European Linear Collider Workshop ECFA LC2013 BDS+MDI IPBSM Beam Size Measurement & Performance...
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Transcript of European Linear Collider Workshop ECFA LC2013 BDS+MDI IPBSM Beam Size Measurement & Performance...
European Linear Collider Workshop ECFA LC2013BDS+MDI
IPBSMBeam Size Measurement & Performance Evaluation
May 29 , 2013DESY
ECFA LC 2013
Jacqueline Yan, S. Komamiya, M. Oroku, Y. Yamaguchi
( The University of Tokyo, Graduate School of Science )T. Yamanaka, Y. Kamiya, T. Suehara ( The University of Tokyo, ICEPP )
T.Okugi, T.Terunuma, T.Tauchi, T.Naito, K.Kubo, S.Kuroda, S.Araki, J.Urakawa (KEK)
113/05/29
Introduction
Measurement SchemeMeasurement SchemeExpected PerformanceExpected PerformanceRole in Beam TuningRole in Beam Tuning
13/05/29ECFA LC 2013
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ATF2 : Linear Collider FFS test facility@KEK
Role of IPBSM (Shintake Monitor) at ATF2Role of IPBSM (Shintake Monitor) at ATF2
IPBSM is crucial for achieving ATF2 ‘s Goal 1 !!focus σy to design 37 nm verify Local Chromaticity Correction
FFS
Ultra-focused vertical beam size at IP !! Crucial for high luminosity
IPBSM
OutlineOutline Beam Time Status Beam Time Status Dec 2012 Dec 2012 Spring 2013Spring 2013
• IPBSM PerformanceIPBSM Performance• Error studiesError studies• Hardware UpgradesHardware Upgrades
Summary Summary & Goals & Goals and Plansand Plans
IntroductionIntroduction
13/04/04ATFII Review
3
ATF : 1.28 GeV LINAC , DR high quality e- beam with extremely small normalized vertical emittance γεy
ATF2 Goal 2: O(nm) beam trajectory stabilization
Compton scattered photons detected downstream
Collision of e- beamwith laser fringe
upper, lower laser paths cross at IP
form Interference fringes
Piezo
• use laser interference fringes as target for e- beamOnly device able to measure σy < 100 nm !!
• Crucial for ATF2 beam tuning and realization of ILC
Measurement SchemeMeasurement Scheme
ECFA LC 2013
e- beam safely
dumped
Split into upper/lower paths phase scan by piezo stage
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4
Detector measures signal Modulation Depth “M”
N +
N -
[rad]
[rad]
ECFA LC 2013
measurable range determined by fringe pitch
depend on crossing angle θ (and λ )
N: no. of Compton photonsConvolution between e- beam profile and fringe intensity
)2/sin(2
ykd
M
d
kNN
NN
y
yy
)cos(ln2
2
)(2exp)cos( 2
M
Focused Beam : large M
Dilluted Beam : small M
Small σy
Large σy
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Crossing angle θ
174° 30° 8° 2°
Fringe pitch 266 nm 1.03 μm 3.81 μm 15.2 μm
Lower limit 20 nm 80 nm 350 nm 1.2 μm
Upper limit 110 nm 400 nm 1.4 μm 6 μm
)2/sin(2
ykd
M
dy
)cos(ln2
2
Measures σy* = 20 nm 〜 few μm with < 10% resolution
Expected PerformanceExpected Performance
select appropriate mode according to beam focusing
ECFA LC 2013
σσyy and M and M for each θ modefor each θ mode
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174 deg. 30 deg.
2 - 8 deg
Crossing angle continuously adjustable by prism 13/05/29
ECFA LC 2013 7
Vertical table Vertical table 1.7 (H) x 1.6 (V) m
• InterferometerInterferometer• Phase control (piezo stage) Phase control (piezo stage)
path for each θ mode ( auto-stages + mirror actuators
)
beam pipe
Laser transported to IP
optical delay
half mirror
transverse : laser wire scan
precise position alignment by remote control
ECFA LC 2013
Role of IPBSM in Beam TuningRole of IPBSM in Beam Tuning
13/05/298
beforehand …. Construct & confirm laser paths, timing alignment
Longitudinal : z scan
After all preparations ……….
