Power Integrity and EMC Design for High-speed …web.mst.edu/~jfan/slides/Wu1.pdf1 EMC DL 2008 Power...

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EMC DL 2008 1 Power Integrity and EMC Design for High Power Integrity and EMC Design for High - - speed speed Circuits Packages Circuits Packages Tzong-Lin Wu, Ph. D. Professor Department of Electrical Engineering Graduate Institute of Communication Engineering National Taiwan University Taipei, Taiwan, ROC

Transcript of Power Integrity and EMC Design for High-speed …web.mst.edu/~jfan/slides/Wu1.pdf1 EMC DL 2008 Power...

EMC DL 20081

Power Integrity and EMC Design for HighPower Integrity and EMC Design for High--speed speed Circuits Packages Circuits Packages

Tzong-Lin Wu, Ph. D.Professor

Department of Electrical EngineeringGraduate Institute of Communication Engineering

National Taiwan UniversityTaipei, Taiwan, ROC

EMC DL 20082

OutlineOutline

• Power Distribution Network (PDN)• Mechanism of Power Noise

• Issues and Quantification of Power Noise

• Solutions of Suppressing Power Noise

– Decoupling Capacitors• Power/ground planes (PKG, PCB)

• Surface mounted capacitor (PCB, PKG)

• Embedded capacitor (PKG)

• On-chip capacitor (Chip)

– Isolation slots

– EBG structures• Electromagnetic Bandgap (EBG) Power Planes

• Photonic Crystal Power Layer (PCPL)

• Conclusion

EMC DL 20083

Trends for high-performance Electronics

*Source: The International Technology Roadmap for Semiconductor (ITRS), 2007 (http://public.itrs.net)

Low voltage High speed

Year Feature Vdd Chip Freq. Power

2007 68nm 1.1V 4.70GHz 189W

2010 45nm 1.0V 5.88GHz 198W

2013 32nm 0.9V 7.34GHz 198W

2016 22nm 0.8V 9.18GHz 198W

2019 16nm 0.7V 11.48GHz 198W

EMC DL 20084 EMC DL 20084

Power Distribution Network (PDN)Power Distribution Network (PDN)

An Electronic SystemAn Electronic System

Ground

Power

Decoupling capacitor on PCB

Decoupling capacitor on Package

Chip Ball Bonding

Flip chipChip

Wire bonding

VRM

EMC DL 20085 EMC DL 20085 5

Power Distribution Network (PDN)Power Distribution Network (PDN)Chip LevelChip Level

Ground

Power

Decoupling capacitor on PCB

Decoupling capacitor on Package

Chip Ball Bonding

Flip chipChip

Wire bonding

VRM

On-chip capacitorP/G GridsInterconnectsPads

EMC DL 20086

Power Distribution Network (PDN)Power Distribution Network (PDN) interconnects for Chipinterconnects for Chip--PKGPKG--PCBPCB

Ground

Power

Decoupling capacitor on PCB

Decoupling capacitor on Package

Chip Ball Bonding

Flip chipChip

Wire bonding

VRM

Fine pitch: 50-100umLine length: 100-200 mil

Bump pitch: 100–300umBGA Ball pitch: 0.5mm – 1mm

EMC DL 20087

Power Distribution Network (PDN)Power Distribution Network (PDN) decoupling capacitorsdecoupling capacitors

EMC DL 20087

CeramicsExternal electrode

Internal electrode

ESR ESL

capacitance

Equivalent capacitor circuit

1Impedance j ESL ESRj C

ωω

= + +

Impe

danc

e (Ω

)

Frequency (Hz)

1/ωC ωL

Ground

Power

Decoupling capacitor on PCB

Decoupling capacitor on Package

Chip Ball Bonding

Flip chipChip

Wire bonding

VRM

EMC DL 20088

Power Distribution Network (PDN)Power Distribution Network (PDN) PWR/GND PlanesPWR/GND Planes

PowerGND

Ground

Power

Decoupling capacitor on PCB

Decoupling capacitor on Package

Chip Ball Bonding

Flip chipChip

Wire bonding

VRM

EMC DL 200899

Bulk Capacitornear VRM

SMT C on PCB

SMT C on PKG

On-chip C

PCBP/G Network

PKG P/G Network

Ball Bonding

wire Bonding

Chip

VRM

Ground

Power

Decoupling capacitor on PCB

Decoupling capacitor on Package

Chip Ball Bonding

Flip chipChip

Wire bonding

VRM

Power Distribution Network (PDN)Power Distribution Network (PDN) Equivalent ModelEquivalent Model

