MBISR Documentation1
CREE CXA1520 LED Array teardown reverse costing report by published Yole Developpement
OSRAM OSTAR Automotive Headlamp Pro
Toshiba first GaN on Silicon LED teardown reverse costing report by Yole Developpement
A tale of two materials
Leveraging Cross-Operational Test Data for Manufacturing Yield and DPPM/RMA Improvements
96212_05
Entrepreneurship I Class #8 VOSG I Business Plan and Finances.
ECE 260B – CSE 241A Power Consumption 1 ECE260B – CSE241A Winter 2005 Power Consumption Website: .
L i a b l eh kC o m p u t i n gL a b o r a t o r y On Effective TSV Repair for 3D- Stacked ICs Li Jiang †, Qiang Xu † and Bill Eklow § † CUhk REliable.
06/08/2015 Diagnostic Test Generation for Transition Delay Faults Using Two-Timeframe ATPG Model Master’s Thesis Defense Xiaolu Shi Dept. of ECE, Auburn.
Diagnostic Test Pattern Generation and Fault Simulation for Stuck-at and Transition Faults
