Chapter 10. Bipolar junction transistor fundamentals
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Transcript of Chapter 10. Bipolar junction transistor fundamentals
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Chapter 10. Bipolar junction transistor fundamentals
Invented in 1948 by Bardeen, Brattain and Shockley
Contains three adjoining, alternately doped semiconductor regions: Emitter (E), Base (B), and Collector (C)
The middle region, base, is very thin compared to the diffusion length of minority carriers
Two kinds: npn and pnp
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Schematic representation of pnp and npn BJTs
Emitter is heavily doped compared to collector. So, emitterand collector are not interchangeable.
The base width is small compared to the minority carrierdiffusion length. If the base is much larger, then this willbehave like back-to-back diodes.
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BJT circuit symbols
As shown, the currents are positive quantities when the transistor is operated in forward active mode.
IE = IB + IC and VEB + VBC + VCE = 0 VCE = VEC
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BJT circuit configurations and output characteristics
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BJT biasing modes
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Cross sections and simplified models of discrete and IC npn BJTs
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Electrostatic variables for a pnp BJT at equilibrium
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Qualitative discussions of operation
Consider two diodes, one forward biased and one reverse biased.
p n n
e
e
e
e
e
e
e
forward
E
E
reverse
h
h h
h
h h
h
E
E
p
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Qualitative discussion of transistor action
p pn
forwardI reverseI
No transistor action
e
Combine the two diodes!VF VR
h
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Consider very thin base width: Transistor action
e
E
R
EIEI
E1 I)(
Hole concentration is zero here, reverse biased
VF VR
The collector current IC is almost equal to IE, and collector currentis controlled by the E-B junction bias. The loss, i.e. < 1 corresponds to the recombination of holes in base.
h
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PNP under forward active mode
IE = IEP + IEN = 1 + 2 + 5IB = IBR + IBE = IBR + IEN = – (4 + 5)IC = IEP – IBR = 2
electrons holes
EI CI
BI
5 41
23
IEP
–IEN
IBR
Electronflux
Holefluxand current
–IBR–IBE
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Current components
1 = hole current lost due to recombination in base, IBR
2 = hole current collected by collector, ~ IC
1 + 2 = hole part of emitter current, IEP
5 = electrons injected across forward biased E-B junction, (– IBE);
same as electron part of emitter current, – IEN
4 = electron supplied by base contact for recombination with
holes lost, – IBR (= 1)
3 = thermally generated e & h making up reverse saturation
current of reverse biased C-B junction. (generally neglected)
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Performance parameters (Consider pnp)
Emitter efficiency:
E
EP
ENEP
EPII
III
Fraction of emitter current carried by holes.We want close to 1.
Base transport factor:
Ep
CT I
Iα Fraction of holes collected by the collector.We want T close to 1.
Common base dc current gain:
EdcETEPTC IIII
Tdc
Neglect the reverse leakage (electron) current of C-B junction
Note that is less than 1.0 but close to 1.0 (e.g. = 0.99)
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Performance parameters (Consider pnp)
Common emitter dc current gain, dc:
BdcC II
Bdc
dcC
BCdcEdcC
1
)(
II
IIII
But,
T
T
dc
dcdc 11
Note that is large (e.g. = 100)
For npn transistor, similar analysis can be carried out. However,the emitter current is mainly carried by electrons.
Example: .etcENEP
EPII
I