EPIC MOS Life Test Facility• The centre of the central CCD in the MOS cameras is showing damage –

Andy Read et al.• This damage causes low energy redistribution changes • Enhanced dark current at raised temperatures has been seen in CCDs

illuminated with a focussed beam at the Panter facility (EPIC EOBB and Swift XRT)

• Have so far not been able to detect the low energy redistribution in these devices

• Need to replicate conditions in orbit – possibly by keeping device cold over an extended period

• Need to focus X-rays onto one spot for months at a time and regularly calibrate on and off spot

• We are producing at Leicester a dedicated facility based on an existing test facility with X-ray source and focussing with a micro-channel plate optic

• A vacuum bellows arrangement allows accurate focussing• The optic can be remotely moved out of the beam for flat field calibration

X-Ray Beam Test of MCP

Cut through PSF

Facility pictures

Camera and Electronics