QPHY-MIPI-M-PHY Instruction...

QPHY-MIPI-M-PHY M-PHY Serial Data Compliance Software

Instruction Manual Revision B – November, 2017 Relating to: XStreamDSO v.8.5.x.x and later QualiPHY Software v.8.5.x.x and later

700 Chestnut Ridge Road Chestnut Ridge, NY, 10977-6499 Tel: (845) 425-2000, Fax: (845) 578 5985 teledynelecroy.com © 2017 Teledyne LeCroy, Inc. All rights reserved. Customers are permitted to duplicate and distribute Teledyne LeCroy documentation for internal training purposes. Unauthorized duplication is strictly prohibited. Teledyne LeCroy and other product or brand names are trademarks or requested trademarks of their respective holders. Information in this publication supersedes all earlier versions. Specifications are subject to change without notice. 924855 Rev B November, 2017

QPHY MIPI M-PHY Operator’s Manual

924855 Rev B i

Table of Contents Introduction ............................................................................................................................... 1 About QualiPHY ............................................................................................................................................. 1 About QPHY MIPI M-PHY ............................................................................................................................. 1 Required Equipment ...................................................................................................................................... 2 Recommended Equipment ............................................................................................................................ 2 Remote Host Computer Requirements ......................................................................................................... 2

Installation and Setup ............................................................................................................... 3 Install Base Application .................................................................................................................................. 3 Activate Components ..................................................................................................................................... 3 Set Up Dual Monitor Display ......................................................................................................................... 3 Set Up Remote Control ................................................................................................................................. 4

Using QualiPHY ........................................................................................................................ 5 Accessing the Software ................................................................................................................................. 5 General Setup ................................................................................................................................................ 6 QualiPHY Test Process ................................................................................................................................. 7 Customizing QualiPHY ................................................................................................................................ 11 X-Replay Mode ............................................................................................................................................ 14

MIPI M-PHY Testing ................................................................................................................ 15 Test Preparation ........................................................................................................................................... 15 QPHY MIPI M-PHY Test Configurations ...................................................................................................... 17 QPHY-MIPI M-PHY Setup tab ..................................................................................................................... 18 QPHY-MIPI M-PHY Variables ...................................................................................................................... 21 QPHY-MIPI M-PHY Test Descriptions ......................................................................................................... 25

1.1.1 UI and f offset-TX ........................................................................................................................ 25 1.1.2 PSDCMTX (info) .......................................................................................................................... 26 1.1.3 THS-PREPARE ........................................................................................................................... 27 1.1.4 VCM-TX ....................................................................................................................................... 27 1.1.5 VDIF-DC-TX ................................................................................................................................ 28 1.1.6 G1.G2 TEYE-TX & VDIF-AC-TX ................................................................................................. 29 1.1.7 G3 TEYE-TX & VDIF-AC-TX ....................................................................................................... 30 1.1.9 TL2L-SKEW-HS-TX .................................................................................................................... 31 1.1.10 SRDIF-TX (max/min) ................................................................................................................. 31 1.1.11 Slew Rate State Monotonicity ................................................................................................... 32 1.1.12 delta SRDIF-TX ......................................................................................................................... 32 1.1.13 Tintra-skew-tx ............................................................................................................................ 32 1.1.14 TPULSE-TX ............................................................................................................................... 33 1.1.15 TJTX & 1.1.17 DJTX continuous ............................................................................................... 33 1.1.16 STTJTX & 1.1.18 STDJTX continuous ...................................................................................... 33 1.1.17 DJTX burst ................................................................................................................................ 34 1.1.18 STDJTX burst ............................................................................................................................ 34 1.2.1 TPWM-TX .................................................................................................................................... 35 1.2.2 kPWM-TX .................................................................................................................................... 36 1.2.3 TPWM-PREPARE ....................................................................................................................... 36 1.2.4 VCM-TX ....................................................................................................................................... 37 1.2.5. VDIF-DC-TX ............................................................................................................................... 37 1.2.6 TEYE-TX ..................................................................................................................................... 37 1.2.7 VDIF-AC-TX ................................................................................................................................ 37 1.2.8 TR-PWM-TX & TF-PWM-TX ....................................................................................................... 38 1.2.9 TL2L-SKEW-PWM-TX................................................................................................................. 38 1.2.10 TOLPWM-TX, TOLPWM-G1-LR-TX ......................................................................................... 39 1.2.11 TPWM-MINOR-G0-TX .............................................................................................................. 39 1.3.1 UISYS & fOFFSET-TX ................................................................................................................ 40 1.3.3 TSYS-PREPARE ......................................................................................................................... 40

ii

1.3.4 VCM-TX ....................................................................................................................................... 40 1.3.5 VDIF-DC-TX ................................................................................................................................ 40 1.3.6 TEYE-TX ..................................................................................................................................... 40 1.3.7 VDIF-AC-TX ................................................................................................................................ 41 1.3.8 TR-SYS & TF-SYS-TX ................................................................................................................ 41 1.3.9 TLRL-SKEW-SYS-TX .................................................................................................................. 41 1.3.2 UIREFCLK & fREFCLK-TX ......................................................................................................... 42

QPHY-MIPI M-PHY Limit Sets ..................................................................................................................... 42

Appendix A: Manual Deskewing Procedures........................................................................ 43 Cable Deskewing Using the Fast Edge Output ........................................................................................... 43 Cable Deskewing Without Using the Fast Edge Output .............................................................................. 46

Table of Figures Figure 1. QualiPHY framework dialog and Standard selection menu ........................................................... 5 Figure 2. The Test Report Cover, Summary Table and Details pages ........................................................ 10 Figure 3. X-Replay Mode window ................................................................................................................ 14 Figure 4. Physical configuration using adapters. ......................................................................................... 15 Figure 5. Physical configuration using probes. ............................................................................................ 16 Figure 6. QPHY MIPI M-PHY Setup tab ...................................................................................................... 18 Figure 7. Definition of fOFFSET-TX(t) ............................................................................................................... 25 Figure 8. PSDCM-TX spectrum generation ..................................................................................................... 26 Figure 9. Common-mode power spectral limit line ...................................................................................... 26 Figure 10. Example Generated HS-PREPARE Period ................................................................................ 27 Figure 11. PREPARE and STALL Periods of an HS Burst .......................................................................... 28 Figure 12. AC amplitude reference mask .................................................................................................... 29 Figure 13. HS-G3 AC Amplitude Reference Mask ...................................................................................... 30 Figure 14. Calculating Slew Rate State Resolution ..................................................................................... 32 Figure 15. Measuring Intra-lane Output Skew ............................................................................................. 32 Figure 16. Calculation of TJTX .................................................................................................................... 33 Figure 17. Definition of kPWM-TX ............................................................................................................... 36

About This Manual This manual assumes that you are familiar with using an oscilloscope−in particular the Teledyne LeCroy oscilloscope that will be used with QualiPHY−and that you have purchased the QPHY-MIPI-M-PHY software option. Some of the images in this manual may show QualiPHY products other than QPHY-MIPI-M-PHY or were captured using different model oscilloscopes, as they are meant to illustrate general concepts only. Rest assured that while the user interface may look different than yours, the functionality is identical.


924855 Rev B 1

Introduction About QualiPHY QualiPHY is highly automated compliance test software meant to help you develop and validate the PHY (physical-electrical) layer of a device, in accordance with the official documents published by the applicable standards organizations and special interest groups (SIGs). You can additionally set custom variables and limits to test compliance to internal standards. QualiPHY is composed of a “framework” application that enables the configuration and control of separate tests for each standard through a common user interface. Features include:

• Multiple Data Source Capability

• User-Defined Test Limits: Tighten limits to ensure devices are well within the passing region, even if subsequently measured with different equipment.

• Flexible Test Results Reporting that includes XML Test Record Generation. Understand a device performance distribution, or obtain process related information from the devices under test.

About QPHY MIPI M-PHY QPHY MIPI M-PHY is an automated test package performing all the Transmitter tests for M-PHY HS mode (Gears 1A, 1B, 2A, 2B, 3A and 3B), PWM mode (Gears 1-7), and SYS mode, in accordance with the M-PHY Conformance Test Suite (CTS), V3.0 r15. The software can be run on any Teledyne LeCroy oscilloscope with at least the required bandwidth for the signal under test:

HS Gear Oscilloscope Bandwidth Gear 1A/1B 6 GHz Gear 2A/2B 13 GHz Gear 3A/3B 20 GHz

2

Required Equipment • Teledyne LeCroy real-time oscilloscope, ≥ 6 GHz BW, installed with:

o XStreamDSO v.7.7.1.3a minimum* with an activated QPHY-MIPI-M-PHY option key o QualiPHY software v.7.7.x.x minimum with an activated QPHY-MIPI-M-PHY component o SDAIII (standard on SDA Zi and DDA Zi models) or SDAIII-LinQ (required for multi-lane

testing) o Eye Doctor II software option

*Note: The version of XStreamDSO and QualiPHY software must match, so upgrade your version of QualilPHY if you have upgraded your oscilloscope firmware. The versions listed above are the minimum versions required for this product. QualiPHY software may be installed on a remote PC, but all other software must be installed on the oscilloscope.