EMC DL 200810

Mechanism of the Power Noise : Mechanism of the Power Noise : lowlow--speed viewspeed view

Chipgroud

Frominput stage

LRLC

Outputlead

OUTV

1Q

2Q

LeadVCC

Groundlead

Boardinductance

CCVCHIP

OUTV

OUTI

VGB

+

-

VGB

IcutCIcut

switching voltage

transient currentΔ − I noiseb g

I C dVdtcut L= −1 0

P/G noise arises whenever a changing current flow through the total inductance of the return path

EMC DL 200811

Mechanism of the GBN : Mechanism of the GBN : highhigh--speed viewspeed view

Print circuit board

Package

Vcc

GND

Decouplingcapacitance

loadedcapacitance

Chip

Pull-Low

bottom

to pGND

VCC

EMC DL 200812

Signal in

Via

Layer 1

Layer 2

Layer 3

Layer 4

A 4-layer PCB

EMC DL 200813

P/GBN Coupling through Via Transition (SP/GBN Coupling through Via Transition (S2121 ))

Freq(GH z)

0.72 0.906 1.44 1.706 2.31

mn- mode

1,0 0,1 2,0 2,1 2,2

10cm

8cm

2cmport1(4cm,4cm)

port2(1.5cm,6cm)

1.5cm

2cm

d=20mils

d=40mils

d=20mils

noisesource

port1

50ohm

port2

viatrace

trace

power

ground

SIG1

PWR

GND

SIG2

via

via

port3(3cm,1cm)

0 0.5 1 1.5 2 2.5Frequency(GHz)

-80

-70

-60

-50

-40

-30

-20

-10

0

S 21(

dB)

perfect planeFDTD modelingmeasurement

EMC DL 200814

RFI Issues

EMC DL 200814

Issues caused by power noiseIssues caused by power noise

Noise current to RF transceiver

EMI Issue

1 2 3 4 5 6 720

30

40

50

60

70

dBμV

Frequency(GHz)

Case 1 Case 2

20 dBEMI

Signal Integrity Issues

SSN

RF sensitivity

Jitter, SkewCrosstalkEye width/height

EMC DL 200815

Example of signal integrity issuesExample of signal integrity issues

EMC DL 200815

Decoupling Con chip

Package P/N network

OCDInput

VDD

VSS

Out

InputOut

RemoveDecoupling C

on chip

Package P/N network

VDD

VSS

OCDO

ut-V

SS (

V)O

ut-V

SS (

V)

EMC DL 200816

Example of EMI Issues

3m

absorber

Spectrum Analyzer

30MHz~2GHz

Signal generator

preamp

PC Control

wooden turntable

3m

tested board

7m

1.2m

Cable feed

0.2 0.4 0.6 0.8 1 1.2 1.4 1.6 1.8 2Frequency(GHz)

0

10

20

30

40

50

60

70

80

|Ez|

at 3

m(d

BuV

/m)

simulationmeasurement

radiation of reference board

excitation amplitude: 20mV excitation location: (6cm, 6cm)

TM10

TM01

TM11

TM20

TM02TM21

TM12

EMC DL 200817

Example of RFI Issues

VCO’s performance is affected by power noise

Ideal VCO

EMC DL 200818

Quantification of Power Noise:Quantification of Power Noise: Z parameterZ parameter

EMC DL 200818

open) 2(Port IVZ

open) 2(Port IVZ

II

ZZ ZZ

VV

1

221

1

111

2

1

2221

1211

2

1

=

=

⎥⎦

⎤⎢⎣

⎡×⎥⎦

⎤⎢⎣

⎡=⎥

⎤⎢⎣

Bulk Capacitornear VRM

Decoupling C on PCB

Decoupling C on package

Decoupling C on chip

+

-

V1

+

-

V2

I2I1

PCBP/G Network

packageP/G Network

Ball Bonding

wire Bonding

VRM

PDN Design:

