IEEE SCC21 1547 Standards Development - IEEE-SA...
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IEEE SCC21 Standards Development Study Group Meeting Minutes for Amendment 1 to IEEE Std 1547.1-2005 (test procedures for equipment interconnecting distributed resources with electric power systems) August 15 – 16, 2013 (San Francisco CA) A study group meeting on potential changes to IEEE Std 1547.1 (test procedures) was held for the purpose of discussing what changes to IEEE Std 1547.1 might be necessary in relation to IEEE Std P1547a Amendment 1 to 1547 (then at ballot). The attendees (Attachment A ) were welcomed by Tom Basso SCC21 Vice Chair, Dick DeBlasio IEEE SCC21 Chair, and Jim Daley Chair of IEEE Std 1547.1-2005 (and co-chair of P1547a). Tom presented the agenda and IEEE introductory slides (Attachment B ) with further information on 1547 background presented by Dick. He focused on IEEE SCC21 activities and plan for future full revision of the IEEE 1547. He mentioned that a meeting on 1547 full revision would be in IEEE headquarters area (Piscataway/New Brunswick NJ) early December 2013. On answering a query, Dick mentioned that the December meeting will be open (as usual) to everyone including ISOs/RTOs, NERC, FERC, and all individuals interested in distributed energy resources interconnecting with the grid. Jim Daley gave a presentation some background on IEEE 1547.1. He also discussed the status of the P1547a which was under ballot. He mentioned that at the June SCC21 testing workshop held the day before the June P1547a meeting, the participants established the IEEE 1547.1a proposed PAR for amendment 1 to IEEE 1547.1 and that PAR was submitted to IEEE Standards Board (subsequently approved). Jim opened the discussion on IEEE 1547.1a concepts by presenting slides for consideration (Attachment C). In his early slides Jim stated he challenged the group that no changes would be required for IEEE 1547.1 testing of response to area EPS abnormal voltage and frequency. This blanket statement drew pointed disagreement from various participants. However, Jim in later slide showed he accounted for such concerns by considering draft test procedures first for voltage regulation and then look back into the voltage and frequency tests in relation to the draft tests and concerns raised during the establishment of the voltage regulation draft test(s). P1547.1a meeting Aug 15 – 16, 2013 Notes Page 1
Transcript of IEEE SCC21 1547 Standards Development - IEEE-SA...
IEEE SCC21 Standards DevelopmentStudy Group Meeting Minutes for Amendment 1 to
IEEE Std 1547.1-2005 (test procedures for equipment interconnecting distributed resources with electric power systems)
August 15 – 16, 2013 (San Francisco CA)
A study group meeting on potential changes to IEEE Std 1547.1 (test procedures) was held for the purpose of discussing what changes to IEEE Std 1547.1 might be necessary in relation to IEEE Std P1547a Amendment 1 to 1547 (then at ballot).
The attendees (Attachment A) were welcomed by Tom Basso SCC21 Vice Chair, Dick DeBlasio IEEE SCC21 Chair, and Jim Daley Chair of IEEE Std 1547.1-2005 (and co-chair of P1547a). Tom presented the agenda and IEEE introductory slides (Attachment B) with further information on 1547 background presented by Dick. He focused on IEEE SCC21 activities and plan for future full revision of the IEEE 1547. He mentioned that a meeting on 1547 full revision would be in IEEE headquarters area (Piscataway/New Brunswick NJ) early December 2013. On answering a query, Dick mentioned that the December meeting will be open (as usual) to everyone including ISOs/RTOs, NERC, FERC, and all individuals interested in distributed energy resources interconnecting with the grid.
Jim Daley gave a presentation some background on IEEE 1547.1. He also discussed the status of the P1547a which was under ballot. He mentioned that at the June SCC21 testing workshop held the day before the June P1547a meeting, the participants established the IEEE 1547.1a proposed PAR for amendment 1 to IEEE 1547.1 and that PAR was submitted to IEEE Standards Board (subsequently approved).
Jim opened the discussion on IEEE 1547.1a concepts by presenting slides for consideration (Attachment C). In his early slides Jim stated he challenged the group that no changes would be required for IEEE 1547.1 testing of response to area EPS abnormal voltage and frequency. This blanket statement drew pointed disagreement from various participants. However, Jim in later slide showed he accounted for such concerns by considering draft test procedures first for voltage regulation and then look back into the voltage and frequency tests in relation to the draft tests and concerns raised during the establishment of the voltage regulation draft test(s).