• Inputs: o 2 or 4 TF-MIPI-MPHY input adapters with high-quality phase-matched SMA-SMA coaxial

cables Or

o 2 or 4 Teledyne LeCroy D620-PS, Dxx30-PS, or Dxx05-PS probing systems

Recommended Equipment MIPI-M-PHY termination fixture available from UNH-IOL (not recommended for HS-G3 testing)

Remote Host Computer Requirements Usually, the oscilloscope is the host computer for the QualiPHY software, and all models that meet the acquisition requirements will also meet the host system requirements. However, if you wish to run the QualiPHY software from a remote computer, these minimum requirements apply:

• Operating System: o Windows 10 Professional o Windows 7 Professional

• 1 GHz or faster processor

• 1 GB (32-bit) or 2 GB (64-bit) of RAM

• Ethernet (LAN) network capability

• Hard Drive: o At least 200 MB free to install the framework application o Up to 2GB per standard installed to store the log database (each database grows from a few

MB to a maximum of 2 GB) See Set Up Remote Control for configuration instructions.


924855 Rev B 3

Installation and Setup QualiPHY is a Windows-based application that can be configured with one or more serial data compliance components. Each compliance component is purchased as a software option.

Install Base Application Download and install the latest version of the X-Stream software, available from: teledynelecroy.com/support/softwaredownload > Oscilloscope Downloads > Firmware Upgrades Download the latest version of the QualiPHY software, available from: teledynelecroy.com/support/softwaredownload > Oscilloscope Downloads > Software Utilities If the oscilloscope is not connected to the Internet, copy the installers onto a USB memory stick then transfer it to the oscilloscope desktop or a folder on a D:\ drive to execute it. When installing, choose all the components you plan to activate. If you omit any components now, you will need to update the installation to activate them later. By default, the oscilloscope appears as local host when QualiPHY is executed on the oscilloscope. Follow the steps under Add Connection to QualiPHY to check that the IP address is 127.0.0.1.

Activate Components The serial data compliance components are factory installed as part of the main application in your oscilloscope and are individually activated through the use of an alphanumeric code uniquely matched to the oscilloscope’s serial number. This option key code is what is delivered when purchasing a software option. To activate a component on the oscilloscope:

1. From the menu bar, choose Utilities > Utilities Setup. 2. On the Options tab, click Add Key. 3. Use the Virtual Keyboard to Enter Option Key, then click OK.

If activation is successful, the key code now appears in the list of Installed Option Keys. 4. Restart the oscilloscope application by choosing File > Exit, then double-clicking the Start DSO

icon on the desktop.

Set Up Dual Monitor Display Teledyne LeCroy recommends running QualiPHY on an oscilloscope equipped with Dual Monitor Display capability. This allows the waveform and measurements to be shown on the oscilloscope LCD display while the QualiPHY application and test results are displayed on a second monitor. See the oscilloscope Operator’s Manual or Getting Started Manual for instructions on setting up dual monitor display.

4

Set Up Remote Control QualiPHY software can be executed from a remote host computer, controlling the oscilloscope through a LAN Connection. To set up remote control:

• The oscilloscope must be connected to a LAN and assigned an IP address (fixed or dynamic).

• The host computer must be on the same subnet as the oscilloscope.

Configure Oscilloscope for Remote Control 1. From the menu bar, choose Utilities Utilities Setup... 2. Open the Remote tab and set Remote Control to TCP/IP.

3. Verify that the oscilloscope shows an IP address.

Add Connection to QualiPHY 1. On the host PC, download and run QualiPHYInstaller.exe. 2. Start QualiPHY and click the General Setup button. 3. On the Connection tab, click Scope Selector. 4. Click Add and choose the connection type. Enter the oscilloscope IP address from Step 3

above. Click OK.

5. When the oscilloscope is properly detected, it appears on the Scope Selector dialog. Select the connection, and click OK.

QualiPHY is now ready to control the oscilloscope.

Select Connection Multiple oscilloscopes may be accessible to a single remote host. In that case, go to General Setup and use the Scope Selector at the start of the QPHY session to choose the correct connection. QualiPHY tests the oscilloscope connection when starting a test. The system warns you if there is a connection problem.


924855 Rev B 5

Using QualiPHY This section provides an overview of the QualiPHY user interface and general procedures. For detailed information about the QPHY MIPI M-PHY software option, see MIPI M-PHY Testing.

Accessing the Software Once QualiPHY is installed and activated, it can be accessed from the oscilloscope menu bar by choosing Analysis > QualiPHY, or by double-clicking the QualiPHY desktop icon on a remote computer. The QualiPHY framework dialog illustrates the overall software flow, from general set up through running individual compliance tests. Work from left to right, making all desired settings on each sub-dialog.

Figure 1. QualiPHY framework dialog and Standard selection menu

The sub-dialogs are organized into tabs each containing configuration controls related to that part of the process. These are described in more detail in the following sections. If Pause on Failure is checked, QualiPHY prompts to retry a measure whenever a test fails. Report Generator launches the manual report generator dialog. The Exit button at the bottom of the framework dialog closes the QualiPHY application.

6

General Setup The first sub-dialog contains general system settings. These remain in effect for each session, regardless of Standard, until changed.

Connection tab Shows IP Address of the test oscilloscope (local host 127.0.0.1 if QualiPHY is run from the oscilloscope). The Scope Selector allows you to choose the oscilloscope used for testing when several are connected to the QualiPHY installation. See Set Up Remote Control for details.

Session Info tab Optional information about the test session that may be added to reports, such as: Operator Name, Device Under Test (DUT), Temperature (in °C) of the test location, and any additional Comments. There is also an option to Append Results or Replace Results when continuing a previous session.

To optimize report generation, enter at least a DUT name at the beginning of each session. Do not use embedded spaces; use underscores, if necessary. Note: The software autogenerates the report file “<Output file name>_<DUT Name>”, or “LeCroyReport_DUT” if you leave the defaults. This report is overwritten each session unless you specify a) a new DUT on the Session Info tab, b) a new output file name on the Report tab, or c) a new output file name in the Report Generator.

Report tab Settings related to report generation. Choose:

• Reporting behavior of: o “Ask to generate a report after tests,” where you’ll be prompted to create a new file for

each set of test results. o “Never generate a report after tests,” where you’ll need to manually execute the Report

Generator to create a report. o “Always generate a report after tests,” to autogenerate a report of the latest test results.

• Default report output type of XML, HTML, or PDF. Enter an Output file name, including the full path if you wish to change the output directory. The value in DUT will be appended to this file name. Optionally, check Allow style sheet selection in Report Generator to enable the use of a custom .xslt when generating reports (XML and HTML output only). The path to the .xslt is entered on the Report Generator dialog. Report Generator launches the Report Generator dialog, which allows you to manually generate a report using the last test session results.

Advanced tab This tab launches the X-Replay Mode dialog. See X-Replay Mode.

About tab Information about your QualiPHY installation.


924855 Rev B 7

QualiPHY Test Process Once general system settings are in place, these are the steps for running test sessions.

Set Up Test Session 1. Connect the oscilloscope to the DUT. See QPHY MIPI M-PHY Testing Physical Setup. 2. Access the QualiPHY software to display the framework dialog.

3. If running QualiPHY remotely, click General Setup and open the Scope Selector to select the correct oscilloscope connection.

4. If you have more than one component activated, click Standard and select the desired standard to test against. Otherwise, your one activated component will appear as the default selection. Note: Although all the QualiPHY components appear on this dialog, only those selected when installing QualiPHY are enabled for selection.

5. Click the Configuration button and select the test configuration to run. These pre-loaded configurations are set up to run all the tests required for compliance and provide a quick, easy way to begin compliance testing. See QPHY-MIPI M-PHY Test Configurations for a description of your configurations. You can also create custom configurations for internal compliance tests by copying and modifying the pre-loaded configurations. See Customizing QualiPHY for details.

6. Close the Edit/View Configuration dialog to return to the framework dialog.

8

Run Tests 1. On the framework dialog, click Start to begin testing.

When tests are in progress, this button changes to Stop. Click it at any time to stop the test in process. You’ll be able to resume from the point of termination or from the beginning of the test.

2. Follow the pop-up window prompts. QualiPHY guides you step-by-step through each of the tests described in the standard specification, including diagrams of the connection to the DUT for each required test mode.

3. When all tests are successfully completed, both progress bars on the framework dialog are completely green and the message “All tests completed successfully” appears. If problems are encountered, you’ll be offered options to:

• Retry the test from the latest established point defined in the script

• Ignore and Continue with the next test

• Abort Session


924855 Rev B 9

Tip: Clear the Pause on Failure checkbox to disable this feature. All tests will run regardless of results. The outcome will appear on the final report.