Lower Z11 (Target impedance)Lower Z21

EMC DL 200819

Measurement of PDN ImpedanceMeasurement of PDN Impedance

ZZ--parameter and Sparameter and S--parametersparameters

port1(5cm,4cm)

port2(4cm,8cm)

10cm

10cm

1.6mmX

Y

(0,0)

Floppy drive

HP 8510C

SMA Connector

Coaxial Probes

Transfer impedance

Self impedance: (two probes are very close)

2121 0

11 22 12 21

11 22

12 21 0

21 21

2(1 )(1 )

Assume S 1 (Low impedance PDN)S 0, Z 50

25

SZ ZS S S S

SS

Z S

=− − −

≈ −⋅ = Ω

≈ ⋅

0 2111

212 1Z S

ZS

=− 11 21 2125 (assume 1)Z S S≈ ⋅

EMC DL 200820 EMC DL 200820

1006 1007 1008 1009

Frequency (Hz)

0.1

1

10

Mag

(Z(1

,1))

[1][2][3][4]

Bulk Capacitornear VRM

Decoupling C on PCB

Decoupling C on package

Decoupling C on chip

PCBP/G Network

packageP/G Network

Ball Bonding

wire Bonding

Chip[1] [2] [3] [4]

Target impedance

Capacitance Given by VRM

Inductance by•ESL of discrete capacitor•Power/ground trace

Resonance Resonance

Antiresonance Antiresonance

Inductance by•Power/Ground Plane•Package via

Decoupling capacitor of package

on-chip Capacitance

VRM

EMC DL 200821

package

Die

PCB

Decoupling capacitor

4cm

4cm

10cm

8cm

port1 port2

Power/Ground PlanesPower/Ground Planes

A Test Sample

EMC DL 200822

Measurement setup Measurement setup

10 cm

8 cmPCB

package 0.4 mm

probe

VNA

Power ring

Ground ring

Power viaprobe

signalground

Power/Ground PlanesPower/Ground Planes

EMC DL 200823

0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5frequency(GHz)

-70

-60

-50

-40

-30

-20

-10

0

S21(

dB)

Bare pkgBare PCBpkg+PCB

The SSN could be magnified by the interaction The SSN could be magnified by the interaction of these two cavities and degrades the of these two cavities and degrades the power integrity of the packaged power integrity of the packaged integrated circuitsintegrated circuits.

The PDS behavior of combining the package The PDS behavior of combining the package and PCB is similar to that of considering and PCB is similar to that of considering only the package.only the package.

Power/Ground PlanesPower/Ground Planes Coupling between PKG and PCBCoupling between PKG and PCB

Measurement Results

Sin-Ting Chen, Ting-Kuang Wang, Chi-Wei Tsai, Sung-Moa Wu, James L. Drewniak, Tzong-Lin Wu, “Modeling Noise Coupling Between Package and PCB Power/Ground Planes with an Efficient 2D-FDTD/Lumped Element Method”, IEEE Transaction on Advanced Packaging, Vol. 30, No. 4, pp. 864 –

pp. 871, Nov. 2007.

EMC DL 200824

900 MHz 1.1GHz

TM10 TM11

Power/Ground PlanesPower/Ground Planes

Cavity resonance

EMC DL 200825

VRMGround

Power

Bulk capacitor

Decoupling capacitor on PCB

Decoupling capacitor on Package

ChipBall Bonding

SMT CapacitorsSMT Capacitors

Design Question?

• Locations?• Numbers?• Values?

EMC DL 200826

SMT Decoupling CapacitorsSMT Decoupling Capacitors

Capacitors placed either on Package or PCBCapacitors placed either on Package or PCB

PCB

package

Decoupling capacitors

Testing port

52 capacitors on package

63 capacitors on PCB

Capacitance : 100 nF

ESR : 0.04ohm ESL :0.63nH

VRMGround

Power

Bulk capacitor

Decoupling capacitor on PCB

Decoupling capacitor on Package

ChipBall Bonding

EMC DL 200827

0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5frequency(GHz)

-90

-80

-70

-60

-50

-40

-30

-20

-10

S21(

db)

pkg+PCBpkg+(PCB+cap)(pkg+cap)+PCB(pkg+cap)+(PCB+cap)

The additional resonance peak The additional resonance peak worsens the PDN performance.worsens the PDN performance.

The behavior of the PDN is similar The behavior of the PDN is similar to that with the caps mounted on to that with the caps mounted on the package.the package.

