20130723 research accomplishment_ud

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Semiconductor & I ntegrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University Taejong Baek Department of Electronics and Electrical Engineering Graduate School Dongguk University Semiconductor & I ntegrated Circuit Lab Millimeter-wave IN ovation Technology research center Research accomplishment (2003 ~ )

description

Research accomplishment Project report

Transcript of 20130723 research accomplishment_ud

Page 1: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

Semiconductor amp Integrated Circuit LabMillimeter-wave INovation Technology research center

Research accomplishment (2003 ~ )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University1

Research field

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University2

What is Millimeter-wave

30 300 3000

Micro-wave Millimeter-wave Submillimeter-wave

10 1 01

Frequency (GHz)

Wave-length (mm)

Wide bandwidth high data rate and high speedwireless communication applications

Short wavelength small-sized and light-weighted circuit systems

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University3

1 Large spectrum availability

rArr Broadband system

rArr Unused frequency bands

2 High reuse potential of frequency

rArr Short range communications from a few meters up to few kilometers

3 Small antenna and system size

rArr Very short wavelength

Advantages of Millimeter-wave

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Requirement of Millimeter-wave Monolithic integrated Circuits

Millimeter-waveApplications

ITS

Military

WLANImaging

system

Imaging

system

Medical

Examples of Millimeter-wave applications

4

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University5

Mask Aligner ICP-Dry etcher

FC Bonder

E-Beam Lithography

Thermal Evaporator ULVAC EBV-10

Rapid Thermal Process System (RTP) KVR-020

Plasma Enhanced Chemical Vapor Deposition (PECVD) JCSS-41MR

O2 Plasma Asher Oxford plasma lab 80 plus

Mask Aligner Karl Suss MA6

Inductively Coupled Plasma Reactive Ion Etching (ICP-RIE) KVICP-T4083

E-Beam Evaporator System KVE-T5560

E-Beam Lithography System Leica EBPG-4HR

Au Plating System

Vacuum Dry Oven SB-CD520

Lapping Machine Allied MultiPrep TM System

Furnace Metritherm

Surface Profiler a-step 200

Thin Film Analyzer Tyger

Flip Chip Bonder Laurier M9

Wedge bonder Hybond 572-A

Ball bonder Hybond 626

Spectrum amp Vector Network Analyzer

Semiconductor Characterization System Keithley 4200-PCS

Ansys HFSS amp Agilent ADS Simulation Program

Plasma Asher

Furnace

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University6

GaAs-based 70 nm MHEMTs

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University7

Fabricated MHEMT

GaAs-based 70 nm MHEMTs

lt70 microm times 2 MHEMTgt ltResist profile of gate footgt

70 nm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University8

70 nm Gate Metamorphic HEMT

Si3N4 passivation 800 Å

Gate length 70 nm

Double exposure method

Tri-layer resist stack

ZEP520 DCB = 15 1

PMGI

PMMA950K MCB = 1 1Gate metal formation

TiAu = 5004500 ÅSEM view of fabricated 70 nm gate

Development of MMIC Libraries

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University9

DC performance- Drain current density 607 mAmm

- Transconductance (gm) 1015 Smm

lt I-V characteristics gt lt Transconductance characteristics gt

70 nm times140 microm MHEMT (1)

GaAs-based 70 nm MHEMTs

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University10

70 nm times140 microm MHEMT (2)

lt RF characteristics gt

330 GHz

425 GHz

GaAs-based 70 nm MHEMTs

- fT 330 GHz

- fmax 425 GHz

RF performance

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University11

fT comparison of HEMTs

[1][2]

[3]

[4]

[5]

[6] [7]

[8] [9]

[10]

This work

[1] Y Yamashita et al IEEE Electron Device Letters

vol 23 no 10 pp 573-575 2002[2] K Shinohara et al IEEE Electron Device Letters

vol 25 no 5 pp 241-243 2004[3] T Suemitsu et al IEEE Trans on Electron Devices

vol 49 no 10 pp 1694-1700 2002[4] K Shinohara et al IEEE Electron Device Letters

vol 22 no 11 pp 507-509 2001[5] K Shinohara et al IEEE MTT-S Digest

vol 3 pp 2159-2162 2001[6] S Bollaert et al IEE Electronics Letters

vol 38 no 8 pp 389-391 2002[7] T Parenty et al Indium Phosphide and

Related Materials pp 626-629 2001[8] A Leuther et al Indium Phosphide and

Related Materials pp 215-218 2003[9] H Wang et al IEEE IEDM Digest

pp 239-242 1993[10] Y C Lien et al IEEE Electron Device Letters

vol 25 no 6 pp 348-350 2004

GaAs-based 70 nm MHEMTs

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University12

DAML(Dielectric-supported Air-gapped Microstrip Line)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University13

Transmission line

Basic elements

Major cause of device loss

Motivation of DAML (1)

SubstrateSubstrate

Conventional transmission lines

Substrate loss

Demand of MEMS technology

Motivation of DAML

Microstrip line CPW line

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University14

Substrate 1

Substrate 2

Substrate

(1)

(2)

(3)

Shielded Membrane Microstrip

(1) Shield cover 2 Masks

(2) Membrane plane 3 Masks

(3) Ground plane 1 Masks

Motivation of DAML (2)

Complex processes

Difficulty of integration withMMICMIMIC

Shielded Membrane Microstrip

DAML technology

Reference SV Robertson et al IEEE Trans Microwave Theory and Techvol 46 no 11 1998 pp 1845-1849 1998

Motivation of DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University15

Surface micromachined transmission line Reduced substrate loss due to elevated signal line

Simple process Compatibility with standard MMICMIMIC fabrication Photo-lithography and low-temperature process

Easily integrated with MMICMIMIC (3 additional masks required) Dielectric post used for mechanical stability (1 post1 mm)

Possibility of vertical integration (3-D integration)

SI GaAs substrate

Dielectric post

Signal line

Ground

DAML Dielectric-supported Air-gapped Microstrip Line

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University16

w

d

h

g

3h ⅹ2 + w

Formula for Effective Dielectric Constant in Partial Dielectric Layer

h Dielectric post height (microm) w Signal line width (microm)

g Dielectric post gap (microm)

d Dielectric post size (microm)

3hⅹ2 + w Field area (by Ansoft HFSS)

The effective dielectric constant εeff is 1086 by calculation (Where g = 500 microm h = 10 microm w = 44 microm d = 40 microm)

wh

whgd

whgd

polyimidepolyimide

eff

121

12

1)23(

1

2

1)23(

12

2

DAML

)23(1

2

whgd

polyimider

Dielectric constant of DAML-Substrate is 1108 by calculation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University17

Process flow of the DAML

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Sacrificial layer (AZ4903)patterning

Seed metal (TiAu)evaporation and

Electro-molding (AZ4903)formation

Signal line (Au) formationand sacrificial layer removal

Ground metal (TiAu) anddielectric post (polyimide)

formation

Process flow of the DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University18

Dielectric Post

Fabricated DAML

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Sacrificial Layer

Fabricated DAML

Reflow the photoresist for smooth metal overlay

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Fabricated DAML

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University21

Comparison of transmission lines[1] K Nishikawa et al IEEE MTT-S Digest vol 3

2001 pp 1881-1884

[2] GE Ponchak et al IEEE Trans Components Packaging and Manufacturing Technology-B

vol 21 no 2 pp 171-176 1998

[3] Suidong Yang et al IEEE Trans MicrowaveTheory and Techniques

vol 46 no 5 pp 623-631 1998

[4] YC Shih et al Microwave Journal

pp 95-105 1991

[5] Youngwoo Kwon et al IEEE Microwave

and Wireless Components Letters

vol 11 no 2 pp 59-61 2001[6] SV Robertson et al IEEE Trans Microwave

Theory and Techniques

vol 46 no 11 1998 pp 1845-1849 1998

This work Sung-Chan Kim et al IEEE Microwaveand Wireless Components Lettersvol 15 no 10 pp 652-654 2005

This work H S Lee et al IEE Electronics Letters

vol 39 no 25 pp 1827-1828 2003

DAML Characteristic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University22

Shielded DAML using Flip chip technique

h Dielectric post height w Signal line width

g Dielectric post gap

d Dielectric post size

Lower Ground Plane

Upper Ground Plane

Polyimide Dielectric post

Air-bridged Signal line

Connected Ground using Flip chip Stud

Ultra low loss extended height (10 microm rarr 17 microm) Shielding effect

- Radiation electromagnetic and environmental interference are avoided by enclosing microstrip circuitry in a shielding cavity

Simple process not bulk micromachining (using flip-chip technique)

SDAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University23

Fabricated DAML (height = 17 microm)

Fabricated DAML

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Simulation Measurement

80(GHz) 163 185

94(GHz)

189 153

110(GHz)

222 213

Signal line width 44 microm (dBcm)

DAML Characteristic (Measurement)

Insertion loss versus Signal line height

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University25

Comparison of original DAML

SDAML Characteristic

0 20 40 60 80 100 120 14000

05

10

15

20

25

30

35

40

Inse

rtion

loss

[dB

cm]

Frequency [GHz]

DAML (h = 10 m) DAML (h = 17 m) SDAML (h = 17 m)

60(GHz)

94(GHz)

120(GHz)

DAML(10 microm) 187 256 31

DAML(17 microm) 127 189 242

SDAML(17 microm) 107 141 167

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University26

CPW

Microstrip

DAML

Reduced Size DAML

λg 4 94 GHz

Electrical length (λg 4 94 GHz )

CPW 304 microm

Microstrip 266 microm

DAML 792 microm

RS-DAML 478 microm

Comparison of electrical length

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University27

Total Size 604 microm times 520 microm

Passive Device using DAML Technology W-band Reduced Size branch-line coupler

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Coupling loss 361 dB

Isolation -355 dB

Transmission loss 425 dB

Return loss -369 dB

Measurement result of W-band Reduced branch-line coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University29

Comparison of W-band branch line coupler

CaseCouplingloss (dB)

Return loss (dB)

Chip size(mm2)

Centerfrequency

(GHz)

1 (CPW)

About -35 About -20 05 ⅹ05 90

RSCDAML -361 -369 06ⅹ052 94

Passive Device using DAML Technology

Reference 1 M Schlechtweg et al GaAs IC Symposium 1995 Technical Digest 1995

17th Annual IEEE 29 Oct-1 Nov 1995 Page(s)214 - 217

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W-band Hybrid Ring Coupler

Fabricated W-band hybrid ring coupler

Coupler size146 mm (diameter)

10 microm

50 Ω termination

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S-parameters of W-band hybrid ring coupler

Transmission loss380 plusmn 008 dB

( 85-105 GHz)

Coupling loss

357 plusmn 022 dB

W-band Hybrid Ring Coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University32

Comparison of W-band hybrid ring coupler

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 94

Thiswork -372 -335 -34 94

Hybrid Ring Coupler

This work Sung-Chan Kim et al IEEE MWCL vol 15 no 10 pp 652-654 2005

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Diameter 0888 mm

W-band reduced ring hybrid coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University34

Reduced to 63 in area

Conventional Coupler

Diameter 1460 mm

Reduced Coupler

Diameter 0888 mm

Comparison of coupler sizes

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Coupling loss 435 dB Isolation -4823 dB

Transmission loss 444 dB Return loss below -25 dB (all port)

75 80 85 90 95 100 105 110

-60

-50

-40

-30

-20

-10

0

S-p

aram

eter

[dB]

Frequency [GHz]

S21Thru S31coupling S23Isolation

Insertion loss

70 75 80 85 90 95 100 105 110 115

-40

-30

-20

-10

0

S-pa

ram

eter

[dB]

Frequency [GHz]

S11 S22 S33

Return loss

Measurement result of W-band reduced ring hybrid coupler

Passive Device using DAML Technology

35

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Comparison of W-band hybrid ring coupler

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)Diameter

(mm)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 About 07 94

DAML -372 -335 -34 146 94

RSCDAML -444 -435 -4823 088 94

Passive Device using DAML Technology

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

36

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

(a) MIM coupling capacitor

(b) Stepped Impedance Perturbation

Novel W-Band Dual Mode Stepped Impedance Resonator BPF Using DAML Technology

(a) (b)

Journal of the Korean Physical Society vol 51 no 10 pp S280-S283 December 2007

Fabricated BPF

(b)

(a)

Passive Device using DAML Technology

37

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University38

60 65 70 75 80 85 90 95 100 105 110 115 120-40

-35

-30

-25

-20

-15

-10

-5

0

5

Inse

rtion

Los

s (d

B)

Frequency (GHz)

S11

S22

S21

S12

Simulation

Step Impedance Ratio 05

MIM Capacitor Size 75 microm2

Perturbation Length 275 microm

Measured Result of W-band BPF

- Insertion Loss 265 dB 97 GHz

- Relative Bandwidth 12

Passive Device using DAML Technology

38

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60-GHz CPW-fed Dielectric-Resonator-Above-Patch

Antenna for Broadband WLAN Applications Using DAML Technology

Microwave and Optical Technology Letters vol 49 Issue 8 pp 1859-1861 2005

Passive Device using DAML Technology

39

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Fabricated Antenna

(a) Fabricated patch using DAML

(b) 60 GHz RDRA

(c) Proposed antenna

(d) Antenna integrated by 60 GHz VCO

Passive Device using DAML Technology

40

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measured Results

Passive Device using DAML Technology

41

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3-D W-band Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University43

Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

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ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

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MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

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MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

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MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

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Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 2: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University1

Research field

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University2

What is Millimeter-wave

30 300 3000

Micro-wave Millimeter-wave Submillimeter-wave

10 1 01

Frequency (GHz)

Wave-length (mm)

Wide bandwidth high data rate and high speedwireless communication applications

Short wavelength small-sized and light-weighted circuit systems

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University3

1 Large spectrum availability

rArr Broadband system

rArr Unused frequency bands

2 High reuse potential of frequency

rArr Short range communications from a few meters up to few kilometers

3 Small antenna and system size

rArr Very short wavelength

Advantages of Millimeter-wave

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Requirement of Millimeter-wave Monolithic integrated Circuits

Millimeter-waveApplications

ITS

Military

WLANImaging

system

Imaging

system

Medical

Examples of Millimeter-wave applications

4

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University5

Mask Aligner ICP-Dry etcher

FC Bonder

E-Beam Lithography

Thermal Evaporator ULVAC EBV-10

Rapid Thermal Process System (RTP) KVR-020

Plasma Enhanced Chemical Vapor Deposition (PECVD) JCSS-41MR

O2 Plasma Asher Oxford plasma lab 80 plus

Mask Aligner Karl Suss MA6

Inductively Coupled Plasma Reactive Ion Etching (ICP-RIE) KVICP-T4083

E-Beam Evaporator System KVE-T5560

E-Beam Lithography System Leica EBPG-4HR

Au Plating System

Vacuum Dry Oven SB-CD520

Lapping Machine Allied MultiPrep TM System

Furnace Metritherm

Surface Profiler a-step 200

Thin Film Analyzer Tyger

Flip Chip Bonder Laurier M9

Wedge bonder Hybond 572-A

Ball bonder Hybond 626

Spectrum amp Vector Network Analyzer

Semiconductor Characterization System Keithley 4200-PCS

Ansys HFSS amp Agilent ADS Simulation Program

Plasma Asher

Furnace

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University6

GaAs-based 70 nm MHEMTs

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University7

Fabricated MHEMT

GaAs-based 70 nm MHEMTs

lt70 microm times 2 MHEMTgt ltResist profile of gate footgt

70 nm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University8

70 nm Gate Metamorphic HEMT

Si3N4 passivation 800 Å

Gate length 70 nm

Double exposure method

Tri-layer resist stack

ZEP520 DCB = 15 1

PMGI

PMMA950K MCB = 1 1Gate metal formation

TiAu = 5004500 ÅSEM view of fabricated 70 nm gate

Development of MMIC Libraries

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University9

DC performance- Drain current density 607 mAmm

- Transconductance (gm) 1015 Smm

lt I-V characteristics gt lt Transconductance characteristics gt

70 nm times140 microm MHEMT (1)

GaAs-based 70 nm MHEMTs

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University10

70 nm times140 microm MHEMT (2)

lt RF characteristics gt

330 GHz

425 GHz

GaAs-based 70 nm MHEMTs

- fT 330 GHz

- fmax 425 GHz

RF performance

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University11

fT comparison of HEMTs

[1][2]

[3]

[4]

[5]

[6] [7]

[8] [9]

[10]

This work

[1] Y Yamashita et al IEEE Electron Device Letters

vol 23 no 10 pp 573-575 2002[2] K Shinohara et al IEEE Electron Device Letters

vol 25 no 5 pp 241-243 2004[3] T Suemitsu et al IEEE Trans on Electron Devices

vol 49 no 10 pp 1694-1700 2002[4] K Shinohara et al IEEE Electron Device Letters

vol 22 no 11 pp 507-509 2001[5] K Shinohara et al IEEE MTT-S Digest

vol 3 pp 2159-2162 2001[6] S Bollaert et al IEE Electronics Letters

vol 38 no 8 pp 389-391 2002[7] T Parenty et al Indium Phosphide and

Related Materials pp 626-629 2001[8] A Leuther et al Indium Phosphide and

Related Materials pp 215-218 2003[9] H Wang et al IEEE IEDM Digest

pp 239-242 1993[10] Y C Lien et al IEEE Electron Device Letters

vol 25 no 6 pp 348-350 2004

GaAs-based 70 nm MHEMTs

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University12

DAML(Dielectric-supported Air-gapped Microstrip Line)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University13

Transmission line

Basic elements

Major cause of device loss

Motivation of DAML (1)

SubstrateSubstrate

Conventional transmission lines

Substrate loss

Demand of MEMS technology

Motivation of DAML

Microstrip line CPW line

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University14

Substrate 1

Substrate 2

Substrate

(1)

(2)

(3)

Shielded Membrane Microstrip

(1) Shield cover 2 Masks

(2) Membrane plane 3 Masks

(3) Ground plane 1 Masks

Motivation of DAML (2)

Complex processes

Difficulty of integration withMMICMIMIC

Shielded Membrane Microstrip

DAML technology

Reference SV Robertson et al IEEE Trans Microwave Theory and Techvol 46 no 11 1998 pp 1845-1849 1998

Motivation of DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University15

Surface micromachined transmission line Reduced substrate loss due to elevated signal line

Simple process Compatibility with standard MMICMIMIC fabrication Photo-lithography and low-temperature process

Easily integrated with MMICMIMIC (3 additional masks required) Dielectric post used for mechanical stability (1 post1 mm)

Possibility of vertical integration (3-D integration)

SI GaAs substrate

Dielectric post

Signal line

Ground

DAML Dielectric-supported Air-gapped Microstrip Line

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University16

w

d

h

g

3h ⅹ2 + w

Formula for Effective Dielectric Constant in Partial Dielectric Layer

h Dielectric post height (microm) w Signal line width (microm)

g Dielectric post gap (microm)

d Dielectric post size (microm)

3hⅹ2 + w Field area (by Ansoft HFSS)

The effective dielectric constant εeff is 1086 by calculation (Where g = 500 microm h = 10 microm w = 44 microm d = 40 microm)

wh

whgd

whgd

polyimidepolyimide

eff

121

12

1)23(

1

2

1)23(

12

2

DAML

)23(1

2

whgd

polyimider

Dielectric constant of DAML-Substrate is 1108 by calculation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University17

Process flow of the DAML

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Sacrificial layer (AZ4903)patterning

Seed metal (TiAu)evaporation and

Electro-molding (AZ4903)formation

Signal line (Au) formationand sacrificial layer removal

Ground metal (TiAu) anddielectric post (polyimide)

formation

Process flow of the DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University18

Dielectric Post

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University19

Sacrificial Layer

Fabricated DAML

Reflow the photoresist for smooth metal overlay

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University20

Fabricated DAML

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University21

Comparison of transmission lines[1] K Nishikawa et al IEEE MTT-S Digest vol 3

2001 pp 1881-1884

[2] GE Ponchak et al IEEE Trans Components Packaging and Manufacturing Technology-B

vol 21 no 2 pp 171-176 1998

[3] Suidong Yang et al IEEE Trans MicrowaveTheory and Techniques

vol 46 no 5 pp 623-631 1998

[4] YC Shih et al Microwave Journal

pp 95-105 1991

[5] Youngwoo Kwon et al IEEE Microwave

and Wireless Components Letters

vol 11 no 2 pp 59-61 2001[6] SV Robertson et al IEEE Trans Microwave

Theory and Techniques

vol 46 no 11 1998 pp 1845-1849 1998

This work Sung-Chan Kim et al IEEE Microwaveand Wireless Components Lettersvol 15 no 10 pp 652-654 2005

This work H S Lee et al IEE Electronics Letters

vol 39 no 25 pp 1827-1828 2003

DAML Characteristic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University22

Shielded DAML using Flip chip technique

h Dielectric post height w Signal line width

g Dielectric post gap

d Dielectric post size

Lower Ground Plane

Upper Ground Plane

Polyimide Dielectric post

Air-bridged Signal line

Connected Ground using Flip chip Stud

Ultra low loss extended height (10 microm rarr 17 microm) Shielding effect

- Radiation electromagnetic and environmental interference are avoided by enclosing microstrip circuitry in a shielding cavity

Simple process not bulk micromachining (using flip-chip technique)

SDAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University23

Fabricated DAML (height = 17 microm)

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University24

Simulation Measurement

80(GHz) 163 185

94(GHz)

189 153

110(GHz)

222 213

Signal line width 44 microm (dBcm)

DAML Characteristic (Measurement)

Insertion loss versus Signal line height

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University25

Comparison of original DAML

SDAML Characteristic

0 20 40 60 80 100 120 14000

05

10

15

20

25

30

35

40

Inse

rtion

loss

[dB

cm]

Frequency [GHz]

DAML (h = 10 m) DAML (h = 17 m) SDAML (h = 17 m)

60(GHz)

94(GHz)

120(GHz)

DAML(10 microm) 187 256 31

DAML(17 microm) 127 189 242

SDAML(17 microm) 107 141 167

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University26

CPW

Microstrip

DAML

Reduced Size DAML

λg 4 94 GHz

Electrical length (λg 4 94 GHz )

CPW 304 microm

Microstrip 266 microm

DAML 792 microm

RS-DAML 478 microm

Comparison of electrical length

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University27

Total Size 604 microm times 520 microm

Passive Device using DAML Technology W-band Reduced Size branch-line coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University28

Coupling loss 361 dB

Isolation -355 dB

Transmission loss 425 dB

Return loss -369 dB

Measurement result of W-band Reduced branch-line coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University29

Comparison of W-band branch line coupler

CaseCouplingloss (dB)

Return loss (dB)

Chip size(mm2)

Centerfrequency

(GHz)

1 (CPW)

About -35 About -20 05 ⅹ05 90

RSCDAML -361 -369 06ⅹ052 94

Passive Device using DAML Technology

Reference 1 M Schlechtweg et al GaAs IC Symposium 1995 Technical Digest 1995

17th Annual IEEE 29 Oct-1 Nov 1995 Page(s)214 - 217

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University30

W-band Hybrid Ring Coupler

Fabricated W-band hybrid ring coupler

Coupler size146 mm (diameter)

10 microm

50 Ω termination

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University31

S-parameters of W-band hybrid ring coupler

Transmission loss380 plusmn 008 dB

( 85-105 GHz)

Coupling loss

357 plusmn 022 dB

W-band Hybrid Ring Coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University32

Comparison of W-band hybrid ring coupler

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 94

Thiswork -372 -335 -34 94

Hybrid Ring Coupler

This work Sung-Chan Kim et al IEEE MWCL vol 15 no 10 pp 652-654 2005

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University33

Diameter 0888 mm

W-band reduced ring hybrid coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University34

Reduced to 63 in area

Conventional Coupler

Diameter 1460 mm

Reduced Coupler

Diameter 0888 mm

Comparison of coupler sizes

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Coupling loss 435 dB Isolation -4823 dB

Transmission loss 444 dB Return loss below -25 dB (all port)

75 80 85 90 95 100 105 110

-60

-50

-40

-30

-20

-10

0

S-p

aram

eter

[dB]

Frequency [GHz]

S21Thru S31coupling S23Isolation

Insertion loss

70 75 80 85 90 95 100 105 110 115

-40

-30

-20

-10

0

S-pa

ram

eter

[dB]

Frequency [GHz]

S11 S22 S33

Return loss

Measurement result of W-band reduced ring hybrid coupler

Passive Device using DAML Technology

35

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Comparison of W-band hybrid ring coupler

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)Diameter

(mm)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 About 07 94

DAML -372 -335 -34 146 94

RSCDAML -444 -435 -4823 088 94

Passive Device using DAML Technology

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

36

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

(a) MIM coupling capacitor

(b) Stepped Impedance Perturbation

Novel W-Band Dual Mode Stepped Impedance Resonator BPF Using DAML Technology

(a) (b)

Journal of the Korean Physical Society vol 51 no 10 pp S280-S283 December 2007

Fabricated BPF

(b)

(a)

Passive Device using DAML Technology

37

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University38

60 65 70 75 80 85 90 95 100 105 110 115 120-40

-35

-30

-25

-20

-15

-10

-5

0

5

Inse

rtion

Los

s (d

B)

Frequency (GHz)

S11

S22

S21

S12

Simulation

Step Impedance Ratio 05

MIM Capacitor Size 75 microm2

Perturbation Length 275 microm

Measured Result of W-band BPF

- Insertion Loss 265 dB 97 GHz

- Relative Bandwidth 12

Passive Device using DAML Technology

38

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

60-GHz CPW-fed Dielectric-Resonator-Above-Patch

Antenna for Broadband WLAN Applications Using DAML Technology

Microwave and Optical Technology Letters vol 49 Issue 8 pp 1859-1861 2005

Passive Device using DAML Technology

39

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Fabricated Antenna

(a) Fabricated patch using DAML

(b) 60 GHz RDRA

(c) Proposed antenna

(d) Antenna integrated by 60 GHz VCO

Passive Device using DAML Technology

40

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measured Results

Passive Device using DAML Technology

41

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University42

3-D W-band Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University43

Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

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Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

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Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

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Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

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Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

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Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

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Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

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Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 3: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University2

What is Millimeter-wave

30 300 3000

Micro-wave Millimeter-wave Submillimeter-wave

10 1 01

Frequency (GHz)

Wave-length (mm)

Wide bandwidth high data rate and high speedwireless communication applications

Short wavelength small-sized and light-weighted circuit systems

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University3

1 Large spectrum availability

rArr Broadband system

rArr Unused frequency bands

2 High reuse potential of frequency

rArr Short range communications from a few meters up to few kilometers

3 Small antenna and system size

rArr Very short wavelength

Advantages of Millimeter-wave

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Requirement of Millimeter-wave Monolithic integrated Circuits

Millimeter-waveApplications

ITS

Military

WLANImaging

system

Imaging

system

Medical

Examples of Millimeter-wave applications

4

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University5

Mask Aligner ICP-Dry etcher

FC Bonder

E-Beam Lithography

Thermal Evaporator ULVAC EBV-10

Rapid Thermal Process System (RTP) KVR-020

Plasma Enhanced Chemical Vapor Deposition (PECVD) JCSS-41MR

O2 Plasma Asher Oxford plasma lab 80 plus

Mask Aligner Karl Suss MA6

Inductively Coupled Plasma Reactive Ion Etching (ICP-RIE) KVICP-T4083

E-Beam Evaporator System KVE-T5560

E-Beam Lithography System Leica EBPG-4HR

Au Plating System

Vacuum Dry Oven SB-CD520

Lapping Machine Allied MultiPrep TM System

Furnace Metritherm

Surface Profiler a-step 200

Thin Film Analyzer Tyger

Flip Chip Bonder Laurier M9

Wedge bonder Hybond 572-A

Ball bonder Hybond 626

Spectrum amp Vector Network Analyzer

Semiconductor Characterization System Keithley 4200-PCS

Ansys HFSS amp Agilent ADS Simulation Program

Plasma Asher

Furnace

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GaAs-based 70 nm MHEMTs

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University7

Fabricated MHEMT

GaAs-based 70 nm MHEMTs

lt70 microm times 2 MHEMTgt ltResist profile of gate footgt

70 nm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University8

70 nm Gate Metamorphic HEMT

Si3N4 passivation 800 Å

Gate length 70 nm

Double exposure method

Tri-layer resist stack

ZEP520 DCB = 15 1

PMGI

PMMA950K MCB = 1 1Gate metal formation

TiAu = 5004500 ÅSEM view of fabricated 70 nm gate

Development of MMIC Libraries

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University9

DC performance- Drain current density 607 mAmm

- Transconductance (gm) 1015 Smm

lt I-V characteristics gt lt Transconductance characteristics gt

70 nm times140 microm MHEMT (1)

GaAs-based 70 nm MHEMTs

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University10

70 nm times140 microm MHEMT (2)

lt RF characteristics gt

330 GHz

425 GHz

GaAs-based 70 nm MHEMTs

- fT 330 GHz

- fmax 425 GHz

RF performance

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University11

fT comparison of HEMTs

[1][2]

[3]

[4]

[5]

[6] [7]

[8] [9]

[10]

This work

[1] Y Yamashita et al IEEE Electron Device Letters

vol 23 no 10 pp 573-575 2002[2] K Shinohara et al IEEE Electron Device Letters

vol 25 no 5 pp 241-243 2004[3] T Suemitsu et al IEEE Trans on Electron Devices

vol 49 no 10 pp 1694-1700 2002[4] K Shinohara et al IEEE Electron Device Letters

vol 22 no 11 pp 507-509 2001[5] K Shinohara et al IEEE MTT-S Digest

vol 3 pp 2159-2162 2001[6] S Bollaert et al IEE Electronics Letters

vol 38 no 8 pp 389-391 2002[7] T Parenty et al Indium Phosphide and

Related Materials pp 626-629 2001[8] A Leuther et al Indium Phosphide and

Related Materials pp 215-218 2003[9] H Wang et al IEEE IEDM Digest

pp 239-242 1993[10] Y C Lien et al IEEE Electron Device Letters

vol 25 no 6 pp 348-350 2004

GaAs-based 70 nm MHEMTs

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University12

DAML(Dielectric-supported Air-gapped Microstrip Line)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University13

Transmission line

Basic elements

Major cause of device loss

Motivation of DAML (1)

SubstrateSubstrate

Conventional transmission lines

Substrate loss

Demand of MEMS technology

Motivation of DAML

Microstrip line CPW line

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University14

Substrate 1

Substrate 2

Substrate

(1)

(2)

(3)

Shielded Membrane Microstrip

(1) Shield cover 2 Masks

(2) Membrane plane 3 Masks

(3) Ground plane 1 Masks

Motivation of DAML (2)

Complex processes

Difficulty of integration withMMICMIMIC

Shielded Membrane Microstrip

DAML technology

Reference SV Robertson et al IEEE Trans Microwave Theory and Techvol 46 no 11 1998 pp 1845-1849 1998

Motivation of DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University15

Surface micromachined transmission line Reduced substrate loss due to elevated signal line

Simple process Compatibility with standard MMICMIMIC fabrication Photo-lithography and low-temperature process

Easily integrated with MMICMIMIC (3 additional masks required) Dielectric post used for mechanical stability (1 post1 mm)

Possibility of vertical integration (3-D integration)

SI GaAs substrate

Dielectric post

Signal line

Ground

DAML Dielectric-supported Air-gapped Microstrip Line

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University16

w

d

h

g

3h ⅹ2 + w

Formula for Effective Dielectric Constant in Partial Dielectric Layer

h Dielectric post height (microm) w Signal line width (microm)

g Dielectric post gap (microm)

d Dielectric post size (microm)

3hⅹ2 + w Field area (by Ansoft HFSS)

The effective dielectric constant εeff is 1086 by calculation (Where g = 500 microm h = 10 microm w = 44 microm d = 40 microm)

wh

whgd

whgd

polyimidepolyimide

eff

121

12

1)23(

1

2

1)23(

12

2

DAML

)23(1

2

whgd

polyimider

Dielectric constant of DAML-Substrate is 1108 by calculation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University17

Process flow of the DAML

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Sacrificial layer (AZ4903)patterning

Seed metal (TiAu)evaporation and

Electro-molding (AZ4903)formation

Signal line (Au) formationand sacrificial layer removal

Ground metal (TiAu) anddielectric post (polyimide)

formation

Process flow of the DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University18

Dielectric Post

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University19

Sacrificial Layer

Fabricated DAML

Reflow the photoresist for smooth metal overlay

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University20

Fabricated DAML

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University21

Comparison of transmission lines[1] K Nishikawa et al IEEE MTT-S Digest vol 3

2001 pp 1881-1884

[2] GE Ponchak et al IEEE Trans Components Packaging and Manufacturing Technology-B

vol 21 no 2 pp 171-176 1998

[3] Suidong Yang et al IEEE Trans MicrowaveTheory and Techniques

vol 46 no 5 pp 623-631 1998

[4] YC Shih et al Microwave Journal

pp 95-105 1991

[5] Youngwoo Kwon et al IEEE Microwave

and Wireless Components Letters

vol 11 no 2 pp 59-61 2001[6] SV Robertson et al IEEE Trans Microwave

Theory and Techniques

vol 46 no 11 1998 pp 1845-1849 1998

This work Sung-Chan Kim et al IEEE Microwaveand Wireless Components Lettersvol 15 no 10 pp 652-654 2005

This work H S Lee et al IEE Electronics Letters

vol 39 no 25 pp 1827-1828 2003

DAML Characteristic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University22

Shielded DAML using Flip chip technique

h Dielectric post height w Signal line width

g Dielectric post gap

d Dielectric post size

Lower Ground Plane

Upper Ground Plane

Polyimide Dielectric post

Air-bridged Signal line

Connected Ground using Flip chip Stud

Ultra low loss extended height (10 microm rarr 17 microm) Shielding effect

- Radiation electromagnetic and environmental interference are avoided by enclosing microstrip circuitry in a shielding cavity

Simple process not bulk micromachining (using flip-chip technique)

SDAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University23

Fabricated DAML (height = 17 microm)

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University24

Simulation Measurement

80(GHz) 163 185

94(GHz)

189 153

110(GHz)

222 213

Signal line width 44 microm (dBcm)

DAML Characteristic (Measurement)

Insertion loss versus Signal line height

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University25

Comparison of original DAML

SDAML Characteristic

0 20 40 60 80 100 120 14000

05

10

15

20

25

30

35

40

Inse

rtion

loss

[dB

cm]

Frequency [GHz]

DAML (h = 10 m) DAML (h = 17 m) SDAML (h = 17 m)

60(GHz)

94(GHz)

120(GHz)

DAML(10 microm) 187 256 31

DAML(17 microm) 127 189 242

SDAML(17 microm) 107 141 167

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University26

CPW

Microstrip

DAML

Reduced Size DAML

λg 4 94 GHz

Electrical length (λg 4 94 GHz )

CPW 304 microm

Microstrip 266 microm

DAML 792 microm

RS-DAML 478 microm

Comparison of electrical length

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University27

Total Size 604 microm times 520 microm

Passive Device using DAML Technology W-band Reduced Size branch-line coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University28

Coupling loss 361 dB

Isolation -355 dB

Transmission loss 425 dB

Return loss -369 dB

Measurement result of W-band Reduced branch-line coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University29

Comparison of W-band branch line coupler

CaseCouplingloss (dB)

Return loss (dB)

Chip size(mm2)

Centerfrequency

(GHz)

1 (CPW)

About -35 About -20 05 ⅹ05 90

RSCDAML -361 -369 06ⅹ052 94

Passive Device using DAML Technology

Reference 1 M Schlechtweg et al GaAs IC Symposium 1995 Technical Digest 1995

17th Annual IEEE 29 Oct-1 Nov 1995 Page(s)214 - 217

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University30

W-band Hybrid Ring Coupler

Fabricated W-band hybrid ring coupler

Coupler size146 mm (diameter)

10 microm

50 Ω termination

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University31

S-parameters of W-band hybrid ring coupler

Transmission loss380 plusmn 008 dB

( 85-105 GHz)

Coupling loss

357 plusmn 022 dB

W-band Hybrid Ring Coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University32

Comparison of W-band hybrid ring coupler

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 94

Thiswork -372 -335 -34 94

Hybrid Ring Coupler

This work Sung-Chan Kim et al IEEE MWCL vol 15 no 10 pp 652-654 2005

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University33

Diameter 0888 mm

W-band reduced ring hybrid coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University34

Reduced to 63 in area

Conventional Coupler

Diameter 1460 mm

Reduced Coupler

Diameter 0888 mm

Comparison of coupler sizes

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Coupling loss 435 dB Isolation -4823 dB

Transmission loss 444 dB Return loss below -25 dB (all port)

75 80 85 90 95 100 105 110

-60

-50

-40

-30

-20

-10

0

S-p

aram

eter

[dB]

Frequency [GHz]

