JRA3 I nstitute of P hysics ASCR Prague

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Munich, 18 Oct 200 6 J. Cvach, annual JRA3 1 JRA3 Institute of Physics ASCR Prague 1. ECAL, VFCAL (V. Vrba) 2. HCAL (J. Cvach) 3. Exchange in NA2 (travels 8.5 k€)

description

JRA3 I nstitute of P hysics ASCR Prague. ECAL, V FCAL (V. Vrba) HCAL (J. Cvach) Exchange in NA2 (travels 8 .5 k€ ). Tasks in EUDET & budget w/o overheads. Si sensor development for ECAL, VFCAL Monitoring system for HCAL Consumables - 81.7 k€ - PowerPoint PPT Presentation

Transcript of JRA3 I nstitute of P hysics ASCR Prague

Page 1: JRA3 I nstitute of  P hysics  ASCR Prague

Munich, 18 Oct 2006 J. Cvach, annual JRA3 1

JRA3Institute of Physics ASCR Prague

1. ECAL, VFCAL (V. Vrba)2. HCAL (J. Cvach)3. Exchange in NA2 (travels 8.5 k€)

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Tasks in EUDET & budget w/o overheads

Si sensor development for ECAL, VFCAL Monitoring system for HCAL Consumables - 81.7 k€

Si sensor development + production (34.6 k€) VME test stand (25742 €), calibration electronics

(16.5 k€) computing (4.9 k€)

Personnel - 13 k€ for PhD students, young postdocs Travels 4 k€ Contribution from the Institute

Permanent staff – 67 ppm Travels (6.7 k€)

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Munich, 18 Oct 2006 Václav Vrba, SI ECAL Sensor Status 2006

Si Sensors for ECAL (V. Vrba)

Sensor ECAL prototype production: 2006: in four production runs of Si pad sensors at ON

Semiconductor we obtained 72 good fully tested wafers which have been integrated into ECAL prototype

January-July 2006: wafers delivered to Ecole Polytechnique 7 ECAL layers equipped with ON Semiconductor wafers

end of 2006: additional fabrication run at ON Semiconductor is planned to produce about 60 wafers for the full instrumentation for 2007 test beam.

DET1

DET2

DET3

DET4

DET5

DET6

DET7

DET8

DET9

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Munich, 18 Oct 2006 Václav Vrba, ECAL status

I-V curves on pad arrays

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Munich, 18 Oct 2006 5

Reverse current long term stability

2 weeks

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Munich, 18 Oct 2006 V. Vrba, ECAL status 6

Sensor testing @ Institute of Physics AS CR

Test laboratory for measurement of Si sensors

Senzors from ON Semiconductor, Czech Republic

EUDET tasks• Design studies for finer

granularity (5x5 mm2) of Si sensors are under way

• Possibility to use 6” wafers is also investigated

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HCAL - Calibration + Monitoring Board system (I. Polák)

CMB provides calibrated UV flashes to the scintillator tiles optical feedback via PIN photodiode sensing of temperature at scintillator planes and

on CMB connection via CANbus to the detector Slow

Control monitoring of temperature, voltages, … setting enable, amplitude, pulse width of each

LED

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Calibration and monitoring board II

Calibration & monitoring board – to deliver LED light dynamic range 0.5 – 100 MIP

Functions LED control

Amplitude (via DAQ, CANbus, standalone)

Pulse width: 5 ns Enable

PIN diode readout Temp monitoring

Measurement of nonlinearity LED intensity varied by DAQ Intensity measured by PIN Absolute calib from linear part

3 pulsegenerators

12 PIN ampli

control

1V

10ns

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Calibrating 18 SiPM with one LED

Gain calibration for a matrix of 18 SiPM connected to the same LED

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Munich, 18 Oct 2006 J. Cvach, annual JRA3 10

HCAL plane

CMB

T

T

T

T

T

T

T

CAN (ADC, Enable Pulser,

DAC)

Polak, Janata,(Karstensen) Gadow

T

T

Goettlicher,Reinecke

T

T

HBAB_TOP

HBAB_BOT

VFECMB

CMB boards during CERN tests

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VME stand – durable equipment financed from the EUDET project Replacement of old

CAMAC and NIM modules Measurements of signals

from photodetectors (PM, APD, …)

9 pieces of APDs, Hamamatsu S 8664-s

12 bit QDC, 16 chan., V792N

Controller V2718 connected by optical cable to PC

Reading, control with Labview

4-channel power supply N472 GPIB, serial busScope TDS 5104

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Stand is operational – a EUDET milestone

Labview chart of signal processing LED 4 fibres read by APD +QDC

Ivo pulser + V993 dual timer – 1 kHz

What we gained? Larger dynamic range

10bit12bit QDC Sophisticated system

(new, VME) Short term usage: long

term tests of CMB

Linearity dependenceof 4 channels (APDs)to the increase (Vcalib)of the LED light

Initia

lisatio

n QD

C

readin

g

Inp

ut

bu

ffer

deco

din

g

Jan Smolík

J. Zálešák

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Future stand use Long term tests and better

understanding of CMB Use a CMB board with (8 LED & PIN

diodes) + 8 APDs 16 QDC chan.

APD APD

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Our immediate tasks in EUDET Production of Si wafers for ECAL module successfully integrated

into the prototype and operated in the test beam Design studies for finer granularity (5x5 mm2) of Si sensors are

under way; Possibility of the use of 6” wafers is investigated;

Students and young physicist (Petr Mikes, Michal Marcisovsky, Pavel Ruzicka, Miroslav Havranek) are involved in the project activities participating in the laboratory sensor evaluation, test beam runs at DESY and CERN, data analysis, simulation etc. They also participate in regular collaboration meetings.

HCAL – calibration electronics 2006: 40 (double) boards produced, 23 installed in the prototype,

one half financed from EUDET Investigations of functionality and long term stability of CMB

Participation in tests and data analysis

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Resources EUDET Main contribution from EUDET

- consumables Upper table – our JRA3

spending profile by tasks Lower table – spending

according to categories

year Perm staff

Temp staff

Consum ables

Travel Durable equipm

Over-heads

Total (€)

Install ment

2006 3256 4308 15 356 4742 2860 6104 36 625 36 740

2007 8581

2008 8581

2009 5720

total 25742

year HCAL ECAL VFCAL

2006 12 k€ 6 k€ 2 k€

2007 12 6 5

2008 14 7 5

2009 6,55 1,9 4,15