Earth Quake Resistance Structures/Buildings-B.E Civil Engineering PPT
Snotra - scanning probe nanotomography technology
O RBIS — Micro-EDXRF System. XRF Advantages Non-destructive: No beam damage or coating of sample Minimal Sample Preparation: conductivity not required.
Electron Beam MicroAnalysis- Theory and Application Electron Probe MicroAnalysis - (EPMA)
STATUS REPORT ON HIRADMAT I. E FTHYMIOPOULOS, EN/MEF Slides taken from HIRADMAT presentation to A&T management R. Assmann, C. Hessler, I. Efthymiopoulos,
Status Report on HIRADMAT I. Efthymiopoulos , EN/MEF
Maintencance Card