WEBINAR: RE-INVENTING MONITORING, REVOLUTIONIZING O&M · • Can arise by partly shaded pv modules...
31
WEBINAR: RE-INVENTING MONITORING, REVOLUTIONIZING O&M MAY 18, 2016 - IN COOPERATION WITH: SOLAR SOLUTIONS PV GMBH | PV MAGAZINE EN
Transcript of WEBINAR: RE-INVENTING MONITORING, REVOLUTIONIZING O&M · • Can arise by partly shaded pv modules...
WEBINAR: RE-INVENTING MONITORING, REVOLUTIONIZING O&MMAY 18, 2016 - IN COOPERATION WITH:
SOLAR SOLUTIONS PV GMBH | PV MAGAZINE
EN
TAKING A LOOK INTO THE DARK ROOM
TAKING A LOOK INTO THE DARK ROOM
Joint analysis by PV Magazine, TÜV Rheinland and Baywa r.e. (06/2015): desired module improvements in relation to issues in rooftop installations
Efficiency
Performance over module lifetime
Fire resistance
PID
Hotspot67 %
37 %
48 %
28 %
55 %
No improvement needed7 %
WHY MEASURING AT ALL?
PV yield decreases as a consequence of Hotspots and PID
© www.photovoltaikbuero.de © www.gutachten.streib.de
© ADLER Solar Services GmbH / pv magazine
WHY MEASURING AT ALL?
HOTSPOTS – REASONS
• Can arise by partly shaded pv modules
• Hotspot-endangered are solar cells that are partly or completely shaded
• The power of a solar cell decreases proportionately to the share ofthe shaded area of the cell.
© www.photovoltaikbuero.de © www.photovoltaikbuero.de
WHY MEASURING AT ALL?
HOTSPOTS – CONSEQUENCES
• Can be cell and module destruction
• Can be fire and destruction of the complete plant
Safety by integration of bypass diodes
© www.solargutachter-prinz.de © www.photovoltaik-forum.com © www.photovoltaikbuero.dePartially shaded cell
WHY MEASURING AT ALL?
HOTSPOTS – POSSIBLE DEFECT OF BYPASS DIODES
Bypass-diode is short-circuited:
If defective diodes are not detected instantly: significant yield losses!
Bypass-diode no longer conducts:
Solar cells of that cell string are not longer protectedagainst hotsopts
If diode failure is not detected instantly: threat ofmodule destruction / fire!
WHY MEASURING AT ALL?
HOTSPOTS – DETECTION OPTIONS
By signature of the module voltage:
Bypass diode is short-circuited
Module voltage is reducedpermanently:
Bypass diode no longer conducts
Bypass-Diode activated!
- 33 %
by 33 % 1 bypass-diode short-circuitedby 66 % 2 bypass-diodesby 100 % all 3 bypass-diodes
WHY MEASURING AT ALL?
PID – POTENTIAL-INDUCED DEGRADATION
Example of PID in a string of 20 modules:
• Modules nr. 10-20: PSTC = 235-245 Wp• Modules nr. 01-09: PSTC = 33-218 Wp
Influence of the position of the module within the string is evident!
© ADLER Solar Services GmbH / pv magazine
WHAT HAPPENS IN THE PV PLANT ? THE BLACK BOX
PVPLANT
Monitoring can help you gather useful data concerning thefunctionment of your PV plant.
However…Do we really know what are the problems due to?
!
!
THE CURRENT MONITORING SOLUTIONS
? ? ? ? ? ? ?
?
?
?? ? ? ? ? ?
? ? ? ? ? ?
Module-level GridInverter-levelString-level
Without monitoring it is not possible to make any assumption as ofthe reason behind the loss in performance and investment!
!
!
? ? ? ? ? ? ?
?
?
? ? ? ? ? ?
? ? ? ? ? ?
Module-level GridInverter-levelString-level
THE CURRENT MONITORING SOLUTIONS
About 90% of all plants are monitored solely at inverter level.
!
!
? ? ? ? ? ?
?? ? ? ? ? ?
? ? ? ? ? ?
Module-level GridInverter-levelString-level
THE CURRENT MONITORING SOLUTIONS
About 10% of all plants are monitored at the string level.
!
!
Module-level GridInverter-levelString-level
?
THE CURRENT MONITORING SOLUTIONS
Only precise module monitoring provides 100% transparency on the plant
LIGHT AT THE END OF THE TUNNEL
AEG SOLARMODULE WITH INTEGRATED IMM-TECHNOLOGY
IMM: Individual Module Monitoring
Monitoring at module level–integrated in the junction box of AEG PV-modules
IMM Sensor
HOW IMM WORKS
IMM String Reader
IMM Gateway
HOW IMM WORKS
IMM Sensor
Neither additional cable nor anextra installation is needed.
