Wirescanner Status
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Transcript of Wirescanner Status
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Wirescanner Status
Guy Crockford BE/OPLBOC 11/10/11
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Content
• Front End improvements– Beam 1: 200MHz noise suppression– Intensity limit at injection energy– Bunch selection gate limitations
• Application Software improvements…– Tools for bunch selection– Display of multiple bunch normalized emittance– General layout
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Beam 1: 200MHz Noise
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Beam 1: 200MHz noise
• Source of noise not yet understood• Few opportunities for access/investigation
• Remove with simple filtering technique…– For each wirescan acquisition…– Add gate to acquire noise signal in the abort gap– Subtract signal acquired from measurements in
gates with beam
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WS measurements @ horizontal scrappingCorrection due to noise
B1 profile: ~200Hz noise hides the profile
B1 profile: Noise reduced by deducting the acquisition of a bunch slot belonging to the abort gap & acquired at the same time
Sigma from noisy profiles
Sigma from cleaned profiles
Intensity curve
Acq stamp (ns) Acq stamp (ns)
Sigm
a (u
m)
Sigm
a (u
m)
The Sigma curve follows Intensity curve in H plane. The overall measurement spread for the corrected profiles is significantly reduced
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Sigma spread with filteringLHC.BWS.5R4.B1H2 Sigma
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Scan results with filtering
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Intensity limit at injection• Wire damage threshold (higher limit)
• BLM trigger threshold (more sensitive)– Previously set to 2.1E13 at 450GeV– We need to scan 12+144 nominal bunches– Hitting limit at bunch intensity > 1.34E11
• Increase limit to 2.5E13 at 450GeV– Effective bunch intensity limit raised to 1.6E11
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Acquisition gate limitation issues
• Previously acquisition gate limited to 30 bunches
• Firmware bug…– Only ¼ of DAB card memory exploitable
• Firmware problem solved and number of turns for 1 acquisition reduced from 1000 to 500
• Now able to set the acquisition gate to measure 156 bunches in 1 scan
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Tools for gate selection
• Need to quickly check emittances at the start of the physics filling process– 12 bunch batch & first 144 bunch batch
• Buttons added to application to select the correct batch (based on nominal filling scheme)
• Buttons to save and recall user defined bunch selections to file
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Bunch selection options
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Bunch selection options12 Bunch Batch
First 144 Bunch Batch
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Emittance ChartNormalized Emittance vs Slot number
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Multiple fit calculation• Slow to calculate fits for 156 bunches• Enable multiple fit calculation for all bunches only if required
Fit All profiles
Fit Only Visible Profiles
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Settings Menu• All key settings controlled from front panel
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Acknowledgments
• Thanks to…– BE/BI: • Ana Guerrero, Federico Roncarolo, • Mariusz Sapinski, Johnathan Emery
– Fermilab LAFS: • Elliott McCrory
• Thanks for your attention!