3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker...

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Introduction Random Variables Random Processes Noise Characterization 3: Random Variables, Processes, and Noise Y. Yoganandam, Runa Kumari, and S. R. Zinka Department of Electrical & Electronics Engineering BITS Pilani, Hyderbad Campus August 10 & 12, 2015 3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Transcript of 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker...

Page 1: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

3: Random Variables, Processes, and Noise

Y. Yoganandam, Runa Kumari, and S. R. Zinka

Department of Electrical & Electronics EngineeringBITS Pilani, Hyderbad Campus

August 10 & 12, 2015

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 2: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Outline

1 Introduction

2 Random Variables

3 Random Processes

4 Noise Characterization

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 3: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Outline

1 Introduction

2 Random Variables

3 Random Processes

4 Noise Characterization

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 4: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Noise

Inputsignal

Inputtransducer Transmitter

Transmittedsignal

Channel

Recivedsignal

Reciver

Outputsignal

Outputtransducer

Outputmessage

Inputmessage

Distortionand

noise

Noise can be internal too ...

Noise is the undesired signal that gets added to the desired signal andreaches the destination.

Noise ultimately determines the threshold for the minimum signal that canbe reliably detected by a receiver.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 5: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Noise

Inputsignal

Inputtransducer Transmitter

Transmittedsignal

Channel

Recivedsignal

Reciver

Outputsignal

Outputtransducer

Outputmessage

Inputmessage

Distortionand

noise

Noise can be internal too ...

Noise is the undesired signal that gets added to the desired signal andreaches the destination.

Noise ultimately determines the threshold for the minimum signal that canbe reliably detected by a receiver.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 6: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Noise

Inputsignal

Inputtransducer Transmitter

Transmittedsignal

Channel

Recivedsignal

Reciver

Outputsignal

Outputtransducer

Outputmessage

Inputmessage

Distortionand

noise

Noise can be internal too ...

Noise is the undesired signal that gets added to the desired signal andreaches the destination.

Noise ultimately determines the threshold for the minimum signal that canbe reliably detected by a receiver.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 7: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Noise

Inputsignal

Inputtransducer Transmitter

Transmittedsignal

Channel

Recivedsignal

Reciver

Outputsignal

Outputtransducer

Outputmessage

Inputmessage

Distortionand

noise

Noise can be internal too ...

Noise is the undesired signal that gets added to the desired signal andreaches the destination.

Noise ultimately determines the threshold for the minimum signal that canbe reliably detected by a receiver.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 8: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Noise

Noise lives with the desired signal. Neither amplification nor the filtering canalleviate the effect of noise on the desired signal.

The only way to keep away from the effects of noise is to see that less amountof noise, relative to the desired signal, is present at the destination.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 9: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Noise

Noise lives with the desired signal. Neither amplification nor the filtering canalleviate the effect of noise on the desired signal.

The only way to keep away from the effects of noise is to see that less amountof noise, relative to the desired signal, is present at the destination.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 10: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Noise

Noise lives with the desired signal. Neither amplification nor the filtering canalleviate the effect of noise on the desired signal.

The only way to keep away from the effects of noise is to see that less amountof noise, relative to the desired signal, is present at the destination.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 11: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

External Noise - Sources

• Noise from stars including the sun (20MHz – 1.5GHz)• Lightning (2MHz – 10MHz)• Thermal noise from the ground• Cosmic background noise from the sky

• Man made noise, e.g., spark plugs, engine noise, etc (1MHz – 500MHz)• Radio, TV, and cellular stations• Wireless devices• Microwave ovens

• Deliberate jamming devices

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 12: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

External Noise - Sources

• Noise from stars including the sun (20MHz – 1.5GHz)• Lightning (2MHz – 10MHz)• Thermal noise from the ground• Cosmic background noise from the sky

• Man made noise, e.g., spark plugs, engine noise, etc (1MHz – 500MHz)• Radio, TV, and cellular stations• Wireless devices• Microwave ovens• Deliberate jamming devices

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 13: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

External Noise - Sources

• Noise from stars including the sun (20MHz – 1.5GHz)• Lightning (2MHz – 10MHz)• Thermal noise from the ground• Cosmic background noise from the sky• Man made noise, e.g., spark plugs, engine noise, etc (1MHz – 500MHz)• Radio, TV, and cellular stations• Wireless devices• Microwave ovens• Deliberate jamming devices

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 14: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Internal Noise - Sources

• Thermal noise is the most basic type of noise, being caused by thermalvibration of bound charges. It is also known as Johnson or Nyquistnoise.

• Shot noise is due to random fluctuations of charge carriers in an electrontube or solid-state device.

• Flicker noise occurs in solid-state components and vacuum tubes.Flicker noise power varies inversely with frequency, and so is oftencalled 1/f noise.

• Plasma noise is caused by random motion of charges in an ionized gas,such as a plasma, the ionosphere, or sparking electrical contacts.

• Quantum noise results from the quantized nature of charge carriers andphotons; it is often insignificant relative to other noise sources.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 15: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Internal Noise - Sources

• Thermal noise is the most basic type of noise, being caused by thermalvibration of bound charges. It is also known as Johnson or Nyquistnoise.

• Shot noise is due to random fluctuations of charge carriers in an electrontube or solid-state device.

• Flicker noise occurs in solid-state components and vacuum tubes.Flicker noise power varies inversely with frequency, and so is oftencalled 1/f noise.

• Plasma noise is caused by random motion of charges in an ionized gas,such as a plasma, the ionosphere, or sparking electrical contacts.

• Quantum noise results from the quantized nature of charge carriers andphotons; it is often insignificant relative to other noise sources.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 16: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Internal Noise - Sources

• Thermal noise is the most basic type of noise, being caused by thermalvibration of bound charges. It is also known as Johnson or Nyquistnoise.

• Shot noise is due to random fluctuations of charge carriers in an electrontube or solid-state device.

• Flicker noise occurs in solid-state components and vacuum tubes.Flicker noise power varies inversely with frequency, and so is oftencalled 1/f noise.

• Plasma noise is caused by random motion of charges in an ionized gas,such as a plasma, the ionosphere, or sparking electrical contacts.

• Quantum noise results from the quantized nature of charge carriers andphotons; it is often insignificant relative to other noise sources.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 17: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Internal Noise - Sources

• Thermal noise is the most basic type of noise, being caused by thermalvibration of bound charges. It is also known as Johnson or Nyquistnoise.

• Shot noise is due to random fluctuations of charge carriers in an electrontube or solid-state device.

• Flicker noise occurs in solid-state components and vacuum tubes.Flicker noise power varies inversely with frequency, and so is oftencalled 1/f noise.

• Plasma noise is caused by random motion of charges in an ionized gas,such as a plasma, the ionosphere, or sparking electrical contacts.

• Quantum noise results from the quantized nature of charge carriers andphotons; it is often insignificant relative to other noise sources.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 18: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Internal Noise - Sources

• Thermal noise is the most basic type of noise, being caused by thermalvibration of bound charges. It is also known as Johnson or Nyquistnoise.

• Shot noise is due to random fluctuations of charge carriers in an electrontube or solid-state device.

• Flicker noise occurs in solid-state components and vacuum tubes.Flicker noise power varies inversely with frequency, and so is oftencalled 1/f noise.

• Plasma noise is caused by random motion of charges in an ionized gas,such as a plasma, the ionosphere, or sparking electrical contacts.

• Quantum noise results from the quantized nature of charge carriers andphotons; it is often insignificant relative to other noise sources.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 19: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Internal Noise - Sources

• Thermal noise is the most basic type of noise, being caused by thermalvibration of bound charges. It is also known as Johnson or Nyquistnoise.

• Shot noise is due to random fluctuations of charge carriers in an electrontube or solid-state device.

• Flicker noise occurs in solid-state components and vacuum tubes.Flicker noise power varies inversely with frequency, and so is oftencalled 1/f noise.

• Plasma noise is caused by random motion of charges in an ionized gas,such as a plasma, the ionosphere, or sparking electrical contacts.

• Quantum noise results from the quantized nature of charge carriers andphotons; it is often insignificant relative to other noise sources.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 20: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Desired vs Undesired Noise

In some cases, such as radiometers or radio astronomy systems, the desiredsignal is actually the noise power received by an antenna, and it is necessary

to distinguish between the received noise power and the undesired noisegenerated by the receiver system itself.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 21: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

As you have seen, there are many types of noise sources. However, we willconcentrate more on thermal noise. Can you guess the reason?

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 22: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Before proceeding further, let’s recap the theory of random variables andprocesses ...

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 23: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Outline

1 Introduction

2 Random Variables

3 Random Processes

4 Noise Characterization

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 24: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Random Variable

Outcome of a random experi-ment could be numerical or non-numerical.