continuously measure σy using fringe scans Feed back to multi-knob tuning
laser spot size σt,laser = 15 – 20 μm
Beam Time Status Beam Time Status
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12/20 : 1st success in M detection
at 174 deg mode
Beam time status in 2012
stable measurements of M 〜 0.55
Feb ; 30 deg mode commissioned ( 1st M detection on 2/17)
ECFA LC 2013
M = 0.52 ± 0.02 (stat) σy = 166.2 ± 6.7 (stat) [nm]
• 2 - 8 ° mode: clear contrast ( Mmeas ~ 0.9)• Prepared 174 deg mode commissioning
Suppress systematic errors Higher laser path stability / reliability
High M measured at 30 ° mode Contribute with stable operation to ATF2 beam focusing / tuning study
(10 x x*, 3 x y* optics)
Spring runSpring run
Major optics reform of 2012 summer
Winter runWinter run
Last 2 days in Dec runMeasured many times M = 0.15 – 0.25 ( correspond to σy 〜 70 – 82 nm )
Large step towards achieving ATF2 ‘s goal !! error studies ongoing aimed at deriving “true beamsize”
preliminary
preliminary
* IPBSM systematic errors uncorrected** under low e beam intensity ( 〜 1E9 e / bunch)
10 x βx* , 1 x βy*
By IPBSM group@KEK
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measured M over continuous reiteration of linear /nonlinear@ tuning knobs @ 174 ° mode
Beam time status in 2013 Spring
ECFA LC 2013
dedicated data for error studies under analysis
ex ) consecutive 10 fringe scans
preliminary
Time passed
measure M vs time after all conditions optimized
preliminary
Stable IPBSM performance major role in beam tuning
10 x x*, 1 x y*
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174 ° mode ”consistency scan”
moving towards goal of σy = 37 nm :higher IPBSM precision and stability & looser current limits of normal / skew sextupoles current
M 〜 0.306 ± 0.043 (RMS) correspond to σy 〜 65 nmBest record
from Okugi-san’s Fri operation meeting slides
Other studies using IPBSMOther studies using IPBSM
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Beam intensity scan
others: •Test various linear / nonlinear tuning knobs• IPBSM systematic error studies
“Reference Cavity scan” in high β region
(ex: 30 deg mode)
wakefield studies
Check linearity of BG levels in IPBSM detector Observe “steepness” of intensity dependence compare with other periods to test effects of orbit tuning and / or hardware improvement for wake suppression
(ex: 30 deg mode)beam intensity 5E9 / bunch
BG level
ex: spring 2012 : Adjust curvature of laser cavity mirrors
Aim:Suppress systematic error sourcesHigher alignment precision & reproducibility
Proved greatly effective in 2012 winter run
ECFA LC 2013
Optics reform of 2012 summer By IPBSM group@KEK
improvements details
alignment precision match focal point to IPInjection position / angle into lensRe-optimize expander / reducer
consistency , reproducibilitybefore / after mode switching
• focal point scan for all modes• CW laser + reference lines on new base plates• new IP target (screen monitor)
• θ mode switching technique {small linear stage + mirror actuators } now: independent for each mode (before: shared rotating stages)
balanced profiles suppress difference in path length & focal point
Tuning of main laser
Aim for a more Gaussian profile
by Spectra Physics
Reform laser profile and spatial coherence (adjust YAG rod & cavity mirrors)
Exchange flash lamp seeding laser tuning ( oscillation stability)
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ECFA LC 2013
Small linear stage+ mirror actuator
Firm lens holders
just after injection onto vertical table
Confirm fine alignment using CW laser and transparent IP target
check positioning of lens, mirror, prism
prism CW laser spot
inside IP chamber
laser waist &
crossing point
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Performance Evaluation #1: Performance Evaluation #1: StabilityStability
Signal jitter sourcesSignal jitter sourcesphase drift / jitterphase drift / jitter
Laser timing & powerLaser timing & power
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Demonstration of stability in IPBSM operation Demonstration of stability in IPBSM operation : : signal Jittersignal Jitter
long term stable performance is maintained under various scan conditions “standard” Long range scans dedicated to error studies : just as stable (jitter is not increased) compared to usual scans
(beam & IPBSM conditions, analysis method kept consistent)
data range Comp sig jitter (@peak of fringe scans)
130314_155758 20 radNav = 10
21.1 %
130314_165737 20 radNav = 10
25.2 %
130314_163420 20 radNav = 20
24.3%
130314_163952 60 radNav = 10
25.4 %
130314_164840 60 radNav = 10
26.3 %
Usual scans immediately before & after
Comp Sig. jitter is quite consistent at generally 20 – 25 % (@peak of fringe scans)
Fine scanNav = 20 events at each phase step
Long range scans 60 rad(usually 20 rad)
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16Long scans from other periods show similar stability
preliminary
Signal jitter: 24.3 %(at peaks)
1st of 2 consecutive long range scans
Signal jitter: 25 %(at peaks)
2nd of 2 consecutive long range scans
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60 rad rangepreliminary S/N ~ 5.8
60 rad scans dedicated to 60 rad scans dedicated to error studyerror study
Stability is maintained for long range scans (fluctuation / drift e.g. BG, phase, timing, power, ect…)
consecutive fringe scans : consecutive fringe scans : drift < 70 mrad / min (drift < 70 mrad / min ( negligible) negligible)
Phase Drift
ECFA LC 2013
final set of scans on 3/8 : very stable final set of scans on 3/8 : very stable
(initial phase) (initial phase) vs (time)vs (time)
(initial phase) (initial phase) vs (time)vs (time)
Comp SignalComp Signal Jitter Jitter
BGBG jitterjitter
signal jitter derived directly signal jitter derived directly from actual fringe scans from actual fringe scans (peaks)(peaks) :: 20 – 25% 20 – 25%
ECFA LC 2013 13/05/29 18
*scaled by S/N
iCT monitor fluctuation
Relative beam –laser positionRelative beam –laser position
* Intrinsic CsI detector energy resolution (GEANT4 sim.)
