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ATML Status
April 2008Issue 15
An overview of the ATML activity in the ATML focus group and as part of the IEEE
SCC20 sub-committees
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ATML• ATML’s mission is to define a collection of XML-based schemas that
allows ATE and test information to be exchanged in a common format adhering to the XML standard
• ATML defines a framework through which different architectures using XML can be implemented. – defines the components from which users can build their architectures,
whilst being interoperable with other compliant architectures.– Show examples of the net centric services by which this information can
be exchanged across different ATS platforms as part of a maintenance process.
– defines the XML format that these elements.• The ATML specifications will define:
– How to define XML schemas that represent ATE and test information.– A set of XML schemas supporting the exchange of specific ATE and
test information.• The ATML specifications will support:
– services that can be used for exchanging ATE and test information in a distributed net-centric environment.
– services supporting the exchange of specific ATE and test information in specific common areas.
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ATMLATML Overview and ArchitectureIEEE Std 1671-2006
Test Station (1671.6)
Instrument Description (1671.2)
Test Adapter (1671.5)
Test Configuration IEEE Std 1671.4-2008
Test Description (1671.1)
SIMICA Test Results and Session InformationIEEE Std 1636.1-2007
Diagnostics: AI-ESTATEIEEE Std 1232-2002
SIMICA Maintenance Action Information
(1636.2)
UUT Description IEEE Std 1671.3-2008
ATML Common, HardwareCommon, TestEquipment, and Capabilities (1671)
Key:
In IEEE Ballot Process
Draft of the Standard
Standard approved by the IEEE
Errata to Standard approved by the IEEE
Draft revision of a standard
Started
Signal Descriptions: STDIEEE Std 1641-2004
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SCC20 & ATML Organisations
• The IEEE SCC20 is the standards organisation through which the ATML components (i.e. schemas and documentation) will be published under various IEEE standards.
• The ATML organisation is an open, independent focus group contributed to by the ATE industry and government agencies to advance the common exchange of test information through the use of XML.– The ATML group provides draft schemas and associated
documents, examples, use cases, requirements and conducts trial use of any ATML components.
– Their findings are submitted to the various SCC20 sub-committees and working groups to advance the IEEE standards associated with the ATML components.
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SCC20 Organisation for 2008
Common, HardwareCommon,
TestEquipment
Key:
Synthetic Instruments:UpConverter,
DownConverter,ARB, Digitizer
Capabilities
SCC20Steering and Administrative
Chair: Mike Seavey (Northrop Grumman)Vice Chair: John Sheppard (Johns Hopkins University)
Secretary: Dave Droste (DRS-TEM)
LiaisonsJohn Sheppard (CS), Joe Stanco & Mark Kaufman (I&M),
Joe Stanco (AES), Bill Ross (DoD), Malcolm Brown (MoD), Les Orlidge (NDIA)
Administrative (ADMIN)Les Orlidge (AAI)
John Sheppard (Johns Hopkins University)
Hardware Interfaces (HI)Co-Chair: Mike Stora (SysIntech)
Co-Chair: Dave Droste (DRS-TEM)Secretary: Dave Droste (DRS-TEM)
Diagnostic and Maintenance Control (DMC)Co-Chair: Tim Wilmering (Boeing)
Co-Chair: Mark Kaufman (NWSC/Corona)Secretary: John Sheppard (Johns Hopkins
University)
Test and ATS Description (TAD)Co-Chair: Ashley Hulme (EADS)
Co-Chair: Ion Neag (Reston Software)Secretary:
Test Information Integration (TII)Co-Chair: Teresa Lopes (Teradyne)Co-Chair: Chris Gorringe (EADS)
Secretary: John Ralph (Northrop Grumman)
IEEE-1505Receiver Fixture Interface
(RFI)
IEEE-P1505.1Common Test Interface Pin
Map
IEEE-1522Testability and Diagnosability
IEEE-1232AI-ESTATE
IEEE-P1636SIMICA
IEEE-1636.1Test Results and Session
Information
IEEE-P1636.2MAI
IEEE-1546DTIF Guide
IEEE-1445DTIF
IEEE-1641STD
IEEE-716C/ATLAS
IEEE-771Guide to the use of ATLAS
IEEE-1641.1Guide to the use of STD
IEEE-P1671.1Test Description
