WIPS Global Brochure, New

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Dynamic Thinking : Patent Search and Analysis www.wipsglobal.com

Transcript of WIPS Global Brochure, New

Page 1: WIPS Global Brochure, New

Dynamic Thinking : Patent Search and Analysis

www.wipsglobal.comWG ver3.1-150613

WIPS Headquarter. Global Business DivisionDMC Tower 18-19F, 189 Sungam-ro, Mapo-gu, Seoul, South Korea 121-904Tel +82 2 726 1130 Fax +82 2 777 7334 E-mail [email protected]

JAPAN Tel +82 2 726 1113 Fax +82 2 777 7334 E-mail [email protected]

CHINA & TAIWAN Tel +82 2 726 1104 Fax +82 2 777 7334 E-mail [email protected]

U.S. OFFICE1952 Gallows Road, Suite 110, Vienna, VA22182 Tel +1 571 268 6639 Fax +1 571 633 9517 E-mail [email protected] Worldwide Intellectual Property Service

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Authorized Prior Art Search Institute.

Authorized Trademark & Design Art Search Institute.

Authorized Patent Cooperation Treaty (PCT) Prior Art Search Institute.

ASPI (Access to Specialized Patent Information) program

DB Quality Award by Korea government

Partnership

Award&Recognition

CompanyProfile

Worldwide Intellectual Property Service

About WIPS

WIPS is Korea’s first company to offer on-line worldwide patent information service. Since starting the business in 1999, the service is being used by over 3,000 companies, patent law firms, academics, governments, and R&D centers including top Korean global companies and multinationals. With over 100,000 users worldwide, WIPS has kept the number 1 spot in Korea with largest market share for over 13 yrs term. In 2012, WIPS achieved 63% market share.

DB Quality Certification(Gold-Class) by Korea Database Agency

Designated as World Class Product / Service by Korea government

Certified ISO/IEC 27001:2005 Information Security Management System

Certification BS10012:2009 Personal Information Management System

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Native Language Search Service

Chinese/English for CN database

Korean/English for KR database

Japanese/English for JP database

For more accuracy search to Asia patent database,WIPS Global newly add native language keyword search for CN/KR/JP.Now, User can use Korean/ Chinese keyword for search. (Advanced / Step search ) *Japanese will be coming soon.WG provide high quality Machine-Translation

The Leader of Asia patent

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What are the Special Features of WIPS Global?

General Search

Theme Search

• Integrated Search : patent search in multiple countries with a single click

• Advanced Search : advanced search using various and exclusive search fields of WIPS

• Step Search : a cross-search of search results and information

• Number Search : a quick search using patent numbers

• Family Search : enables a quick custom search for patents by setting various search terms for patent families

• Citation Search : a quick search for citation relationships with specific document

• Company Search : enables extraction of applicable cases when wanting to analyze patent portfolios of a specific company

Search

Review

Quickly reviews and classifies a large amount of search results en bloc(user-defined tags)

Easy Viewer

View option : List, Block, Drawing type view List realignment with Family Group function

Search results

Quickly reviews major information (e.g., claims, drawing) of individual patent

Express View

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SmartAngle: Patent Statistics

Patent Analysis

• Chart Analysis : quickly and easily offers statistics of a large amount of patent information in chart forms, enables phased review of statistical information

• Cross Matrix : quickly extracts major statistics from a large amount of patent information by setting up statistics fields (X/Y Axis)

• Classification : quickly extracts the patents that satisfy the condition of review from a large amount of patent information

Download

Offers various output formats (XLS, TXT, MDB, PMDX) to allow major information of patents to be used in various ways

ThinKlear 2012

Offers editing and reporting tools to allow users to utilize the Output information in various ways

• Cla im Analys is : o ffers keyword extraction and a referential relationship with an individual patent claim, able to compare claims of published and granted patents

• Family Analysis : offers information on nations in which patent family is entered, time series information, and comparison of claims to enable multi-dimensional analysis on patent family information

• Citation Analysis : allows a multi-dimensional analysis on patent citation information through a citation map and citation statistics information

• Patent Folder : saves and shares searched results of patents

• Query Folder : saves and shares query information

• Query History : reuses the query information

Query SDI

Monitors trends through registering interested query (Keyword, IPC, etc.)