Non-numerical example: coin toss-ing experiment – Head or Tail.

For non numerical outcomes, onecan assign certain numbers.

We may assign 1 for Head and -1for Tail.

When such numerical values areassigned to a variable, the variableis called a random variable.

For the coin tossing experiment,variable x can take either 1 or -1 de-pending on the outcome.

Probability of a random variable xtaking values xi is Px(xi).

Discrete random variable: If {xi}are distinct , then x is a discrete ran-dom variable, such that

∑i

Px (xi) = 1.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 25: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Random Variable

Outcome of a random experi-ment could be numerical or non-numerical.

Non-numerical example: coin toss-ing experiment – Head or Tail.

For non numerical outcomes, onecan assign certain numbers.

We may assign 1 for Head and -1for Tail.

When such numerical values areassigned to a variable, the variableis called a random variable.

For the coin tossing experiment,variable x can take either 1 or -1 de-pending on the outcome.

Probability of a random variable xtaking values xi is Px(xi).

Discrete random variable: If {xi}are distinct , then x is a discrete ran-dom variable, such that

∑i

Px (xi) = 1.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 26: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Random Variable

Outcome of a random experi-ment could be numerical or non-numerical.

Non-numerical example: coin toss-ing experiment – Head or Tail.

For non numerical outcomes, onecan assign certain numbers.

We may assign 1 for Head and -1for Tail.

When such numerical values areassigned to a variable, the variableis called a random variable.

For the coin tossing experiment,variable x can take either 1 or -1 de-pending on the outcome.

Probability of a random variable xtaking values xi is Px(xi).

Discrete random variable: If {xi}are distinct , then x is a discrete ran-dom variable, such that

∑i

Px (xi) = 1.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 27: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Random Variable

Outcome of a random experi-ment could be numerical or non-numerical.

Non-numerical example: coin toss-ing experiment – Head or Tail.

For non numerical outcomes, onecan assign certain numbers.

We may assign 1 for Head and -1for Tail.

When such numerical values areassigned to a variable, the variableis called a random variable.

For the coin tossing experiment,variable x can take either 1 or -1 de-pending on the outcome.

Probability of a random variable xtaking values xi is Px(xi).

Discrete random variable: If {xi}are distinct , then x is a discrete ran-dom variable, such that

∑i

Px (xi) = 1.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 28: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Random Variable

Outcome of a random experi-ment could be numerical or non-numerical.

Non-numerical example: coin toss-ing experiment – Head or Tail.

For non numerical outcomes, onecan assign certain numbers.

We may assign 1 for Head and -1for Tail.

When such numerical values areassigned to a variable, the variableis called a random variable.

For the coin tossing experiment,variable x can take either 1 or -1 de-pending on the outcome.

Probability of a random variable xtaking values xi is Px(xi).

Discrete random variable: If {xi}are distinct , then x is a discrete ran-dom variable, such that

∑i

Px (xi) = 1.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 29: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Random Variable

Outcome of a random experi-ment could be numerical or non-numerical.

Non-numerical example: coin toss-ing experiment – Head or Tail.

For non numerical outcomes, onecan assign certain numbers.

We may assign 1 for Head and -1for Tail.

When such numerical values areassigned to a variable, the variableis called a random variable.

For the coin tossing experiment,variable x can take either 1 or -1 de-pending on the outcome.

Probability of a random variable xtaking values xi is Px(xi).

Discrete random variable: If {xi}are distinct , then x is a discrete ran-dom variable, such that

∑i

Px (xi) = 1.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 30: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Random Variable

Outcome of a random experi-ment could be numerical or non-numerical.

Non-numerical example: coin toss-ing experiment – Head or Tail.

For non numerical outcomes, onecan assign certain numbers.

We may assign 1 for Head and -1for Tail.

When such numerical values areassigned to a variable, the variableis called a random variable.

For the coin tossing experiment,variable x can take either 1 or -1 de-pending on the outcome.

Probability of a random variable xtaking values xi is Px(xi).

Discrete random variable: If {xi}are distinct , then x is a discrete ran-dom variable, such that

∑i

Px (xi) = 1.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 31: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Random Variable

Outcome of a random experi-ment could be numerical or non-numerical.

Non-numerical example: coin toss-ing experiment – Head or Tail.

For non numerical outcomes, onecan assign certain numbers.

We may assign 1 for Head and -1for Tail.

When such numerical values areassigned to a variable, the variableis called a random variable.

For the coin tossing experiment,variable x can take either 1 or -1 de-pending on the outcome.

Probability of a random variable xtaking values xi is Px(xi).

Discrete random variable: If {xi}are distinct , then x is a discrete ran-dom variable, such that

∑i

Px (xi) = 1.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 32: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Random Variable

Outcome of a random experi-ment could be numerical or non-numerical.

Non-numerical example: coin toss-ing experiment – Head or Tail.

For non numerical outcomes, onecan assign certain numbers.

We may assign 1 for Head and -1for Tail.

When such numerical values areassigned to a variable, the variableis called a random variable.

For the coin tossing experiment,variable x can take either 1 or -1 de-pending on the outcome.

Probability of a random variable xtaking values xi is Px(xi).

Discrete random variable: If {xi}are distinct , then x is a discrete ran-dom variable, such that

∑i

Px (xi) = 1.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 33: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Continuous Random Variables

Continuous RV can assume any value in a given interval.

Probability density function (PDF) px (x) is the appropriate definition for con-tinuous random variables.

Probability for a continuous RV is defined in terms of PDF as

P (x1 ≤ x ≤ x2) =

ˆ x2

x1

px (x) dx. (1)

Of course, ˆ ∞

−∞px (x) dx = 1. (2)

And cumulative distribution function (CDF) is defined as

Fx (x) = P (x ≤ x) =ˆ x

−∞px (x) dx. (3)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 34: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Continuous Random Variables

Continuous RV can assume any value in a given interval.

Probability density function (PDF) px (x) is the appropriate definition for con-tinuous random variables.

Probability for a continuous RV is defined in terms of PDF as

P (x1 ≤ x ≤ x2) =

ˆ x2

x1

px (x) dx. (1)

Of course, ˆ ∞

−∞px (x) dx = 1. (2)

And cumulative distribution function (CDF) is defined as

Fx (x) = P (x ≤ x) =ˆ x

−∞px (x) dx. (3)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 35: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Continuous Random Variables

Continuous RV can assume any value in a given interval.

Probability density function (PDF) px (x) is the appropriate definition for con-tinuous random variables.

Probability for a continuous RV is defined in terms of PDF as

P (x1 ≤ x ≤ x2) =

ˆ x2

x1

px (x) dx. (1)

Of course, ˆ ∞

−∞px (x) dx = 1. (2)

And cumulative distribution function (CDF) is defined as

Fx (x) = P (x ≤ x) =ˆ x

−∞px (x) dx. (3)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 36: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Continuous Random Variables

Continuous RV can assume any value in a given interval.

Probability density function (PDF) px (x) is the appropriate definition for con-tinuous random variables.

Probability for a continuous RV is defined in terms of PDF as

P (x1 ≤ x ≤ x2) =

ˆ x2

x1

px (x) dx. (1)

Of course, ˆ ∞

−∞px (x) dx = 1. (2)

And cumulative distribution function (CDF) is defined as

Fx (x) = P (x ≤ x) =ˆ x

−∞px (x) dx. (3)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 37: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Continuous Random Variables

Continuous RV can assume any value in a given interval.

Probability density function (PDF) px (x) is the appropriate definition for con-tinuous random variables.

Probability for a continuous RV is defined in terms of PDF as

P (x1 ≤ x ≤ x2) =

ˆ x2

x1

px (x) dx. (1)

Of course, ˆ ∞

−∞px (x) dx = 1. (2)

And cumulative distribution function (CDF) is defined as

Fx (x) = P (x ≤ x) =ˆ x

−∞px (x) dx. (3)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Continuous Random Variables

Continuous RV can assume any value in a given interval.

Probability density function (PDF) px (x) is the appropriate definition for con-tinuous random variables.