S21Thru S31coupling S23Isolation

Insertion loss

70 75 80 85 90 95 100 105 110 115

-40

-30

-20

-10

0

S-pa

ram

eter

[dB]

Frequency [GHz]

S11 S22 S33

Return loss

Measurement result of W-band reduced ring hybrid coupler

Passive Device using DAML Technology

35

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Comparison of W-band hybrid ring coupler

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)Diameter

(mm)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 About 07 94

DAML -372 -335 -34 146 94

RSCDAML -444 -435 -4823 088 94

Passive Device using DAML Technology

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

36

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

(a) MIM coupling capacitor

(b) Stepped Impedance Perturbation

Novel W-Band Dual Mode Stepped Impedance Resonator BPF Using DAML Technology

(a) (b)

Journal of the Korean Physical Society vol 51 no 10 pp S280-S283 December 2007

Fabricated BPF

(b)

(a)

Passive Device using DAML Technology

37

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University38

60 65 70 75 80 85 90 95 100 105 110 115 120-40

-35

-30

-25

-20

-15

-10

-5

0

5

Inse

rtion

Los

s (d

B)

Frequency (GHz)

S11

S22

S21

S12

Simulation

Step Impedance Ratio 05

MIM Capacitor Size 75 microm2

Perturbation Length 275 microm

Measured Result of W-band BPF

- Insertion Loss 265 dB 97 GHz

- Relative Bandwidth 12

Passive Device using DAML Technology

38

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

60-GHz CPW-fed Dielectric-Resonator-Above-Patch

Antenna for Broadband WLAN Applications Using DAML Technology

Microwave and Optical Technology Letters vol 49 Issue 8 pp 1859-1861 2005

Passive Device using DAML Technology

39

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Fabricated Antenna

(a) Fabricated patch using DAML

(b) 60 GHz RDRA

(c) Proposed antenna

(d) Antenna integrated by 60 GHz VCO

Passive Device using DAML Technology

40

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measured Results

Passive Device using DAML Technology

41

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University42

3-D W-band Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University43

Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

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Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 4: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University3

1 Large spectrum availability

rArr Broadband system

rArr Unused frequency bands

2 High reuse potential of frequency

rArr Short range communications from a few meters up to few kilometers

3 Small antenna and system size

rArr Very short wavelength

Advantages of Millimeter-wave

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Requirement of Millimeter-wave Monolithic integrated Circuits

Millimeter-waveApplications

ITS

Military

WLANImaging

system

Imaging

system

Medical

Examples of Millimeter-wave applications

4

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University5

Mask Aligner ICP-Dry etcher

FC Bonder

E-Beam Lithography

Thermal Evaporator ULVAC EBV-10

Rapid Thermal Process System (RTP) KVR-020

Plasma Enhanced Chemical Vapor Deposition (PECVD) JCSS-41MR

O2 Plasma Asher Oxford plasma lab 80 plus

Mask Aligner Karl Suss MA6

Inductively Coupled Plasma Reactive Ion Etching (ICP-RIE) KVICP-T4083

E-Beam Evaporator System KVE-T5560

E-Beam Lithography System Leica EBPG-4HR

Au Plating System

Vacuum Dry Oven SB-CD520

Lapping Machine Allied MultiPrep TM System

Furnace Metritherm

Surface Profiler a-step 200

Thin Film Analyzer Tyger

Flip Chip Bonder Laurier M9

Wedge bonder Hybond 572-A

Ball bonder Hybond 626

Spectrum amp Vector Network Analyzer

Semiconductor Characterization System Keithley 4200-PCS

Ansys HFSS amp Agilent ADS Simulation Program

Plasma Asher

Furnace

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University6

GaAs-based 70 nm MHEMTs

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University7

Fabricated MHEMT

GaAs-based 70 nm MHEMTs

lt70 microm times 2 MHEMTgt ltResist profile of gate footgt

70 nm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University8

70 nm Gate Metamorphic HEMT

Si3N4 passivation 800 Å

Gate length 70 nm

Double exposure method

Tri-layer resist stack

ZEP520 DCB = 15 1

PMGI

PMMA950K MCB = 1 1Gate metal formation

TiAu = 5004500 ÅSEM view of fabricated 70 nm gate

Development of MMIC Libraries

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University9

DC performance- Drain current density 607 mAmm

- Transconductance (gm) 1015 Smm

lt I-V characteristics gt lt Transconductance characteristics gt

70 nm times140 microm MHEMT (1)

GaAs-based 70 nm MHEMTs

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University10

70 nm times140 microm MHEMT (2)

lt RF characteristics gt

330 GHz

425 GHz

GaAs-based 70 nm MHEMTs

- fT 330 GHz

- fmax 425 GHz

RF performance

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University11

fT comparison of HEMTs

[1][2]

[3]

[4]

[5]

[6] [7]

[8] [9]

[10]

This work

[1] Y Yamashita et al IEEE Electron Device Letters

vol 23 no 10 pp 573-575 2002[2] K Shinohara et al IEEE Electron Device Letters

vol 25 no 5 pp 241-243 2004[3] T Suemitsu et al IEEE Trans on Electron Devices

vol 49 no 10 pp 1694-1700 2002[4] K Shinohara et al IEEE Electron Device Letters

vol 22 no 11 pp 507-509 2001[5] K Shinohara et al IEEE MTT-S Digest

vol 3 pp 2159-2162 2001[6] S Bollaert et al IEE Electronics Letters

vol 38 no 8 pp 389-391 2002[7] T Parenty et al Indium Phosphide and

Related Materials pp 626-629 2001[8] A Leuther et al Indium Phosphide and

Related Materials pp 215-218 2003[9] H Wang et al IEEE IEDM Digest

pp 239-242 1993[10] Y C Lien et al IEEE Electron Device Letters

vol 25 no 6 pp 348-350 2004

GaAs-based 70 nm MHEMTs

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University12

DAML(Dielectric-supported Air-gapped Microstrip Line)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University13

Transmission line

Basic elements

Major cause of device loss

Motivation of DAML (1)

SubstrateSubstrate

Conventional transmission lines

Substrate loss

Demand of MEMS technology

Motivation of DAML

Microstrip line CPW line

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University14

Substrate 1

Substrate 2

Substrate

(1)

(2)

(3)

Shielded Membrane Microstrip

(1) Shield cover 2 Masks

(2) Membrane plane 3 Masks

(3) Ground plane 1 Masks

Motivation of DAML (2)

Complex processes

Difficulty of integration withMMICMIMIC

Shielded Membrane Microstrip

DAML technology

Reference SV Robertson et al IEEE Trans Microwave Theory and Techvol 46 no 11 1998 pp 1845-1849 1998

Motivation of DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University15

Surface micromachined transmission line Reduced substrate loss due to elevated signal line

Simple process Compatibility with standard MMICMIMIC fabrication Photo-lithography and low-temperature process

Easily integrated with MMICMIMIC (3 additional masks required) Dielectric post used for mechanical stability (1 post1 mm)

Possibility of vertical integration (3-D integration)

SI GaAs substrate

Dielectric post

Signal line

Ground

DAML Dielectric-supported Air-gapped Microstrip Line

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University16

w

d

h

g

3h ⅹ2 + w

Formula for Effective Dielectric Constant in Partial Dielectric Layer

h Dielectric post height (microm) w Signal line width (microm)

g Dielectric post gap (microm)

d Dielectric post size (microm)

3hⅹ2 + w Field area (by Ansoft HFSS)

The effective dielectric constant εeff is 1086 by calculation (Where g = 500 microm h = 10 microm w = 44 microm d = 40 microm)

wh

whgd

whgd

polyimidepolyimide

eff

121

12

1)23(

1

2

1)23(

12

2

DAML

)23(1

2

whgd

polyimider

Dielectric constant of DAML-Substrate is 1108 by calculation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University17

Process flow of the DAML

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Sacrificial layer (AZ4903)patterning

Seed metal (TiAu)evaporation and

Electro-molding (AZ4903)formation

Signal line (Au) formationand sacrificial layer removal

Ground metal (TiAu) anddielectric post (polyimide)

formation

Process flow of the DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University18

Dielectric Post

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University19

Sacrificial Layer

Fabricated DAML

Reflow the photoresist for smooth metal overlay

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University20

Fabricated DAML

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University21

Comparison of transmission lines[1] K Nishikawa et al IEEE MTT-S Digest vol 3

2001 pp 1881-1884

[2] GE Ponchak et al IEEE Trans Components Packaging and Manufacturing Technology-B

vol 21 no 2 pp 171-176 1998

[3] Suidong Yang et al IEEE Trans MicrowaveTheory and Techniques

vol 46 no 5 pp 623-631 1998

[4] YC Shih et al Microwave Journal

pp 95-105 1991

[5] Youngwoo Kwon et al IEEE Microwave

and Wireless Components Letters

vol 11 no 2 pp 59-61 2001[6] SV Robertson et al IEEE Trans Microwave

Theory and Techniques

vol 46 no 11 1998 pp 1845-1849 1998

This work Sung-Chan Kim et al IEEE Microwaveand Wireless Components Lettersvol 15 no 10 pp 652-654 2005

This work H S Lee et al IEE Electronics Letters

vol 39 no 25 pp 1827-1828 2003

DAML Characteristic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University22

Shielded DAML using Flip chip technique

h Dielectric post height w Signal line width

g Dielectric post gap

d Dielectric post size

Lower Ground Plane

Upper Ground Plane

Polyimide Dielectric post

Air-bridged Signal line

Connected Ground using Flip chip Stud

Ultra low loss extended height (10 microm rarr 17 microm) Shielding effect

- Radiation electromagnetic and environmental interference are avoided by enclosing microstrip circuitry in a shielding cavity

Simple process not bulk micromachining (using flip-chip technique)

SDAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University23

Fabricated DAML (height = 17 microm)

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University24

Simulation Measurement

80(GHz) 163 185

94(GHz)

189 153

110(GHz)

222 213

Signal line width 44 microm (dBcm)

DAML Characteristic (Measurement)

Insertion loss versus Signal line height

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University25

Comparison of original DAML

SDAML Characteristic

0 20 40 60 80 100 120 14000

05

10

15

20

25

30

35

40

Inse

rtion

loss

[dB

cm]

Frequency [GHz]

DAML (h = 10 m) DAML (h = 17 m) SDAML (h = 17 m)

60(GHz)

94(GHz)

120(GHz)

DAML(10 microm) 187 256 31

DAML(17 microm) 127 189 242

SDAML(17 microm) 107 141 167

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University26

CPW

Microstrip

DAML

Reduced Size DAML

λg 4 94 GHz

Electrical length (λg 4 94 GHz )

CPW 304 microm

Microstrip 266 microm

DAML 792 microm

RS-DAML 478 microm

Comparison of electrical length

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University27

Total Size 604 microm times 520 microm

Passive Device using DAML Technology W-band Reduced Size branch-line coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University28

Coupling loss 361 dB

Isolation -355 dB

Transmission loss 425 dB

Return loss -369 dB

Measurement result of W-band Reduced branch-line coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University29

Comparison of W-band branch line coupler

CaseCouplingloss (dB)

Return loss (dB)

Chip size(mm2)

Centerfrequency

(GHz)

1 (CPW)

About -35 About -20 05 ⅹ05 90

RSCDAML -361 -369 06ⅹ052 94

Passive Device using DAML Technology

Reference 1 M Schlechtweg et al GaAs IC Symposium 1995 Technical Digest 1995

17th Annual IEEE 29 Oct-1 Nov 1995 Page(s)214 - 217

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University30

W-band Hybrid Ring Coupler

Fabricated W-band hybrid ring coupler

Coupler size146 mm (diameter)

10 microm

50 Ω termination

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University31

S-parameters of W-band hybrid ring coupler

Transmission loss380 plusmn 008 dB

( 85-105 GHz)

Coupling loss

357 plusmn 022 dB

W-band Hybrid Ring Coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University32

Comparison of W-band hybrid ring coupler

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 94

Thiswork -372 -335 -34 94

Hybrid Ring Coupler

This work Sung-Chan Kim et al IEEE MWCL vol 15 no 10 pp 652-654 2005

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University33

Diameter 0888 mm

W-band reduced ring hybrid coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University34

Reduced to 63 in area

Conventional Coupler

Diameter 1460 mm

Reduced Coupler

Diameter 0888 mm

Comparison of coupler sizes

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Coupling loss 435 dB Isolation -4823 dB

Transmission loss 444 dB Return loss below -25 dB (all port)

75 80 85 90 95 100 105 110

-60

-50

-40

-30

-20

-10

0

S-p

aram

eter

[dB]

Frequency [GHz]

S21Thru S31coupling S23Isolation

Insertion loss

70 75 80 85 90 95 100 105 110 115

-40

-30

-20

-10

0

S-pa

ram

eter

[dB]

Frequency [GHz]

S11 S22 S33

Return loss

Measurement result of W-band reduced ring hybrid coupler

Passive Device using DAML Technology

35

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Comparison of W-band hybrid ring coupler

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)Diameter

(mm)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 About 07 94

DAML -372 -335 -34 146 94

RSCDAML -444 -435 -4823 088 94

Passive Device using DAML Technology

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

36

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

(a) MIM coupling capacitor

(b) Stepped Impedance Perturbation

Novel W-Band Dual Mode Stepped Impedance Resonator BPF Using DAML Technology

(a) (b)

Journal of the Korean Physical Society vol 51 no 10 pp S280-S283 December 2007

Fabricated BPF

(b)

(a)

Passive Device using DAML Technology

37

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University38

60 65 70 75 80 85 90 95 100 105 110 115 120-40

-35

-30

-25

-20

-15

-10

-5

0

5

Inse

rtion

Los

s (d

B)

Frequency (GHz)

S11

S22

S21

S12

Simulation

Step Impedance Ratio 05

MIM Capacitor Size 75 microm2

Perturbation Length 275 microm

Measured Result of W-band BPF

- Insertion Loss 265 dB 97 GHz

- Relative Bandwidth 12

Passive Device using DAML Technology

38

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

60-GHz CPW-fed Dielectric-Resonator-Above-Patch

Antenna for Broadband WLAN Applications Using DAML Technology

Microwave and Optical Technology Letters vol 49 Issue 8 pp 1859-1861 2005

Passive Device using DAML Technology

39

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Fabricated Antenna

(a) Fabricated patch using DAML

(b) 60 GHz RDRA

(c) Proposed antenna

(d) Antenna integrated by 60 GHz VCO

Passive Device using DAML Technology

40

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measured Results

Passive Device using DAML Technology

41

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University42

3-D W-band Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University43

Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

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IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 5: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Requirement of Millimeter-wave Monolithic integrated Circuits

Millimeter-waveApplications

ITS

Military

WLANImaging

system

Imaging

system

Medical

Examples of Millimeter-wave applications

4

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University5

Mask Aligner ICP-Dry etcher

FC Bonder

E-Beam Lithography

Thermal Evaporator ULVAC EBV-10

Rapid Thermal Process System (RTP) KVR-020

Plasma Enhanced Chemical Vapor Deposition (PECVD) JCSS-41MR

O2 Plasma Asher Oxford plasma lab 80 plus

Mask Aligner Karl Suss MA6

Inductively Coupled Plasma Reactive Ion Etching (ICP-RIE) KVICP-T4083

E-Beam Evaporator System KVE-T5560

E-Beam Lithography System Leica EBPG-4HR

Au Plating System

Vacuum Dry Oven SB-CD520

Lapping Machine Allied MultiPrep TM System

Furnace Metritherm

Surface Profiler a-step 200

Thin Film Analyzer Tyger

Flip Chip Bonder Laurier M9

Wedge bonder Hybond 572-A

Ball bonder Hybond 626

Spectrum amp Vector Network Analyzer

Semiconductor Characterization System Keithley 4200-PCS

Ansys HFSS amp Agilent ADS Simulation Program

Plasma Asher

Furnace

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University6

GaAs-based 70 nm MHEMTs

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University7

Fabricated MHEMT

GaAs-based 70 nm MHEMTs

lt70 microm times 2 MHEMTgt ltResist profile of gate footgt

70 nm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University8

70 nm Gate Metamorphic HEMT

Si3N4 passivation 800 Å

Gate length 70 nm

Double exposure method

Tri-layer resist stack

ZEP520 DCB = 15 1

PMGI

PMMA950K MCB = 1 1Gate metal formation

TiAu = 5004500 ÅSEM view of fabricated 70 nm gate

Development of MMIC Libraries

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University9

DC performance- Drain current density 607 mAmm

- Transconductance (gm) 1015 Smm

lt I-V characteristics gt lt Transconductance characteristics gt

70 nm times140 microm MHEMT (1)

GaAs-based 70 nm MHEMTs

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University10

70 nm times140 microm MHEMT (2)

lt RF characteristics gt

330 GHz

425 GHz

GaAs-based 70 nm MHEMTs

- fT 330 GHz

- fmax 425 GHz

RF performance

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University11

fT comparison of HEMTs

[1][2]

[3]

[4]

[5]

[6] [7]

[8] [9]

[10]

This work

[1] Y Yamashita et al IEEE Electron Device Letters

vol 23 no 10 pp 573-575 2002[2] K Shinohara et al IEEE Electron Device Letters

vol 25 no 5 pp 241-243 2004[3] T Suemitsu et al IEEE Trans on Electron Devices

vol 49 no 10 pp 1694-1700 2002[4] K Shinohara et al IEEE Electron Device Letters

vol 22 no 11 pp 507-509 2001[5] K Shinohara et al IEEE MTT-S Digest

vol 3 pp 2159-2162 2001[6] S Bollaert et al IEE Electronics Letters

vol 38 no 8 pp 389-391 2002[7] T Parenty et al Indium Phosphide and

Related Materials pp 626-629 2001[8] A Leuther et al Indium Phosphide and

Related Materials pp 215-218 2003[9] H Wang et al IEEE IEDM Digest

pp 239-242 1993[10] Y C Lien et al IEEE Electron Device Letters

vol 25 no 6 pp 348-350 2004

GaAs-based 70 nm MHEMTs

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University12

DAML(Dielectric-supported Air-gapped Microstrip Line)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University13

Transmission line

Basic elements

Major cause of device loss

Motivation of DAML (1)

SubstrateSubstrate

Conventional transmission lines

Substrate loss

Demand of MEMS technology

Motivation of DAML

Microstrip line CPW line

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University14

Substrate 1

Substrate 2

Substrate

(1)

(2)

(3)

Shielded Membrane Microstrip

(1) Shield cover 2 Masks

(2) Membrane plane 3 Masks

(3) Ground plane 1 Masks

Motivation of DAML (2)

Complex processes

Difficulty of integration withMMICMIMIC

Shielded Membrane Microstrip

DAML technology

Reference SV Robertson et al IEEE Trans Microwave Theory and Techvol 46 no 11 1998 pp 1845-1849 1998

Motivation of DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University15

Surface micromachined transmission line Reduced substrate loss due to elevated signal line

Simple process Compatibility with standard MMICMIMIC fabrication Photo-lithography and low-temperature process

Easily integrated with MMICMIMIC (3 additional masks required) Dielectric post used for mechanical stability (1 post1 mm)

Possibility of vertical integration (3-D integration)

SI GaAs substrate

Dielectric post

Signal line

Ground

DAML Dielectric-supported Air-gapped Microstrip Line

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University16

w

d

h

g

3h ⅹ2 + w

Formula for Effective Dielectric Constant in Partial Dielectric Layer

h Dielectric post height (microm) w Signal line width (microm)

g Dielectric post gap (microm)

d Dielectric post size (microm)

3hⅹ2 + w Field area (by Ansoft HFSS)

The effective dielectric constant εeff is 1086 by calculation (Where g = 500 microm h = 10 microm w = 44 microm d = 40 microm)

wh

whgd

whgd

polyimidepolyimide

eff

121

12

1)23(

1

2

1)23(

12

2

DAML

)23(1

2

whgd

polyimider

Dielectric constant of DAML-Substrate is 1108 by calculation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University17

Process flow of the DAML

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Sacrificial layer (AZ4903)patterning

Seed metal (TiAu)evaporation and

Electro-molding (AZ4903)formation

Signal line (Au) formationand sacrificial layer removal

Ground metal (TiAu) anddielectric post (polyimide)

formation

Process flow of the DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University18

Dielectric Post

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University19

Sacrificial Layer

Fabricated DAML

Reflow the photoresist for smooth metal overlay

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University20

Fabricated DAML

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University21

Comparison of transmission lines[1] K Nishikawa et al IEEE MTT-S Digest vol 3

2001 pp 1881-1884

[2] GE Ponchak et al IEEE Trans Components Packaging and Manufacturing Technology-B

vol 21 no 2 pp 171-176 1998

[3] Suidong Yang et al IEEE Trans MicrowaveTheory and Techniques

vol 46 no 5 pp 623-631 1998

[4] YC Shih et al Microwave Journal

pp 95-105 1991

[5] Youngwoo Kwon et al IEEE Microwave

and Wireless Components Letters

vol 11 no 2 pp 59-61 2001[6] SV Robertson et al IEEE Trans Microwave

Theory and Techniques

vol 46 no 11 1998 pp 1845-1849 1998

This work Sung-Chan Kim et al IEEE Microwaveand Wireless Components Lettersvol 15 no 10 pp 652-654 2005

This work H S Lee et al IEE Electronics Letters

vol 39 no 25 pp 1827-1828 2003

DAML Characteristic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University22

Shielded DAML using Flip chip technique

h Dielectric post height w Signal line width

g Dielectric post gap

d Dielectric post size

Lower Ground Plane

Upper Ground Plane

Polyimide Dielectric post

Air-bridged Signal line

Connected Ground using Flip chip Stud

Ultra low loss extended height (10 microm rarr 17 microm) Shielding effect

- Radiation electromagnetic and environmental interference are avoided by enclosing microstrip circuitry in a shielding cavity

Simple process not bulk micromachining (using flip-chip technique)

SDAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University23

Fabricated DAML (height = 17 microm)

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University24

Simulation Measurement

80(GHz) 163 185

94(GHz)

189 153

110(GHz)

222 213

Signal line width 44 microm (dBcm)

DAML Characteristic (Measurement)

Insertion loss versus Signal line height

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University25

Comparison of original DAML

SDAML Characteristic

0 20 40 60 80 100 120 14000

05

10

15

20

25

30

35

40

Inse

rtion

loss

[dB

cm]

Frequency [GHz]

DAML (h = 10 m) DAML (h = 17 m) SDAML (h = 17 m)

60(GHz)

94(GHz)

120(GHz)

DAML(10 microm) 187 256 31

DAML(17 microm) 127 189 242

SDAML(17 microm) 107 141 167

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University26

CPW

Microstrip

DAML

Reduced Size DAML

λg 4 94 GHz

Electrical length (λg 4 94 GHz )

CPW 304 microm

Microstrip 266 microm

DAML 792 microm

RS-DAML 478 microm

Comparison of electrical length

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University27

Total Size 604 microm times 520 microm

Passive Device using DAML Technology W-band Reduced Size branch-line coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University28

Coupling loss 361 dB

Isolation -355 dB

Transmission loss 425 dB

Return loss -369 dB

Measurement result of W-band Reduced branch-line coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University29

Comparison of W-band branch line coupler

CaseCouplingloss (dB)

Return loss (dB)

Chip size(mm2)

Centerfrequency

(GHz)

1 (CPW)

About -35 About -20 05 ⅹ05 90

RSCDAML -361 -369 06ⅹ052 94

Passive Device using DAML Technology

Reference 1 M Schlechtweg et al GaAs IC Symposium 1995 Technical Digest 1995

17th Annual IEEE 29 Oct-1 Nov 1995 Page(s)214 - 217

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University30

W-band Hybrid Ring Coupler

Fabricated W-band hybrid ring coupler

Coupler size146 mm (diameter)

10 microm

50 Ω termination

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University31

S-parameters of W-band hybrid ring coupler

Transmission loss380 plusmn 008 dB

( 85-105 GHz)

Coupling loss

357 plusmn 022 dB

W-band Hybrid Ring Coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University32

Comparison of W-band hybrid ring coupler

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 94

Thiswork -372 -335 -34 94

Hybrid Ring Coupler

This work Sung-Chan Kim et al IEEE MWCL vol 15 no 10 pp 652-654 2005

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University33

Diameter 0888 mm

W-band reduced ring hybrid coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University34

Reduced to 63 in area

Conventional Coupler

Diameter 1460 mm

Reduced Coupler

Diameter 0888 mm

Comparison of coupler sizes

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Coupling loss 435 dB Isolation -4823 dB

Transmission loss 444 dB Return loss below -25 dB (all port)

75 80 85 90 95 100 105 110

-60

-50

-40

-30

-20

-10

0

S-p

aram

eter

[dB]

Frequency [GHz]

S21Thru S31coupling S23Isolation

Insertion loss

70 75 80 85 90 95 100 105 110 115

-40

-30

-20

-10

0

S-pa

ram

eter

[dB]

Frequency [GHz]

S11 S22 S33

Return loss

Measurement result of W-band reduced ring hybrid coupler

Passive Device using DAML Technology

35

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Comparison of W-band hybrid ring coupler

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)Diameter

(mm)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 About 07 94

DAML -372 -335 -34 146 94

RSCDAML -444 -435 -4823 088 94

Passive Device using DAML Technology

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

36

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

(a) MIM coupling capacitor

(b) Stepped Impedance Perturbation

Novel W-Band Dual Mode Stepped Impedance Resonator BPF Using DAML Technology

(a) (b)

Journal of the Korean Physical Society vol 51 no 10 pp S280-S283 December 2007

Fabricated BPF

(b)

(a)

Passive Device using DAML Technology

37

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University38

60 65 70 75 80 85 90 95 100 105 110 115 120-40

-35

-30

-25

-20

-15

-10

-5

0

5

Inse

rtion

Los

s (d

B)

Frequency (GHz)

S11

S22

S21

S12

Simulation

Step Impedance Ratio 05

MIM Capacitor Size 75 microm2

Perturbation Length 275 microm

Measured Result of W-band BPF

- Insertion Loss 265 dB 97 GHz

- Relative Bandwidth 12

Passive Device using DAML Technology

38

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

60-GHz CPW-fed Dielectric-Resonator-Above-Patch

Antenna for Broadband WLAN Applications Using DAML Technology

Microwave and Optical Technology Letters vol 49 Issue 8 pp 1859-1861 2005

Passive Device using DAML Technology

39

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Fabricated Antenna

(a) Fabricated patch using DAML

(b) 60 GHz RDRA

(c) Proposed antenna

(d) Antenna integrated by 60 GHz VCO

Passive Device using DAML Technology

40

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measured Results

Passive Device using DAML Technology

41

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University42

3-D W-band Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University43

Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

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Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

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Introduction

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Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

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IntroductionPrivate issue

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Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

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Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

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Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

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Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

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Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

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Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

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Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

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Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

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Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

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Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

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Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

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LNA ndash OscillationSystem Specification

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80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

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Detector ndash TransitionSystem Specification

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Detector ndash OutputSystem Specification

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Size ndash Array SystemSystem Specification

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Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

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Development of Security Screening System

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System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

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Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

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Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

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Video Demo

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Video Demo2011 01 31

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Conclusion

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ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 6: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University5

Mask Aligner ICP-Dry etcher

FC Bonder

E-Beam Lithography

Thermal Evaporator ULVAC EBV-10

Rapid Thermal Process System (RTP) KVR-020

Plasma Enhanced Chemical Vapor Deposition (PECVD) JCSS-41MR

O2 Plasma Asher Oxford plasma lab 80 plus

Mask Aligner Karl Suss MA6

Inductively Coupled Plasma Reactive Ion Etching (ICP-RIE) KVICP-T4083

E-Beam Evaporator System KVE-T5560

E-Beam Lithography System Leica EBPG-4HR

Au Plating System

Vacuum Dry Oven SB-CD520

Lapping Machine Allied MultiPrep TM System

Furnace Metritherm

Surface Profiler a-step 200

Thin Film Analyzer Tyger

Flip Chip Bonder Laurier M9

Wedge bonder Hybond 572-A

Ball bonder Hybond 626

Spectrum amp Vector Network Analyzer

Semiconductor Characterization System Keithley 4200-PCS

Ansys HFSS amp Agilent ADS Simulation Program

Plasma Asher

Furnace

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GaAs-based 70 nm MHEMTs

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Fabricated MHEMT

GaAs-based 70 nm MHEMTs

lt70 microm times 2 MHEMTgt ltResist profile of gate footgt

70 nm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University8

70 nm Gate Metamorphic HEMT

Si3N4 passivation 800 Å

Gate length 70 nm

Double exposure method

Tri-layer resist stack

ZEP520 DCB = 15 1

PMGI

PMMA950K MCB = 1 1Gate metal formation

TiAu = 5004500 ÅSEM view of fabricated 70 nm gate

Development of MMIC Libraries

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University9

DC performance- Drain current density 607 mAmm

- Transconductance (gm) 1015 Smm

lt I-V characteristics gt lt Transconductance characteristics gt

70 nm times140 microm MHEMT (1)

GaAs-based 70 nm MHEMTs

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University10

70 nm times140 microm MHEMT (2)

lt RF characteristics gt

330 GHz

425 GHz

GaAs-based 70 nm MHEMTs

- fT 330 GHz

- fmax 425 GHz

RF performance

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University11

fT comparison of HEMTs

[1][2]

[3]

[4]

[5]

[6] [7]

[8] [9]

[10]

This work

[1] Y Yamashita et al IEEE Electron Device Letters

vol 23 no 10 pp 573-575 2002[2] K Shinohara et al IEEE Electron Device Letters

vol 25 no 5 pp 241-243 2004[3] T Suemitsu et al IEEE Trans on Electron Devices

vol 49 no 10 pp 1694-1700 2002[4] K Shinohara et al IEEE Electron Device Letters

vol 22 no 11 pp 507-509 2001[5] K Shinohara et al IEEE MTT-S Digest

vol 3 pp 2159-2162 2001[6] S Bollaert et al IEE Electronics Letters

vol 38 no 8 pp 389-391 2002[7] T Parenty et al Indium Phosphide and

Related Materials pp 626-629 2001[8] A Leuther et al Indium Phosphide and

Related Materials pp 215-218 2003[9] H Wang et al IEEE IEDM Digest

pp 239-242 1993[10] Y C Lien et al IEEE Electron Device Letters

vol 25 no 6 pp 348-350 2004

GaAs-based 70 nm MHEMTs

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University12

DAML(Dielectric-supported Air-gapped Microstrip Line)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University13

Transmission line

Basic elements

Major cause of device loss

Motivation of DAML (1)

SubstrateSubstrate

Conventional transmission lines

Substrate loss

Demand of MEMS technology

Motivation of DAML

Microstrip line CPW line

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University14

Substrate 1

Substrate 2

Substrate

(1)

(2)

(3)

Shielded Membrane Microstrip

(1) Shield cover 2 Masks

(2) Membrane plane 3 Masks

(3) Ground plane 1 Masks

Motivation of DAML (2)

Complex processes

Difficulty of integration withMMICMIMIC

Shielded Membrane Microstrip

DAML technology

Reference SV Robertson et al IEEE Trans Microwave Theory and Techvol 46 no 11 1998 pp 1845-1849 1998

Motivation of DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University15

Surface micromachined transmission line Reduced substrate loss due to elevated signal line

Simple process Compatibility with standard MMICMIMIC fabrication Photo-lithography and low-temperature process

Easily integrated with MMICMIMIC (3 additional masks required) Dielectric post used for mechanical stability (1 post1 mm)

Possibility of vertical integration (3-D integration)

SI GaAs substrate

Dielectric post

Signal line

Ground

DAML Dielectric-supported Air-gapped Microstrip Line

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University16

w

d

h

g

3h ⅹ2 + w

Formula for Effective Dielectric Constant in Partial Dielectric Layer

h Dielectric post height (microm) w Signal line width (microm)

g Dielectric post gap (microm)

d Dielectric post size (microm)

3hⅹ2 + w Field area (by Ansoft HFSS)

The effective dielectric constant εeff is 1086 by calculation (Where g = 500 microm h = 10 microm w = 44 microm d = 40 microm)

wh

whgd

whgd

polyimidepolyimide

eff

121

12

1)23(

1

2

1)23(

12

2

DAML

)23(1

2

whgd

polyimider

Dielectric constant of DAML-Substrate is 1108 by calculation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University17

Process flow of the DAML

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Sacrificial layer (AZ4903)patterning

Seed metal (TiAu)evaporation and

Electro-molding (AZ4903)formation

Signal line (Au) formationand sacrificial layer removal

Ground metal (TiAu) anddielectric post (polyimide)

formation

Process flow of the DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University18

Dielectric Post

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University19

Sacrificial Layer

Fabricated DAML

Reflow the photoresist for smooth metal overlay

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Fabricated DAML

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University21

Comparison of transmission lines[1] K Nishikawa et al IEEE MTT-S Digest vol 3

2001 pp 1881-1884

[2] GE Ponchak et al IEEE Trans Components Packaging and Manufacturing Technology-B

vol 21 no 2 pp 171-176 1998

[3] Suidong Yang et al IEEE Trans MicrowaveTheory and Techniques

vol 46 no 5 pp 623-631 1998

[4] YC Shih et al Microwave Journal

pp 95-105 1991

[5] Youngwoo Kwon et al IEEE Microwave

and Wireless Components Letters

vol 11 no 2 pp 59-61 2001[6] SV Robertson et al IEEE Trans Microwave

Theory and Techniques

vol 46 no 11 1998 pp 1845-1849 1998

This work Sung-Chan Kim et al IEEE Microwaveand Wireless Components Lettersvol 15 no 10 pp 652-654 2005

This work H S Lee et al IEE Electronics Letters

vol 39 no 25 pp 1827-1828 2003

DAML Characteristic

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Shielded DAML using Flip chip technique

h Dielectric post height w Signal line width

g Dielectric post gap

d Dielectric post size

Lower Ground Plane

Upper Ground Plane

Polyimide Dielectric post

Air-bridged Signal line

Connected Ground using Flip chip Stud

Ultra low loss extended height (10 microm rarr 17 microm) Shielding effect

- Radiation electromagnetic and environmental interference are avoided by enclosing microstrip circuitry in a shielding cavity

Simple process not bulk micromachining (using flip-chip technique)

SDAML

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Fabricated DAML (height = 17 microm)

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University24

Simulation Measurement

80(GHz) 163 185

94(GHz)

189 153

110(GHz)

222 213

Signal line width 44 microm (dBcm)

DAML Characteristic (Measurement)

Insertion loss versus Signal line height

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University25

Comparison of original DAML

SDAML Characteristic

0 20 40 60 80 100 120 14000

05

10

15

20

25

30

35

40

Inse

rtion

loss

[dB

cm]

Frequency [GHz]

DAML (h = 10 m) DAML (h = 17 m) SDAML (h = 17 m)

60(GHz)

94(GHz)

120(GHz)

DAML(10 microm) 187 256 31

DAML(17 microm) 127 189 242

SDAML(17 microm) 107 141 167

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University26

CPW

Microstrip

DAML

Reduced Size DAML

λg 4 94 GHz

Electrical length (λg 4 94 GHz )

CPW 304 microm

Microstrip 266 microm

DAML 792 microm

RS-DAML 478 microm

Comparison of electrical length

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University27

Total Size 604 microm times 520 microm

Passive Device using DAML Technology W-band Reduced Size branch-line coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University28

Coupling loss 361 dB

Isolation -355 dB

Transmission loss 425 dB

Return loss -369 dB

Measurement result of W-band Reduced branch-line coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University29

Comparison of W-band branch line coupler

CaseCouplingloss (dB)

Return loss (dB)

Chip size(mm2)

Centerfrequency

(GHz)

1 (CPW)

About -35 About -20 05 ⅹ05 90

RSCDAML -361 -369 06ⅹ052 94

Passive Device using DAML Technology

Reference 1 M Schlechtweg et al GaAs IC Symposium 1995 Technical Digest 1995

17th Annual IEEE 29 Oct-1 Nov 1995 Page(s)214 - 217

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W-band Hybrid Ring Coupler

Fabricated W-band hybrid ring coupler

Coupler size146 mm (diameter)

10 microm

50 Ω termination

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University31

S-parameters of W-band hybrid ring coupler

Transmission loss380 plusmn 008 dB

( 85-105 GHz)

Coupling loss

357 plusmn 022 dB

W-band Hybrid Ring Coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University32

Comparison of W-band hybrid ring coupler

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 94

Thiswork -372 -335 -34 94

Hybrid Ring Coupler

This work Sung-Chan Kim et al IEEE MWCL vol 15 no 10 pp 652-654 2005

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University33

Diameter 0888 mm

W-band reduced ring hybrid coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University34

Reduced to 63 in area

Conventional Coupler

Diameter 1460 mm

Reduced Coupler

Diameter 0888 mm

Comparison of coupler sizes

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Coupling loss 435 dB Isolation -4823 dB

Transmission loss 444 dB Return loss below -25 dB (all port)

