Northeastern UniversityBoston, MA
- USA -
LLOWOW--PPOWEROWER µµWAVEWAVE PPLASMALASMA
SSOURCEOURCE FFOROR MMICROSYSTEMSICROSYSTEMS
Felipe Iza and Jeffrey A. HopwoodFelipe Iza and Jeffrey A. Hopwood
ICOPS - Cheju, 2003
Outline
DEVICE DESCRIPTION
v Low-cost gap-excited microwave plasma source
v Low-power device
v Atmospheric pressure
PROBE DIAGNOSTICS
v High-density discharge
v Low sheath voltage
SPECTRUM ANALISYS
v Non-equilibrium, low-temperature discharge
CONCLUSIONS
Plasma Source Description
RT/Duroid 6010.8
Dielectric: Ceramic reinforced teflonDielectric constant εr=10.8Dielectric thickness: 635µm
Conductor: CopperConductor thickness: 9 µm
Operation Conditions
900 MHz0.1 - 760 torr0.150 - 3 W
Ground PlaneDielectric
Discharge gap
Line
SMA connector
Discharge Gap
λ/4
~ 2 cm
~ 5
cm
λ/2
Matching network
Split ringresonator
I V
?2
Principle of Operation
Discharge gap
g oh
E 2 Eg
≈Ground Plane
Dielectric
g
hEo
Eg
Line
Groundplane
Lineplane
Section AA’
Groundplane
Lineplane
Section BB’
A’
AB’
BMagnitude of the electric field |E|Simulation using HFSS from Ansoft
Experiment Set-up
Glass tube
(chamber)
Manifold
PlasmaSourceGas outlet
To pressure gauges
Coaxial Probe
Gas inlet
Needlevalve
30dB
900.000 -7.3
MKS
0.53
0.53- - -
Ignition Power & Gap engineering
Pressure (torr)
Igni
tion
Pow
er (W
)
0.1 1 10 100
1
6
760
3
0.5
500 µm gap - Argon
50 µm gap - Argon
500 µm gap - Air
0.6
0.7
0.80.9
2
4
5
Pressure Range of Operation
Probe diagnostics:v Ion Density ~1011cm-3
v Floating Potential <5V
Spectroscopy:v Trot = 400K v Tvib = 0.7eVv Texc = 0.32eV
Ar plasma @ 1W, 900 MHz
Glass tube
Microstrip
Glass tube
Microstrip
Glass tube
0.1 torr 10 torr 760 torr100 torr
Probe diagnostics: Ion density
100 mtorr 200 mtorr300 mtorr400 mtorr
Power (W)0.0 0.2 0.4 0.6 0.8 1.0 1.2
Ion
Den
sity
nii(c
m-3
)
0.0
2.0e+10
4.0e+10
6.0e+10
8.0e+10
1.0e+11
1.2e+11
1.4e+11
[1] Iza F. and Hopwood J., Plasma Sources Science and Technology, vol. 11, no. 3, pp. 229-235, August 2002
mICP @ 400 mtorr[1]
mICP 400 mtorr[1]
Ring resonator400 mtorr
335Q ≈
40Q ≈
Argon
Probe diagnostics: Floating Potential
Pressure (torr)
0.01 0.1 1 10 100 1000 10000
Floa
ting
Pote
ntia
l (V
)
-5
0
5
10
15
20
25
1250 mW
1000 mW
750 mW
250 mW
500 mW
150 mW
Probe: Thin gold wire (d=50µm)
Argon
Pressure Range of Operation
Probe diagnostics:v Ion Density ~1011cm-3
v Floating Potential <5V
Spectroscopy:v Trot = 400K v Tvib = 0.7eVv Texc = 0.32eV
Ar plasma @ 1W, 900 MHz
Glass tube
Microstrip
Glass tube
Microstrip
Glass tube
0.1 torr 10 torr 760 torr100 torr
Ar: 760 torr, 1.5 W
4000 5000 6000 7000 8000 9000 10000
4000 4500
Texcitation and Tvibrational @760 torr
Ar Ground state
E (eV)Ar+
Ar*
15
10
5
13
-14
-12
-10
-8
-6
-4
-2
0
2
ln(I
*lam
bda/
A)
7 8 9 10 11 12 14 15-16
Energy (eV)16
4000 5000 6000 7000 8000 9000
99.9% Ar + 0.1% N2 : 760 torr, 1.5 W1st Positive Band: 3 3 +
g uB ? A→ ∑2nd Positive Band: 3 3u gC ? B ?→
∆ν = ...0 2 3 41 -3 -1-2- 4
∆ν = ...
N2 Ground state
ν=1
N2+
ν=2ν=3
ν=1ν=2ν=3
3 +uA ∑
3gB Π
3uC Π
......
...
ν=1ν=2ν=3
N2+
Tvib = 0.70 eV(8124 K)
Tvib = 0.25 eV(2901 K)
N2:1st positive band
N2:2nd positive band
00.10.20.30.40.50.60.70.80.9
1
Wavelength (Å)
Inte
nsity
(a.u
.)
Ar* Ar+
Argon
Texc = 0.32 eV(3714 K)
********** ****
**
*****
**
*******
Boltzmann plot
4000 5000 6000 7000 8000 900000.20.40.60.8
1
Wavelength (Å)
Inte
nsity
-3 -1-2- 4
1st Positive Band: 3 3 +
g uB ? A→ ∑2nd Positive Band: 3 3
u gC ? B ?→
∆ν = ...0 2 3 41∆ν = ...
Rotational Temperature Trot @760 torr
N2 Ground state
ν=1
N2+
ν=2ν=3
ν=1ν=2ν=3
3 +uA ∑
3gB Π
3uC Π
......
...
ν=1ν=2ν=3
99.9% Ar + 0.1% N2 : P=760 torr, 1.5 W
3680 3700 3720 3740 3760 3780 3800 3820Wavelength (Å)
2-4
1-3
0-2
Trot = 350 K
Trot = 400 K
Trot = 450 K
gas rotT T = 400 K≈
ConclusionsNEW DEVICE BASED ON A SPLIT-RING RESONATOR
v Low cost, robust and high-Qv Low-Power
Ø 0.5W Argon @ 760torrv Wide pressure range operation Ø 0.1-760 torr
PROBE DIAGNOSTICS (LOW PRESSURE)v High-density dischargev Small sheath voltage at pressures > 3 torr
SPECTRUM ANALISYS
v Non-thermal plasmav 99.9% Ar +0.1%N2, 760 torr, 1.5W ØTexc= 0.32eV (3714 K)ØTvib= 0.7eV (8124 K)ØTrot= 0.03eV (400K)
PORTABLE DEVICE
EFFICIENT AND DURABLE
LOW-TEMP.APPLICATIONS
This research has been supported by Northeastern University, the Fulbright Program, and the National Science Foundation under Grant No. DMI-0078406.
Acknowledgment