Probability for a continuous RV is defined in terms of PDF as

P (x1 ≤ x ≤ x2) =

ˆ x2

x1

px (x) dx. (1)

Of course, ˆ ∞

−∞px (x) dx = 1. (2)

And cumulative distribution function (CDF) is defined as

Fx (x) = P (x ≤ x) =ˆ x

−∞px (x) dx. (3)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Statistical Averages – Means

For a continuous RV case, the mean is given by

x̄ = E [x] =ˆ ∞

−∞xpx (x) dx. (4)

Mean of a function (y = g (x)) of a random variable is

g (x) = E [g (x)] =ˆ ∞

−∞g (x) px (x) dx. (5)

The above expression can be generalized for two random variables is of arandom variable as

g (x, y) = E [g (x, y)] =ˆ ∞

−∞

ˆ ∞

−∞g (x, y) pxy (x, y) dx. (6)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Statistical Averages – Means

For a continuous RV case, the mean is given by

x̄ = E [x] =ˆ ∞

−∞xpx (x) dx. (4)

Mean of a function (y = g (x)) of a random variable is

g (x) = E [g (x)] =ˆ ∞

−∞g (x) px (x) dx. (5)

The above expression can be generalized for two random variables is of arandom variable as

g (x, y) = E [g (x, y)] =ˆ ∞

−∞

ˆ ∞

−∞g (x, y) pxy (x, y) dx. (6)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Statistical Averages – Means

For a continuous RV case, the mean is given by

x̄ = E [x] =ˆ ∞

−∞xpx (x) dx. (4)

Mean of a function (y = g (x)) of a random variable is

g (x) = E [g (x)] =ˆ ∞

−∞g (x) px (x) dx. (5)

The above expression can be generalized for two random variables is of arandom variable as

g (x, y) = E [g (x, y)] =ˆ ∞

−∞

ˆ ∞

−∞g (x, y) pxy (x, y) dx. (6)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Statistical Averages – Means

For a continuous RV case, the mean is given by

x̄ = E [x] =ˆ ∞

−∞xpx (x) dx. (4)

Mean of a function (y = g (x)) of a random variable is

g (x) = E [g (x)] =ˆ ∞

−∞g (x) px (x) dx. (5)

The above expression can be generalized for two random variables is of arandom variable as

g (x, y) = E [g (x, y)] =ˆ ∞

−∞

ˆ ∞

−∞g (x, y) pxy (x, y) dx. (6)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Statistical Averages – Moments

The nth moment of a random variable x is defined as

xn =

ˆ ∞

−∞xnpx (x) dx. (7)

Similarly, the nth central moment of a random variable x is defined as

(x− x)n =

ˆ ∞

−∞(x− x)n px (x) dx. (8)

The second central moment of an RV x is called variance and denoted by σ2x ,

where σx is known as standard deviation.

σ2x = (x− x)2

= x2 − 2x2 + x2 = x2 − x2 (9)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Statistical Averages – Moments

The nth moment of a random variable x is defined as

xn =

ˆ ∞

−∞xnpx (x) dx. (7)

Similarly, the nth central moment of a random variable x is defined as

(x− x)n =

ˆ ∞

−∞(x− x)n px (x) dx. (8)

The second central moment of an RV x is called variance and denoted by σ2x ,

where σx is known as standard deviation.

σ2x = (x− x)2

= x2 − 2x2 + x2 = x2 − x2 (9)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 45: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Statistical Averages – Moments

The nth moment of a random variable x is defined as

xn =

ˆ ∞

−∞xnpx (x) dx. (7)

Similarly, the nth central moment of a random variable x is defined as

(x− x)n =

ˆ ∞

−∞(x− x)n px (x) dx. (8)

The second central moment of an RV x is called variance and denoted by σ2x ,

where σx is known as standard deviation.

σ2x = (x− x)2

= x2 − 2x2 + x2 = x2 − x2 (9)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 46: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Statistical Averages – Moments

The nth moment of a random variable x is defined as

xn =

ˆ ∞

−∞xnpx (x) dx. (7)

Similarly, the nth central moment of a random variable x is defined as

(x− x)n =

ˆ ∞

−∞(x− x)n px (x) dx. (8)

The second central moment of an RV x is called variance and denoted by σ2x ,

where σx is known as standard deviation.

σ2x = (x− x)2

= x2 − 2x2 + x2 = x2 − x2 (9)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Statistical Averages – Corollary

If x and x are independent RVs and

z = x + y, (10)

thenz = x + y (11)

σ2z = σ2

x + σ2y . (12)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Statistical Averages – Corollary

If x and x are independent RVs and

z = x + y, (10)

thenz = x + y (11)

σ2z = σ2

x + σ2y . (12)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Statistical Averages – Corollary

If x and x are independent RVs and

z = x + y, (10)

thenz = x + y (11)

σ2z = σ2

x + σ2y . (12)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Central-Limit Theorem

If x and x are independent RVs and

z = x + y, (13)

then

pz (z) =ˆ ∞

−∞px (x) py (z− x) dx. (14)

From the above equation, it is clear that the PDF pz (z) is the convolution ofPDFs px (x) and py (y) . This result can be extended to n number of RVs.

Under certain conditions, sum of large number of independent random vari-ables tends to be a Gaussian random variable, independent of the PDFs of therandom variables involved. This is the central-limit theorem.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Central-Limit Theorem

If x and x are independent RVs and

z = x + y, (13)

then

pz (z) =ˆ ∞

−∞px (x) py (z− x) dx. (14)

From the above equation, it is clear that the PDF pz (z) is the convolution ofPDFs px (x) and py (y) . This result can be extended to n number of RVs.

Under certain conditions, sum of large number of independent random vari-ables tends to be a Gaussian random variable, independent of the PDFs of therandom variables involved. This is the central-limit theorem.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Central-Limit Theorem

If x and x are independent RVs and

z = x + y, (13)

then

pz (z) =ˆ ∞

−∞px (x) py (z− x) dx. (14)

From the above equation, it is clear that the PDF pz (z) is the convolution ofPDFs px (x) and py (y) . This result can be extended to n number of RVs.

Under certain conditions, sum of large number of independent random vari-ables tends to be a Gaussian random variable, independent of the PDFs of therandom variables involved. This is the central-limit theorem.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 53: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Central-Limit Theorem

If x and x are independent RVs and

z = x + y, (13)

then

pz (z) =ˆ ∞

−∞px (x) py (z− x) dx. (14)

From the above equation, it is clear that the PDF pz (z) is the convolution ofPDFs px (x) and py (y) . This result can be extended to n number of RVs.

Under certain conditions, sum of large number of independent random vari-ables tends to be a Gaussian random variable, independent of the PDFs of therandom variables involved. This is the central-limit theorem.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Central-Limit Theorem – Demonstration

px(x)

x1-1

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Central-Limit Theorem – Demonstration

px(x)

x1-1

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Central-Limit Theorem – Demonstration

px(x) px(x) * px(x)

x x1-1 2-2

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Central-Limit Theorem – Demonstration

px(x) px(x) * px(x) px(x) * px(x) * px(x)

x xx1-1 2-2 -3 3

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

The Gaussian (Normal) PDF

- 1

1 2 3

- 3

- 2

- 1

p x(x

)

0.8

0.6

0.4

0.2

0.0

−5 −3 1 3 5

x

1.0

−1 0 2 4−2−4

0,μ= 2 1.0,σ =

px (x) =1

σ√

2πe−(x−µ)2/2σ2

Fx (x) =1

σ√

ˆ x

−∞e−(x−µ)2/2σ2

dx = 1−Q(

x− µ

σ

)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

The Gaussian (Normal) PDF

- 1

1 2 3

- 3

- 2

- 1

p x(x

)

0.8

0.6

0.4

0.2

0.0

−5 −3 1 3 5

x

1.0

−1 0 2 4−2−4

0,μ= 2 1.0,σ =

px (x) =1

σ√

2πe−(x−µ)2/2σ2

Fx (x) =1

σ√

ˆ x

−∞e−(x−µ)2/2σ2

dx = 1−Q(

x− µ

σ

)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 60: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

The Gaussian (Normal) PDF

- 1

1 2 3

- 3

- 2

- 1

p x(x

)

0.8

0.6

0.4

0.2

0.0

−5 −3 1 3 5

x

1.0

−1 0 2 4−2−4

0,μ=0,μ=

2 0.2,σ =2 1.0,σ =

px (x) =1

σ√

2πe−(x−µ)2/2σ2

Fx (x) =1

σ√

ˆ x

−∞e−(x−µ)2/2σ2

dx = 1−Q(

x− µ

σ

)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 61: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

The Gaussian (Normal) PDF

- 1

1 2 3

- 3

- 2

- 1

p x(x

)

0.8

0.6

0.4

0.2

0.0

−5 −3 1 3 5

x

1.0

−1 0 2 4−2−4

0,μ=0,μ=0,μ=

2 0.2,σ =2 1.0,σ =2 5.0,σ =

px (x) =1

σ√

2πe−(x−µ)2/2σ2

Fx (x) =1

σ√

ˆ x

−∞e−(x−µ)2/2σ2

dx = 1−Q(

x− µ

σ

)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 62: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

The Gaussian (Normal) PDF

- 1

1 2 3

- 3

- 2

- 1

p x(x

)