Citation SDI

Continually monitors changes to citation information in patents of interest

Family SDI

Continually monitors changes to family information in patents of interest

Monitoring

My Folder Statistics & Analysis

Download Information

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Search

List type Block type Drawing type

• Optimizes the patent search environment by offering various and exclusive search fields

• Search Type: Integrated Search / Advanced Search / Step Search / Number Search

• Additional Functions: Query Matching Board, Error Check, Setting output items out of searched results, supporting various search field operators, etc.

• Search Results View: Provide List, Block, Drawing type view-option

• Family Group Function: List realignment with Family Group

Status information of patent families

Status Information of Forward / Backward Citation

Convenient search interface for applicants’ info.

Dictionary of representative names of applicants (EN/KR)

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• Quickly extracts patent document using the search terms and keywords for family patents

• Able to quickly figure the present conditions of domestic/overseas patent applications of competitors: enables establishing patent strategies for each nation

Citation Search

• Quickly and easily search Forward / Backward Citation through inte-

grated citation information of patents from Korea, the US, Japan, and Euro pean countries

• Easily searches the current status of patents of interest (competitors’):

conveniently establishes strategies to respond to disputes

Company Search

• Search patent document of an applicant for a patent without omis sions by making a representative name for the information of affiliated companies or applicants written in various forms

• Conveniently figures the trends of competitors’ patent applications: enables continuous monitoring of competitor patent portfolios

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Easy Viewer

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• Easy Viewer is a feature that enables searching large amount of patent document rapidly and conveniently

- Provides selected abstract, drawings, and original documents by each viewers

- Item classification, download, my folder service can be all connected as needed

- Original document can be viewed directly without downloading..

- Provides a short sign and description for each selected figure.- It is a very useful feature for users who want to review all drawings at once.

View Drawings

View Document

- User can setup output options by selecting Bibliography, Abstract, summary, Representative drawing, Exemplary Claim and etc.

View PDF

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Loading patents related to OOO saved in My Folder onto SmartAngle

1. Drag & Drop : US patent

2. Select Field (First output info): Applicant’s Nationality

Present status of patents applied in the US by Japanese applicants related to (technology areas)

3. Drag & Drop : JP data

Output

Input

• Conducts a multi-dimensional review of results through various statistics fields offered by the SmartAngle and the narrow down type statistics function for searched data or a large amount of patent data saved in My Folder

• SmartAngle is able to load 10,000 cases of searched data or 10,000 cases of saved data in My Folder

Q : I want to know the present status of patents applied in the U.S. by major Japanese applicants related to (technology areas)

A : SmartAngle(Chart Analysis)

4. Select Field (secondary output info) : Primary Applicant

SmartAngle

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• Easily and quickly extracts statistical information on two-dimensional correlation of a large amount of patent data through setting up statistics information fields (X/Y Axis) for search results or a large amount of patent data saved in My Folder

• Offers various chart views of the Cross Matrix results and the view function of a list of patents

• Easily and quickly clusters the patent document search results among a large amount of patent data using filtering operators and various classification fields

• Able to quickly review extracted results using Easy Viewer

Question

Answer

Setting classification fields

Setting Classification Fields

US and 000 Corp. and G06F-017

US 2011 –XXXXXXX A1US 2005 –XXXXXXX A1

I want to know the present status of patents applied in the US by (company name) related to (technology areas)

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s • Offers a customized statistical analysis function through setting various statistics fields for the citation information of patents of interest (or competitors’) and offers visualized information of the citation relationship for user’s convenience.

• Offers integrated citation information for patents from Korea, the US, Japan, and European countries

• Offers such functions as statistics, family country profiles, time series view, and compare documents to enable a multi-dimensional analysis on family information of patents of interest (or competitors’)

• Conveniently figures the present status of competitor patents; enables strategic use of information to establish patent portfolio

Statistics

Time Series View

Family Country Profiles

Compare Documents

• Patent Portfolio• R&D Trends• Scope of Rights

Family Analysis

Visual Mode (Citation Map)Text Mode & Statistics

Analysis

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Claim

Analysis

• Offers information in diagram forms for users to conveniently analyze the classes and reference relationship among patent claims

• Offers a comparison function of claims per document and analysis function of keywords per claim for users to easily analyze public and registered patents from the same patent document and a range of rights for an individual claim

2. Analysis on Keywords by Claim 3. Disclosure of the Same Patent Document and Comparison of Claim in Published and Granted Patents

Can be used in various works such as prior art, invalidity, and infringement searches through

the convenient function of claim analysis

1.Classes of Claim and Reference Relationship Diagram

Dependent Claim

Independent Claim

Comparison of the range of rights between claims in a reference relationship

Information on keywords analysis

Highlighting major keywords

Present status of independent and dependent claims

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n) • SDI is a “notification service of newly registered patents” that regularly provides users with new patent information every time applicable patent information is updated according to the user’s query of interest (Keyword, IPC, Applicant) registered on the Web SDI.

