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ContracerHigh precision + high functionality + high operability = Contracer

Mitutoyo reserves the right to change any or all aspects of any product specification, including prices, designs and service content, without notice.

Contracer CV-2100SERIES 218 — Contour Measuring

Instruments• The operation flow is significantly shortened

by arranging the controls for stylus position change, measurement start/stop and return on the front of the drive unit.

• Fine and coarse X-axis positioning can be performed easily by using the jog shuttle that covers the whole measuring range.

• The quick-vertical-motion stand allows operators to swiftly and easily move the drive unit to and from the measurement height without having to push or pull (only for CV-2100M4).

Contour Measuring System enabling mea-surement that is fast, accurate, and easy.

Refer to the Contracer CV-2100 Catalog (No. E15020) for more details.

An inspection certificate is supplied as standard. Refer to page X for details.

SPECIFICATIONSModel No. CV-2100M4 CV-2100N4Measurement range

X-axis 100 mmZ1-axis (detector unit) 50 mm

Z2-axis (column) travel range 350 mm—

X-axis inclination angle ±45°Accuracy(20 °C)

X-axis ±(2.5+0.02L)µm L = Measurement Length (mm)Z1-axis ±(2.5+|0.1H|)µm H = Measurementt height from horizontal position within ±25 mm

Note: While the appearance of the natural stone measuring table varies according to the source, the high stability for which this material is known can always be relied upon.

* For the CV-2100N4, a manual column stand is required (optionally available.)

Motor-driven jog shuttle

Quick-vertical-motion stand

Centralized front control panel

CV-2100M4

CV-2100M4

Notebook PC Form Analysis program FORMTRACEPAK

Desktop PC

CV-2100N4

• CV-3200 series are contour measuring instruments equipped with a high-precision arc scale and newly designed arm on the Z1-axis (detector). The high-precision arc scale can directly read the arc track of the stylus tip to achieve high accuracy and resolution. The new arm has extended the Z1-axis measuring range by 10 mm while reducing the chance of interference with workpieces compared to conventional models. The arm mount can be attached/detached with a single touch on the magnet joint for improved ease of operation.

• The 700 mm Z2-axis (column) range models are new to the lineup.

Dramatically Improved High-Precision Contour Measuring Instruments.

Contracer CV-3200SERIES 218 — Contour Measuring

Instruments

CV-3200S4

CV-3200L4 (with options)

SPECIFICATIONSModel No. CV-3200S4 CV-3200H4 CV-3200W4 CV-3200L4 CV-3200S8 CV-3200H8 CV-3200W8 CV-3200L8Measuring range

X-axis 100 mm 200 mmZ1-axis (detector) 60 mm (±30 mm from the horizontal)

Z2-axis (column) travel range 300 mm 500 mm 700 mm 300 mm 500 mm 700 mm

Accuracy (20 °C)

X-axis±(0.8+0.01L)µm L = traverse length (mm)

Wide range: 1.8 µm/100 mmNarrow range: 1.05 µm/25 mm

±(0.8+0.02L)µm L = traverse length (mm)Wide range: 4.8 µm/200 mmNarrow range: 1.3 µm/25 mm

Z1-axis (detector) ±(1.4+|2H|/100)µm H = probing height from the horizontal (mm)Note: While the appearance of the natural stone measuring table varies according to the source, the high stability for which this

material is known can always be relied upon.

Products equipped with the measurement data output function can be connected to the measurement data network system MeasurLink (refer to page A-5 for details).

Z1-axis measuring range has been extended by 10 mm.

• CV-3100 (conventional model)

• CV-3200

50mm

10 mm

60mm

19 mm

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Mitutoyo reserves the right to change any or all aspects of any product specification, including prices, designs and service content, without notice.

Refer to the Contracer CV-3200/4500 series Catalog (No. E15010) for more details.

