复习
What did I learn in school today?
Major concept areasCrystal structure and propertiesCrystallographyReciprocal latticeX-rays, X-ray spectraX-ray absorption, X-ray fluorescenceDiffraction, Braggs' law, Ewald constructionPowder diffractometerPowder patterns
IndexingIntensities
Powder pattern applicationsQualitative analysisQuant analysisCrystallite size, microstrianResidual stressThin film epitaxy
SEMTEM, imaging and diffractionAFM
Must-know terms
Crystallographysymmetry operation - translation, rotationlattice, Bravais latticeunit cellcrystal systempoint group, space group
stereographic projectionequipointlattice plane, lattice direction
Must-know terms
X-rayscontinuous radiationcharacteristic radiationsynchrotron radiationmass attenuation coefficientabsorption edgefluorescence
Must-know terms
DiffractionBraggs' lawreciprocal latticeEwald constructionDebye rings
Must-know terms
Powder diffractometerfocusingSoller slitdivergence slitreceiving slitmonochromatordetectordeadtime
Must-know terms
Powder diffraction patternsindexingextinction ruleatomic scattering factorstructure factorintensitymultiplicityLorentz polarizationtemperature factorpeak breadth
Must-know terms
Powder diffraction proceduresdiffractometer alignmentcalibration standardsspecimen displacementpreferred orientationfront fill, back fill, side driftzero background platestep sizedwell time
Must-know terms
Powder diffraction applicationsPDFHanawalt search methodquantitative analysiscrystallite sizemicrostrainScherrer equationWilliamson-Hall methodresidual stressfour-circle diffractometerepitaxy
Must-know terms
SEMmicrostructurematrix and precipitatesbackscattered electronscomposition contrastsecondary electronstopographic contrastdepth of focusWehnelt cuptunneling and field emissioninteraction volume
Must-know terms
TEMback focal planejet thinningion millingcamera constantrelrods
Must-know terms
AFMcontact and non-contact modesconstant heightconstant forcetapping modeforce-distance plot