75 80 85 90 95 100 105 110

-60

-50

-40

-30

-20

-10

0

S-p

aram

eter

[dB]

Frequency [GHz]

S21Thru S31coupling S23Isolation

Insertion loss

70 75 80 85 90 95 100 105 110 115

-40

-30

-20

-10

0

S-pa

ram

eter

[dB]

Frequency [GHz]

S11 S22 S33

Return loss

Measurement result of W-band reduced ring hybrid coupler

Passive Device using DAML Technology

35

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Comparison of W-band hybrid ring coupler

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)Diameter

(mm)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 About 07 94

DAML -372 -335 -34 146 94

RSCDAML -444 -435 -4823 088 94

Passive Device using DAML Technology

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

36

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

(a) MIM coupling capacitor

(b) Stepped Impedance Perturbation

Novel W-Band Dual Mode Stepped Impedance Resonator BPF Using DAML Technology

(a) (b)

Journal of the Korean Physical Society vol 51 no 10 pp S280-S283 December 2007

Fabricated BPF

(b)

(a)

Passive Device using DAML Technology

37

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University38

60 65 70 75 80 85 90 95 100 105 110 115 120-40

-35

-30

-25

-20

-15

-10

-5

0

5

Inse

rtion

Los

s (d

B)

Frequency (GHz)

S11

S22

S21

S12

Simulation

Step Impedance Ratio 05

MIM Capacitor Size 75 microm2

Perturbation Length 275 microm

Measured Result of W-band BPF

- Insertion Loss 265 dB 97 GHz

- Relative Bandwidth 12

Passive Device using DAML Technology

38

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

60-GHz CPW-fed Dielectric-Resonator-Above-Patch

Antenna for Broadband WLAN Applications Using DAML Technology

Microwave and Optical Technology Letters vol 49 Issue 8 pp 1859-1861 2005

Passive Device using DAML Technology

39

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Fabricated Antenna

(a) Fabricated patch using DAML

(b) 60 GHz RDRA

(c) Proposed antenna

(d) Antenna integrated by 60 GHz VCO

Passive Device using DAML Technology

40

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measured Results

Passive Device using DAML Technology

41

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University42

3-D W-band Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University43

Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

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Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 7: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University6

GaAs-based 70 nm MHEMTs

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University7

Fabricated MHEMT

GaAs-based 70 nm MHEMTs

lt70 microm times 2 MHEMTgt ltResist profile of gate footgt

70 nm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University8

70 nm Gate Metamorphic HEMT

Si3N4 passivation 800 Å

Gate length 70 nm

Double exposure method

Tri-layer resist stack

ZEP520 DCB = 15 1

PMGI

PMMA950K MCB = 1 1Gate metal formation

TiAu = 5004500 ÅSEM view of fabricated 70 nm gate

Development of MMIC Libraries

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University9

DC performance- Drain current density 607 mAmm

- Transconductance (gm) 1015 Smm

lt I-V characteristics gt lt Transconductance characteristics gt

70 nm times140 microm MHEMT (1)

GaAs-based 70 nm MHEMTs

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University10

70 nm times140 microm MHEMT (2)

lt RF characteristics gt

330 GHz

425 GHz

GaAs-based 70 nm MHEMTs

- fT 330 GHz

- fmax 425 GHz

RF performance

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University11

fT comparison of HEMTs

[1][2]

[3]

[4]

[5]

[6] [7]

[8] [9]

[10]

This work

[1] Y Yamashita et al IEEE Electron Device Letters

vol 23 no 10 pp 573-575 2002[2] K Shinohara et al IEEE Electron Device Letters

vol 25 no 5 pp 241-243 2004[3] T Suemitsu et al IEEE Trans on Electron Devices

vol 49 no 10 pp 1694-1700 2002[4] K Shinohara et al IEEE Electron Device Letters

vol 22 no 11 pp 507-509 2001[5] K Shinohara et al IEEE MTT-S Digest

vol 3 pp 2159-2162 2001[6] S Bollaert et al IEE Electronics Letters

vol 38 no 8 pp 389-391 2002[7] T Parenty et al Indium Phosphide and

Related Materials pp 626-629 2001[8] A Leuther et al Indium Phosphide and

Related Materials pp 215-218 2003[9] H Wang et al IEEE IEDM Digest

pp 239-242 1993[10] Y C Lien et al IEEE Electron Device Letters

vol 25 no 6 pp 348-350 2004

GaAs-based 70 nm MHEMTs

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University12

DAML(Dielectric-supported Air-gapped Microstrip Line)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University13

Transmission line

Basic elements

Major cause of device loss

Motivation of DAML (1)

SubstrateSubstrate

Conventional transmission lines

Substrate loss

Demand of MEMS technology

Motivation of DAML

Microstrip line CPW line

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University14

Substrate 1

Substrate 2

Substrate

(1)

(2)

(3)

Shielded Membrane Microstrip

(1) Shield cover 2 Masks

(2) Membrane plane 3 Masks

(3) Ground plane 1 Masks

Motivation of DAML (2)

Complex processes

Difficulty of integration withMMICMIMIC

Shielded Membrane Microstrip

DAML technology

Reference SV Robertson et al IEEE Trans Microwave Theory and Techvol 46 no 11 1998 pp 1845-1849 1998

Motivation of DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University15

Surface micromachined transmission line Reduced substrate loss due to elevated signal line

Simple process Compatibility with standard MMICMIMIC fabrication Photo-lithography and low-temperature process

Easily integrated with MMICMIMIC (3 additional masks required) Dielectric post used for mechanical stability (1 post1 mm)

Possibility of vertical integration (3-D integration)

SI GaAs substrate

Dielectric post

Signal line

Ground

DAML Dielectric-supported Air-gapped Microstrip Line

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University16

w

d

h

g

3h ⅹ2 + w

Formula for Effective Dielectric Constant in Partial Dielectric Layer

h Dielectric post height (microm) w Signal line width (microm)

g Dielectric post gap (microm)

d Dielectric post size (microm)

3hⅹ2 + w Field area (by Ansoft HFSS)

The effective dielectric constant εeff is 1086 by calculation (Where g = 500 microm h = 10 microm w = 44 microm d = 40 microm)

wh

whgd

whgd

polyimidepolyimide

eff

121

12

1)23(

1

2

1)23(

12

2

DAML

)23(1

2

whgd

polyimider

Dielectric constant of DAML-Substrate is 1108 by calculation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University17

Process flow of the DAML

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Sacrificial layer (AZ4903)patterning

Seed metal (TiAu)evaporation and

Electro-molding (AZ4903)formation

Signal line (Au) formationand sacrificial layer removal

Ground metal (TiAu) anddielectric post (polyimide)

formation

Process flow of the DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University18

Dielectric Post

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University19

Sacrificial Layer

Fabricated DAML

Reflow the photoresist for smooth metal overlay

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University20

Fabricated DAML

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University21

Comparison of transmission lines[1] K Nishikawa et al IEEE MTT-S Digest vol 3

2001 pp 1881-1884

[2] GE Ponchak et al IEEE Trans Components Packaging and Manufacturing Technology-B

vol 21 no 2 pp 171-176 1998

[3] Suidong Yang et al IEEE Trans MicrowaveTheory and Techniques

vol 46 no 5 pp 623-631 1998

[4] YC Shih et al Microwave Journal

pp 95-105 1991

[5] Youngwoo Kwon et al IEEE Microwave

and Wireless Components Letters

vol 11 no 2 pp 59-61 2001[6] SV Robertson et al IEEE Trans Microwave

Theory and Techniques

vol 46 no 11 1998 pp 1845-1849 1998

This work Sung-Chan Kim et al IEEE Microwaveand Wireless Components Lettersvol 15 no 10 pp 652-654 2005

This work H S Lee et al IEE Electronics Letters

vol 39 no 25 pp 1827-1828 2003

DAML Characteristic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University22

Shielded DAML using Flip chip technique

h Dielectric post height w Signal line width

g Dielectric post gap

d Dielectric post size

Lower Ground Plane

Upper Ground Plane

Polyimide Dielectric post

Air-bridged Signal line

Connected Ground using Flip chip Stud

Ultra low loss extended height (10 microm rarr 17 microm) Shielding effect

- Radiation electromagnetic and environmental interference are avoided by enclosing microstrip circuitry in a shielding cavity

Simple process not bulk micromachining (using flip-chip technique)

SDAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University23

Fabricated DAML (height = 17 microm)

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University24

Simulation Measurement

80(GHz) 163 185

94(GHz)

189 153

110(GHz)

222 213

Signal line width 44 microm (dBcm)

DAML Characteristic (Measurement)

Insertion loss versus Signal line height

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University25

Comparison of original DAML

SDAML Characteristic

0 20 40 60 80 100 120 14000

05

10

15

20

25

30

35

40

Inse

rtion

loss

[dB

cm]

Frequency [GHz]

DAML (h = 10 m) DAML (h = 17 m) SDAML (h = 17 m)

60(GHz)

94(GHz)

120(GHz)

DAML(10 microm) 187 256 31

DAML(17 microm) 127 189 242

SDAML(17 microm) 107 141 167

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University26

CPW

Microstrip

DAML

Reduced Size DAML

λg 4 94 GHz

Electrical length (λg 4 94 GHz )

CPW 304 microm

Microstrip 266 microm

DAML 792 microm

RS-DAML 478 microm

Comparison of electrical length

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University27

Total Size 604 microm times 520 microm

Passive Device using DAML Technology W-band Reduced Size branch-line coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University28

Coupling loss 361 dB

Isolation -355 dB

Transmission loss 425 dB

Return loss -369 dB

Measurement result of W-band Reduced branch-line coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University29

Comparison of W-band branch line coupler

CaseCouplingloss (dB)

Return loss (dB)

Chip size(mm2)

Centerfrequency

(GHz)

1 (CPW)

About -35 About -20 05 ⅹ05 90

RSCDAML -361 -369 06ⅹ052 94

Passive Device using DAML Technology

Reference 1 M Schlechtweg et al GaAs IC Symposium 1995 Technical Digest 1995

17th Annual IEEE 29 Oct-1 Nov 1995 Page(s)214 - 217

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University30

W-band Hybrid Ring Coupler

Fabricated W-band hybrid ring coupler

Coupler size146 mm (diameter)

10 microm

50 Ω termination

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University31

S-parameters of W-band hybrid ring coupler

Transmission loss380 plusmn 008 dB

( 85-105 GHz)

Coupling loss

357 plusmn 022 dB

W-band Hybrid Ring Coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University32

Comparison of W-band hybrid ring coupler

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 94

Thiswork -372 -335 -34 94

Hybrid Ring Coupler

This work Sung-Chan Kim et al IEEE MWCL vol 15 no 10 pp 652-654 2005

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University33

Diameter 0888 mm

W-band reduced ring hybrid coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University34

Reduced to 63 in area

Conventional Coupler

Diameter 1460 mm

Reduced Coupler

Diameter 0888 mm

Comparison of coupler sizes

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Coupling loss 435 dB Isolation -4823 dB

Transmission loss 444 dB Return loss below -25 dB (all port)

75 80 85 90 95 100 105 110

-60

-50

-40

-30

-20

-10

0

S-p

aram

eter

[dB]

Frequency [GHz]

S21Thru S31coupling S23Isolation

Insertion loss

70 75 80 85 90 95 100 105 110 115

-40

-30

-20

-10

0

S-pa

ram

eter

[dB]

Frequency [GHz]

S11 S22 S33

Return loss

Measurement result of W-band reduced ring hybrid coupler

Passive Device using DAML Technology

35

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Comparison of W-band hybrid ring coupler

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)Diameter

(mm)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 About 07 94

DAML -372 -335 -34 146 94

RSCDAML -444 -435 -4823 088 94

Passive Device using DAML Technology

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

36

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

(a) MIM coupling capacitor

(b) Stepped Impedance Perturbation

Novel W-Band Dual Mode Stepped Impedance Resonator BPF Using DAML Technology

(a) (b)

Journal of the Korean Physical Society vol 51 no 10 pp S280-S283 December 2007

Fabricated BPF

(b)

(a)

Passive Device using DAML Technology

37

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University38

60 65 70 75 80 85 90 95 100 105 110 115 120-40

-35

-30

-25

-20

-15

-10

-5

0

5

Inse

rtion

Los

s (d

B)

Frequency (GHz)

S11

S22

S21

S12

Simulation

Step Impedance Ratio 05

MIM Capacitor Size 75 microm2

Perturbation Length 275 microm

Measured Result of W-band BPF

- Insertion Loss 265 dB 97 GHz

- Relative Bandwidth 12

Passive Device using DAML Technology

38

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

60-GHz CPW-fed Dielectric-Resonator-Above-Patch

Antenna for Broadband WLAN Applications Using DAML Technology

Microwave and Optical Technology Letters vol 49 Issue 8 pp 1859-1861 2005

Passive Device using DAML Technology

39

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Fabricated Antenna

(a) Fabricated patch using DAML

(b) 60 GHz RDRA

(c) Proposed antenna

(d) Antenna integrated by 60 GHz VCO

Passive Device using DAML Technology

40

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measured Results

Passive Device using DAML Technology

41

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University42

3-D W-band Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University43

Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

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MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

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Transceiver

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Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

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LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

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Detector ndash TransitionSystem Specification

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Detector ndash OutputSystem Specification

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Size ndash Array SystemSystem Specification

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Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

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Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 8: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University7

Fabricated MHEMT

GaAs-based 70 nm MHEMTs

lt70 microm times 2 MHEMTgt ltResist profile of gate footgt

70 nm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University8

70 nm Gate Metamorphic HEMT

Si3N4 passivation 800 Å

Gate length 70 nm

Double exposure method

Tri-layer resist stack

ZEP520 DCB = 15 1

PMGI

PMMA950K MCB = 1 1Gate metal formation

TiAu = 5004500 ÅSEM view of fabricated 70 nm gate

Development of MMIC Libraries

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University9

DC performance- Drain current density 607 mAmm

- Transconductance (gm) 1015 Smm

lt I-V characteristics gt lt Transconductance characteristics gt

70 nm times140 microm MHEMT (1)

GaAs-based 70 nm MHEMTs

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University10

70 nm times140 microm MHEMT (2)

lt RF characteristics gt

330 GHz

425 GHz

GaAs-based 70 nm MHEMTs

- fT 330 GHz

- fmax 425 GHz

RF performance

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University11

fT comparison of HEMTs

[1][2]

[3]

[4]

[5]

[6] [7]

[8] [9]

[10]

This work

[1] Y Yamashita et al IEEE Electron Device Letters

vol 23 no 10 pp 573-575 2002[2] K Shinohara et al IEEE Electron Device Letters

vol 25 no 5 pp 241-243 2004[3] T Suemitsu et al IEEE Trans on Electron Devices

vol 49 no 10 pp 1694-1700 2002[4] K Shinohara et al IEEE Electron Device Letters

vol 22 no 11 pp 507-509 2001[5] K Shinohara et al IEEE MTT-S Digest

vol 3 pp 2159-2162 2001[6] S Bollaert et al IEE Electronics Letters

vol 38 no 8 pp 389-391 2002[7] T Parenty et al Indium Phosphide and

Related Materials pp 626-629 2001[8] A Leuther et al Indium Phosphide and

Related Materials pp 215-218 2003[9] H Wang et al IEEE IEDM Digest

pp 239-242 1993[10] Y C Lien et al IEEE Electron Device Letters

vol 25 no 6 pp 348-350 2004

GaAs-based 70 nm MHEMTs

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University12

DAML(Dielectric-supported Air-gapped Microstrip Line)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University13

Transmission line

Basic elements

Major cause of device loss

Motivation of DAML (1)

SubstrateSubstrate

Conventional transmission lines

Substrate loss

Demand of MEMS technology

Motivation of DAML

Microstrip line CPW line

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University14

Substrate 1

Substrate 2

Substrate

(1)

(2)

(3)

Shielded Membrane Microstrip

(1) Shield cover 2 Masks

(2) Membrane plane 3 Masks

(3) Ground plane 1 Masks

Motivation of DAML (2)

Complex processes

Difficulty of integration withMMICMIMIC

Shielded Membrane Microstrip

DAML technology

Reference SV Robertson et al IEEE Trans Microwave Theory and Techvol 46 no 11 1998 pp 1845-1849 1998

Motivation of DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University15

Surface micromachined transmission line Reduced substrate loss due to elevated signal line

Simple process Compatibility with standard MMICMIMIC fabrication Photo-lithography and low-temperature process

Easily integrated with MMICMIMIC (3 additional masks required) Dielectric post used for mechanical stability (1 post1 mm)

Possibility of vertical integration (3-D integration)

SI GaAs substrate

Dielectric post

Signal line

Ground

DAML Dielectric-supported Air-gapped Microstrip Line

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University16

w

d

h

g

3h ⅹ2 + w

Formula for Effective Dielectric Constant in Partial Dielectric Layer

h Dielectric post height (microm) w Signal line width (microm)

g Dielectric post gap (microm)

d Dielectric post size (microm)

3hⅹ2 + w Field area (by Ansoft HFSS)

The effective dielectric constant εeff is 1086 by calculation (Where g = 500 microm h = 10 microm w = 44 microm d = 40 microm)

wh

whgd

whgd

polyimidepolyimide

eff

121

12

1)23(

1

2

1)23(

12

2

DAML

)23(1

2

whgd

polyimider

Dielectric constant of DAML-Substrate is 1108 by calculation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University17

Process flow of the DAML

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Sacrificial layer (AZ4903)patterning

Seed metal (TiAu)evaporation and

Electro-molding (AZ4903)formation

Signal line (Au) formationand sacrificial layer removal

Ground metal (TiAu) anddielectric post (polyimide)

formation

Process flow of the DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University18

Dielectric Post

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University19

Sacrificial Layer

Fabricated DAML

Reflow the photoresist for smooth metal overlay

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University20

Fabricated DAML

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University21

Comparison of transmission lines[1] K Nishikawa et al IEEE MTT-S Digest vol 3

2001 pp 1881-1884

[2] GE Ponchak et al IEEE Trans Components Packaging and Manufacturing Technology-B

vol 21 no 2 pp 171-176 1998

[3] Suidong Yang et al IEEE Trans MicrowaveTheory and Techniques

vol 46 no 5 pp 623-631 1998

[4] YC Shih et al Microwave Journal

pp 95-105 1991

[5] Youngwoo Kwon et al IEEE Microwave

and Wireless Components Letters

vol 11 no 2 pp 59-61 2001[6] SV Robertson et al IEEE Trans Microwave

Theory and Techniques

vol 46 no 11 1998 pp 1845-1849 1998

This work Sung-Chan Kim et al IEEE Microwaveand Wireless Components Lettersvol 15 no 10 pp 652-654 2005

This work H S Lee et al IEE Electronics Letters

vol 39 no 25 pp 1827-1828 2003

DAML Characteristic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University22

Shielded DAML using Flip chip technique

h Dielectric post height w Signal line width

g Dielectric post gap

d Dielectric post size

Lower Ground Plane

Upper Ground Plane

Polyimide Dielectric post

Air-bridged Signal line

Connected Ground using Flip chip Stud

Ultra low loss extended height (10 microm rarr 17 microm) Shielding effect

- Radiation electromagnetic and environmental interference are avoided by enclosing microstrip circuitry in a shielding cavity

Simple process not bulk micromachining (using flip-chip technique)

SDAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University23

Fabricated DAML (height = 17 microm)

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University24

Simulation Measurement

80(GHz) 163 185

94(GHz)

189 153

110(GHz)

222 213

Signal line width 44 microm (dBcm)

DAML Characteristic (Measurement)

Insertion loss versus Signal line height

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University25

Comparison of original DAML

SDAML Characteristic

0 20 40 60 80 100 120 14000

05

10

15

20

25

30

35

40

Inse

rtion

loss

[dB

cm]

Frequency [GHz]

DAML (h = 10 m) DAML (h = 17 m) SDAML (h = 17 m)

60(GHz)

94(GHz)

120(GHz)

DAML(10 microm) 187 256 31

DAML(17 microm) 127 189 242

SDAML(17 microm) 107 141 167

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University26

CPW

Microstrip

DAML

Reduced Size DAML

λg 4 94 GHz

Electrical length (λg 4 94 GHz )

CPW 304 microm

Microstrip 266 microm

DAML 792 microm

RS-DAML 478 microm

Comparison of electrical length

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University27

Total Size 604 microm times 520 microm

Passive Device using DAML Technology W-band Reduced Size branch-line coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University28

Coupling loss 361 dB

Isolation -355 dB

Transmission loss 425 dB

Return loss -369 dB

Measurement result of W-band Reduced branch-line coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University29

Comparison of W-band branch line coupler

CaseCouplingloss (dB)

Return loss (dB)

Chip size(mm2)

Centerfrequency

(GHz)

1 (CPW)

About -35 About -20 05 ⅹ05 90

RSCDAML -361 -369 06ⅹ052 94

Passive Device using DAML Technology

Reference 1 M Schlechtweg et al GaAs IC Symposium 1995 Technical Digest 1995

17th Annual IEEE 29 Oct-1 Nov 1995 Page(s)214 - 217

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University30

W-band Hybrid Ring Coupler

Fabricated W-band hybrid ring coupler

Coupler size146 mm (diameter)

10 microm

50 Ω termination

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University31

S-parameters of W-band hybrid ring coupler

Transmission loss380 plusmn 008 dB

( 85-105 GHz)

Coupling loss

357 plusmn 022 dB

W-band Hybrid Ring Coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University32

Comparison of W-band hybrid ring coupler

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 94

Thiswork -372 -335 -34 94

Hybrid Ring Coupler

This work Sung-Chan Kim et al IEEE MWCL vol 15 no 10 pp 652-654 2005

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University33

Diameter 0888 mm

W-band reduced ring hybrid coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University34

Reduced to 63 in area

Conventional Coupler

Diameter 1460 mm

Reduced Coupler

Diameter 0888 mm

Comparison of coupler sizes

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Coupling loss 435 dB Isolation -4823 dB

Transmission loss 444 dB Return loss below -25 dB (all port)

75 80 85 90 95 100 105 110

-60

-50

-40

-30

-20

-10

0

S-p

aram

eter

[dB]

Frequency [GHz]

S21Thru S31coupling S23Isolation

Insertion loss

70 75 80 85 90 95 100 105 110 115

-40

-30

-20

-10

0

S-pa

ram

eter

[dB]

Frequency [GHz]

S11 S22 S33

Return loss

Measurement result of W-band reduced ring hybrid coupler

Passive Device using DAML Technology

35

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Comparison of W-band hybrid ring coupler

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)Diameter

(mm)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 About 07 94

DAML -372 -335 -34 146 94

RSCDAML -444 -435 -4823 088 94

Passive Device using DAML Technology

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

36

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

(a) MIM coupling capacitor

(b) Stepped Impedance Perturbation

Novel W-Band Dual Mode Stepped Impedance Resonator BPF Using DAML Technology

(a) (b)

Journal of the Korean Physical Society vol 51 no 10 pp S280-S283 December 2007

Fabricated BPF

(b)

(a)

Passive Device using DAML Technology

37

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University38

60 65 70 75 80 85 90 95 100 105 110 115 120-40

-35

-30

-25

-20

-15

-10

-5

0

5

Inse

rtion

Los

s (d

B)

Frequency (GHz)

S11

S22

S21

S12

Simulation

Step Impedance Ratio 05

MIM Capacitor Size 75 microm2

Perturbation Length 275 microm

Measured Result of W-band BPF

- Insertion Loss 265 dB 97 GHz

- Relative Bandwidth 12

Passive Device using DAML Technology

38

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

60-GHz CPW-fed Dielectric-Resonator-Above-Patch

Antenna for Broadband WLAN Applications Using DAML Technology

Microwave and Optical Technology Letters vol 49 Issue 8 pp 1859-1861 2005

Passive Device using DAML Technology

39

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Fabricated Antenna

(a) Fabricated patch using DAML

(b) 60 GHz RDRA

(c) Proposed antenna

(d) Antenna integrated by 60 GHz VCO

Passive Device using DAML Technology

40

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measured Results

Passive Device using DAML Technology

41

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University42

3-D W-band Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University43

Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

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Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

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IntroductionPrivate issue

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Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

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Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

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Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

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Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

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Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

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Development of Radiometer Receiver

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An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

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Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

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Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

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LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

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Detector ndash TransitionSystem Specification

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Detector ndash OutputSystem Specification

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Size ndash Array SystemSystem Specification

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Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

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Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

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Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 9: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University8

70 nm Gate Metamorphic HEMT

Si3N4 passivation 800 Å

Gate length 70 nm

Double exposure method

Tri-layer resist stack

ZEP520 DCB = 15 1

PMGI

PMMA950K MCB = 1 1Gate metal formation

TiAu = 5004500 ÅSEM view of fabricated 70 nm gate

Development of MMIC Libraries

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University9

DC performance- Drain current density 607 mAmm

- Transconductance (gm) 1015 Smm

lt I-V characteristics gt lt Transconductance characteristics gt

70 nm times140 microm MHEMT (1)

GaAs-based 70 nm MHEMTs

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University10

70 nm times140 microm MHEMT (2)

lt RF characteristics gt

330 GHz

425 GHz

GaAs-based 70 nm MHEMTs

- fT 330 GHz

- fmax 425 GHz

RF performance

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University11

fT comparison of HEMTs

[1][2]

[3]

[4]

[5]

[6] [7]

[8] [9]

[10]

This work

[1] Y Yamashita et al IEEE Electron Device Letters

vol 23 no 10 pp 573-575 2002[2] K Shinohara et al IEEE Electron Device Letters

vol 25 no 5 pp 241-243 2004[3] T Suemitsu et al IEEE Trans on Electron Devices

vol 49 no 10 pp 1694-1700 2002[4] K Shinohara et al IEEE Electron Device Letters

vol 22 no 11 pp 507-509 2001[5] K Shinohara et al IEEE MTT-S Digest

vol 3 pp 2159-2162 2001[6] S Bollaert et al IEE Electronics Letters

vol 38 no 8 pp 389-391 2002[7] T Parenty et al Indium Phosphide and

Related Materials pp 626-629 2001[8] A Leuther et al Indium Phosphide and

Related Materials pp 215-218 2003[9] H Wang et al IEEE IEDM Digest

pp 239-242 1993[10] Y C Lien et al IEEE Electron Device Letters

vol 25 no 6 pp 348-350 2004

GaAs-based 70 nm MHEMTs

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University12

DAML(Dielectric-supported Air-gapped Microstrip Line)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University13

Transmission line

Basic elements

Major cause of device loss

Motivation of DAML (1)

SubstrateSubstrate

Conventional transmission lines

Substrate loss

Demand of MEMS technology

Motivation of DAML

Microstrip line CPW line

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University14

Substrate 1

Substrate 2

Substrate

(1)

(2)

(3)

Shielded Membrane Microstrip

(1) Shield cover 2 Masks

(2) Membrane plane 3 Masks

(3) Ground plane 1 Masks

Motivation of DAML (2)

Complex processes

Difficulty of integration withMMICMIMIC

Shielded Membrane Microstrip

DAML technology

Reference SV Robertson et al IEEE Trans Microwave Theory and Techvol 46 no 11 1998 pp 1845-1849 1998

Motivation of DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University15

Surface micromachined transmission line Reduced substrate loss due to elevated signal line

Simple process Compatibility with standard MMICMIMIC fabrication Photo-lithography and low-temperature process

Easily integrated with MMICMIMIC (3 additional masks required) Dielectric post used for mechanical stability (1 post1 mm)

Possibility of vertical integration (3-D integration)

SI GaAs substrate

Dielectric post

Signal line

Ground

DAML Dielectric-supported Air-gapped Microstrip Line

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University16

w

d

h

g

3h ⅹ2 + w

Formula for Effective Dielectric Constant in Partial Dielectric Layer

h Dielectric post height (microm) w Signal line width (microm)

g Dielectric post gap (microm)

d Dielectric post size (microm)

3hⅹ2 + w Field area (by Ansoft HFSS)

The effective dielectric constant εeff is 1086 by calculation (Where g = 500 microm h = 10 microm w = 44 microm d = 40 microm)

wh

whgd

whgd

polyimidepolyimide

eff

121

12

1)23(

1

2

1)23(

12

2

DAML

)23(1

2

whgd

polyimider

Dielectric constant of DAML-Substrate is 1108 by calculation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University17

Process flow of the DAML

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Sacrificial layer (AZ4903)patterning

Seed metal (TiAu)evaporation and

Electro-molding (AZ4903)formation

Signal line (Au) formationand sacrificial layer removal

Ground metal (TiAu) anddielectric post (polyimide)

formation

Process flow of the DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University18

Dielectric Post

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University19

Sacrificial Layer

Fabricated DAML

Reflow the photoresist for smooth metal overlay

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University20

Fabricated DAML

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University21

Comparison of transmission lines[1] K Nishikawa et al IEEE MTT-S Digest vol 3

2001 pp 1881-1884

[2] GE Ponchak et al IEEE Trans Components Packaging and Manufacturing Technology-B

vol 21 no 2 pp 171-176 1998

[3] Suidong Yang et al IEEE Trans MicrowaveTheory and Techniques

vol 46 no 5 pp 623-631 1998

[4] YC Shih et al Microwave Journal

pp 95-105 1991

[5] Youngwoo Kwon et al IEEE Microwave

and Wireless Components Letters

vol 11 no 2 pp 59-61 2001[6] SV Robertson et al IEEE Trans Microwave

Theory and Techniques

vol 46 no 11 1998 pp 1845-1849 1998

This work Sung-Chan Kim et al IEEE Microwaveand Wireless Components Lettersvol 15 no 10 pp 652-654 2005

This work H S Lee et al IEE Electronics Letters

vol 39 no 25 pp 1827-1828 2003

DAML Characteristic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University22

Shielded DAML using Flip chip technique

h Dielectric post height w Signal line width

g Dielectric post gap

d Dielectric post size

Lower Ground Plane

Upper Ground Plane

Polyimide Dielectric post

Air-bridged Signal line

Connected Ground using Flip chip Stud

Ultra low loss extended height (10 microm rarr 17 microm) Shielding effect

- Radiation electromagnetic and environmental interference are avoided by enclosing microstrip circuitry in a shielding cavity

Simple process not bulk micromachining (using flip-chip technique)

SDAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University23

Fabricated DAML (height = 17 microm)

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University24

Simulation Measurement

80(GHz) 163 185

94(GHz)

189 153

110(GHz)

222 213

Signal line width 44 microm (dBcm)

DAML Characteristic (Measurement)

Insertion loss versus Signal line height

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University25

Comparison of original DAML

SDAML Characteristic

0 20 40 60 80 100 120 14000

05

10

15

20

25

30

35

40

Inse

rtion

loss

[dB

cm]

Frequency [GHz]

DAML (h = 10 m) DAML (h = 17 m) SDAML (h = 17 m)

60(GHz)

94(GHz)

120(GHz)

DAML(10 microm) 187 256 31

DAML(17 microm) 127 189 242

SDAML(17 microm) 107 141 167

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University26

CPW

Microstrip

DAML

Reduced Size DAML

λg 4 94 GHz

Electrical length (λg 4 94 GHz )

CPW 304 microm

Microstrip 266 microm

DAML 792 microm

RS-DAML 478 microm

Comparison of electrical length

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University27

Total Size 604 microm times 520 microm

Passive Device using DAML Technology W-band Reduced Size branch-line coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University28

Coupling loss 361 dB

Isolation -355 dB

Transmission loss 425 dB

Return loss -369 dB

Measurement result of W-band Reduced branch-line coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University29

Comparison of W-band branch line coupler

CaseCouplingloss (dB)

Return loss (dB)

Chip size(mm2)

Centerfrequency

(GHz)

1 (CPW)

About -35 About -20 05 ⅹ05 90

RSCDAML -361 -369 06ⅹ052 94

Passive Device using DAML Technology

Reference 1 M Schlechtweg et al GaAs IC Symposium 1995 Technical Digest 1995

17th Annual IEEE 29 Oct-1 Nov 1995 Page(s)214 - 217

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University30

W-band Hybrid Ring Coupler

Fabricated W-band hybrid ring coupler

Coupler size146 mm (diameter)

10 microm

50 Ω termination

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University31

S-parameters of W-band hybrid ring coupler

Transmission loss380 plusmn 008 dB

( 85-105 GHz)

Coupling loss

357 plusmn 022 dB

W-band Hybrid Ring Coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University32

Comparison of W-band hybrid ring coupler

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 94

Thiswork -372 -335 -34 94

Hybrid Ring Coupler

This work Sung-Chan Kim et al IEEE MWCL vol 15 no 10 pp 652-654 2005

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University33

Diameter 0888 mm

W-band reduced ring hybrid coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University34

Reduced to 63 in area

Conventional Coupler

Diameter 1460 mm

Reduced Coupler

Diameter 0888 mm

Comparison of coupler sizes

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Coupling loss 435 dB Isolation -4823 dB

Transmission loss 444 dB Return loss below -25 dB (all port)

75 80 85 90 95 100 105 110

-60

-50

-40

-30

-20

-10

0

S-p

aram

eter

[dB]

Frequency [GHz]

S21Thru S31coupling S23Isolation

Insertion loss

70 75 80 85 90 95 100 105 110 115

-40

-30

-20

-10

0

S-pa

ram

eter

[dB]

Frequency [GHz]

S11 S22 S33

Return loss

Measurement result of W-band reduced ring hybrid coupler

Passive Device using DAML Technology

35

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Comparison of W-band hybrid ring coupler

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)Diameter

(mm)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 About 07 94

DAML -372 -335 -34 146 94

RSCDAML -444 -435 -4823 088 94

Passive Device using DAML Technology

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

36

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

(a) MIM coupling capacitor

(b) Stepped Impedance Perturbation

Novel W-Band Dual Mode Stepped Impedance Resonator BPF Using DAML Technology

(a) (b)

Journal of the Korean Physical Society vol 51 no 10 pp S280-S283 December 2007

Fabricated BPF

(b)

(a)

Passive Device using DAML Technology

37

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University38

60 65 70 75 80 85 90 95 100 105 110 115 120-40

-35

-30

-25

-20

-15

-10

-5

0

5

Inse

rtion

Los

s (d

B)

Frequency (GHz)

S11

S22

S21

S12

Simulation

Step Impedance Ratio 05

MIM Capacitor Size 75 microm2

Perturbation Length 275 microm

Measured Result of W-band BPF

- Insertion Loss 265 dB 97 GHz

- Relative Bandwidth 12

Passive Device using DAML Technology

38

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

60-GHz CPW-fed Dielectric-Resonator-Above-Patch

Antenna for Broadband WLAN Applications Using DAML Technology

Microwave and Optical Technology Letters vol 49 Issue 8 pp 1859-1861 2005

Passive Device using DAML Technology

39

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Fabricated Antenna

(a) Fabricated patch using DAML

(b) 60 GHz RDRA

(c) Proposed antenna

(d) Antenna integrated by 60 GHz VCO

Passive Device using DAML Technology

40

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measured Results

Passive Device using DAML Technology

41

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University42

3-D W-band Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University43

Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

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Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 10: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University9

DC performance- Drain current density 607 mAmm

- Transconductance (gm) 1015 Smm

lt I-V characteristics gt lt Transconductance characteristics gt

70 nm times140 microm MHEMT (1)

GaAs-based 70 nm MHEMTs

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University10

70 nm times140 microm MHEMT (2)

lt RF characteristics gt

330 GHz

425 GHz

GaAs-based 70 nm MHEMTs

- fT 330 GHz

- fmax 425 GHz

RF performance

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University11

fT comparison of HEMTs

[1][2]

[3]

[4]

[5]

[6] [7]

[8] [9]

[10]

This work

[1] Y Yamashita et al IEEE Electron Device Letters

vol 23 no 10 pp 573-575 2002[2] K Shinohara et al IEEE Electron Device Letters

vol 25 no 5 pp 241-243 2004[3] T Suemitsu et al IEEE Trans on Electron Devices

vol 49 no 10 pp 1694-1700 2002[4] K Shinohara et al IEEE Electron Device Letters

vol 22 no 11 pp 507-509 2001[5] K Shinohara et al IEEE MTT-S Digest

vol 3 pp 2159-2162 2001[6] S Bollaert et al IEE Electronics Letters

vol 38 no 8 pp 389-391 2002[7] T Parenty et al Indium Phosphide and

Related Materials pp 626-629 2001[8] A Leuther et al Indium Phosphide and

Related Materials pp 215-218 2003[9] H Wang et al IEEE IEDM Digest

pp 239-242 1993[10] Y C Lien et al IEEE Electron Device Letters

vol 25 no 6 pp 348-350 2004

GaAs-based 70 nm MHEMTs

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University12

DAML(Dielectric-supported Air-gapped Microstrip Line)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University13

Transmission line

Basic elements

Major cause of device loss

Motivation of DAML (1)

