Unit 3 OF ESD

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    Unit 3

    Memories and memory

    subsystem

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    INTRODUCTION

    Memory subsystemthe place within an

    embedded system where instructions and

    data are stored.

    Major concern in design is the execution

    time. This is taken care by the memory

    management (static/ dynamic allocation of

    memory)

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    Classification of memory

    MEMORY

    RAM ROM

    DRAM SRAM

    SDRAM

    PROM EPROM

    EEPROM FLASH

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    Random Access Memory (RAM)

    It is the main memory in most

    computers. One can read and over-write

    data in RAM.

    Can be classified as:

    SRAM

    DRAM

    Both static and dynamicRAM are consideredvolat i le , as their state is lostor reset when power isremoved from the system.

    In SRAM,a bit of datais storedusing the state of a flip-flop.

    It is more expensiveto produce,

    but is generally faster andrequires less power than DRAM.

    In modern computers, SRAM isoften used as cache memory forthe CPU.

    DRAM stores a bit of datausing a

    transistor and capacitor pair,which together comprise amemory cell.

    The capacitor holds a high or lowcharge (1 or 0, respectively), andthe transistor acts as a switchthat lets the control circuitry onthe chip read the capacitor's stateof charge or change it.

    As this form of memory is lessexpensiveto produce than staticRAM, it is the predominant formof computer memory used in

    modern computers.

    http://en.wikipedia.org/wiki/Bithttp://en.wikipedia.org/wiki/Flip-flop_(electronics)http://en.wikipedia.org/wiki/Central_processing_unithttp://en.wikipedia.org/wiki/Central_processing_unithttp://en.wikipedia.org/wiki/Flip-flop_(electronics)http://en.wikipedia.org/wiki/Flip-flop_(electronics)http://en.wikipedia.org/wiki/Flip-flop_(electronics)http://en.wikipedia.org/wiki/Bit
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    Read Only Memory (ROM) Stores data by permanently

    enabling or disabling selectedtransistors, such that the

    memory cannot be altered. Classified as:

    Mask ROM

    PROM

    EPROM

    EEPROM

    FLASH

    In mask ROM, the data isphysically encoded in thecircuit, so it can only beprogrammed duringfabrication

    -

    - PROM,invented in 1956,allowed users to program itscontents exactly once byphysically altering its structure

    with the application of high-voltage pulses.

    - The 1971 invention of EPROMessentially solved problemwith PROM, since EPROM canbe repeatedly reset to itsunprogrammed state by

    exposure to strong ultravioletlight (typically for 10 minutesor longer).

    - Repeated exposure to UV lightwill eventually wear out anEPROM, but the enduranceofmost EPROM chips exceeds

    1000 cycles of erasing andreprogramming

    -

    http://en.wikipedia.org/wiki/Programmable_read-only_memoryhttp://en.wikipedia.org/wiki/EPROMhttp://en.wikipedia.org/wiki/Read-only_memoryhttp://en.wikipedia.org/wiki/File:EPROM_Intel_C1702A.jpghttp://en.wikipedia.org/wiki/File:EPROM_Intel_C1702A.jpghttp://en.wikipedia.org/wiki/Read-only_memoryhttp://en.wikipedia.org/wiki/EPROMhttp://en.wikipedia.org/wiki/Programmable_read-only_memory
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    Read Only Memory (ROM)

    EEPROM, invented in 1983,can be programmed in-placeif the containingdevice provides a meansto receive the programcontents from an externalsource (for example, a

    personal computer via aserial cable).

    - Writing is a very slowprocess and again needshigher voltage (usually

    around 12 V)

    Flash memory,invented at Toshiba

    in the mid-1980s,and commercializedin the early 1990s, isa form of EEPROMthat makes very

    efficient use of chiparea and can beerased andreprogrammedthousands of timeswithout damage.

    http://en.wikipedia.org/wiki/EEPROMhttp://en.wikipedia.org/wiki/In-place_programmablehttp://en.wikipedia.org/wiki/In-place_programmablehttp://en.wikipedia.org/wiki/Serial_cablehttp://en.wikipedia.org/wiki/Volthttp://en.wikipedia.org/wiki/Flash_memoryhttp://en.wikipedia.org/wiki/Toshibahttp://en.wikipedia.org/wiki/Toshibahttp://en.wikipedia.org/wiki/Flash_memoryhttp://en.wikipedia.org/wiki/Volthttp://en.wikipedia.org/wiki/Serial_cablehttp://en.wikipedia.org/wiki/In-place_programmablehttp://en.wikipedia.org/wiki/In-place_programmablehttp://en.wikipedia.org/wiki/In-place_programmablehttp://en.wikipedia.org/wiki/EEPROM
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    General memory interface The first level model of

    memory can be viewed as

    an ARRAY.

    Each location in an array

    will have an index no.

