CMOS technologies in the 100 nm range for rad-hard front-end electronics in future collider experiments V. Re a,c, L. Gaioni b,c, M. Manghisoni a,c, L.
V. Re a,c , L. Gaioni b,c , M. Manghisoni a,c , L. Ratti b,c , V. Speziali b,c , G. Traversi a,c