• Once the patent numbers of interest (or competitors’) are registered on the Web SDI, the updated news of patent families or citation patents of the applicable patent are regularly offered.

• SDI service can be effectively used to monitor competitors or the patent trends of technology of interest.

1. Setting Up Query SDI 3. Setting Up Family SDI

Obtaining prior art data before applying for a patent overseas

Blocking other applicants to register a patent relatedto the company’s rights

(Raising a formal objection)

Obtaining related patent data when developing new

technology

Get the trend of competitor’s patent applications

SDIUtilization of SDI Service

2. Setting Up Citation SDI

Setting the sharing person about SDI result

Setting up a range of monitoring and registering Query

Setting patent numbers of the monitoring object

Setting patent numbers of the monitoring object

Convenient management of the SDI History informationSDI Result

SDI

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My FolderM

y FolderQ

uery History

• Offers the function to save (10,000 cases/folder) patent data that will be applied to work and manage the data (data sharing and information classification)

• Enables a secondary use of the data by linking the saved data in Patent Folder with SmartAngle and Easy Viewer offered by the WIPS Global

The setting status of user-classification tags for the saved patent data in an individual folder

• Displays a list of the saved patent data in an individual folder

• Able to set up user-classification tag for individual patent data

• offers a search function of patent document in an individual folder

• Conveniently links the saved patent data in Patent Folder with other services such as Easy Viewer and SmartAngle

Setting to share the saved patent data in Patent Folder

Query Folder

• Convenient function to save and manage frequently used query information in folders

• Links the saved query information with SDI service

• Linked with Query Matching Board

• Offers the history of query information by used dates

• Offers the search terms used

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• Offers a wide range of information fields for users to use major patent information in various ways• Offers various output formats: XLS, TXT, MDB, PMDX (supported format by ThinKlear2012)

• ThinKlear2012 is a support tool for editing and analyzing patent information with an improved degree of freedom for users. Offered as software, this additional service can be used in various ways including analyzing or making a report on patent information.

• Its user interface is reinforced to enable customized analysis on downloaded patent information such as bibliographical information, patent families, citation information, applicants, and inventors from WIPS Global Advanced.

Offers various patent information fields (79 Fields) Reinforced set function for a customized output

Offers a list of patent information with representative drawing

Editing an order of output data

ThinKlear2012

Simple tool for automatic analysis Customized list of essentialsFunction to manage and edit group

work information

Supports a customized analysis

Various functions of information editing

(e.g., Standardized Applicant)

Download Information

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DB Coveragew

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Data collection Earliest Records Data

US

Patents issued before 1975 Grant Date1790.07.31 ~ 1975.12.30 Full text, Full-Image(PDF), Rep. Drawings

Patent Application Publications Unexam Pub. Date2001

Full text, Full-Image(PDF), Drawings* Agent/Attorney (Published information from USPTO is provided

until Feb. 24,2011)

Patent Granted Publications Grant Date1976

Full text, Full-Image(PDF), Drawings* Individual Drawings (Grant date 2001~Present)

Assignments Information 1970Assignor / Assignee Data* Range of date provided is the registry date of assignee information

from the USPTO.