• CV-4500 series are contour measuring instruments equipped with a high-precision arc scale and newly designed arm on the Z1-axis (detector). The high-precision arc scale can directly read the arc track of the stylus tip to achieve high accuracy and resolution. The new arm has extended the Z1-axis measuring range by 10 mm while reducing the chance of interference with workpieces compared to conventional models. The arm mount can be attached/detached with a single touch on the magnet joint for improved ease of operation.

• The following two features have been added exclusively for the CV-4500 series:(1) Continuous measurement in the vertical

direction (up/down) is available in combination with a double-sided conical stylus. Up/down continuous measurement data facilitates the analysis of the effective diameter of screw threads, which has been difficult to measure in the past.

(2) The measuring force can be set in the FORMTRACEPAK software. Weight replacement and position adjustment are not required to adjust the measuring force.

• The 700 mm Z2-axis (column) range models are new to the lineup.

Dramatically Improved High-Precision Contour Measuring Instruments.

CV-4500S4

Contracer CV-4500SERIES 218 — Contour Measuring

Instruments

Downward (Bottom plane) measurement

Upward/downward measurement direction is switchable on the software

Upward (Top plane) measurement

Measuring direction

SPECIFICATIONSModel No. CV-4500S4 CV-4500H4 CV-4500W4 CV-4500L4 CV-4500S8 CV-4500H8 CV-4500W8 CV-4500L8Measuring range

X-axis 100 mm 200 mmZ1-axis (detector) 60 mm (±30 mm from the horizontal)

Z2-axis (column) travel range 300 mm 500 mm 700 mm 300 mm 500 mm 700 mm

Z1-axis (Detector)

Scale type Arc Resolution 0.02 µmStylus up/down Arc motionMeasuring direction Forward / backward Face of stylus Vertical direction (up/down, available for continuous measurement)Measuring force 10, 20, 30, 40, 50 mN (switching on the software)

Traceable angle Ascent: 77°, descent: 83° (using the standard one-sided cut stylus*1 provided and depending on the surface roughness)

Drive unit

Scale typeX-axis Separate type linear scaleZ2-axis (column) ABS scale

ResolutionX-axis 0.05 µmZ2-axis (column) 1 µm

Drive speedX-axis 0 to 80 mm/s or manual operationZ2-axis (column) 0 to 30 mm/s or manual operation

Measuring speed X-axis 0.02, 0.05, 0.1, 0.2, 0.5, 1.0, 2.0, 5.0, 10, 20 mm/s

Straightness*2 X-axis 0.8 µm/100 mm 2 µm/200 mmInclination range X-axis ±45°

Accuracy (20 °C)X-axis

±(0.8+0.01L)µm L = traverse length (mm)Wide range: 1.8 µm/100 mm

Narrow range: 1.05 µm/25 mm

±(0.8+0.02L)µm L = traverse length (mm)Wide range: 4.8 µm/200 mmNarrow range: 1.3 µm/25 mm

Z1-axis (detector) ±(0.8+|2H|/100)µm H = probing height from the horizontal (mm)

External dimensions(W×D×H) Main unit*3 756×482

×966 mm756×482

×1166 mm1156×482 ×1176 mm

1156×492 ×1436 mm

766×482 ×966 mm

766×482 ×1166 mm

1166×482 ×1176 mm

1156×492 ×1436 mm

Mass Main unit 140 kg 150 kg 220 kg 270 kg 140 kg 150 kg 220 kg 270 kg*1: SPH-71 (No. 354884)*2: In X-axis horizontal position*3: Base material of the main unit is Gabbro.Note: While the appearance of the natural stone measuring table varies according to the source, the high stability for which this

material is known can always be relied upon.

An inspection certificate is supplied as standard. Refer to page X for details.

Products equipped with the measurement data output function can be connected to the measurement data network system MeasurLink (refer to page A-5 for details).

Z1-axis measuring range has been extended by 10 mm.

• CV-4100 (conventional model)

• CV-4500

50mm

10 mm

60mm

19 mm

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FormtracerHybrid machine with dual-role capability

Mitutoyo reserves the right to change any or all aspects of any product specification, including prices, designs and service content, without notice.