IEEE-P1671.2Instrument Description
IEEE-1671ATML Overview and
Architecture
IEEE-1671.3UUT Description
IEEE-1671.4Test Configuration
IEEE-P1671.5Test Adapter
IEEE-P1671.6Test Station
ATML Component
Errata
Synthetic Instrument Annexes
IEEE-P1505.22-Tier RFI
IEEE Staff LiaisonSoo H. Kim (S.H.Kim@IEEE.ORG)
Pins, Ports & Connectors
Proposed ATML Users Guide
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ATML’s 2008 Objectives & Goals
• To have the P1671.2 (Instrument Description) Trial-Use Standard:– complete the formal ballot process by May 2008– to submit as a trial-use standard by Q3 2008
• To have the P1671.5 (Test Adapter) Trial-Use Standard:– complete the formal ballot process by Jul 2008– to submit as a trial-use standard by Q3 2008
• To have the P1671.6 (Test Station) Trial-Use Standard:– complete the formal ballot process by Jul 2008– to submit as a trial-use standard by Q3 2008
• To have the P1671.1 (Test Description) Trial-Use Standard:– written, reviewed and to start the formal ballot process by May 2008– Ready for publication Dec 2008– to submit as a trial-use standard by Q5 2008
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ATML’s 2008 Objectives & Goals (cont)
• Review associated candidate schemas for all ATML components– Q1
• Signal Description (STD - 1641) Errata v2
– Q3 • Update 1671-2006 & errata for draft full use standard
– Q4• Signal Description (STD - 1641) Dec 2008 Start Ballot• Review All IEEE Std 1671 ATML Components (P1671.1 thru
P1671.6 & P1636.1) in line with 1671 draft Full Use Standard
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Standards & Schema Revisions (1 of 2)
Project or Standard
Project or Standard Number
Document & Draft Number XML Schema Name
XML Schema Version Number
Common.xsd 2.01 (Note 1,3)HardwareCommon.xsd 2.02 (Note 1,3)
TestEquipment.xsd 0.16 (Note 3)Errata: Annex C
Draft 1.1Capabilities.xsd 0.04 (Note 2,3)
ATML Test Description
P1671.1 P1671.1 Draft 0.4 TestDescription.xsd 0.16
InstrumentDescription.xsd 0.25InstrumentInstance.xsd 0.04
UUTDescription.xsd 1.01UUTInstance.xsd 1.00
ATML Test Configuration
IEEE Std 1671.4™-2008
- TestConfiguration.xsd 1.01
TestAdapterDescription.xsd 0.10TestAdapterInstance.xsd 0.08
TestStationDescription.xsd 0.10TestStationInstance.xsd 0.08
IEEE Std 1671™-2006
ATML Overview and Architecture
Errata: Annex B Draft 10
P1671.5 Draft 5P1671.5ATML Test Adapter
P1671.6 Draft 5P1671.6ATML Test Station
P1671.2 Draft 8P1671.2ATML Instrument
DescriptionATML UUT Description
IEEE Std 1671.3™-2008
-
indicates project is a published standardindicates project is in the ballot process
Note 3: Annex B & C will be handled as Errata until next publication (~Jan 2009)
Note 1: Schema version 1.01 is posted on the IEEE download site (as of May 2007)Note 2: Capabilities will be included in next publication (~Jan 2009)
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Standards & Schema Revisions (2 of 2)
Project or Standard
Project or Standard Number
Document & Draft Number XML Schema Name
XML Schema Version Number
SIMICA Test Results and Session Information
IEEE Std 1636.1™-2007
- TestResults.xsd 2.03
SIMICA Maintenance Action Information
(MAI)P1636.2 Not Available
MAIDraft_102907_working-C.xsd
0.11
AI-ESTATEIEEE Std
1232™-2002Note 4 Note 5 -
STDIEEE Std
1641™-2004Note 6 Note 7 -
Note 5: XML schemas associated with the EXPRESS models are being developed
Note 7: The XML schemas included in STD are being updatedNote 6: STD (IEEE Std 1671-2004) is being updated, expected to go to ballot in 2008
indicates project is a published standardindicates project is in the ballot process
Note 4: AI-ESTATE (IEEE Std 1232-2002) is being updated, expected to go to ballot in 2008
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ATML Overview & Architecture (IEEE Std 1671-2006)
• IEEE Std 1671-2006– Published December 16, 2006– Common schema Version 1.01– HardwareCommon Version 1.01
• Errata Document to “replace” published Annex B– Presently at Draft 10– Errata until 2009; to be posted on IEEE Errata
web-site• Common schema Version 2.01• HardwareCommon schema Version 2.02• TestEquipment schema Version 0.16
– Published IEEE Std 1671™-2006 did not include Test Equipment
