Shirly Ronen - rapid release flow and agile testing-as
E-DOC-CRN-20060308-0002_v1.0_public
3db16219aaaafmzza_v1_9400 Awy Product Release Note r2.1.6
UNIT-V DEFECT PREVENTION 1Defect prevention (Arun)
.1
Lab 3 Details
Vijay Rajvaidya Sr. Marketing Manager Sun Microsystems, Inc.
Test Driven Development
Xtensa C and C++ Compiler Ding-Kai Chen Tensilica, Inc dkchen@tensilica