• The combination of a surface roughness tester and contour measuring instrument saves installation space.

Surface roughness testing function• Z1-axis detector provides highest resolution of

0.0001 µm (when the measuring range is 8 µm) is provided as standard.

• High-accuracy glass scales, built-in on the X-axis, directly read the drive unit movement. This greatly facilitates spacing parameter evaluation while achieving high-accuracy positioning.

• Measuring force for the detector is selectable from 4 mN or 0.75 mN.

Contour measuring function• The Z1-axis (detector) is equipped with a high-

precision arc scale and newly designed arm. The high-precision arc scale can directly read the arc track of the stylus tip to achieve high accuracy and resolution. The new arm has extended the Z1-axis measuring range by 10 mm while reducing the chance of interference with workpieces compared to conventional models. The arm mount can be attached/detached with a single touch on the magnet joint for improved ease of operation.

• The following two features have been added exclusively for the SV-C-4500 series as functions dedicated to contour measuring systems:

(1) Continuous measurement in the vertical direction (up/down) is available in combination with a double-tipped stylus.

Up/down continuous measurement data facilitates the analysis of the effective diameter of screw threads, which has been difficult to measure in the past.

(2) The measuring force can be set in the FORMTRACEPAK software. Weight replacement and position adjustment are not required to adjust the measuring force.

• The 700 mm Z2-axis (column) range models are new to the lineup.

An inspection certificate is supplied as standard. Refer to page X for details.

Formtracer SV-C3200/4500SERIES 525 — Surface Roughness and

Contour Measuring SystemsSurface roughness

testing

Contour measuring

Formtra

cer

Refer to the Formtracer SV-C3200/4500 series Catalog (No. E15012) for more details.

Downward (Bottom plane) measurement

Upward/downward measurement direction is switchable in the software

Upward (Top plane) measurement

SPECIFICATIONSModel No.

SV-C3200S4 SV-C3200H4 SV-C3200W4 SV-C3200L4 SV-C3200S8 SV-C3200H8 SV-C3200W8 SV-C3200L8SV-C4500S4 SV-C4500H4 SV-C4500W4 SV-C4500L4 SV-C4500S8 SV-C4500H8 SV-C4500W8 SV-C4500L8

• Surface roughness measurement

Measuring range

X-axis (drive unit) 100 mm 200 mmZ1-axis (detector) 800 µm/80 µm/8 µm

Straightness (0.05+L /1000)µm L: traverse length (mm) (0.1+0.002L)µm L: traverse length (mm)Resolution Z1-axis (detector) 0.01 µm(800 µm), 0.001 µm(80 µm), 0.0001 µm(8 µm)

Measuring force 0.75 mN (when the Code No. of the main unit ends with "-1") / 4 mN (when the Code No. of the main unit ends with "-2")

Stylus tip shape 60°, 2 µmR (when the Code No. of the main unit ends with "-1") / 90°, 5 µmR (when the Code No. of the main unit ends with "-2")

Applicable standards JIS1982/ JIS1994/ JIS2001/ ISO1997/ ANSI/ VDA

ParameterPa, Pq, Psk, Pku, Pp, Pv, Pz, Pt, Pc, PSm, P q, Pmr (C), Pmr, P c, Ra, Rq, Rsk, Rku, Rp, Rv, Rz, Rt, Rc, RSm, R q, Rmr (C), Rmr, R c, Wa, Wq, Wsk, Wku, Wp, Wv, Wz, Wt, Wc, WSm, W q, Wmr (C), Wmr, W c, Rk, Rpk, Rvk, Mr1, Mr2, A1, A2, Rx, AR, R, Wx, AW, W, Wte, Ry, RyDIN, RzDIN, R3y, R3z, S, HSC, Lo, Ir, a, a, q, Vo, Htp, NR, NCRX, CPM, SR, SAR, NW, SW, SAW

Assessed profilePrimary profile, Roughness profile, Filtered waviness profile, Waviness profile, Rolling circle waviness primary profile, Rolling circle waviness profile, Envelope residual profile, DF profile (DIN4776/ ISO13565-1), Roughness motif (Envelope waviness profile is displayed when evaluating the motif.)