SubstrateSubstrate

Conventional transmission lines

Substrate loss

Demand of MEMS technology

Motivation of DAML

Microstrip line CPW line

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University14

Substrate 1

Substrate 2

Substrate

(1)

(2)

(3)

Shielded Membrane Microstrip

(1) Shield cover 2 Masks

(2) Membrane plane 3 Masks

(3) Ground plane 1 Masks

Motivation of DAML (2)

Complex processes

Difficulty of integration withMMICMIMIC

Shielded Membrane Microstrip

DAML technology

Reference SV Robertson et al IEEE Trans Microwave Theory and Techvol 46 no 11 1998 pp 1845-1849 1998

Motivation of DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University15

Surface micromachined transmission line Reduced substrate loss due to elevated signal line

Simple process Compatibility with standard MMICMIMIC fabrication Photo-lithography and low-temperature process

Easily integrated with MMICMIMIC (3 additional masks required) Dielectric post used for mechanical stability (1 post1 mm)

Possibility of vertical integration (3-D integration)

SI GaAs substrate

Dielectric post

Signal line

Ground

DAML Dielectric-supported Air-gapped Microstrip Line

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University16

w

d

h

g

3h ⅹ2 + w

Formula for Effective Dielectric Constant in Partial Dielectric Layer

h Dielectric post height (microm) w Signal line width (microm)

g Dielectric post gap (microm)

d Dielectric post size (microm)

3hⅹ2 + w Field area (by Ansoft HFSS)

The effective dielectric constant εeff is 1086 by calculation (Where g = 500 microm h = 10 microm w = 44 microm d = 40 microm)

wh

whgd

whgd

polyimidepolyimide

eff

121

12

1)23(

1

2

1)23(

12

2

DAML

)23(1

2

whgd

polyimider

Dielectric constant of DAML-Substrate is 1108 by calculation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University17

Process flow of the DAML

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Sacrificial layer (AZ4903)patterning

Seed metal (TiAu)evaporation and

Electro-molding (AZ4903)formation

Signal line (Au) formationand sacrificial layer removal

Ground metal (TiAu) anddielectric post (polyimide)

formation

Process flow of the DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University18

Dielectric Post

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University19

Sacrificial Layer

Fabricated DAML

Reflow the photoresist for smooth metal overlay

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University20

Fabricated DAML

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University21

Comparison of transmission lines[1] K Nishikawa et al IEEE MTT-S Digest vol 3

2001 pp 1881-1884

[2] GE Ponchak et al IEEE Trans Components Packaging and Manufacturing Technology-B

vol 21 no 2 pp 171-176 1998

[3] Suidong Yang et al IEEE Trans MicrowaveTheory and Techniques

vol 46 no 5 pp 623-631 1998

[4] YC Shih et al Microwave Journal

pp 95-105 1991

[5] Youngwoo Kwon et al IEEE Microwave

and Wireless Components Letters

vol 11 no 2 pp 59-61 2001[6] SV Robertson et al IEEE Trans Microwave

Theory and Techniques

vol 46 no 11 1998 pp 1845-1849 1998

This work Sung-Chan Kim et al IEEE Microwaveand Wireless Components Lettersvol 15 no 10 pp 652-654 2005

This work H S Lee et al IEE Electronics Letters

vol 39 no 25 pp 1827-1828 2003

DAML Characteristic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University22

Shielded DAML using Flip chip technique

h Dielectric post height w Signal line width

g Dielectric post gap

d Dielectric post size

Lower Ground Plane

Upper Ground Plane

Polyimide Dielectric post

Air-bridged Signal line

Connected Ground using Flip chip Stud

Ultra low loss extended height (10 microm rarr 17 microm) Shielding effect

- Radiation electromagnetic and environmental interference are avoided by enclosing microstrip circuitry in a shielding cavity

Simple process not bulk micromachining (using flip-chip technique)

SDAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University23

Fabricated DAML (height = 17 microm)

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University24

Simulation Measurement

80(GHz) 163 185

94(GHz)

189 153

110(GHz)

222 213

Signal line width 44 microm (dBcm)

DAML Characteristic (Measurement)

Insertion loss versus Signal line height

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University25

Comparison of original DAML

SDAML Characteristic

0 20 40 60 80 100 120 14000

05

10

15

20

25

30

35

40

Inse

rtion

loss

[dB

cm]

Frequency [GHz]

DAML (h = 10 m) DAML (h = 17 m) SDAML (h = 17 m)

60(GHz)

94(GHz)

120(GHz)

DAML(10 microm) 187 256 31

DAML(17 microm) 127 189 242

SDAML(17 microm) 107 141 167

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University26

CPW

Microstrip

DAML

Reduced Size DAML

λg 4 94 GHz

Electrical length (λg 4 94 GHz )

CPW 304 microm

Microstrip 266 microm

DAML 792 microm

RS-DAML 478 microm

Comparison of electrical length

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University27

Total Size 604 microm times 520 microm

Passive Device using DAML Technology W-band Reduced Size branch-line coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University28

Coupling loss 361 dB

Isolation -355 dB

Transmission loss 425 dB

Return loss -369 dB

Measurement result of W-band Reduced branch-line coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University29

Comparison of W-band branch line coupler

CaseCouplingloss (dB)

Return loss (dB)

Chip size(mm2)

Centerfrequency

(GHz)

1 (CPW)

About -35 About -20 05 ⅹ05 90

RSCDAML -361 -369 06ⅹ052 94

Passive Device using DAML Technology

Reference 1 M Schlechtweg et al GaAs IC Symposium 1995 Technical Digest 1995

17th Annual IEEE 29 Oct-1 Nov 1995 Page(s)214 - 217

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University30

W-band Hybrid Ring Coupler

Fabricated W-band hybrid ring coupler

Coupler size146 mm (diameter)

10 microm

50 Ω termination

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University31

S-parameters of W-band hybrid ring coupler

Transmission loss380 plusmn 008 dB

( 85-105 GHz)

Coupling loss

357 plusmn 022 dB

W-band Hybrid Ring Coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University32

Comparison of W-band hybrid ring coupler

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 94

Thiswork -372 -335 -34 94

Hybrid Ring Coupler

This work Sung-Chan Kim et al IEEE MWCL vol 15 no 10 pp 652-654 2005

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University33

Diameter 0888 mm

W-band reduced ring hybrid coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University34

Reduced to 63 in area

Conventional Coupler

Diameter 1460 mm

Reduced Coupler

Diameter 0888 mm

Comparison of coupler sizes

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Coupling loss 435 dB Isolation -4823 dB

Transmission loss 444 dB Return loss below -25 dB (all port)

75 80 85 90 95 100 105 110

-60

-50

-40

-30

-20

-10

0

S-p

aram

eter

[dB]

Frequency [GHz]

S21Thru S31coupling S23Isolation

Insertion loss

70 75 80 85 90 95 100 105 110 115

-40

-30

-20

-10

0

S-pa

ram

eter

[dB]

Frequency [GHz]

S11 S22 S33

Return loss

Measurement result of W-band reduced ring hybrid coupler

Passive Device using DAML Technology

35

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Comparison of W-band hybrid ring coupler

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)Diameter

(mm)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 About 07 94

DAML -372 -335 -34 146 94

RSCDAML -444 -435 -4823 088 94

Passive Device using DAML Technology

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

36

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

(a) MIM coupling capacitor

(b) Stepped Impedance Perturbation

Novel W-Band Dual Mode Stepped Impedance Resonator BPF Using DAML Technology

(a) (b)

Journal of the Korean Physical Society vol 51 no 10 pp S280-S283 December 2007

Fabricated BPF

(b)

(a)

Passive Device using DAML Technology

37

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University38

60 65 70 75 80 85 90 95 100 105 110 115 120-40

-35

-30

-25

-20

-15

-10

-5

0

5

Inse

rtion

Los

s (d

B)

Frequency (GHz)

S11

S22

S21

S12

Simulation

Step Impedance Ratio 05

MIM Capacitor Size 75 microm2

Perturbation Length 275 microm

Measured Result of W-band BPF

- Insertion Loss 265 dB 97 GHz

- Relative Bandwidth 12

Passive Device using DAML Technology

38

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

60-GHz CPW-fed Dielectric-Resonator-Above-Patch

Antenna for Broadband WLAN Applications Using DAML Technology

Microwave and Optical Technology Letters vol 49 Issue 8 pp 1859-1861 2005

Passive Device using DAML Technology

39

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Fabricated Antenna

(a) Fabricated patch using DAML

(b) 60 GHz RDRA

(c) Proposed antenna

(d) Antenna integrated by 60 GHz VCO

Passive Device using DAML Technology

40

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measured Results

Passive Device using DAML Technology

41

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3-D W-band Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University43

Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

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MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

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MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

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Introduction

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IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 11: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University10

70 nm times140 microm MHEMT (2)

lt RF characteristics gt

330 GHz

425 GHz

GaAs-based 70 nm MHEMTs

- fT 330 GHz

- fmax 425 GHz

RF performance

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University11

fT comparison of HEMTs

[1][2]

[3]

[4]

[5]

[6] [7]

[8] [9]

[10]

This work

[1] Y Yamashita et al IEEE Electron Device Letters

vol 23 no 10 pp 573-575 2002[2] K Shinohara et al IEEE Electron Device Letters

vol 25 no 5 pp 241-243 2004[3] T Suemitsu et al IEEE Trans on Electron Devices

vol 49 no 10 pp 1694-1700 2002[4] K Shinohara et al IEEE Electron Device Letters

vol 22 no 11 pp 507-509 2001[5] K Shinohara et al IEEE MTT-S Digest

vol 3 pp 2159-2162 2001[6] S Bollaert et al IEE Electronics Letters

vol 38 no 8 pp 389-391 2002[7] T Parenty et al Indium Phosphide and

Related Materials pp 626-629 2001[8] A Leuther et al Indium Phosphide and

Related Materials pp 215-218 2003[9] H Wang et al IEEE IEDM Digest

pp 239-242 1993[10] Y C Lien et al IEEE Electron Device Letters

vol 25 no 6 pp 348-350 2004

GaAs-based 70 nm MHEMTs

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University12

DAML(Dielectric-supported Air-gapped Microstrip Line)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University13

Transmission line

Basic elements

Major cause of device loss

Motivation of DAML (1)

SubstrateSubstrate

Conventional transmission lines

Substrate loss

Demand of MEMS technology

Motivation of DAML

Microstrip line CPW line

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University14

Substrate 1

Substrate 2

Substrate

(1)

(2)

(3)

Shielded Membrane Microstrip

(1) Shield cover 2 Masks

(2) Membrane plane 3 Masks

(3) Ground plane 1 Masks

Motivation of DAML (2)

Complex processes

Difficulty of integration withMMICMIMIC

Shielded Membrane Microstrip

DAML technology

Reference SV Robertson et al IEEE Trans Microwave Theory and Techvol 46 no 11 1998 pp 1845-1849 1998

Motivation of DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University15

Surface micromachined transmission line Reduced substrate loss due to elevated signal line

Simple process Compatibility with standard MMICMIMIC fabrication Photo-lithography and low-temperature process

Easily integrated with MMICMIMIC (3 additional masks required) Dielectric post used for mechanical stability (1 post1 mm)

Possibility of vertical integration (3-D integration)

SI GaAs substrate

Dielectric post

Signal line

Ground

DAML Dielectric-supported Air-gapped Microstrip Line

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University16

w

d

h

g

3h ⅹ2 + w

Formula for Effective Dielectric Constant in Partial Dielectric Layer

h Dielectric post height (microm) w Signal line width (microm)

g Dielectric post gap (microm)

d Dielectric post size (microm)

3hⅹ2 + w Field area (by Ansoft HFSS)

The effective dielectric constant εeff is 1086 by calculation (Where g = 500 microm h = 10 microm w = 44 microm d = 40 microm)

wh

whgd

whgd

polyimidepolyimide

eff

121

12

1)23(

1

2

1)23(

12

2

DAML

)23(1

2

whgd

polyimider

Dielectric constant of DAML-Substrate is 1108 by calculation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University17

Process flow of the DAML

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Sacrificial layer (AZ4903)patterning

Seed metal (TiAu)evaporation and

Electro-molding (AZ4903)formation

Signal line (Au) formationand sacrificial layer removal

Ground metal (TiAu) anddielectric post (polyimide)

formation

Process flow of the DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University18

Dielectric Post

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University19

Sacrificial Layer

Fabricated DAML

Reflow the photoresist for smooth metal overlay

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University20

Fabricated DAML

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University21

Comparison of transmission lines[1] K Nishikawa et al IEEE MTT-S Digest vol 3

2001 pp 1881-1884

[2] GE Ponchak et al IEEE Trans Components Packaging and Manufacturing Technology-B

vol 21 no 2 pp 171-176 1998

[3] Suidong Yang et al IEEE Trans MicrowaveTheory and Techniques

vol 46 no 5 pp 623-631 1998

[4] YC Shih et al Microwave Journal

pp 95-105 1991

[5] Youngwoo Kwon et al IEEE Microwave

and Wireless Components Letters

vol 11 no 2 pp 59-61 2001[6] SV Robertson et al IEEE Trans Microwave

Theory and Techniques

vol 46 no 11 1998 pp 1845-1849 1998

This work Sung-Chan Kim et al IEEE Microwaveand Wireless Components Lettersvol 15 no 10 pp 652-654 2005

This work H S Lee et al IEE Electronics Letters

vol 39 no 25 pp 1827-1828 2003

DAML Characteristic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University22

Shielded DAML using Flip chip technique

h Dielectric post height w Signal line width

g Dielectric post gap

d Dielectric post size

Lower Ground Plane

Upper Ground Plane

Polyimide Dielectric post

Air-bridged Signal line

Connected Ground using Flip chip Stud

Ultra low loss extended height (10 microm rarr 17 microm) Shielding effect

- Radiation electromagnetic and environmental interference are avoided by enclosing microstrip circuitry in a shielding cavity

Simple process not bulk micromachining (using flip-chip technique)

SDAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University23

Fabricated DAML (height = 17 microm)

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University24

Simulation Measurement

80(GHz) 163 185

94(GHz)

189 153

110(GHz)

222 213

Signal line width 44 microm (dBcm)

DAML Characteristic (Measurement)

Insertion loss versus Signal line height

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University25

Comparison of original DAML

SDAML Characteristic

0 20 40 60 80 100 120 14000

05

10

15

20

25

30

35

40

Inse

rtion

loss

[dB

cm]

Frequency [GHz]

DAML (h = 10 m) DAML (h = 17 m) SDAML (h = 17 m)

60(GHz)

94(GHz)

120(GHz)

DAML(10 microm) 187 256 31

DAML(17 microm) 127 189 242

SDAML(17 microm) 107 141 167

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University26

CPW

Microstrip

DAML

Reduced Size DAML

λg 4 94 GHz

Electrical length (λg 4 94 GHz )

CPW 304 microm

Microstrip 266 microm

DAML 792 microm

RS-DAML 478 microm

Comparison of electrical length

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University27

Total Size 604 microm times 520 microm

Passive Device using DAML Technology W-band Reduced Size branch-line coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University28

Coupling loss 361 dB

Isolation -355 dB

Transmission loss 425 dB

Return loss -369 dB

Measurement result of W-band Reduced branch-line coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University29

Comparison of W-band branch line coupler

CaseCouplingloss (dB)

Return loss (dB)

Chip size(mm2)

Centerfrequency

(GHz)

1 (CPW)

About -35 About -20 05 ⅹ05 90

RSCDAML -361 -369 06ⅹ052 94

Passive Device using DAML Technology

Reference 1 M Schlechtweg et al GaAs IC Symposium 1995 Technical Digest 1995

17th Annual IEEE 29 Oct-1 Nov 1995 Page(s)214 - 217

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University30

W-band Hybrid Ring Coupler

Fabricated W-band hybrid ring coupler

Coupler size146 mm (diameter)

10 microm

50 Ω termination

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University31

S-parameters of W-band hybrid ring coupler

Transmission loss380 plusmn 008 dB

( 85-105 GHz)

Coupling loss

357 plusmn 022 dB

W-band Hybrid Ring Coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University32

Comparison of W-band hybrid ring coupler

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 94

Thiswork -372 -335 -34 94

Hybrid Ring Coupler

This work Sung-Chan Kim et al IEEE MWCL vol 15 no 10 pp 652-654 2005

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University33

Diameter 0888 mm

W-band reduced ring hybrid coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University34

Reduced to 63 in area

Conventional Coupler

Diameter 1460 mm

Reduced Coupler

Diameter 0888 mm

Comparison of coupler sizes

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Coupling loss 435 dB Isolation -4823 dB

Transmission loss 444 dB Return loss below -25 dB (all port)

75 80 85 90 95 100 105 110

-60

-50

-40

-30

-20

-10

0

S-p

aram

eter

[dB]

Frequency [GHz]

S21Thru S31coupling S23Isolation

Insertion loss

70 75 80 85 90 95 100 105 110 115

-40

-30

-20

-10

0

S-pa

ram

eter

[dB]

Frequency [GHz]

S11 S22 S33

Return loss

Measurement result of W-band reduced ring hybrid coupler

Passive Device using DAML Technology

35

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Comparison of W-band hybrid ring coupler

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)Diameter

(mm)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 About 07 94

DAML -372 -335 -34 146 94

RSCDAML -444 -435 -4823 088 94

Passive Device using DAML Technology

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

36

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

(a) MIM coupling capacitor

(b) Stepped Impedance Perturbation

Novel W-Band Dual Mode Stepped Impedance Resonator BPF Using DAML Technology

(a) (b)

Journal of the Korean Physical Society vol 51 no 10 pp S280-S283 December 2007

Fabricated BPF

(b)

(a)

Passive Device using DAML Technology

37

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University38

60 65 70 75 80 85 90 95 100 105 110 115 120-40

-35

-30

-25

-20

-15

-10

-5

0

5

Inse

rtion

Los

s (d

B)

Frequency (GHz)

S11

S22

S21

S12

Simulation

Step Impedance Ratio 05

MIM Capacitor Size 75 microm2

Perturbation Length 275 microm

Measured Result of W-band BPF

- Insertion Loss 265 dB 97 GHz

- Relative Bandwidth 12

Passive Device using DAML Technology

38

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

60-GHz CPW-fed Dielectric-Resonator-Above-Patch

Antenna for Broadband WLAN Applications Using DAML Technology

Microwave and Optical Technology Letters vol 49 Issue 8 pp 1859-1861 2005

Passive Device using DAML Technology

39

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Fabricated Antenna

(a) Fabricated patch using DAML

(b) 60 GHz RDRA

(c) Proposed antenna

(d) Antenna integrated by 60 GHz VCO

Passive Device using DAML Technology

40

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measured Results

Passive Device using DAML Technology

41

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University42

3-D W-band Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University43

Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

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Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

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Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

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Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

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Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 12: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University11

fT comparison of HEMTs

[1][2]

[3]

[4]

[5]

[6] [7]

[8] [9]

[10]

This work

[1] Y Yamashita et al IEEE Electron Device Letters

vol 23 no 10 pp 573-575 2002[2] K Shinohara et al IEEE Electron Device Letters

vol 25 no 5 pp 241-243 2004[3] T Suemitsu et al IEEE Trans on Electron Devices

vol 49 no 10 pp 1694-1700 2002[4] K Shinohara et al IEEE Electron Device Letters

vol 22 no 11 pp 507-509 2001[5] K Shinohara et al IEEE MTT-S Digest

vol 3 pp 2159-2162 2001[6] S Bollaert et al IEE Electronics Letters

vol 38 no 8 pp 389-391 2002[7] T Parenty et al Indium Phosphide and

Related Materials pp 626-629 2001[8] A Leuther et al Indium Phosphide and

Related Materials pp 215-218 2003[9] H Wang et al IEEE IEDM Digest

pp 239-242 1993[10] Y C Lien et al IEEE Electron Device Letters

vol 25 no 6 pp 348-350 2004

GaAs-based 70 nm MHEMTs

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University12

DAML(Dielectric-supported Air-gapped Microstrip Line)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University13

Transmission line

Basic elements

Major cause of device loss

Motivation of DAML (1)

SubstrateSubstrate

Conventional transmission lines

Substrate loss

Demand of MEMS technology

Motivation of DAML

Microstrip line CPW line

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University14

Substrate 1

Substrate 2

Substrate

(1)

(2)

(3)

Shielded Membrane Microstrip

(1) Shield cover 2 Masks

(2) Membrane plane 3 Masks

(3) Ground plane 1 Masks

Motivation of DAML (2)

Complex processes

Difficulty of integration withMMICMIMIC

Shielded Membrane Microstrip

DAML technology

Reference SV Robertson et al IEEE Trans Microwave Theory and Techvol 46 no 11 1998 pp 1845-1849 1998

Motivation of DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University15

Surface micromachined transmission line Reduced substrate loss due to elevated signal line

Simple process Compatibility with standard MMICMIMIC fabrication Photo-lithography and low-temperature process

Easily integrated with MMICMIMIC (3 additional masks required) Dielectric post used for mechanical stability (1 post1 mm)

Possibility of vertical integration (3-D integration)

SI GaAs substrate

Dielectric post

Signal line

Ground

DAML Dielectric-supported Air-gapped Microstrip Line

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University16

w

d

h

g

3h ⅹ2 + w

Formula for Effective Dielectric Constant in Partial Dielectric Layer

h Dielectric post height (microm) w Signal line width (microm)

g Dielectric post gap (microm)

d Dielectric post size (microm)

3hⅹ2 + w Field area (by Ansoft HFSS)

The effective dielectric constant εeff is 1086 by calculation (Where g = 500 microm h = 10 microm w = 44 microm d = 40 microm)

wh

whgd

whgd

polyimidepolyimide

eff

121

12

1)23(

1

2

1)23(

12

2

DAML

)23(1

2

whgd

polyimider

Dielectric constant of DAML-Substrate is 1108 by calculation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University17

Process flow of the DAML

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Sacrificial layer (AZ4903)patterning

Seed metal (TiAu)evaporation and

Electro-molding (AZ4903)formation

Signal line (Au) formationand sacrificial layer removal

Ground metal (TiAu) anddielectric post (polyimide)

formation

Process flow of the DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University18

Dielectric Post

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University19

Sacrificial Layer

Fabricated DAML

Reflow the photoresist for smooth metal overlay

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University20

Fabricated DAML

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University21

Comparison of transmission lines[1] K Nishikawa et al IEEE MTT-S Digest vol 3

2001 pp 1881-1884

[2] GE Ponchak et al IEEE Trans Components Packaging and Manufacturing Technology-B

vol 21 no 2 pp 171-176 1998

[3] Suidong Yang et al IEEE Trans MicrowaveTheory and Techniques

vol 46 no 5 pp 623-631 1998

[4] YC Shih et al Microwave Journal

pp 95-105 1991

[5] Youngwoo Kwon et al IEEE Microwave

and Wireless Components Letters

vol 11 no 2 pp 59-61 2001[6] SV Robertson et al IEEE Trans Microwave

Theory and Techniques

vol 46 no 11 1998 pp 1845-1849 1998

This work Sung-Chan Kim et al IEEE Microwaveand Wireless Components Lettersvol 15 no 10 pp 652-654 2005

This work H S Lee et al IEE Electronics Letters

vol 39 no 25 pp 1827-1828 2003

DAML Characteristic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University22

Shielded DAML using Flip chip technique

h Dielectric post height w Signal line width

g Dielectric post gap

d Dielectric post size

Lower Ground Plane

Upper Ground Plane

Polyimide Dielectric post

Air-bridged Signal line

Connected Ground using Flip chip Stud

Ultra low loss extended height (10 microm rarr 17 microm) Shielding effect

- Radiation electromagnetic and environmental interference are avoided by enclosing microstrip circuitry in a shielding cavity

Simple process not bulk micromachining (using flip-chip technique)

SDAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University23

Fabricated DAML (height = 17 microm)

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University24

Simulation Measurement

80(GHz) 163 185

94(GHz)

189 153

110(GHz)

222 213

Signal line width 44 microm (dBcm)

DAML Characteristic (Measurement)

Insertion loss versus Signal line height

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University25

Comparison of original DAML

SDAML Characteristic

0 20 40 60 80 100 120 14000

05

10

15

20

25

30

35

40

Inse

rtion

loss

[dB

cm]

Frequency [GHz]

DAML (h = 10 m) DAML (h = 17 m) SDAML (h = 17 m)

60(GHz)

94(GHz)

120(GHz)

DAML(10 microm) 187 256 31

DAML(17 microm) 127 189 242

SDAML(17 microm) 107 141 167

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University26

CPW

Microstrip

DAML

Reduced Size DAML

λg 4 94 GHz

Electrical length (λg 4 94 GHz )

CPW 304 microm

Microstrip 266 microm

DAML 792 microm

RS-DAML 478 microm

Comparison of electrical length

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University27

Total Size 604 microm times 520 microm

Passive Device using DAML Technology W-band Reduced Size branch-line coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University28

Coupling loss 361 dB

Isolation -355 dB

Transmission loss 425 dB

Return loss -369 dB

Measurement result of W-band Reduced branch-line coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University29

Comparison of W-band branch line coupler

CaseCouplingloss (dB)

Return loss (dB)

Chip size(mm2)

Centerfrequency

(GHz)

1 (CPW)

About -35 About -20 05 ⅹ05 90

RSCDAML -361 -369 06ⅹ052 94

Passive Device using DAML Technology

Reference 1 M Schlechtweg et al GaAs IC Symposium 1995 Technical Digest 1995

17th Annual IEEE 29 Oct-1 Nov 1995 Page(s)214 - 217

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W-band Hybrid Ring Coupler

Fabricated W-band hybrid ring coupler

Coupler size146 mm (diameter)

10 microm

50 Ω termination

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University31

S-parameters of W-band hybrid ring coupler

Transmission loss380 plusmn 008 dB

( 85-105 GHz)

Coupling loss

357 plusmn 022 dB

W-band Hybrid Ring Coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University32

Comparison of W-band hybrid ring coupler

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 94

Thiswork -372 -335 -34 94

Hybrid Ring Coupler

This work Sung-Chan Kim et al IEEE MWCL vol 15 no 10 pp 652-654 2005

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University33

Diameter 0888 mm

W-band reduced ring hybrid coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University34

Reduced to 63 in area

Conventional Coupler

Diameter 1460 mm

Reduced Coupler

Diameter 0888 mm

Comparison of coupler sizes

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Coupling loss 435 dB Isolation -4823 dB

Transmission loss 444 dB Return loss below -25 dB (all port)

75 80 85 90 95 100 105 110

-60

-50

-40

-30

-20

-10

0

S-p

aram

eter

[dB]

Frequency [GHz]

S21Thru S31coupling S23Isolation

Insertion loss

70 75 80 85 90 95 100 105 110 115

-40

-30

-20

-10

0

S-pa

ram

eter

[dB]

Frequency [GHz]

S11 S22 S33

Return loss

Measurement result of W-band reduced ring hybrid coupler

Passive Device using DAML Technology

35

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Comparison of W-band hybrid ring coupler

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)Diameter

(mm)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 About 07 94

DAML -372 -335 -34 146 94

RSCDAML -444 -435 -4823 088 94

Passive Device using DAML Technology

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

36

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

(a) MIM coupling capacitor

(b) Stepped Impedance Perturbation

Novel W-Band Dual Mode Stepped Impedance Resonator BPF Using DAML Technology

(a) (b)

Journal of the Korean Physical Society vol 51 no 10 pp S280-S283 December 2007

Fabricated BPF

(b)

(a)

Passive Device using DAML Technology

37

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University38

60 65 70 75 80 85 90 95 100 105 110 115 120-40

-35

-30

-25

-20

-15

-10

-5

0

5

Inse

rtion

Los

s (d

B)

Frequency (GHz)

S11

S22

S21

S12

Simulation

Step Impedance Ratio 05

MIM Capacitor Size 75 microm2

Perturbation Length 275 microm

Measured Result of W-band BPF

- Insertion Loss 265 dB 97 GHz

- Relative Bandwidth 12

Passive Device using DAML Technology

38

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

60-GHz CPW-fed Dielectric-Resonator-Above-Patch

Antenna for Broadband WLAN Applications Using DAML Technology

Microwave and Optical Technology Letters vol 49 Issue 8 pp 1859-1861 2005

Passive Device using DAML Technology

39

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Fabricated Antenna

(a) Fabricated patch using DAML

(b) 60 GHz RDRA

(c) Proposed antenna

(d) Antenna integrated by 60 GHz VCO

Passive Device using DAML Technology

40

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measured Results

Passive Device using DAML Technology

41

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3-D W-band Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University43

Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

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MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 13: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University12

DAML(Dielectric-supported Air-gapped Microstrip Line)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University13

Transmission line

Basic elements

Major cause of device loss

Motivation of DAML (1)

SubstrateSubstrate

Conventional transmission lines

Substrate loss

Demand of MEMS technology

Motivation of DAML

Microstrip line CPW line

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University14

Substrate 1

Substrate 2

Substrate

(1)

(2)

(3)

Shielded Membrane Microstrip

(1) Shield cover 2 Masks

(2) Membrane plane 3 Masks

(3) Ground plane 1 Masks

Motivation of DAML (2)

Complex processes

Difficulty of integration withMMICMIMIC

Shielded Membrane Microstrip

DAML technology

Reference SV Robertson et al IEEE Trans Microwave Theory and Techvol 46 no 11 1998 pp 1845-1849 1998

Motivation of DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University15

Surface micromachined transmission line Reduced substrate loss due to elevated signal line

Simple process Compatibility with standard MMICMIMIC fabrication Photo-lithography and low-temperature process

Easily integrated with MMICMIMIC (3 additional masks required) Dielectric post used for mechanical stability (1 post1 mm)

Possibility of vertical integration (3-D integration)

SI GaAs substrate

Dielectric post

Signal line

Ground

DAML Dielectric-supported Air-gapped Microstrip Line

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University16

w

d

h

g

3h ⅹ2 + w

Formula for Effective Dielectric Constant in Partial Dielectric Layer

h Dielectric post height (microm) w Signal line width (microm)

g Dielectric post gap (microm)

d Dielectric post size (microm)

3hⅹ2 + w Field area (by Ansoft HFSS)

The effective dielectric constant εeff is 1086 by calculation (Where g = 500 microm h = 10 microm w = 44 microm d = 40 microm)

wh

whgd

whgd

polyimidepolyimide

eff

121

12

1)23(

1

2

1)23(

12

2

DAML

)23(1

2

whgd

polyimider

Dielectric constant of DAML-Substrate is 1108 by calculation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University17

Process flow of the DAML

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Sacrificial layer (AZ4903)patterning

Seed metal (TiAu)evaporation and

Electro-molding (AZ4903)formation

Signal line (Au) formationand sacrificial layer removal

Ground metal (TiAu) anddielectric post (polyimide)

formation

Process flow of the DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University18

Dielectric Post

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University19

Sacrificial Layer

Fabricated DAML

Reflow the photoresist for smooth metal overlay

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University20

Fabricated DAML

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University21

Comparison of transmission lines[1] K Nishikawa et al IEEE MTT-S Digest vol 3

2001 pp 1881-1884

[2] GE Ponchak et al IEEE Trans Components Packaging and Manufacturing Technology-B

vol 21 no 2 pp 171-176 1998

[3] Suidong Yang et al IEEE Trans MicrowaveTheory and Techniques

vol 46 no 5 pp 623-631 1998

[4] YC Shih et al Microwave Journal

pp 95-105 1991

[5] Youngwoo Kwon et al IEEE Microwave

and Wireless Components Letters

vol 11 no 2 pp 59-61 2001[6] SV Robertson et al IEEE Trans Microwave

Theory and Techniques

vol 46 no 11 1998 pp 1845-1849 1998

This work Sung-Chan Kim et al IEEE Microwaveand Wireless Components Lettersvol 15 no 10 pp 652-654 2005

This work H S Lee et al IEE Electronics Letters

vol 39 no 25 pp 1827-1828 2003

DAML Characteristic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University22

Shielded DAML using Flip chip technique

h Dielectric post height w Signal line width

g Dielectric post gap

d Dielectric post size

Lower Ground Plane

Upper Ground Plane

Polyimide Dielectric post

Air-bridged Signal line

Connected Ground using Flip chip Stud

Ultra low loss extended height (10 microm rarr 17 microm) Shielding effect

- Radiation electromagnetic and environmental interference are avoided by enclosing microstrip circuitry in a shielding cavity

Simple process not bulk micromachining (using flip-chip technique)

SDAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University23

Fabricated DAML (height = 17 microm)

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University24

Simulation Measurement

80(GHz) 163 185

94(GHz)

189 153

110(GHz)

222 213

Signal line width 44 microm (dBcm)

DAML Characteristic (Measurement)

Insertion loss versus Signal line height

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University25

Comparison of original DAML

SDAML Characteristic

0 20 40 60 80 100 120 14000

05

10

15

20

25

30

35

40

Inse

rtion

loss

[dB

cm]

Frequency [GHz]

DAML (h = 10 m) DAML (h = 17 m) SDAML (h = 17 m)

60(GHz)

94(GHz)

120(GHz)

DAML(10 microm) 187 256 31

DAML(17 microm) 127 189 242

SDAML(17 microm) 107 141 167

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University26

CPW

Microstrip

DAML

Reduced Size DAML

λg 4 94 GHz

Electrical length (λg 4 94 GHz )

CPW 304 microm

Microstrip 266 microm

DAML 792 microm

RS-DAML 478 microm

Comparison of electrical length

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University27

Total Size 604 microm times 520 microm

Passive Device using DAML Technology W-band Reduced Size branch-line coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University28

Coupling loss 361 dB

Isolation -355 dB

Transmission loss 425 dB

Return loss -369 dB

Measurement result of W-band Reduced branch-line coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University29

Comparison of W-band branch line coupler

CaseCouplingloss (dB)

Return loss (dB)

Chip size(mm2)

Centerfrequency

(GHz)

1 (CPW)

About -35 About -20 05 ⅹ05 90

RSCDAML -361 -369 06ⅹ052 94

Passive Device using DAML Technology

Reference 1 M Schlechtweg et al GaAs IC Symposium 1995 Technical Digest 1995

17th Annual IEEE 29 Oct-1 Nov 1995 Page(s)214 - 217

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University30

W-band Hybrid Ring Coupler

Fabricated W-band hybrid ring coupler

Coupler size146 mm (diameter)

10 microm

50 Ω termination

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University31

S-parameters of W-band hybrid ring coupler

Transmission loss380 plusmn 008 dB

( 85-105 GHz)

Coupling loss

357 plusmn 022 dB

W-band Hybrid Ring Coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University32

Comparison of W-band hybrid ring coupler

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 94

Thiswork -372 -335 -34 94

Hybrid Ring Coupler

This work Sung-Chan Kim et al IEEE MWCL vol 15 no 10 pp 652-654 2005

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University33

Diameter 0888 mm

W-band reduced ring hybrid coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University34

Reduced to 63 in area

Conventional Coupler

Diameter 1460 mm

Reduced Coupler

Diameter 0888 mm

Comparison of coupler sizes

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Coupling loss 435 dB Isolation -4823 dB

Transmission loss 444 dB Return loss below -25 dB (all port)

75 80 85 90 95 100 105 110

-60

-50

-40

-30

-20

-10

0

S-p

aram

eter

[dB]

Frequency [GHz]

S21Thru S31coupling S23Isolation

Insertion loss

70 75 80 85 90 95 100 105 110 115

-40

-30

-20

-10

0

S-pa

ram

eter

[dB]

Frequency [GHz]

S11 S22 S33

Return loss

Measurement result of W-band reduced ring hybrid coupler

Passive Device using DAML Technology

35

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Comparison of W-band hybrid ring coupler

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)Diameter

(mm)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 About 07 94

DAML -372 -335 -34 146 94

RSCDAML -444 -435 -4823 088 94

Passive Device using DAML Technology

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

36

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

(a) MIM coupling capacitor

(b) Stepped Impedance Perturbation

Novel W-Band Dual Mode Stepped Impedance Resonator BPF Using DAML Technology

(a) (b)

Journal of the Korean Physical Society vol 51 no 10 pp S280-S283 December 2007

Fabricated BPF

(b)

(a)

Passive Device using DAML Technology

37

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University38

60 65 70 75 80 85 90 95 100 105 110 115 120-40

-35

-30

-25

-20

-15

-10

-5

0

5

Inse

rtion

Los

s (d

B)

Frequency (GHz)

S11

S22

S21

S12

Simulation

Step Impedance Ratio 05

MIM Capacitor Size 75 microm2

Perturbation Length 275 microm

Measured Result of W-band BPF

- Insertion Loss 265 dB 97 GHz

- Relative Bandwidth 12

Passive Device using DAML Technology

38

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

60-GHz CPW-fed Dielectric-Resonator-Above-Patch

Antenna for Broadband WLAN Applications Using DAML Technology

Microwave and Optical Technology Letters vol 49 Issue 8 pp 1859-1861 2005

Passive Device using DAML Technology

39

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Fabricated Antenna

(a) Fabricated patch using DAML

(b) 60 GHz RDRA

(c) Proposed antenna

(d) Antenna integrated by 60 GHz VCO

Passive Device using DAML Technology

40

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measured Results

Passive Device using DAML Technology

41

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University42

3-D W-band Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University43

Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

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Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 14: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University13