Specifically for 1547.1a testing response to abnormal voltage and frequency, it was stated for example that volt-VAR type of advanced functions could affect the operations of abnormal voltage and/or frequency trip and need to be considered in the abnormal voltage/frequency trip tests.
Additionally concerns were raised as to whether or not testing for unintentional islanding might be impacted by the new voltage and frequency IEEE 1547a revisions. Though Jim stated we would provide such concerns to the group on full revision of IEEE 1547 and IEEE 1547.1, Jim stated his position that he was not yet convinced that IEEE 1547.1a would require revisions to the IEEE 1547.1 unintentional islanding test procedures. In contrast, various participants thought it would be necessary and proper to at least consider islanding test revisions for IEEE 1547.1a. Participants didn’t have definitive results/experience to cite one way or another. .
Discussion then addressed defining draft test procedures for voltage regulation testing, initially focusing on “Type (Design) Tests.” Various topics were generally discussed such as steady-state versus dynamic testing, different volt-VAR modes for voltage regulation, fixed VAR/power factor operation, autonomous
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operation, Information-Communications Technology (ICT) based operation of the advanced inverters, intentional delays, dead bands, hysteresis, and response time.
A pre-publication draft report on inverter interoperability testing was brought up as an example for consideration [Test Protocol for Advanced Inverter Interoperability Functions - V22, Sandia National Labs]. Jim then displayed the current IEEE 1547.1 standard to show the group the format and style as a model for establishing the draft procedures for the P1547.1a amendment.
A participant, Aminul Huque from EPRI, volunteered and drafted a “strawman” version of a test procedure for fixed reactive power operation, building upon the Sandia report and drafted into the 1547.1 style. Once completed, the strawman draft was revised with the group and further formatted into the IEEE 1547.1 style. (Attachment D – Initial Draft Type-Test Procedures for Voltage Regulation).
During discussions, the group debated specifics for that voltage regulation test procedure as well as additional topics that are actually in other parts of the IEEE 1547.1 standard, such as EPS simulator requirements, error margins, the number of times each test needs to be repeated, etc. Various sections of the IEEE 1547.1 document were referred back to, such as clause 4 and Annex A. Those sections provide more detail to clarify some of the topics of discussions.
Discussions on day 2 started with the second method of voltage regulation through volt-VAR profiles. Mischa Steurer from Florida State University volunteered and drafted a “strawman” version of the test procedures for the volt-VAR advanced functions. Detailed discussions followed on each of the steps drafted and revisions made to the initial version (see Attachment D). Some discussion points addressed testing for input power variation, e.g., which would especially be required in consideration for PV system inverter output that varies with irradiance changes and temperature. In the existing IEEE 1547.1, some tests are conducted at various power levels.
It was also discussed that the test procedures need to be generic enough to accommodate different technologies but at the same time detailed enough to test manufacturer specified volt-VAR curves such as a curve with deadband and/or hysteresis. Various other topics were discussed such as how to balance “over-testing” that would add complexity/cost versus what would be technically appropriate; one phase versus 3-phase testing; and, considerations of the certification rules in differing jurisdictions (e.g., Europe versus USA). A number of these concerns are similarly already addressed in IEEE 1547.1.
In closing, Jim told that the participants the above two basic draft test procedures developed during the meeting would be available at the IEEE 1547.1a website and would be requested to be commented on using comment form. Also it was announced that the next meeting would continue on developing test procedures for other modes of volt-VAR operation (such as ICT based). Also Jim reminded everyone to reread IEEE 1547.1 especially to consider if their concerns are already covered elsewhere in 1547.1.
Next actions Next meeting would likely be early December in NJ near IEEE headquarters. The listserv will be used to solicit review of these minutes Attachment D materials developed and
solicit volunteers for additional draft test development.
The meeting was adjourned around 11:15 am.
Respectfully submitted,
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Tom Basso, SCC21 Vice Chair and Secretary, Dick DeBlasio, SCC21 Chair, and Jim Daley IEEE Std 1547.1 Chair.