Analysis graphMaterial ratio curve, Profile height amplitude distribution curve, Power spectrum chart, Auto-correlation chart, Walsh power spectrum chart, Walsh auto-correlation chart, Slope distribution chart, Local peak distribution chart, Parameter distribution chart (Contour analysis function can analyze the area of abrasion amount and overlay.)

Data compensation functions Least squares straight line, R-surface compensation, Ellipse compensation, Parabola compensation, Hyperbolic compensation, Conic compensation, Polynomial compensation (auto or arbitrary 2nd to 7th), No compensation

Filter Gaussian filter, 2CRPC75, 2CRPC50, 2CR75, 2CR50, Robust spline filter• Contour measurement

Measuring range

X-axis (drive unit) 100 mm 200 mmZ1-axis (detector) 60 mm (±30 mm from the horizontal)

Straightness 0.8 µm/100 mm 2 µm/200 mm

AccuracyX-axis (drive unit) ±(0.8+0.01L)µm L: traverse length (mm) ±(0.8+0.02L)µm L = traverse length (mm)

Z1-axis (detector) SV-C3200 series: ±(1.4+|2H|/100)µm, SV-C4500 series: ±(0.8+|2H|/100)µmH: Probing height from the horizontal (mm)

ResolutionX-axis (drive unit) 0.05 µmZ1-axis (detector) SV-C3200 series: 0.04 µm, SV-C4500 series: 0.02 µmZ2-axis (column) 1 µm

Measuring force SV-C3200 series: 30 mN (adjustment using weights)SV-C4500 series: 10, 20, 30, 40, 50 mN (switching on the software)

Face of stylus SV-C3200 series: Vertical direction (up/down, single measurement)SV-C4500 series: Vertical direction (up/down, available for continuous measurement)

• Common specificationZ2-axis (column) travel range 300 mm 500 mm 700 mm 300 mm 500 mm 700 mmX-axis Inclination range ±45°

Drive speedX-axis 0 to 80 mm/s or manual operationZ2-axis (column) 0 to 30 mm/s or manual operation

Measuring speed 0.02, 0.05, 0.1, 0.2, 0.5, 1.0, 2.0, 5.0, 10, 20 mm/s

Note: While the appearance of the natural stone measuring table varies according to the source, the high stability for which this material is known can always be relied upon.

Z1-axis measuring range has been extended by 10 mm.

• SV-C3100/4100 (conventional model)

• SV-C3200/4500

50mm

10 mm

60mm

19 mm

SV-C3200S4

SV-C3200L4 (with options)

Products equipped with the measurement data output function can be connected to the measurement data network system MeasurLink (refer to page A-5 for details).

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Mitutoyo reserves the right to change any or all aspects of any product specification, including prices, designs and service content, without notice.

• Equipped with a wide range and high resolution Z-axis detector.• Measuring range Z1-axis (detector): 5 mm (Resolution: 0.0008 µm, for 0.05 mm measuring range) X-axis: 100 mm (Resolution: 0.05 µm)

• Overhang of the detector: Max. 70 mm (Fixable at a desired position)

• Uses the well-respected FORMTRACEPAK software to provide a rich variety of analysis functions to achieve excellent surface texture evaluation.

Formtracer CS-3200S4SERIES 525 — Surface Roughness and

Contour Measuring System

CS-3200S4

Refer to the Formtracer CS-3200 Catalog (No. E15025) for more details.