0.8

0.6

0.4

0.2

0.0

−5 −3 1 3 5

x

1.0

−1 0 2 4−2−4

0,μ=0,μ=0,μ=−2,μ=

2 0.2,σ =2 1.0,σ =2 5.0,σ =2 0.5,σ =

px (x) =1

σ√

2πe−(x−µ)2/2σ2

Fx (x) =1

σ√

ˆ x

−∞e−(x−µ)2/2σ2

dx = 1−Q(

x− µ

σ

)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 63: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

The Gaussian (Normal) PDF

- 1

1 2 3

- 3

- 2

- 1

x

0.8

0.6

0.4

0.2

0.0

1.0

−5 −3 1 3 5−1 0 2 4−2−4

0,μ= 2 1.0,σ =

F x(x

)

p x(x

)

0.8

0.6

0.4

0.2

0.0

−5 −3 1 3 5

x

1.0

−1 0 2 4−2−4

0,μ=0,μ=0,μ=−2,μ=

2 0.2,σ =2 1.0,σ =2 5.0,σ =2 0.5,σ =

px (x) =1

σ√

2πe−(x−µ)2/2σ2

Fx (x) =1

σ√

ˆ x

−∞e−(x−µ)2/2σ2

dx = 1−Q(

x− µ

σ

)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

The Gaussian (Normal) PDF

- 1

1 2 3

- 3

- 2

- 1

x

0.8

0.6

0.4

0.2

0.0

1.0

−5 −3 1 3 5−1 0 2 4−2−4

0,μ=0,μ=0,μ=−2,μ=

2 0.2,σ =2 1.0,σ =2 5.0,σ =2 0.5,σ =

F x(x

)

p x(x

)

0.8

0.6

0.4

0.2

0.0

−5 −3 1 3 5

x

1.0

−1 0 2 4−2−4

0,μ=0,μ=0,μ=−2,μ=

2 0.2,σ =2 1.0,σ =2 5.0,σ =2 0.5,σ =

px (x) =1

σ√

2πe−(x−µ)2/2σ2

Fx (x) =1

σ√

ˆ x

−∞e−(x−µ)2/2σ2

dx = 1−Q(

x− µ

σ

)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

The Gaussian (Normal) PDF – Interpretation

0.0

0.1

0.2

0.3

0.4

−2σ −1σ 1σ−3σ 3σ0 2σ

34.1% 34.1%

13.6%2.1%

13.6% 0.1%0.1% 2.1%

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

The Gaussian (Normal) PDF – Interpretation

0.0

0.1

0.2

0.3

0.4

−2σ −1σ 1σ−3σ 3σ0 2σ

34.1% 34.1%

13.6%2.1%

13.6% 0.1%0.1% 2.1%

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Outline

1 Introduction

2 Random Variables

3 Random Processes

4 Noise Characterization

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Random Process

t

x(t, ζ1)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Random Process

t

x(t, ζ1)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Random Process

t

t

x(t, ζ1)

x(t, ζ2)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Random Process

t

t

t

x(t, ζ1)

x(t, ζ2)

x(t, ζ3)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Random Process

t

t

t

t

x(t, ζ1)

x(t, ζ2)

x(t, ζ3)

x(t, ζ4)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Random Process

t

t

t

t

x(t, ζ1)

x(t, ζ2)

x(t, ζ3)

x(t, ζ4)

Sample function

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Random Process

t

t

t

t

x(t, ζ1)

x(t, ζ2)

x(t, ζ3)

x(t, ζ4)

Ensemble

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Random Process

t

t

t

t

t1

x(t1) = x1

x(t, ζ1)

x(t, ζ2)

x(t, ζ3)

x(t, ζ4)

Randomvariable

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Random Process

t

t

t

t

t1 t2

x(t1) = x1 x(t2) = x2

x(t, ζ1)

x(t, ζ2)

x(t, ζ3)

x(t, ζ4)

Randomvariable

Randomvariable x isa function

of time

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Random Process

A random variable that is a function of time is called a random process orstochastic process.

In other words, a random process is just a collection of an infinite number ofRVs, which are generally dependent.

So, a random process is completely described by the joint PDF

px1x2···xn (x1, x2, . . . , xn)

which can also be expressed as

px1x2···xn (x1, x2, . . . , xn; t1, t2, . . . , tn)

or simply

px (x; t)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 78: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Random Process

A random variable that is a function of time is called a random process orstochastic process.

In other words, a random process is just a collection of an infinite number ofRVs, which are generally dependent.

So, a random process is completely described by the joint PDF

px1x2···xn (x1, x2, . . . , xn)

which can also be expressed as

px1x2···xn (x1, x2, . . . , xn; t1, t2, . . . , tn)

or simply

px (x; t)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 79: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Random Process

A random variable that is a function of time is called a random process orstochastic process.

In other words, a random process is just a collection of an infinite number ofRVs, which are generally dependent.

So, a random process is completely described by the joint PDF

px1x2···xn (x1, x2, . . . , xn)

which can also be expressed as

px1x2···xn (x1, x2, . . . , xn; t1, t2, . . . , tn)

or simply

px (x; t)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 80: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Random Process

A random variable that is a function of time is called a random process orstochastic process.

In other words, a random process is just a collection of an infinite number ofRVs, which are generally dependent.

So, a random process is completely described by the joint PDF

px1x2···xn (x1, x2, . . . , xn)

which can also be expressed as

px1x2···xn (x1, x2, . . . , xn; t1, t2, . . . , tn)

or simply

px (x; t)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 81: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Random Process

A random variable that is a function of time is called a random process orstochastic process.

In other words, a random process is just a collection of an infinite number ofRVs, which are generally dependent.

So, a random process is completely described by the joint PDF

px1x2···xn (x1, x2, . . . , xn)

which can also be expressed as

px1x2···xn (x1, x2, . . . , xn; t1, t2, . . . , tn)

or simply

px (x; t)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 82: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Random Process

A random variable that is a function of time is called a random process orstochastic process.

In other words, a random process is just a collection of an infinite number ofRVs, which are generally dependent.

So, a random process is completely described by the joint PDF

px1x2···xn (x1, x2, . . . , xn)

which can also be expressed as

px1x2···xn (x1, x2, . . . , xn; t1, t2, . . . , tn)

or simply

px (x; t)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 83: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Random Process

A random variable that is a function of time is called a random process orstochastic process.

In other words, a random process is just a collection of an infinite number ofRVs, which are generally dependent.

So, a random process is completely described by the joint PDF

px1x2···xn (x1, x2, . . . , xn)

which can also be expressed as

px1x2···xn (x1, x2, . . . , xn; t1, t2, . . . , tn)

or simply

px (x; t)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Random Process ... A Few More Things

We can always derive a lower order PDF from a higher order PDF by integra-tion. For instance,

px1 (x1) =

ˆ ∞

−∞px1x2 (x1, x2) dx2. (15)

The mean x (t) of a random process x (t) can be determined from the first-order PDF as

x (t) =ˆ ∞

−∞xpx (x; t) dx. (16)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Random Process ... A Few More Things

We can always derive a lower order PDF from a higher order PDF by integra-tion. For instance,

px1 (x1) =

ˆ ∞

−∞px1x2 (x1, x2) dx2. (15)

The mean x (t) of a random process x (t) can be determined from the first-order PDF as

x (t) =ˆ ∞

−∞xpx (x; t) dx. (16)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Random Process ... A Few More Things

We can always derive a lower order PDF from a higher order PDF by integra-tion. For instance,

px1 (x1) =

ˆ ∞

−∞px1x2 (x1, x2) dx2. (15)

The mean x (t) of a random process x (t) can be determined from the first-order PDF as

x (t) =ˆ ∞

−∞xpx (x; t) dx. (16)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

A Few Other Types of Random Process

t

t

t

t

x(t, ζ1)

x(t, ζ2)

x(t, ζ3)

x(t, ζ4)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

A Few Other Types of Random Process

t

t

t

t

x(t, ζ1)

x(t, ζ2)

x(t, ζ3)

x(t, ζ4)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

A Few Other Types of Random Process

t

t

t

t

x(t, ζ1)

x(t, ζ2)

x(t, ζ3)

x(t, ζ4)

t

t

t

t

x(t, ζ1)

x(t, ζ2)

x(t, ζ3)

x(t, ζ4)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Auto-Correlation of a Random Process

x(t)

x1 x2

t1 t2

t

t

t

t

τ

Rx (t1, t2) = x (t1) x (t2) = x1x2 =

ˆ ∞

−∞

ˆ ∞

−∞x1x2px1x2 (x1, x2) dx1dx2

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Auto-Correlation of a Random Processx(t)

x1 x2

t1 t2

t

t

t

t

τ

Rx (t1, t2) = x (t1) x (t2) = x1x2 =

ˆ ∞

−∞

ˆ ∞

−∞x1x2px1x2 (x1, x2) dx1dx2

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Auto-Correlation of a Random Processx(t) y(t)

x1 x2

t1 t2 t1 t2

y1 y2

t

t

t

t

t

t

t

t

τ τ

Rx (t1, t2) = x (t1) x (t2) = x1x2 =

ˆ ∞

−∞

ˆ ∞

−∞x1x2px1x2 (x1, x2) dx1dx2

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Auto-Correlation of a Random Processx(t) y(t)

x1 x2

t1 t2 t1 t2

y1 y2

t

t

t

t

t

t

t

t

τ

Rx(τ)Ry(τ)