Decoupling capacitors placed on Decoupling capacitors placed on package have better performance.package have better performance.

SMT Decoupling Capacitors for Suppressing the P/GBNSMT Decoupling Capacitors for Suppressing the P/GBN

Capacitors placed either on Package or PCBCapacitors placed either on Package or PCB

EMC DL 200828

C:100nF (on Package)

ESR:0.04ohm

ESL:0.63nH

With increasing the number of decoupling capacitors, the peaks move to higher frequency and their magnitude become smaller.

0 0.2 0.4 0.6 0.8 1 1.2 1.4 1.6 1.8 2frequency(GHz)

-100

-90

-80

-70

-60

-50

-40

-30

-20

-10

S21(

db)

(pkg+PCB)_no cap4 cap8 cap12 cap22 cap52 cap

SMT Decoupling CapacitorsSMT Decoupling Capacitors

Capacitors Number EffectVRM

Ground

Power

Bulk capacitor

Decoupling capacitor on PCB

Decoupling capacitor on Package

ChipBall Bonding

EMC DL 200829

0 0.2 0.4 0.6 0.8 1 1.2 1.4 1.6 1.8 2frequency(GHz)

-80

-70

-60

-50

-40

-30

-20

-10S2

1(dB

)

(pkg+PCB)_no cap12cap_100n12cap_100p

100nF capacitors have better performance to reduce noise at low frequency.

100pF capacitors have better performance at higher frequency. At low frequency, the capacitors can reduce noise about 8 dB.

SMT Decoupling CapacitorsSMT Decoupling CapacitorsCapacitance value Effect

EMC DL 200830

Embedded CapacitorEmbedded Capacitor

L1L2L3L4

AP5

L5

L6L7L8L9L10

AP6

Embedded CEmbedded Capacitor Properties:

Dk (10kHz): 3000Capacitance Density: 1.0 nF/mm2

thickness: 20- 30 umCu Electrode thickness: 5~7um

20um3~7um

EMC DL 200831 2008/8/1631

Caps locationCaps location

11

223344

77 88

EMC DL 20083232

Impedance measurement Impedance measurement

Cap (nF) ESL (pH) SRF (MHz)

Cap4 8.87 214 115.6

Good capacitor is seen below SRF.

SRF is in the several MHz range due to large ESL of the connecting vias.

The bandwidth could be enhanced by designing the capacitor closer to the surface of the package.

EMC DL 200833

GND plnae(2nd layer)

Vcc plane(3rd layer)

Substrate

Schematic diagram of the Isolated and BridgedPower Planes in Four Layers PCB Circuits

IC

Etched slit (Moat)

Bridged connection

X

Y

Z

Top layer (1'st layer)

Bottom layer (4th layer)

signal traces

Isolation by etched slot with bridgesIsolation by etched slot with bridges

EMC DL 200834

Isolation slots with bridgeIsolation slots with bridge

0 0.5 1 1.5 2 2.5 3Frequency(GHz)

-80

-70

-60

-50

-40

-30

-20

-10

0

|S12

| (dB

)

Dotted line: measurementSolid line: 3D-FDTDexcited location: port 2

reference board

0 0.5 1 1.5 2 2.5 3Frequency(GHz)

-80

-70

-60

-50

-40

-30

-20

-10

0

|S12

| (dB

)

moat-bridged board

33

EMC DL 200835

effl

TM10

effl

TM10-like

Isolation by etched slot with bridgeIsolation by etched slot with bridge (P/G Noise of the bridged board)(P/G Noise of the bridged board)

J. N. Hwang and T. L. Wu,"The Bridging Effect of the Isolation Moat on the EMI Caused by Ground Bounce Noise between Power/Ground planes of PCB,"2001 IEEE EMC Symposium, Montreal, Canada, Vol. 1, pp. 471 -474, Aug. 2001.

T. L. Wu, J. N. Huang, C. C. Kuo, Y. H. Lin,"Numerical and Experimental Investigation of Radiation Caused by the Switching Noise on the Partitioned DC Reference Planes of High Speed Digital PCB,”

IEEE Transactions on Electromagnetic Compatibility, Feb. 2004.