SPECIFICATIONSModel No. CS-3200S4

Measuring range/Resolution

X-axis 100 mm/0.05 µm

Z1-axis (detector)5 mm/0.08 µm

0.5 mm/0.008 µm0.05 mm/0.0008 µm

Z2-axis (column) 300 mm/1 µm

Accuracy (20 °C)

X-axis ±(0.8+0.01L)µm L = measuring length (mm)Z1-axis (detector) ±(1.5+|2H|/100) µm H = probing height from the horizontal (mm)

Drive unit

Straightness (X-axis)

Under normal use 0.2 µm/100 mmWhen protruding to the maximum extent 0.4 µm/100 mm

Measuring speedRoughness measurement 0.02, 0.05, 0.1, 0.2 mm/s (4-step)Contour measurement 0.02, 0.05, 0.1, 0.2, 0.5, 1.0, 2.0 mm/s (7-step)

Drive speedX-axis (horizontal direction) 0 to 80 mm/s or manual operationZ2-axis (vertical direction) 0 to 20 mm/s or manual operation

Up/down movement 300 mm (motorized)Inclination range ±45°

Detector

Detection method Differential inductanceMeasuring force 0.75 mN

Stylus

Standard stylus (for roughness/contour measurement) Tip angle: 60° cone, Tip radius: 2 µm, Diamond tip

Cone stylus (for contour measurement) Tip angle: 30° cone, Tip radius: 25 µm, Sapphire

Stylus up/down Available (Stoppable at a mid-air position)Note1: While the appearance of the natural stone measuring table varies according to the source, the high stability for which this

material is known can always be relied upon.Note2: High column and 200 mm X-axis drive-unit models are also available. Please consult your local Mitutoyo office for applicable

specifications.

An inspection certificate is supplied as standard. Refer to page X for details.

Products equipped with the measurement data output function can be connected to the measurement data network system MeasurLink (refer to page A-5 for details).

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FormtracerHybrid machine with dual-role capability

Mitutoyo reserves the right to change any or all aspects of any product specification, including prices, designs and service content, without notice.

SV-C4500CNC• High-accuracy stylus type CNC Surface

Roughness / Contour Measuring System that allows measurement of surface roughness and form/contour with one unit through detector replacement.

• For models with the -axis, it is possible to perform continuous measurement over horizontal and inclined surfaces by power-tilting the X1-axis. In addition, automatic measuring force adjustment function of Z1-axis detector for contour measurement enables automatic measurement with constant measuring force even with the X1-axis tilted.

• For models with the Y-axis table, it is possible to expand the measuring range for multiple workpieces through positioning in the Y-axis direction.

• Since the Z1-axis detector incorporates an anti-collision safety device, the machine will automatically stop if the detector touches a workpiece or jig.

• Optional external control function (Ext I/O) through bidirectional communication (RS-232C) with the PLC (programmable logic controller) is available.

SV-C4500CNC HYBRID TYPE1• CNC Surface Roughness/Contour Measuring

System equipped with a non-contact type detector as well as a contact type surface roughness contour measuring detector.

• Equipped with the Y-axis table, it is possible to expand the measuring range for multiple workpieces through positioning in the Y-axis direction.

• Since the Z1-axis detector incorporates an anti-collision safety device, the machine will automatically stop if the detector touches a workpiece or jig.

• Optional external control function (Ext I/O) through bidirectional communication (RS- 232C) with the PLC (programmable logic controller) is available.

An inspection certificate is supplied as standard. Refer to page X for details.

Formtracer Extreme SV-C4500CNC/SV-C4500CNC HYBRID TYPE1SERIES 525 — CNC Surface Roughness and

Contour Measuring Systems

S V-C4500CNC (Contour detector shown mounted together with the inclinable drive unit and Y-axis table)

SV-C4500CNC HYBRID TYPE1 (Mounting example of non-contact detector)

SV-C4500CNC Specifications*Model No. SV-C4500CNC

X1-axis(Drive unit)

Measuring range 200 mmResolution 0.05 µmScale type Reflective-type linear encoder

ContourStraightness 2 µm/200 mmAccuracy (20 °C) ±(0.8+4L/200)µm L: Measuring length (mm)

Surface roughness Straightness 0.5 µm/200 mm

Z1-axis(Detector)

Contour

Measuring range 60 mm (±30 mm from the horizontal)Resolution 0.02 µmScale type Arc

Accuracy (20 °C) ±(0.8+|2H|/100)µmH: Measuring height from horizontal position (mm)

Surface roughnessMeasuring range 800 µm/80 µm/8 µmResolution 0.01 µm/0.001 µm/0.0001 µm

Z2-axis(Column)

Drive range Specification is selectable from 300 mm or 500 mm.Resolution 0.05 µm

Note: While the appearance of the natural stone measuring table varies according to the source, the high stability for which this material is known can always be relied upon.

