Feb. 23, 2001VLSI Test: Bushnell-Agrawal/Lecture 141 Lecture 14 Sequential Circuit ATPG Simulation-Based Methods n Use of fault simulation for test generation.
DSP Manual
Hidden Markov Model - The Most Probable Path
1 Lecture 14 Sequential Circuit ATPG Simulation-Based Methods n Use of fault simulation for test generation n Contest n Directed search n Cost functions.
Spin-motion coupling in atoms Cooling to motional ground states and Quantum logic spectroscopy.