EPEuropean Patent Applications Issued Date

1978 Full text, Full-Image(PDF), Drawings

Granted European Patents Issued Date1980 Full text, Full-Image(PDF), Drawings

PCT(WO) Issued Date1978 Full text, Full-Image(PDF), Rep. Drawings

JP

Patent Application

Unexamined Publications

Unexam Pub. Date1993 Full text, Full-Image(PDF), Drawings

Unexam Pub. Date1989.01.01 ~ 1992.12.31 Full-Image(PDF)

Japanese Translation of PCT Unexam Pub. Date1996 Full text, Full-Image(PDF), Drawings

Domestic Re-Publication of PCT Unexam Pub. Date1992 Full text, Full-Image(PDF), Drawings

Patent GrantedExamined Publications Exam Pub. Date

1994.01.05 ~ 1996.03.29 Full text, Full-Image(PDF), Drawings

Granted Grant Date1996 Full text, Full-Image(PDF), Drawings

Utility ApplicationUnexamined Publications

Unexam Pub. Date1993 Full text, Full-Image(PDF), Drawings

Unexam Pub. Date1989.01.01 ~ 1992.12.31 Full-Image(PDF)

Unexamined Granted Grant Date1994

Full text, Full-Image(PDF), Drawings* Published after 1994

Utility GrantedExamined Publications Exam Pub. Date

1994.01.05 ~ 1996.03.29 Full text, Full-Image(PDF), Drawings

Granted Grant Date1996 Full text, Full-Image(PDF), Drawings

PAJ (Patent Abstract of Japan – Unexamined Applications) Unexam Pub. Date1976

Bibliographic, Abstract, Full-Image(PDF), Rep. Drawings* JP Full-Image(PDF) (Unexam Pub. Date 1989.01.01 ~ Present)

Amendment Information (JP patent / Utility) Issued Date1993 Amendment Image (PDF)

* JP data is in Japanese language except for PAJ

KR

Patent Application Unexamined Publications Unexam Pub. Date1983 Full text, Full-Image(PDF), Drawings

Patent GrantedExamined Publications Exam Pub. Date

1979.07.12 ~ 1997.08.08 Full text, Full-Image(PDF), Drawings

Granted Grant Date1997 Full text, Full-Image(PDF), Drawings

Utility Application Unexamined Publications Unexam Pub. Date1983 Full text, Full-Image(PDF), Drawings

Utility GrantedExamined Publications Exam Pub. Date

1979.07.11 ~ 1997.07.31 Full text, Full-Image(PDF), Drawings

Granted Grant Date1996 Full text, Full-Image(PDF), Drawings

KPA (Korea Patent Abstract)KPA-A (Unexamined Applications) Unexam Pub. Date

1999 Bibliographic, Abstract, Full-Image(PDF), Rep. Drawings

KPA-B1 (Examined Applications) Grant Date1997 Bibliographic, Abstract, Full-Image(PDF), Rep. Drawings

Amendment Information (KR patent / Utility) Issued Date2005 Amendment Image (PDF)

* Text data is offered in Korean+English depending on its fields.

CN

Patent Application Publications Unexam Pub. Date1985 Full text, Full-Image(PDF), Rep. Drawings

Patent Granted Publications Grant Date1985 Full text, Full-Image(PDF), Rep. Drawings

Utility Application Publications Unexam Pub. Date1985.09.10 ~ 1992.12.30 Full text, Full-Image(PDF), Rep. Drawings

Utility Granted Publications Grant Date1993 Full text, Full-Image(PDF), Rep. Drawings

* Text data is offered in Chinese+English depending on its fields.

DOCDB Patent Date1827

Collection of published applications from 100+ countriesBibliographic, Abstract, Legal Status

Others

FEDERAL REPUBLIC GERMANY Patent Date1861 Full text, Rep. Drawing

UNITED KINGDOM Patent Date1782 Full text, Rep. Drawing

FRANCE Patent Date1855 Full text, Rep. Drawing

RUSSIAN FEDERATION Patent Date1975 Full text, Rep. Drawing

INDIA Patent Date1900 Bibliographic, Abstract, Rep. Drawings

TAIWAN Patent Date1950 Bibliographic, Abstract

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Dynamic Thinking : Patent Search and Analysis

www.wipsglobal.comWG ver3.1-150613

WIPS Headquarter. Global Business DivisionDMC Tower 18-19F, 189 Sungam-ro, Mapo-gu, Seoul, South Korea 121-904Tel +82 2 726 1130 Fax +82 2 777 7334 E-mail [email protected]

JAPAN Tel +82 2 726 1113 Fax +82 2 777 7334 E-mail [email protected]

CHINA & TAIWAN Tel +82 2 726 1104 Fax +82 2 777 7334 E-mail [email protected]

U.S. OFFICE1952 Gallows Road, Suite 110, Vienna, VA22182 Tel +1 571 268 6639 Fax +1 571 633 9517 E-mail [email protected] Worldwide Intellectual Property Service