SV-C4500CNC HYBRID TYPE1 Specifications*Model No. SV-C4500CNC HYBRID TYPE1

X1-axis(Drive unit)

Measuring range 200 mmResolution 0.05 µmScale type Reflective-type linear encoder

ContourStraightness (20 °C) 2 µm/200 mmAccuracy ±(0.8+4L/200)µm L: Measuring length (mm)

Surface roughness Straightness 0.5 µm/200 mm

Non-contact typeStraightness 0.5 µm/200 mmAccuracy ±(0.8+4L/200)µm L: Measuring length (mm)

Y-axisMeasuring range 200 mmResolution 0.05 µmMaximum table loading 20 kg

Z1-axis

Contour

Measuring range 60 mm (±30 mm from the horizontal)Resolution 0.02 µmScale type Arc

Accuracy (20 °C) ±(0.8+|2H|/100)µmH: Measuring height from horizontal position (mm)

Surface roughnessMeasuring range 800 µm/80 µm/8 µmResolution 0.01 µm/0.001 µm/0.0001 µm

Non-contact type detector CPS2525*1

Measuring range 1.2 mmResolution 25 nm

Non-contact type detector CPS0517*1

Measuring range 0.1 mmResolution 5 nm

Z2-axisDrive range 500 mmResolution 0.05 µm

Note: While the appearance of the natural stone measuring table varies according to the source, the high stability for which this material is known can always be relied upon.

*1: Select either CPS2525 or CPS0517.

Products equipped with the measurement data output function can be connected to the measurement data network system MeasurLink (refer to page A-5 for details).

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Mitutoyo reserves the right to change any or all aspects of any product specification, including prices, designs and service content, without notice.

Formtracer Extreme CS-5000CNC/CS-H5000CNCSERIES 525 — CNC Surface Roughness and

Contour Measuring Systems

Wide range detector employing active control technology

CS-H5000CNC(with Y-axis table)

• High-accuracy stylus type CNC Surface Measuring System that allows batch measurement of surface roughness and form/contour.

• The X1- and Z2-axes have maximum drive speeds of 40 mm/s and 200 mm/s, respectively. This permits high-speed positioning that can potentially result in a large increase in the throughput of multiple-profile / multiple-workpiece measurement tasks.

• A Mitutoyo Laser Holoscale is incorporated in the X1- and Z1-axes so that high resolution is achieved and batch measurement of form/contour and surface roughness can be made.

• The active control method is employed for the Z1-axis detector to implement a wide-range measurement capability wherein the variation in dynamic measuring force is restricted.

• Since the Z1-axis detector incorporates an anti-collision safety device, the machine will automatically stop if the detector touches a workpiece or jig.

• For models with the -axis, it is possible to perform continuous measurement over horizontal and inclined surfaces by power-tilting the X1-axis. (CS-5000CNC only)

• For models with the Y-axis table, it is possible to expand the measuring range for multiple workpieces through positioning in the Y-axis direction.

• Optional external control function (Ext I/O) through bidirectional communication (RS-232C) with the PLC (programmable logic controller) is available.