detector energy resolution
Signal Jitter Sources
< 10%
under investigation
< 1 %
~ 3 %
6 - 7 % (monitored by PIN-PD signal)
< 5 % ICT monitor accuracy measured Comp sig energy normalized by beam intensity
varies with beam condition
Spring, 2013: 174 deg modecontribution to Sig Jitter ΔEsig / Esig, avg
Study of Signal FluctuationStudy of Signal Fluctuation
~ 1 % (from photo-diode)
Prepared offline veto for large timing, power jittered events
•hard to separate from other fluctuation sources hard to separate from other fluctuation sources (laser (laser pointing jitters, drifts, ect….)pointing jitters, drifts, ect….)• jitters can vary greatly over timejitters can vary greatly over time
Phase Jitter / Relative Position JitterPhase Jitter / Relative Position Jitter
Can’t push all fluctuation to phase jittersCan’t push all fluctuation to phase jitters
fitted energy jitters with contributions from statistics, timing, BG , and Δx
preliminary
take high statistics scans (Nav ~ 100) under optimized conditions for dedicated analysistake high statistics scans (Nav ~ 100) under optimized conditions for dedicated analysis
derive horizontal rel position jitter Δx using high statistic laserwire scan
if if Δy < 0.3 * σy Δy < 0.3 * σy (ATF2 beamline design)(ATF2 beamline design) CΔy > 90 % for σy* = 65 nmCΔy > 90 % for σy* = 65 nm
Issue 1: Δy Issue 1: Δy M reduction M reduction
Important to grasp residual M reduction factors in order to derive the true beamsize
Issue 2 : fluctuation source during fringe scanIssue 2 : fluctuation source during fringe scanIf Δx 〜 2.5 μm cause 〜 4 % signal jitters (assume Gaussian profile σlaser = 10 μm)
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possibly veto jittered points under clearly identified causesGoal: achieve precise Mmeas (σy,meas )
λ/ 2 plate setting
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IP area:QD0, QF1
MFB2FF : "vertical IP-phase BPM"
ATF2 beamline & BPMsATF2 beamline & BPMs
Check for correlation of signal jitters with e beam orbit in BPMs e.g. MREF3FF (high β location for “ref cavity scan” )
synchronize fringe scan data with all ATF2 monitors e.g. BPMs, ICT monitors
ex): check y position jitter@IP using MFB2FF : "vertical IP-phase BPM”
e beam orbit
jitterjitter (( RMSRMS )) 〜 〜 1.3 ns1.3 ns
Relative timing cutRelative timing cut (beam – laser)(beam – laser)e.g. 1-sigma
Observe ΔEsig dependence on Esig :
Investigate Signal FluctuationInvestigate Signal Fluctuation
Anticipate O(nm) res. measurement of Anticipate O(nm) res. measurement of beam position jitter at IP by beam position jitter at IP by IPBPMsIPBPMs (under commissioning)(under commissioning)
[1] improve hardware [2] data selection
Performance Evaluation #2:Performance Evaluation #2:Modulation Reduction FactorsModulation Reduction Factors
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(1) “ Direct Method” consecutive mode switching , under same beam condition consecutive mode switching , under same beam condition (e.g. : 2 ° (e.g. : 2 ° 7 ° 7 ° 30 ° ) 30 ° ) use a σy that yields very high M at low θ mode use a σy that yields very high M at low θ mode observe upper limit on M observe upper limit on Mmeasmeas
Note) apply to a particular dedicated data sample
(2) “ Indirect Method” Evaluate each individual factor offline and “sum up”
Note) represents the typical conditions of a particular period however …… hard to derive overall M reduction (e.g. some factors lack quantitative evaluation, vary over time, only can get “worst limit”)
Study of M reduction
Modulation Reduction Factor
Under-evaluate M, over-evaluate σy
How to evaluate M reduction?