Generate Reports The QualiPHY software automates report generation. On the framework dialog, go to General Setup > Report to pre-configure reporting behavior. You can also manually launch the Report Generator from the framework dialog once a test is run. The Report Generator offers the same selections as the Report tab, only applied manually, rather than as a system setting. This enables you to save reports for each test session, rather than overwrite the autogenerated report file. There are also options to link a custom style sheet (.xslt) to the report, or to Exclude Informative Results.

10

The Test Report includes a summary table with links to the detailed test result pages.

Figure 2. The Test Report Cover, Summary Table and Details pages

Reports are output to the folder D:\QPHY\Reports, or C:\LeCroy\QPHY\Reports if QualiPHY is installed on a remote PC. You can add your own logo to the report by replacing the file *\QPHY\StyleSheets\CustomerLogo.jpg. The recommended maximum size is 250x100 pixels at 72 ppi, 16.7 million colors, 24 bits. Use the same file name and format.


924855 Rev B 11

Customizing QualiPHY Create custom test configurations by copying one of the standard configurations and modifying it. The pre-loaded configurations cannot be modified.

Copy Configuration 1. Access the QualiPHY framework dialog and select a Standard. 2. Click Edit/View Configuration and select the configuration upon which to base the new

configuration. This can be a pre-loaded configuration or another copy. 3. Click Copy and enter a name and description. Once a custom configuration is defined, it

appears on the Configuration tab with the defined name.

4. Select the new, custom configuration and follow the procedures below to continue making

changes. Note: If any part of a configuration is changed, the Save As button becomes active on the bottom of the dialog. If a custom configuration is changed, the Save button will also become active to apply the changes to the existing configuration, rather than create a new one

Select Tests On the Test Selector tab, check the tests that make up the configuration. Each test is defined by the MIPI M-PHY CTS. A description of each test is displayed when it is selected. To loop an individual test or group of tests, select it from the list, then choose to loop indefinitely until stopped or enter the number of repetitions. When defining a number of repetitions, enter the number of repetitions before enabling the checkbox.

12

Edit Variables The Variable Setup tab contains a list of test variables. See QPHY MIPI M-PHY Variables for a description of each. To modify a variable:

1. Select the variable on the Variable Setup tab, then click Edit Variable. (You can also choose to Reset to Default at any time.)

2. The conditions of this variable appear on a pop-up. Choose the new condition to apply.


924855 Rev B 13

Edit Test Limits The Limits tab shows the Limit Set currently associated with the configuration. Any limit set can be associated with a custom configuration by selecting it in this field. The Limits Manager shows the settings for every test limit in a limit set. Those in the default set are the limits defined by the standard. To create a custom limit set:

1. On the Limits tab, click Limits Manager. 2. With the default set selected, click Copy Set and enter a name.

Note: You can also choose to copy and/or modify another custom set that has been associated with this configuration.

3. Double click the limit to be modified, and in the pop-up enter the new values.

You can also Import Limits from a .csv file. Navigate to the file location after clicking the button. Tip: Likewise, Export Limits creates a .csv file from the current limit set. You may wish to do this and copy it to format the input .csv file.

14

X-Replay Mode The X-Replay mode window is an advanced (“developer”) view of QualiPHY. The tree in the upper-left frame enables you to navigate to processes in the MIPI M-PHY test script, in case you need to review the code, which appears in the upper-right frame. Two other particularly useful features are:

• A list of recent test sessions in the lower-left frame. While you can only generate a report of the current test session in the QualiPHY wizard, in X-Replay Mode you can generate a report for any of these recent sessions. Select the session and choose Report > Create Report from the menu bar.

• The QualiPHY log in the bottom-right frame. The frame can be split by dragging up the lower edge. The bottom half of this split frame now shows the raw Python output.

Figure 3. X-Replay Mode window


924855 Rev B 15

MIPI M-PHY Testing Test Preparation Before beginning any test or data acquisition, the oscilloscope should be warmed for at least 20 minutes. Teledyne LeCroy oscilloscopes automatically perform a brief self-calibration routine as needed to maintain accuracy. No user intervention is required. This procedure will be run again if the temperature of the oscilloscope changes by more than a few degrees.

Required Test Modes The script will prompt you to output the required signal from the DUT for each test. It is recommended that you first make sure the DUT is capable of being placed in the required test modes before initializing the test.

Physical Setup M-PHY requires receivers to present a 100Ω differential load, but to be effectively open-circuit in a common-mode sense. This is to eliminate loading of the transmitter, which will have some DC common-mode bias. This common-mode loading must also be avoided during Transmitter tests. QPHY-MIPI-MPHY supports two ways of connecting an M-PHY DUT to the oscilloscope.

Direct connection with adapters The most straightforward and highest-fidelity method uses the Teledyne LeCroy MIPI M-PHY Input Adapter (TF-MIPI-MPHY). By default, these are set by the script to a nominal offset of 190mV. This can be adjusted in the variable setup, as described later. The physical connection setup using adapters is identical for all tests performed by QPHY-MIPI-MPHY, and is shown below for a single lane under test:

Figure 4. Physical configuration using adapters.

16

A configuration for a two-lane test would use two additional M-PHY input adapters on C3 and C4. QualiPHY-MIPI-MPHY will automatically detect if the adapters are being used, and will show the appropriate prompts.

Probed connection For testing using legacy M-PHY termination fixtures, or using QPHY-MIPI-PHY to test an integrated system, differential probes may be preferred. This is also possible. Note: Legacy termination fixtures designed for testing HS-Gears 1 and 2 are very unlikely to provide the required signal integrity for HS-Gear 3 testing, leading to incorrect results and potentially to “false failures”. For HS-Gear 3, we strongly recommend the use of the M-PHY input adapter. The physical connection setup using probes is identical for all tests performed by QPHY-MIPI-MPHY, and is shown below for a single lane under test:

Figure 5. Physical configuration using probes.

A configuration for a two-lane test would use two additional probes on Channels 3 and 4. If the script does not detect the presence of the TF-MIPI-MPHY adapters, it will default to showing the probed setup diagrams.


924855 Rev B 17

QPHY MIPI M-PHY Test Configurations Test configurations include variable settings, limit sets, and test selections. See QPHY MIPI M-PHY Variables for a description of each variable and its default value. It is important to note that, unlike some other standards, MIPI M-PHY does not prescribe an exact set of functions which need to be tested. Individual devices may implement some or all operating modes (HS, PWM and SYS), some or all GEARs of each supported operating mode, and some or all optional features (such as slew rate control). As such, it is not feasible to provide an exhaustive set of preset configurations to cover all possible DUT types. It is almost certain, due to the nature of M-PHY, that you as an end-user will need to create a Test Configuration that is suitable for testing your particular device.

Test HS Live This configuration runs all the transmitter-side HS, PWM, and SYS tests required by the MIPI standard. Variables are set up to test 1 lane, using C1 and C2 By default, HS GEAR 1A and HS GEAR 3B are tested. If you want to test other speeds, be sure to configure the “Setup” dialog appropriately before testing.

Demo HS This configuration demonstrates the Test HS Live configuration tests using demo waveforms stored at D:\Waveforms\MPHY\DEMO. Run this before “Test HS Live” for an overview of the test process.

18

QPHY-MIPI M-PHY Setup tab QualiPHY-MIPI M-PHY includes a “Setup” tab, making it easy to create a test configuration specific to your device’s requirements:

Figure 6. QPHY MIPI M-PHY Setup tab

General Setup Section Test 2 Lanes Simultaneously If this box is checked, QualiPHY will test two lanes simultaneously – otherwise, it will only test a single lane, and the Lane#, Dp and Dn settings for the second lane will not be visible. When only testing a single lane, some parameters such as lane-to-lane skew cannot be tested and are skipped.

Lane# This setting only has an effect on the output report, and allows the user to assign any integer number to any lane being tested. Since an oscilloscope can only test two lanes of M-PHY at a given time, this setting allows devices with more than two lanes to be tested, with suitable lane enumeration in the resulting report.

Dp, Dn source selection for each lane Specify the source oscilloscope channels for the positive and negative Data signals for the corresponding lane.


924855 Rev B 19

Fixture Type RT = Resistively Terminated; NT = Not Terminated. All HS tests are done using only RT (as per the CTS). The Teledyne LeCroy TF-MIPI-MPHY input adapters constitute a resistively terminated fixture.

HS Setup Section Test HS Mode If this box is checked, QualiPHY will perform all HS tests appropriate to the GEAR(s) selected. Individual tests may be excluded by using the test selector tab.

HS-GEAR selections Select the GEARs for the script to test. When running, QualiPHY will prompt the user for the required waveforms.