SPECIFICATIONSModel No. CS-5000CNC CS-H5000CNC

X1-axis

Measuring range 200 mmResolution 0.00625 µmScale type Laser Holoscale

Drive speedCNC mode Max. 40 mm/sJoystick mode 0 to 40 mm/s

Measuring speed 0.02, 0.05, 0.1, 0.2 mm/s (surface roughness), 0.02, 0.05, 0.1, 0.2, 0.5, 1.0, 2.0 mm/s (form/contour)Measuring direction Forward / backward

Straightness(with standard stylus) (0.1+0.0015L)µm L: traverse length (mm) (0.05+0.0003L)µm L: traverse length (mm)(with 2X-long stylus) (0.2+0.0015L)µm L: traverse length (mm) (0.1+0.0015L)µm L: traverse length (mm)

Accuracy (20 °C) ±(0.3+0.002L)µm L: traverse length (mm) ±(0.16+0.001L)µm L: traverse length (mm)α-axis Inclination range -45°(CCW), +10°(CW) —

Z1-axis(Detector)

Measuring range(with standard stylus) 12 mm(with 2X-long stylus) 24 mm

Resolution(with standard stylus) 0.0008 µm(with 2X-long stylus) 0.0016 µm

Vertical movement of the stylus Arc motionScale type Transmission-type linear encoder Accuracy (20 °C) ±(0.3+|0.02H|)µm H: probing height (mm) ±(0.07+|0.02H|)µm H: probing height (mm)

Measuring force(with standard stylus) 4 mN (Fixed)(with 2X-long stylus) 0.75 mN (Fixed)

Traceable angle Ascent: 60°, Descent: 60°, (Depends on the surface texture.)

Stylus tip shape

Standard stylus Tip angle: 40°, Tip radius: 5 µm, Diamond tipStandard ball stylus Tip ball radius: 0.25 mm, Sapphire2X-long stylus Tip angle: 40°, Tip radius: 5 µm, Diamond tip2X-long stylus — Tip angle: 60°, Tip radius: 2 µm, Diamond tip2X-long ball stylus Tip ball radius: 0.25 mm, Sapphire

Face of stylus Downward

Z2-axis(Column)

Travel rangeZ2-axis (column, type S) 300 mmZ2-axis (column, type H) 500 mm —

Resolution 0.05 µmScale type Reflective-type linear encoder

Drive speedCNC mode Max. 200 mm/sJoystick mode 0 to 50 mm/s

Base size (width×depth) 750×600 mmBase material Gabbro

Note: While the appearance of the natural stone base varies according to the source, the high stability for which this material is known can always be relied upon.

An inspection certificate is supplied as standard. Refer to page X for details.

Products equipped with the measurement data output function can be connected to the measurement data network system MeasurLink (refer to page A-5 for details).

ContracerHigh precision + high functionality + high operability = Contracer

Mitutoyo reserves the right to change any or all aspects of any product specification, including prices, designs and service content, without notice.

Contracer (Contour Measuring Instruments)Quick Guide to Precision Measuring Instruments

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■Traceable Angle

The maximum angle at which a stylus can trace upwards or downwards along the contour of a workpiece, in the stylus travel direction, is referred to as the traceable angle. A one-sided sharp stylus with a tip angle of 12° (as in the above figure) can trace a maximum 77° of up slope and a maximum 87° of down slope. For a conical stylus (30° cone), the traceable angle is smaller. An up slope with an angle of 77° or less overall may actually include an angle of more than 77° due to the effect of surface roughness. Surface roughness also affects the measuring force.For model CV-3200/4500, the same type of stylus (SPH-71: one-sided sharp stylus with a tip angle of 12°) can trace a maximum 77° of up slope and a maximum 83° of down slope.

If a profile is read from the recorder through a template or scale, it is necessary to compensate for the stylus tip radius beforehand according to the applied measurement magnification.

■Compensating for Stylus Tip RadiusA recorded profile represents the locus of the center of the ball tip rolling on a workpiece surface. (A typical radius is 0.025 mm.) Obviously this is not the same as the true surface profile so, in order to obtain an accurate profile record, it is necessary to compensate for the effect of the tip radius through data processing.

3: Software processing. To measure a workpiece contour that involves a large displacement in the vertical direction with high accuracy, one of these compensation methods needs to be implemented.