DATA TRANSFER OVER EXISTING WIRING
1ST STEP: COMPARISON
All collected values are compared against each other: not only inverter data, but string and even module data
comparison of inverters
comparison of strings
comparison of modules
2ND STEP: SIMULATION
Measure exact temperature of each module: temperature ∆ is important toprecisely assess reference values (e.g.: wind ∆ 20°C module yield ∆ ~ 8.8% ! )
Match temperature with individual flasher data of each module: important for assessing which module is underperforming (datasheet standard values: 3% deviation)
IMM Scientific Engine (MATLAB, INSEL)
compares actual values with nominal values + simulates up from the module (Bottom-up-Simulation) , obtaining the
precise Performance Ratio (no approximation!)
How do you find the yield reference values?
nominal valuedata of one module specific error pattern
3RD STEP: FINGERPRINT TRACKING
Each error has its specific, unique electronic signature, its “fingerprint”.
We track all data according to these fingerprints and add new fingerprints to our “rogue’s gallery” automatically.
2. Analysis:all errors are analyzed& identified by theirindividual electronic fingerprint
1. Detection:nearly all performancereducing factors (errors) aredetected by remote
4. Correction: accurate repairs or swaps
of defected modules orcomponents can
take place promptly
3. Instruction: precise and plain
instructions, specificto each individual error
100 % TRANSPARENCY IN 4 STEPS
High Security and minimized
yield lossesby 100%
transparency
RESULT 1: TOTALLY INFORMED AT A GLANCE
RESULT 2: EVEN SMALLEST ERRORS ARE DETECTED
Exact temperature of each module: temperature ∆ is important to preciselyassess reference values (e.g.: wind ∆ 20°C module yield ∆ ~ 8.8% ! )
Exact voltage of each module: important to assess if a module has got a problem – and which it is.
Individual flasher data of each module: important for assessing which module is underperforming (datasheet standard values: 3% deviation)
IMM shows the precise performance of each module,
identifying even smallest errors.
Usual monitoring systems: not able to consider temperature/voltage of each module.
RESULT 3: DECREASE IN O&M EXPENDITURES…
www.latino-star.com
RESULT 4: … AND INCREASE IN YIELDS
Typical failure scenarios for crystalline-PV-modules;
IEA Task 13: junction-box-lead monitoring can lead to an increase in revenues of up to 12%* and is therefore strongly recommended.
Three typical failure scenarios for wafer-based crystalline photovoltaic modules. Source: IEA-PVPS Task 13, Review of Failures of Photovoltaic Modules Final, 2014, page 4
*See: IEA-PVPS Task 13, Analytical Monitoring of PV Systems Final, 2014, page 7
TALKING NUMBERS: COST-BENEFIT ANALYSIS EXAMPLE
Plant assumptions: Plant size (Wp): 1.000.000Module power (Wp): 260Irradiance kWh/kWp/year: 950Feed-in remuneration: 0,14 €Cost of plant: 1.000.000 €
Revenue/year: 133.000 €Plant ROI: 13%Increase by IMM: 1,0%Additional revenue by IMM/year: 1.330,00 €
O&M assumptions: Costs O&M ø per kWp: 10,50 €Costs O&M ø per year: 10.500 €
Savings with IMM/year in %: 10,0%Savings with IMM/year in €: 1.050 €
Additional gain with IMM in total/year: 2.380 €
Costs of IMM String-Reader hardware: Amounts Totalnumber of Modules 3.846
Total costs IMM String-Reading: 13.150 €
ROI IMM 18%
ROI plant for comparison 13%
Any data and price of any products in this slide are intended to be an estimate only without legally or commercially binding power. Any information about the products and their prices is subject to change without notice. Prices are fully subject to the terms and conditions of a commercial offer by Solar Solutions PV GmbH.
RESULTS:
PV plant always performsat its optimum
Even smallest errors are detectedand the benefit of repairmentmeasures calculated
Profit is increased and securityenhanced
IMM TECHNOLOGY: THE REVOLUTION OF O&M
O&M with IMM Technology is pv plant monitoringmanaged by artificial intelligence.
IMM: 100% TRANSPARENCY
100% TRANSPARENCYThanks to module monitoringand artificialintelligence
THANK YOU VERY MUCH FOR YOUR ATTENTION
Ingmar Kruse
Solar Solutions PV GmbHLudwig-Feuerbach-Str. 6990489 Nürnberg
www.aeg-industrialsolar.de