36

Fundamentals for EBG StructureFundamentals for EBG Structure circuit viewcircuit view

DGS2L DGS2L DGS2L

1Port 2Port

A BC D⎡ ⎤⎢ ⎥⎣ ⎦

A BC D⎡ ⎤⎢ ⎥⎣ ⎦

A BC D⎡ ⎤⎢ ⎥⎣ ⎦

Unit Cell d

nV+

1nV+

+

nI 1nI +

( )

0 0

0 0

20

2 200 0

cos sin cos sin12 2 2 20 1sin cos sin cos

2 2 2 2

cos sin cos2 2

sin 1 sin cos sin2 2 2

unit cell

jZ jZA B jXC D jY jY

X Y jX

Y Xj jXY Y

θ θ θ θ

θ θ θ θ

θθ θ

θθ θ θ

⎡ ⎤ ⎡ ⎤⎢ ⎥ ⎢ ⎥⎡ ⎤ ⎡ ⎤

= ⎢ ⎥ ⎢ ⎥⎢ ⎥ ⎢ ⎥⎣ ⎦ ⎣ ⎦⎢ ⎥ ⎢ ⎥

⎢ ⎥ ⎢ ⎥⎣ ⎦ ⎣ ⎦⎡ ⎤−⎢ ⎥

= ⎢ ⎥⎢ ⎥+ − −⎢ ⎥⎣ ⎦

37

Fundamentals for EBG StructureFundamentals for EBG Structure circuit viewcircuit view

0 0,α β π= ≠• Case 1 : (Pass Band)

0cos cos sin2Xd Zβ θ θ= −

0cos sin 12X Zθ θ− ≤

• Case 2 : (Stop Band)

0 =0,α β π≠

0cosh cos sin 12Xd Zα θ θ= − ≥

0 2 4 6 80

1

2

3

4

5

0

2

βd(r

ad)

αd(

Np)

Frequency(GHz)

38

Fundamentals for EBG/PBG StructureFundamentals for EBG/PBG Structure wave viewwave view

1D

2D3D

39 39

Fundamentals for EBG/PBG StructureFundamentals for EBG/PBG Structure wave viewwave view

1D example (no DK contrast)

40 40

Photonic Bandgap

Photonic Bandgap

Fundamentals for EBG/PBG StructureFundamentals for EBG/PBG Structure wave viewwave view

41 41

E-field for mode at top of band I

Local power in E-field , top of band I

E-field for mode at bottom of band II

Local power in E-field, bottom of band II

High-DK Low-DK

High-DK Low-DK

Fundamentals for EBG/PBG StructureFundamentals for EBG/PBG Structure wave viewwave view

42

HighHigh--impedance Surface (mushimpedance Surface (mush--room)room) conceptconcept

0 ,Z β 0 ,Z βVL

pC

0

1

24

start

p v

fhC L μπ

=⎡ ⎤+⎢ ⎥⎣ ⎦

Shawn D. Rogers, “Electromagnetic-Bandgap Layers for Broad-Band Suppression of TEM Modes in Power Planes”, IEEE Trans. Microwave Theory and Tech., Vol.53, No. 8, pp.2495-2505, Aug. 2005

43

HighHigh--impedance Surface (mushimpedance Surface (mush--room)room) bandwidth enhancementbandwidth enhancement

Cascaded HIS: to improve the bandwidth

Shahrooz Shahparnia

and Omar M. Ramahi, “Electromagnetic Interference (EMI) Reduction From Printed Circuit Boards (PCB) Using Electromagnetic Bandgap Structures”, IEEE Trans. Electromagntic Compatibility, Vol.46, No.4, Nov. 2004.

44

HighHigh--impedance Surface (mushimpedance Surface (mush--room)room) bandwidth enhancementbandwidth enhancement

(d) Spiral HIS

(c) Double-Stacked HIS

Jongbae Park, Albert Chee W. Lu, Kai M. Chua, Lai L. Wai, Junho Lee, and Joungho Kim, “Double-Stacked EBG Structure for Wideband Suppression of Simultaneous Switching Noise in LTCC-Based SiP Applications”, IEEE Microwave and Wireless Components Letters, vol. 15, No.8, pp. 505-507, Aug. 2005. Chien-Lin Wang, Guang-Hwa Shiue, and Ruey-Beei Wu, “EBG-Enhanced Split Power Planes for Wideband Noise Suppression”, Proc. IEEE 14th Topical Meeting Elect. Performance Electron. Package., 2005, pp.61-64.