■Compensating for Arm RotationThe stylus is carried on a pivoted arm so it rotates as the surface is traced and the contact tip does not track purely in the Z direction. Therefore it is necessary to apply compensation in the X direction to ensure accuracy. There are three methods of compensating for arm rotation.1: Mechanical compensation2: Electrical compensation

■AccuracyAs the detector units of the X and Z-axes incorporate scales, the magnification accuracy is displayed not as a percentage but as the linear displacement accuracy for each axis.

■Overload Safety CutoutIf an excessive force (overload) is exerted on the stylus tip due, perhaps, to the tip encountering a too-steep slope on a workpiece feature, or a burr, for example, a safety device automatically stops operation and sounds an alarm buzzer. This type of instrument is commonly equipped with separate safety devices for the tracing direction (X-axis) load and vertical direction (Y-axis) load.For model CV-3200/4500, a safety device functions if the arm comes off the detector mount.

■Simple or Complex Arm GuidanceIn the case of a simple pivoted arm, the locus that the stylus tip traces during vertical movement (Z direction) is a circular arc that results in an unwanted offset in X, for which compensation has to be made. The larger the arc movement, the larger is the unwanted X displacement (δ) that has to be compensated. (See figure, lower left.) The alternative is to use a complex mechanical linkage arrangement to obtain a linear translation locus in Z, and therefore avoid the need to compensate in X.

■Z-axis Measurement MethodsThough the X-axis measurement method commonly adopted is by means of a digital scale, the Z-axis measurement divides into analog methods (using a differential transformer, for example) and digital scale methods.Analog methods vary in Z-axis resolution depending on the measurement magnification and measuring range. Digital scale methods have fixed resolution.Generally, a digital scale method provides higher accuracy than an analog method.

RxM

RxMRxM

Recorded profile

Workpiece contour

R: Stylus tip radiusM: Measurement magnification

Stylus

StylusMeasuring arm

Fulcrum

δ: Unwanted displacement in X to be compensated

δ

Up slope

Down slope

77˚ or less 87˚ or less

Mitutoyo reserves the right to change any or all aspects of any product specification, including prices, designs and service content, without notice. L-18

L

■Contour analysis methodsYou can analyze the contour with one of the following two methods after completing the measurement operation.

Data processing section and analysis programThe measured contour is input into the data processing section in real time and a dedicated program performs the analysis using the mouse and/or keyboard. The angle, radius, step, pitch and other data are directly displayed as numerical values. Analysis combining coordinate systems can be easily performed. The graph that goes through stylus radius correction is output to the printer as the recorded profile.

■Tolerancing with Design DataMeasured workpiece contour data can be compared with design data in terms of actual and designed shapes rather than just analysis of individual dimensions. In this technique each deviation of the measured contour from the intended contour is displayed and recorded. Also, data from one workpiece example can be processed so as to become the master design data to which other workpieces are compared. This function is particularly useful when the shape of a section greatly affects product performance, or when its shape has an influence on the relationship between mating or assembled parts.

■Best-fittingIf there is a standard for surface profile data, tolerancing with design data is performed according to the standard. If there is no standard, or if tolerancing only with shape is desired, best-fitting between design data and measurement data can be performed.

The best-fit processing algorithm searches for deviations between both sets of data and derives a coordinate system in which the sum of squares of the deviations is a minimum when the measured data is overlaid on the design data.

■Data CombinationConventionally, if tracing a complete contour is prevented by stylus traceable-angle restrictions then it has to be divided into several sections that are then measured and evaluated separately. This function avoids this undesirable situation by combining the separate sections into one contour by overlaying common elements (lines, points) onto each other. With this function the complete contour can be displayed and various analyses performed in the usual way.

Aspheric lens contour

Internal gear teeth

Male thread form Gage contour

Female thread form

Inner/outer ring contour of a bearing

■Measurement Examples

Measured data

Design data

Measured data

Design data

<After best-fit processing><Before best-fit processing>

Data combination

Data 2Data 1