TX_HS_PREPARE length Specify the HS_PREPARE length, in symbol intervals, as programmed into the DUT; valid values are 1 to 15. The measured HS_PREPARE length will be compared to this value in test 1.1.3.


DUT Supports Slew Rate Control If this option is selected, then test 1.1.10, SR DIF-RX(max/min), test 1.1.11, Slew Rate State Monotonicity, and test 1.1.12, delta SRDIF-TX, are performed – see the Test Methodology for test 1.1.10 on page 31 for more details. If this option is not selected, then these tests are not relevant – test 1.1.10 may be performed for informative purposes only, tests 1.1.11 and 1.1.12 are skipped. Deselecting this option removes the “Number of Slew Rate settings” input field from the dialog.

Test Channel type for HSG3B eye If this option is set to Software, the script will use .s2p or .s4p files installed with the QualiPHY software in order to implement the reference test channel for HS-GEAR3 eye diagrams. This is the default value and is probably the most convenient and appropriate in almost all cases. If TestChannel is set to Physical (or if the scope does not have the EyeDr2 option) then you will be prompted to connect a physical reference channel board for CH1 and CH2. See the Test Description for test 1.1.7 on page 30 for more details on the Test Channel setup.

Amplitude Specifies the DUT’s supported signal amplitude levels. Available options are “Small_Amplitude_only”, “Large_Amplitude_only”, and “Large_and_Small_Amplitude”. Corresponds to the TX_Amplitude_Capability M-TX Capability Attribute (see Table 49 of the M-PHY 3.1 specification)

20

PWM Setup Section Test PWM Mode If this box is checked, QualiPHY will perform all PWM tests appropriate to the GEAR(s) selected. Individual tests may be excluded by using the test selector tab.

PWM-GEAR selections Select the GEARs which are to be tested by the script. When running, QualiPHY will prompt the user for the required waveforms.

DUT Supports Terminated PWM Select this option if the DUT supports terminated PWM. Corresponds to TX_LS_Terminated_LINE_Drive_Capability in M-TX Capability Attributes (Table 40 in M-PHY 3.1 specification).

SYS Setup Section Test SYS Mode If this box is checked, QualiPHY will perform SYS tests. Individual tests may be excluded by using the test selector tab.

SYS Bit Rates The bit rate (in MHz) at which SYS mode tests should be performed. Understood to be the ideal DigRF Reference Frequency (26.0, 38.4 or 52.0 MHz or a fractional rate thereof).

DUT Supports Terminated SYS Select this option if the DUT supports terminated SYS. Corresponds to TX_LS_Terminated_LINE_Drive_Capability in M-TX Capability Attributes (Table 40 in M-PHY 3.1 specification).

DUT is DigRFv4 BBIC If selected, then test 1.3.2 (UIREFCLK and fREFCLOCK-TX) is performed.


924855 Rev B 21

QPHY-MIPI M-PHY Variables The variables which determine the test execution of QualiPHY-MIPI-MPHY are almost all set within the Setup dialog, with the exception of a few variables which should rarely require modification by the end-user. A full list with descriptions is given here for completeness, but the Setup dialog is generally the more appropriate place to configure testing.

General Variables DemoMode Set this to "Yes" to run tests in demonstration mode, using saved waveforms. This setting only affects the Demo configurations. The default set of demonstration waveforms is not included with the QualiPHY installer, as it consists of a number of large waveform files.

DemoModeWfmPath If DemoMode is set to Yes, the script will attempt to recall demo waveforms from this path. Default is D:\Waveforms\MPHY\Demo.

Dn of first lane Specify the source of negative Data. This is for the first lane tested (or only lane, if Test2LanesSimultaneously is set to “No”).

Dn of second lane Specify the source of positive Data for the second lane tested. This is used only if Test2LanesSimultaneously is set to "Yes".

Dp of first lane Specify the source of positive Data. This is for the first lane tested (or only lane, if Test2LanesSimultaneously is set to “No”).

Dp of second lane Specify the source of positive Data for the second lane tested. This is used only if Test2LanesSimultaneously is set to "Yes".

DUT_AmplitudeCapability Specifies the DUT’s supported signal amplitude levels. Available options are “Small_Amplitude_only”, “Large_Amplitude_only”, and “Large_and_Small_Amplitude”. Corresponds to the TX_Amplitude_Capability M-TX Capability Attribute (see Table 49 of the M-PHY 3.1 specification)

DUT Supports HS If "Yes", then HS tests are performed. Corresponds to TX_HSMODE_Capability in M-TX Capability Attributes (Table 40 in M-PHY 3.1 specification).

DUT Supports PWM If "Yes", then PWM tests are performed.

DUT Supports SYS Signaling If "Yes", then tests 1.3.1 through 1.3.9 are performed.

22


InputTerminatorOffset If a MIPI M-PHY Terminator is attached to any input channel in use, the script will set its Offset to this value. Set this variable to the expected Vcm value. When correctly set to Vcm, no common mode current is drawn from the transmitter. Default value is 190 mV.

Lane# of first lane Lane# of the first (possibly only) lane being tested - this can be set to any integer. Since an oscilloscope can only test two lanes of M-PHY at a given time, this variable allows devices with more than two lanes to be tested, with suitable lane enumeration in the resulting report.

Lane# of second lane Lane# of the second lane being tested. Used only if Test2LanesSimultaneously is set to "Yes".

SavedWfmPath Path on the oscilloscope where the script will store waveform files. Default value is D:\Waveforms\MPHY. The DUT name entered at session start is appended to form: D:\Waveforms\MPHY\<DUT>. Note: This script does not archive waveform results; it clears the directory at this path when it starts. The generated report is the saved result. If you want to keep the waveforms, you must move them from this location to a different directory after the test completes. StopAfterEveryTest When set to Yes, the script will stop after each test to allow you to review results.

Test 2 Lanes Simultaneously This script assumes two input adapters or probes are in use for each lane, one for DP and one for DN. If this variable is set to "No", then only one lane is tested. On a four channel scope it is possible to test two lines simultaneously, using four probes; that is done if this variable is set to "Yes".


924855 Rev B 23

Specific to Section 1 – TX Tests DUT Supports Slew Rate Control If this variable is set to "Yes", then test 1.1.10, SR DIF-RX(max/min), test 1.1.11, Slew Rate State Monotonicity, and test 1.1.12, delta SRDIF-TX, are performed – see the Test Methodology for test 1.1.10 on page 31 for more details. If this variable is set to “No”, then these tests are not relevant – test 1.1.10 may be performed for informative purposes only, tests 1.1.11 and 1.1.12 are skipped.

MaxSlewRateSetting Number of slew rates that the DUT is capable of.

Specific to Group 1 HS – Tests Test at HS-G1A Set to "Yes" to perform HS tests at HS-G1A.

Test at HS-G1B Set to "Yes" to perform HS tests at HS-G1B.

Test at HS-G2A Set to "Yes" to perform HS tests at HS-G2A.


Test at HS-G3A Set to "Yes" to perform HS tests at HS-G3A.


Test 1.1.3 TX_HS_PREPARE_LENGTH_config_attribute Specify the HS_PREPARE length, in symbol intervals, as programmed into the DUT. The measured HS_PREPARE length will be compared to this value in test 1.1.3. Acceptable values are 1 to 15.

Test 1.1.7 TestChannel If TestChannel is set to Software, the script will use .s2p or .s4p files installed with the QualiPHY software in order to implement the reference test channel for HS-GEAR3 eye diagrams. If TestChannel is set to Physical (or if the scope does not have either SDA2 or SDA3 and in addition EyeDr2 options) then you will be prompted to connect a real, physical reference channel board for CH1 and CH2. See the Test Description for test 1.1.7 on page 30 for more details on the Test Channel setup.

24

Specific to Group 2 – PWM Tests DUT Supports Terminated PWM Set to “Yes” if DUT supports terminated PWM, otherwise set to “No”. Corresponds to TX_LS_Terminated_LINE_Drive_Capability in M-TX Capability Attributes (Table 40 in M-PHY 3.1 specification).

Test at PWM-G0 Set to "Yes" to perform PWM tests at PWM-G0 (0.1 to 3MHz, optional for Type I modules).

Test at PWM-G1 Set to "Yes" to perform PWM tests at PWM-G1 (3 - 9Mbps, mandatory default startup state).

Test at PWM-G2 Set to "Yes" to perform PWM tests at PWM-G2.






Specific to Group 3– SYS Tests DUT is DigRFv4 BBIC If "Yes" then test 1.3.2, UIREFCLK and fREFCLOCK-TX, is performed.

DUT Supports Terminated SYS Set to “Yes” if DUT supports terminated SYS, else set to No. Corresponds to TX_LS_Terminated_LINE_Drive_Capability in M-TX Capability Attributes (Table 40 in M-PHY 3.1 specification).

SYS_bitrates_MHz A comma-separated list of the bit rates (in MHz) at which SYS mode tests should be performed. Understood to be the ideal DigRF Reference Frequency (26.0, 38.4 or 52.0 MHz or a fractional rate thereof).