τ τ

Rx (t1, t2) = x (t1) x (t2) = x1x2 =

ˆ ∞

−∞

ˆ ∞

−∞x1x2px1x2 (x1, x2) dx1dx2

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Auto-Correlation of a Random Processx(t) y(t)

x1 x2

t1 t2 t1 t2

y1 y2

t

t

t

t

t

t

t

t

τ

Rx(τ)Ry(τ)

τ τ

Rx (t1, t2) = x (t1) x (t2) = x1x2 =

ˆ ∞

−∞

ˆ ∞

−∞x1x2px1x2 (x1, x2) dx1dx2

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Stationary Random Process

A random process whose statistical characteristics do not change with time isclassified as a stationary random process.

t

t

t

t

t

t

t

t

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Stationary Random Process

A random process whose statistical characteristics do not change with time isclassified as a stationary random process.

t

t

t

t

t

t

t

t

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Stationary Random Process

A random process whose statistical characteristics do not change with time isclassified as a stationary random process.

t

t

t

t

t

t

t

t

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Stationary Random Process

px (x; t) = px (x) (17)

Rx (t1, t2) = Rx (t2 − t1) (18)

Rx (τ) = x (t) x (t + τ) (19)

A process is called stationary process only when first-order as well as all thehigher order PDFs, such as px1x2 ...xn (x1, x2, . . . , xn) are all independent of thechoice of origin.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Stationary Random Process

px (x; t) = px (x) (17)

Rx (t1, t2) = Rx (t2 − t1) (18)

Rx (τ) = x (t) x (t + τ) (19)

A process is called stationary process only when first-order as well as all thehigher order PDFs, such as px1x2 ...xn (x1, x2, . . . , xn) are all independent of thechoice of origin.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Stationary Random Process

px (x; t) = px (x) (17)

Rx (t1, t2) = Rx (t2 − t1) (18)

Rx (τ) = x (t) x (t + τ) (19)

A process is called stationary process only when first-order as well as all thehigher order PDFs, such as px1x2 ...xn (x1, x2, . . . , xn) are all independent of thechoice of origin.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 101: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Stationary Random Process

px (x; t) = px (x) (17)

Rx (t1, t2) = Rx (t2 − t1) (18)

Rx (τ) = x (t) x (t + τ) (19)

A process is called stationary process only when first-order as well as all thehigher order PDFs, such as px1x2 ...xn (x1, x2, . . . , xn) are all independent of thechoice of origin.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Stationary Random Process

px (x; t) = px (x) (17)

Rx (t1, t2) = Rx (t2 − t1) (18)

Rx (τ) = x (t) x (t + τ) (19)

A process is called stationary process only when first-order as well as all thehigher order PDFs, such as px1x2 ...xn (x1, x2, . . . , xn) are all independent of thechoice of origin.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Wide-Sense Stationary Random Process

A process may not be stationary in strict sense, yet it may have a mean valueand an auto-correlation function that are independent of the shift of time ori-gin.

This meansx (t) = constant (20)

andRx (t1, t2) = Rx (τ) , τ = t2 − t1. (21)

Such a process is known as wide-sense stationary, or weakly stationary pro-cess.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Wide-Sense Stationary Random Process

A process may not be stationary in strict sense, yet it may have a mean valueand an auto-correlation function that are independent of the shift of time ori-gin.

This meansx (t) = constant (20)

andRx (t1, t2) = Rx (τ) , τ = t2 − t1. (21)

Such a process is known as wide-sense stationary, or weakly stationary pro-cess.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 105: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Wide-Sense Stationary Random Process

A process may not be stationary in strict sense, yet it may have a mean valueand an auto-correlation function that are independent of the shift of time ori-gin.

This meansx (t) = constant (20)

andRx (t1, t2) = Rx (τ) , τ = t2 − t1. (21)

Such a process is known as wide-sense stationary, or weakly stationary pro-cess.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 106: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Wide-Sense Stationary Random Process

A process may not be stationary in strict sense, yet it may have a mean valueand an auto-correlation function that are independent of the shift of time ori-gin.

This meansx (t) = constant (20)

andRx (t1, t2) = Rx (τ) , τ = t2 − t1. (21)

Such a process is known as wide-sense stationary, or weakly stationary pro-cess.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Ergodic Random Process

In ergodic process, ensemble averages are equal to the time averages of anysample function. Thus for an ergodic process x (t) ,

x (t) = x̃ (t)Rx (τ) = Rx (τ) ,

where

x̃ (t) = limT→∞

1T

ˆ T/2

−T/2x (t) dt

and

Rx (τ) = limT→∞

1T

ˆ T/2

−T/2x (t) x (t + τ) dt.

An Ergodic process is neccessarily a stationary process; but the converse is nottrue.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Ergodic Random Process

In ergodic process, ensemble averages are equal to the time averages of anysample function. Thus for an ergodic process x (t) ,

x (t) = x̃ (t)Rx (τ) = Rx (τ) ,

where

x̃ (t) = limT→∞

1T

ˆ T/2

−T/2x (t) dt

and

Rx (τ) = limT→∞

1T

ˆ T/2

−T/2x (t) x (t + τ) dt.

An Ergodic process is neccessarily a stationary process; but the converse is nottrue.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 109: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Ergodic Random Process

In ergodic process, ensemble averages are equal to the time averages of anysample function. Thus for an ergodic process x (t) ,

x (t) = x̃ (t)Rx (τ) = Rx (τ) ,

where

x̃ (t) = limT→∞

1T

ˆ T/2

−T/2x (t) dt

and

Rx (τ) = limT→∞

1T

ˆ T/2

−T/2x (t) x (t + τ) dt.

An Ergodic process is neccessarily a stationary process; but the converse is nottrue.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 110: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Ergodic Random Process

In ergodic process, ensemble averages are equal to the time averages of anysample function. Thus for an ergodic process x (t) ,

x (t) = x̃ (t)Rx (τ) = Rx (τ) ,

where

x̃ (t) = limT→∞

1T

ˆ T/2

−T/2x (t) dt

and

Rx (τ) = limT→∞

1T

ˆ T/2

−T/2x (t) x (t + τ) dt.

An Ergodic process is neccessarily a stationary process; but the converse is nottrue.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Why Ergodic Random Processes Notion is Important?

Because many of the stationary processes encountered in practice are ergodicwith respect to at least send-order averages, i.e., with respect to mean and

auto-correlation values.

And we need only the first- and second-order averages when we are dealingwith linear systems.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 112: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Why Ergodic Random Processes Notion is Important?

Because many of the stationary processes encountered in practice are ergodicwith respect to at least send-order averages, i.e., with respect to mean and

auto-correlation values.

And we need only the first- and second-order averages when we are dealingwith linear systems.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 113: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Why Ergodic Random Processes Notion is Important?

Because many of the stationary processes encountered in practice are ergodicwith respect to at least send-order averages, i.e., with respect to mean and

auto-correlation values.

And we need only the first- and second-order averages when we are dealingwith linear systems.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Classification of Random Processes

Random process

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Classification of Random Processes

Random process

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Classification of Random Processes

Random process

Wide-sense stationary

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Classification of Random Processes

Random process

Wide-sense stationary

Stationary

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Classification of Random Processes

Random process

Wide-sense stationary

Stationary

Ergodic

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

PSD of a Random Process

PSD of a random process x (t) is given as

Sx (ω) = limT→∞

[|XT (ω)|2

T

], (22)

where XT (ω) is the Fourier transform of the truncated random processx (t) rect (t/T) .

PSD is related to auto-correlation function as

Sx (ω) =

ˆ ∞

−∞Rx (τ) e−jωtdτ (23)

where Rx (τ) = x∗ (t) x (t + τ).

The average power of a wide-sense random process x (t) is its mean squarevalue

Px = x2 = Rx (0) =1

ˆ ∞

−∞Sx (ω) dω. (24)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

PSD of a Random Process

PSD of a random process x (t) is given as

Sx (ω) = limT→∞

[|XT (ω)|2

T

], (22)

where XT (ω) is the Fourier transform of the truncated random processx (t) rect (t/T) .