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Plan for assessment of M reduction factorsPlan for assessment of M reduction factors
how to find out bias due to “uncertain” individual factors: (e.g. relative position jitter, spatial coherence)
At a low θ mode : measure a large M (near resolution limit) using a sufficiently small σy compare results with higher θ modes
example: if we measure M corresponding to σy = 350 nm at 7 deg mode expect M = 0.98 at 2.75 deg mode (try to keep within 2-8 deg) what if we get only 0.95 ??? Ctotal 〜 0.97 no individual bias factor worse than 0.97
Note:• conditions may vary over time confirm with repeated measurements• need prove that these factors are really independent of θ
priorities1st : suppress M reduction aim for Ctotal 〜 12nd: precisely evaluate any residual errors derive the “true beam size”
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test using “direct method”
Error source M reduction factor
Fringe tilt (z, t)
profile imbalance Cpro > 98.5%
power imbalance Cpow > 99 %
Laser polarization Optimized to “S state” using λ / 2 plate
Phase drift not major issue
Laser path alignment Ct,pos : ~ 99 %, Cz,pos : > 98 %
Major bias if unattended to
relative position jitter (phase jitter) Spatial coherence
Limited by alignment precision
Could be major bias
Measured polarization and half mirror reflective properties
Resolution of mirror actuators aligning laser to beam
ECFA LC 2013
Spring 2013, 174 deg
power measured directly for each path
drift : < 70 mrad / min during consecutive fringe scans
Still quantitatively uncertain
under evaluation:
Beamtime final optimization by “tilt scan”
assume Gaussian laser profile (spot size)
Individual M Reduction Factors
Represent typical condition of a particular period
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laser polarization related measurements
polarization measured just after injection onto vertical table•very close to linearly S polarization • should be very little polarization related M reduction
resultsresults
λ/ 2 plate setting
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ECFA LC 2013
90 deg cycle
“P contamination”: Pp/Ps = (1.46± 0.06) %
Set-up
IPBSM laser optics is designed for pure linear S polarization
to precisely confirm there is no residual M reduction ……. next plan individual measurements for upper and lower paths near IP
Hardware prepared carry out in June
also measured reflective properties of “half mirror”
Rs = 50.3 %, Rp = 20.1 % Match catalog specifications !!
half mirror
25
power ratio
ECFA LC 2013 26
lower
“S peaks” (maximum M) also yield best power balance Minimize M reduction
26
S peak
P peak
45 deg between S and P
During Beamtime “λ/2 plate scan “ to maximize M
laser polarization and power balanceand power balance
Rotate λ/2 plate angle
lens
upper
power meter
investigate power balance: U vs L path
90 deg 180 deg
Rotate λ/2 plate and measure high power Immediately in front of final focus lenses
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M reduction factor due to power imbalance
Mismatch in axis between fringe and beam
transverse longitudinal
laser path observed on lens: precision ~ 0.5 mm (few mrad)
Fringe TiltFringe Tilt
issues: • Position drifted by the time we scan• e beam may also be rotated in transverse
Current method : “ tilt scan”fringe pitch / roll adjustment: observe M reduction “ Ctilt “
(70 - 80% if uncorrected) directly use e beam as reference for tilt adjustment
27(study of fringe tilt by Okugi-san)
important adjustment to eliminate M reduction
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ex fringe pitchM 0.07 0.32
Mirrors for adjusting tilt M174L Y
(8.9 mm 9.01 mm )
beamsize monitor using laser interference Only existing device capable of measuring σy < 100 nm Indispensible for achieving ATF2 goals and realizing ILC
< Status > contribute with stable operation to continuous beam size tuning Consistent measurement of M 〜 0.3 ( 174 ° mode) at low beam intensity
correspond to σy ~ 65 nm (assuming no M reduction) Application of various linear / non-linear multi- knobs dedicated studies of e beam and IPBSM errors
<towards performance improvement> Performance significantly improved by laser optics reformssuppressed error sources, improved laser path reliability & reproducibility
SummarySummary
ECFA LC 2013
Maintain / improve beamtime performance : e.g. stability, precisionAssess residual systematic errors derive the “true beam size” stable measurements of σy < 50 nm within this run
