Post on 20-Dec-2015
EPIC MOS Life Test Facility• The centre of the central CCD in the MOS cameras is showing damage –
Andy Read et al.• This damage causes low energy redistribution changes • Enhanced dark current at raised temperatures has been seen in CCDs
illuminated with a focussed beam at the Panter facility (EPIC EOBB and Swift XRT)
• Have so far not been able to detect the low energy redistribution in these devices
• Need to replicate conditions in orbit – possibly by keeping device cold over an extended period
• Need to focus X-rays onto one spot for months at a time and regularly calibrate on and off spot
• We are producing at Leicester a dedicated facility based on an existing test facility with X-ray source and focussing with a micro-channel plate optic
• A vacuum bellows arrangement allows accurate focussing• The optic can be remotely moved out of the beam for flat field calibration