Transmission line

Basic elements

Major cause of device loss

Motivation of DAML (1)

SubstrateSubstrate

Conventional transmission lines

Substrate loss

Demand of MEMS technology

Motivation of DAML

Microstrip line CPW line

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University14

Substrate 1

Substrate 2

Substrate

(1)

(2)

(3)

Shielded Membrane Microstrip

(1) Shield cover 2 Masks

(2) Membrane plane 3 Masks

(3) Ground plane 1 Masks

Motivation of DAML (2)

Complex processes

Difficulty of integration withMMICMIMIC

Shielded Membrane Microstrip

DAML technology

Reference SV Robertson et al IEEE Trans Microwave Theory and Techvol 46 no 11 1998 pp 1845-1849 1998

Motivation of DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University15

Surface micromachined transmission line Reduced substrate loss due to elevated signal line

Simple process Compatibility with standard MMICMIMIC fabrication Photo-lithography and low-temperature process

Easily integrated with MMICMIMIC (3 additional masks required) Dielectric post used for mechanical stability (1 post1 mm)

Possibility of vertical integration (3-D integration)

SI GaAs substrate

Dielectric post

Signal line

Ground

DAML Dielectric-supported Air-gapped Microstrip Line

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University16

w

d

h

g

3h ⅹ2 + w

Formula for Effective Dielectric Constant in Partial Dielectric Layer

h Dielectric post height (microm) w Signal line width (microm)

g Dielectric post gap (microm)

d Dielectric post size (microm)

3hⅹ2 + w Field area (by Ansoft HFSS)

The effective dielectric constant εeff is 1086 by calculation (Where g = 500 microm h = 10 microm w = 44 microm d = 40 microm)

wh

whgd

whgd

polyimidepolyimide

eff

121

12

1)23(

1

2

1)23(

12

2

DAML

)23(1

2

whgd

polyimider

Dielectric constant of DAML-Substrate is 1108 by calculation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University17

Process flow of the DAML

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Sacrificial layer (AZ4903)patterning

Seed metal (TiAu)evaporation and

Electro-molding (AZ4903)formation

Signal line (Au) formationand sacrificial layer removal

Ground metal (TiAu) anddielectric post (polyimide)

formation

Process flow of the DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University18

Dielectric Post

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University19

Sacrificial Layer

Fabricated DAML

Reflow the photoresist for smooth metal overlay

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University20

Fabricated DAML

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University21

Comparison of transmission lines[1] K Nishikawa et al IEEE MTT-S Digest vol 3

2001 pp 1881-1884

[2] GE Ponchak et al IEEE Trans Components Packaging and Manufacturing Technology-B

vol 21 no 2 pp 171-176 1998

[3] Suidong Yang et al IEEE Trans MicrowaveTheory and Techniques

vol 46 no 5 pp 623-631 1998

[4] YC Shih et al Microwave Journal

pp 95-105 1991

[5] Youngwoo Kwon et al IEEE Microwave

and Wireless Components Letters

vol 11 no 2 pp 59-61 2001[6] SV Robertson et al IEEE Trans Microwave

Theory and Techniques

vol 46 no 11 1998 pp 1845-1849 1998

This work Sung-Chan Kim et al IEEE Microwaveand Wireless Components Lettersvol 15 no 10 pp 652-654 2005

This work H S Lee et al IEE Electronics Letters

vol 39 no 25 pp 1827-1828 2003

DAML Characteristic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University22

Shielded DAML using Flip chip technique

h Dielectric post height w Signal line width

g Dielectric post gap

d Dielectric post size

Lower Ground Plane

Upper Ground Plane

Polyimide Dielectric post

Air-bridged Signal line

Connected Ground using Flip chip Stud

Ultra low loss extended height (10 microm rarr 17 microm) Shielding effect

- Radiation electromagnetic and environmental interference are avoided by enclosing microstrip circuitry in a shielding cavity

Simple process not bulk micromachining (using flip-chip technique)

SDAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University23

Fabricated DAML (height = 17 microm)

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University24

Simulation Measurement

80(GHz) 163 185

94(GHz)

189 153

110(GHz)

222 213

Signal line width 44 microm (dBcm)

DAML Characteristic (Measurement)

Insertion loss versus Signal line height

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University25

Comparison of original DAML

SDAML Characteristic

0 20 40 60 80 100 120 14000

05

10

15

20

25

30

35

40

Inse

rtion

loss

[dB

cm]

Frequency [GHz]

DAML (h = 10 m) DAML (h = 17 m) SDAML (h = 17 m)

60(GHz)

94(GHz)

120(GHz)

DAML(10 microm) 187 256 31

DAML(17 microm) 127 189 242

SDAML(17 microm) 107 141 167

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University26

CPW

Microstrip

DAML

Reduced Size DAML

λg 4 94 GHz

Electrical length (λg 4 94 GHz )

CPW 304 microm

Microstrip 266 microm

DAML 792 microm

RS-DAML 478 microm

Comparison of electrical length

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University27

Total Size 604 microm times 520 microm

Passive Device using DAML Technology W-band Reduced Size branch-line coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University28

Coupling loss 361 dB

Isolation -355 dB

Transmission loss 425 dB

Return loss -369 dB

Measurement result of W-band Reduced branch-line coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University29

Comparison of W-band branch line coupler

CaseCouplingloss (dB)

Return loss (dB)

Chip size(mm2)

Centerfrequency

(GHz)

1 (CPW)

About -35 About -20 05 ⅹ05 90

RSCDAML -361 -369 06ⅹ052 94

Passive Device using DAML Technology

Reference 1 M Schlechtweg et al GaAs IC Symposium 1995 Technical Digest 1995

17th Annual IEEE 29 Oct-1 Nov 1995 Page(s)214 - 217

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University30

W-band Hybrid Ring Coupler

Fabricated W-band hybrid ring coupler

Coupler size146 mm (diameter)

10 microm

50 Ω termination

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University31

S-parameters of W-band hybrid ring coupler

Transmission loss380 plusmn 008 dB

( 85-105 GHz)

Coupling loss

357 plusmn 022 dB

W-band Hybrid Ring Coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University32

Comparison of W-band hybrid ring coupler

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 94

Thiswork -372 -335 -34 94

Hybrid Ring Coupler

This work Sung-Chan Kim et al IEEE MWCL vol 15 no 10 pp 652-654 2005

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University33

Diameter 0888 mm

W-band reduced ring hybrid coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University34

Reduced to 63 in area

Conventional Coupler

Diameter 1460 mm

Reduced Coupler

Diameter 0888 mm

Comparison of coupler sizes

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Coupling loss 435 dB Isolation -4823 dB

Transmission loss 444 dB Return loss below -25 dB (all port)

75 80 85 90 95 100 105 110

-60

-50

-40

-30

-20

-10

0

S-p

aram

eter

[dB]

Frequency [GHz]

S21Thru S31coupling S23Isolation

Insertion loss

70 75 80 85 90 95 100 105 110 115

-40

-30

-20

-10

0

S-pa

ram

eter

[dB]

Frequency [GHz]

S11 S22 S33

Return loss

Measurement result of W-band reduced ring hybrid coupler

Passive Device using DAML Technology

35

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Comparison of W-band hybrid ring coupler

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)Diameter

(mm)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 About 07 94

DAML -372 -335 -34 146 94

RSCDAML -444 -435 -4823 088 94

Passive Device using DAML Technology

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

36

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

(a) MIM coupling capacitor

(b) Stepped Impedance Perturbation

Novel W-Band Dual Mode Stepped Impedance Resonator BPF Using DAML Technology

(a) (b)

Journal of the Korean Physical Society vol 51 no 10 pp S280-S283 December 2007

Fabricated BPF

(b)

(a)

Passive Device using DAML Technology

37

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University38

60 65 70 75 80 85 90 95 100 105 110 115 120-40

-35

-30

-25

-20

-15

-10

-5

0

5

Inse

rtion

Los

s (d

B)

Frequency (GHz)

S11

S22

S21

S12

Simulation

Step Impedance Ratio 05

MIM Capacitor Size 75 microm2

Perturbation Length 275 microm

Measured Result of W-band BPF

- Insertion Loss 265 dB 97 GHz

- Relative Bandwidth 12

Passive Device using DAML Technology

38

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

60-GHz CPW-fed Dielectric-Resonator-Above-Patch

Antenna for Broadband WLAN Applications Using DAML Technology

Microwave and Optical Technology Letters vol 49 Issue 8 pp 1859-1861 2005

Passive Device using DAML Technology

39

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Fabricated Antenna

(a) Fabricated patch using DAML

(b) 60 GHz RDRA

(c) Proposed antenna

(d) Antenna integrated by 60 GHz VCO

Passive Device using DAML Technology

40

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measured Results

Passive Device using DAML Technology

41

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University42

3-D W-band Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University43

Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

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Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

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Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 15: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University14

Substrate 1

Substrate 2

Substrate

(1)

(2)

(3)

Shielded Membrane Microstrip

(1) Shield cover 2 Masks

(2) Membrane plane 3 Masks

(3) Ground plane 1 Masks

Motivation of DAML (2)

Complex processes

Difficulty of integration withMMICMIMIC

Shielded Membrane Microstrip

DAML technology

Reference SV Robertson et al IEEE Trans Microwave Theory and Techvol 46 no 11 1998 pp 1845-1849 1998

Motivation of DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University15

Surface micromachined transmission line Reduced substrate loss due to elevated signal line

Simple process Compatibility with standard MMICMIMIC fabrication Photo-lithography and low-temperature process

Easily integrated with MMICMIMIC (3 additional masks required) Dielectric post used for mechanical stability (1 post1 mm)

Possibility of vertical integration (3-D integration)

SI GaAs substrate

Dielectric post

Signal line

Ground

DAML Dielectric-supported Air-gapped Microstrip Line

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University16

w

d

h

g

3h ⅹ2 + w

Formula for Effective Dielectric Constant in Partial Dielectric Layer

h Dielectric post height (microm) w Signal line width (microm)

g Dielectric post gap (microm)

d Dielectric post size (microm)

3hⅹ2 + w Field area (by Ansoft HFSS)

The effective dielectric constant εeff is 1086 by calculation (Where g = 500 microm h = 10 microm w = 44 microm d = 40 microm)

wh

whgd

whgd

polyimidepolyimide

eff

121

12

1)23(

1

2

1)23(

12

2

DAML

)23(1

2

whgd

polyimider

Dielectric constant of DAML-Substrate is 1108 by calculation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University17

Process flow of the DAML

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Sacrificial layer (AZ4903)patterning

Seed metal (TiAu)evaporation and

Electro-molding (AZ4903)formation

Signal line (Au) formationand sacrificial layer removal

Ground metal (TiAu) anddielectric post (polyimide)

formation

Process flow of the DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University18

Dielectric Post

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University19

Sacrificial Layer

Fabricated DAML

Reflow the photoresist for smooth metal overlay

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University20

Fabricated DAML

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University21

Comparison of transmission lines[1] K Nishikawa et al IEEE MTT-S Digest vol 3

2001 pp 1881-1884

[2] GE Ponchak et al IEEE Trans Components Packaging and Manufacturing Technology-B

vol 21 no 2 pp 171-176 1998

[3] Suidong Yang et al IEEE Trans MicrowaveTheory and Techniques

vol 46 no 5 pp 623-631 1998

[4] YC Shih et al Microwave Journal

pp 95-105 1991

[5] Youngwoo Kwon et al IEEE Microwave

and Wireless Components Letters

vol 11 no 2 pp 59-61 2001[6] SV Robertson et al IEEE Trans Microwave

Theory and Techniques

vol 46 no 11 1998 pp 1845-1849 1998

This work Sung-Chan Kim et al IEEE Microwaveand Wireless Components Lettersvol 15 no 10 pp 652-654 2005

This work H S Lee et al IEE Electronics Letters

vol 39 no 25 pp 1827-1828 2003

DAML Characteristic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University22

Shielded DAML using Flip chip technique

h Dielectric post height w Signal line width

g Dielectric post gap

d Dielectric post size

Lower Ground Plane

Upper Ground Plane

Polyimide Dielectric post

Air-bridged Signal line

Connected Ground using Flip chip Stud

Ultra low loss extended height (10 microm rarr 17 microm) Shielding effect

- Radiation electromagnetic and environmental interference are avoided by enclosing microstrip circuitry in a shielding cavity

Simple process not bulk micromachining (using flip-chip technique)

SDAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University23

Fabricated DAML (height = 17 microm)

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University24

Simulation Measurement

80(GHz) 163 185

94(GHz)

189 153

110(GHz)

222 213

Signal line width 44 microm (dBcm)

DAML Characteristic (Measurement)

Insertion loss versus Signal line height

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University25

Comparison of original DAML

SDAML Characteristic

0 20 40 60 80 100 120 14000

05

10

15

20

25

30

35

40

Inse

rtion

loss

[dB

cm]

Frequency [GHz]

DAML (h = 10 m) DAML (h = 17 m) SDAML (h = 17 m)

60(GHz)

94(GHz)

120(GHz)

DAML(10 microm) 187 256 31

DAML(17 microm) 127 189 242

SDAML(17 microm) 107 141 167

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University26

CPW

Microstrip

DAML

Reduced Size DAML

λg 4 94 GHz

Electrical length (λg 4 94 GHz )

CPW 304 microm

Microstrip 266 microm

DAML 792 microm

RS-DAML 478 microm

Comparison of electrical length

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University27

Total Size 604 microm times 520 microm

Passive Device using DAML Technology W-band Reduced Size branch-line coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University28

Coupling loss 361 dB

Isolation -355 dB

Transmission loss 425 dB

Return loss -369 dB

Measurement result of W-band Reduced branch-line coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University29

Comparison of W-band branch line coupler

CaseCouplingloss (dB)

Return loss (dB)

Chip size(mm2)

Centerfrequency

(GHz)

1 (CPW)

About -35 About -20 05 ⅹ05 90

RSCDAML -361 -369 06ⅹ052 94

Passive Device using DAML Technology

Reference 1 M Schlechtweg et al GaAs IC Symposium 1995 Technical Digest 1995

17th Annual IEEE 29 Oct-1 Nov 1995 Page(s)214 - 217

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University30

W-band Hybrid Ring Coupler

Fabricated W-band hybrid ring coupler

Coupler size146 mm (diameter)

10 microm

50 Ω termination

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University31

S-parameters of W-band hybrid ring coupler

Transmission loss380 plusmn 008 dB

( 85-105 GHz)

Coupling loss

357 plusmn 022 dB

W-band Hybrid Ring Coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University32

Comparison of W-band hybrid ring coupler

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 94

Thiswork -372 -335 -34 94

Hybrid Ring Coupler

This work Sung-Chan Kim et al IEEE MWCL vol 15 no 10 pp 652-654 2005

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University33

Diameter 0888 mm

W-band reduced ring hybrid coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University34

Reduced to 63 in area

Conventional Coupler

Diameter 1460 mm

Reduced Coupler

Diameter 0888 mm

Comparison of coupler sizes

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Coupling loss 435 dB Isolation -4823 dB

Transmission loss 444 dB Return loss below -25 dB (all port)

75 80 85 90 95 100 105 110

-60

-50

-40

-30

-20

-10

0

S-p

aram

eter

[dB]

Frequency [GHz]

S21Thru S31coupling S23Isolation

Insertion loss

70 75 80 85 90 95 100 105 110 115

-40

-30

-20

-10

0

S-pa

ram

eter

[dB]

Frequency [GHz]

S11 S22 S33

Return loss

Measurement result of W-band reduced ring hybrid coupler

Passive Device using DAML Technology

35

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Comparison of W-band hybrid ring coupler

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)Diameter

(mm)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 About 07 94

DAML -372 -335 -34 146 94

RSCDAML -444 -435 -4823 088 94

Passive Device using DAML Technology

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

36

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

(a) MIM coupling capacitor

(b) Stepped Impedance Perturbation

Novel W-Band Dual Mode Stepped Impedance Resonator BPF Using DAML Technology

(a) (b)

Journal of the Korean Physical Society vol 51 no 10 pp S280-S283 December 2007

Fabricated BPF

(b)

(a)

Passive Device using DAML Technology

37

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University38

60 65 70 75 80 85 90 95 100 105 110 115 120-40

-35

-30

-25

-20

-15

-10

-5

0

5

Inse

rtion

Los

s (d

B)

Frequency (GHz)

S11

S22

S21

S12

Simulation

Step Impedance Ratio 05

MIM Capacitor Size 75 microm2

Perturbation Length 275 microm

Measured Result of W-band BPF

- Insertion Loss 265 dB 97 GHz

- Relative Bandwidth 12

Passive Device using DAML Technology

38

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

60-GHz CPW-fed Dielectric-Resonator-Above-Patch

Antenna for Broadband WLAN Applications Using DAML Technology

Microwave and Optical Technology Letters vol 49 Issue 8 pp 1859-1861 2005

Passive Device using DAML Technology

39

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Fabricated Antenna

(a) Fabricated patch using DAML

(b) 60 GHz RDRA

(c) Proposed antenna

(d) Antenna integrated by 60 GHz VCO

Passive Device using DAML Technology

40

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measured Results

Passive Device using DAML Technology

41

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3-D W-band Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University43

Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

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MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

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Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

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Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

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Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

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Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

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Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

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LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

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Detector ndash TransitionSystem Specification

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Detector ndash OutputSystem Specification

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Size ndash Array SystemSystem Specification

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Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

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Development of Security Screening System

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System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 16: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University15

Surface micromachined transmission line Reduced substrate loss due to elevated signal line

Simple process Compatibility with standard MMICMIMIC fabrication Photo-lithography and low-temperature process

Easily integrated with MMICMIMIC (3 additional masks required) Dielectric post used for mechanical stability (1 post1 mm)

Possibility of vertical integration (3-D integration)

SI GaAs substrate

Dielectric post

Signal line

Ground

DAML Dielectric-supported Air-gapped Microstrip Line

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University16

w

d

h

g

3h ⅹ2 + w

Formula for Effective Dielectric Constant in Partial Dielectric Layer

h Dielectric post height (microm) w Signal line width (microm)

g Dielectric post gap (microm)

d Dielectric post size (microm)

3hⅹ2 + w Field area (by Ansoft HFSS)

The effective dielectric constant εeff is 1086 by calculation (Where g = 500 microm h = 10 microm w = 44 microm d = 40 microm)

wh

whgd

whgd

polyimidepolyimide

eff

121

12

1)23(

1

2

1)23(

12

2

DAML

)23(1

2

whgd

polyimider

Dielectric constant of DAML-Substrate is 1108 by calculation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University17

Process flow of the DAML

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Sacrificial layer (AZ4903)patterning

Seed metal (TiAu)evaporation and

Electro-molding (AZ4903)formation

Signal line (Au) formationand sacrificial layer removal

Ground metal (TiAu) anddielectric post (polyimide)

formation

Process flow of the DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University18

Dielectric Post

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University19

Sacrificial Layer

Fabricated DAML

Reflow the photoresist for smooth metal overlay

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University20

Fabricated DAML

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University21

Comparison of transmission lines[1] K Nishikawa et al IEEE MTT-S Digest vol 3

2001 pp 1881-1884

[2] GE Ponchak et al IEEE Trans Components Packaging and Manufacturing Technology-B

vol 21 no 2 pp 171-176 1998

[3] Suidong Yang et al IEEE Trans MicrowaveTheory and Techniques

vol 46 no 5 pp 623-631 1998

[4] YC Shih et al Microwave Journal

pp 95-105 1991

[5] Youngwoo Kwon et al IEEE Microwave

and Wireless Components Letters

vol 11 no 2 pp 59-61 2001[6] SV Robertson et al IEEE Trans Microwave

Theory and Techniques

vol 46 no 11 1998 pp 1845-1849 1998

This work Sung-Chan Kim et al IEEE Microwaveand Wireless Components Lettersvol 15 no 10 pp 652-654 2005

This work H S Lee et al IEE Electronics Letters

vol 39 no 25 pp 1827-1828 2003

DAML Characteristic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University22

Shielded DAML using Flip chip technique

h Dielectric post height w Signal line width

g Dielectric post gap

d Dielectric post size

Lower Ground Plane

Upper Ground Plane

Polyimide Dielectric post

Air-bridged Signal line

Connected Ground using Flip chip Stud

Ultra low loss extended height (10 microm rarr 17 microm) Shielding effect

- Radiation electromagnetic and environmental interference are avoided by enclosing microstrip circuitry in a shielding cavity

Simple process not bulk micromachining (using flip-chip technique)

SDAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University23

Fabricated DAML (height = 17 microm)

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University24

Simulation Measurement

80(GHz) 163 185

94(GHz)

189 153

110(GHz)

222 213

Signal line width 44 microm (dBcm)

DAML Characteristic (Measurement)

Insertion loss versus Signal line height

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University25

Comparison of original DAML

SDAML Characteristic

0 20 40 60 80 100 120 14000

05

10

15

20

25

30

35

40

Inse

rtion

loss

[dB

cm]

Frequency [GHz]

DAML (h = 10 m) DAML (h = 17 m) SDAML (h = 17 m)

60(GHz)

94(GHz)

120(GHz)

DAML(10 microm) 187 256 31

DAML(17 microm) 127 189 242

SDAML(17 microm) 107 141 167

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University26

CPW

Microstrip

DAML

Reduced Size DAML

λg 4 94 GHz

Electrical length (λg 4 94 GHz )

CPW 304 microm

Microstrip 266 microm

DAML 792 microm

RS-DAML 478 microm

Comparison of electrical length

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University27

Total Size 604 microm times 520 microm

Passive Device using DAML Technology W-band Reduced Size branch-line coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University28

Coupling loss 361 dB

Isolation -355 dB

Transmission loss 425 dB

Return loss -369 dB

Measurement result of W-band Reduced branch-line coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University29

Comparison of W-band branch line coupler

CaseCouplingloss (dB)

Return loss (dB)

Chip size(mm2)

Centerfrequency

(GHz)

1 (CPW)

About -35 About -20 05 ⅹ05 90

RSCDAML -361 -369 06ⅹ052 94

Passive Device using DAML Technology

Reference 1 M Schlechtweg et al GaAs IC Symposium 1995 Technical Digest 1995

17th Annual IEEE 29 Oct-1 Nov 1995 Page(s)214 - 217

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University30

W-band Hybrid Ring Coupler

Fabricated W-band hybrid ring coupler

Coupler size146 mm (diameter)

10 microm

50 Ω termination

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University31

S-parameters of W-band hybrid ring coupler

Transmission loss380 plusmn 008 dB

( 85-105 GHz)

Coupling loss

357 plusmn 022 dB

W-band Hybrid Ring Coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University32

Comparison of W-band hybrid ring coupler

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 94

Thiswork -372 -335 -34 94

Hybrid Ring Coupler

This work Sung-Chan Kim et al IEEE MWCL vol 15 no 10 pp 652-654 2005

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University33

Diameter 0888 mm

W-band reduced ring hybrid coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University34

Reduced to 63 in area

Conventional Coupler

Diameter 1460 mm

Reduced Coupler

Diameter 0888 mm

Comparison of coupler sizes

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Coupling loss 435 dB Isolation -4823 dB

Transmission loss 444 dB Return loss below -25 dB (all port)

75 80 85 90 95 100 105 110

-60

-50

-40

-30

-20

-10

0

S-p

aram

eter

[dB]

Frequency [GHz]

S21Thru S31coupling S23Isolation

Insertion loss

70 75 80 85 90 95 100 105 110 115

-40

-30

-20

-10

0

S-pa

ram

eter

[dB]

Frequency [GHz]

S11 S22 S33

Return loss

Measurement result of W-band reduced ring hybrid coupler

Passive Device using DAML Technology

35

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Comparison of W-band hybrid ring coupler

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)Diameter

(mm)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 About 07 94

DAML -372 -335 -34 146 94

RSCDAML -444 -435 -4823 088 94

Passive Device using DAML Technology

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

36

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

(a) MIM coupling capacitor

(b) Stepped Impedance Perturbation

Novel W-Band Dual Mode Stepped Impedance Resonator BPF Using DAML Technology

(a) (b)

Journal of the Korean Physical Society vol 51 no 10 pp S280-S283 December 2007

Fabricated BPF

(b)

(a)

Passive Device using DAML Technology

37

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University38

60 65 70 75 80 85 90 95 100 105 110 115 120-40

-35

-30

-25

-20

-15

-10

-5

0

5

Inse

rtion

Los

s (d

B)

Frequency (GHz)

S11

S22

S21

S12

Simulation

Step Impedance Ratio 05

MIM Capacitor Size 75 microm2

Perturbation Length 275 microm

Measured Result of W-band BPF

- Insertion Loss 265 dB 97 GHz

- Relative Bandwidth 12

Passive Device using DAML Technology

38

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

60-GHz CPW-fed Dielectric-Resonator-Above-Patch

Antenna for Broadband WLAN Applications Using DAML Technology

Microwave and Optical Technology Letters vol 49 Issue 8 pp 1859-1861 2005

Passive Device using DAML Technology

39

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Fabricated Antenna

(a) Fabricated patch using DAML

(b) 60 GHz RDRA

(c) Proposed antenna

(d) Antenna integrated by 60 GHz VCO

Passive Device using DAML Technology

40

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measured Results

Passive Device using DAML Technology

41

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University42

3-D W-band Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University43

Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

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Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 17: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University16

w

d

h

g

3h ⅹ2 + w

Formula for Effective Dielectric Constant in Partial Dielectric Layer

h Dielectric post height (microm) w Signal line width (microm)

g Dielectric post gap (microm)

d Dielectric post size (microm)

3hⅹ2 + w Field area (by Ansoft HFSS)

The effective dielectric constant εeff is 1086 by calculation (Where g = 500 microm h = 10 microm w = 44 microm d = 40 microm)

wh

whgd

whgd

polyimidepolyimide

eff

121

12

1)23(

1

2

1)23(

12

2

DAML

)23(1

2

whgd

polyimider

Dielectric constant of DAML-Substrate is 1108 by calculation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University17

Process flow of the DAML

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Sacrificial layer (AZ4903)patterning

Seed metal (TiAu)evaporation and

Electro-molding (AZ4903)formation

Signal line (Au) formationand sacrificial layer removal

Ground metal (TiAu) anddielectric post (polyimide)

formation

Process flow of the DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University18

Dielectric Post

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University19

Sacrificial Layer

Fabricated DAML

Reflow the photoresist for smooth metal overlay

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University20

Fabricated DAML

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University21

Comparison of transmission lines[1] K Nishikawa et al IEEE MTT-S Digest vol 3

2001 pp 1881-1884

[2] GE Ponchak et al IEEE Trans Components Packaging and Manufacturing Technology-B

vol 21 no 2 pp 171-176 1998

[3] Suidong Yang et al IEEE Trans MicrowaveTheory and Techniques

vol 46 no 5 pp 623-631 1998

[4] YC Shih et al Microwave Journal

pp 95-105 1991

[5] Youngwoo Kwon et al IEEE Microwave

and Wireless Components Letters

vol 11 no 2 pp 59-61 2001[6] SV Robertson et al IEEE Trans Microwave

Theory and Techniques

vol 46 no 11 1998 pp 1845-1849 1998

This work Sung-Chan Kim et al IEEE Microwaveand Wireless Components Lettersvol 15 no 10 pp 652-654 2005

This work H S Lee et al IEE Electronics Letters

vol 39 no 25 pp 1827-1828 2003

DAML Characteristic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University22

Shielded DAML using Flip chip technique

h Dielectric post height w Signal line width

g Dielectric post gap

d Dielectric post size

Lower Ground Plane

Upper Ground Plane

Polyimide Dielectric post

Air-bridged Signal line

Connected Ground using Flip chip Stud

Ultra low loss extended height (10 microm rarr 17 microm) Shielding effect

- Radiation electromagnetic and environmental interference are avoided by enclosing microstrip circuitry in a shielding cavity

Simple process not bulk micromachining (using flip-chip technique)

SDAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University23

Fabricated DAML (height = 17 microm)

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University24

Simulation Measurement

80(GHz) 163 185

94(GHz)

189 153

110(GHz)

222 213

Signal line width 44 microm (dBcm)

DAML Characteristic (Measurement)

Insertion loss versus Signal line height

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University25

Comparison of original DAML

SDAML Characteristic

0 20 40 60 80 100 120 14000

05

10

15

20

25

30

35

40

Inse

rtion

loss

[dB

cm]

Frequency [GHz]

DAML (h = 10 m) DAML (h = 17 m) SDAML (h = 17 m)

60(GHz)

94(GHz)

120(GHz)

DAML(10 microm) 187 256 31

DAML(17 microm) 127 189 242

SDAML(17 microm) 107 141 167

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University26

CPW

Microstrip

DAML

Reduced Size DAML

λg 4 94 GHz

Electrical length (λg 4 94 GHz )

CPW 304 microm

Microstrip 266 microm

DAML 792 microm

RS-DAML 478 microm

Comparison of electrical length

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University27

Total Size 604 microm times 520 microm

Passive Device using DAML Technology W-band Reduced Size branch-line coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University28

Coupling loss 361 dB

Isolation -355 dB

Transmission loss 425 dB

Return loss -369 dB

Measurement result of W-band Reduced branch-line coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University29

Comparison of W-band branch line coupler

CaseCouplingloss (dB)

Return loss (dB)

Chip size(mm2)

Centerfrequency

(GHz)

1 (CPW)

About -35 About -20 05 ⅹ05 90

RSCDAML -361 -369 06ⅹ052 94

Passive Device using DAML Technology

Reference 1 M Schlechtweg et al GaAs IC Symposium 1995 Technical Digest 1995

17th Annual IEEE 29 Oct-1 Nov 1995 Page(s)214 - 217

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University30

W-band Hybrid Ring Coupler

Fabricated W-band hybrid ring coupler

Coupler size146 mm (diameter)

10 microm

50 Ω termination

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University31

S-parameters of W-band hybrid ring coupler

Transmission loss380 plusmn 008 dB

( 85-105 GHz)

Coupling loss

357 plusmn 022 dB

W-band Hybrid Ring Coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University32

Comparison of W-band hybrid ring coupler

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 94

Thiswork -372 -335 -34 94

Hybrid Ring Coupler

This work Sung-Chan Kim et al IEEE MWCL vol 15 no 10 pp 652-654 2005

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University33

Diameter 0888 mm

W-band reduced ring hybrid coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University34

Reduced to 63 in area

Conventional Coupler

Diameter 1460 mm

Reduced Coupler

Diameter 0888 mm

Comparison of coupler sizes

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Coupling loss 435 dB Isolation -4823 dB

Transmission loss 444 dB Return loss below -25 dB (all port)

75 80 85 90 95 100 105 110

-60

-50

-40

-30

-20

-10

0

S-p

aram

eter

[dB]

Frequency [GHz]

S21Thru S31coupling S23Isolation

Insertion loss

70 75 80 85 90 95 100 105 110 115

-40

-30

-20

-10

0

S-pa

ram

eter

[dB]

Frequency [GHz]

S11 S22 S33

Return loss

Measurement result of W-band reduced ring hybrid coupler

Passive Device using DAML Technology

35

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Comparison of W-band hybrid ring coupler

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)Diameter

(mm)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 About 07 94

DAML -372 -335 -34 146 94

RSCDAML -444 -435 -4823 088 94

Passive Device using DAML Technology

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

36

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

(a) MIM coupling capacitor

(b) Stepped Impedance Perturbation

Novel W-Band Dual Mode Stepped Impedance Resonator BPF Using DAML Technology

(a) (b)

Journal of the Korean Physical Society vol 51 no 10 pp S280-S283 December 2007

Fabricated BPF

(b)

(a)

Passive Device using DAML Technology

37

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University38

60 65 70 75 80 85 90 95 100 105 110 115 120-40

-35

-30

-25

-20

-15

-10

-5

0

5

Inse

rtion

Los

s (d

B)

Frequency (GHz)

S11

S22

S21

S12

Simulation

Step Impedance Ratio 05

MIM Capacitor Size 75 microm2

Perturbation Length 275 microm

Measured Result of W-band BPF

- Insertion Loss 265 dB 97 GHz

- Relative Bandwidth 12

Passive Device using DAML Technology

38

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

60-GHz CPW-fed Dielectric-Resonator-Above-Patch

Antenna for Broadband WLAN Applications Using DAML Technology

Microwave and Optical Technology Letters vol 49 Issue 8 pp 1859-1861 2005

Passive Device using DAML Technology

39

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Fabricated Antenna

(a) Fabricated patch using DAML

(b) 60 GHz RDRA

(c) Proposed antenna

(d) Antenna integrated by 60 GHz VCO

Passive Device using DAML Technology

40

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measured Results

Passive Device using DAML Technology

41

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University42

3-D W-band Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University43

Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

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Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 18: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University17

Process flow of the DAML

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Semi-insulating GaAs substrate

Sacrificial layer (AZ4903)patterning

Seed metal (TiAu)evaporation and

Electro-molding (AZ4903)formation

Signal line (Au) formationand sacrificial layer removal

Ground metal (TiAu) anddielectric post (polyimide)

formation

Process flow of the DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University18

Dielectric Post

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University19

Sacrificial Layer

Fabricated DAML

Reflow the photoresist for smooth metal overlay

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University20

Fabricated DAML

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University21

Comparison of transmission lines[1] K Nishikawa et al IEEE MTT-S Digest vol 3

2001 pp 1881-1884

[2] GE Ponchak et al IEEE Trans Components Packaging and Manufacturing Technology-B

vol 21 no 2 pp 171-176 1998

[3] Suidong Yang et al IEEE Trans MicrowaveTheory and Techniques

vol 46 no 5 pp 623-631 1998

[4] YC Shih et al Microwave Journal

pp 95-105 1991

[5] Youngwoo Kwon et al IEEE Microwave

and Wireless Components Letters

vol 11 no 2 pp 59-61 2001[6] SV Robertson et al IEEE Trans Microwave

Theory and Techniques

vol 46 no 11 1998 pp 1845-1849 1998

This work Sung-Chan Kim et al IEEE Microwaveand Wireless Components Lettersvol 15 no 10 pp 652-654 2005

This work H S Lee et al IEE Electronics Letters

vol 39 no 25 pp 1827-1828 2003

DAML Characteristic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University22

Shielded DAML using Flip chip technique

h Dielectric post height w Signal line width

g Dielectric post gap

d Dielectric post size

Lower Ground Plane

Upper Ground Plane

Polyimide Dielectric post

Air-bridged Signal line

Connected Ground using Flip chip Stud

Ultra low loss extended height (10 microm rarr 17 microm) Shielding effect

- Radiation electromagnetic and environmental interference are avoided by enclosing microstrip circuitry in a shielding cavity

Simple process not bulk micromachining (using flip-chip technique)

SDAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University23

Fabricated DAML (height = 17 microm)

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University24

Simulation Measurement

80(GHz) 163 185

94(GHz)

189 153

110(GHz)

222 213

Signal line width 44 microm (dBcm)

DAML Characteristic (Measurement)

Insertion loss versus Signal line height

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University25

Comparison of original DAML

SDAML Characteristic

0 20 40 60 80 100 120 14000

05

10

15

20

25

30

35

40

Inse

rtion

loss

[dB

cm]

Frequency [GHz]

DAML (h = 10 m) DAML (h = 17 m) SDAML (h = 17 m)

60(GHz)

94(GHz)

120(GHz)

DAML(10 microm) 187 256 31

DAML(17 microm) 127 189 242

SDAML(17 microm) 107 141 167

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University26

CPW

Microstrip

DAML

Reduced Size DAML

λg 4 94 GHz

Electrical length (λg 4 94 GHz )

CPW 304 microm

Microstrip 266 microm

DAML 792 microm

RS-DAML 478 microm

Comparison of electrical length

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University27

Total Size 604 microm times 520 microm

Passive Device using DAML Technology W-band Reduced Size branch-line coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University28

Coupling loss 361 dB

Isolation -355 dB

Transmission loss 425 dB

Return loss -369 dB

Measurement result of W-band Reduced branch-line coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University29

Comparison of W-band branch line coupler

CaseCouplingloss (dB)

Return loss (dB)

Chip size(mm2)

Centerfrequency

(GHz)

1 (CPW)

About -35 About -20 05 ⅹ05 90

RSCDAML -361 -369 06ⅹ052 94

Passive Device using DAML Technology

Reference 1 M Schlechtweg et al GaAs IC Symposium 1995 Technical Digest 1995

17th Annual IEEE 29 Oct-1 Nov 1995 Page(s)214 - 217

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University30

W-band Hybrid Ring Coupler

Fabricated W-band hybrid ring coupler

Coupler size146 mm (diameter)

