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MBISR Documentation1
Msc Thesis Fall 2011
1 Testing - Overview MotivationMotivation –fault models –testing methods Automatic Test Pattern Generation (ATPG) algorithmsAutomatic Test Pattern Generation.
DSCE
Chapter 1 petrel
M.TECH-DECS
Fault Seal Prediction and Uncertainty Estimation of a Water Wet Fault
m Tech Vlsi Syllabus
MEMS Testing Project
Copyright 1995-1999 SCRA 1 Methodology Reinventing Electronic Design Architecture Infrastructure DARPA Tri-Service RASSP Test Technology Overview RASSP.
RASSP Reinventing Electronic Design Methodology Architecture Infrastructure ARPA Tri-Service Test Technology Overview.
