The top documents tagged [maximum scan test cycle]

PRAVEEN VENKATARAMANI pzv0006@auburn.edu VISHWANI D. AGRAWAL vagrawal@eng.auburn.edu Auburn University, Dept. of ECE Auburn, AL 36849, USA 26 th International.

PRAVEEN VENKATARAMANI [email protected] VISHWANI D. AGRAWAL [email protected] Auburn University, Dept. of ECE Auburn, AL 36849, USA 26 th International.

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Reducing Test Time of Power Constrained Test by Optimal Selection of Supply Voltage

Reducing Test Time of Power Constrained Test by Optimal Selection of Supply Voltage

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