924855 Rev B 25

QPHY-MIPI M-PHY Test Descriptions These are the standard MIPI M-PHY compliance tests. Each name is preceded by a test number, in the form 1.x.x – this test number corresponds with the test number used in the MIPI M-PHY Conformance Test Suite v3.0r15 (hereafter referred to as “the CTS”).

Group 1 – HS Tests

1.1.1 UI and f offset-TX This test verifies that the Unit Interval (UIHS) and Frequency Offset (fOFFSET-TX) of the DUT’s HS-TX are within the conformance limits. This test is performed on both continuous-mode and burst-mode CRPAT signals.

What Is Measured The timings of the zero crossings of the signals acquired by the oscilloscope are used to calculate a set of Unit Intervals, UI(t). The parameter fOFFSET-TX(t) is calculated by relating the inverse of the UI(t) values to the nominal data rate for the GEAR under test, as defined in Figure 7 and Table 1.

fOFFSET-TX(t) = (1/UI(t) - DRHS) / (DRHS / 1E6)

Figure 7. Definition of fOFFSET-TX(t)

Table 1. Summary of HS-TX RATE Series and GEARs

The max and min values for fOFFSET-TX(t) in any single observed burst must be between +2000ppm and -2000ppm of the nominal GEAR/RATE value in order to be considered conformant. The quantity UIHS is also measured in this test, as it is used in several subsequent tests. The UIHS value for a given burst or continuous capture is calculated as the inverse of the mean fOFFSET-TX value for that burst/capture.

26

1.1.2 PSDCMTX (info) This test verifies that the Common-Mode AC Power Spectral Magnitude (PSDCM-TX) of the DUT’s HS-TX is below the conformance limit, for Large and Small Amplitudes, in Terminated mode, for all Lanes, for HS-G1. It requires that the DUT output be CRPAT, burst mode. This is an informative (non-normative) test, and is defined for HS-GEAR 1 only, as per the MPHY CTS V3.0 r15.

What Is Measured The PSDCM-TX measures the common-mode power spectral density of the transmitter. The spectrum is generated according to Figure 8:

Figure 8. PSDCM-TX spectrum generation

The resulting spectrum must fall below the limit mask shown in Figure 9:

Figure 9. Common-mode power spectral limit line

The value reported for this test is the minimum margin between measured spectrum and limit line.


924855 Rev B 27

1.1.3 THS-PREPARE This test verifies that the length of the DUT’s transmitted HS PREPARE period is consistent with the value indicated by its TX_HS_PREPARE_LENGTH configuration attribute. It requires that the DUT output be CRPAT, and will also prompt the user to enter the DUT’s nominal TX_HS_PREPARE value to test against.

What Is Measured The THS_PREPARE value is measured as the time between the two zero crossings which define the PREPARE period. This measured value will be divided by [10 * (measured UIHS)], rounded to the nearest integer, and compared with the DUT’s nominal TX_HS_PREPARE value as entered by the user.

Figure 10. Example Generated HS-PREPARE Period

1.1.4 VCM-TX This test verifies that the Common-Mode DC Output Voltage Amplitude (VCM-TX) of the DUT’s HS-TX is within the conformance limits. It requires that the DUT output be CRPAT, burst mode.

What Is Measured

VCM-TX is defined as , where VTXDP and VTXDN are understood to represent the steady-state DC voltages of DP and DN, respectively. Two separate conformance ranges are defined, for the small-amplitude and large-amplitude cases. The respective conformance limits are shown in Table 2.

Parameter

Amplitude

Conformance Min

Conformance Max

VCM-LA-TX Large 160mV 260mV

VCM-SA-TX Small 80mV 190mV

Table 2. VCM-xA-TX Conformance limits

28

1.1.5 VDIF-DC-TX This test verifies that the Differential DC Output Voltage Amplitude (VDIF-DC-TX) of the DUT’s HS-TX is within the conformance limits. It requires that the DUT output be CRPAT, burst mode.

What Is Measured

VDIF-DC-TX is defined as , where VTXDP and VTXDN are understood to represent the steady-state DC voltages of DP and DN, respectively. Separate conformance ranges are defined, for the small-amplitude and large-amplitude cases:

Parameter

Amplitude

Conformance Min

Conformance Max

VDIF-DC-LA-RT-TX Large 160mV 240mV

VDIF-DC-SA-RT-TX Small 100mV 130mV

Table 3. DC Differential Amplitude Requirements

VDIF-DC-TX is measured on the extended-length DIF-P and DIF-N states that are transmitted during the PREPARE and STALL states of an HS burst:

Figure 11. PREPARE and STALL Periods of an HS Burst

It is worth noting that the PREPARE and STALL states in Figure 11 show step changes in amplitude as the receiver switches termination, this will not occur when connected to a resistively-terminated fixture for conformance testing.


924855 Rev B 29

1.1.6 G1.G2 TEYE-TX & VDIF-AC-TX This test verifies that the DUT’s HS-TX meets the requirements for Transmitter Eye Opening (TEYE-TX), and Maximum and Minimum Differential AC Output Voltage Amplitude (VDIF-AC-TX). It requires that the DUT output be CRPAT, burst mode.

What Is Measured This test constructs uses an acquired record of 3E6 UI, and constructs an eye diagram by recovering a clock using a second-order PLL (specified in the CTS). The acquired eye is compared to the mask shown in Figure 12.

Figure 12. AC amplitude reference mask

This serves the dual purpose of performing an eye mask test, and testing the differential AC voltage VDIF-AC-TX against its upper and lower limits as shown in Table 4.

Parameter

Amplitude

Conformance Min

Conformance Max

VDIF-AC-LA-RT-TX Large 140mV 250mV

VDIF-AC-SA-RT-TX Small 80mV 140mV

Table 4. G1.G2 VDIF-AC-TX Limits

30

1.1.7 G3 TEYE-TX & VDIF-AC-TX This test verifies that the DUT’s HS-TX meets the requirements for Transmitter Eye Opening (TEYE-HS-G3-

TX), and Maximum and Minimum Differential AC Output Voltage Amplitude (VDIF-AC-HS-G3-TX, VDIF-AC-TX). It requires that the DUT output be CRPAT, burst mode.

What Is Measured This test uses an acquired record of 25,000 UI, and constructs an eye diagram by recovering a clock using a second-order PLL (specified in the CTS). In the case of the GEAR 3 eye, the eye is constructed after the signal has passed through a reference channel (also specified in the CTS). QualiPHY-MIPI-MPHY includes s-parameter models of the reference channel, which are automatically applied to the signal as required. If you prefer to use a physical reference channel instead, then in the Setup tab, set the “Test Channel” to “Physical”. (The default value is “Software”, referring to software channel emulation using the supplied s-parameter files.) The acquired eye is compared to the mask shown in Figure 13.

Figure 13. HS-G3 AC Amplitude Reference Mask

This serves the dual purpose of performing an eye mask test, and testing the differential AC voltage VDIF-AC-TX against its upper and lower limits as shown in Table 5.

Parameter Amplitude Conf. Min Conf. Max

VDIF-AC-HS-G3-TX Large + Small 40mV N/A

VDIF-AC-LA-TX Large N/A 250mV

VDIF-AC-SA-TX Small N/A 140mV

TEYE-HS-G3-TX Large + Small 0.55UI N/A

Table 5. GEAR 3 VDIF-AC-TX Limits


924855 Rev B 31

1.1.9 TL2L-SKEW-HS-TX This test verifies that the Skew between any two DUT HS-TX LANEs (TL2L-SKEW-HS-TX) is less than the maximum allowed conformance limit. It requires that the DUT output be CRPAT, burst mode. Note it is only possible to perform this test if two lanes are being tested simultaneously. If only one lane is being tested, QualiPHY-MIPI-MPHY will not perform this test, and test 1.1.9 will not appear in the resulting report. QualiPHY reports this test as informative only, as the skew limits are set by the specific MIPI protocol layer sitting on top of the MPHY implementation.

What Is Measured This test measures the timing difference between the zero crossings of the first MARKER0 symbol on two lanes. The maximum allowable skew values for various protocol specifications are shown in Table 6.

Specification SYS PWM HS-G1 HS-G2 HS-G3

DigRFv4[2] See Note* N/A See Note* See Note* N/A

LLI[3] N/A N/A 2 UI 2 UI 2 UI

UniPro[4] N/A 10 TPWM-TX 10 UIHS 10 UIHS 10 UIHS

SSIC[8] N/A N/A 1300ps 1300ps 1300ps * The DigRFv4 spec [2] requires DUTs to define mandatory product-specific TX skew limits (e.g., in the device datasheet), which will be used as the conformance limits for this test.