PSD is related to auto-correlation function as

Sx (ω) =

ˆ ∞

−∞Rx (τ) e−jωtdτ (23)

where Rx (τ) = x∗ (t) x (t + τ).

The average power of a wide-sense random process x (t) is its mean squarevalue

Px = x2 = Rx (0) =1

ˆ ∞

−∞Sx (ω) dω. (24)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

PSD of a Random Process

PSD of a random process x (t) is given as

Sx (ω) = limT→∞

[|XT (ω)|2

T

], (22)

where XT (ω) is the Fourier transform of the truncated random processx (t) rect (t/T) .

PSD is related to auto-correlation function as

Sx (ω) =

ˆ ∞

−∞Rx (τ) e−jωtdτ (23)

where Rx (τ) = x∗ (t) x (t + τ).

The average power of a wide-sense random process x (t) is its mean squarevalue

Px = x2 = Rx (0) =1

ˆ ∞

−∞Sx (ω) dω. (24)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

PSD of a Random Process

PSD of a random process x (t) is given as

Sx (ω) = limT→∞

[|XT (ω)|2

T

], (22)

where XT (ω) is the Fourier transform of the truncated random processx (t) rect (t/T) .

PSD is related to auto-correlation function as

Sx (ω) =

ˆ ∞

−∞Rx (τ) e−jωtdτ (23)

where Rx (τ) = x∗ (t) x (t + τ).

The average power of a wide-sense random process x (t) is its mean squarevalue

Px = x2 = Rx (0) =1

ˆ ∞

−∞Sx (ω) dω. (24)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Transmission of Random Processes Through LinearSystems

x(t) y(t)h(t)

H(ω)

Ry (τ) = h (τ) ∗ h (−τ) ∗ Rx (τ) (25)

Sy (ω) = |H (ω)|2 Sx (ω) (26)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Transmission of Random Processes Through LinearSystems

x(t) y(t)h(t)

H(ω)

Ry (τ) = h (τ) ∗ h (−τ) ∗ Rx (τ) (25)

Sy (ω) = |H (ω)|2 Sx (ω) (26)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Transmission of Random Processes Through LinearSystems

x(t) y(t)h(t)

H(ω)

Ry (τ) = h (τ) ∗ h (−τ) ∗ Rx (τ) (25)

Sy (ω) = |H (ω)|2 Sx (ω) (26)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Transmission of Random Processes Through LinearSystems

x(t) y(t)h(t)

H(ω)

Ry (τ) = h (τ) ∗ h (−τ) ∗ Rx (τ) (25)

Sy (ω) = |H (ω)|2 Sx (ω) (26)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Sum of Random Processes

If two stationary processes (at least in the wide sense) x (t) and y (t) are addedto form a process z (t), i.e.,

z (t) = x (t) + y (t) ,

thenRz (τ) = Rx (τ) + Ry (τ) + 2 x y. (27)

Most processes of interest in communication problems have zero means. So,if x (t) and y (t) are uncorrelated with either x = 0 or y = 0

Rz (τ) = Rx (τ) + Ry (τ) (28)

andSz (ω) = Sx (ω) + Sy (ω) . (29)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Sum of Random Processes

If two stationary processes (at least in the wide sense) x (t) and y (t) are addedto form a process z (t), i.e.,

z (t) = x (t) + y (t) ,

thenRz (τ) = Rx (τ) + Ry (τ) + 2 x y. (27)

Most processes of interest in communication problems have zero means. So,if x (t) and y (t) are uncorrelated with either x = 0 or y = 0

Rz (τ) = Rx (τ) + Ry (τ) (28)

andSz (ω) = Sx (ω) + Sy (ω) . (29)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Sum of Random Processes

If two stationary processes (at least in the wide sense) x (t) and y (t) are addedto form a process z (t), i.e.,

z (t) = x (t) + y (t) ,

thenRz (τ) = Rx (τ) + Ry (τ) + 2 x y. (27)

Most processes of interest in communication problems have zero means. So,if x (t) and y (t) are uncorrelated with either x = 0 or y = 0

Rz (τ) = Rx (τ) + Ry (τ) (28)

andSz (ω) = Sx (ω) + Sy (ω) . (29)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Outline

1 Introduction

2 Random Variables

3 Random Processes

4 Noise Characterization

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

As we have seen, there are many types of noise sources. However, we willconcentrate more on thermal noise for the reasons metioned ealier. So, let’s

study about thermal noise in this section.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Thermal (Johnson-Nyquist) Noise

T°K

R v(t)

v(t)

t

Random motions of electrons produce small, random voltage fluctuations atthe resistor terminals, which have a zero average value but a nonzero rootmean square (rms) value given by Planck’s blackbody radiation law,

Vn =

√4hfBR

ehf /kT − 1, (30)

where h and k are Plank’s and Boltzmann’s constants, respectively.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Thermal (Johnson-Nyquist) Noise

T°K

R v(t)

v(t)

t

Random motions of electrons produce small, random voltage fluctuations atthe resistor terminals, which have a zero average value but a nonzero rootmean square (rms) value given by Planck’s blackbody radiation law,

Vn =

√4hfBR

ehf /kT − 1, (30)

where h and k are Plank’s and Boltzmann’s constants, respectively.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Thermal (Johnson-Nyquist) Noise

T°K

R v(t)

v(t)

t

Random motions of electrons produce small, random voltage fluctuations atthe resistor terminals, which have a zero average value but a nonzero rootmean square (rms) value given by Planck’s blackbody radiation law,

Vn =

√4hfBR

ehf /kT − 1, (30)

where h and k are Plank’s and Boltzmann’s constants, respectively.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Rayleigh–Jeans Approximation

At microwave frequencies, where hf � kT, (30) can be simplified to

Vn =√

4kTBR. (31)

For very high frequencies or very low temperatures, however, this approxi-mation may be invalid, in which case (30) should be used.�

�From the equation (31), it is evident that thermal noise is independent of

frequency. So, thermal noise is a white noise.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Rayleigh–Jeans Approximation

At microwave frequencies, where hf � kT, (30) can be simplified to

Vn =√

4kTBR. (31)

For very high frequencies or very low temperatures, however, this approxi-mation may be invalid, in which case (30) should be used.�

�From the equation (31), it is evident that thermal noise is independent of

frequency. So, thermal noise is a white noise.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 137: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Rayleigh–Jeans Approximation

At microwave frequencies, where hf � kT, (30) can be simplified to

Vn =√

4kTBR. (31)

For very high frequencies or very low temperatures, however, this approxi-mation may be invalid, in which case (30) should be used.

�From the equation (31), it is evident that thermal noise is independent of

frequency. So, thermal noise is a white noise.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 138: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Rayleigh–Jeans Approximation

At microwave frequencies, where hf � kT, (30) can be simplified to

Vn =√

4kTBR. (31)

For very high frequencies or very low temperatures, however, this approxi-mation may be invalid, in which case (30) should be used.�

�From the equation (31), it is evident that thermal noise is independent of

frequency. So, thermal noise is a white noise.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Maximum Available Noise Power

R

R

Vn

Idealbandpassfilter

B

Power delivered to the load shown in the above figure is

Pn =

(Vn

2R

)2R = kTB, (32)

since Vn is an rms voltage. This important result gives the maximum availablenoise power from the noisy resistor at temperature T .��

Independent white noise sources can be treated as Gaussian-distributedrandom variables, so the noise powers (variances) of independent noise

sources are additive.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Maximum Available Noise Power

R

R

Vn

Idealbandpassfilter

B

Power delivered to the load shown in the above figure is

Pn =

(Vn

2R

)2R = kTB, (32)

since Vn is an rms voltage. This important result gives the maximum availablenoise power from the noisy resistor at temperature T .��

Independent white noise sources can be treated as Gaussian-distributedrandom variables, so the noise powers (variances) of independent noise

sources are additive.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Maximum Available Noise Power

R

R

Vn

Idealbandpassfilter

B

Power delivered to the load shown in the above figure is

Pn =

(Vn

2R

)2R = kTB, (32)

since Vn is an rms voltage. This important result gives the maximum availablenoise power from the noisy resistor at temperature T .

��

Independent white noise sources can be treated as Gaussian-distributedrandom variables, so the noise powers (variances) of independent noise

sources are additive.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Maximum Available Noise Power

R

R

Vn

Idealbandpassfilter

B

Power delivered to the load shown in the above figure is

Pn =

(Vn

2R

)2R = kTB, (32)

since Vn is an rms voltage. This important result gives the maximum availablenoise power from the noisy resistor at temperature T .��

Independent white noise sources can be treated as Gaussian-distributedrandom variables, so the noise powers (variances) of independent noise

sources are additive.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Thermal Noise - Some Observations

• As B→ 0, Pn → 0. This means that systems with smaller bandwidthscollect less noise power.