10 microm

50 Ω termination

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University31

S-parameters of W-band hybrid ring coupler

Transmission loss380 plusmn 008 dB

( 85-105 GHz)

Coupling loss

357 plusmn 022 dB

W-band Hybrid Ring Coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University32

Comparison of W-band hybrid ring coupler

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 94

Thiswork -372 -335 -34 94

Hybrid Ring Coupler

This work Sung-Chan Kim et al IEEE MWCL vol 15 no 10 pp 652-654 2005

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University33

Diameter 0888 mm

W-band reduced ring hybrid coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University34

Reduced to 63 in area

Conventional Coupler

Diameter 1460 mm

Reduced Coupler

Diameter 0888 mm

Comparison of coupler sizes

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Coupling loss 435 dB Isolation -4823 dB

Transmission loss 444 dB Return loss below -25 dB (all port)

75 80 85 90 95 100 105 110

-60

-50

-40

-30

-20

-10

0

S-p

aram

eter

[dB]

Frequency [GHz]

S21Thru S31coupling S23Isolation

Insertion loss

70 75 80 85 90 95 100 105 110 115

-40

-30

-20

-10

0

S-pa

ram

eter

[dB]

Frequency [GHz]

S11 S22 S33

Return loss

Measurement result of W-band reduced ring hybrid coupler

Passive Device using DAML Technology

35

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Comparison of W-band hybrid ring coupler

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)Diameter

(mm)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 About 07 94

DAML -372 -335 -34 146 94

RSCDAML -444 -435 -4823 088 94

Passive Device using DAML Technology

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

36

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

(a) MIM coupling capacitor

(b) Stepped Impedance Perturbation

Novel W-Band Dual Mode Stepped Impedance Resonator BPF Using DAML Technology

(a) (b)

Journal of the Korean Physical Society vol 51 no 10 pp S280-S283 December 2007

Fabricated BPF

(b)

(a)

Passive Device using DAML Technology

37

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University38

60 65 70 75 80 85 90 95 100 105 110 115 120-40

-35

-30

-25

-20

-15

-10

-5

0

5

Inse

rtion

Los

s (d

B)

Frequency (GHz)

S11

S22

S21

S12

Simulation

Step Impedance Ratio 05

MIM Capacitor Size 75 microm2

Perturbation Length 275 microm

Measured Result of W-band BPF

- Insertion Loss 265 dB 97 GHz

- Relative Bandwidth 12

Passive Device using DAML Technology

38

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

60-GHz CPW-fed Dielectric-Resonator-Above-Patch

Antenna for Broadband WLAN Applications Using DAML Technology

Microwave and Optical Technology Letters vol 49 Issue 8 pp 1859-1861 2005

Passive Device using DAML Technology

39

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Fabricated Antenna

(a) Fabricated patch using DAML

(b) 60 GHz RDRA

(c) Proposed antenna

(d) Antenna integrated by 60 GHz VCO

Passive Device using DAML Technology

40

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measured Results

Passive Device using DAML Technology

41

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University42

3-D W-band Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University43

Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 19: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University18

Dielectric Post

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University19

Sacrificial Layer

Fabricated DAML

Reflow the photoresist for smooth metal overlay

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University20

Fabricated DAML

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University21

Comparison of transmission lines[1] K Nishikawa et al IEEE MTT-S Digest vol 3

2001 pp 1881-1884

[2] GE Ponchak et al IEEE Trans Components Packaging and Manufacturing Technology-B

vol 21 no 2 pp 171-176 1998

[3] Suidong Yang et al IEEE Trans MicrowaveTheory and Techniques

vol 46 no 5 pp 623-631 1998

[4] YC Shih et al Microwave Journal

pp 95-105 1991

[5] Youngwoo Kwon et al IEEE Microwave

and Wireless Components Letters

vol 11 no 2 pp 59-61 2001[6] SV Robertson et al IEEE Trans Microwave

Theory and Techniques

vol 46 no 11 1998 pp 1845-1849 1998

This work Sung-Chan Kim et al IEEE Microwaveand Wireless Components Lettersvol 15 no 10 pp 652-654 2005

This work H S Lee et al IEE Electronics Letters

vol 39 no 25 pp 1827-1828 2003

DAML Characteristic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University22

Shielded DAML using Flip chip technique

h Dielectric post height w Signal line width

g Dielectric post gap

d Dielectric post size

Lower Ground Plane

Upper Ground Plane

Polyimide Dielectric post

Air-bridged Signal line

Connected Ground using Flip chip Stud

Ultra low loss extended height (10 microm rarr 17 microm) Shielding effect

- Radiation electromagnetic and environmental interference are avoided by enclosing microstrip circuitry in a shielding cavity

Simple process not bulk micromachining (using flip-chip technique)

SDAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University23

Fabricated DAML (height = 17 microm)

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University24

Simulation Measurement

80(GHz) 163 185

94(GHz)

189 153

110(GHz)

222 213

Signal line width 44 microm (dBcm)

DAML Characteristic (Measurement)

Insertion loss versus Signal line height

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University25

Comparison of original DAML

SDAML Characteristic

0 20 40 60 80 100 120 14000

05

10

15

20

25

30

35

40

Inse

rtion

loss

[dB

cm]

Frequency [GHz]

DAML (h = 10 m) DAML (h = 17 m) SDAML (h = 17 m)

60(GHz)

94(GHz)

120(GHz)

DAML(10 microm) 187 256 31

DAML(17 microm) 127 189 242

SDAML(17 microm) 107 141 167

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University26

CPW

Microstrip

DAML

Reduced Size DAML

λg 4 94 GHz

Electrical length (λg 4 94 GHz )

CPW 304 microm

Microstrip 266 microm

DAML 792 microm

RS-DAML 478 microm

Comparison of electrical length

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University27

Total Size 604 microm times 520 microm

Passive Device using DAML Technology W-band Reduced Size branch-line coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University28

Coupling loss 361 dB

Isolation -355 dB

Transmission loss 425 dB

Return loss -369 dB

Measurement result of W-band Reduced branch-line coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University29

Comparison of W-band branch line coupler

CaseCouplingloss (dB)

Return loss (dB)

Chip size(mm2)

Centerfrequency

(GHz)

1 (CPW)

About -35 About -20 05 ⅹ05 90

RSCDAML -361 -369 06ⅹ052 94

Passive Device using DAML Technology

Reference 1 M Schlechtweg et al GaAs IC Symposium 1995 Technical Digest 1995

17th Annual IEEE 29 Oct-1 Nov 1995 Page(s)214 - 217

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University30

W-band Hybrid Ring Coupler

Fabricated W-band hybrid ring coupler

Coupler size146 mm (diameter)

10 microm

50 Ω termination

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University31

S-parameters of W-band hybrid ring coupler

Transmission loss380 plusmn 008 dB

( 85-105 GHz)

Coupling loss

357 plusmn 022 dB

W-band Hybrid Ring Coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University32

Comparison of W-band hybrid ring coupler

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 94

Thiswork -372 -335 -34 94

Hybrid Ring Coupler

This work Sung-Chan Kim et al IEEE MWCL vol 15 no 10 pp 652-654 2005

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University33

Diameter 0888 mm

W-band reduced ring hybrid coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University34

Reduced to 63 in area

Conventional Coupler

Diameter 1460 mm

Reduced Coupler

Diameter 0888 mm

Comparison of coupler sizes

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Coupling loss 435 dB Isolation -4823 dB

Transmission loss 444 dB Return loss below -25 dB (all port)

75 80 85 90 95 100 105 110

-60

-50

-40

-30

-20

-10

0

S-p

aram

eter

[dB]

Frequency [GHz]

S21Thru S31coupling S23Isolation

Insertion loss

70 75 80 85 90 95 100 105 110 115

-40

-30

-20

-10

0

S-pa

ram

eter

[dB]

Frequency [GHz]

S11 S22 S33

Return loss

Measurement result of W-band reduced ring hybrid coupler

Passive Device using DAML Technology

35

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Comparison of W-band hybrid ring coupler

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)Diameter

(mm)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 About 07 94

DAML -372 -335 -34 146 94

RSCDAML -444 -435 -4823 088 94

Passive Device using DAML Technology

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

36

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

(a) MIM coupling capacitor

(b) Stepped Impedance Perturbation

Novel W-Band Dual Mode Stepped Impedance Resonator BPF Using DAML Technology

(a) (b)

Journal of the Korean Physical Society vol 51 no 10 pp S280-S283 December 2007

Fabricated BPF

(b)

(a)

Passive Device using DAML Technology

37

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University38

60 65 70 75 80 85 90 95 100 105 110 115 120-40

-35

-30

-25

-20

-15

-10

-5

0

5

Inse

rtion

Los

s (d

B)

Frequency (GHz)

S11

S22

S21

S12

Simulation

Step Impedance Ratio 05

MIM Capacitor Size 75 microm2

Perturbation Length 275 microm

Measured Result of W-band BPF

- Insertion Loss 265 dB 97 GHz

- Relative Bandwidth 12

Passive Device using DAML Technology

38

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

60-GHz CPW-fed Dielectric-Resonator-Above-Patch

Antenna for Broadband WLAN Applications Using DAML Technology

Microwave and Optical Technology Letters vol 49 Issue 8 pp 1859-1861 2005

Passive Device using DAML Technology

39

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Fabricated Antenna

(a) Fabricated patch using DAML

(b) 60 GHz RDRA

(c) Proposed antenna

(d) Antenna integrated by 60 GHz VCO

Passive Device using DAML Technology

40

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measured Results

Passive Device using DAML Technology

41

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University42

3-D W-band Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University43

Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

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Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 20: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University19

Sacrificial Layer

Fabricated DAML

Reflow the photoresist for smooth metal overlay

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University20

Fabricated DAML

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University21

Comparison of transmission lines[1] K Nishikawa et al IEEE MTT-S Digest vol 3

2001 pp 1881-1884

[2] GE Ponchak et al IEEE Trans Components Packaging and Manufacturing Technology-B

vol 21 no 2 pp 171-176 1998

[3] Suidong Yang et al IEEE Trans MicrowaveTheory and Techniques

vol 46 no 5 pp 623-631 1998

[4] YC Shih et al Microwave Journal

pp 95-105 1991

[5] Youngwoo Kwon et al IEEE Microwave

and Wireless Components Letters

vol 11 no 2 pp 59-61 2001[6] SV Robertson et al IEEE Trans Microwave

Theory and Techniques

vol 46 no 11 1998 pp 1845-1849 1998

This work Sung-Chan Kim et al IEEE Microwaveand Wireless Components Lettersvol 15 no 10 pp 652-654 2005

This work H S Lee et al IEE Electronics Letters

vol 39 no 25 pp 1827-1828 2003

DAML Characteristic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University22

Shielded DAML using Flip chip technique

h Dielectric post height w Signal line width

g Dielectric post gap

d Dielectric post size

Lower Ground Plane

Upper Ground Plane

Polyimide Dielectric post

Air-bridged Signal line

Connected Ground using Flip chip Stud

Ultra low loss extended height (10 microm rarr 17 microm) Shielding effect

- Radiation electromagnetic and environmental interference are avoided by enclosing microstrip circuitry in a shielding cavity

Simple process not bulk micromachining (using flip-chip technique)

SDAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University23

Fabricated DAML (height = 17 microm)

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University24

Simulation Measurement

80(GHz) 163 185

94(GHz)

189 153

110(GHz)

222 213

Signal line width 44 microm (dBcm)

DAML Characteristic (Measurement)

Insertion loss versus Signal line height

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University25

Comparison of original DAML

SDAML Characteristic

0 20 40 60 80 100 120 14000

05

10

15

20

25

30

35

40

Inse

rtion

loss

[dB

cm]

Frequency [GHz]

DAML (h = 10 m) DAML (h = 17 m) SDAML (h = 17 m)

60(GHz)

94(GHz)

120(GHz)

DAML(10 microm) 187 256 31

DAML(17 microm) 127 189 242

SDAML(17 microm) 107 141 167

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University26

CPW

Microstrip

DAML

Reduced Size DAML

λg 4 94 GHz

Electrical length (λg 4 94 GHz )

CPW 304 microm

Microstrip 266 microm

DAML 792 microm

RS-DAML 478 microm

Comparison of electrical length

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University27

Total Size 604 microm times 520 microm

Passive Device using DAML Technology W-band Reduced Size branch-line coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University28

Coupling loss 361 dB

Isolation -355 dB

Transmission loss 425 dB

Return loss -369 dB

Measurement result of W-band Reduced branch-line coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University29

Comparison of W-band branch line coupler

CaseCouplingloss (dB)

Return loss (dB)

Chip size(mm2)

Centerfrequency

(GHz)

1 (CPW)

About -35 About -20 05 ⅹ05 90

RSCDAML -361 -369 06ⅹ052 94

Passive Device using DAML Technology

Reference 1 M Schlechtweg et al GaAs IC Symposium 1995 Technical Digest 1995

17th Annual IEEE 29 Oct-1 Nov 1995 Page(s)214 - 217

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University30

W-band Hybrid Ring Coupler

Fabricated W-band hybrid ring coupler

Coupler size146 mm (diameter)

10 microm

50 Ω termination

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University31

S-parameters of W-band hybrid ring coupler

Transmission loss380 plusmn 008 dB

( 85-105 GHz)

Coupling loss

357 plusmn 022 dB

W-band Hybrid Ring Coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University32

Comparison of W-band hybrid ring coupler

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 94

Thiswork -372 -335 -34 94

Hybrid Ring Coupler

This work Sung-Chan Kim et al IEEE MWCL vol 15 no 10 pp 652-654 2005

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University33

Diameter 0888 mm

W-band reduced ring hybrid coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University34

Reduced to 63 in area

Conventional Coupler

Diameter 1460 mm

Reduced Coupler

Diameter 0888 mm

Comparison of coupler sizes

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Coupling loss 435 dB Isolation -4823 dB

Transmission loss 444 dB Return loss below -25 dB (all port)

75 80 85 90 95 100 105 110

-60

-50

-40

-30

-20

-10

0

S-p

aram

eter

[dB]

Frequency [GHz]

S21Thru S31coupling S23Isolation

Insertion loss

70 75 80 85 90 95 100 105 110 115

-40

-30

-20

-10

0

S-pa

ram

eter

[dB]

Frequency [GHz]

S11 S22 S33

Return loss

Measurement result of W-band reduced ring hybrid coupler

Passive Device using DAML Technology

35

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Comparison of W-band hybrid ring coupler

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)Diameter

(mm)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 About 07 94

DAML -372 -335 -34 146 94

RSCDAML -444 -435 -4823 088 94

Passive Device using DAML Technology

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

36

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

(a) MIM coupling capacitor

(b) Stepped Impedance Perturbation

Novel W-Band Dual Mode Stepped Impedance Resonator BPF Using DAML Technology

(a) (b)

Journal of the Korean Physical Society vol 51 no 10 pp S280-S283 December 2007

Fabricated BPF

(b)

(a)

Passive Device using DAML Technology

37

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University38

60 65 70 75 80 85 90 95 100 105 110 115 120-40

-35

-30

-25

-20

-15

-10

-5

0

5

Inse

rtion

Los

s (d

B)

Frequency (GHz)

S11

S22

S21

S12

Simulation

Step Impedance Ratio 05

MIM Capacitor Size 75 microm2

Perturbation Length 275 microm

Measured Result of W-band BPF

- Insertion Loss 265 dB 97 GHz

- Relative Bandwidth 12

Passive Device using DAML Technology

38

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

60-GHz CPW-fed Dielectric-Resonator-Above-Patch

Antenna for Broadband WLAN Applications Using DAML Technology

Microwave and Optical Technology Letters vol 49 Issue 8 pp 1859-1861 2005

Passive Device using DAML Technology

39

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Fabricated Antenna

(a) Fabricated patch using DAML

(b) 60 GHz RDRA

(c) Proposed antenna

(d) Antenna integrated by 60 GHz VCO

Passive Device using DAML Technology

40

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measured Results

Passive Device using DAML Technology

41

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University42

3-D W-band Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University43

Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 21: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University20

Fabricated DAML

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University21

Comparison of transmission lines[1] K Nishikawa et al IEEE MTT-S Digest vol 3

2001 pp 1881-1884

[2] GE Ponchak et al IEEE Trans Components Packaging and Manufacturing Technology-B

vol 21 no 2 pp 171-176 1998

[3] Suidong Yang et al IEEE Trans MicrowaveTheory and Techniques

vol 46 no 5 pp 623-631 1998

[4] YC Shih et al Microwave Journal

pp 95-105 1991

[5] Youngwoo Kwon et al IEEE Microwave

and Wireless Components Letters

vol 11 no 2 pp 59-61 2001[6] SV Robertson et al IEEE Trans Microwave

Theory and Techniques

vol 46 no 11 1998 pp 1845-1849 1998

This work Sung-Chan Kim et al IEEE Microwaveand Wireless Components Lettersvol 15 no 10 pp 652-654 2005

This work H S Lee et al IEE Electronics Letters

vol 39 no 25 pp 1827-1828 2003

DAML Characteristic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University22

Shielded DAML using Flip chip technique

h Dielectric post height w Signal line width

g Dielectric post gap

d Dielectric post size

Lower Ground Plane

Upper Ground Plane

Polyimide Dielectric post

Air-bridged Signal line

Connected Ground using Flip chip Stud

Ultra low loss extended height (10 microm rarr 17 microm) Shielding effect

- Radiation electromagnetic and environmental interference are avoided by enclosing microstrip circuitry in a shielding cavity

Simple process not bulk micromachining (using flip-chip technique)

SDAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University23

Fabricated DAML (height = 17 microm)

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University24

Simulation Measurement

80(GHz) 163 185

94(GHz)

189 153

110(GHz)

222 213

Signal line width 44 microm (dBcm)

DAML Characteristic (Measurement)

Insertion loss versus Signal line height

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University25

Comparison of original DAML

SDAML Characteristic

0 20 40 60 80 100 120 14000

05

10

15

20

25

30

35

40

Inse

rtion

loss

[dB

cm]

Frequency [GHz]

DAML (h = 10 m) DAML (h = 17 m) SDAML (h = 17 m)

60(GHz)

94(GHz)

120(GHz)

DAML(10 microm) 187 256 31

DAML(17 microm) 127 189 242

SDAML(17 microm) 107 141 167

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University26

CPW

Microstrip

DAML

Reduced Size DAML

λg 4 94 GHz

Electrical length (λg 4 94 GHz )

CPW 304 microm

Microstrip 266 microm

DAML 792 microm

RS-DAML 478 microm

Comparison of electrical length

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University27

Total Size 604 microm times 520 microm

Passive Device using DAML Technology W-band Reduced Size branch-line coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University28

Coupling loss 361 dB

Isolation -355 dB

Transmission loss 425 dB

Return loss -369 dB

Measurement result of W-band Reduced branch-line coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University29

Comparison of W-band branch line coupler

CaseCouplingloss (dB)

Return loss (dB)

Chip size(mm2)

Centerfrequency

(GHz)

1 (CPW)

About -35 About -20 05 ⅹ05 90

RSCDAML -361 -369 06ⅹ052 94

Passive Device using DAML Technology

Reference 1 M Schlechtweg et al GaAs IC Symposium 1995 Technical Digest 1995

17th Annual IEEE 29 Oct-1 Nov 1995 Page(s)214 - 217

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University30

W-band Hybrid Ring Coupler

Fabricated W-band hybrid ring coupler

Coupler size146 mm (diameter)

10 microm

50 Ω termination

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University31

S-parameters of W-band hybrid ring coupler

Transmission loss380 plusmn 008 dB

( 85-105 GHz)

Coupling loss

357 plusmn 022 dB

W-band Hybrid Ring Coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University32

Comparison of W-band hybrid ring coupler

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 94

Thiswork -372 -335 -34 94

Hybrid Ring Coupler

This work Sung-Chan Kim et al IEEE MWCL vol 15 no 10 pp 652-654 2005

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University33

Diameter 0888 mm

W-band reduced ring hybrid coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University34

Reduced to 63 in area

Conventional Coupler

Diameter 1460 mm

Reduced Coupler

Diameter 0888 mm

Comparison of coupler sizes

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Coupling loss 435 dB Isolation -4823 dB

Transmission loss 444 dB Return loss below -25 dB (all port)

75 80 85 90 95 100 105 110

-60

-50

-40

-30

-20

-10

0

S-p

aram

eter

[dB]

Frequency [GHz]

S21Thru S31coupling S23Isolation

Insertion loss

70 75 80 85 90 95 100 105 110 115

-40

-30

-20

-10

0

S-pa

ram

eter

[dB]

Frequency [GHz]

S11 S22 S33

Return loss

Measurement result of W-band reduced ring hybrid coupler

Passive Device using DAML Technology

35

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Comparison of W-band hybrid ring coupler

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)Diameter

(mm)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 About 07 94

DAML -372 -335 -34 146 94

RSCDAML -444 -435 -4823 088 94

Passive Device using DAML Technology

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

36

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

(a) MIM coupling capacitor

(b) Stepped Impedance Perturbation

Novel W-Band Dual Mode Stepped Impedance Resonator BPF Using DAML Technology

(a) (b)

Journal of the Korean Physical Society vol 51 no 10 pp S280-S283 December 2007

Fabricated BPF

(b)

(a)

Passive Device using DAML Technology

37

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University38

60 65 70 75 80 85 90 95 100 105 110 115 120-40

-35

-30

-25

-20

-15

-10

-5

0

5

Inse

rtion

Los

s (d

B)

Frequency (GHz)

S11

S22

S21

S12

Simulation

Step Impedance Ratio 05

MIM Capacitor Size 75 microm2

Perturbation Length 275 microm

Measured Result of W-band BPF

- Insertion Loss 265 dB 97 GHz

- Relative Bandwidth 12

Passive Device using DAML Technology

38

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

60-GHz CPW-fed Dielectric-Resonator-Above-Patch

Antenna for Broadband WLAN Applications Using DAML Technology

Microwave and Optical Technology Letters vol 49 Issue 8 pp 1859-1861 2005

Passive Device using DAML Technology

39

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Fabricated Antenna

(a) Fabricated patch using DAML

(b) 60 GHz RDRA

(c) Proposed antenna

(d) Antenna integrated by 60 GHz VCO

Passive Device using DAML Technology

40

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measured Results

Passive Device using DAML Technology

41

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University42

3-D W-band Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University43

Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 22: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University21

Comparison of transmission lines[1] K Nishikawa et al IEEE MTT-S Digest vol 3

2001 pp 1881-1884

[2] GE Ponchak et al IEEE Trans Components Packaging and Manufacturing Technology-B

vol 21 no 2 pp 171-176 1998

[3] Suidong Yang et al IEEE Trans MicrowaveTheory and Techniques

vol 46 no 5 pp 623-631 1998

[4] YC Shih et al Microwave Journal

pp 95-105 1991

[5] Youngwoo Kwon et al IEEE Microwave

and Wireless Components Letters

vol 11 no 2 pp 59-61 2001[6] SV Robertson et al IEEE Trans Microwave

Theory and Techniques

vol 46 no 11 1998 pp 1845-1849 1998

This work Sung-Chan Kim et al IEEE Microwaveand Wireless Components Lettersvol 15 no 10 pp 652-654 2005

This work H S Lee et al IEE Electronics Letters

vol 39 no 25 pp 1827-1828 2003

DAML Characteristic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University22

Shielded DAML using Flip chip technique

h Dielectric post height w Signal line width

g Dielectric post gap

d Dielectric post size

Lower Ground Plane

Upper Ground Plane

Polyimide Dielectric post

Air-bridged Signal line

Connected Ground using Flip chip Stud

Ultra low loss extended height (10 microm rarr 17 microm) Shielding effect

- Radiation electromagnetic and environmental interference are avoided by enclosing microstrip circuitry in a shielding cavity

Simple process not bulk micromachining (using flip-chip technique)

SDAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University23

Fabricated DAML (height = 17 microm)

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University24

Simulation Measurement

80(GHz) 163 185

94(GHz)

189 153

110(GHz)

222 213

Signal line width 44 microm (dBcm)

DAML Characteristic (Measurement)

Insertion loss versus Signal line height

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University25

Comparison of original DAML

SDAML Characteristic

0 20 40 60 80 100 120 14000

05

10

15

20

25

30

35

40

Inse

rtion

loss

[dB

cm]

Frequency [GHz]

DAML (h = 10 m) DAML (h = 17 m) SDAML (h = 17 m)

60(GHz)

94(GHz)

120(GHz)

DAML(10 microm) 187 256 31

DAML(17 microm) 127 189 242

SDAML(17 microm) 107 141 167

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University26

CPW

Microstrip

DAML

Reduced Size DAML

λg 4 94 GHz

Electrical length (λg 4 94 GHz )

CPW 304 microm

Microstrip 266 microm

DAML 792 microm

RS-DAML 478 microm

Comparison of electrical length

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University27

Total Size 604 microm times 520 microm

Passive Device using DAML Technology W-band Reduced Size branch-line coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University28

Coupling loss 361 dB

Isolation -355 dB

Transmission loss 425 dB

Return loss -369 dB

Measurement result of W-band Reduced branch-line coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University29

Comparison of W-band branch line coupler

CaseCouplingloss (dB)

Return loss (dB)

Chip size(mm2)

Centerfrequency

(GHz)

1 (CPW)

About -35 About -20 05 ⅹ05 90

RSCDAML -361 -369 06ⅹ052 94

Passive Device using DAML Technology

Reference 1 M Schlechtweg et al GaAs IC Symposium 1995 Technical Digest 1995

17th Annual IEEE 29 Oct-1 Nov 1995 Page(s)214 - 217

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University30

W-band Hybrid Ring Coupler

Fabricated W-band hybrid ring coupler

Coupler size146 mm (diameter)

10 microm

50 Ω termination

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University31

S-parameters of W-band hybrid ring coupler

Transmission loss380 plusmn 008 dB

( 85-105 GHz)

Coupling loss

357 plusmn 022 dB

W-band Hybrid Ring Coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University32

Comparison of W-band hybrid ring coupler

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 94

Thiswork -372 -335 -34 94

Hybrid Ring Coupler

This work Sung-Chan Kim et al IEEE MWCL vol 15 no 10 pp 652-654 2005

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University33

Diameter 0888 mm

W-band reduced ring hybrid coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University34

Reduced to 63 in area

Conventional Coupler

Diameter 1460 mm

Reduced Coupler

Diameter 0888 mm

Comparison of coupler sizes

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Coupling loss 435 dB Isolation -4823 dB

Transmission loss 444 dB Return loss below -25 dB (all port)

75 80 85 90 95 100 105 110

-60

-50

-40

-30

-20

-10

0

S-p

aram

eter

[dB]

Frequency [GHz]

S21Thru S31coupling S23Isolation

Insertion loss

70 75 80 85 90 95 100 105 110 115

-40

-30

-20

-10

0

S-pa

ram

eter

[dB]

Frequency [GHz]

S11 S22 S33

Return loss

Measurement result of W-band reduced ring hybrid coupler

Passive Device using DAML Technology

35

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Comparison of W-band hybrid ring coupler

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)Diameter

(mm)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 About 07 94

DAML -372 -335 -34 146 94

RSCDAML -444 -435 -4823 088 94

Passive Device using DAML Technology

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

36

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

(a) MIM coupling capacitor

(b) Stepped Impedance Perturbation

Novel W-Band Dual Mode Stepped Impedance Resonator BPF Using DAML Technology

(a) (b)

Journal of the Korean Physical Society vol 51 no 10 pp S280-S283 December 2007

Fabricated BPF

(b)

(a)

Passive Device using DAML Technology

37

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University38

60 65 70 75 80 85 90 95 100 105 110 115 120-40

-35

-30

-25

-20

-15

-10

-5

0

5

Inse

rtion

Los

s (d

B)

Frequency (GHz)

S11

S22

S21

S12

Simulation

Step Impedance Ratio 05

MIM Capacitor Size 75 microm2

Perturbation Length 275 microm

Measured Result of W-band BPF

- Insertion Loss 265 dB 97 GHz

- Relative Bandwidth 12

Passive Device using DAML Technology

38

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

60-GHz CPW-fed Dielectric-Resonator-Above-Patch

Antenna for Broadband WLAN Applications Using DAML Technology

Microwave and Optical Technology Letters vol 49 Issue 8 pp 1859-1861 2005

Passive Device using DAML Technology

39

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Fabricated Antenna

(a) Fabricated patch using DAML

(b) 60 GHz RDRA

(c) Proposed antenna

(d) Antenna integrated by 60 GHz VCO

Passive Device using DAML Technology

40

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measured Results

Passive Device using DAML Technology

41

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University42

3-D W-band Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University43

Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 23: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University22

Shielded DAML using Flip chip technique

h Dielectric post height w Signal line width

g Dielectric post gap

d Dielectric post size

Lower Ground Plane

Upper Ground Plane

Polyimide Dielectric post

Air-bridged Signal line

Connected Ground using Flip chip Stud

Ultra low loss extended height (10 microm rarr 17 microm) Shielding effect

- Radiation electromagnetic and environmental interference are avoided by enclosing microstrip circuitry in a shielding cavity

Simple process not bulk micromachining (using flip-chip technique)

SDAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University23

Fabricated DAML (height = 17 microm)

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University24

Simulation Measurement

80(GHz) 163 185

94(GHz)

189 153

110(GHz)

222 213

Signal line width 44 microm (dBcm)

DAML Characteristic (Measurement)

Insertion loss versus Signal line height

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University25

Comparison of original DAML

SDAML Characteristic

0 20 40 60 80 100 120 14000

05

10

15

20

25

30

35

40

Inse

rtion

loss

[dB

cm]

Frequency [GHz]

DAML (h = 10 m) DAML (h = 17 m) SDAML (h = 17 m)

60(GHz)

94(GHz)

120(GHz)

DAML(10 microm) 187 256 31

DAML(17 microm) 127 189 242

SDAML(17 microm) 107 141 167

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University26

CPW

Microstrip

DAML

Reduced Size DAML

λg 4 94 GHz

Electrical length (λg 4 94 GHz )

CPW 304 microm

Microstrip 266 microm

DAML 792 microm

RS-DAML 478 microm

Comparison of electrical length

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University27

Total Size 604 microm times 520 microm

Passive Device using DAML Technology W-band Reduced Size branch-line coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University28

Coupling loss 361 dB

Isolation -355 dB

Transmission loss 425 dB

Return loss -369 dB

Measurement result of W-band Reduced branch-line coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University29

Comparison of W-band branch line coupler

CaseCouplingloss (dB)

Return loss (dB)

Chip size(mm2)

Centerfrequency

(GHz)

1 (CPW)

About -35 About -20 05 ⅹ05 90

RSCDAML -361 -369 06ⅹ052 94

Passive Device using DAML Technology

Reference 1 M Schlechtweg et al GaAs IC Symposium 1995 Technical Digest 1995

17th Annual IEEE 29 Oct-1 Nov 1995 Page(s)214 - 217

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University30

W-band Hybrid Ring Coupler

Fabricated W-band hybrid ring coupler

Coupler size146 mm (diameter)

10 microm

50 Ω termination

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University31

S-parameters of W-band hybrid ring coupler

Transmission loss380 plusmn 008 dB

( 85-105 GHz)

Coupling loss

357 plusmn 022 dB

W-band Hybrid Ring Coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University32

Comparison of W-band hybrid ring coupler

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 94

Thiswork -372 -335 -34 94

Hybrid Ring Coupler

This work Sung-Chan Kim et al IEEE MWCL vol 15 no 10 pp 652-654 2005

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University33

Diameter 0888 mm

W-band reduced ring hybrid coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University34

Reduced to 63 in area

Conventional Coupler

Diameter 1460 mm

Reduced Coupler

Diameter 0888 mm

Comparison of coupler sizes

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Coupling loss 435 dB Isolation -4823 dB

Transmission loss 444 dB Return loss below -25 dB (all port)

75 80 85 90 95 100 105 110

-60

-50

-40

-30

-20

-10

0

S-p

aram

eter

[dB]

Frequency [GHz]

S21Thru S31coupling S23Isolation

Insertion loss

70 75 80 85 90 95 100 105 110 115

-40

-30

-20

-10

0

S-pa

ram

eter

[dB]

Frequency [GHz]

S11 S22 S33

Return loss

Measurement result of W-band reduced ring hybrid coupler

Passive Device using DAML Technology

35

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Comparison of W-band hybrid ring coupler

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)Diameter

(mm)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 About 07 94

DAML -372 -335 -34 146 94

RSCDAML -444 -435 -4823 088 94

Passive Device using DAML Technology

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

36

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

(a) MIM coupling capacitor

(b) Stepped Impedance Perturbation

Novel W-Band Dual Mode Stepped Impedance Resonator BPF Using DAML Technology

(a) (b)

Journal of the Korean Physical Society vol 51 no 10 pp S280-S283 December 2007

Fabricated BPF

(b)

(a)

Passive Device using DAML Technology

37

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University38

60 65 70 75 80 85 90 95 100 105 110 115 120-40

-35

-30

-25

-20

-15

-10

-5

0

5

Inse

rtion

Los

s (d

B)

Frequency (GHz)

S11

S22

S21

S12

Simulation

Step Impedance Ratio 05

MIM Capacitor Size 75 microm2

Perturbation Length 275 microm

Measured Result of W-band BPF

- Insertion Loss 265 dB 97 GHz

- Relative Bandwidth 12

Passive Device using DAML Technology

38

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

60-GHz CPW-fed Dielectric-Resonator-Above-Patch

Antenna for Broadband WLAN Applications Using DAML Technology

Microwave and Optical Technology Letters vol 49 Issue 8 pp 1859-1861 2005

Passive Device using DAML Technology

39

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Fabricated Antenna

(a) Fabricated patch using DAML

(b) 60 GHz RDRA

(c) Proposed antenna

(d) Antenna integrated by 60 GHz VCO

Passive Device using DAML Technology

40

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measured Results

Passive Device using DAML Technology

41

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University42

3-D W-band Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University43

Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

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Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 24: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University23

Fabricated DAML (height = 17 microm)

Fabricated DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University24

Simulation Measurement

80(GHz) 163 185

94(GHz)

189 153

110(GHz)

222 213

Signal line width 44 microm (dBcm)

DAML Characteristic (Measurement)

Insertion loss versus Signal line height

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University25

Comparison of original DAML

SDAML Characteristic

0 20 40 60 80 100 120 14000

05

10

15

20

25

30

35

40

Inse

rtion

loss

[dB

cm]

Frequency [GHz]

DAML (h = 10 m) DAML (h = 17 m) SDAML (h = 17 m)

60(GHz)

94(GHz)

120(GHz)

DAML(10 microm) 187 256 31

DAML(17 microm) 127 189 242

SDAML(17 microm) 107 141 167

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University26

CPW

Microstrip

DAML

Reduced Size DAML

λg 4 94 GHz

Electrical length (λg 4 94 GHz )

CPW 304 microm

Microstrip 266 microm

DAML 792 microm

RS-DAML 478 microm

Comparison of electrical length

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University27

Total Size 604 microm times 520 microm

Passive Device using DAML Technology W-band Reduced Size branch-line coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University28

Coupling loss 361 dB

Isolation -355 dB

Transmission loss 425 dB

Return loss -369 dB

Measurement result of W-band Reduced branch-line coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University29

Comparison of W-band branch line coupler

CaseCouplingloss (dB)

Return loss (dB)

Chip size(mm2)

Centerfrequency

(GHz)

1 (CPW)

About -35 About -20 05 ⅹ05 90

RSCDAML -361 -369 06ⅹ052 94

Passive Device using DAML Technology

Reference 1 M Schlechtweg et al GaAs IC Symposium 1995 Technical Digest 1995

17th Annual IEEE 29 Oct-1 Nov 1995 Page(s)214 - 217

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University30

W-band Hybrid Ring Coupler

Fabricated W-band hybrid ring coupler

Coupler size146 mm (diameter)

10 microm

50 Ω termination

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University31

S-parameters of W-band hybrid ring coupler

Transmission loss380 plusmn 008 dB

( 85-105 GHz)

Coupling loss

357 plusmn 022 dB

W-band Hybrid Ring Coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University32

Comparison of W-band hybrid ring coupler

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 94

Thiswork -372 -335 -34 94

Hybrid Ring Coupler

This work Sung-Chan Kim et al IEEE MWCL vol 15 no 10 pp 652-654 2005

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University33

Diameter 0888 mm

W-band reduced ring hybrid coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University34

Reduced to 63 in area

Conventional Coupler

Diameter 1460 mm

Reduced Coupler

Diameter 0888 mm

Comparison of coupler sizes

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Coupling loss 435 dB Isolation -4823 dB

Transmission loss 444 dB Return loss below -25 dB (all port)

75 80 85 90 95 100 105 110

-60

-50

-40

-30

-20

-10

0

S-p

aram

eter

[dB]