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ATML Overview & Architecture (cont)
• ATML Capabilities– Proposed as “new” Annex C
• Errata to IEEE Std 1671 until 2009; to be posted on IEEE Errata web-site
– Annex Document presently at Draft 1.1– Capabilities schema Version 0.04
• ATML Pins, Ports, Connectors– Material to be posted on the TII web-site
• Future ATML Users Guide
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ATML Test Description (P1671.1)
Task Date (month/day/year)
Draft Standard Draft 2.0 will be available for review on 5th May 08
Upload Draft Document to IEEE MEC
April 08
MEC Approval
Invitation to Ballot 11th April 08
Initiate Ballot May 08
Ballot Closed
Initial Ballot Results -
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ATML Instrument Description (P1671.2)Task Date (month/day/year)
Draft Standard Draft 6: 09/04/07 Incorporates Synthetic Instruments as Annexes: Up-converter, Down-Converter, ARB, Digitizer
Upload Draft Document to IEEE MEC
09/04/07
MEC Approval 10/12/07
Invitation to Ballot 10/22/07 (Closed 11/15/07)
Initiate Ballot Draft 8: 11/28/07
Ballot Closed 01/14/08
Initial Ballot Results –Passed
Number of Balloters = 45
44 Responded 97.8% (≥ 75% of balloters)
Affirmative = 36
Negative = 4
Abstain = 4
Approval Rate 90.0% (≥ 75% of returned ballots)
Abstain Rate 9.1%
Number of Comments = 553 (572)
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ATML Instrument Description (cont)Task Date (month/day/year)
Ballot Resolution 01/15/08-TBD
Re-Circulation Ballot 17th April 2008
Re-Circulation Ballot Closes
2nd May 2008
Recirculation Ballot Results
No comments – thus far
IEEE RevCom Submittal Package
IEEE RevCom Meeting
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ATML UUT Description (IEEE Std 1671.3-2008)
Task Date (month/day/year)
Draft Standard Draft 3: 03/03/07
Upload Draft Document to IEEE MEC
03/03/07
MEC Approval 04/04/07
Invitation to Ballot 04/25/07
Initiate Ballot Draft 6: 06/13/07
Ballot Closed 07/13/07
Initial Ballot Results - Passed
Number of Balloters = 55
45 Responded 81.8% (≥ 75% of balloters)
Affirmative = 40
Negative = 2
Abstain =3
Approval Rate 95.2% (≥ 75% of returned ballots)
Abstain Rate 6.7%
Number of Comments = 118
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ATML UUT Description (cont)Task Date (month/day/year)
Ballot Resolution 07/13/07-09/05/07 All 118 comments have been addressed Regardless of classification or vote
Re-circulation path has been taken. IEEE editors could not have resolved some of these comments on there own. The XML schema was modified.
Re-Circulation Ballot Draft 8: 09/05/07
Re-Circulation Ballot Closed
09/14/07
Recirculation Ballot Results - Passed
Number of Balloters = 55
48 Responded 87.3% (≥ 75% of balloters)
Affirmative = 44
Negative = 2
Abstain =2 (1 Lack of time, 1 Other)
Approval Rate 95.7% (≥ 75% of returned ballots)
Abstain Rate 4.2%
Number of Additional Comments = 22
IEEE RevCom Submittal Package
10/09/07
IEEE RevCom Meeting - Approved
12/05/07 preliminary RevCom comments received/addressed November 2007
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ATML UUT Description (cont)Task Date (month/day/year)
Copy-Edited Review package due
01/30/08
Comments & Corrections due
02/20/08
Target IEEE Publication date
03/28/08
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ATML Test Configuration IEEE Std 1671.4-2008
Task Date (month/day/year)
Draft Standard Draft 3: 03/03/07
Upload Draft Document to IEEE MEC
03/03/07
MEC Approval 04/04/07
Invitation to Ballot 04/25/07
Initiate Ballot Draft 6: 06/13/07
Ballot Closed 07/13/07
Initial Ballot Results - Passed
Number of Balloters = 54
44 Responded 81.5% (≥ 75% of balloters)
Affirmative = 39
Negative = 2
Abstain =3
Approval Rate 95.1% (≥ 75% of returned ballots)
Abstain Rate 6.8%
Number of Comments = 102
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ATML Test Configuration (cont)Task Date (month/day/year)
Ballot Resolution 07/13/07-09/05/07 All 102 comments have been addressed Regardless of classification or vote
Re-circulation path has been taken. IEEE editors could not have resolved some of these comments on there own. The XML schema was modified.