• As T → 0, Pn → 0. This means that cooler devices and componentsgenerate less noise power.

• As B→ ∞, Pn → ∞. This is the so-called ultraviolet catastrophe, whichdoes not occur in reality because Rayleigh-Jeans approximation is validonly when hf � kT.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Thermal Noise - Some Observations

• As B→ 0, Pn → 0. This means that systems with smaller bandwidthscollect less noise power.

• As T → 0, Pn → 0. This means that cooler devices and componentsgenerate less noise power.

• As B→ ∞, Pn → ∞. This is the so-called ultraviolet catastrophe, whichdoes not occur in reality because Rayleigh-Jeans approximation is validonly when hf � kT.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 145: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Thermal Noise - Some Observations

• As B→ 0, Pn → 0. This means that systems with smaller bandwidthscollect less noise power.

• As T → 0, Pn → 0. This means that cooler devices and componentsgenerate less noise power.

• As B→ ∞, Pn → ∞. This is the so-called ultraviolet catastrophe, whichdoes not occur in reality because Rayleigh-Jeans approximation is validonly when hf � kT.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 146: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Thermal Noise - Some Observations

• As B→ 0, Pn → 0. This means that systems with smaller bandwidthscollect less noise power.

• As T → 0, Pn → 0. This means that cooler devices and componentsgenerate less noise power.

• As B→ ∞, Pn → ∞. This is the so-called ultraviolet catastrophe, whichdoes not occur in reality because Rayleigh-Jeans approximation is validonly when hf � kT.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

The characterization of noise effects in communication systems in terms ofnoise temperature and noise figure will apply to all types of noise, regardless

of the source, as long as the spectrum of the noise is relatively flat over thebandwidth of the system.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Equivalent Noise Temperature

RR

No No

Te

Te = kBRR

NoArbitrarywhitenoisesource

If an arbitrary source of noise (thermal or non-thermal) is white, it can bemodeled as an equivalent thermal noise source, and characterized with anequivalent noise temperature, Te.

Te =N0kB

(33)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Equivalent Noise Temperature

RR

No No

Te

Te = kBRR

NoArbitrarywhitenoisesource

If an arbitrary source of noise (thermal or non-thermal) is white, it can bemodeled as an equivalent thermal noise source, and characterized with anequivalent noise temperature, Te.

Te =N0kB

(33)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Equivalent Noise Temperature

RR

No No

Te

Te = kBRR

NoArbitrarywhitenoisesource

If an arbitrary source of noise (thermal or non-thermal) is white, it can bemodeled as an equivalent thermal noise source, and characterized with anequivalent noise temperature, Te.

Te =N0kB

(33)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Equivalent Noise Temperature of a Noisy Amplifier

R RNoiselessamplifier

Ni No = GkTeB

NoTe =GkB

G

R RNoisy

amplifier

Ts = 0 K

Ni = 0 No

eGT

Te =N0

GkB(34)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Equivalent Noise Temperature of a Noisy Amplifier

R RNoiselessamplifier

Ni No = GkTeB

NoTe =GkB

G

R RNoisy

amplifier

Ts = 0 K

Ni = 0 No

eGT

Te =N0

GkB(34)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Noise Figure

R

R

Pi = Si +Ni Po = So +No

NoisynetworkG, B, Te

T0 = 290 K

Noise figure, F, is a measure of this reduction in signal-to-noise ratio, and isdefined as

F =Si/NiSo/No

≥ 1. (35)

By definition, the input noise power is assumed to be the noise power result-ing from a matched resistor at T0 = 290K, i.e., Ni = kT0B.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Noise Figure

R

R

Pi = Si +Ni Po = So +No

NoisynetworkG, B, Te

T0 = 290 K

Noise figure, F, is a measure of this reduction in signal-to-noise ratio, and isdefined as

F =Si/NiSo/No

≥ 1. (35)

By definition, the input noise power is assumed to be the noise power result-ing from a matched resistor at T0 = 290K, i.e., Ni = kT0B.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Noise Figure

R

R

Pi = Si +Ni Po = So +No

NoisynetworkG, B, Te

T0 = 290 K

Noise figure, F, is a measure of this reduction in signal-to-noise ratio, and isdefined as

F =Si/NiSo/No

≥ 1. (35)

By definition, the input noise power is assumed to be the noise power result-ing from a matched resistor at T0 = 290K, i.e., Ni = kT0B.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

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Introduction Random Variables Random Processes Noise Characterization

Noise Figure

R

R

Pi = Si +Ni Po = So +No

NoisynetworkG, B, Te

T0 = 290 K

Noise figure, F, is a measure of this reduction in signal-to-noise ratio, and isdefined as

F =Si/NiSo/No

≥ 1. (35)

By definition, the input noise power is assumed to be the noise power result-ing from a matched resistor at T0 = 290K, i.e., Ni = kT0B.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 157: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Relation Between F and Te

R

R

Pi = Si +Ni Po = So +No

NoisynetworkG, B, Te

T0 = 290 K

F =SiSo× No

Ni

=1G× Gk (T0 + Te)B

kT0B

= 1 +Te

T0≥ 1. (36)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 158: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Relation Between F and Te

R

R

Pi = Si +Ni Po = So +No

NoisynetworkG, B, Te

T0 = 290 K

F =SiSo× No

Ni

=1G× Gk (T0 + Te)B

kT0B

= 1 +Te

T0≥ 1. (36)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 159: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Relation Between F and Te

R

R

Pi = Si +Ni Po = So +No

NoisynetworkG, B, Te

T0 = 290 K

F =SiSo× No

Ni

=1G× Gk (T0 + Te)B

kT0B

= 1 +Te

T0≥ 1. (36)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 160: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Relation Between F and Te

R

R

Pi = Si +Ni Po = So +No

NoisynetworkG, B, Te

T0 = 290 K

F =SiSo× No

Ni

=1G× Gk (T0 + Te)B

kT0B

= 1 +Te

T0≥ 1. (36)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 161: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Relation Between F and Te

R

R

Pi = Si +Ni Po = So +No

NoisynetworkG, B, Te

T0 = 290 K

F =SiSo× No

Ni

=1G× Gk (T0 + Te)B

kT0B

= 1 +Te

T0≥ 1. (36)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 162: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Equivalent Noise Temperature of a Cascaded System

G1F1Te1

G2F2Te2

G1G2FcasTecas

Ni No

No

T0

Ni

T0

N1

The noise power at the output of the second stage is

No = G2N1 + G2kTe2B = G2G1k (T0 + Te1)B + G2kTe2B.

For the equivalent system we have

No = G1G2k (Te,cas + T0)B.

So, comparing the above equations gives

Te,cas = Te1 +Te2G1

. (37)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 163: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Equivalent Noise Temperature of a Cascaded System

G1F1Te1

G2F2Te2

G1G2FcasTecas

Ni No

No

T0

Ni

T0

N1

The noise power at the output of the second stage is

No = G2N1 + G2kTe2B = G2G1k (T0 + Te1)B + G2kTe2B.

For the equivalent system we have

No = G1G2k (Te,cas + T0)B.

So, comparing the above equations gives

Te,cas = Te1 +Te2G1

. (37)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 164: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Equivalent Noise Temperature of a Cascaded System

G1F1Te1

G2F2Te2

G1G2FcasTecas

Ni No

No

T0

Ni

T0

N1

The noise power at the output of the second stage is

No = G2N1 + G2kTe2B = G2G1k (T0 + Te1)B + G2kTe2B.

For the equivalent system we have

No = G1G2k (Te,cas + T0)B.

So, comparing the above equations gives

Te,cas = Te1 +Te2G1

. (37)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 165: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Equivalent Noise Temperature of a Cascaded System

G1F1Te1

G2F2Te2

G1G2FcasTecas

Ni No

No

T0

Ni

T0

N1

The noise power at the output of the second stage is

No = G2N1 + G2kTe2B = G2G1k (T0 + Te1)B + G2kTe2B.

For the equivalent system we have

No = G1G2k (Te,cas + T0)B.

So, comparing the above equations gives

Te,cas = Te1 +Te2G1

. (37)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 166: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Equivalent Noise Temperature of a Cascaded System

G1F1Te1

G2F2Te2

G1G2FcasTecas

Ni No

No

T0

Ni

T0

N1

The noise power at the output of the second stage is

No = G2N1 + G2kTe2B = G2G1k (T0 + Te1)B + G2kTe2B.