GoalsGoals
Shintake Monitor (IPBSM)
Towards confirming σy = 37 nm
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ECFA LC 2013
Backup
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•hard to separate from other fluctuation sources hard to separate from other fluctuation sources (laser (laser pointing jitters, drifts, ect….)pointing jitters, drifts, ect….)• jitters can vary greatly over timejitters can vary greatly over time
Phase Jitter / Relative Position JitterPhase Jitter / Relative Position Jitter
Can’t push all fluctuation to phase jittersCan’t push all fluctuation to phase jitters
fitted energy jitters with contributions from statistics, timing, BG , and Δx
preliminary
take high statistics scans (Nav ~ 100) under optimized conditions for dedicated analysistake high statistics scans (Nav ~ 100) under optimized conditions for dedicated analysis
derive horizontal rel position jitter Δx using high statistic laserwire scan
if if Δy < 0.3 * σy Δy < 0.3 * σy (ATF2 beamline design)(ATF2 beamline design) CΔy > 90 % for σy* = 65 nmCΔy > 90 % for σy* = 65 nm
Issue 1: Δy Issue 1: Δy M reduction M reduction
Important to grasp residual M reduction factors in order to derive the true beamsize
Issue 2 : fluctuation source during fringe scanIssue 2 : fluctuation source during fringe scanIf Δx 〜 2.5 μm cause 〜 4 % signal jitters (assume Gaussian profile σlaser = 10 μm)
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Ex #2: check y position jitter@IP using MFB2FF : "vertical IP-phase BPM”
EX#1: MQD10BFF (high β location near ref cavity MREF3FF)
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simulation
Measures σy* = 25 nm 〜 few μm with < 10% resolution
Expected PerformanceExpected Performance must select appropriate mode
according to beam focusing
ECFA LC 2013
Resolution for each θ modefor each θ mode
nm (syst.) (stat.) 237 -04
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Laser interference scheme
k_1
B_1
k_2
B_2
phase scan by optical delay
x
y
Θ
Φ
Time averages magnetic field causes inverse Compton scattering
・ phase shift at IP α・ wave number component along y-axis 2ky = 2k sin φ・ modulation depends on cosθ
S-polarized laser
Wave number vector of two laser paths
Fringe pitch
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Calculation of beam size
phase [rad]
Signal energy [a.u.]
0 2π
Save
Small beamLarge beam
Small beam size
S+
Large beam size
S-
Total signal energy measured by γ-detector
Convolution of ・ Laser magnetic field : Sine curve・ Electron beam profile : Gaussian
M : Modulation depth
Laser magnetic field Electron Beam profile with beam size σy along y-direction
S± : Max / Min of Signal energy
phase [rad]
Signal energy [a.u.]
0 2π
Save
Small beamLarge beam
Small beam size
S+
Large beam size
S-
phase [rad]
Signal energy [a.u.]
0 2π
Save
Small beamLarge beam
Small beam size
S+
Large beam size
S-
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Gamma detector
Gamma
Gamma
Beam longitudinal direction: 33cm (17.7radiation length)
Calorimeter like gamma detector•Multi layered CsI(Tl) scintillator•PMT R7400U (Hamamatsu Photonics)
Width : 10 cmHeight : 5 cm
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Phase control by optical delay line
piezo stage
Optical delay line (~10 cm) Controlled by piezo stage
piezostage
laser beam
Δ stage
Movement by piezo stage : Δstage
Phase shift
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measurement scheme
electron beam
Total energy of gamma ray
wire position
gamma
wire scanner, laser wire
Phase of laser fringe
measurablebeamsize ~ 1μm
measurablebeamsize < 100nm
Shintake monitor
Total energy of gamma ray
Calculate beam size from Gaussian sigma
Calculate beam size from contrast
of sine curve
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laser path misalignmentlaser path misalignment
transverse
longitudinal
precision of alignmnet by mirror actuator • Δz, about 15-20% of σz,laser (from zscan)• Δt about 5-10% of σt, laser * (from laserwire scan)
σz,laser about half of σt,laser
longitudinal Cz- pos > 98.9 % transverse Ct-pos ~ 99.9 %
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If Δy ~ 0.3 σy C 〜 88.4% for 70 nm @ 174 degC 〜 96.2% for 150 nm@30 deg modeC 〜 97.7% for 500 nm@7 deg mode
phase jitter observed from fringe scan: about 200 mrad ?? C 〜 98 % (????)
Phase (relative position) jitterPhase (relative position) jitter
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