Re-Circulation Ballot Draft 9: 09/05/07
Re-Circulation Ballot Closed
09/14/07
Recirculation Ballot Results - Passed
Number of Balloters = 54
47 Responded 87.0% (≥ 75% of balloters)
Affirmative = 44
Negative = 1
Abstain =2 (1 Lack of time, 1 Other)
Approval Rate 97.8% (≥ 75% of returned ballots)
Abstain Rate 4.3%
Number of Additional Comments = 1
IEEE RevCom Submittal Package
10/02/07
IEEE RevCom Meeting - Approved
12/05/07 preliminary RevCom comments received/addressed November 2007
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ATML Test Configuration (cont)Task Date (month/day/year)
Copy-Edited Review package due
03/05/08
Comments & Corrections due
03/26/08
Target IEEE Publication date
04/30/08
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ATML Test Adapter (P1671.5)
Task Date (month/day/year)
Draft Standard Draft 4: 10/01/07
Upload Draft Document to IEEE MEC
10/01/07
MEC Approval 10/12/07
Invitation to Ballot 11/28/07 (Closed 12/28/07)
Initiate Ballot 13th Feb 2008
Ballot Closes 13th March 2008
Initial Ballot Results - Passed
Number of Balloters = 32
31 Responded 97% (≥ 75% of balloters)
Affirmative = 24
Negative = 3
Abstain =4
Approval Rate 88.98% (≥ 75% of returned ballots)
Abstain Rate 12.9%
Number of Comments = 73
Task Date (month/day/year)
Ballot Resolution 04/22/08-05/22/08 All 73 comments have been addressed Regardless of classification or vote
Re-Circulation Ballot
Re-Circulation Ballot Closed
Recirculation Ballot Results - Passed
IEEE RevCom Submittal Package
IEEE RevCom Meeting - Approved
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ATML Test Station (P1671.6)
Task Date (month/day/year)
Draft Standard Draft 4: 10/01/07
Upload Draft Document to IEEE MEC
10/01/07
MEC Approval 10/22/07
Invitation to Ballot 11/28/07 (Closed 12/28/07)
Initiate Ballot 13th Feb 2008
Ballot Closes 13th Mar 2008
Initial Ballot Results - Passed
Number of Balloters = 32
31 Responded 97% (≥ 75% of balloters)
Affirmative = 24
Negative = 3
Abstain =4
Approval Rate 88.98% (≥ 75% of returned ballots)
Abstain Rate 12.9%
Number of Comments = 105
Task Date (month/day/year)
Ballot Resolution 04/22/08-05/22/08 All 105 comments have been addressed Regardless of classification or vote
Re-Circulation Ballot
Re-Circulation Ballot Closed
Recirculation Ballot Results - Passed
IEEE RevCom Submittal Package
IEEE RevCom Meeting - Approved
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ATML & SIMICA(IEEE-1636.1)
• SIMICA:Test Results and Session Information– IEEE Std 1636.1-2007– TestResults schema Version 2.03
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ATML & STD (IEEE-1641)
• STD: (Update to IEEE Std 1641-2004)– Draft updated standard under development– Draft updated schemas under development– Start Ballot December 2008
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Balloting - Spanning Calendar Years
• Clarification– Once the initial ballot begins, the ballot group
is set until all rounds of balloting are finished.
– Even if a ballotter does not renew his or her IEEE membership.
• myProject and myBallot accounts remain active only for activities selected while IEEE membership was active.
• myProject will indicate that IEEE membership has expired.
• All votes and comments are valid, and are to be handled as any other IEEE-SA member.
– The IEEE does not wish to re-establish balloting constituencies.
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GROOVEWork Space
Current
TII Web-site
Common.XSD (2.01)HardwareCommon.XSD (2.02)
TestEquipment (0.16)
IEEE Download site
1671-2006
IEEE Errata site
1671-2006
Annex B Change Pages
IEEE Interpretations site
1671-2006
Archive
Common.XSD (1.01)HardwareCommon.XSD (1.01)
Common.XSD (2.01)HardwareCommon.XSD (2.02)
TestEquipment (0.14)
Common.XSD (2.01)HardwareCommon.XSD (2.02)
TestEquipment (0.16)
Annex C Capabilities
Pins, Ports, Connectors
IEEE Std1671-2006 Schema & Document Locations
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2008 Meeting Schedule• Face-to-Face Meetings:
– Jan. 15-17; Orlando, FL (Lockheed Martin)
– Apr. 22nd-24th ; SCC20 08-1 St. Louis, MO (Boeing)
– Jul. TBA; Open - meeting presently planned for Santa Rosa
– 6-8th Sept.; SCC20 08-2 Salt Lake City, UT• In conjunction with AUTOTESTCON (Sept. 8-11)
– Oct./Nov. TBD; Open - no meeting presently planned
• Additionally:– Bi-Weekly Teleconferences– 4 Meetings a year plus additional break-out working groups as
necessary– Synchronise with SCC20 meetings