Frequency [GHz]

S21Thru S31coupling S23Isolation

Insertion loss

70 75 80 85 90 95 100 105 110 115

-40

-30

-20

-10

0

S-pa

ram

eter

[dB]

Frequency [GHz]

S11 S22 S33

Return loss

Measurement result of W-band reduced ring hybrid coupler

Passive Device using DAML Technology

35

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Comparison of W-band hybrid ring coupler

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)Diameter

(mm)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 About 07 94

DAML -372 -335 -34 146 94

RSCDAML -444 -435 -4823 088 94

Passive Device using DAML Technology

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

36

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

(a) MIM coupling capacitor

(b) Stepped Impedance Perturbation

Novel W-Band Dual Mode Stepped Impedance Resonator BPF Using DAML Technology

(a) (b)

Journal of the Korean Physical Society vol 51 no 10 pp S280-S283 December 2007

Fabricated BPF

(b)

(a)

Passive Device using DAML Technology

37

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University38

60 65 70 75 80 85 90 95 100 105 110 115 120-40

-35

-30

-25

-20

-15

-10

-5

0

5

Inse

rtion

Los

s (d

B)

Frequency (GHz)

S11

S22

S21

S12

Simulation

Step Impedance Ratio 05

MIM Capacitor Size 75 microm2

Perturbation Length 275 microm

Measured Result of W-band BPF

- Insertion Loss 265 dB 97 GHz

- Relative Bandwidth 12

Passive Device using DAML Technology

38

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

60-GHz CPW-fed Dielectric-Resonator-Above-Patch

Antenna for Broadband WLAN Applications Using DAML Technology

Microwave and Optical Technology Letters vol 49 Issue 8 pp 1859-1861 2005

Passive Device using DAML Technology

39

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Fabricated Antenna

(a) Fabricated patch using DAML

(b) 60 GHz RDRA

(c) Proposed antenna

(d) Antenna integrated by 60 GHz VCO

Passive Device using DAML Technology

40

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measured Results

Passive Device using DAML Technology

41

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3-D W-band Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University43

Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

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Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 25: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University24

Simulation Measurement

80(GHz) 163 185

94(GHz)

189 153

110(GHz)

222 213

Signal line width 44 microm (dBcm)

DAML Characteristic (Measurement)

Insertion loss versus Signal line height

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University25

Comparison of original DAML

SDAML Characteristic

0 20 40 60 80 100 120 14000

05

10

15

20

25

30

35

40

Inse

rtion

loss

[dB

cm]

Frequency [GHz]

DAML (h = 10 m) DAML (h = 17 m) SDAML (h = 17 m)

60(GHz)

94(GHz)

120(GHz)

DAML(10 microm) 187 256 31

DAML(17 microm) 127 189 242

SDAML(17 microm) 107 141 167

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University26

CPW

Microstrip

DAML

Reduced Size DAML

λg 4 94 GHz

Electrical length (λg 4 94 GHz )

CPW 304 microm

Microstrip 266 microm

DAML 792 microm

RS-DAML 478 microm

Comparison of electrical length

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University27

Total Size 604 microm times 520 microm

Passive Device using DAML Technology W-band Reduced Size branch-line coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University28

Coupling loss 361 dB

Isolation -355 dB

Transmission loss 425 dB

Return loss -369 dB

Measurement result of W-band Reduced branch-line coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University29

Comparison of W-band branch line coupler

CaseCouplingloss (dB)

Return loss (dB)

Chip size(mm2)

Centerfrequency

(GHz)

1 (CPW)

About -35 About -20 05 ⅹ05 90

RSCDAML -361 -369 06ⅹ052 94

Passive Device using DAML Technology

Reference 1 M Schlechtweg et al GaAs IC Symposium 1995 Technical Digest 1995

17th Annual IEEE 29 Oct-1 Nov 1995 Page(s)214 - 217

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University30

W-band Hybrid Ring Coupler

Fabricated W-band hybrid ring coupler

Coupler size146 mm (diameter)

10 microm

50 Ω termination

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University31

S-parameters of W-band hybrid ring coupler

Transmission loss380 plusmn 008 dB

( 85-105 GHz)

Coupling loss

357 plusmn 022 dB

W-band Hybrid Ring Coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University32

Comparison of W-band hybrid ring coupler

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 94

Thiswork -372 -335 -34 94

Hybrid Ring Coupler

This work Sung-Chan Kim et al IEEE MWCL vol 15 no 10 pp 652-654 2005

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University33

Diameter 0888 mm

W-band reduced ring hybrid coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University34

Reduced to 63 in area

Conventional Coupler

Diameter 1460 mm

Reduced Coupler

Diameter 0888 mm

Comparison of coupler sizes

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Coupling loss 435 dB Isolation -4823 dB

Transmission loss 444 dB Return loss below -25 dB (all port)

75 80 85 90 95 100 105 110

-60

-50

-40

-30

-20

-10

0

S-p

aram

eter

[dB]

Frequency [GHz]

S21Thru S31coupling S23Isolation

Insertion loss

70 75 80 85 90 95 100 105 110 115

-40

-30

-20

-10

0

S-pa

ram

eter

[dB]

Frequency [GHz]

S11 S22 S33

Return loss

Measurement result of W-band reduced ring hybrid coupler

Passive Device using DAML Technology

35

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Comparison of W-band hybrid ring coupler

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)Diameter

(mm)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 About 07 94

DAML -372 -335 -34 146 94

RSCDAML -444 -435 -4823 088 94

Passive Device using DAML Technology

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

36

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

(a) MIM coupling capacitor

(b) Stepped Impedance Perturbation

Novel W-Band Dual Mode Stepped Impedance Resonator BPF Using DAML Technology

(a) (b)

Journal of the Korean Physical Society vol 51 no 10 pp S280-S283 December 2007

Fabricated BPF

(b)

(a)

Passive Device using DAML Technology

37

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University38

60 65 70 75 80 85 90 95 100 105 110 115 120-40

-35

-30

-25

-20

-15

-10

-5

0

5

Inse

rtion

Los

s (d

B)

Frequency (GHz)

S11

S22

S21

S12

Simulation

Step Impedance Ratio 05

MIM Capacitor Size 75 microm2

Perturbation Length 275 microm

Measured Result of W-band BPF

- Insertion Loss 265 dB 97 GHz

- Relative Bandwidth 12

Passive Device using DAML Technology

38

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

60-GHz CPW-fed Dielectric-Resonator-Above-Patch

Antenna for Broadband WLAN Applications Using DAML Technology

Microwave and Optical Technology Letters vol 49 Issue 8 pp 1859-1861 2005

Passive Device using DAML Technology

39

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Fabricated Antenna

(a) Fabricated patch using DAML

(b) 60 GHz RDRA

(c) Proposed antenna

(d) Antenna integrated by 60 GHz VCO

Passive Device using DAML Technology

40

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measured Results

Passive Device using DAML Technology

41

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University42

3-D W-band Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University43

Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

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Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 26: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University25

Comparison of original DAML

SDAML Characteristic

0 20 40 60 80 100 120 14000

05

10

15

20

25

30

35

40

Inse

rtion

loss

[dB

cm]

Frequency [GHz]

DAML (h = 10 m) DAML (h = 17 m) SDAML (h = 17 m)

60(GHz)

94(GHz)

120(GHz)

DAML(10 microm) 187 256 31

DAML(17 microm) 127 189 242

SDAML(17 microm) 107 141 167

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University26

CPW

Microstrip

DAML

Reduced Size DAML

λg 4 94 GHz

Electrical length (λg 4 94 GHz )

CPW 304 microm

Microstrip 266 microm

DAML 792 microm

RS-DAML 478 microm

Comparison of electrical length

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University27

Total Size 604 microm times 520 microm

Passive Device using DAML Technology W-band Reduced Size branch-line coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University28

Coupling loss 361 dB

Isolation -355 dB

Transmission loss 425 dB

Return loss -369 dB

Measurement result of W-band Reduced branch-line coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University29

Comparison of W-band branch line coupler

CaseCouplingloss (dB)

Return loss (dB)

Chip size(mm2)

Centerfrequency

(GHz)

1 (CPW)

About -35 About -20 05 ⅹ05 90

RSCDAML -361 -369 06ⅹ052 94

Passive Device using DAML Technology

Reference 1 M Schlechtweg et al GaAs IC Symposium 1995 Technical Digest 1995

17th Annual IEEE 29 Oct-1 Nov 1995 Page(s)214 - 217

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University30

W-band Hybrid Ring Coupler

Fabricated W-band hybrid ring coupler

Coupler size146 mm (diameter)

10 microm

50 Ω termination

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University31

S-parameters of W-band hybrid ring coupler

Transmission loss380 plusmn 008 dB

( 85-105 GHz)

Coupling loss

357 plusmn 022 dB

W-band Hybrid Ring Coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University32

Comparison of W-band hybrid ring coupler

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 94

Thiswork -372 -335 -34 94

Hybrid Ring Coupler

This work Sung-Chan Kim et al IEEE MWCL vol 15 no 10 pp 652-654 2005

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University33

Diameter 0888 mm

W-band reduced ring hybrid coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University34

Reduced to 63 in area

Conventional Coupler

Diameter 1460 mm

Reduced Coupler

Diameter 0888 mm

Comparison of coupler sizes

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Coupling loss 435 dB Isolation -4823 dB

Transmission loss 444 dB Return loss below -25 dB (all port)

75 80 85 90 95 100 105 110

-60

-50

-40

-30

-20

-10

0

S-p

aram

eter

[dB]

Frequency [GHz]

S21Thru S31coupling S23Isolation

Insertion loss

70 75 80 85 90 95 100 105 110 115

-40

-30

-20

-10

0

S-pa

ram

eter

[dB]

Frequency [GHz]

S11 S22 S33

Return loss

Measurement result of W-band reduced ring hybrid coupler

Passive Device using DAML Technology

35

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Comparison of W-band hybrid ring coupler

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)Diameter

(mm)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 About 07 94

DAML -372 -335 -34 146 94

RSCDAML -444 -435 -4823 088 94

Passive Device using DAML Technology

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

36

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

(a) MIM coupling capacitor

(b) Stepped Impedance Perturbation

Novel W-Band Dual Mode Stepped Impedance Resonator BPF Using DAML Technology

(a) (b)

Journal of the Korean Physical Society vol 51 no 10 pp S280-S283 December 2007

Fabricated BPF

(b)

(a)

Passive Device using DAML Technology

37

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University38

60 65 70 75 80 85 90 95 100 105 110 115 120-40

-35

-30

-25

-20

-15

-10

-5

0

5

Inse

rtion

Los

s (d

B)

Frequency (GHz)

S11

S22

S21

S12

Simulation

Step Impedance Ratio 05

MIM Capacitor Size 75 microm2

Perturbation Length 275 microm

Measured Result of W-band BPF

- Insertion Loss 265 dB 97 GHz

- Relative Bandwidth 12

Passive Device using DAML Technology

38

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

60-GHz CPW-fed Dielectric-Resonator-Above-Patch

Antenna for Broadband WLAN Applications Using DAML Technology

Microwave and Optical Technology Letters vol 49 Issue 8 pp 1859-1861 2005

Passive Device using DAML Technology

39

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Fabricated Antenna

(a) Fabricated patch using DAML

(b) 60 GHz RDRA

(c) Proposed antenna

(d) Antenna integrated by 60 GHz VCO

Passive Device using DAML Technology

40

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measured Results

Passive Device using DAML Technology

41

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University42

3-D W-band Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University43

Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

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Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

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Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 27: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University26

CPW

Microstrip

DAML

Reduced Size DAML

λg 4 94 GHz

Electrical length (λg 4 94 GHz )

CPW 304 microm

Microstrip 266 microm

DAML 792 microm

RS-DAML 478 microm

Comparison of electrical length

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University27

Total Size 604 microm times 520 microm

Passive Device using DAML Technology W-band Reduced Size branch-line coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University28

Coupling loss 361 dB

Isolation -355 dB

Transmission loss 425 dB

Return loss -369 dB

Measurement result of W-band Reduced branch-line coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University29

Comparison of W-band branch line coupler

CaseCouplingloss (dB)

Return loss (dB)

Chip size(mm2)

Centerfrequency

(GHz)

1 (CPW)

About -35 About -20 05 ⅹ05 90

RSCDAML -361 -369 06ⅹ052 94

Passive Device using DAML Technology

Reference 1 M Schlechtweg et al GaAs IC Symposium 1995 Technical Digest 1995

17th Annual IEEE 29 Oct-1 Nov 1995 Page(s)214 - 217

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W-band Hybrid Ring Coupler

Fabricated W-band hybrid ring coupler

Coupler size146 mm (diameter)

10 microm

50 Ω termination

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University31

S-parameters of W-band hybrid ring coupler

Transmission loss380 plusmn 008 dB

( 85-105 GHz)

Coupling loss

357 plusmn 022 dB

W-band Hybrid Ring Coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University32

Comparison of W-band hybrid ring coupler

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 94

Thiswork -372 -335 -34 94

Hybrid Ring Coupler

This work Sung-Chan Kim et al IEEE MWCL vol 15 no 10 pp 652-654 2005

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University33

Diameter 0888 mm

W-band reduced ring hybrid coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University34

Reduced to 63 in area

Conventional Coupler

Diameter 1460 mm

Reduced Coupler

Diameter 0888 mm

Comparison of coupler sizes

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Coupling loss 435 dB Isolation -4823 dB

Transmission loss 444 dB Return loss below -25 dB (all port)

75 80 85 90 95 100 105 110

-60

-50

-40

-30

-20

-10

0

S-p

aram

eter

[dB]

Frequency [GHz]

S21Thru S31coupling S23Isolation

Insertion loss

70 75 80 85 90 95 100 105 110 115

-40

-30

-20

-10

0

S-pa

ram

eter

[dB]

Frequency [GHz]

S11 S22 S33

Return loss

Measurement result of W-band reduced ring hybrid coupler

Passive Device using DAML Technology

35

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Comparison of W-band hybrid ring coupler

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)Diameter

(mm)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 About 07 94

DAML -372 -335 -34 146 94

RSCDAML -444 -435 -4823 088 94

Passive Device using DAML Technology

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

36

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

(a) MIM coupling capacitor

(b) Stepped Impedance Perturbation

Novel W-Band Dual Mode Stepped Impedance Resonator BPF Using DAML Technology

(a) (b)

Journal of the Korean Physical Society vol 51 no 10 pp S280-S283 December 2007

Fabricated BPF

(b)

(a)

Passive Device using DAML Technology

37

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University38

60 65 70 75 80 85 90 95 100 105 110 115 120-40

-35

-30

-25

-20

-15

-10

-5

0

5

Inse

rtion

Los

s (d

B)

Frequency (GHz)

S11

S22

S21

S12

Simulation

Step Impedance Ratio 05

MIM Capacitor Size 75 microm2

Perturbation Length 275 microm

Measured Result of W-band BPF

- Insertion Loss 265 dB 97 GHz

- Relative Bandwidth 12

Passive Device using DAML Technology

38

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

60-GHz CPW-fed Dielectric-Resonator-Above-Patch

Antenna for Broadband WLAN Applications Using DAML Technology

Microwave and Optical Technology Letters vol 49 Issue 8 pp 1859-1861 2005

Passive Device using DAML Technology

39

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Fabricated Antenna

(a) Fabricated patch using DAML

(b) 60 GHz RDRA

(c) Proposed antenna

(d) Antenna integrated by 60 GHz VCO

Passive Device using DAML Technology

40

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measured Results

Passive Device using DAML Technology

41

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3-D W-band Single Balanced Active Mixer

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Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

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For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

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Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

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ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

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MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

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MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

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Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 28: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University27

Total Size 604 microm times 520 microm

Passive Device using DAML Technology W-band Reduced Size branch-line coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University28

Coupling loss 361 dB

Isolation -355 dB

Transmission loss 425 dB

Return loss -369 dB

Measurement result of W-band Reduced branch-line coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University29

Comparison of W-band branch line coupler

CaseCouplingloss (dB)

Return loss (dB)

Chip size(mm2)

Centerfrequency

(GHz)

1 (CPW)

About -35 About -20 05 ⅹ05 90

RSCDAML -361 -369 06ⅹ052 94

Passive Device using DAML Technology

Reference 1 M Schlechtweg et al GaAs IC Symposium 1995 Technical Digest 1995

17th Annual IEEE 29 Oct-1 Nov 1995 Page(s)214 - 217

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University30

W-band Hybrid Ring Coupler

Fabricated W-band hybrid ring coupler

Coupler size146 mm (diameter)

10 microm

50 Ω termination

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University31

S-parameters of W-band hybrid ring coupler

Transmission loss380 plusmn 008 dB

( 85-105 GHz)

Coupling loss

357 plusmn 022 dB

W-band Hybrid Ring Coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University32

Comparison of W-band hybrid ring coupler

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 94

Thiswork -372 -335 -34 94

Hybrid Ring Coupler

This work Sung-Chan Kim et al IEEE MWCL vol 15 no 10 pp 652-654 2005

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University33

Diameter 0888 mm

W-band reduced ring hybrid coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University34

Reduced to 63 in area

Conventional Coupler

Diameter 1460 mm

Reduced Coupler

Diameter 0888 mm

Comparison of coupler sizes

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Coupling loss 435 dB Isolation -4823 dB

Transmission loss 444 dB Return loss below -25 dB (all port)

75 80 85 90 95 100 105 110

-60

-50

-40

-30

-20

-10

0

S-p

aram

eter

[dB]

Frequency [GHz]

S21Thru S31coupling S23Isolation

Insertion loss

70 75 80 85 90 95 100 105 110 115

-40

-30

-20

-10

0

S-pa

ram

eter

[dB]

Frequency [GHz]

S11 S22 S33

Return loss

Measurement result of W-band reduced ring hybrid coupler

Passive Device using DAML Technology

35

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Comparison of W-band hybrid ring coupler

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)Diameter

(mm)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 About 07 94

DAML -372 -335 -34 146 94

RSCDAML -444 -435 -4823 088 94

Passive Device using DAML Technology

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

36

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

(a) MIM coupling capacitor

(b) Stepped Impedance Perturbation

Novel W-Band Dual Mode Stepped Impedance Resonator BPF Using DAML Technology

(a) (b)

Journal of the Korean Physical Society vol 51 no 10 pp S280-S283 December 2007

Fabricated BPF

(b)

(a)

Passive Device using DAML Technology

37

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University38

60 65 70 75 80 85 90 95 100 105 110 115 120-40

-35

-30

-25

-20

-15

-10

-5

0

5

Inse

rtion

Los

s (d

B)

Frequency (GHz)

S11

S22

S21

S12

Simulation

Step Impedance Ratio 05

MIM Capacitor Size 75 microm2

Perturbation Length 275 microm

Measured Result of W-band BPF

- Insertion Loss 265 dB 97 GHz

- Relative Bandwidth 12

Passive Device using DAML Technology

38

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

60-GHz CPW-fed Dielectric-Resonator-Above-Patch

Antenna for Broadband WLAN Applications Using DAML Technology

Microwave and Optical Technology Letters vol 49 Issue 8 pp 1859-1861 2005

Passive Device using DAML Technology

39

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Fabricated Antenna

(a) Fabricated patch using DAML

(b) 60 GHz RDRA

(c) Proposed antenna

(d) Antenna integrated by 60 GHz VCO

Passive Device using DAML Technology

40

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measured Results

Passive Device using DAML Technology

41

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University42

3-D W-band Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University43

Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 29: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University28

Coupling loss 361 dB

Isolation -355 dB

Transmission loss 425 dB

Return loss -369 dB

Measurement result of W-band Reduced branch-line coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University29

Comparison of W-band branch line coupler

CaseCouplingloss (dB)

Return loss (dB)

Chip size(mm2)

Centerfrequency

(GHz)

1 (CPW)

About -35 About -20 05 ⅹ05 90

RSCDAML -361 -369 06ⅹ052 94

Passive Device using DAML Technology

Reference 1 M Schlechtweg et al GaAs IC Symposium 1995 Technical Digest 1995

17th Annual IEEE 29 Oct-1 Nov 1995 Page(s)214 - 217

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University30

W-band Hybrid Ring Coupler

Fabricated W-band hybrid ring coupler

Coupler size146 mm (diameter)

10 microm

50 Ω termination

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University31

S-parameters of W-band hybrid ring coupler

Transmission loss380 plusmn 008 dB

( 85-105 GHz)

Coupling loss

357 plusmn 022 dB

W-band Hybrid Ring Coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University32

Comparison of W-band hybrid ring coupler

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 94

Thiswork -372 -335 -34 94

Hybrid Ring Coupler

This work Sung-Chan Kim et al IEEE MWCL vol 15 no 10 pp 652-654 2005

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University33

Diameter 0888 mm

W-band reduced ring hybrid coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University34

Reduced to 63 in area

Conventional Coupler

Diameter 1460 mm

Reduced Coupler

Diameter 0888 mm

Comparison of coupler sizes

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Coupling loss 435 dB Isolation -4823 dB

Transmission loss 444 dB Return loss below -25 dB (all port)

75 80 85 90 95 100 105 110

-60

-50

-40

-30

-20

-10

0

S-p

aram

eter

[dB]

Frequency [GHz]

S21Thru S31coupling S23Isolation

Insertion loss

70 75 80 85 90 95 100 105 110 115

-40

-30

-20

-10

0

S-pa

ram

eter

[dB]

Frequency [GHz]

S11 S22 S33

Return loss

Measurement result of W-band reduced ring hybrid coupler

Passive Device using DAML Technology

35

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Comparison of W-band hybrid ring coupler

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)Diameter

(mm)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 About 07 94

DAML -372 -335 -34 146 94

RSCDAML -444 -435 -4823 088 94

Passive Device using DAML Technology

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

36

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

(a) MIM coupling capacitor

(b) Stepped Impedance Perturbation

Novel W-Band Dual Mode Stepped Impedance Resonator BPF Using DAML Technology

(a) (b)

Journal of the Korean Physical Society vol 51 no 10 pp S280-S283 December 2007

Fabricated BPF

(b)

(a)

Passive Device using DAML Technology

37

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University38

60 65 70 75 80 85 90 95 100 105 110 115 120-40

-35

-30

-25

-20

-15

-10

-5

0

5

Inse

rtion

Los

s (d

B)

Frequency (GHz)

S11

S22

S21

S12

Simulation

Step Impedance Ratio 05

MIM Capacitor Size 75 microm2

Perturbation Length 275 microm

Measured Result of W-band BPF

- Insertion Loss 265 dB 97 GHz

- Relative Bandwidth 12

Passive Device using DAML Technology

38

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

60-GHz CPW-fed Dielectric-Resonator-Above-Patch

Antenna for Broadband WLAN Applications Using DAML Technology

Microwave and Optical Technology Letters vol 49 Issue 8 pp 1859-1861 2005

Passive Device using DAML Technology

39

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Fabricated Antenna

(a) Fabricated patch using DAML

(b) 60 GHz RDRA

(c) Proposed antenna

(d) Antenna integrated by 60 GHz VCO

Passive Device using DAML Technology

40

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measured Results

Passive Device using DAML Technology

41

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University42

3-D W-band Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University43

Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

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Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

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Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

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Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 30: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University29

Comparison of W-band branch line coupler

CaseCouplingloss (dB)

Return loss (dB)

Chip size(mm2)

Centerfrequency

(GHz)

1 (CPW)

About -35 About -20 05 ⅹ05 90

RSCDAML -361 -369 06ⅹ052 94

Passive Device using DAML Technology

Reference 1 M Schlechtweg et al GaAs IC Symposium 1995 Technical Digest 1995

17th Annual IEEE 29 Oct-1 Nov 1995 Page(s)214 - 217

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W-band Hybrid Ring Coupler

Fabricated W-band hybrid ring coupler

Coupler size146 mm (diameter)

10 microm

50 Ω termination

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University31

S-parameters of W-band hybrid ring coupler

Transmission loss380 plusmn 008 dB

( 85-105 GHz)

Coupling loss

357 plusmn 022 dB

W-band Hybrid Ring Coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University32

Comparison of W-band hybrid ring coupler

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 94

Thiswork -372 -335 -34 94

Hybrid Ring Coupler

This work Sung-Chan Kim et al IEEE MWCL vol 15 no 10 pp 652-654 2005

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University33

Diameter 0888 mm

W-band reduced ring hybrid coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University34

Reduced to 63 in area

Conventional Coupler

Diameter 1460 mm

Reduced Coupler

Diameter 0888 mm

Comparison of coupler sizes

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Coupling loss 435 dB Isolation -4823 dB

Transmission loss 444 dB Return loss below -25 dB (all port)

75 80 85 90 95 100 105 110

-60

-50

-40

-30

-20

-10

0

S-p

aram

eter

[dB]

Frequency [GHz]

S21Thru S31coupling S23Isolation

Insertion loss

70 75 80 85 90 95 100 105 110 115

-40

-30

-20

-10

0

S-pa

ram

eter

[dB]

Frequency [GHz]

S11 S22 S33

Return loss

Measurement result of W-band reduced ring hybrid coupler

Passive Device using DAML Technology

35

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Comparison of W-band hybrid ring coupler

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)Diameter

(mm)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 About 07 94

DAML -372 -335 -34 146 94

RSCDAML -444 -435 -4823 088 94

Passive Device using DAML Technology

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

36

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

(a) MIM coupling capacitor

(b) Stepped Impedance Perturbation

Novel W-Band Dual Mode Stepped Impedance Resonator BPF Using DAML Technology

(a) (b)

Journal of the Korean Physical Society vol 51 no 10 pp S280-S283 December 2007

Fabricated BPF

(b)

(a)

Passive Device using DAML Technology

37

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University38

60 65 70 75 80 85 90 95 100 105 110 115 120-40

-35

-30

-25

-20

-15

-10

-5

0

5

Inse

rtion

Los

s (d

B)

Frequency (GHz)

S11

S22

S21

S12

Simulation

Step Impedance Ratio 05

MIM Capacitor Size 75 microm2

Perturbation Length 275 microm

Measured Result of W-band BPF

- Insertion Loss 265 dB 97 GHz

- Relative Bandwidth 12

Passive Device using DAML Technology

38

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

60-GHz CPW-fed Dielectric-Resonator-Above-Patch

Antenna for Broadband WLAN Applications Using DAML Technology

Microwave and Optical Technology Letters vol 49 Issue 8 pp 1859-1861 2005

Passive Device using DAML Technology

39

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Fabricated Antenna

(a) Fabricated patch using DAML

(b) 60 GHz RDRA

(c) Proposed antenna

(d) Antenna integrated by 60 GHz VCO

Passive Device using DAML Technology

40

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measured Results

Passive Device using DAML Technology

41

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3-D W-band Single Balanced Active Mixer

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Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

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For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

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Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

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ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

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MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

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MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

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MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

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Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

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Introduction

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IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 31: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University30

W-band Hybrid Ring Coupler

Fabricated W-band hybrid ring coupler

Coupler size146 mm (diameter)

10 microm

50 Ω termination

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University31

S-parameters of W-band hybrid ring coupler

Transmission loss380 plusmn 008 dB

( 85-105 GHz)

Coupling loss

357 plusmn 022 dB

W-band Hybrid Ring Coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University32

Comparison of W-band hybrid ring coupler

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 94

Thiswork -372 -335 -34 94

Hybrid Ring Coupler

This work Sung-Chan Kim et al IEEE MWCL vol 15 no 10 pp 652-654 2005

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University33

Diameter 0888 mm

W-band reduced ring hybrid coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University34

Reduced to 63 in area

Conventional Coupler

Diameter 1460 mm

Reduced Coupler

Diameter 0888 mm

Comparison of coupler sizes

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Coupling loss 435 dB Isolation -4823 dB

Transmission loss 444 dB Return loss below -25 dB (all port)

75 80 85 90 95 100 105 110

-60

-50

-40

-30

-20

-10

0

S-p

aram

eter

[dB]

Frequency [GHz]

S21Thru S31coupling S23Isolation

Insertion loss

70 75 80 85 90 95 100 105 110 115

-40

-30

-20

-10

0

S-pa

ram

eter

[dB]

Frequency [GHz]

S11 S22 S33

Return loss

Measurement result of W-band reduced ring hybrid coupler

Passive Device using DAML Technology

35

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Comparison of W-band hybrid ring coupler

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)Diameter

(mm)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 About 07 94

DAML -372 -335 -34 146 94

RSCDAML -444 -435 -4823 088 94

Passive Device using DAML Technology

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

36

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

(a) MIM coupling capacitor

(b) Stepped Impedance Perturbation

Novel W-Band Dual Mode Stepped Impedance Resonator BPF Using DAML Technology

(a) (b)

Journal of the Korean Physical Society vol 51 no 10 pp S280-S283 December 2007

Fabricated BPF

(b)

(a)

Passive Device using DAML Technology

37

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University38

60 65 70 75 80 85 90 95 100 105 110 115 120-40

-35

-30

-25

-20

-15

-10

-5

0

5

Inse

rtion

Los

s (d

B)

Frequency (GHz)

S11

S22

S21

S12

Simulation

Step Impedance Ratio 05

MIM Capacitor Size 75 microm2

Perturbation Length 275 microm

Measured Result of W-band BPF

- Insertion Loss 265 dB 97 GHz

- Relative Bandwidth 12

Passive Device using DAML Technology

38

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

60-GHz CPW-fed Dielectric-Resonator-Above-Patch

Antenna for Broadband WLAN Applications Using DAML Technology

Microwave and Optical Technology Letters vol 49 Issue 8 pp 1859-1861 2005

Passive Device using DAML Technology

39

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Fabricated Antenna

(a) Fabricated patch using DAML

(b) 60 GHz RDRA

(c) Proposed antenna

(d) Antenna integrated by 60 GHz VCO

Passive Device using DAML Technology

40

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measured Results

Passive Device using DAML Technology

41

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University42

3-D W-band Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University43

Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

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Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 32: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University31

S-parameters of W-band hybrid ring coupler

Transmission loss380 plusmn 008 dB

( 85-105 GHz)

Coupling loss

357 plusmn 022 dB

W-band Hybrid Ring Coupler

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University32

Comparison of W-band hybrid ring coupler

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 94

Thiswork -372 -335 -34 94

Hybrid Ring Coupler

This work Sung-Chan Kim et al IEEE MWCL vol 15 no 10 pp 652-654 2005

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University33

Diameter 0888 mm

W-band reduced ring hybrid coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University34

Reduced to 63 in area

Conventional Coupler

Diameter 1460 mm

Reduced Coupler

Diameter 0888 mm

Comparison of coupler sizes

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Coupling loss 435 dB Isolation -4823 dB

Transmission loss 444 dB Return loss below -25 dB (all port)

75 80 85 90 95 100 105 110

-60

-50

-40

-30

-20

-10

0

S-p

aram

eter

[dB]

Frequency [GHz]

S21Thru S31coupling S23Isolation

Insertion loss

70 75 80 85 90 95 100 105 110 115

-40

-30

-20

-10

0

S-pa

ram

eter

[dB]

Frequency [GHz]

S11 S22 S33

Return loss

Measurement result of W-band reduced ring hybrid coupler

Passive Device using DAML Technology

35

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Comparison of W-band hybrid ring coupler

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)Diameter

(mm)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 About 07 94

DAML -372 -335 -34 146 94

RSCDAML -444 -435 -4823 088 94

Passive Device using DAML Technology

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

36

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

(a) MIM coupling capacitor

(b) Stepped Impedance Perturbation

Novel W-Band Dual Mode Stepped Impedance Resonator BPF Using DAML Technology

(a) (b)

Journal of the Korean Physical Society vol 51 no 10 pp S280-S283 December 2007

Fabricated BPF

(b)

(a)

Passive Device using DAML Technology

37

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University38

60 65 70 75 80 85 90 95 100 105 110 115 120-40

-35

-30

-25

-20

-15

-10

-5

0

5

Inse

rtion

Los

s (d

B)

Frequency (GHz)

S11

S22

S21

S12

Simulation

Step Impedance Ratio 05

MIM Capacitor Size 75 microm2

Perturbation Length 275 microm

Measured Result of W-band BPF

- Insertion Loss 265 dB 97 GHz

- Relative Bandwidth 12

Passive Device using DAML Technology

38

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

60-GHz CPW-fed Dielectric-Resonator-Above-Patch

Antenna for Broadband WLAN Applications Using DAML Technology

Microwave and Optical Technology Letters vol 49 Issue 8 pp 1859-1861 2005

Passive Device using DAML Technology

39

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Fabricated Antenna

(a) Fabricated patch using DAML

(b) 60 GHz RDRA

(c) Proposed antenna

(d) Antenna integrated by 60 GHz VCO

Passive Device using DAML Technology

40

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measured Results

Passive Device using DAML Technology

41

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University42

3-D W-band Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University43

Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

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Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 33: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University32

Comparison of W-band hybrid ring coupler

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 94

Thiswork -372 -335 -34 94

Hybrid Ring Coupler

This work Sung-Chan Kim et al IEEE MWCL vol 15 no 10 pp 652-654 2005

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University33

Diameter 0888 mm

W-band reduced ring hybrid coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University34

Reduced to 63 in area

Conventional Coupler

Diameter 1460 mm

Reduced Coupler

Diameter 0888 mm

Comparison of coupler sizes

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Coupling loss 435 dB Isolation -4823 dB

Transmission loss 444 dB Return loss below -25 dB (all port)

75 80 85 90 95 100 105 110

-60

-50

-40

-30

-20

-10

0

S-p

aram

eter

[dB]

Frequency [GHz]

S21Thru S31coupling S23Isolation

Insertion loss

70 75 80 85 90 95 100 105 110 115

-40

-30

-20

-10

0

S-pa

ram

eter

[dB]

Frequency [GHz]

S11 S22 S33

Return loss

Measurement result of W-band reduced ring hybrid coupler

Passive Device using DAML Technology

35

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Comparison of W-band hybrid ring coupler

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)Diameter

(mm)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 About 07 94

DAML -372 -335 -34 146 94

RSCDAML -444 -435 -4823 088 94

Passive Device using DAML Technology

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

36

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

(a) MIM coupling capacitor

(b) Stepped Impedance Perturbation

Novel W-Band Dual Mode Stepped Impedance Resonator BPF Using DAML Technology

(a) (b)

Journal of the Korean Physical Society vol 51 no 10 pp S280-S283 December 2007

Fabricated BPF

(b)

(a)

Passive Device using DAML Technology

37

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University38

60 65 70 75 80 85 90 95 100 105 110 115 120-40

-35

-30

-25

-20

-15

-10

-5

0

5

Inse

rtion

Los

s (d

B)

Frequency (GHz)

S11

S22

S21

S12

Simulation

Step Impedance Ratio 05

MIM Capacitor Size 75 microm2

Perturbation Length 275 microm

Measured Result of W-band BPF

- Insertion Loss 265 dB 97 GHz

- Relative Bandwidth 12

Passive Device using DAML Technology

38

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

60-GHz CPW-fed Dielectric-Resonator-Above-Patch

Antenna for Broadband WLAN Applications Using DAML Technology

Microwave and Optical Technology Letters vol 49 Issue 8 pp 1859-1861 2005

Passive Device using DAML Technology

39

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Fabricated Antenna

(a) Fabricated patch using DAML

(b) 60 GHz RDRA

(c) Proposed antenna

(d) Antenna integrated by 60 GHz VCO

Passive Device using DAML Technology

40

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measured Results

Passive Device using DAML Technology

41

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3-D W-band Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University43

Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

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Transceiver

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Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 34: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University33

Diameter 0888 mm

W-band reduced ring hybrid coupler

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University34

Reduced to 63 in area

Conventional Coupler

Diameter 1460 mm

Reduced Coupler

Diameter 0888 mm

Comparison of coupler sizes

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Coupling loss 435 dB Isolation -4823 dB

Transmission loss 444 dB Return loss below -25 dB (all port)

75 80 85 90 95 100 105 110

-60

-50

-40

-30

-20

-10

0

S-p

aram

eter

[dB]

Frequency [GHz]

S21Thru S31coupling S23Isolation

Insertion loss

70 75 80 85 90 95 100 105 110 115

-40

-30

-20

-10

0

S-pa

ram

eter

[dB]

Frequency [GHz]

S11 S22 S33

Return loss

Measurement result of W-band reduced ring hybrid coupler

Passive Device using DAML Technology

35

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Comparison of W-band hybrid ring coupler

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)Diameter

(mm)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 About 07 94

DAML -372 -335 -34 146 94

RSCDAML -444 -435 -4823 088 94

Passive Device using DAML Technology

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

36

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

(a) MIM coupling capacitor

(b) Stepped Impedance Perturbation

Novel W-Band Dual Mode Stepped Impedance Resonator BPF Using DAML Technology

(a) (b)

Journal of the Korean Physical Society vol 51 no 10 pp S280-S283 December 2007

Fabricated BPF

(b)

(a)

