Penn ESE534 Spring2014 -- Mehta & DeHon 1 ESE534 Computer Organization Day 6: February 12, 2014 Energy, Power, Reliability.
Modeling and Estimation of Full-Chip Leakage Current Considering Within- Die Correlations Khaled R. Heloue, Navid Azizi, Farid N. Najm University of Toronto.