EMC DL 200845

Electromagnetic Bandgap (EBG) Power PlanesElectromagnetic Bandgap (EBG) Power Planes

• Broadband suppression of the P/GBN

• Low EMI caused by the P/GBN

• Isotropically elimination of the P/GBN

• Very low cost

Ground Plane

Power Plane

Tzong-Lin Wu, Yen-Hui Lin, and Sin-Ting Chen, “A Novel Power Planes With Low Radiation and Broadband Suppression of Ground Bounce Noise Using Photonic Bandgap Structures,”

IEEE Microwave and Wireless Components Letters, Vol. 14, No. 7, pp. 337-339, Jul. 2004

EMC DL 200846

bLpC

gC

bC2 1ni − 2ni 2 1ni + 2 2ni +

2 2

2 2

n

nQ −

2 1

2 1

n

nQ −

2

2

n

nQ 2 1

2 1

n

nQ +

+

2 2

2 2

n

nQ +

+

gC gCpL

pC pCbCbC

bLbL

2 2ni −

pL pL pL

2 3

2 3

n

nQ +

+

2 3ni +

4.3rε =w

2pl

d

1p

1D1D--equivalent circuit modelequivalent circuit model

40

EMC DL 200847

90mm

90mm

Power plane

GND plane

h = 0.4mmx

y

z

(0,0)

0 1 2 3 4 5 6Frequency(GHz)

-110

-90

-70

-50

-30

-10

|S21

| (dB

)

Solid line: 2D-FDTDDotted line: measurement

Reference board

9-cell LPC-EBG boardexcited location: (45mm, 45mm)

received location: (15mm, 75mm)

P/GBN suppressionP/GBN suppression—— Frequency domainFrequency domain

44

EMC DL 200848

0 5 10 15 20 25 30Time(ns)

-0.4

-0.3

-0.2

-0.1

0

0.1

0.2

0.3

0.4

0.5

Volta

ge(m

V)

Reference board9-cell LPC-EBG board

excited source: 20mV Gaussian pulse

excited location: (45mm, 45mm)

received location: (15mm, 75mm)

90mm

90mm

Power plane

GND plane

h = 0.4mmx

y

z

(0,0)

P/GBN suppressionP/GBN suppression—— Time domain (3DTime domain (3D--FDTD)FDTD)

There is over 35% of the GBN suppression rate by LPC-EBG power plane design.

46

EMC DL 200849

Excitation source(2.25GHz clock with

amplitude of ±125mV)

P/GBN suppression P/GBN suppression —— Time domain (measurement)Time domain (measurement)

9cell-EBG board (peak to peak 7mV)

Excited port (45mm, 45mm)

received port (15mm, 75mm)

47

EMC DL 200850

0 0.5 1 1.5 2 2.5 3 3.5 4Frequency(GHz)

0

10

20

30

40

50

60

70

E_m

ax(d

BuV

/m)

EMI at 3mSolid line: 3D-FDTDDotted line: measurement

Reference board

9-cell LPC-EBG board

excited amplitude: 20mV

excited location: (45mm, 45mm)

PreAmp

Horn Antenna

Absorber

20mV

Spectrum Analyzer

Signal generator

3m

7m

Test Board

3m

Wooden Table

EMI eliminationEMI elimination —— LPCLPC--EBG structureEBG structure

48

EMC DL 200851

Port1

30mm

20mm

10mm

0.4mm

0.4mm

0.4mm

4.3rε =

(45mm, 49mm)

Port2

w=0.75mmPort1

30mm

20mm

10mm

0.4mm

0.4mm

0.4mm

4.3rε =

w=0.5mm

(45mm, 49mm)

Port2Port4

Port3

s=0.25mm

MEO=363mV MEW=370ps MEO=471mV MEW=389ps

Reference board (with solid power/ground planes)

MEO=440mV MEW=388ps

Impact on SI Impact on SI —— Traces referring to EBG planesTraces referring to EBG planes

49

Tzong-Lin Wu, Yen-Hui Lin, Ting-Kuang Wang, Chien-Chung Wang, and Sin-Ting Chen, “Electromagnetic Bandgap Power/Ground Planes for Wideband Suppression of Ground Bounce Noise and Radiated Emission in High-speed Circuits,”