Table 6. Protocol-Specific TX Lane-to-Lane Skew Requirement

1.1.10 SRDIF-TX (max/min) This test verifies that the Slew Rate (SRDIF-TX) of the DUT’s HS-TX can be suitably adjusted across the minimum required range of values. It requires that the DUT output be CRPAT, burst mode. This test is only required at HS-GEAR1, and only if the DUT supports slew rate control. If your DUT does support slew rate control, do not select the DUT supports slew rate control” in the setup tab. If the DUT does not support slew rate control, QualiPHY will still perform the measurement on the DUT’s slew rate, and report the result as informative rather than normative. What Is Measured This test verifies that the DUT can produce signals with 20%-80% slew rates across the range specified in the CTS:

Parameter

Amplitude

Conformance Min

Conformance Max

SRDIF-SA-RT-TX[MAX] Small 0.90 V/ns n/a

SRDIF-SA-RT-TX[MIN] Small n/a 0.35 V/ns

SRDIF-LA-RT-TX[MAX] Large 1.665 V/ns n/a

SRDIF-LA-RT-TX[MIN] Large n/a 0.6475 V/ns

Table 7. Slew rate range control requirements

32

1.1.11 Slew Rate State Monotonicity This test verifies that the Slew Rate control states of the DUT’s HS-TX support monotonically decreasing Slew Rate settings. This test is also only performed if the “DUT supports slew rate control” is set to “Yes” – see the test description for test 1.1.10 SRDIF-TX (max/min) on page 31 for details on how to configure this.

What Is Measured This test verifies that the set of slew rates for each DUT slew rate setting are monotonically decreasing, with the fastest slew rate being for setting 1, and the slowest being for setting N. It uses the waveforms acquired for test 1.1.10 SRDIF-TX (max/min) – see page 31 for more details.

1.1.12 delta SRDIF-TX This test verifies that the Slew Rate State Resolution (ΔSRDIF-TX) of the DUT’s HS-TX Slew Rate Control satisfies the conformance requirements. This test is also only performed if the “DUT supports slew rate control” is set to “Yes” – see the test description for test 1.1.10 SRDIF-TX (max/min) on page 31 for configuration details.

What Is Measured For each slew rate state supported by the DUT, this test calculates the difference between its slew rate, SRDIF-TX[i], and that of the next slower slew rate state, SRDIF-TX[i+1], using the formula:

Figure 14. Calculating Slew Rate State Resolution

In order to conform, this difference must be between 1% and 30%.

1.1.13 Tintra-skew-tx This test verifies that the Intra-Lane Output Skew (TINTRA-SKEW-TX) of the DUT’s HS-TX is within the conformance limits.

What Is Measured This test measures the skew between corresponding edges of DP and DN – excessive skew within the differential pair creates undesirable common-mode ripple. The skew is measured at the points where DP and DN intersect the mean common-mode voltage, VCM-TX, as shown in Figure 15.

Figure 15. Measuring Intra-lane Output Skew

The value of TINTRA-SKEW-TX must be between -0.06*UIHS and 0.06*UIHS to be considered conformant.


924855 Rev B 33

1.1.14 TPULSE-TX This test verifies that the Pulse Width (TPULSE-TX) of the DUT’s HS-TX is within the conformance limits.

What Is Measured The transmitter pulse width TPULSE-TX is the difference in time between the zero-crossings of the differential output signal VTX-DIF for a single bit. The test is performed over at least one CRPAT burst. All single bits must have a pulse width of greater than 0.9*UIHS to conform.

1.1.15 TJTX & 1.1.17 DJTX continuous This test verifies that the Total Jitter (TJTX) and the continuous-mode Deterministic Jitter (DJTX) of the DUT’s HS-TX are within the conformance limits. QualiPHY-MIPI-MPY groups these tests together, as they are defined in the same section of the M-PHY specification. Furthermore, DJTX (in the continuous-mode case) is a component of TJTX. (The burst-mode DJTX measurement (another component of 1.1.17) is described separately on page 34.)

What Is Measured TJTX is measured by acquiring a continuous CRPAT signal of at least 150,000UI, and performing a jitter analysis using the clock recovery and Jitter Transfer Function (JTF) characteristics specified in the CTS. The measured Time Interval Error (TIE) is decomposed into Determinstic Jitter (DJ) and Random Jitter (RJRMS), and the Total Jitter is extrapolated to a BER of 10E-10, to give TJTX as per the equation in Figure 16.

TJTX = DJ + 12.72*RJRMS

Figure 16. Calculation of TJTX

The value of TJTX must be less than 0.32*UIHS in order to be considered conformant. In the continuous-mode case, DJTX is equivalent to the DJ value derived from the TIE measurement made for the TJTX test, and is the same as the DJ term in the equation in Figure 16. The value of DJTX must be less than 0.15*UIHS in order to be considered conformant.

1.1.16 STTJTX & 1.1.18 STDJTX continuous This test verifies that the Short-Term Total Jitter (STTJTX) and the continuous-mode Short-Term Deterministic Jitter (STDJTX) of the DUT’s HS-TX are within the conformance limits. QualiPHY-MIPI-MPY groups these tests together as they are defined in the same section of the M-PHY specification. Furthermore, STDJTX (in the continuous-mode case) is a component of STTJTX. (The burst-mode STDJTX measurement (another component of 1.1.18) is described separately on page 34.)

What Is Measured The short-term TJTX test is analogous to the TJTX test performed in test 1.1.15, with the difference being that a first-order Butterworth highpass filter with a 3dB cutoff frequency of 1/(30*UIHS) is applied to the jitter waveform. The value of STTJTX must be less than 0.20*UIHS in order to be considered conformant.

34

Likewise, the short-term continuous-mode DJTX test is analogous to the continuous-mode DJTX test performed in test 1.1.17, except a first-order Butterworth highpass filter with a 3dB cutoff frequency of 1/(30*UIHS) is now applied to the jitter waveform. The value of STDJTX must be less than 0.10*UIHS in order to be considered conformant.

1.1.17 DJTX burst This test verifies the burst-mode Deterministic Jitter (DJTX) of the DUT’s HS-TX is within the conformance limits.

What Is Measured

In the burst-mode DJTX measurement, separate TIE arrays are calculated for a minimum of 10 CRPAT bursts, using a linear-fit clock recovery algorithm and the JTF specified by the CTS. The average peak-to-peak jitter of these 10 TIE arrays is taken to be the burst-mode DJTX. The underlying assumption here is that any random jitter component is statistically insignificant when taken over very short bursts, with the ten-burst average mitigating the effects of any outliers. The value of DJTX must be less than 0.15*UIHS in order to be considered conformant.

1.1.18 STDJTX burst This test verifies the short-term burst-mode Deterministic Jitter (DJTX) of the DUT’s HS-TX is within the conformance limits.

What Is Measured Likewise, the short-term burst-mode DJTX test is analogous to the burst-mode DJTX test performed in test 1.1.17, except a first-order Butterworth highpass filter with a 3dB cutoff frequency of 1/(30*UIHS) is now applied to the jitter waveform. The value of STDJTX must be less than 0.10*UIHS in order to be considered conformant.


924855 Rev B 35

Group 2 – PWM Tests

1.2.1 TPWM-TX This test verifies that the Transmit Bit Duration (TPWM-TX) of the DUT’s PWM-TX is within the conformance limits, for all combinations of supported Amplitudes, Terminations, LANEs, and PWM GEARs. This test requires that the DUT produce burst-mode CRPAT.

What Is Measured The time differences between all successive falling edges in a CRPAT burst are measured, with the min, max and mean results reported. For each supported mode of operation, all three reported results must lie within the range specified in the CTS:

PWM Gear Conformance Min Conformance Max Units TPWM-G0-TX 1/3 (0.3333) 100 µs TPWM-G1-TX 1/9 (0.1111) 1/3 (0.3333) µs TPWM-G2-TX 1/18 (0.0556) 1/6 (0.1667) µs TPWM-G3-TX 1/36 (0.0278) 1/12 (0.0833) µs TPWM-G4-TX 1/72 (0.0139) 1/24 (0.0417) µs TPWM-G5-TX 1/144 (0.0069) 1/48 (0.0208) µs TPWM-G6-TX 1/288 (0.0035) 1/96 (0.0104) µs TPWM-G7-TX 1/576 (0.0017) 1/192 (0.0052) µs

Table 8. Summary of TPWM-TX Conformance Requirements (µs)

PWM Gear Conformance Min Conformance Max Units TPWM-G0-TX .010 3 Mbps TPWM-G1-TX 3 9 Mbps TPWM-G2-TX 6 18 Mbps TPWM-G3-TX 12 36 Mbps TPWM-G4-TX 24 72 Mbps TPWM-G5-TX 48 144 Mbps TPWM-G6-TX 96 288 Mbps TPWM-G7-TX 192 576 Mbps

Table 9. Summary of TPWM-TX Conformance Requirements (Mbps)

36

1.2.2 kPWM-TX This test verifies that the PWM Transmit Ratio (kPWM-TX) of the DUT’s PWM-TX is within the conformance limits, for all LANEs. This test requires that the DUT produce burst-mode CRPAT.

