Renishaw Clasic R-2

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    Slide 1

    Touch-trigger probe technologies

    Resistive simple

    compact

    rugged

    Strain-gauge solid-state switching

    high accuracy and

    repeatability

    long operating life

    Piezo three sensing

    methods in one probe

    ultra-high accuracy

    quill mounted

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    Slide 2

    Kinematic resistive probe operation

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    Slide 3

    Kinematic resistive probe operation

    probe in seated positionAll kinematics

    in contact

    Motion of

    machine

    stylus makes contact with

    component

    contact force resisted by reactiveforce in probe mechanism

    resulting in bending of the stylus

    Reactive

    force

    Contact

    force

    stylus assembly pivots about

    kinematic contacts, resulting in

    one or two contacts moving apart trigger generated before

    contacts separate

    Contacts

    separate

    Pivots about

    these

    contacts

    machine backs off surface and

    probe reseats

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    Slide 4

    Kinematic resistive probe operation

    lectrical s!itching

    electrical circuit through

    contacts

    resistance measured

    contact patches reduce in

    sie as stylus forces build

    Kinematicattache" to

    stylus

    Kinematics bon"e" to #an"

    insulate" from$ probe bo"y

    Current flo!s

    throughkinematics

    Contact patch shrinks as

    stylus force balances

    spring force

    Resistance rises as area

    re"uces #R % &A$

    Close-up vie! of

    kinematics'

    lastic "eformation

    Section through

    kinematics'

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    Slide !

    Kinematic resistive probe operation

    lectrical s!itching

    resistance breaches

    threshold and probe

    triggers

    kinematics are still in

    contact when probetriggers

    stylus in "efine"

    position

    current cut before

    kinematics separate toavoid arcing

    (orce on

    kinematics

    Resistance

    Trigger

    threshol"

    Trigger

    signal

    generate"

    (orce on kinematics

    !hen stylus is in freespace

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    Slide "

    (actors in measurement performance

    Pre-travel

    stylus bending under contact

    loads before trigger threshold is

    reached

    pre-travel "epen"s on (C an" )

    trigger is generated a short

    distance after the stylus first

    touches the component

    (C* ) % (S* R# and $Sare constant

    (Cis proportional to R

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    Slide %

    (actors in measurement performance

    Pre-travel variation - +lobing,

    trigger force depends on probing

    direction, since pivot point varies

    $&is proportional to '

    therefore, pre-travel varies around

    the () plane

    Top vie!

    igh force

    "irection'

    Pivot

    point

    )o! force

    "irection'

    Pivot

    point

    R./ R0

    (C./ (C0

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    Slide *

    (actors in measurement performance

    Pre-travel variation - +lobing,

    trigger force in + direction is higher than

    in () plane

    no mechanical advantage over spring

    $& $S

    kinematic resistive probes ehibit 3.

    /()+0 pre-travel variation

    combination of + and () trigger effects

    low ()+ useful for contoured part

    inspection

    Test "ata'

    S5 163"6-2 3. form

    26 with !6 mm stylus7 486 m /686661" in0

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    Slide 9

    (actors in measurement performance

    Probe calibration pre-travel can be compensated by probe

    calibration

    a datum feature /of known sie and position0 is

    measured to establish the average pre-travel

    key performance factor is repeatability

    )imitations

    on comple parts, many probing directions may

    be needed

    low means simple calibration can be usedfor comple measurements

    if is significant compared to allowable

    measurement error, may need to qualify the

    probe : stylus in each probing direction

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    Slide 16

    (actors in measurement performance

    Typical pre-travel variation () plane

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    Slide 11

    (actors in measurement performance

    Repeatability the ability of a probe to trigger

    at the same point each time

    a random error with a ;ormal

    distribution

    for a given probe and probingcondition, repeatability is equal

    to twice the standard deviation

    /20 of the ;ormal distribution

    9!< confidence level that all

    readings taken in this mode

    will repeat within =:- 2 from a

    mean value

    ysteresis error arising from the direction

    of the preceding probing move

    maimum hysteresis occurs

    when a measurement follows a

    probing moves in oppositedirections to each other in the

    probe>s () plane

    hysteresis errors increases

    linearly with trigger force and

    stylus length

    kinematic mechanism

    minimises hysteresis

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    Slide 12

    (actors in measurement performance

    Ranke" in terms of importance repeatability

    key requirement of any trigger probe

    fundamental limit on system measurement performance

    hysteresis contributes to measurement repeatability

    pre-travel variation

    can be calibrated, provided all probing directions are known

    measurement accuracy will be reduced if probe used in un-qualified

    direction and is high

    increases rapidly with stylus length

    hysteresis

    small error factor for probes with kinematic mechanisms

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    Slide 13

    Kinematic resistive probe technology

    Simple electro-mechanicals!itching

    resistive probes use the probe

    kinematics as an electrical trigger

    circuit

    pre-travel variation is significant dueto the arrangement of the kinematics

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    Slide 14

    Kinematic resistive probe characteristics

    *tremely robust Compact

    good part access

    suitable for long etensions

    1oo" repeatability

    ecellent performance with shorter styli

    low contact and overtravel forces minimise

    stylus bending and part deflection

    2niversal fitment

    simple interfacing

    Cost-effective

    (inite operating life

    electro-mechanical switching