Presentatie smart blister gg platform sff 20 11-2012
Grazing Incidence X-ray Scattering from Patterned Nanoscale Dot Arrays D.S. Eastwood, D. Atkinson, B.K. Tanner and T.P.A. Hase Nanoscale Science and Technology.
FEC 2005 -- DeHon Nanowire-Based Computing Systems André DeHon [email protected] In collaboration with Helia Naeimi, Michael Wilson, Charles Lieber,
UT Oct. 2004 -- DeHon Sub-lithographic Semiconductor Computing Systems André DeHon [email protected] In collaboration with Helia Naeimi, Michael Wilson,
