CONTENTS

CHAPTER I INTRODUCTION

1.1 INTRODUCTION TO SYSTEM-ON-CHIP (SOC)

1.2 LINEAR FEEDBACK SHIFT REGISTERS (LFSR )

1.3 INTRODUCTION TO BIST

1.4 INTRODUCTION TO VLSI

1.4.1 OVERVIEW

1.4.2 WHAT IS VLSI?

1.4.3APPLICATIONS

1.4.4 ASIC

CHAPTER II SOC BACKGROUND

2.1 SOC

2.2 SOC Attributes

2.3 SOC Design Tools and Methodology

2.4 SOC Power Consumption

2.5 SOC Manufacturing Processes

2.6 SOC Test and Assembly

CHAPTER III SOC TEST

3.1 SOC TEST

3.2 SOC Test Tools and Methodology

3.3 Test Approaches (External and Conventional DFT)

3.4 Built-In-Self-Test (BIST)

3.5 BIST Pattern Generation Using LFSR

3.6 LFSR

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CHAPTER IV LOW POWER PATTERNGENERATION

4.1 Idea Behind Low Power Test Pattern Generation

4.2 A Technique to Produce Low Power

Pattern for BIST

4.3 Benchmark Design Circuits

4.4 Braun Array multiplier

4.5 Working of a project

CHAPTER V IMPLEMENTATION AND RESULTS

5.1 Simulation Using Standard LFSR Pattern

5.2 Simulation Using LP-LFSR

5.3 Power Consumption Using standard LFSR

5.4 Power Consumption Using LP-LFSR

5.5 Power Consumption Comparison

(Standard LFSR versus LP-LFSR)

5.6 Summary

CHAPTER VI CONCLUSION AND FUTURE WORK

6.1 Conclusion

6.2 Future work

BIBLIOGRAPHY

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