IEEE Transactions on Microwave Theory and Techniques, vol. 53, No. 9, pp. 2935 -

2942, Sept. 2005

EMC DL 200852

LL--bridged EBG Power Planebridged EBG Power Plane

L-bridged EBG board

Power plane

h = 0.4 mm

Ground plane

Substrate

b = 9 cm

a = 9 cm

Reference board

Power plane

Ground plane

Substrate

h = 0.4 mm

a = 9 cm

b = 9 cm

Tzong Lin Wu, Yen-Hui Lin and Ting-Kuang Wang, “A Novel Power Plane with super-Wideband Elimination of Ground Bounce Noise on High Speed Circuits,”

IEEE Microwave and Wireless Components Letters, Vol. 15, No. 3, pp. 174-176, Mar. 2005

EMC DL 200853

LL--bridged EBG geometrical parametersbridged EBG geometrical parameters

Power plane

Ground plane90mm x 90mm x 0.4mm

port1

port2

90 mm

90 mm

Unit Cell

g3

w

l

a

g2

a = 30 mm

w = 6.65 mm

g1 = 0.1 mm

g2 = 0.2 mm

g3 = 0.75 mm

l = 15.2 mm

EMC DL 200854

Wideband suppressionWideband suppression

0 1 2 3 4 5 6Frequency(GHz)

-100

-80

-60

-40

-20

0S 2

1(dB

)

FDTDFEMMeasurement

reference

L-bridged

EMC DL 200855

EMI performanceEMI performance

0.05 0.55 1.05 1.55 2.05 2.55Frequency (GHz)

5

10

15

20

25

30

35

40

45

50

Ez a

t 3m

(dB

uv/m

)

MeasurementreferenceL-bridged

EMC DL 200856

EMS measurement setupEMS measurement setup

According to IEC61000-4-3

Modulation:CW

Frequency Range:80 MHz ~ 3 GHz

Dwell time:1 sec

Frequency step:2%

Electric field intensity:3 V/m

Hung-Chun Kuo

Sin-Ting Chen

Tzong-Lin Wu

, “Improving the Radiated Immunity of the Strip-Lines Using a Novel Hybrid EBG Structure“, IEEE 15th Topical Meeting on Electrical Performance of Electronic Packaging

(EPEP), Scottsdale, AZ, USA, 2006

EMC DL 200857

EMS frequencyEMS frequency--domain responsedomain response

0 0.5 1 1.5 2 2.5 3Frequency(GHz)

0

2

4

6

8

10

12

14m

V

solid line: simulationdash line: measurement

Reference boardEBG board

EMC DL 200858

Photonic Crystal Power Layer (PCPL)Photonic Crystal Power Layer (PCPL)

Multilayer PCB substrateMultilayer PCB substrate

Tzong-Lin Wu and Sin-Ting Chen, “An Electromagnetic Crystal Power Substrate with Efficient Suppression of Power/Ground Plane Noise on High-speed Circuits,”

IEEE Microwave and Wireless Components Letters, VOL. 16, NO. 7, Page(s):413 -

415, Jun. 2006

EMC DL 200859

Square latticeSquare lattice

The geometry of the PCPLThe geometry of the PCPL

HighHigh--DK materialDK material

HighHigh--DK material DK material

εεrr =110=110

Q=1003 (f = 7GHz)Q=1003 (f = 7GHz)

EMC DL 200860

Dispersion diagram for the PCPLDispersion diagram for the PCPL

In this diagram, the In this diagram, the bandgapbandgap is represented by frequency range in which there is no is represented by frequency range in which there is no propagating mode for any propagation vectors.propagating mode for any propagation vectors.

