Warm Electronics: Components/Subsystems Test Results
description
Transcript of Warm Electronics: Components/Subsystems Test Results
Warm Electronics 1
PACS SVR 22/23 June 2006
Warm Electronics: Warm Electronics: Components/Subsystems Test Components/Subsystems Test
ResultsResults
B. Voss
PACS SVR
Warm Electronics 2
PACS SVR 22/23 June 2006
BOLC FM
• errors occurred during thermal vacuum acceptance tests
• three housekeeping channels found unstable during cold start up test (-30°C)
• failure seems to be temperature dependent (possibly a week soldering)
• tests are stopped and BOLC is sent back for repair
• tests will be resumed and partly repeated (vibration in at least one axis)
Warm Electronics 3
PACS SVR 22/23 June 2006
DEC/MEC QM
• equipped with complete nominal section• currently running at MPE• long duration tests
– digital interfaces without errors or malfunctions– analogue interfaces OK except:
• SPU current housekeeping, known problem with wrong gain setting in DEC/MEC. Corrected for FM
• CRE interfaces tested OK during acceptance test, but no long term tests available.
Warm Electronics 4
PACS SVR 22/23 June 2006
DEC/MEC FM
• in production• schedule delayed by two main problems:
– FPGA swap on both DEC Base boards• repair envisaged due week 29• rearranging test order because of availability of test
facilities
– erroneous SPU boards • FM will be temporary equipped with erroneous SPU
boards thus EMC and environmental test can be performed in time
• only small likelihood of malfunction during tests• later exchange of the SPU boards and delta acceptance
Warm Electronics 5
PACS SVR 22/23 June 2006
DEC/MEC FM
• new schedule by CSL:– repair due week 29– functional test and vibration due week 32– thermal vacuum due week 33– functional retest due week 34– EMC test at ESTEC due week 35– delivery to MPE begin of September
Warm Electronics 6
PACS SVR 22/23 June 2006
DPU PFM
• functional Tests at CGS OK• thermal Tests OK• EMC Test OK (minor NCRs, solved/accepted)• possible problems:
– CFM2 showed corrupted memory after some hours of operation at MPE
– AVM2 in same configuration is running stable – possible reasons currently under investigation
(HW or SW problem?)– errors not reproducible at CGS– PFM now at MPE for comparative tests
Warm Electronics 7
PACS SVR 22/23 June 2006
SPU PFM
• thermal tests OK• EMC test OK (minor deviations already
accepted)• functional test failed under special conditions
– during acceptance test campaign 15.05.06 malfunction occurred (CRISA FPL-NC-1214-077-CRS)
– start-up SW reports error during application upload command
– error affects read from DSP program memory (PRAM) with special bit patterns (all 1’s to all but one bit 0’s)
– error is systematic and affects all DSP boards (PACS SPU, PACS DECMEC and LFI REBA)
Warm Electronics 8
PACS SVR 22/23 June 2006
SPU PFM
• reason of error– not clearly understood yet, but most likely a
ground bouncing problem when switching output stages in the PRAMs
• repair– repair of EBB with additional ground wires on the
board improved the situation– modification of flight spare currently under
progress
Warm Electronics 9
PACS SVR 22/23 June 2006
Harnesses
• Warm Interconnect Harness– QM at MPE– QM showed different weaknesses (bad bonding,
wrong back shells, swapped wires in cable bundles)
– FM production will take care of these
• Cryo Harness– complete and tested– differences in resistance measurements
compared to MPE test harness– reason under investigation but most likely due to
different measurement systems