Passive Device using DAML Technology

37

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University38

60 65 70 75 80 85 90 95 100 105 110 115 120-40

-35

-30

-25

-20

-15

-10

-5

0

5

Inse

rtion

Los

s (d

B)

Frequency (GHz)

S11

S22

S21

S12

Simulation

Step Impedance Ratio 05

MIM Capacitor Size 75 microm2

Perturbation Length 275 microm

Measured Result of W-band BPF

- Insertion Loss 265 dB 97 GHz

- Relative Bandwidth 12

Passive Device using DAML Technology

38

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

60-GHz CPW-fed Dielectric-Resonator-Above-Patch

Antenna for Broadband WLAN Applications Using DAML Technology

Microwave and Optical Technology Letters vol 49 Issue 8 pp 1859-1861 2005

Passive Device using DAML Technology

39

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Fabricated Antenna

(a) Fabricated patch using DAML

(b) 60 GHz RDRA

(c) Proposed antenna

(d) Antenna integrated by 60 GHz VCO

Passive Device using DAML Technology

40

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measured Results

Passive Device using DAML Technology

41

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University42

3-D W-band Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University43

Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 35: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University34

Reduced to 63 in area

Conventional Coupler

Diameter 1460 mm

Reduced Coupler

Diameter 0888 mm

Comparison of coupler sizes

Passive Device using DAML Technology

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Coupling loss 435 dB Isolation -4823 dB

Transmission loss 444 dB Return loss below -25 dB (all port)

75 80 85 90 95 100 105 110

-60

-50

-40

-30

-20

-10

0

S-p

aram

eter

[dB]

Frequency [GHz]

S21Thru S31coupling S23Isolation

Insertion loss

70 75 80 85 90 95 100 105 110 115

-40

-30

-20

-10

0

S-pa

ram

eter

[dB]

Frequency [GHz]

S11 S22 S33

Return loss

Measurement result of W-band reduced ring hybrid coupler

Passive Device using DAML Technology

35

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Comparison of W-band hybrid ring coupler

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)Diameter

(mm)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 About 07 94

DAML -372 -335 -34 146 94

RSCDAML -444 -435 -4823 088 94

Passive Device using DAML Technology

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

36

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

(a) MIM coupling capacitor

(b) Stepped Impedance Perturbation

Novel W-Band Dual Mode Stepped Impedance Resonator BPF Using DAML Technology

(a) (b)

Journal of the Korean Physical Society vol 51 no 10 pp S280-S283 December 2007

Fabricated BPF

(b)

(a)

Passive Device using DAML Technology

37

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University38

60 65 70 75 80 85 90 95 100 105 110 115 120-40

-35

-30

-25

-20

-15

-10

-5

0

5

Inse

rtion

Los

s (d

B)

Frequency (GHz)

S11

S22

S21

S12

Simulation

Step Impedance Ratio 05

MIM Capacitor Size 75 microm2

Perturbation Length 275 microm

Measured Result of W-band BPF

- Insertion Loss 265 dB 97 GHz

- Relative Bandwidth 12

Passive Device using DAML Technology

38

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

60-GHz CPW-fed Dielectric-Resonator-Above-Patch

Antenna for Broadband WLAN Applications Using DAML Technology

Microwave and Optical Technology Letters vol 49 Issue 8 pp 1859-1861 2005

Passive Device using DAML Technology

39

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Fabricated Antenna

(a) Fabricated patch using DAML

(b) 60 GHz RDRA

(c) Proposed antenna

(d) Antenna integrated by 60 GHz VCO

Passive Device using DAML Technology

40

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measured Results

Passive Device using DAML Technology

41

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University42

3-D W-band Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University43

Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

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Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 36: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Coupling loss 435 dB Isolation -4823 dB

Transmission loss 444 dB Return loss below -25 dB (all port)

75 80 85 90 95 100 105 110

-60

-50

-40

-30

-20

-10

0

S-p

aram

eter

[dB]

Frequency [GHz]

S21Thru S31coupling S23Isolation

Insertion loss

70 75 80 85 90 95 100 105 110 115

-40

-30

-20

-10

0

S-pa

ram

eter

[dB]

Frequency [GHz]

S11 S22 S33

Return loss

Measurement result of W-band reduced ring hybrid coupler

Passive Device using DAML Technology

35

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Comparison of W-band hybrid ring coupler

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)Diameter

(mm)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 About 07 94

DAML -372 -335 -34 146 94

RSCDAML -444 -435 -4823 088 94

Passive Device using DAML Technology

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

36

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

(a) MIM coupling capacitor

(b) Stepped Impedance Perturbation

Novel W-Band Dual Mode Stepped Impedance Resonator BPF Using DAML Technology

(a) (b)

Journal of the Korean Physical Society vol 51 no 10 pp S280-S283 December 2007

Fabricated BPF

(b)

(a)

Passive Device using DAML Technology

37

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University38

60 65 70 75 80 85 90 95 100 105 110 115 120-40

-35

-30

-25

-20

-15

-10

-5

0

5

Inse

rtion

Los

s (d

B)

Frequency (GHz)

S11

S22

S21

S12

Simulation

Step Impedance Ratio 05

MIM Capacitor Size 75 microm2

Perturbation Length 275 microm

Measured Result of W-band BPF

- Insertion Loss 265 dB 97 GHz

- Relative Bandwidth 12

Passive Device using DAML Technology

38

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

60-GHz CPW-fed Dielectric-Resonator-Above-Patch

Antenna for Broadband WLAN Applications Using DAML Technology

Microwave and Optical Technology Letters vol 49 Issue 8 pp 1859-1861 2005

Passive Device using DAML Technology

39

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Fabricated Antenna

(a) Fabricated patch using DAML

(b) 60 GHz RDRA

(c) Proposed antenna

(d) Antenna integrated by 60 GHz VCO

Passive Device using DAML Technology

40

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measured Results

Passive Device using DAML Technology

41

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University42

3-D W-band Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University43

Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

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Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

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Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

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Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 37: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Comparison of W-band hybrid ring coupler

CaseTransmission

loss (dB)Coupling loss

(dB)Isolation

(dB)Diameter

(mm)

Centerfrequency

(GHz)

1(CPW) About -55 About -47 About -30 About 07 94

DAML -372 -335 -34 146 94

RSCDAML -444 -435 -4823 088 94

Passive Device using DAML Technology

Reference 1 Hiroyuki Matsuura et al IEEE MTT-S Digest 1996 pp 389-392

36

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

(a) MIM coupling capacitor

(b) Stepped Impedance Perturbation

Novel W-Band Dual Mode Stepped Impedance Resonator BPF Using DAML Technology

(a) (b)

Journal of the Korean Physical Society vol 51 no 10 pp S280-S283 December 2007

Fabricated BPF

(b)

(a)

Passive Device using DAML Technology

37

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University38

60 65 70 75 80 85 90 95 100 105 110 115 120-40

-35

-30

-25

-20

-15

-10

-5

0

5

Inse

rtion

Los

s (d

B)

Frequency (GHz)

S11

S22

S21

S12

Simulation

Step Impedance Ratio 05

MIM Capacitor Size 75 microm2

Perturbation Length 275 microm

Measured Result of W-band BPF

- Insertion Loss 265 dB 97 GHz

- Relative Bandwidth 12

Passive Device using DAML Technology

38

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

60-GHz CPW-fed Dielectric-Resonator-Above-Patch

Antenna for Broadband WLAN Applications Using DAML Technology

Microwave and Optical Technology Letters vol 49 Issue 8 pp 1859-1861 2005

Passive Device using DAML Technology

39

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Fabricated Antenna

(a) Fabricated patch using DAML

(b) 60 GHz RDRA

(c) Proposed antenna

(d) Antenna integrated by 60 GHz VCO

Passive Device using DAML Technology

40

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measured Results

Passive Device using DAML Technology

41

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3-D W-band Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University43

Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

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Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

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Introduction

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IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

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Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

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Transceiver

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Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

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Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 38: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

(a) MIM coupling capacitor

(b) Stepped Impedance Perturbation

Novel W-Band Dual Mode Stepped Impedance Resonator BPF Using DAML Technology

(a) (b)

Journal of the Korean Physical Society vol 51 no 10 pp S280-S283 December 2007

Fabricated BPF

(b)

(a)

Passive Device using DAML Technology

37

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University38

60 65 70 75 80 85 90 95 100 105 110 115 120-40

-35

-30

-25

-20

-15

-10

-5

0

5

Inse

rtion

Los

s (d

B)

Frequency (GHz)

S11

S22

S21

S12

Simulation

Step Impedance Ratio 05

MIM Capacitor Size 75 microm2

Perturbation Length 275 microm

Measured Result of W-band BPF

- Insertion Loss 265 dB 97 GHz

- Relative Bandwidth 12

Passive Device using DAML Technology

38

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

60-GHz CPW-fed Dielectric-Resonator-Above-Patch

Antenna for Broadband WLAN Applications Using DAML Technology

Microwave and Optical Technology Letters vol 49 Issue 8 pp 1859-1861 2005

Passive Device using DAML Technology

39

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Fabricated Antenna

(a) Fabricated patch using DAML

(b) 60 GHz RDRA

(c) Proposed antenna

(d) Antenna integrated by 60 GHz VCO

Passive Device using DAML Technology

40

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measured Results

Passive Device using DAML Technology

41

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University42

3-D W-band Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University43

Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 39: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University38

60 65 70 75 80 85 90 95 100 105 110 115 120-40

-35

-30

-25

-20

-15

-10

-5

0

5

Inse

rtion

Los

s (d

B)

Frequency (GHz)

S11

S22

S21

S12

Simulation

Step Impedance Ratio 05

MIM Capacitor Size 75 microm2

Perturbation Length 275 microm

Measured Result of W-band BPF

- Insertion Loss 265 dB 97 GHz

- Relative Bandwidth 12

Passive Device using DAML Technology

38

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

60-GHz CPW-fed Dielectric-Resonator-Above-Patch

Antenna for Broadband WLAN Applications Using DAML Technology

Microwave and Optical Technology Letters vol 49 Issue 8 pp 1859-1861 2005

Passive Device using DAML Technology

39

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Fabricated Antenna

(a) Fabricated patch using DAML

(b) 60 GHz RDRA

(c) Proposed antenna

(d) Antenna integrated by 60 GHz VCO

Passive Device using DAML Technology

40

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measured Results

Passive Device using DAML Technology

41

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University42

3-D W-band Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University43

Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

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Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 40: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

60-GHz CPW-fed Dielectric-Resonator-Above-Patch

Antenna for Broadband WLAN Applications Using DAML Technology

Microwave and Optical Technology Letters vol 49 Issue 8 pp 1859-1861 2005

Passive Device using DAML Technology

39

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Fabricated Antenna

(a) Fabricated patch using DAML

(b) 60 GHz RDRA

(c) Proposed antenna

(d) Antenna integrated by 60 GHz VCO

Passive Device using DAML Technology

40

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measured Results

Passive Device using DAML Technology

41

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University42

3-D W-band Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University43

Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

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Transceiver

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Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

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Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

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Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 41: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Fabricated Antenna

(a) Fabricated patch using DAML

(b) 60 GHz RDRA

(c) Proposed antenna

(d) Antenna integrated by 60 GHz VCO

Passive Device using DAML Technology

40

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measured Results

Passive Device using DAML Technology

41

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University42

3-D W-band Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University43

Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 42: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measured Results

Passive Device using DAML Technology

41

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University42

3-D W-band Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University43

Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

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Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 43: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University42

3-D W-band Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University43

Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 44: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University43

Mixer with DAML coupler

Design strategy

MEMS coupler

MEMS library

Diode amp CPW lines

MMIC library

Schematic

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 45: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University44

Layout

Ring coupler based on DAML

70 nm gate

MHEMT

RF

IF2

LO

IF1

Dielectric post

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 46: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University45

For the lowest reflection of DAML Distance of Airbridge to DAML 90 ~ 150 microm

Interference of DAML and CPW lines

Single Balanced Active Mixer

DAML

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 47: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University46

Process flow of the single balanced mixer

GaAs epi-wafer

Semi-insulating GaAs substrate

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

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Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 48: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University47

MHEMT

Semi-insulating GaAs substrate

Mesa etching

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

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Transceiver

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Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

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Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

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Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

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Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 49: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University48

Semi-insulating GaAs substrate

MHEMT

Ohmic contact formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

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Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 50: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University49

ResistorMHEMT

Semi-insulating GaAs substrate

Resistor formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

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Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 51: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University50

MHEMT Resistor

Semi-insulating GaAs substrate

70 nm gate patterning narrow recess and gate metalization

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

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Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 52: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University51

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

First metal formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

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Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 53: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University52

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) deposition

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 54: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University53

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (Si3N4) RIE

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 55: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University54

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Second metal (air-bridge) formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 56: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University55

MHEMT Resistor Capacitor CPW GroundGround

Semi-insulating GaAs substrate

Dielectric (polyimide) post formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

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Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 57: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University56

MHEMT Resistor Capacitor CPW GroundGround

Hybrid ring coupler based on DAML

Semi-insulating GaAs substrate

DAML formation

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

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Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

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Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 58: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University57

70 nm MHEMT

Hybrid ring coupler

IF1 IF2

RF

LO

Chip size

18 mm times 21 mm

External balun for IFrsquos

W-band coupler size

146 mm (diameter)

Fabricated single balanced mixer

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

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Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

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Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

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Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 59: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University58

Conversion loss vs LO input power

Conversion loss25 dB

- RF frequency 94 GHz

- LO frequency 942 GHz

- RF power -10 dBm

- LO power 6 dBm

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

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Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

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Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 60: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University59

LO-to-RF isolation

LO-to-RF isolation

- LO power 0 dBm

lt -30 dB

- LO freq 9365-9425 GHz

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 61: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University60

Comparison of W-band mixers (1)

CaseMixer Design

FeaturesConversion

Gain (dB)Device

Technology

LOFrequency

(GHz)

RFFrequency

(GHz)

RF-LOIsolation

(dB)

1 SE active mixer 08 01 microm InP HEMT 94 945 -

2 SB resistive mixer -8 01 microm InP HEMT 83 94 -27

3 SB resistive mixer -128 01 microm GaAs PHEMT 93 932 -

4 SB diode mixer -75 01 microm GaAs PHEMT 93 94 -18

5 SB diode mixer -9 01 microm GaAs PHEMT 94 95 -

6 SB diode mixer -10 01 microm InP HEMT 94 945 -

Thiswork SB active mixer -25 70 nm GaAs MHEMT 942 94 -33

( SE Single Ended SB Single Balanced )

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

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Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

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Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 62: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University61

Comparison of W-band mixers (2)

- References

[1] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

[2] A R Barnes et al IEEE MTT-S Digest 2002 pp 1867-1870

[3] K W Chang et al IEEE Microwave and Guided Wave Letters vol 4 no 9 pp 301-302 1994

[4] K W Chang et al IEEE Transactions on Microwave Theory and Techniques vol 39 no 12 pp 1972-1979 1991

[5] K W Chang et al Proc IEEE Microwave and Millimeter-wave Monolithic Circuits Symposium 1993 pp 41-44

[6] Robinder S Virk et al IEEE MTT-S Digest 1997 pp 435-438

Single balanced active mixer

Low conversion loss high-performance 70 nm MHEMTs

High isolation hybrid ring coupler based on DAML

This work Sung Chan Kim et al IEEE Electron Device Letters vol 27 no 1 pp 28-30 2006

Single Balanced Active Mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

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Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 63: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Department of Electronics and Electrical Engineering Graduate School

Dongguk University

A transceiver module for FM-CW radar sensors using 94 GHz dot-type Schottky diode mixer

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

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Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 64: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University63

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 65: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University64

IntroductionMotivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 66: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University65

IntroductionPassive amp Active

Active system conceptAlso known as a radar (using oscillator)

Transmit a signal and receive scattered waveform

Detected unwanted objects

Need to large computational resources

Passive system conceptHigh Sensitivity receivers are required

Antenna aperture affects resolution and SNR

Direct measure of temperature (sub K accuracy)

Can detect objects through differences in emissivity

ObjectTransmitted

ReceivedFreq

T

ObjectThermal noiseVol

T

Objects also reflect the radiation emanating from the environment to a degree of reflectivity which is the complementof their emissivity the sum of the emissivity and the reflectivity is 1

Emissivity = radiation + reflectivity (from the natural background radiation)

Emissivity = radiation + reflectivity (from the signal source)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 67: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University66

InP Gunn Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 68: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Epi structure of InP Gunn diode

InP Gunn diodeEpi structure

67

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

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Transceiver

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Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

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Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

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Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 69: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

1 Wafer Cleaning

2 Formation of top side trench

InP Gunn diodeProcess flow 1~2

1) Initial cleaning

TCE

Acetone

IPA

DI water rinse

1)Photo resist (PR) coating

2)Soft baking

3)Alignment amp Exposure

4)Development

5)Post baking

6)Wet etching

7)PR strip

68

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 70: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Cathode ohmic metalization

4 Integral heat sink (IHS) patterning lithography

InP Gunn diodeProcess flow 3~4

1)Cleaning

2)Oxide etching

3)Metal evaporation

4)Protection layer

1) Cleaning

2) Photo resist (PR) coating

3) Soft baking

4) Alignment amp Exposure

5) Post Expose Baking

6) Development

69

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 71: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

5 2nd seed evaporation

6 2nd plating (formation of support layer)

InP Gunn diodeProcess flow 5~6

1)Cleaning

2)2nd seed evaporation

1) Au plating

70

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 72: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

7 Wafer thinning (lapping amp polishing)

8 Anode ohmic metalization

InP Gunn diodeProcess flow 7~8

1) Wafer mount

2) Lapping 640 um lapping

3) Wafer de-mount

4) Cleaning

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)Reverse baking

6)Flood exposure

7)Development

8)Oxide etching

9)Metal evaporation

10)Lift-off

71

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 73: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

9 Overlay metallization

10 MESA etching

InP Gunn diodeProcess flow 9~10

1)Seed evaporation

2)Photo resist (PR) coating

3) Soft baking

4) Alignment amp Pre-exposure

5) Development

6) Oxide etching

7) Au plating

8) PR strip

9) Seed etching

1)Cleaning

2)Photo resist (PR) coating

3)Soft baking

4)Alignment amp Exposure

5)PEB (post exposure bake)

6)Development

7)Hard baking

8)Dry etching

9)PR strip

72

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 74: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

11 Gold amp 2nd seed etching

(Cathode)

InP

anode

Fabricated InP Gunn diode

InP Gunn diodeProcess flow 11

1) Cleaning

2) Oxide etching

3) Au etching

73

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 75: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University74

Packaged Diode

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 76: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

StudAuSn solder

AgSn solderLid

Gunn diode chip

Ceramic ring

Au wire

3-48 UNC-2A THREAD

Package element

InP Gunn diodePackaging

75

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 77: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Ceramic ring1 Ceramic ring junction

Stud

(3-48 UNC-2A THREAD)

2 Die attachChip

InP Gunn diodePackage process 1~2

76

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 78: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

3 Maltese Cross BondingMaltese Cross

4 Lid junctionLid

InP Gunn diodePackage process 3~4

77

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 79: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

X-ray image of InP Gunn diode Packaged InP Gunn diode

InP Gunn diodePackaged Diode

78

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 80: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

DC I-V measurement result

InP Gunn diode chip Packaged InP Gunn diode

InP Gunn diodeDC characteristic

79

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 81: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Measurement results of packaged InP Gunn diode

Chip number Voltage [V] Current [mA] Oscillation frequency [GHz] Output Power [dBm]

1 124 299 94 178

2 117 260 9398 16

3 97 299 9425 156

4 109 349 939 166

5 93 349 938 164

Oscillation characteristics of fabricated InP Gunn diode

InP Gunn diodeRF characteristic

80

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 82: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University81

Transceiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University82

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 83: 20130723 research accomplishment_ud

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Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 84: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University83

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 85: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University84

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 86: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University85

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 87: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University86

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 88: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University87

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 89: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University88

Flip chip packaging configuration

Cross section Top view

Active Radar SensorFlip-chip

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 90: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University89

Active Radar SensorFlip-chip

(a) Gold bumps were then flattened using a flip-chip bonder of model M9 from LaurierTM at a press force of 100 gbump(b) epoxy can spread out evenly on them Flattened bump had a typical diameter of 100 μm and a height of 45 μm

(a) (b)

(c) (d)

(c) Silver epoxy was then applied onto the flattened gold bumps using a capillary tool with a 3-mil Au ribbon wire and a manual wire bonder of model 572A-40 from HybondTM The resulting bump had 23 μm of silver epoxy on top 45 μm of gold

(d) MMIC chip and the sapphire substrate were flip-chip bonded with the epoxy in between The M9 bonder was used with a bonding force of 30 gbump and a bonding time of 90 second at 110 degC Silver epoxy was compressed down to 5 μm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 91: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University90

75 80 85 90 95 100 105 110 115-35

-30

-25

-20

-15

-10

-5

0

S-pa

ram

eter

[dB

]

Frequency [dB]

Insertion loss Return loss

Reference Bump material Bonding condition Lossfrequency

[1] Au 350 20 gpillar 02 dB77 GHz

[2] Au 275 230 Nmm2 02 dBNA

This work Au Ag epoxy 110 30gbump 0205 dB94 GHz

Active Radar SensorRF Characteristic

[1] Aoki S Someta H Yokokawa S Ono K Hirose T Ohashi Y ldquoA flip chip bonding technology using gold pillars formillimeter-wave applicationsrdquo in Proc IEEE MTT-S Int Microw Symp Dig 1997 vol 2 pp 731-734 1997

[2] Heinrich W Jentzsch A Richter H ldquoFlip-chip interconnects for frequencies up to W bandrdquo Electron Lett vol 37 issue 3 pp180-181 2001

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 92: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University91

Active Radar SensorTest image

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 93: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University92

Reference Bump material Bonding temperature Die shear strength [mg 2]

[1] Indium

100 155

150 219

200 438

[2]ACP 220 105

ACF 220 107

[3] CuSn 260 217

This work AuAg epoxy 110 573

The shear tests were performed using a model 4000 series shear test machine from DageTM widely used to measure the interconnection strength between the MMIC chip and the sapphire substrate The speed of the shear blade was 300 μms with the tip located at 40 μm above the surface of the sapphire substrate The flip-chip bonded die which used proposed low-temperature flip-chip bonding method and 20 bumps of 100 μm diameter was separated at a force of 900 g

[1] Kun-Mo Chu Jung-Sub Lee Han Seo Cho Hyo-Hoon Park Duk Young Jeon ldquoA fluxless flip-chip bonding for VCSEL arrays usingsilver-coated indium solder bumpsrdquo IEEE Trans Electronics Packag Manuf vol 27 no 4 pp 246-253 2004

[2] Tan Ai Min Sharon Pei-Siang Lim and Charles Lee ldquoDevelopment of solder replacement flip chip using anisotropic conductiveadhesivesrdquo in Proc 5th Electron Packag Tech Conf 2003 pp 390-396 2003

[3] Katsuyuki Sakuma Jun Mizuno Noriyasu Nagai Naoko Unami and Shuichi Shoji ldquoEffects of Vacuum Ultraviolet SurfaceTreatment on the Bonding Interconnections for Flip Chip and 3-D Integrationrdquo IEEE Trans Electronics Packag Manuf vol 33 no 3pp 212-220 2010

Active Radar SensorShear test

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 94: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University93

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 95: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University94

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 96: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

Taejong Baek

Advisor Jin-Koo RheeDepartment of Electronics and Electrical Engineering

Graduate SchoolDongguk University

Studies of the Millimeter-Wave Radiometric Sensor and Fabricated Passive Imaging System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 97: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University96

Introduction

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 98: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University97

Introduction

The increased threats of criminal or terrorist action in recent years have led to the development of many techniques forthe detection of concealed weaponscontraband explosives or other threats

Traditional methodMetal detectors

X-ray imaging systems

Insufficient for modern and health threatsPlastic and liquid explosive

Plastic or ceramic guns and knives

Ionizing radiation

Advanced methodMillimeter-waveterahertz security systems

Motivation

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 99: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University98

IntroductionPrivate issue

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 100: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University99

Radiation law

Every object generates electromagnetic emissions at all wavelengths with intensity proportional to the product of itsphysical temperature and its emissivity in accordance with Plancks radiation law

Object Emissivity ()

Human skin 65 ~ 95

Plastics 30 ~ 70 depending on type

Paper 30 ~ 70 depending on moisture content

Ceramics 30 ~ 70

Water 50

Metal ~ 0

Object radiationObject emissivity + reflectivity (reflect the radiation form the environment) = 1

Radiation = Object reflectivity + Object emissivity

Both the amplitude and the wavelength of the radiation peak are dependent on the temperature of the object

Background and Theory

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 101: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University100

Target SpecificationSystem Arrangement

Realndashtime (ge 1 Hz) imaging (82 GHz to 102 GHz )

Spatial resolution (le 5 cm2)

1degC temperature resolution at (ge 1 Hz)

Fullndashbody scanning (3m stand-off )

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 102: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University101

Noise equivalent temperature difference (∆푻)The minimum detectable change in signal at the input is equal to the noise power at the output times the reciprocal of the squared response of the system evaluated at Tsys Sometimes radiometric resolution is referred to as the noise equivalent temperature difference ie ldquoNETDrdquo or sensitivity

∆푻 =푻풔풚풔∆풇흉

Whole imaging measurement time (t) the number of detector (n) and total number of picture point (m)

흉 =풕풏풎

number of samplings (sn) reflector scanning cycle time (rt)

풕 =풎

풏 times 풔풏풓풕

NETDSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 103: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University102

Total number of picture point (m)풎 = ퟏퟐퟖ timesퟏퟔ = ퟐퟎퟒퟖ풑풐풊풏풕

whole imaging measurement time (t)

풕 =풎

풏times 풔풏풓풕=

ퟐퟎퟒퟖ

ퟏퟔ timesퟏퟐퟖퟏ= ퟏ풔풄풆풏풆풔풆풄

in this case integration time (흉) is

흉 =풕풏풎

=ퟏퟔퟐퟎퟒퟖ

= ퟕ ퟖ풎풔풆풄풓풆풄풆풊풗풆풓

Integration TimeSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 104: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University103

Radiometer input signal (thermal noise) power

푷풅푩풎 = ퟏퟎ 풍풐품(풌푩푻times 1000)+10 퐥퐨퐠(∆풇)

where Δf is the bandwidth in hertz (set 20 GHz)

푷풅푩풎 = minusퟏퟕퟒ + ퟏퟎퟑ asymp minusퟕퟎ풅푩풎

Lens concentrate thermal noise ratio (dB)

푳풆풏풔풂풑풆풓풕풖풓풆풂풓풆풂푨풏풕풆풏풏풂풂풑풆풓풕풖풓풆풂풓풆풂

times 풔풉풂풑풆풎풂풕풄풉 = 10dB

Hence a gain of 70 dB at least is required to provide at the output a detectable signal (ge0 dBm) The total input thermal noise is through the lens is ndash70 dBm + 10 dB = ndash60 dBm Therefore we need an amplifier of least 60 dB or more gain

Noise TemperatureSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 105: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University104

Basic radiometer model

The system noise temperature at the receiver input is Tsys= TA+ Trec

∆푻 =푻풔풚풔∆풇흉

where Trec is the noise temperature of the detector TA is the effective temperature of the antenna Δf is the RF bandwidth and τ is thepost-detection integration time constant

System elements to be considered for high performance

1 Antenna return loss

2 LNA return loss noise figure

3 Frequency bandwidth of each element

4 Transition return loss insertion loss

5 Diode noise temperature

System RequirementRequirements

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 106: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University105

Component Parameter Target Specification

System

NETD (ΔT)ResolutionFrame RateBandwidth (Δf)Noise figure

le 1 Kle 5 cm1 scenesec20 GHzle 15 dB

LNANoise figureGainReturn loss

le 10 dBge 60 dB

le ndash15 dB

AntennaGainReturn lossVSWR

ge 15 dBi

≦ ndash25 dB≦ 12

DetectorOutput voltage rangeSensitivity

100 mV ~ 1000 mVgt 500 mVmW (0 dBm)

Radiometer Type System Characteristics

Dickeradiometer

Super heterodyne receiver

superior low noise temperaturecomplicated structureneed local oscillatorhigh cost

Full powerradiometer

Directndashdetection receiverlow noise temperaturesimple structurelow power consumption

Target SpecificationSystem Arrangement

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 107: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University106

Development of Radiometer Receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 108: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University107

An antenna with a large aperture has more gain than a smaller on just as it captures more energy from a passing radio wave it also radiates more energy in that direction Gain may be calculated as

푮풅푩풊 = ퟏퟎ 퐥퐨퐠 휼ퟒ흅흀ퟐ

with reference to an isotropic radiator ƞ is the efficiency of the antenna and A is the aperture area

Antenna is designed to have the peak gain of 175 dBi at the center frequency of 94 GHz and the return loss of less than -25 dB in W-band and the small aperture size of 6 mm times 9 mm for antenna configuration with high resolution

AntennaGain

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 109: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University108

Returnlossisameasureofthereflectedpowerandforwardpowerratio

푹풆풕풖풓풏푳풐풔풔 풅푩 = minusퟐퟎ 퐥퐨퐠푺푾푹minus ퟏ푺푾푹+ ퟏ

Specification

Frequency range (GHz) 75 ~ 110

Waveguide type WR-10

VSWR (max) 11

Mid-band Gain (dB Typ) 175

Total Length (L) 32

Aperture size (W times H) mm2 9 times 6

AntennaEfficiency

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 110: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University109

Antenna ndash array for multi-channel

Multi-channel antenna array To obtain high accuracy and resolution various methods areproposed Conventional beamforming method is a straight forwardmethod but its angle resolution is limited by aperture of the antennaarray which implies that the number of antennas should be increasedto satisfy resolution requirement 8 times 2 horn arrays antennadeveloped for available real-time passive imaging system

Antenna

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 111: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University110

Specifications

Frequency89 GHz ~ 99 GHz

(center frequency 94 GHz)

Center wavelength 3191 mm(c=υλ)

Diameter le 200 mm

Material Teflon

Viewing angle plusmn113deg(target distance 3m)

LensLens - specification

Optical path and spot-patterns for different incident angles are calculated and compared without or with an extended hemispherical lens by using ray-tracing method

Teflon was the material of the lens the lens is reflected from the surface of the lens is placed in the hole In addition depth of non-reflective layer is 066 mm pitch 07 mm and groove length 04 mm

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 112: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University111

LNA ndash OscillationSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 113: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University112

80 85 90 95 100 105 110

-80

-60

-40

-20

0

20

40

60

80

S-Pa

ram

eter

[dB

]

Frequency [GHz]

S11

S21

S12

S22

LNA module ndash 4-stage

4-stage LNA module measured characteristics

Average linear gain 658 dB 81 ~ 102 GHz

682 dB 94 GHz

LNA

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 114: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University113

Detector ndash TransitionSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 115: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University114

Detector ndash OutputSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 116: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University115

Size ndash Array SystemSystem Specification

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 117: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University116

Radiometer

16 receivers array multi-channel radiometer

Radiometer Receiver

radiometer receiver

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 118: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University117

Development of Security Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 119: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University118

System block diagramSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 120: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University

24V15V 12V 5V 33V 33V

ACG

Power2

(Floating)

Power2

(Floating)

Power2

(Floating)

DirectLine

(Floating)

NTSC

CAM

IR

CAM

DC

Cont

FAN

NTSC Signal

(with Ground)

IR Signal

(with Ground)

DC 12VDC 12V

DC 12V

DC 12V

EmbeddedSystem

DC 5VSerial to USB

RS232 USB To PC

(with Ground)

Step motor DriverControl signal

Step

Motor

DC 24V

Encoder

MMW Sensor

USB To PC

(with Ground)

Drain

Gate

DC 15V

+ - G AC+ - G AC+V -V FG L N LNG Com V2 Com V1

AC GKeyboard

Mouse USB

VGA

WiFi

CAM1

CAM2

MonitorTo Sensor Part

(with Ground)

To Sensor Part

(with Ground)

+V-V FG ACAC

DirectLine

(Floating)

Sensor part

PC part

Power part

DC 15V

DC 5V

G

FG FG

G

ADC1~16 Ch

G

Shield box

Circuit mapSecurity Screening System

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 121: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University120

Measurement SWSecurity Screening System

Ch-1 Ch-2

Ch-3 Ch-4

Ch-5 Ch-6

Ch-7 Ch-8

Ch-9 Ch-10

Ch-11 Ch-12

Ch-13 Ch-14

Ch-15 Ch-16

CCD IR

16 m

(variable pixel)

06 m (16 pixel)

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 122: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University121

Comparison with Commercial MMW Imaging

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 123: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University122

Name L3 safeviewprovision100

Agilent Qinetiq Smiths Tadar

Sago Trex BrijotBIS-WDS

ThruVisionT4000

This Work

base SPO 20 ST150 Real Time Imager

Application Portal Portal Portal Stand-off8 ndash 30m

Portal Stand-off5m

Stand-off Stand-off3-10m

Stand-off3-10m

Stand-off3m

ActivePassive

Active Active Passive Passive PassiveActive

Passive Passive Passive Passive Passive

Frequency(Bandwidth)

24-30GHz 24GHz 35GHz 94GHz 94GHz(gt 10GHz)

76-94GHz 76-94GHz 90GHz(20 GHz)

250GHz 94GHz(10 GHz)

ImagingSystem

Source ampReceiverarray rotates around subject

Active antenna array programm-able fresnelzone-plate

Folded Schmidtcamera conical scan off-axis rotating mirror

Mechanical Tilted rotatingmirror

Frequency scanned antenna and reflector

Phased array of freqscanned antennas

Receiverarray of multi-channelscannedantennasand reflector

Receivers 1 64 64 24 1 232 16 16

Receivertechnology

InPMMIC

InP Direct detection

InPHEMT MMIC

GaAsSchottkymixer

GaAs Direct detection (z-b Schottkydiode)

SystemNETD

5K 1K 1-3K 6K 1K 1-15K le 2K

SpatialResolution

05cm 05cm 075cm2cm

03degree 10mm 6mrad 6mrad128times192pixel

5cm 3cm gt45 cm16times128 pixel(variable)

Refresh rate 2Hz 15Hz 15Hz 10HZ 05Hz 30Hz 4-10Hz 1-3Hz 1Hz

Aperture 90cm 80cm 60cm 18cm 12cm 20cm

DimensionsL times W times H

150 times 150 times 270

90 times 10 times 90

250 times 160 times 220

71 times 33 times 48

50 times 50 times110

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 124: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University123

Specification Brijot (indoor) This work (indoor)

Center Frequency 90 94

Bandwidth (Δf) 20 10

No of Receiver 16 16

System NETD (ΔT) 1 K le 2 K

Spatial Resolution 5 cm 5 cm

Image Quality clearly noisily

Reflesh Rate 4 ~ 10 Hz 1 Hz

∆푻 =푻풔풚풔

ퟏퟎ ∙ ퟏퟎퟗ timesퟕ ퟖ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟐ푲times ퟖퟖퟑퟏ = ퟏퟕퟔퟔퟑ푲

푻풔풚풔 = ퟏ푲times ퟖퟖퟑퟏ = ퟖퟖퟑퟏ푲

∆푻 =푻풔풚풔

ퟐퟎ ∙ ퟏퟎퟗ timesퟏ ퟗ ∙ ퟏퟎ ퟑ 푻풔풚풔 = ퟏ푲 times ퟔퟏퟔퟒ = ퟔퟏퟔퟒ푲

Our system

Brijot

DiscussionSystem Noise Temperature

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 125: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University124

Video Demo

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 126: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University125

Video Demo2011 01 31

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 127: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University126

Conclusion

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2

Page 128: 20130723 research accomplishment_ud

Semiconductor amp Integrated Circuit Lab Millimeter-wave INnovation Technology research center Dongguk University127

ConclusionSummary

Passive Imagingsensor

Antenna Frequency Waveguide type VSWR (max) Mid-band Gain Return loss Size

77 ~ 110 GHz WR-10 11 175 dBi lt - 25 dB 9 times 6 times 32 mm

LNA module Frequency Gain (1st) Returen Loss (1st)

Gain (4st) Returen Loss (4st)

Noise Figure (Chip)

82 ~ 102 GHz 196 dB -11 dB 658 dB -57 dB 41 dB

Detector module

Frequency Operation range

Output voltage Minimum detectable

power

Sensitivity (input 0 dBm)

75 ~ 110 GHz -10 ~ 15 dBm 100 ~ 1500 mV -20 dBm 350~400 mVmW

Securityscreening

System NETD Spatial resolution

Refresh rate ReflectorScan angle

MMW lens diameter

2K 4cm 1Hz plusmn 20 deg 20 cm

Type 82~102 GHz Passive imaging (indoor)

Bandwidth 20 GHz

Dimension (cm) 50 times 50 times 110

IR and CCD image fusion

Spatial resolution 45 cm (16 times 128 pixel)

Temperature sensitivity 2