The dots The dots ---- FDTD methodFDTD methodThe solid lines The solid lines ---- MIT photonic band tool MIT photonic band tool 0

1

2

3

4

5

6

7

8

9

Freq

uenc

y (G

Hz)

Γ ΓM XSLSL--PCPLPCPL

EMC DL 200861

0 1 2 3 4 5 6 7 8Frequency(GHz)

-120

-100

-80

-60

-40

-20

0

S 21(

dB)

simulationmeasurement

reference board

SL-PCPL

Ceff

P/GBN suppressionP/GBN suppression –– Frequency domainFrequency domain

1 0(1 )

10.348

716pF

eff r r r r

eff

eff

A A

C

ε ε ε

ε

= + −

=

=

Bandgaps

EMC DL 200862

0 0.2 0.4 0.6 0.8 1Time (ns)

-200

-150

-100

-50

0

50

100

150

200

mv

0 0.2 0.4 0.6 0.8 1Time (ns)

-200

-150

-100

-50

0

50

100

150

200

mv

Reference boardSL-PCPL

The waveform of the excitation sourceThe waveform of the excitation source10Gbps and amplitude10Gbps and amplitude ±±125 125 mVmV

Square latticeSquare lattice

171.2 mV

16.1 mV

SSN can be reduced about 91%

P/GBN suppressionP/GBN suppression –– Time domainTime domain

EMC DL 200863

Signal Integrity PerformanceSignal Integrity Performance

2.33rε =

0.4m m

0.8m m

0.4m m

P ort 1W = 1.183m mP ort 2

S q u are lattice ortrian gu lar lattice

Input signal : Input signal :

2299--1 pseudo random bit sequence (PRBS), 1 pseudo random bit sequence (PRBS), nonreturnnonreturn to zero (NRZ), coded at 10GHz. to zero (NRZ), coded at 10GHz.

Bit rate : 10 Bit rate : 10 GbpsGbps

Amplitude : 500 Amplitude : 500 mvmv

Edge rate : 35 Edge rate : 35 psps

EMC DL 200864

Eye Pattern Simulation (TLEye Pattern Simulation (TL--PCPL)PCPL)

MEO = 292 mV, MEW = 85 MEO = 292 mV, MEW = 85 pspsMEO = 245 mV, MEW = 72 MEO = 245 mV, MEW = 72 psps

MEO MEO Maximum Eye OpenMaximum Eye Open

MEW MEW Maximum Eye WidthMaximum Eye Width

PCPLRef brd

EMC DL 200865

1 2 3 4 5 6 7 8Frequency (GHz)

40

50

60

70

80

90

100

110

EMI (

dBuv

/m)

reference board

SL-PCPL

measurementsimulation

EMI eliminationEMI elimination —— PCPL structurePCPL structure

At the frequency range of the At the frequency range of the bandgapbandgap, the radiation resulted from the SSN is significantly , the radiation resulted from the SSN is significantly suppressed with over 30dB reduction.suppressed with over 30dB reduction.

Bandgap

EMC DL 200866

0 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4 0.45r/a

0.05

0.1

0.15

0.2

0.25

0.3

0.35

0.4

Freq

uenc

y (£

sa/2

£kC

)

Gap map for PCPL structureGap map for PCPL structure

Area of maximum bandwidth for the first bandgap

The substrate almost filled with high-DK rods

For the application, we need the broad stopband at low frequency. Therefore, there is design tradeoff between the bandwidth and the center frequency for the PCPL structure.

Tzong-Lin Wu, Sin-Ting Chen, “A photonic crystal power/ground layer for eliminating simultaneously switching noise in high-speed circuit,”IEEE Transactions on Microwave Theory and Techniques, VOL. 54, NO. 8, pp. 3398 -

3406, Sept. 2006

EMC DL 200867

Gap map of the PCPL structure for different dielectric Gap map of the PCPL structure for different dielectric constantconstant

• The bandgap appears at smaller r/a for larger dielectric constant.• The center frequency of the band at the same r/a is higher for the

smaller dielectric constant.

0 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4 0.45r/a

0.05

0.1

0.15

0.2

0.25

0.3

0.35

0.4Fr

eque

ncy

(£sa

/2£k

C)

K=150K=150 K=110K=110 K=50K=50

0 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4 0.45r/a

0.05

0.1

0.15

0.2

0.25

0.3

0.35

0.4Fr

eque

ncy

(£sa

/2£k

C)

0 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4 0.45r/a

0.05

0.1

0.15

0.2

0.25

0.3

0.35

0.4Fr

eque

ncy

(£sa

/2£k

C)

EMC DL 200868

ConclusionConclusion

• P/GBN is one of the key issues for designing high-speed digital circuit with good signal integrity (SI) and EMC performance.

• Several approaches to eliminate the P/GBN on the power delivery systems are investigated by both numerical simulations and experimental measurement.