What Is Measured For each bit, the TPWM-MAJOR-TX and TPWM-MINOR-TX intervals will be measured separately for “0” and “1” bits, as shown in Figure 17:

Figure 17. Definition of kPWM-TX

This results in four values, TPWM-MINOR-TX(b1) and TPWM-MAJOR-TX(b1), TPWM-MAJOR-TX(b0), and TPWM-MINOR-TX(b0). From these are calculated:

kPWM-Gx-TX(b0) = TPWM-MAJOR-TX(b0) / TPWM-MINOR-TX(b0) and,

kPWM-Gx-TX(b1) = TPWM-MAJOR-TX(b1) / TPWM-MINOR-TX(b1) For PWM-G1 and all higher supported PWM GEARs, the max, min, and mean values of kPWM-Gx-TX must be between 0.63/0.37 = 1.7027 and 0.72/0.28 = 2.5714 in order to be considered conformant[2].

1.2.3 TPWM-PREPARE This test verifies that the length of the DUT’s transmitted PWM-PREPARE period is consistent with the value indicated by its TX_LS_PREPARE_LENGTH configuration attribute. This test requires that the DUT produce burst-mode CRPAT.

What Is Measured The TPWM_PREPARE value is measured as the time between the two zero crossings which define the PREPARE period. This measured value will be divided by the mean measured TPWM-TX value measured separately for that burst (see Test 1.2.1), and compared with the DUT’s nominal TPWM_PREPARE value as entered by the user.


924855 Rev B 37

1.2.4 VCM-TX This test verifies that the Common-Mode Output Voltage Amplitude (VCM-TX) of the DUT’s PWM-TX is within the conformance limits. It requires that the DUT produce CRPAT, burst mode.

What Is Measured This test is identical to HS test 1.1.4 VCM-TX, except that in this case, the DUT is sourcing a PWM signal.

1.2.5. VDIF-DC-TX This test verifies that the Differential DC Output Voltage Amplitude (VDIF-DC-TX) of the DUT’s PWM-TX is within the conformance limits. It requires that the DUT produce CRPAT, burst mode.

What Is Measured This test is identical to HS test 1.1.5, except that in this case, the DUT is sourcing PWM signals at all supported PWM GEARs.

1.2.6 TEYE-TX As of the v3.0 specification, eye diagram requirements do not apply to PWM signaling. This test is left in the package for completeness.

1.2.7 VDIF-AC-TX This test verifies that the DUT’s PWM-TX meets the requirements for the Maximum Differential AC Output Voltage Amplitude. This test requires that the DUT produce burst-mode CRPAT.

What Is Measured This test measures the DUT’s peak maximum positive and peak maximum negative Differential AC Output Voltage Amplitudes, comparing them to the values in Table 10 below.

Parameter

Amplitude

Termination

Reference Load

Conformance Min

Conformance Max

VDIF-AC-LA-NT-TX Large Unterminated RREF-NT N/A 500mV

VDIF-AC-SA-NT-TX Small Unterminated RREF-NT N/A 280mV

VDIF-AC-LA-RT-TX Large Terminated RREF-RT N/A 250mV

VDIF-AC-SA-RT-TX Small Terminated RREF-RT N/A 140mV

Table 10. VDIF-TX-AC test limits

38

1.2.8 TR-PWM-TX & TF-PWM-TX This test verifies that the Rise and Fall times (TR-PWM-TX and TF-PWM-TX) of the DUT’s PWM-TX are less than the maximum conformance limit. This test requires that the DUT produce CRPAT, burst mode.

What Is Measured The test measures rise and fall times will for all edges of a PWM burst, using the 20/80% reference levels derived from the measured 0/100% VDIF-DC-xA-xT-TX amplitudes obtained in Test 1.2.5. The rise/fall time values will be converted to units of fractional TPWM-TX by dividing by the TPWM-TX value measured in Test 1.2.1, and averaged over a minimum of one complete PWM burst. The mean values in each case must be less than 0.07*TPWM-TX in order to be considered conformant.

1.2.9 TL2L-SKEW-PWM-TX This test verifies that the Lane-to-Lane Skew (TL2L-SKEW-PWM-TX) of the DUT’s PWM-TX is within the conformance limits. This test requires that the DUT produce burst-mode CRPAT. Note it is only possible to perform this test if two lanes are being tested simultaneously. If only one lane is being tested, QualiPHY-MIPI-MPHY will not perform this test, and test 1.2.9 will not appear in the resulting report. QualiPHY reports this test as informative only, as the skew limits are set by the specific MIPI protocol layer sitting on top of the MPHY implementation.

What Is Measured This test will use the same methodology that was used for the HS Lane-to-Lane Skew test 1.1.9, where the skew for each LANE will be measured relative to LANE 0, and the Lane-to-Lane Skew results for all other LANE combinations will be derived mathematically from the measured values. Note: If the DUT implements fewer than four PWM LANEs, then only the applicable subset of Lane-to-Lane combinations will be measured. (Also, if the DUT implements one or zero PWM LANEs, this test is Not Applicable.)

Protocol-specific conformance values are shown in Table 11.

Specification SYS PWM HS-G1 HS-G2 HS-G3

DigRFv4[2] See Note* N/A See Note* See Note* N/A

LLI[3] N/A N/A 2 UI 2 UI 2 UI

UniPro[4] N/A 10 TPWM-TX 10 UIHS 10 UIHS 10 UIHS

SSIC[8] N/A N/A 1300ps 1300ps 1300ps * The DigRFv4 spec [2] requires DUTs to define mandatory product-specific TX skew limits (e.g., in the device datasheet), which will be used as the conformance limits for this test.

Table 11. Protocol-Specific TX Lane-to-Lane Skew Requirement


924855 Rev B 39

1.2.10 TOLPWM-TX, TOLPWM-G1-LR-TX This test verifies that the Transmit Bit Duration Tolerance (TOLPWM-TX) of the DUT’s PWM-TX is within the conformance limits. This test requires that the DUT produce burst-mode CRPAT in all GEARs (for TOLPWM-TX) and, additionally, a LINE-READ command in PWM-G1 (for TOLPWM-G1-LR-TX)

What Is Measured This test compares the bit duration of each bit in a burst with the average bit duration (already measured in test 1.2.1).

For all GEARs, both the maximum and minimum values of TOLPWM-TX must be between 0.90 and 1.10, in order to be considered conformant. Additionally, in the PWM-G1 case, both the maximum and minimum values of TOLPWM-G1-LR-TX must be between 0.97 and 1.03, in order to be considered conformant.

1.2.11 TPWM-MINOR-G0-TX This test verifies that the PWM-G0 Minor Duration (TPWM-MINOR-G0-TX) of the DUT’s PWM-TX is within the conformance limits. This test requires that the DUT produce CRPAT, burst-mode. This test is only applicable for devices that support PWM-G0 operation.

What Is Measured This test is analogous to test, except that only the minor duration is of interest here. The minimum values for TPWM-MINOR-G0-TX(0) and TPWM-MINOR-G0-TX(1) must be between 1/27 and 1/9 us (i.e., 37.04 and 111.11 ns) in order to be considered conformant (Refer to Figure 17 in the section on test for an illustration of these parameters).

40

Group 3 – SYS Tests

1.3.1 UISYS & fOFFSET-TX This test verifies that the Unit Interval (UISYS) and Frequency Offset (fOFFSET-TX) of the DUT’s SYS-TX are within the conformance limits. This test requires that the DUT produce CRPAT.

What Is Measured This test uses the same methodology as Test 1.1.1, in terms of how the data is processed and filtered, except the measurement is performed on the DUT’s SYS signaling bursts, and will be performed for all supported Reference Frequencies.

1.3.3 TSYS-PREPARE This test verifies that the length of the DUT’s transmitted SYS-PREPARE period is consistent with the value indicated by its TX_LS_PREPARE_LENGTH configuration attribute. This test requires that the DUT produce burst-mode CRPAT.

What Is Measured The TSYS_PREPARE value is measured as the time between the two zero crossings which define the PREPARE period. This measured value will be divided by the mean measured UISYS-TX value measured separately for that burst (see Test 1.3.1), and compared with the DUT’s nominal TSYS_PREPARE value as entered by the user.

1.3.4 VCM-TX This test verifies that the Common-Mode Output Voltage Amplitude (VCM-TX) of the DUT’s SYS-TX is within the conformance limits. It requires that the DUT produce CRPAT, burst mode.

What Is Measured This test is identical to HS test 1.1.4 VCM-TX, except that in this case, the DUT is sourcing SYS signals at all supported DigRFv4 Reference Frequencies.

1.3.5 VDIF-DC-TX This test verifies that the Differential DC Output Voltage Amplitude (VDIF-DC-TX) of the DUT’s SYS-TX is within the conformance limits. It requires that the DUT produce CRPAT, burst mode.

