and Linear Integrated Circuits, 4th

ed., Prentice Hall of

India, 2000.

3. M. Morris Mano, Digital Design, 3rd

ed., Prentice Hall of India, 2002.

4. William D Cooper, aand A. D. Helfrick, Electronic Instrumentations and Measurement

Techniques, 2nd

ed., PHI 2008.

5. S. Shalivahan, N. Suresh Kumar, A. Vallava Raj, Electronic Devices and Circuits,3rd

ed.,

McGraw Hill Education India Private limited, 2012.

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EC 291

ELECTRONICS ENGINEERING – II LAB

(For EEE and EIE)

Instruction 3 Periods per Week

Duration of University Examination 3Hours

University Examination 50Marks

Sessional 25Marks

Objectives:

1. Evaluate the frequency response of amplifier circuits.

2. Design various oscillator circuits.

3. Design power amplifier, clipper and clamper circuits.

List of Experiments

1. Frequency response of two stage RC Coupled BJT amplifier

2. Current-Series Feedback Amplifier with & with-out Feedback

3. Voltage-Series Feedback Amplifier with & with-out Feedback

4. Current-Shunt Feedback Amplifier with & with-out Feedback

5. Voltage-Shunt Feedback Amplifier with & with-out Feedback

6. RC phase shift oscillator,

7. Hartley oscillator

8. Colpitts Oscillator

9. Design of Class-A power amplifier.

10. Design of Class-B power amplifier.

11. Clipping Circuits

12. Clamping Circuits

Suggested Reading:

1. Paul B. Zbar, Albert P. Malvino, Michael A. Miller, Basic Electronics, A Text - Lab Manual, 7th

ed., McGraw-Hill Higher Education 2001.

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EC 292

BASIC ELECTRONICS LAB (For Mechanical, Production and CSE)

Instruction 3 Periods per Week

Duration of University Examination 3Hours

University Examination 50Marks

Sessionals 25Marks

Objectives:

1. Demonstrate the characteristics of Semiconductor diodes

2. Realize the filters and rectifiers.

3. Verify the characteristics of different transistor Configurations

4. Design of Biasing Circuits for BJT and FET Amplifiers

5. Design different circuits using Operational Amplifiers.

List of Experiments:

1. CRO-Applications, Measurements of R, L and C using LCR meter, Color code method and

soldering practice.

2. Characteristics of Semiconductors diode (Ge, Si and Zener)

3. Static Characteristics of BJT-Common Emitter

4. Static Characteristics of BJT-Common Base

5. Static Characteristics of FET

6. RC-Phase Shift Oscillator

7. Hartley and Colpitt’s Oscillators

8. Common Emitter Amplifier

9. Astable Multivibrator

10. Full-wave rectifier with and without filters using BJT

11. Operational Amplifier Applications

12. Strain Gauge Measurement

13. Analog-to-Digital and Digital to Analog Converters

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Suggested Reading:

1. David Bell A., Operational Amplifiers and Linear ICS, Prentice Hall of India, 2005.

2. David Bell A., Laboratory Manual for Electronic Devices and Circuits, Prentice Hall of India,

2007.

3. Boylestad R.L and Nashelsky, Electronics Devices and Circuit Theory, Prentice Hall of India,

2006.