Paradigm Shift in Functional Test
For public distribution, v12.2017
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Source: Gartner
CAGR: 7%
ATE/ATS
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UUT
Drive Signals
Get Responses
FPGA
Who provides the FPGA configuration here on the UUT?!
Automated Test Synthesis
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FPGAQSPI
DDRAM
XADCEthernet Oscillator
HDMI
PCIe
USB
I2C Switches
SATA
LCDPush
buttons
FMC connectors
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CorePiler
Board Designer Factory Floor ATE
Application Examples
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At Volume Production Line
QI would screen out defective partsbefore applying time-consumingfunctional and application tests.
At Troubleshooting Station
QI help to narrow down defectscaused functional test to fail,thereby shortening the repair andretest cycle.
More Than Functional Test
7
Determine how much of signal distortion can still be tolerated• Error rates are color-coded
• The more red area observed – the less distortion can be tolerated
Quick BER eye measurement (1-5 seconds)
For public distribution, v12.2017
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Error rate if data is
sampled under
normal conditions
Phase and voltage
threshold shifted
All errors
No errors
Some errors
Phase shift
Vo
lta
ge
th
resh
old
sh
ift
BER eye examples
Goodlink
Proble-matic
link
More Than Functional Test
For public distribution, v12.2017
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Two GND lines for DQ40-47 byte
group missing
In-field Experience is Sorrowful
For public distribution, v12.2017
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“A DIMM that sees a correctable error is 13–228 times more likely to see another correctable error in the same month, compared to a DIMM that has not seen errors.” [2]
“Failures in DRAM are a dominant source of errors in modern systems”
“Non-DRAM memory failures, such as those in the memory controller and the memory channel, are the source of the majority of errors that occur” [1]
ATE Integration
For public distribution, v12.2017
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System
Under
Test
PCBA BOARD
HEADER
UUT2UUT1
UU
T3
FPGA
General purpose
IO instrument card
FPGA on the
customer board
holds diagnostic
instrumentation
JTAG standard bus
can be used to com-
municate between
the two couterparts
Typical general
purpose func-
tional tester (FT)
Demo Application at NTF
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12For public distribution, v12.2017
Automatically synthesized and placed
Eliminate the need for FPGA designer
Controlled from ATE/ATS or standalone
Provide better than functional test coverage
Cover Marginal Faults/Defects
Cloud-based service
Instruments
For public distribution, v12.2017
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External/ATE Embedded
Traditional Synthetic
Virtual
Traditional Synthetic
Virtual
• BIT• SST• POST• BIST• BA-BIST• HSIO-BIST• IBIST• MBIST• LBIST• sensors
• FCT by ASSET• CoreCommander
by JTAG Tech
FPGA Card
Technology Benefits
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Improves Test Quality
Lowers Test Development Costs
Reduces Test Escape Rate
Easy Integration
Faster prototype bring-up
THANK YOU!
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