For the equivalent system we have

No = G1G2k (Te,cas + T0)B.

So, comparing the above equations gives

Te,cas = Te1 +Te2G1

. (37)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 167: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Noise Figure of a Cascaded System

G1F1Te1

G2F2Te2

G1G2FcasTecas

Ni No

No

T0

Ni

T0

N1

Te,cas = Te1 +Te2G1

.

⇒ T0 (Fcas − 1) = T0 (F1 − 1) +T0 (F2 − 1)

G1

⇒ Fcas = F1 +F2 − 1

G1. (38)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 168: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Noise Figure of a Cascaded System

G1F1Te1

G2F2Te2

G1G2FcasTecas

Ni No

No

T0

Ni

T0

N1

Te,cas = Te1 +Te2G1

.

⇒ T0 (Fcas − 1) = T0 (F1 − 1) +T0 (F2 − 1)

G1

⇒ Fcas = F1 +F2 − 1

G1. (38)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 169: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Noise Figure of a Cascaded System

G1F1Te1

G2F2Te2

G1G2FcasTecas

Ni No

No

T0

Ni

T0

N1

Te,cas = Te1 +Te2G1

.

⇒ T0 (Fcas − 1) = T0 (F1 − 1) +T0 (F2 − 1)

G1

⇒ Fcas = F1 +F2 − 1

G1. (38)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 170: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Generalization

For an arbitrary number of stages, Te,cas and Fcas are given as

Te,cas = Te1 +Te2G1

+Te3

G1G2+ · · · , and (39)

Fcas = F1 +F2 − 1

G1+

F3 − 1G1G2

+ · · · . (40)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 171: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Generalization

For an arbitrary number of stages, Te,cas and Fcas are given as

Te,cas = Te1 +Te2G1

+Te3

G1G2+ · · · , and (39)

Fcas = F1 +F2 − 1

G1+

F3 − 1G1G2

+ · · · . (40)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 172: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Generalization

For an arbitrary number of stages, Te,cas and Fcas are given as

Te,cas = Te1 +Te2G1

+Te3

G1G2+ · · · , and (39)

Fcas = F1 +F2 − 1

G1+

F3 − 1G1G2

+ · · · . (40)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 173: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Generalization

For an arbitrary number of stages, Te,cas and Fcas are given as

Te,cas = Te1 +Te2G1

+Te3

G1G2+ · · · , and (39)

Fcas = F1 +F2 − 1

G1+

F3 − 1G1G2

+ · · · . (40)

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 174: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Lossy Line held at Physical Temperature T

RT

No = kTBL, T, Zo = R

Ni = kTB

Consider a lossy line (lossy lines or networks containing passive elementscan generate only thermal noise) with a matched source resistor that is also at

temperature T as shown in the figure.

The power gain, G, of a lossy line is less than unity; the loss factor, L, can bedefined as L = 1/G > 1.

Input noise power is kTB. Because the entire system is in thermal equilibriumat the temperature T , and thermal noise power is independent of the

resistance value, the output noise power also must be No = kTB.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 175: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Lossy Line held at Physical Temperature T

RT

No = kTBL, T, Zo = R

Ni = kTB

Consider a lossy line (lossy lines or networks containing passive elementscan generate only thermal noise) with a matched source resistor that is also at

temperature T as shown in the figure.

The power gain, G, of a lossy line is less than unity; the loss factor, L, can bedefined as L = 1/G > 1.

Input noise power is kTB. Because the entire system is in thermal equilibriumat the temperature T , and thermal noise power is independent of the

resistance value, the output noise power also must be No = kTB.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 176: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Lossy Line held at Physical Temperature T

RT

No = kTBL, T, Zo = R

Ni = kTB

Consider a lossy line (lossy lines or networks containing passive elementscan generate only thermal noise) with a matched source resistor that is also at

temperature T as shown in the figure.

The power gain, G, of a lossy line is less than unity; the loss factor, L, can bedefined as L = 1/G > 1.

Input noise power is kTB. Because the entire system is in thermal equilibriumat the temperature T , and thermal noise power is independent of the

resistance value, the output noise power also must be No = kTB.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 177: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Lossy Line held at Physical Temperature T

RT

No = kTBL, T, Zo = R

Ni = kTB

Consider a lossy line (lossy lines or networks containing passive elementscan generate only thermal noise) with a matched source resistor that is also at

temperature T as shown in the figure.

The power gain, G, of a lossy line is less than unity; the loss factor, L, can bedefined as L = 1/G > 1.

Input noise power is kTB. Because the entire system is in thermal equilibriumat the temperature T , and thermal noise power is independent of the

resistance value, the output noise power also must be No = kTB.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 178: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Lossy Line held at Physical Temperature T

RT

No = kTBL, T, Zo = R

Ni = kTB

Consider a lossy line (lossy lines or networks containing passive elementscan generate only thermal noise) with a matched source resistor that is also at

temperature T as shown in the figure.

The power gain, G, of a lossy line is less than unity; the loss factor, L, can bedefined as L = 1/G > 1.

Input noise power is kTB. Because the entire system is in thermal equilibriumat the temperature T , and thermal noise power is independent of the

resistance value, the output noise power also must be No = kTB.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 179: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Lossy Line held at Physical Temperature T

Thus, we have

No = kTB = GkTB + GNadded

where Nadded is the noise generated by the line, as if it appeared at the inputterminals of the line. Rearranging the above equation gives

Nadded = kTB1−G

G= kTB (L− 1) .

From the above equation, it is clear that the equivalent noise temperature ofthe lossy line is

Te = (L− 1)T.

So, noise figure of the lossy line is

F = 1 +Te

T0= 1 + (L− 1)

TT0

.

When T = T0, for lossy networks, F = L.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 180: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Lossy Line held at Physical Temperature T

Thus, we have

No = kTB = GkTB + GNadded

where Nadded is the noise generated by the line, as if it appeared at the inputterminals of the line.

Rearranging the above equation gives

Nadded = kTB1−G

G= kTB (L− 1) .

From the above equation, it is clear that the equivalent noise temperature ofthe lossy line is

Te = (L− 1)T.

So, noise figure of the lossy line is

F = 1 +Te

T0= 1 + (L− 1)

TT0

.

When T = T0, for lossy networks, F = L.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 181: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Lossy Line held at Physical Temperature T

Thus, we have

No = kTB = GkTB + GNadded

where Nadded is the noise generated by the line, as if it appeared at the inputterminals of the line. Rearranging the above equation gives

Nadded = kTB1−G

G= kTB (L− 1) .

From the above equation, it is clear that the equivalent noise temperature ofthe lossy line is

Te = (L− 1)T.

So, noise figure of the lossy line is

F = 1 +Te

T0= 1 + (L− 1)

TT0

.

When T = T0, for lossy networks, F = L.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 182: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Lossy Line held at Physical Temperature T

Thus, we have

No = kTB = GkTB + GNadded

where Nadded is the noise generated by the line, as if it appeared at the inputterminals of the line. Rearranging the above equation gives

Nadded = kTB1−G

G= kTB (L− 1) .

From the above equation, it is clear that the equivalent noise temperature ofthe lossy line is

Te = (L− 1)T.

So, noise figure of the lossy line is

F = 1 +Te

T0= 1 + (L− 1)

TT0

.

When T = T0, for lossy networks, F = L.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 183: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Lossy Line held at Physical Temperature T

Thus, we have

No = kTB = GkTB + GNadded

where Nadded is the noise generated by the line, as if it appeared at the inputterminals of the line. Rearranging the above equation gives

Nadded = kTB1−G

G= kTB (L− 1) .

From the above equation, it is clear that the equivalent noise temperature ofthe lossy line is

Te = (L− 1)T.

So, noise figure of the lossy line is

F = 1 +Te

T0= 1 + (L− 1)

TT0

.

When T = T0, for lossy networks, F = L.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad

Page 184: 3: Random Variables, Processes, and Noise2016/01/31  · tube or solid-state device. Flicker noiseoccurs in solid-state components and vacuum tubes. Flicker noise power varies inversely

Introduction Random Variables Random Processes Noise Characterization

Lossy Line held at Physical Temperature T

Thus, we have

No = kTB = GkTB + GNadded

where Nadded is the noise generated by the line, as if it appeared at the inputterminals of the line. Rearranging the above equation gives

Nadded = kTB1−G

G= kTB (L− 1) .

From the above equation, it is clear that the equivalent noise temperature ofthe lossy line is

Te = (L− 1)T.

So, noise figure of the lossy line is

F = 1 +Te

T0= 1 + (L− 1)

TT0

.

When T = T0, for lossy networks, F = L.

3: Random Variables, Processes, and Noise Communication Systems, Dept. of EEE, BITS Hyderabad