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Development of HV Inverter Testing System Enable to Simulate Vehicle Behavior

Takahito Murata Tadashi Kobayashi Toshihisa Saito Hikaru Mizuno

We developed a HV inverter testing system which can simulate transient vehicle behavior without actual car, engine, transaxle and battery. This testing system became capable of various operating condition, for example wide-open-throttle acceleration, driving at very low speed and so on. It could also carry out a test of operating condition

difficult to be duplicated by experimental vehicle and realize various measurements. These results lead to remarkable man-hour reduction.

KEY WORDS: EV and HV system, power control unit, system technology, testing system (A3)

Advanced development Trial Manufacture Massproduction

Demands of adaptability test

Front loading of adaptability test to raise the design quality

Adaptability test with provisional samples

Marginal test beyond working limit

Mesurement while transient operation

Evaluation of mass-produced samples for next development

Fig.1 Ideal state of PCU experiment

Vol.45,No.3,May 2014. 521

技術論文 20144535

Development of HV Inverter Testing System Which Enables to Simulate Vehicle Behavior

522 自動車技術会論文集

実車走行時動作の模擬が可能なHVインバータ評価ベンチの開発

Table1 Driving conditions to simulate

Constant-speed runHigh-speed cruiseAcceleration with wide-open-throttleDeceleration with regenerationRepeat of acceleration and decelerationDriving at very low speedState in which wheels are stopped in spite of accelerator-onidling

Environmentaltest chamber

BTSILSBRS

voltage

Coolant

PCU : Power control unitILS : Inverter load simulatorBTS : Battery simulatorBRS : Battery internal resistance simulator

(for motor)

ILS(for generator)

resistance temp.flow

temp.humidityECU

command

Electronic load(for DCDC converter)

Electronic load(for air conditioner)

currentrevolution speedresolver angleelectrical constant

PCU

System controller

Fig.2 Overview of HV inverter testing system

Table2 Specification of ILS and BTS Maximum rated voltage 585Vrms

400Arms ( 400Hz)300Arms ( 600Hz)200Arms ( 1200Hz)

Frequency control range 0 1200HzMotor model Permanent magnet synchronous motorSystem construction 2 motors (for HV system)Frequency responsiveness 24min-1/msecResolver simulator accuracy F.S. 0.02%Voltage control range DC 100 600VMaximum rated output 200Adc (at 600Vdc)Voltage responsiveness 10V/msecCurrent responsiveness 2.1A/msec

ILSMaximum rated current

BTS

Vol.45,No.3,May 2014. 523


PCUILS1

BTS

HV control device

Measurementcontroller

ILS2

Operationcontroller

Datastorage

Datastorage PC

Poweranalyze

Datalogger

1msec

4msec4msec

10msec50msec

Pattern file

Fig.3 Schematic diagram of command and measurement

BTSOperation controller

1msec

Controller

10msec

voltageHLS(SLAVE)

FL-net

ILS1Controller

HLS(SLAVE)

FL-net

ILS2Controller

HLS(SLAVE)

FL-net

HLS(MASTER)

HLS(MASTER)

HLS(MASTER)

Operating panelfor BTS and ILS

FL-net

revolution speedresolver angle

1msec

1msec

Fig.4 Communication method between machinery

0 5 10 15

Tor

que c

omm

and (

Nm

)

Revo

lutio

n spe

ed (r

/min

)

T ime (sec)

Command

Output

250

-1500

6000

Fig.5 Comparison between command and Output

ECU command

UVW

PN

resolver signal

detectedvoltage

Ed_fbEq_fb

Vd_com

Vq_com

Id Iq

--

Resolversimulator electrical angle

revolution speedresolver angle

Inductance (Lq,Ld)

coil resistance (R)

detectedcurrent

PCU

Outputreactor

convert todq-axis

InvertersinusoidalPWM

PIPIconvert to

dq-axis

voltagecommand

convert tothree phase

Motor voltage equationVd_com = R Lq Iq

Ld Id + R

--

++

Lout

Ed_com

Eq_com

Correction for outer reactorEd_com = Vd_com + Lout IqEq_com = Vq_com - Lout Id

Fig.6 Fundamental structure of ILS



0 5 10 15 20

Out

put c

urre

nt (A

)

T ime (sec)

Id

Iq

After improvement

Out

put c

urre

nt (A

)

Id

Iq

Before improvement

Control failure

Vehicle

Testing system

250

-250250

-250

Fig.7 Improvement of output current by feedforward term

Lq (H)

Iq (A)

Id (A)

Fig.8 Lq variation with current

0 5 10 15 20

Out

put c

urre

nt (A

)

T ime (sec)

Id

Iq

Two-dimension Ld Lq table

Out

put c

urre

nt (A

)

Id

Iq

One-dimension Ld Lq table

Current fluctuation

250

-250250

-250

Fig.9 Improvement of output current by precise Lq and Ld

Lq profile from CAE

from actual vehicle data Back calculating plot

Vol.45,No.3,May 2014. 525


Revolution speedResolver angle Transmit synchronously

0 r/min ?

Revolution speed

Resolver angleIntegration

Transmit to resolver simulator

Y

N

Fig.10 Command logic while very low-speed motor rotation

0

100

0

360

0 2 4 6 8 10 12

Revo

lutio

n spe

ed (r

/min

)

Reso

lver

angl

e (de

gree

)

T ime (sec)

Command

Output

Fig.11 Resolver angle comparison between command and output

voltage command

UVW

P

N

-

+

-

+

detectedvoltage

detectedcurrent

Chopper circuit

PI

dutycommand

PI

BRSPCU

Fig.12 Fundamental structure of BTS

0 5 10 15 20

Inpu

t vol

tage

(V)

T ime (sec)

260

160

Command

Output

Fig.13 Input voltage comparison between command and output



0 5 10 15 20Time (sec)

Ris

e in

tem

pera

ture

of I

GB

T (

)

VehicleTesting system

±1

Fig.14 Rise in temperature of IGBT as wide-open throttle

Table 3 Experimental period shortening items using testing system

Need man-hour to exchange of only heat sinkPossible to experiment without cover and housingNeedless replacement and loading PCUNeedless preparation and restoration work for vehicleNeedless set-up for every PCU replacementNeedless vehicle set-up for measurementNeedless orientation drivePossible to experiment aloneShorter experimental working at repeatitive test

PCU set-up

Vehicle set-up

Measuringsystem set-up

Experiment

Testingsystem

Actualvehicle

test

Man-hour (Hr)

PCU set-up Vehicle set-up

Measuring system set-up

Experiment

800

Fig.15 Total reduction man-hour using testing system