    (address)

    Read access

    the binary

    encoded address (index

    value) can be decoded

    and returns the stored

    value. Write access-stores a

    new value in the binary

    encoded address (index

    value)

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    Common memory control signals CS-enables a memory

    device for read/writeoperation.

    OE-output control of amemory device.

    R- indicates READoperation on the memorydevice.

    W-indicates WRITEoperation on the memorydevice.

    RAS-Indicates that theaddress inputs represents

    a row address in thememory device.

    CAS-Indicates that theaddress inputs representsa column address in the

    memory device.

    CONTROL

    SIGNAL

    MEANING

    __

    CS

    Chip Select

    ___

    OE

    Output Enable

    R Read

    __

    W

    Write

    ____

    RAS

    Row Address Strobe

    ____

    CAS

    Column Address

    Strobe

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    Chip organization

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    ROM timing diagram

    Only READ operation

    is possible. User has to give the

    address.

    When the CS is made

    low, the data can be

    read after a certain

    processing time (tread)

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    SRAM timing diagram

    READ/WRITE both

    are possible.

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    SRAM CELL A typical SRAM cell is made up

    of six MOSFETs.

    Each bitin an SRAM is stored

    on four transistors(M1, M2, M3,M4) that form two cross-coupled inverters.

    This storage cell has twostable states which are used todenote 0 and 1.

    Two additionalaccess

    transistors serve to control theaccess to a storage cell duringread and write operations.

    Access to the cell is enabledby the word line (WL in figure)which controls the two accesstransistors M5 and M6 which,in turn, control whether the cellshould be connected to the bitlines: BL and BL. They areused to transfer data for bothread and write operations.

    http://en.wikipedia.org/wiki/MOSFEThttp://en.wikipedia.org/wiki/Bithttp://en.wikipedia.org/wiki/Transistorhttp://en.wikipedia.org/wiki/Transistorhttp://en.wikipedia.org/wiki/Bithttp://en.wikipedia.org/wiki/MOSFET
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    SRAM cell

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    DRAM Timing Diagram

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    DRAM Cell

    T i l

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    Terminology Access time

    Time to access a word inmemory.

    Time taken for read/writeoperation.

    Cycle time Time interval from the start

    of one read/write operationuntil the start of the next.

    It is the measure of howquickly the memory can berepeatedly accessed.

    Memory bandwidth The measure of word

    transmission rate to andfrom the memory by thebus.

    Blocks large quantities of data are

    transferred within a systemin blocks.

    block sizeis the no. ofwords in a block.

    Latency

    Time required to computethe address of a sequenceof words and then locate itsfirst block in the memory.

    Block Access Time

    Time required to find the 0

    th

    word of the block and thentransfer the entire block.

    Page Collection of blocks.

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    Access time and cycle time

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    The Primary physical memory map0xFFFF

    0xE5FF

    0x68FF

    0x4FF

    0x3FF

    0x0

    Memory mapped I/O

    and DMA

    Firmware

    Volatile RAM

    Non- Volatile

    RAM(SRAM/DRAM)

    Stack space

    System memory

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    Memory subsystem architecture It is comprised of a number of

    memory components of differentkinds/sizes/speeds arranged in

    hierarchical manner and designedto cooperate with each other.

    Purpose of building a memorysystem is the reduce the memoryaccess timedepending upon the

    application. Cache memory

    Smallest

    Fastest

    Most expensive

    Main/primary memory

    SRAM/DRAM

    Secondary memory

    Slowest

    Largest

    Least expensive

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    Need for Cachememory High speed memories are expensive and complex to design.

    Also, the support circuitry for high speed memory device

    will be complex and expensive.

    Two main goalsof a good design of ES are:

    To reduce the no. of memory accesses.

    To reduce the latency of each memory access.

    The cache is a smaller, faster memory which temporarily

    stores copies of the block data and program instructions

    from main memorylocations.

    As long as most memory accesses are cached, the average

    latencyof memory accesses will be very nominal.

    Most modern desktop and server CPUs have independent caches for:

    instruction cache (icache) to speed up executable instruction fetch

    a data cache (dcache) to speed up data fetch

    S ti l L lit f f

    http://en.wikipedia.org/wiki/Main_memoryhttp://en.wikipedia.org/wiki/RAM_latencyhttp://en.wikipedia.org/wiki/RAM_latencyhttp://en.wikipedia.org/wiki/Main_memory
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    Sequential Locality of reference 85% of the embedded software is

    written in Embedded C.

    IBM analyzed the flow of theseprograms and came out with aphenomenon called sequential localityof reference.

    It states that actual execution

    generally happens within a smallwindowthat moves forward throughthe program. These instructions canbe kept in a fast memory.

    Thus execution speed is increased(asthe memory access time is reduced) ata reduced cost. (no need of high endsupport for high speed memories)

    This concept failsif there are largeloops or repeated branches outsidethe window.

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    Cache system architecture