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Attachment A – Attendees
Last Name First Name AffiliationArjona Daniel Idaho PowerBasso Tom National Renewable Energy Lab (NREL)Bravo Richard Southern CA Edison (SCE)Brigandi Michael NSTAR Electric MACeglia Matthew IEEECleveland Frances Xanthus Consulting InternationalCoddington Michael National Renewable Energy Lab (NREL)Connelly Nancy Duke EnergyDaley James M Facilities Electrical Consulting ServicesDiong Mamadou Dominion Virginia PowerEnayati Babak National GridErnst Bernhard SMA Solar Technology AGFurukawa Motoko TMEICHamon Marvin Hamon Engineering IncHironori Iwasaki Mitsubishi Research InstituteHuque Mohammad Aminul Electric Power Research Institute (EPRI)Igbokwe Chinedu Solectria Renewables LLCInzunza Ruben TMEICIRIE Hiroshi Mitsubishi Research InstituteJohnson Gerald Basler Electric CompanyKazuto Maeda NEDO/JapanLydic Brian Fronius USAMazy Anthony California Public Utilities CommissionNunneley John SunSpec AllianceRazon Alvin DOE SunshotSaint Bob NRECASalas Roger Southern CA Edison (SCE)Schoder Karl CAPS @ FSUScroggins Rich Cummins Power GenerationSheehan Michael IRECSiira Mark ComRent InternationalSteurer Mischa Florida State UniversityWhite Robert Power-One Inc.Woodcock Gordon KACO new energyZgonena Tim UL LLC
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Attachment B – Introductory Slides and Agenda
Slide 1
Slide 2
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Slide 3
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Slide 5
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Slide 7
Slide 8
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Slide 9
Slide 10
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Slide 11
Slide 12
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Slide 13
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Attachment C – 1547.1a Amendment Considerations Related to P1547a
Slide 1
Slide 2
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Slide 3
Slide 4
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Slide 5
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Slide 7
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Slide 9
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Slide 11
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Slide 13
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Slide 15
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Slide 17
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Slide 19
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Attachment D – Initial Draft Test Procedures
P1547.1a meeting Aug 15 to 16, 2013: onsite notes related to draft test procedures based on P1547a Amendment 1
IEEE Std P1547a (voltage regulation draft text follows)
4.1.1 Voltage regulation (P1547a Amendment 1 draft wording) Coordination with and approval of, the area EPS and DR operators, shall be required for the DR to actively participate to regulate the voltage by changes of real and reactive power. The DR shall not cause the Area EPS service voltage at other Local EPSs to go outside the requirements of ANSI C84.1-2011, Range A. --------------------------- ----------------------------------
P1547.1a discussion/drafting development guidance established onsite. - Review IEEE Std 1547.1 especially clause 5, and clause 4 and Annex A. - Draft procedures should follow IEEE Std 1547.1 format (style will be harmonized to 1547.1
in future): Test title; Purpose; Procedure; Requirements; Criteria. - Please capitalize only the first word in a sentence and in headings; acronyms written as all
caps.
EUT -- equipment under test
Brainstorming topics – not for final P1547.1a draft: - Consider need for both steady state test and a dynamic test. - Characteristics required: ranges of and default values (default typically =
manufacturer setting if otherwise not mandated)- Example characteristics of concern: current, Voltage, VA, pf, VAR, Ramp rates?
More? And characteristic times, e.g., intentional delay, hysteresis, dead bands, response time.
-------------------------- -------------------------------- P1547.1 Clause 5 initial draft text follows as per working group discussion August 15-16, 2013 -- reformatting/numbering introduced after the meeting.
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P1547.1 a 5. Type tests … 5.13 Voltage regulation The manufacturer shall specify the response characteristics of the EUT to respond to the requirement to provide real and reactive power.
[The following categories will be redrafted as introductory text under 5.13].
Categories of voltage regulation testing follow. Each category is applicable to the three types of DR stated in 1547: static power inverters/converters (aka inverter-based), induction machines, and synchronous machines.
1. Where the EUT responds to variations in voltage the manufacturer shall specify the response characteristics.
2. Where the EUT responds to input stimuli the manufacturer shall specify the response characteristics. 3. Where the EUT responds to communicated settings the manufacturer shall specify the protocol, means of communications and the response characteristics.
4. Where the EUT responds to a time schedule the manufacturer shall specify the response characteristics.
5.13.1 Voltage regulation test where the EUT responds to variations in voltage the manufacturer shall specify the response characteristics.
5.13.1.1 Purpose.
The purpose is to test the response of the EUT to changes in voltage magnitude as provided by manufacturer’s response characteristics. {If multiple characteristics are available, this test shall be performed with each of the available settings. Record applicable settings} 5.13.1.2 Procedure.
