Feb. 23, 2001VLSI Test: Bushnell-Agrawal/Lecture 141 Lecture 14 Sequential Circuit ATPG Simulation-Based Methods n Use of fault simulation for test generation.
1 Lecture 14 Sequential Circuit ATPG Simulation-Based Methods n Use of fault simulation for test generation n Contest n Directed search n Cost functions.
Copyright 2001, Agrawal & BushnellVLSI Test: Lecture 14/13alt1 Lecture 14 Sequential Circuit ATPG Simulation-Based Methods (Lecture 13alt in the Alternative.