What Is Measured This test is identical to HS test, except that in this case, the DUT is sourcing SYS signals at all supported DigRFv4 Reference Frequencies.

1.3.6 TEYE-TX Eye diagram requirements no longer apply to SYS mode transmitters.


924855 Rev B 41

1.3.7 VDIF-AC-TX This test verifies that the DUT’s SYS-TX meets the requirements for the Maximum Differential AC Output Voltage Amplitude (VDIF-AC-TX). This test requires that the DUT produce CRPAT, burst-mode.

What Is Measured The methodology for this test is identical to the PWM-TX case of Test 1.2.7, except the measurement is performed on the DUT’s SYS-TX signaling bursts. The measurement is performed for all supported DigRFv4 Reference Frequencies (26, 38.4, 52MHz).

1.3.8 TR-SYS & TF-SYS-TX This test verifies that the Rise and Fall times (TR-SYS-TX and TF-SYS-TX) of the DUT’s SYS-TX are within the conformance limits, for all combinations of supported Amplitudes, Terminations, LANEs, and Reference Frequencies.

What Is Measured In this test, the DUTs SYS-TX Rise and Fall Times are measured while the DUT is driving a CRPAT test pattern into both the RREF-RT and RREF-NT reference loads, for both the Large and Small Amplitudes. For each termination/Amplitude case, the reference amplitude will be defined by the VDIF-DC-xA-xT-TX result measured in Test 1.3.5. Note: This test is intended for DUTs that support SYS signaling (e.g., Type-II devices). If the DUT does not support SYS signaling, this test is Not Applicable. The values of TR-SYS-TX and TF-SYS-TX for all combinations of supported Amplitudes, Terminations, LANEs, and Reference Frequencies must be less than 0.20* UISYS in order to be considered conformant (where UISYS is the value measured in Test 1.3.1).

1.3.9 TLRL-SKEW-SYS-TX This test measures measure the Lane-to-Lane Skew (TL2L-SKEW-SYS-TX) of the DUT’s SYS-TX meets the specified conformance limits.

What Is Measured The DUTs SYS Lane-to-Lane Skew, TL2L-SKEW-SYS-TX, is measured while the DUT is driving a reference test pattern in Unterminated LINE drive mode into the RREF-NT reference load, on all SYS LANEs simultaneously. If the DUT supports both the Large and Small Amplitudes, only the Large Amplitude will be used for this test. The skew is reported as the mean timing error between the two LANEs, based on the zero-crossing times. Also, the exact pattern used for this test varies depending on the protocol. This test uses the otherwise same measurement methodology as Test 1.1.9, in terms of measuring the skew for each LANE with respect to LANE 0, and computing the Lane-to-Lane skew for all other LANE combinations using the measured data. For all valid SYS Lane-to-Lane combinations, TL2L-SKEW-SYS-TX must be less than the maximum vendor-specified rated value, for all supported Reference Frequencies in order to be conformant.

42

1.3.2 UIREFCLK & fREFCLK-TX This test verifies that the Frequency (fREFCLK-TX) of the DUT’s shared Reference Clock is within the conformance limits . This test is performed on the DUT’s reference clock, rather than the Dp and Dn signals. Note: This test is only applicable to DigRFv4 BBIC devices. If you do not check the appropriate box on the QPHY-MIPI-MPHY setup tab, this test will not be executed.

What Is Measured This test uses the same methodology as tests 1.1.1 and 1.3.1, but applied to the reference clock signal.

QPHY-MIPI M-PHY Limit Sets The default installation of QPHY MIPI M-PHY contains only one limit set, called “Default”. In this script, limits are only used to convey Unit labels. The actual limits for each value tested are encoded in or computed by the script and cannot be changed.


924855 Rev B 43

Appendix A: Manual Deskewing Procedures This section is only applicable to the oscilloscope and the cables connecting to the oscilloscope channels. .

Cable Deskewing Using the Fast Edge Output The following procedure demonstrates how to manually deskew two oscilloscope channels and cables using the fast edge output, with no need for any T connector or adapters. Note: Fast Edge output is available only on some models. If your oscilloscope does not have Fast Edge output, see Cable Deskewing Without Using the Fast Edge Output. This can be done once the temperature of the oscilloscope is stable. The oscilloscope must be warmed up for at least 20 min. before proceeding. This procedure should be run again if the temperature of the oscilloscope changes by more than a few degrees. For the purpose of this procedure, the two channels being deskewed are referred to as Channel X and Channel Y. The reference channel is Channel X and the channel being deskewed is Channel Y.

1. Begin by recalling the Default Oscilloscope Setup. 2. Configure the oscilloscope as follows:

• Timebase i. Fixed Sample Rate ii. Set the Sample Rate to 40 GS/s iii. Set the Time/Division to 1 ns/div

• Channels

i. Turn on Channel X and Channel Y. ii. Set V/div for Channel X and Channel Y to 100mV/div. iii. Set the Averaging of Channel X and Channel Y to 500 sweeps. iv. Set the Interpolation of Channel X and Channel Y to Sinx/x.

44

• Trigger i. Configure to Source to be FastEdge. ii. Set the Slope to Positive.

• Parameter Measurements:

i. Set the source for P1 to CX and the measure to Delay. ii. Set the source for P2 to CY and the measure to Delay. iii. Set the source for P3 to M1 and the measure to Delay.

3. Set the display to Single Grid.

• Click Display Single Grid. 4. Using the appropriate adapter, connect Channel X to the Fast Edge Output of the oscilloscope. 5. Adjust the Trigger Delay so that the Channel X signal crosses at the center of the screen. 6. Change the Timebase to 50 ps/div.

7. Fine tune the Trigger Delay so that the Channel X signal crosses at the exact center of the

screen. 8. Press the Clear Sweeps button on the front panel to reset the averaging.

9. Allow multiple acquisitions to occur until the waveform is stable on the screen.


924855 Rev B 45

10. Save Channel X to M1.

• Click File Save Waveform.

• Set Save To Memory.

• Set the Source to CX.

• Set the Destination to M1.

• Click Save Now.

11. Disconnect Channel X from the Fast Edge Output and connect Channel Y to the Fast Edge

Output. 12. Press the Clear Sweeps button on the front panel to reset the averaging. 13. Allow multiple acquisitions to occur until the waveform is stable on the screen. 14. From the Channel Y menu, adjust the Deskew of Channel Y until Channel Y is directly over the

M1 trace. 15. Ensure that P3 and P2 are reasonably close to the same value. (Typically < 5ps difference)

46

Cable Deskewing Without Using the Fast Edge Output The following procedure demonstrates how to manually deskew two oscilloscope channels and cables using the differential data signal, with no need for any T connector or adapters. This can be done once the temperature of the oscilloscope is stable. The oscilloscope must be warmed up for at least a half-hour before proceeding. This procedure should be run again if the temperature of the oscilloscope changes by more than a few degrees.

1. Connect a differential data signal to C1 and C2 using two approximately matching cables. Set up the oscilloscope to use the maximum sample rate. Set the timebase for a few repetitions of the pattern (at least a few dozen edges).

2. On the C3 menu, check Invert. Now C1 and C2 should look the same. 3. Using the Measure Setup, set P1 to measure the Skew of C1, C2. Turn on Statistics (Measure

menu). Write down the mean skew value after it stabilizes. This mean skew value is the addition of Data skew + cable skew + channel skew.

4. Swap the cable connections on the Data source side (on the test fixture), and then press the Clear Sweeps button on the oscilloscope (to clear the accumulated statistics; since we changed the input).

5. Write down the mean skew value after it stabilizes. This mean skew value is the addition of (-

Data skew) + cable skew + channel skew. 6. Add the two mean skew values and divide the sum in half:

UU [Data skew + cable skew + channel skew] + [ (-Data skew) + cable skew + channel skew] UU 2

The above formula simplifies to: [cable skew + channel skew]

7. Set the resulting value as the Deskew value in C1 menu. 8. Restore the cable connections to their Step 1 settings (previous). Press the Clear Sweeps

button on the oscilloscope. The mean skew value should be approximately zero - that is the data skew. Typically, results are <1ps given a test fixture meant to minimize skew on the differential pair.

9. On the C2 menu, clear the Invert checkbox and turn off the parameters.


924855 Rev B 47

In the previous procedure, we used the default setup of the Skew parameter (which is detecting positive edges on both signals at 50%). We also inverted C2 in order to make C1 and C2 both have positive edges at the same time. Alternately, we clearly could have not inverted C2 and instead selected the Skew clock 2 tab in the P1 parameter menu and set the oscilloscope to look for negative edges on the second input (C2). However, we believe that the previous procedure looks much more aesthetically pleasing from the display as it shows C2 and C3 with the same polarity.

QPHY-MIPI-M-PHY Instruction...

Documents

Transcript of QPHY-MIPI-M-PHY Instruction...