This procedure uses the voltage ramp rates defined in 1547.1 Annex A and a series of test voltage magnitudes sufficient to reproduce the manufacturer’s response characteristics (including hysteresis, and dead band) with an accuracy to evaluate the manufacturer’s accuracy.
1. Connect the EUT according to the instructions and specifications provided by the manufacturer.
2. Set all source parameters to the nominal operating conditions for the EUT.3. Set (and verify) all EUT parameters to the prescribed operating settings4. Ramp voltage down from the present voltage set point to the next using the ramp rate
defined in 1547.1 Annex A. Record the time domain response of real and reactive power.
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5. When EUT real and reactive power has reached steady state record values6. Repeat 4 & 5 until the lowest operating voltage of the EUT is reached.7. Ramp voltage up from the present voltage set point to the next using the ramp rate defined
in Annex A. Record the time domain response of the real and reactive power. 8. When EUT real and reactive power has reached steady state record values9. Repeat 7 & 8 until the highest operating voltage of the EUT is reached.10. Repeat 4 – 9 until 5 full sweeps through the entire voltage range have been completed.
Repeat test sequence 3 through 10 at power levels of the EUT specified by the manufacturer.
5.13.1.4 Requirements
5.13.1.5 Criteria
5.13.2 Voltage regulation test where the EUT responds to input stimuli the manufacturer shall specify the response characteristics.
5.13.2.1 Purpose. The purpose of this test is to verify the EUT changes its output of real and reactive power in response to voltage variations as specified by the manufacturer.
5.13.2.2 Procedure {need to get description of acronyms} Set the EUT mode to fixed VAR {consider separate procedure for each mode} Set the “EPS test source to 1 pu” [then at manufacturer min V pu and manufacturer max V pu operating conditions … e.g., 0.9 1.0 1.1] a) Connect the EUT according to the instructions and specifications provided by the manufacturer. Where the EUT requires a separate test input source to conduct this test, that source shall be capable of supplying 150% of the input required to evaluate the EUT in this test regimen.b) Set all source parameters to the nominal operating conditions for the EUT.c) Set (or verify) all EUT parameters to the nominal operating settings.d) Set the EUT ac output power to nominal/rated value.e) Set (or command) EUT to the reactive power to +Qmax_Pnom.f) Record the active and reactive power generated by the EUT.g) Plot the response in the specified parameter versus time.h) Set (or command) EUT target reactive power to zero.
i) Repeat steps d) through g) four times for a total of five tests.
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Table 5.13.2—Table 1 “Title”
Test Scenario #1 #2 #3 #4 ? ?Reactive Power
+Qmax_Pnom
-Qmax_Pnom +Qmax -Qmax
Real Power Pnom Pnom Pmax_+Qmax
Pmax_-Qmax
+Qmax_Pnom:
Maximum +ve reactive var capability of EUT at nominal active power settings
-Qmax_Pnom: Maximum -ve reactive var capability of EUT at nominal active power settings
Pmax_+Qmax Maximum active power capability of EUT while generating +Qmax reactive var
Pmax_-Qmax Maximum active power capability of EUT while generating -Qmax reactive var
Pnom nominal power
5.13.2.3 Requirements
5.13.2.4 Criteria
5.13.3 Voltage regulation test where the EUT responds to communicated settings the manufacturer shall specify the protocol, means of communications and the response characteristics.
5.13.3.1 Purpose The purpose of this test is to verify the EUT establishes its output of real and reactive power in response to communicated commands as specified by the manufacturer.
5.13.3.2 Procedure Manufacturer shall specify communication protocols Manufacturer shall specify the communications media Manufacturer shall … specify the data characteristics (times, throughput, synchronicity, etc. ). Manufacturer shall specify the communication networks. Manufacturer shall specify … how to change the settings.
5.13.3.3 Requirements
5.13.3.4 Criteria
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5.13.4 Voltage regulation test where the EUT responds to a time schedule the manufacturer shall specify the response characteristics.
5.13.4.1 Purpose
The purpose of this test is to verify the EUT establishes its output of real and reactive power in response to a time schedule as specified by the manufacturer.
5.13.4.2 Procedure
5.13.4.3 Requirements
5.13.4.4 Criteria ----------------------------- -----------------------
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